NZ767004B2 - Solid Inspection Apparatus and Method of Use - Google Patents
Solid Inspection Apparatus and Method of UseInfo
- Publication number
- NZ767004B2 NZ767004B2 NZ767004A NZ76700417A NZ767004B2 NZ 767004 B2 NZ767004 B2 NZ 767004B2 NZ 767004 A NZ767004 A NZ 767004A NZ 76700417 A NZ76700417 A NZ 76700417A NZ 767004 B2 NZ767004 B2 NZ 767004B2
- Authority
- NZ
- New Zealand
- Prior art keywords
- optical target
- optical
- target
- objective
- solid
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J2003/1842—Types of grating
- G01J2003/1861—Transmission gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
- G01N2021/6419—Excitation at two or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
- G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/278—Constitution of standards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
- G01N21/643—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" non-biological material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6489—Photoluminescence of semiconductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/022—Casings
- G01N2201/0227—Sealable enclosure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/024—Modular construction
- G01N2201/0245—Modular construction with insertable-removable part
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
Abstract
optical detection device, may comprise: an optical target including a solid body that encloses a fluorescing material; an objective to direct excitation light toward the optical target and to receive fluorescence emission from the optical target; a driver to move the objective to a region of interest proximate to the optical target; memory to store program instructions; and a processor to execute the program instructions for detecting fluorescence emission from the optical target in connection with at least one of optical alignment or calibration of an instrument.
Claims (20)
1. An optical detection device, comprising: an optical target including a solid body that encloses a fluorescing material comprising an ion of at least one of an actinide or a transition metal element; an objective to direct excitation light toward the optical target and to receive fluorescence emission from the optical target; a driver to move the objective to a region of interest proximate to the optical target; memory to store program instructions; and a processor to execute the program instructions for detecting fluorescence emission from the optical target in connection with at least one of optical alignment or calibration of an instrument; wherein the optical target includes a solid host material and the fluorescing material embedded in the solid host material, the solid host material having a predetermined phonon energy HOST , the fluorescing material exhibiting a select ground energy level, a target excitation (TE) energy level, and a next lower lying (NLL) energy level spaced an energy gap FM below the TE energy level, wherein a ratio of the FM /HOSTPE is three or more. EG2 EG2
2. The device of claim 1, wherein the objective directs excitation light onto the optical target, the processor is to derive reference information from the fluorescence emission, the processor is to utilise the reference information in connection with the at least one of optical alignment or calibration of the instrument.
3. The device of either claim 1 or 2, wherein the optical target is permanently mounted at a calibration location proximate to the objective, the calibration location being separate from flow cell channels within the instrument.
4. The device of any one of the preceding claims, wherein the solid body represents a substrate comprising a solid host material doped with one or more ions that form the fluorescing material.
5. The device of any one of the preceding claims, wherein the solid body represents at least one of an epoxy or polymer that encloses quantum dots that emit fluorescence in one or more predetermined emission bands of interest when irradiated by the excitation light.
6. The device of any one of the preceding claims, further comprising an anti-reflective coating formed on the optical target.
7. An optical detection method, comprising: aligning an objective of an instrument with an optical target that includes a solid body that encloses a fluorescing material, wherein the aligning operation comprises: aligning the objective with a grating region that includes a microstructure located above the optical target and focusing the excitation light to a first focal point at the microstructure, and aligning the objective with a non-grating region that is void of the microstructure and focusing the excitation light to a second focal point that is below an upper surface of the optical target; directing excitation light onto the optical target; detecting fluorescence emission from the optical target as reference information; and utilising the reference information in connection with at least one of optical alignment or calibration of the instrument.
8. The method of claim 7, further comprising focusing the excitation light to a focal point that is below an upper surface of the optical target.
9. The method of either claim 7 or claim 8, wherein the fluorescing material comprises a chemical element that comprises an ion of at least one of erbium, holmium or praseodymium and wherein the solid host material comprises at least one of silicate, germanate, InF , or ZBLAN.
10. The device of any one of claims 1 to 6, wherein the ratio of the FM /HOST equals or is EG2 PE between four and ten.
11. The device of any one of claims 1 to 6, or 10, wherein the solid host material includes at least one of glass, amorphous polymers, crystalline materials, semi-crystalline polymers, metallic glass, or ceramic.
12. The device of any one of claims 1 to 6, or 10 to 11, wherein the fluorescing material has a fluorescence emission wavelength with a centre wavelength at or below about 1000 nm.
13. The device of any one of claims 1 to 6, or 10 to 12, wherein the solid host material has a maximum phonon energy less than or equal to 580 cm .
14. The device of any one of claims 1 to 6, or 10 to 13, wherein the optical target further comprises microstructures formed on a surface of the optical target to form a grating layer.
15. The method of any one of claims 7 to 9, wherein the solid body has a predetermined phonon energy HOST , the fluorescing material exhibiting a select ground energy level, a target excitation (TE) energy level and a next lower lying (NLL) energy level spaced an energy gap FM below the TE energy level, wherein a ratio of the FM /HOST is three or more. EG2 EG2 PE
16. The method of claim 15, wherein the ratio of the FM /HOST equals or is between four EG2 PE and ten.
17. The method of any one of claims 7 to 9, or 15 to 16, wherein the solid body includes at least one of glass, amorphous polymers, crystalline materials, semi-crystalline polymers, metallic glass, or ceramic.
18. The method of any one of claims 7 to 9, or 15 to 17, wherein the fluorescence emission has a centre wavelength at or below about 1000 nm.
19. The method of any one of claims 7 to 9, or 15 to 18, wherein the solid body has a maximum phonon energy less than or equal to 580 cm .
20. The method of any one of claims 7 to 9, or 15 to 19, wherein the optical target further comprises microstructures formed on a surface of the optical target to form a grating layer.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762443675P | 2017-01-07 | 2017-01-07 | |
| NZ747901A NZ747901B2 (en) | 2017-01-07 | 2017-12-11 | Solid inspection apparatus and method of use |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| NZ767004A NZ767004A (en) | 2024-01-26 |
| NZ767004B2 true NZ767004B2 (en) | 2024-04-30 |
Family
ID=
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20160116416A1 (en) | Substrate Enhanced Laser-Induced Breakdown Spectroscopy (LIBS) Apparatus | |
| US20210138577A1 (en) | Using lasers to reduce reflection of transparent solids, coatings and devices employing transparent solids | |
| US8817263B2 (en) | Sample analysis element and detecting device | |
| TWI629750B (en) | Method and system for laser focus plane measurement in laser scribing process | |
| US8564026B2 (en) | Chip, method for producing a chip and device for laser ablation | |
| NZ767004B2 (en) | Solid Inspection Apparatus and Method of Use | |
| NZ767004A (en) | Solid inspection apparatus and method of use | |
| Tawfik et al. | Damage profile of HDPE polymer using laser-induced plasma | |
| Banerjee et al. | Detection of buried layers in silicon devices using LIBS during hole drilling with femtosecond laser pulses | |
| CN104093676B (en) | New Materials | |
| CN204044069U (en) | Micro-confocal fluorescent system | |
| US20030183784A1 (en) | Method and apparatus for boresighting a laser with a forward looking infrared device | |
| US9614346B2 (en) | Organic laser for measurement | |
| KR101694395B1 (en) | Apparatus and method for testing weather resistance and arrangement method of the apparatus | |
| Fourmaux et al. | Laser induced damage threshold and incubation effects of high-power laser system optics | |
| US9236522B2 (en) | MEMS infrared sensor including a plasmonic lens | |
| CN203918235U (en) | A kind of laser ablation Apparatus and system | |
| EP3283869A1 (en) | Device for the beaming of light emitted by light sources, in particular fluorescence of molecules | |
| US20180087959A1 (en) | Laser power and energy sensor using anisotropic thermoelectric material | |
| US20130074824A1 (en) | Solar position tracking apparatus comprising a cylindrical light focusing device | |
| US20170363880A1 (en) | Direct laser writing of 3-d gratings and diffraction optics | |
| JP2005242292A (en) | Laser beam incidence optical device | |
| US10473588B2 (en) | Device and method for water-proofing test | |
| US20140370627A1 (en) | Monitoring laser processing of semiconductors by raman spectroscopy | |
| KR20180078099A (en) | Laser displacement sensor and design method thereof |