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NZ776876B2 - Defect inspection system, defect inspection method, and defect inspection program for wood plank - Google Patents
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NZ776876B2 - Defect inspection system, defect inspection method, and defect inspection program for wood plank - Google Patents

Defect inspection system, defect inspection method, and defect inspection program for wood plank

Info

Publication number
NZ776876B2
NZ776876B2 NZ776876A NZ77687621A NZ776876B2 NZ 776876 B2 NZ776876 B2 NZ 776876B2 NZ 776876 A NZ776876 A NZ 776876A NZ 77687621 A NZ77687621 A NZ 77687621A NZ 776876 B2 NZ776876 B2 NZ 776876B2
Authority
NZ
New Zealand
Prior art keywords
light
wood plank
defect inspection
transmitted
invisible
Prior art date
Application number
NZ776876A
Other versions
NZ776876A (en
Inventor
Morita Koji
Original Assignee
Meinan Machinery Works Inc
Filing date
Publication date
Application filed by Meinan Machinery Works Inc filed Critical Meinan Machinery Works Inc
Publication of NZ776876A publication Critical patent/NZ776876A/en
Publication of NZ776876B2 publication Critical patent/NZ776876B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8986—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30161—Wood; Lumber
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means

Abstract

light (2) for reflected light that emits visible light for reflected light onto a front side of a veneer (6), a light (32) for invisible light that emits near-infrared light for transmitted light onto a back side of the veneer (6), and an image processing device (1) that detects defects of the veneer (6) by analyzing a captured image generated by a line sensor camera (4) are provided. Defects of the veneer (6) are discriminated on the basis of a set of shading and shapes in an infrared-transmitted-light image based on the transmitted light, and colors in a visible-light image based on the reflected light. Consequently, even if a defect has a small color difference from a normal part in the visible-light image, difference of shading between the defective part and the normal part appears in the infrared-transmitted-light image, and a defect that is difficult to detect by seeing only a color difference in a visible-light image can be relatively easily detected.

Claims (8)

1. A defect inspection system for a wood plank, the defect inspection system comprising: a light for visible light that emits visible light for reflected light onto one side of a wood plank; a light for invisible light that emits invisible light for transmitted light onto another side of the wood plank that is opposite the one side; a capture device that generates an image by capturing the one side of the wood plank; and an image processing device that detects a plurality of kinds of defects of the wood plank by analyzing a captured image generated by the capture device, wherein the image processing device discriminates the plurality of kinds of defects of the wood plank on a basis of a set that includes at least shading and shapes in an image based on the invisible light transmitted through the wood plank, and colors in an image based on the visible light reflected by the wood plank.
2. The defect inspection system for a wood plank according to claim 1, wherein the light for visible light includes a white-light source, and the light for invisible light includes a near-infrared light source.
3. The defect inspection system for a wood plank according to claim 1, further comprising a second light for visible light that emits visible light for transmitted light onto the another side of the wood plank, the visible light for transmitted light having a color that is easily discriminated from a color of reflected light that is from the light for visible light and is reflected by the wood plank.
4. The defect inspection system for a wood plank according to claim 3, wherein the light for visible light includes a white-light source, the light for invisible light includes a near-infrared light source, and the second light for visible light includes a light source that has a color that is different from a color of the white-light source.
5. A defect inspection method for a wood plank, the method comprising the steps of: generating an image by capturing one side of a wood plank with a capture device while emitting visible light for reflected light onto the one side of the wood plank from a light for visible light, and emitting invisible light for transmitted light onto another side of the wood plank that is opposite the one side from a light for invisible light; and detecting a plurality of kinds of defects of the wood plank by using an image processing device to analyze a captured image generated by the capture device, wherein the image processing device discriminates the plurality of kinds of defects of the wood plank on a basis of a set that includes at least shading and shapes in an image based on the invisible light transmitted through the wood plank, and colors in an image based on the visible light reflected by the wood plank.
6. The defect inspection method for a wood plank according to claim 5, wherein the light for invisible light includes a near-infrared light source.
7. A defect inspection program for a wood plank, the program being installed in an image processing device and allowing a computer of the image processing device to function as: means for obtaining a captured image generated by capturing one side of a wood plank while visible light for reflected light is emitted onto the one side of the wood plank from a light for visible light, and invisible light for transmitted light is emitted onto another side of the wood plank that is opposite the one side from a light for invisible light; and means for analyzing the captured image, discriminating a plurality of kinds of defects of the wood plank on a basis of a set that includes at least shading and shapes in an image based on the invisible light transmitted through the wood plank, and colors in an image based on the visible light reflected by the wood plank, and thus detecting the plurality of kinds of defects of the wood plank.
8. The defect inspection program for a wood plank according to claim 7, wherein the light for invisible light includes a near-infrared light source. 1 / 3 Fi g. 1 IMAGE PROCESSING DEVICE 4 LINE SENSOR CAMERA 2 LIGHT FOR REFLECTED LIGHT 6 VENEER 5b 5a 3 LIGHT FOR TRANSMITTED LIGHT 31 32
NZ776876A 2021-06-03 Defect inspection system, defect inspection method, and defect inspection program for wood plank NZ776876B2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPPCT/JP2020/030797 2020-08-13

Publications (2)

Publication Number Publication Date
NZ776876A NZ776876A (en) 2022-07-01
NZ776876B2 true NZ776876B2 (en) 2022-10-04

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