SG11201908162RA - Method for manufacturing wafer - Google Patents
Method for manufacturing waferInfo
- Publication number
- SG11201908162RA SG11201908162RA SG11201908162RA SG11201908162RA SG 11201908162R A SG11201908162R A SG 11201908162RA SG 11201908162R A SG11201908162R A SG 11201908162RA SG 11201908162R A SG11201908162R A SG 11201908162RA
- Authority
- SG
- Singapore
- Prior art keywords
- manufacturing wafer
- wafer
- manufacturing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/128—Preparing bulk and homogeneous wafers by edge treatment, e.g. chamfering
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/123—Preparing bulk and homogeneous wafers by grinding or lapping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/124—Preparing bulk and homogeneous wafers by processing the backside of the wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/126—Preparing bulk and homogeneous wafers by chemical etching
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/129—Preparing bulk and homogeneous wafers by polishing
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017047448A JP6610587B2 (en) | 2017-03-13 | 2017-03-13 | Wafer manufacturing method |
| PCT/JP2018/007083 WO2018168426A1 (en) | 2017-03-13 | 2018-02-27 | Wafer manufacturing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201908162RA true SG11201908162RA (en) | 2019-10-30 |
Family
ID=63523108
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201908162R SG11201908162RA (en) | 2017-03-13 | 2018-02-27 | Method for manufacturing wafer |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US11361959B2 (en) |
| JP (1) | JP6610587B2 (en) |
| KR (1) | KR102454449B1 (en) |
| CN (1) | CN110383427B (en) |
| DE (1) | DE112018000935B4 (en) |
| SG (1) | SG11201908162RA (en) |
| TW (1) | TWI736746B (en) |
| WO (1) | WO2018168426A1 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7158594B2 (en) * | 2020-01-29 | 2022-10-21 | Jx金属株式会社 | indium phosphide substrate |
| KR102533868B1 (en) | 2021-05-25 | 2023-05-26 | 이기정 | Method for manufacturing wafer |
| CN113809149B (en) * | 2021-07-23 | 2023-12-12 | 上海先进半导体制造有限公司 | Wafers, semiconductor components and semiconductor component processing methods |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3580600B2 (en) * | 1995-06-09 | 2004-10-27 | 株式会社ルネサステクノロジ | Method for manufacturing semiconductor device, semiconductor wafer used for the same, and method for manufacturing the same |
| JP4076046B2 (en) * | 2000-05-30 | 2008-04-16 | エム・イー・エム・シー株式会社 | Multistage chamfering method of wafer |
| US6962521B2 (en) * | 2000-07-10 | 2005-11-08 | Shin-Etsu Handotai Co., Ltd. | Edge polished wafer, polishing cloth for edge polishing, and apparatus and method for edge polishing |
| US7258931B2 (en) * | 2002-08-29 | 2007-08-21 | Samsung Electronics Co., Ltd. | Semiconductor wafers having asymmetric edge profiles that facilitate high yield processing by inhibiting particulate contamination |
| JP2004319910A (en) * | 2003-04-18 | 2004-11-11 | Sumitomo Mitsubishi Silicon Corp | Method for manufacturing semiconductor wafer |
| DE102006037267B4 (en) * | 2006-08-09 | 2010-12-09 | Siltronic Ag | Process for the production of semiconductor wafers with high-precision edge profile |
| KR101460993B1 (en) | 2007-01-31 | 2014-11-13 | 신에쯔 한도타이 가부시키가이샤 | A chamfering device for a silicon wafer, a method for manufacturing a silicon wafer, |
| JP5138407B2 (en) * | 2008-02-14 | 2013-02-06 | セイコーインスツル株式会社 | Wafer and wafer polishing method |
| KR100999361B1 (en) * | 2008-08-04 | 2010-12-09 | 주식회사 실트론 | Wafer Manufacturing Method |
| JP5472073B2 (en) * | 2010-12-16 | 2014-04-16 | 信越半導体株式会社 | Semiconductor wafer and manufacturing method thereof |
| JP2015153999A (en) * | 2014-02-18 | 2015-08-24 | 信越半導体株式会社 | Manufacturing method of semiconductor wafer |
-
2017
- 2017-03-13 JP JP2017047448A patent/JP6610587B2/en active Active
-
2018
- 2018-02-27 SG SG11201908162R patent/SG11201908162RA/en unknown
- 2018-02-27 DE DE112018000935.1T patent/DE112018000935B4/en active Active
- 2018-02-27 CN CN201880016747.2A patent/CN110383427B/en active Active
- 2018-02-27 KR KR1020197026388A patent/KR102454449B1/en active Active
- 2018-02-27 WO PCT/JP2018/007083 patent/WO2018168426A1/en not_active Ceased
- 2018-02-27 US US16/487,471 patent/US11361959B2/en active Active
- 2018-03-05 TW TW107107171A patent/TWI736746B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| WO2018168426A1 (en) | 2018-09-20 |
| US11361959B2 (en) | 2022-06-14 |
| KR102454449B1 (en) | 2022-10-14 |
| JP2018152456A (en) | 2018-09-27 |
| TWI736746B (en) | 2021-08-21 |
| CN110383427B (en) | 2023-01-03 |
| DE112018000935T5 (en) | 2019-10-31 |
| US20200006047A1 (en) | 2020-01-02 |
| TW201834002A (en) | 2018-09-16 |
| DE112018000935B4 (en) | 2025-07-10 |
| KR20190124728A (en) | 2019-11-05 |
| JP6610587B2 (en) | 2019-11-27 |
| CN110383427A (en) | 2019-10-25 |
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