Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
SG11201908162RA - Method for manufacturing wafer - Google Patents
[go: Go Back, main page]

SG11201908162RA - Method for manufacturing wafer - Google Patents

Method for manufacturing wafer

Info

Publication number
SG11201908162RA
SG11201908162RA SG11201908162RA SG11201908162RA SG 11201908162R A SG11201908162R A SG 11201908162RA SG 11201908162R A SG11201908162R A SG 11201908162RA SG 11201908162R A SG11201908162R A SG 11201908162RA
Authority
SG
Singapore
Prior art keywords
manufacturing wafer
wafer
manufacturing
Prior art date
Application number
Inventor
Yuya Nakatani
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Publication of SG11201908162RA publication Critical patent/SG11201908162RA/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/128Preparing bulk and homogeneous wafers by edge treatment, e.g. chamfering
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/123Preparing bulk and homogeneous wafers by grinding or lapping
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/124Preparing bulk and homogeneous wafers by processing the backside of the wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/126Preparing bulk and homogeneous wafers by chemical etching
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12Preparing bulk and homogeneous wafers
    • H10P90/129Preparing bulk and homogeneous wafers by polishing

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
SG11201908162R 2017-03-13 2018-02-27 Method for manufacturing wafer SG11201908162RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017047448A JP6610587B2 (en) 2017-03-13 2017-03-13 Wafer manufacturing method
PCT/JP2018/007083 WO2018168426A1 (en) 2017-03-13 2018-02-27 Wafer manufacturing method

Publications (1)

Publication Number Publication Date
SG11201908162RA true SG11201908162RA (en) 2019-10-30

Family

ID=63523108

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201908162R SG11201908162RA (en) 2017-03-13 2018-02-27 Method for manufacturing wafer

Country Status (8)

Country Link
US (1) US11361959B2 (en)
JP (1) JP6610587B2 (en)
KR (1) KR102454449B1 (en)
CN (1) CN110383427B (en)
DE (1) DE112018000935B4 (en)
SG (1) SG11201908162RA (en)
TW (1) TWI736746B (en)
WO (1) WO2018168426A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7158594B2 (en) * 2020-01-29 2022-10-21 Jx金属株式会社 indium phosphide substrate
KR102533868B1 (en) 2021-05-25 2023-05-26 이기정 Method for manufacturing wafer
CN113809149B (en) * 2021-07-23 2023-12-12 上海先进半导体制造有限公司 Wafers, semiconductor components and semiconductor component processing methods

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3580600B2 (en) * 1995-06-09 2004-10-27 株式会社ルネサステクノロジ Method for manufacturing semiconductor device, semiconductor wafer used for the same, and method for manufacturing the same
JP4076046B2 (en) * 2000-05-30 2008-04-16 エム・イー・エム・シー株式会社 Multistage chamfering method of wafer
US6962521B2 (en) * 2000-07-10 2005-11-08 Shin-Etsu Handotai Co., Ltd. Edge polished wafer, polishing cloth for edge polishing, and apparatus and method for edge polishing
US7258931B2 (en) * 2002-08-29 2007-08-21 Samsung Electronics Co., Ltd. Semiconductor wafers having asymmetric edge profiles that facilitate high yield processing by inhibiting particulate contamination
JP2004319910A (en) * 2003-04-18 2004-11-11 Sumitomo Mitsubishi Silicon Corp Method for manufacturing semiconductor wafer
DE102006037267B4 (en) * 2006-08-09 2010-12-09 Siltronic Ag Process for the production of semiconductor wafers with high-precision edge profile
KR101460993B1 (en) 2007-01-31 2014-11-13 신에쯔 한도타이 가부시키가이샤 A chamfering device for a silicon wafer, a method for manufacturing a silicon wafer,
JP5138407B2 (en) * 2008-02-14 2013-02-06 セイコーインスツル株式会社 Wafer and wafer polishing method
KR100999361B1 (en) * 2008-08-04 2010-12-09 주식회사 실트론 Wafer Manufacturing Method
JP5472073B2 (en) * 2010-12-16 2014-04-16 信越半導体株式会社 Semiconductor wafer and manufacturing method thereof
JP2015153999A (en) * 2014-02-18 2015-08-24 信越半導体株式会社 Manufacturing method of semiconductor wafer

Also Published As

Publication number Publication date
WO2018168426A1 (en) 2018-09-20
US11361959B2 (en) 2022-06-14
KR102454449B1 (en) 2022-10-14
JP2018152456A (en) 2018-09-27
TWI736746B (en) 2021-08-21
CN110383427B (en) 2023-01-03
DE112018000935T5 (en) 2019-10-31
US20200006047A1 (en) 2020-01-02
TW201834002A (en) 2018-09-16
DE112018000935B4 (en) 2025-07-10
KR20190124728A (en) 2019-11-05
JP6610587B2 (en) 2019-11-27
CN110383427A (en) 2019-10-25

Similar Documents

Publication Publication Date Title
SG10201910623VA (en) Wafer producing method
SG10201702358YA (en) Wafer producing method
SG10201704123PA (en) Wafer producing method
SG10201707176SA (en) SiC WAFER PRODUCING METHOD
SG10201603903QA (en) Wafer producing method
SG10201603714RA (en) Wafer producing method
SG10201604080XA (en) Wafer producing method
SG10201600557XA (en) Wafer producing method
SG10201600555UA (en) Wafer producing method
SG10201601981YA (en) Wafer producing method
SG10201600552YA (en) Wafer producing method
SG10201510273SA (en) Wafer producing method
SG10201605092PA (en) Wafer producing method
SG10201510271QA (en) Wafer producing method
SG10201610962SA (en) SiC WAFER PRODUCING METHOD
EP3379588A4 (en) Semiconductor device manufacturing method
SG10201601975SA (en) Wafer producing method
SG10201701086SA (en) Wafer processing method
SG10201700915XA (en) Wafer processing method
SG10201610635SA (en) Wafer production method
GB201918592D0 (en) Methods for manufacturing an adjuvant
EP3279924A4 (en) Semiconductor device manufacturing method
SG11201709671YA (en) Semiconductor device manufacturing method
SG11202001118WA (en) Semiconductor manufacturing apparatus
SG10201700072UA (en) Wafer processing method