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AU2003233485A1 - Fluid assisted cryogenic cleaning - Google Patents
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AU2003233485A1 - Fluid assisted cryogenic cleaning - Google Patents

Fluid assisted cryogenic cleaning

Info

Publication number
AU2003233485A1
AU2003233485A1 AU2003233485A AU2003233485A AU2003233485A1 AU 2003233485 A1 AU2003233485 A1 AU 2003233485A1 AU 2003233485 A AU2003233485 A AU 2003233485A AU 2003233485 A AU2003233485 A AU 2003233485A AU 2003233485 A1 AU2003233485 A1 AU 2003233485A1
Authority
AU
Australia
Prior art keywords
cryogenic cleaning
fluid assisted
assisted cryogenic
fluid
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003233485A
Inventor
Souvik Banerjee
Harlan Forrest Chung
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOC Inc
Original Assignee
Eco-Snow Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/324,221 external-priority patent/US6852173B2/en
Priority claimed from US10/403,147 external-priority patent/US6949145B2/en
Application filed by Eco-Snow Systems Inc filed Critical Eco-Snow Systems Inc
Publication of AU2003233485A1 publication Critical patent/AU2003233485A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/80Cleaning only by supercritical fluids
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/0064Cleaning by methods not provided for in a single other subclass or a single group in this subclass by temperature changes
    • B08B7/0092Cleaning by methods not provided for in a single other subclass or a single group in this subclass by temperature changes by cooling
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24CABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL
    • B24C1/00Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods
    • B24C1/003Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods using material which dissolves or changes phase after the treatment, e.g. ice, CO2
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G5/00Cleaning or de-greasing metallic material by other methods; Apparatus for cleaning or de-greasing metallic material with organic solvents
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
AU2003233485A 2002-04-05 2003-04-03 Fluid assisted cryogenic cleaning Abandoned AU2003233485A1 (en)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US36985202P 2002-04-05 2002-04-05
US36985302P 2002-04-05 2002-04-05
US60/369,853 2002-04-05
US60/369,852 2002-04-05
US10,324,221 2002-12-19
US10/324,221 US6852173B2 (en) 2002-04-05 2002-12-19 Liquid-assisted cryogenic cleaning
US10/403,147 2003-03-31
US10/403,147 US6949145B2 (en) 2002-04-05 2003-03-31 Vapor-assisted cryogenic cleaning
PCT/US2003/010354 WO2003086668A1 (en) 2002-04-05 2003-04-03 Fluid assisted cryogenic cleaning

Publications (1)

Publication Number Publication Date
AU2003233485A1 true AU2003233485A1 (en) 2003-10-27

Family

ID=29255566

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003233485A Abandoned AU2003233485A1 (en) 2002-04-05 2003-04-03 Fluid assisted cryogenic cleaning

Country Status (6)

Country Link
EP (1) EP1494821A4 (en)
JP (1) JP2005522056A (en)
KR (1) KR20040098054A (en)
CN (1) CN1665609A (en)
AU (1) AU2003233485A1 (en)
WO (1) WO2003086668A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040029494A1 (en) * 2002-08-09 2004-02-12 Souvik Banerjee Post-CMP cleaning of semiconductor wafer surfaces using a combination of aqueous and CO2 based cryogenic cleaning techniques
US7264679B2 (en) 2004-02-11 2007-09-04 Applied Materials, Inc. Cleaning of chamber components
RU2356700C1 (en) * 2007-07-30 2009-05-27 Эдуард Михайлович ГОЦ Method for vibration cutting and vibration cutter
PT103951A (en) * 2008-01-31 2009-07-31 Univ Nova De Lisboa PROCESSING OF ELECTRICAL AND / OR ELECTRONIC ELEMENTS IN CELLULOSIC MATERIAL SUBSTRATES
CN102476108A (en) * 2010-11-23 2012-05-30 中国科学院微电子研究所 High-temperature steam and water mixed jet cleaning system and method
US9925639B2 (en) * 2014-07-18 2018-03-27 Applied Materials, Inc. Cleaning of chamber components with solid carbon dioxide particles
JP2016093871A (en) * 2014-11-14 2016-05-26 株式会社東芝 Processing equipment and nozzle
JP2016093870A (en) * 2014-11-14 2016-05-26 株式会社東芝 Processing equipment
DE102015003942A1 (en) * 2015-03-26 2016-09-29 Linde Aktiengesellschaft Deburring of molded parts, in particular rubber moldings
CN106493121B (en) * 2016-11-01 2017-10-03 武汉大学 A kind of nanometer cleaning method based on active liquid and laser
TW202221789A (en) 2020-11-27 2022-06-01 南韓商Psk有限公司 Method and apparatus for treating substrate
CN114042684B (en) * 2022-01-12 2022-03-22 北京通美晶体技术股份有限公司 Indium phosphide wafer and mixed cleaning process thereof

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631250A (en) * 1985-03-13 1986-12-23 Research Development Corporation Of Japan Process for removing covering film and apparatus therefor
US4695327A (en) * 1985-06-13 1987-09-22 Purusar Corporation Surface treatment to remove impurities in microrecesses
DE3612586A1 (en) * 1986-04-15 1987-10-29 Messer Griesheim Gmbh METHOD FOR REMOVING MATERIAL REMAINS ON THE SURFACE OF WORKPIECES
JPH0349224A (en) * 1989-07-17 1991-03-04 Mitsubishi Electric Corp Treating method for substrate
US5377705A (en) * 1993-09-16 1995-01-03 Autoclave Engineers, Inc. Precision cleaning system
US5417768A (en) * 1993-12-14 1995-05-23 Autoclave Engineers, Inc. Method of cleaning workpiece with solvent and then with liquid carbon dioxide
US5931721A (en) * 1994-11-07 1999-08-03 Sumitomo Heavy Industries, Ltd. Aerosol surface processing
US5908510A (en) * 1996-10-16 1999-06-01 International Business Machines Corporation Residue removal by supercritical fluids
US6066032A (en) * 1997-05-02 2000-05-23 Eco Snow Systems, Inc. Wafer cleaning using a laser and carbon dioxide snow
US6306564B1 (en) * 1997-05-27 2001-10-23 Tokyo Electron Limited Removal of resist or residue from semiconductors using supercritical carbon dioxide
US6332470B1 (en) * 1997-12-30 2001-12-25 Boris Fishkin Aerosol substrate cleaner

Also Published As

Publication number Publication date
CN1665609A (en) 2005-09-07
WO2003086668A1 (en) 2003-10-23
KR20040098054A (en) 2004-11-18
EP1494821A4 (en) 2009-11-25
EP1494821A1 (en) 2005-01-12
JP2005522056A (en) 2005-07-21

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase