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AU408625B2 - Apparatus for measuring the thickness of dielectric members - Google Patents
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AU408625B2 - Apparatus for measuring the thickness of dielectric members - Google Patents

Apparatus for measuring the thickness of dielectric members

Info

Publication number
AU408625B2
AU408625B2 AU36306/68A AU3630668A AU408625B2 AU 408625 B2 AU408625 B2 AU 408625B2 AU 36306/68 A AU36306/68 A AU 36306/68A AU 3630668 A AU3630668 A AU 3630668A AU 408625 B2 AU408625 B2 AU 408625B2
Authority
AU
Australia
Prior art keywords
measuring
thickness
dielectric members
dielectric
members
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU36306/68A
Other versions
AU3630668A (en
Inventor
Joe Schmersal Larry
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Glass Inc
Original Assignee
Owens Illinois Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Illinois Inc filed Critical Owens Illinois Inc
Priority to AU36306/68A priority Critical patent/AU408625B2/en
Publication of AU3630668A publication Critical patent/AU3630668A/en
Application granted granted Critical
Publication of AU408625B2 publication Critical patent/AU408625B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
AU36306/68A 1968-04-11 1968-04-11 Apparatus for measuring the thickness of dielectric members Expired AU408625B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU36306/68A AU408625B2 (en) 1968-04-11 1968-04-11 Apparatus for measuring the thickness of dielectric members

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU36306/68A AU408625B2 (en) 1968-04-11 1968-04-11 Apparatus for measuring the thickness of dielectric members

Publications (2)

Publication Number Publication Date
AU3630668A AU3630668A (en) 1969-11-16
AU408625B2 true AU408625B2 (en) 1970-12-01

Family

ID=3723547

Family Applications (1)

Application Number Title Priority Date Filing Date
AU36306/68A Expired AU408625B2 (en) 1968-04-11 1968-04-11 Apparatus for measuring the thickness of dielectric members

Country Status (1)

Country Link
AU (1) AU408625B2 (en)

Also Published As

Publication number Publication date
AU3630668A (en) 1969-11-16

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