AU571334B2 - Focal plane scanning device - Google Patents
Focal plane scanning deviceInfo
- Publication number
- AU571334B2 AU571334B2 AU43598/85A AU4359885A AU571334B2 AU 571334 B2 AU571334 B2 AU 571334B2 AU 43598/85 A AU43598/85 A AU 43598/85A AU 4359885 A AU4359885 A AU 4359885A AU 571334 B2 AU571334 B2 AU 571334B2
- Authority
- AU
- Australia
- Prior art keywords
- mirror
- piezoceramic
- focal plane
- bracket
- flexure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000003287 optical effect Effects 0.000 claims description 23
- 238000000034 method Methods 0.000 claims description 11
- 230000033001 locomotion Effects 0.000 claims description 5
- 230000003213 activating effect Effects 0.000 claims 1
- 239000000919 ceramic Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000004411 aluminium Substances 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 238000010276 construction Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910001374 Invar Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 241001664469 Tibicina haematodes Species 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000010076 replication Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
FOCAL PLANE SCANNING DEVICE:
Infrared detection systems which operate over the 2 to 20μm wavelength region, and which are required to have an optical resolution of 1 mrad or less, conventionally employ either a 5. germanium refracting objective or a catadioptric objective such as a Schmidt system. The optical system is used in conjunction with a single infrared detector or array of detectors, associated signal processing electronics, and a suitable target 10. indicator device or display.
In order to detect targets over a substantial field of view, the small instantaneous field of view defined by the focal length of the optical system and the size of individual detectors may 15. be optically scanned through the total search field of view. This may be achieved, .for example, by means of rotating optical components which generate a line-by-line rectangular raster scan.
Alternatively, a large number of detectors 20. may be employed without scanning, i.e. a staring focal plane array system. This technique suffers from various limitations arising from the finite spacing between adjacent detectors.
A disadvantage of refractive and catadioptric 25. systems is their high unit cost. Furthermore, optomechanical scanning techniques which employ motor-driven components moving at high speed to generate the desired search field, add to system complexity and overall cost.
30. The object of the present invention is the construction of a low cost optical system
which incorporates a novel scanning technique to fill the gaps in optical coverage between adjacent sensors of a focal plane array of infrared detectors.
In accordance with the invention, the optical 5. system is of the Cassegrain type, both the primary and secondary mirrors being constructed of a metal such as aluminium. The secondary mirror is caused to vibrate by means of a piezoelectric drive unit, the angular displacement of this mirror being 10. of sufficient amplitude to scan the optical image by the desired amount at the focal plane.
Piezoelectric drive means for mirror oscillation have been proposed hertofore, see the specification of U.S. Patent No. 4,436,364, and Offenlegungsschrift
15. DE3035314, both by Lauer and Pfefferle, the first relating to a device comprising a pair of coplanar but oppositely actuated piezoceramic strips coupled to a mirror disposed between facing ends, the second relating to a single piezoceramic strip
20. extending to a mirror anchored on a second flexible strip normal to the first strip to give a modular motion, in each case the mirror being carried by the piezoceramic strip or strips.
The invention comprises a focal plane scanning 25. device arranged to move a mirror in an- optical scanning device such as an infrared scanner wherein the mirror is mounted to be angularly displaced by means of a piezoelectric assembly comprising at least a piezoelectric member connected to the 30. said mirror by means of a first flexure member to support the said mirror on a support bracket to allow the mirror to be tilted about a selected
axis relative to the said support bracket and at least a piezoelectric drive element carried on the said support and connected to the said mirror, characterised by a pair of piezoceramic 5. drive elements (4-5) arranged generally parallel to the plane of the said mirror (1) each connected at one end to the said support bracket (2) and extending in opposite direction past a first flexure member (3) which supports the said mirror (1),
10. and by flexure members (8-9) one on the other end of each of said piezoceramic drive elements (4-5) connecting that piezoceramic member to the said mirror (1) remote from the said first flexure member (3), whereby a balanced movement of the said
15. mirror (1) about the said first flexure member (3) results when said piezoceramic members (4-5) are oppositely energised.
To enable the invention to be fully understood an embodiment thereof will be described with reference 20. to the drawings in which -
FIG. 1 shows schematically a general arrangement of an embodiment.
FIG. 2 shows details of a piezoceramic drive element in plan (A) and side elevation (B), and
25. FIG. 3 is a central sectional view of the piezoelectric drive unit.
The primary and secondary mirrors are furnished with aspheric reflecting surfaces by means of computer-controlled machining. The quality of 30. these surfaces are such that for an f/1 system having a focal length of 75mm, the angular aberration
blur size is less than 1 mrad. The aspheric shape is either machined directly in the aluminium mirror, or follows an electroless nickel deposition onto a rough-machined aluminium mirror. The final 5. surface may be lightly polished and provided with a vacuum-deposited gold reflecting coating. Invar spacer rods are used to maintain precise separation between the primary and secondary mirrors following optical alignment.
10. Subsequent to the machining of the aspheric surfaces, further mirrors may be prepared by estab¬ lished replication processes.
Whilst various configurations of the piezo¬ electric drive unit have been devised, the basic
15. concept can be understood from FIG. 3. The light¬ weight mirror 1 is mounted on bracket 2 by means of a central flexure member 3. Two piezoceramic drive elements 4 and 5 are held in clamps 6 and 7. The opposite ends of the drive elements are
20. connected to dual flexure members 8 and 9 which in turn are connected to the mirror 1 through a load adjustment bracket 10. Application of a voltage to one or both of the drive elements produces a cantilever action which forces the
25. mirror 1 to turn about the axis of the central flexure member 3. An oscillating voltage causes the mirror to vibrate at the frequency of the applied voltage. The flexure members 8 and 9 have opposed notches 11 at each end portion to allow
30. flexing in a required plane. The central flexure member has only two opposed notches 12 to form a pivot normal to the flexure member 3.
It is possible with this general arrangement to produce a forced vibration of the mirror at the desired frequency. However, this method of operation may require a large applied voltage, 5. which could necessitate the use of transformers to step-up the voltage from associated power sources.
A convenient technique is to design and construct the mirror assembly in such a fashion that mechanical resonance is achieved at the desired
10. scan frequency. In this manner an oscillating voltage at the mechanical resonant frequency will produce a large mirror deflection at a low drive voltage. Course mechanical tuning is effected by varying mass loading via the load adjustment
15. bracket 10 in FIG. 3, and fine tuning is achieved by adjusting the effective driv*e length of the piezoceramic elements 4 and 5.
The piezoceramic drive elements are comprised of two lead-zirconate-titanate (PZT) rectangular
20. piezoceramic slabs 15 and 16, bonded one on each side of a metal strip 17 as illustrated in FIG. 2. The metal strip may be aluminium, steel or titanium; however, titanium is preferred for reasons of rigidity and lightness. The dimensions
25. of this trilaminar bender design are chosen according to theory to meet the electro-mechanical drive requirements of the scan unit assembly. Simple bilaminar bender designs, consisting of either two piezoceramic slabs or a single slab bonded
30. onto a metal strip, have also been investigated, but were found to be less suitable than the trilaminar construction.
The mirror can be made to vibrate by applying voltages of appropriate phase to both piezoceramic elements in parallel. However, a convenient arrange¬ ment is to drive one element only. The second 5. element then provides mechanical compensation and produces an electrical reference signal for the associated electronic drive circuit.
Scan units constructed as described herein have been operated at frequencies from 50 to 1000 Hz.
10. For a resonant system mechanically tuned to 100 Hz, the typical angular mirror deflection is -_l/3 mrad per volt (rms). Since a scan amplitude in the range 0.5 to 5 mrad would satisfy most requirements concerned with focal plane detector arrays, the drive voltage
15. can be readily derived from microelectronic circuits.
It should be understood that optical systems of the Cassegrain type have been widely u-s-ed. for many years, and methods of generating aspheric surfaces in metal mirrors are well know. The
20. trilaminar piezoceramic bender design has also been previously described. This invention deals with the construction of a low cost optical system, used in conjunction with the novel scan technique described herein to produce maximum optical coverage
25. at the focal plane for large arrays of infrared detectors. It may be noted, however, that the scan concept is not restricted to the simple optical arrangement shown in FIG. 1, but can be employed with other optical designs, and with systems operated
30. in the visible region of the spectrum.
From the foregoing it will be seen that the invention comprises an optical system specifically of the Cassegrain type wherein one of the optical components is caused to vibrate by virtue of a 5. piezoelectric drive unit as described herein, thereby causing the optical field of view to execute an oscillating motion at the focal plane.
A feature is an optical scan technique wherein a mirror or lens component of the optical 10. system is caused to vibrate by means of piezoceramic bender elements operated in cantilever fashion and connected to the said component via flexure members, such vibration producing an image scan motion in the focal plane of the optical system.
r-5. Such an optical system can be used with an array of infrared detectors positioned at the focal plane.
Claims
1. A focal plane scanning device arranged to move a mirror in an optical scanning device such as an infrared scanner wherein the mirror is mounted to be angularly displaced by means of
5. a piezoelectric assembly comprising at least a piezoelectric member connected to the said mirror by means of a first flexure member to support the said mirror on a support bracket to allow the mirror to be tilted about a selected axis
10. relative to the said support bracket and at least a piezoelectric drive element carried on the said support and connected to the said mirror characterised by a pair of piezoceramic elements (4-5) arranged generally parallel to the plane of the said mirror (1)
15. each connected at one end to the said support bracket (2) and extending in opposite directions past a first flexure member (3) which supports the said mirror (1), and by flexure members (8-9) one on the other end of each of said piezoceramic elements (4-5) connecting
20. that piezoceramic element to the said mirror (1) remote from the said first flexure member (3), whereby- a balanced movement of the said mirror (1) about the said first flexure member (3) results when at least one of said piezoceramic members (4—5) is energised.
2. A focal plane scanning device according to Claim 1 wherein the said mirror (1) is held against an adjustment bracket (10) and located by a central flexure member (3) secured to a bracket 5- (2) forming the said support, and the said piezo¬ ceramic elements (4 and 5) are rigidly held at their one said end to the said bracket (2) by clamps (7 and 8) and are connected at their other said ends by flexure pivots (8 and 9) to the said adjustmen 10. bracket (10).
3. A focal plane scanning device according to claim 2 wherein the said flexure members (8-9) comprise rods threaded at each end and having opposed notches (11) near each end adapted to 5. allow flexing in a plane normal to the axis of the said rod, one of said flexure members (8) being apertured to allow the other piezoceramic element to project therethrough.
4. A focal plane scanning device according to Claim 1, 2 or 3 characterised in that the mirror (1) and adjustment bracket (10) are arranged to have a mechanical resonance at the desired scan 5. frequency whereby to minimise drive required by the said piezoceramic elements (4-5).
5. The method of activating a focal plane scanning mirror as defined in Claim 1 wherein one of the said piezoceramic elements only is electrically driven and the other said piezoceramic drive element is arranged
5. to provide mechanical compensation and optionally produces an electrical reference signal for the associated electronic drive circuit.
6. The method of actuating a focal plane scanning mirror as defined in Claim 1 wherein both of the said piezoceramic elements are electrically driven but in opposite phase.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU43598/85A AU571334B2 (en) | 1984-05-24 | 1985-05-17 | Focal plane scanning device |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AUPG5164 | 1984-05-24 | ||
| AUPG516484 | 1984-05-24 | ||
| AU43598/85A AU571334B2 (en) | 1984-05-24 | 1985-05-17 | Focal plane scanning device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| AU4359885A AU4359885A (en) | 1985-12-13 |
| AU571334B2 true AU571334B2 (en) | 1988-04-14 |
Family
ID=25626421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU43598/85A Ceased AU571334B2 (en) | 1984-05-24 | 1985-05-17 | Focal plane scanning device |
Country Status (1)
| Country | Link |
|---|---|
| AU (1) | AU571334B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69327233T2 (en) * | 1992-03-09 | 2000-05-31 | The Commonwealth Of Australia, Canberra | INFRARED INTRUSION SENSOR |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1438974A (en) * | 1920-11-13 | 1922-12-19 | Western Electric Co | Piezo-electrical voltage indicator |
| EP0075063A1 (en) * | 1981-09-23 | 1983-03-30 | Siemens-Albis Aktiengesellschaft | Scanning device |
| US4436364A (en) * | 1980-09-18 | 1984-03-13 | Erwin Sick Gmbh Optik-Elektronik | Piezoelectric apparatus for producing rotary oscillation of a mirror |
-
1985
- 1985-05-17 AU AU43598/85A patent/AU571334B2/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1438974A (en) * | 1920-11-13 | 1922-12-19 | Western Electric Co | Piezo-electrical voltage indicator |
| US4436364A (en) * | 1980-09-18 | 1984-03-13 | Erwin Sick Gmbh Optik-Elektronik | Piezoelectric apparatus for producing rotary oscillation of a mirror |
| EP0075063A1 (en) * | 1981-09-23 | 1983-03-30 | Siemens-Albis Aktiengesellschaft | Scanning device |
Also Published As
| Publication number | Publication date |
|---|---|
| AU4359885A (en) | 1985-12-13 |
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