CN101936780A - A wavefront sensor with two cone mirrors - Google Patents
A wavefront sensor with two cone mirrors Download PDFInfo
- Publication number
- CN101936780A CN101936780A CN 201010253165 CN201010253165A CN101936780A CN 101936780 A CN101936780 A CN 101936780A CN 201010253165 CN201010253165 CN 201010253165 CN 201010253165 A CN201010253165 A CN 201010253165A CN 101936780 A CN101936780 A CN 101936780A
- Authority
- CN
- China
- Prior art keywords
- wavefront
- lens
- sided cone
- sided
- cone mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 210000001747 pupil Anatomy 0.000 claims abstract description 39
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 claims description 11
- 239000011159 matrix material Substances 0.000 claims description 10
- 238000001514 detection method Methods 0.000 claims description 5
- 230000004044 response Effects 0.000 claims description 5
- 239000013598 vector Substances 0.000 claims description 5
- 238000005516 engineering process Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 4
- 230000014509 gene expression Effects 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- 238000012625 in-situ measurement Methods 0.000 claims 1
- 230000004075 alteration Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000005070 sampling Methods 0.000 description 6
- 206010073261 Ovarian theca cell tumour Diseases 0.000 description 5
- 208000001644 thecoma Diseases 0.000 description 5
- 230000009467 reduction Effects 0.000 description 3
- 230000003044 adaptive effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 206010010071 Coma Diseases 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
技术领域technical field
本发明涉及一种波前传感器,特别是一种两面锥镜的波前传感器,属于自适应光学、波前探测等技术领域的关键器件。The invention relates to a wavefront sensor, in particular to a wavefront sensor with two conical mirrors, which belongs to key devices in the technical fields of adaptive optics, wavefront detection and the like.
背景技术Background technique
波前传感器是自适应系统中测量波前畸变的重要器件,根据测量信号与波面之间的联系可以分为两类:一类是通过测量波前斜率(即波前一阶导数)获得波前相位,较典型的有哈特曼波前传感器,剪切干涉仪等;另一类是测量波前曲率(即波前二阶导数)来获得波前相位,主要有曲率波前传感器。The wavefront sensor is an important device for measuring wavefront distortion in an adaptive system. According to the connection between the measurement signal and the wavefront, it can be divided into two categories: one is to obtain the wavefront by measuring the slope of the wavefront (ie, the first derivative of the wavefront) Phase, the more typical Hartmann wavefront sensor, shearing interferometer, etc.; the other is to measure the wavefront curvature (ie, the second derivative of the wavefront) to obtain the wavefront phase, mainly curvature wavefront sensor.
最常用的哈特曼波前传感器使用微透镜阵列对入射光瞳进行分割,通过测量透镜阵列焦面上像斑的质心坐标与参考波前质心坐标之差求解波前斜率。另外一种光瞳分光的波前传感器利用N(N>1)个棱面的棱锥将入射波面分束,进而测量波前畸变(1983年授权的美国专利US4399356“Optical wavefront sensing system”)。The most commonly used Hartmann wavefront sensor uses a microlens array to segment the entrance pupil, and calculates the wavefront slope by measuring the difference between the centroid coordinates of the image spot on the focal plane of the lens array and the reference wavefront centroid coordinates. Another pupil-splitting wavefront sensor uses N (N>1) pyramids to split the incident wavefront to measure wavefront distortion (US Patent US4399356 "Optical wavefront sensing system" issued in 1983).
这两类波前传感器都是一种分波前的波前传感器,其空间采样率由子孔径数目决定,每个子孔径需要若干个CCD像素以探测光斑中心,而增加子孔径数目将对光电成像元件的像素数提出更高的要求,而且光能利用率较低。These two types of wavefront sensors are wavefront sensors that divide the wavefront, and their spatial sampling rate is determined by the number of sub-apertures. Each sub-aperture needs several CCD pixels to detect the center of the spot, and increasing the number of sub-apertures will affect the photoelectric imaging element. The number of pixels puts forward higher requirements, and the utilization rate of light energy is low.
2002年授权的澳大利亚专利AU2003267457A1“Pyramid sensorfor determing the wave aberration of the human eye”利用金字塔形状的折射镜将会聚的入射光在焦平面分成4束,接着利用中继透镜成像到CCD图像探测器,通过比较同一方向光瞳像光强之差得到测量信号,然后利用线性重构矩阵复原待测波前,这种传感器被称为四棱锥波前传感器(PWFS)。它与前面两种分波前的波前传感器相比较,CCD每一像素相当于一个子孔径,具有采样率高且易于改变、光能利用率高等优点(A&A,350,L23-L26,1999,Opt.Commun,268,189-195,2006)。The Australian patent AU2003267457A1 "Pyramid sensor for determining the wave aberration of the human eye" authorized in 2002 uses a pyramid-shaped refracting mirror to divide the converging incident light into 4 beams at the focal plane, and then uses a relay lens to image the image to the CCD image detector. The measured signal is obtained by comparing the light intensity difference of the pupil image in the same direction, and then the wavefront to be measured is restored by using the linear reconstruction matrix. This sensor is called a pyramidal wavefront sensor (PWFS). Compared with the previous two sub-wavefront wavefront sensors, each pixel of the CCD is equivalent to a sub-aperture, which has the advantages of high sampling rate, easy change, and high light energy utilization (A&A, 350, L23-L26, 1999, Opt. Commun, 268, 189-195, 2006).
PWFS的核心器件是一个金字塔形状的折射棱镜,简称四棱锥,其作用是在频谱面对入射波进行分束,因此对其表面粗糙度与棱边的平台宽度有严格的要求(SPIE,Vol.4007,423-430,2000)。虽然加工四棱锥的技术不断的改进,但目前生产合格四棱锥仍存在加工难度大,易于在屋脊棱边的尖端产生较宽平台,因而影响波前探测(Microelectronic Engineering67-68,566-573,2003;PhD Thesis,Joana Büchler costa.2005)。此外,使用无调制的PWFS测量波前差时,模式法复原波前所用的重构矩阵无解析解,需要现场进行测量(Appl.0pt,47,79-87,2008)。The core device of PWFS is a pyramid-shaped refracting prism, referred to as quadrangular pyramid. Its function is to split the incident wave in the spectrum, so there are strict requirements on its surface roughness and edge platform width (SPIE, Vol. 4007, 423-430, 2000). Although the technology of processing quadrangular pyramids has been continuously improved, it is still difficult to produce qualified quadrangular pyramids at present, and it is easy to produce a wider platform at the tip of the edge of the roof, thus affecting the wavefront detection (Microelectronic Engineering67-68, 566-573, 2003 ; PhD Thesis, Joana Büchler costa. 2005). In addition, when using the non-modulated PWFS to measure the wavefront difference, the reconstruction matrix used to restore the wavefront by the mode method has no analytical solution and needs to be measured on site (Appl. Opt, 47, 79-87, 2008).
发明内容Contents of the invention
本发明的目的是利用具有两面锥镜的波前传感器克服了传统哈特曼波前传感器空间采样率低、光能利用率低,四棱锥波前传感器制作困难且线性重构矩阵需要在实际光路进行测量的缺点。The purpose of the present invention is to use the wavefront sensor with two conical mirrors to overcome the low spatial sampling rate and low light energy utilization rate of the traditional Hartmann wavefront sensor, the difficulty in making the quadrangular pyramidal wavefront sensor and the need for linear reconstruction matrix in the actual optical path. Disadvantages of taking measurements.
为达成所述目的,本发明提供的具有两面锥镜的波前传感器的技术解决方案是:具有两个两面锥镜、一个分束镜BS、四个透镜和两个CCD图像探测器,入射畸变波前经分束镜BS分成两束光线,每一路光都经过一个两面锥镜和两个透镜组成的4f缩束系统,两个两面锥镜的两个屋脊棱边相互正交摆放,并且它们的屋脊棱边分别与第一透镜或第三透镜的焦点重合,其中一个两面锥镜将入射畸变波前沿水平方向分光,另一个两面锥镜将入射畸变波前沿竖直方向分光,然后经第二透镜或第四透镜后,其光瞳共轭像被成像到各自CCD图像探测器;其中4f缩束系统的两个透镜共用一个焦平面,且两个透镜的焦距不等;CCD图像探测器与计算机相连,利用计算机读取光瞳像,并比较水平方向或竖直方向两个光瞳像的光强分布差异可以得到两个方向的测量信号,再利用波前复原算法重构波前相位。In order to achieve the stated purpose, the technical solution of the wavefront sensor with two axicons provided by the present invention is: with two axicons, a beam splitter BS, four lenses and two CCD image detectors, the incident distortion The wavefront is divided into two beams of light by the beam splitter BS, and each light passes through a 4f beam reduction system composed of a two-sided axicon and two lenses. The two roof edges of the two two-sided axicons are placed orthogonally to each other, and Their roof edges coincide with the focal points of the first lens or the third lens respectively. One of the two axicons splits the incident distorted wavefront in the horizontal direction, and the other two axicons split the incident distorted wavefront in the vertical direction, and then passes through the first After the second lens or the fourth lens, the pupil conjugate images are imaged to the respective CCD image detectors; the two lenses of the 4f beam reduction system share a focal plane, and the focal lengths of the two lenses are not equal; the CCD image detectors Connect with the computer, use the computer to read the pupil image, and compare the light intensity distribution difference of the two pupil images in the horizontal direction or vertical direction to obtain the measurement signals in the two directions, and then use the wavefront restoration algorithm to reconstruct the wavefront phase .
本发明与现有技术相比有如下优点:Compared with the prior art, the present invention has the following advantages:
(1)本发明的具有两面锥镜的波前传感器,与哈特曼波前传感器相比,具有采样率高(相同的CCD靶面),光能利用率高的优点。(1) Compared with the Hartmann wavefront sensor, the wavefront sensor with two conical mirrors of the present invention has the advantages of high sampling rate (same CCD target surface) and high utilization rate of light energy.
(2)本发明的两面锥镜的波前传感器,所用的两面锥镜具有容易加工,棱边仅由两个平面形成,不易产生平台。(2) In the wavefront sensor of the double-sided axicon of the present invention, the used two-sided axicon is easy to process, and the edge is only formed by two planes, so it is not easy to produce a platform.
(3)本发明的两面锥镜的波前传感器,与四棱锥波前传感器相比,采用模式法复原波前的时候,重构矩阵可由解析式计算无需现场测量,拥有比四棱锥波前传感器更高的波前复原精度。(3) The wavefront sensor of the two-sided cone mirror of the present invention, compared with the quadrangular pyramidal wavefront sensor, when adopting the model method to restore the wavefront, the reconstruction matrix can be calculated without on-site measurement by the analytical formula, and has a larger ratio than the quadrangular pyramidal wavefront sensor Higher wavefront restoration accuracy.
附图说明Description of drawings
图1为本发明两面锥镜的波前传感器的原理图;Fig. 1 is the schematic diagram of the wavefront sensor of two conical mirrors of the present invention;
图2a为第一CCD图像探测器获取的沿水平方向分光后的光瞳像光强示意图;Figure 2a is a schematic diagram of the light intensity of the pupil image obtained by the first CCD image detector after splitting light along the horizontal direction;
图2b为彗差沿水平方向的分光后在第一CCD图像探测器上的光瞳像分布图;Fig. 2b is the pupil image distribution diagram on the first CCD image detector after the coma aberration is split along the horizontal direction;
图3a为第二CCD图像探测器获取的沿水平方向分光后的光瞳像光强示意图;Figure 3a is a schematic diagram of the light intensity of the pupil image obtained by the second CCD image detector after splitting light along the horizontal direction;
图3b为彗差沿水平方向的分光后在第二CCD图像探测器上的光瞳像分布图;Fig. 3b is the pupil image distribution diagram on the second CCD image detector after the coma aberration is split along the horizontal direction;
图4a至图4c为本发明两面锥镜的波前传感器采用模式法对彗差波前复原的仿真结果。Fig. 4a to Fig. 4c are the simulation results of coma aberration wavefront restoration by the wavefront sensor of the two conical mirrors of the present invention using the mode method.
具体实施方式Detailed ways
为使本发明的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本发明进一步详细说明。In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
如图1示出的本发明两面锥镜的波前传感器的原理图,本发明由两个两面锥镜、一个分束镜BS、四个透镜和两个CCD图像探测器构成。入射畸变波前经分束镜BS分成两束光线,每一路光都经过一个两面锥镜和两个透镜L1、L2(或两个透镜L3、L4)组成的4f缩束系统,两个两面锥镜的两个屋脊棱边相互正交摆放,并且它们的屋脊棱边分别与第一透镜L1或第三透镜L3的焦点重合,其中一个两面锥镜将入射畸变波前沿水平方向分光,然后经第二透镜L2,另一个两面锥镜将入射畸变波前沿竖直方向分光,然后经第四透镜L4后,其光瞳共轭像被成像到各自CCD图像探测器。其中4f缩束系统的两个透镜共用一个焦平面,且两个透镜的焦距不等;两个CCD图像探测器分别与计算机相连,利用计算机读取光瞳像,并比较水平方向或竖直方向两个光瞳像的光强分布差异可以得到两个方向的测量信号,再利用波前复原算法重构波前相位。As shown in Figure 1, the principle diagram of the wavefront sensor of the two-sided axicon of the present invention, the present invention is made of two two-sided axicons, a beam splitter BS, four lenses and two CCD image detectors. The incident distorted wavefront is divided into two beams of light by the beam splitter BS, and each light passes through a 4f narrowing system composed of a two-sided cone mirror and two lenses L 1 , L 2 (or two lenses L 3 , L 4 ). The two roof edges of the two two-sided axicons are placed orthogonally to each other, and their roof edges coincide with the focal points of the first lens L1 or the third lens L3 respectively, and one of the two-sided axicons will incident the distortion wavefront The light is split in the horizontal direction, and then through the second lens L 2 , another two-sided cone mirror splits the light in the vertical direction of the incident distorted wavefront, and then after passing through the fourth lens L 4 , the pupil conjugate image is imaged to the respective CCD image detectors . Among them, the two lenses of the 4f beam reduction system share a focal plane, and the focal lengths of the two lenses are not equal; the two CCD image detectors are connected to the computer respectively, and the pupil image is read by the computer, and the horizontal or vertical direction is compared The light intensity distribution difference of the two pupil images can obtain the measurement signals in two directions, and then the wavefront phase can be reconstructed by using the wavefront restoration algorithm.
所述分束镜BS具有任意分光比。The beam splitter BS has an arbitrary beam splitting ratio.
所述两个两面锥镜包括第一两面锥镜1和第二两面锥镜2,所述屋脊棱边为第一两面锥镜1具有第一屋脊棱边11和第二两面锥镜2具有第二屋脊棱边21,所述第一屋脊棱11与所述第二屋脊棱21相互正交摆放,分别放置在第一透镜L1和第三透镜L3的焦平面,并且第一屋脊棱边11和第二屋脊棱边21正对第一透镜L1和第三透镜L3焦点。Described two two-sided axicons comprise the first two-sided axicon 1 and the second two-sided axicon 2, and the first two-sided axicon 1 has the first roof edge 11 and the second two-sided axicon 2 has the first two-sided axicon 2. Two roof edges 21, the first roof edge 11 and the second roof edge 21 are placed orthogonally to each other, respectively placed on the focal planes of the first lens L 1 and the third lens L 3 , and the first roof edge The edge 11 and the second roof edge 21 are at the focal point of the first lens L 1 and the third lens L 3 .
所述四个透镜中第一透镜L1和第三透镜L3的焦距分别为f1,第二透镜L2和第四透镜L4焦距分别为f2,决定光瞳像大小,其中,D为入射波前孔径。Among the four lenses, the focal lengths of the first lens L 1 and the third lens L 3 are respectively f 1 , the focal lengths of the second lens L 2 and the fourth lens L 4 are respectively f 2 , Determine the pupil image size, where D is the incident wavefront aperture.
所述的两面锥镜为传统光学器件加工工艺制作的折射型两面锥镜;两面锥镜的底角M为相邻的光瞳像中心距离与光瞳像的比值,f1为第一透镜L1和第三透镜L3的焦距,n为材料的折射率。Described two-sided axicon is the refraction type two-sided axicon that traditional optics processing technology makes; The base angle of two-sided axicon M is the ratio of the center distance of adjacent pupil images to the pupil image, f 1 is the focal length of the first lens L 1 and the third lens L 3 , n is the refractive index of the material.
所述相邻的光瞳像中心距离与光瞳像的比值为M>2。The ratio of the center distance of the adjacent pupil images to the pupil images is M>2.
所述两面锥镜的底面和屋脊面镀增透膜,面形中间的棱宽小于所述两面锥镜的顶角接近180°,λ为波长。The bottom surface and the roof surface of the two cone mirrors are plated with an anti-reflection film, and the surface shape is The middle rib width is less than The apex angle of the two conical mirrors is close to 180°, and λ is the wavelength.
所述两个CCD图像探测器的像素大小相等,每个CCD图像探测器的靶面的最短长度要大于 The pixel sizes of the two CCD image detectors are equal, and the shortest length of the target surface of each CCD image detector is greater than
采用模式法进行波前复原时,待测畸变波前可以描述为其中Zm(x,y)为第m阶的Zernike多项式,am为相应的系数,N表示所取的Zernike阶数,(x,y)为待测畸变波前的坐标。所用响应矩阵由N个列向量构成,第m列向量由 两个解析式给出,其中,P(x)和P(y)分别表示过探测点(x,y)垂直于坐标轴y和x的直线与光瞳函数P边界的交点,λ为波长,(x′,y′)表示坐标系(x,y)中任意点的坐标,所以无需现场测量。When the model method is used for wavefront restoration, the distorted wavefront to be measured can be described as Among them, Z m (x, y) is the Zernike polynomial of order m, a m is the corresponding coefficient, N represents the Zernike order taken, and (x, y) is the coordinate of the distortion wavefront to be measured. The response matrix used consists of N column vectors, and the mth column vector is given by Two analytical formulas are given, wherein, P(x) and P(y) respectively represent the intersection point of the line perpendicular to the coordinate axes y and x through the detection point (x, y) and the boundary of the pupil function P, λ is the wavelength, (x', y') represents the coordinates of any point in the coordinate system (x, y), so no on-site measurement is required.
设两面锥镜波前传感器的入射光瞳处的光场为:Let the light field at the entrance pupil of the wavefront sensor with two conical mirrors be:
其中u0和φ(x,y)分别表示入射光场的振幅和相位,x和y表示待测畸变的坐标,i表示虚部单位,P为光瞳函数,λ为波长,入射光场被分束镜BS分成两路,其透射率与反射率之比等于a/b,两路光线分别经过两面锥镜和4f系统后,在CCD图像探测器的靶面上形成的光瞳像,其中I1,I2为第一CCD图像探测器获取的待测畸变波前沿水平方向分光后形成的光瞳像光强,其分布见图2a;图2b为彗差(第7阶Zernike模式,Z7)沿水平方向的分光后在第一CCD图像探测器上的光瞳像分布图;I3和I4为第二CCD图像探测器获取的待测畸变波前沿竖直方向分光后形成的光瞳像光强,其分布见图3a;图3b为彗差(第7阶Zernike模式,Z7)沿水平方向的分光后在第二CCD图像探测器上的光瞳像分布图。通过比较同一方向两个光瞳像之间的光强差异可以得到测量信号Sx和Sy,测量信号与畸变波前之间的关系式为:where u 0 and φ(x, y) represent the amplitude and phase of the incident light field respectively, x and y represent the coordinates of the distortion to be measured, i represents the imaginary part unit, P is the pupil function, λ is the wavelength, and the incident light field is The beam splitter BS is divided into two paths, and the ratio of its transmittance to reflectivity is equal to a/b. After the two paths of light pass through the two conical mirrors and the 4f system respectively, the pupil image formed on the target surface of the CCD image detector, among them I 1 and I 2 are the light intensity of the pupil image obtained by the first CCD image detector after splitting light in the horizontal direction of the distortion wavefront to be measured, and its distribution is shown in Fig. 2a; Fig. 2b is the coma aberration (the seventh-order Zernike mode, Z 7 ) Pupil image distribution diagram on the first CCD image detector after light splitting along the horizontal direction; I3 and I4 are the light formed after the vertical direction splitting of the distortion wavefront to be measured obtained by the second CCD image detector The distribution of the light intensity of the pupil image is shown in Fig. 3a; Fig. 3b is the distribution diagram of the pupil image on the second CCD image detector after the coma aberration (7th order Zernike mode, Z 7 ) is split along the horizontal direction. By comparing the light intensity difference between two pupil images in the same direction, the measurement signals S x and S y can be obtained. The relationship between the measurement signal and the distorted wavefront is:
公式(2)和(3)中积分上下限P(x)和P(y)分别表示过探测点(x,y)垂直于坐标轴y和x的直线与光瞳函数P边界的交点,(x′,y′)表示坐标系(x,y)中任意点的坐标。f1和f2分别表示4f系统中两个透镜的焦距,所述两个透镜为第一透镜L1和第三透镜L3、第二透镜L2和第四透镜L4。In the formulas (2) and (3), the upper and lower limits of integration P(x) and P(y) represent the intersection points of the line perpendicular to the coordinate axes y and x and the boundary of the pupil function P through the detection point (x, y), respectively, ( x', y') represent the coordinates of any point in the coordinate system (x, y). f 1 and f 2 respectively denote the focal lengths of two lenses in the 4f system, the two lenses being the first lens L 1 and the third lens L 3 , the second lens L 2 and the fourth lens L 4 .
使用Zernike模式表示待测畸变波前像差:Zm(x,y)为第m阶的Zernike多项式,am为相应的系数,N表示所取的Zernike阶数。当较小时,公式(2)和(3)中的正弦函数可用其泰勒展开式中的第一项来近似表示,于是上面两式可以写成:Use the Zernike mode to represent the measured distortion wavefront aberration: Z m (x, y) is the Zernike polynomial of order m, a m is the corresponding coefficient, and N represents the Zernike order taken. when When small, the sine function in formulas (2) and (3) can be approximated by the first term in its Taylor expansion, so the above two formulas can be written as:
Sx和Sy是前N阶Zernike项在系数较小时各阶信号Gxm和Gym的线性叠加。当待测像差较大时,公式(2)和(3)到公式(4)和(5)的近似过程将会产生较大的误差,因而测量结果只能体现待测畸变波前的方向。这时可以使用变形镜对入射光场进行负反馈校正,使校正后残余相位误差逐渐减小,直至达到需要的校正精度为止,从而通过这种闭环操作可以得到待测畸变波前。S x and S y are the linear superposition of signals G xm and G ym of each order when the coefficients of the first N order Zernike terms are small. When the aberration to be measured When it is larger, the approximation process from formulas (2) and (3) to formulas (4) and (5) will produce larger errors, so the measurement results can only reflect the direction of the distortion wavefront to be measured. At this time, the deformable mirror can be used to perform negative feedback correction on the incident light field, so that the residual phase error after correction is gradually reduced until the required correction accuracy is achieved, so that the measured distortion wavefront can be obtained through this closed-loop operation.
采用模式法波前复原时,可预先求解Gxm与Gym的解析解,然后按照实际光学系统的空间采样率进行数值离散,由此建立线性响应矩阵G,此时,公式(4)和(5)的矩阵形式可以表示为S=GA,A为Zernike系数向量,进一步采用奇异值分解法(SVD)求出此响应矩阵的广义逆G+。M表示待测畸变波前的空间采样率,N表示模式复原时所取Zernike模式阶数,待测波前的各阶Zernike系数通过下式计算:When using the model method for wavefront restoration, the analytical solutions of G xm and G ym can be solved in advance, and then numerically discretized according to the spatial sampling rate of the actual optical system, thereby establishing a linear response matrix G. At this time, formulas (4) and ( The matrix form of 5) can be expressed as S=GA, A is the Zernike coefficient vector, and the generalized inverse G + of this response matrix is further obtained by using the singular value decomposition method (SVD). M represents the spatial sampling rate of the distorted wavefront to be measured, N represents the order of the Zernike mode taken when the mode is restored, and the Zernike coefficients of each order of the wavefront to be measured are calculated by the following formula:
A=G+S. (8)A=G + S. (8)
其中,
采用两面锥波前传感器测量波面时,响应矩阵G的各项可以由解析式(6)和(7)直接算出,而四棱锥的相应表达式中含有信号之间的交叉项,不能用解析式得到。When the wavefront is measured by a two-sided conical wavefront sensor, the items of the response matrix G can be directly calculated by the analytical formula (6) and (7), while the corresponding expression of the square pyramid contains the cross term between the signals, and the analytical formula cannot be used get.
图4a至图4c为本发明两面锥镜的波前传感器采用模式法对彗差(第7阶Zernike模式,Z7)波前复原的仿真结果,其中图4a为原始波前,图4b为复原波前,图4c为残余波前。Fig. 4a to Fig. 4c are the simulation results of the wavefront restoration of the coma (the 7th order Zernike mode, Z 7 ) by the wavefront sensor of the two conical mirrors of the present invention using the mode method, wherein Fig. 4a is the original wavefront, and Fig. 4b is the restoration wavefront, Figure 4c is the residual wavefront.
以上所述,仅为本发明中的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉该技术的人在本发明所揭露的技术范围内,可理解想到的变换或替换,都应涵盖在本发明的权利要求书的保护范围之内。The above is only a specific implementation mode in the present invention, but the scope of protection of the present invention is not limited thereto. Anyone familiar with the technology can understand the conceivable transformation or replacement within the technical scope disclosed in the present invention. All should be covered within the scope of protection of the claims of the present invention.
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102531651A CN101936780B (en) | 2010-08-12 | 2010-08-12 | Wavefront sensor with two-sided cone mirror |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102531651A CN101936780B (en) | 2010-08-12 | 2010-08-12 | Wavefront sensor with two-sided cone mirror |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101936780A true CN101936780A (en) | 2011-01-05 |
| CN101936780B CN101936780B (en) | 2012-02-22 |
Family
ID=43390228
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102531651A Expired - Fee Related CN101936780B (en) | 2010-08-12 | 2010-08-12 | Wavefront sensor with two-sided cone mirror |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101936780B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106646895A (en) * | 2017-01-13 | 2017-05-10 | 湖北工业大学 | Laser beam shaping device and laser beam shaping method based on spatial light modulator |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6917426B2 (en) * | 2002-01-29 | 2005-07-12 | The Boeing Company | Real-time wavefront sensor system |
| CN101078636A (en) * | 2007-06-28 | 2007-11-28 | 中国科学院光电技术研究所 | Hartmann wavefront sensor capable of eliminating stray light of system |
| US20080225229A1 (en) * | 2007-03-14 | 2008-09-18 | Noriko Saito | Wavefront aberration compensating apparatus and opthalmologic unit having the same |
| CN101344640A (en) * | 2008-09-03 | 2009-01-14 | 中国科学院光电技术研究所 | A Shaker-Hartmann Wavefront Sensor in an Adaptive Optics System |
| CN101614593A (en) * | 2009-07-28 | 2009-12-30 | 中国科学院光电技术研究所 | A Reflective Pyramid Wavefront Sensor |
-
2010
- 2010-08-12 CN CN2010102531651A patent/CN101936780B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6917426B2 (en) * | 2002-01-29 | 2005-07-12 | The Boeing Company | Real-time wavefront sensor system |
| US20080225229A1 (en) * | 2007-03-14 | 2008-09-18 | Noriko Saito | Wavefront aberration compensating apparatus and opthalmologic unit having the same |
| CN101078636A (en) * | 2007-06-28 | 2007-11-28 | 中国科学院光电技术研究所 | Hartmann wavefront sensor capable of eliminating stray light of system |
| CN101344640A (en) * | 2008-09-03 | 2009-01-14 | 中国科学院光电技术研究所 | A Shaker-Hartmann Wavefront Sensor in an Adaptive Optics System |
| CN101614593A (en) * | 2009-07-28 | 2009-12-30 | 中国科学院光电技术研究所 | A Reflective Pyramid Wavefront Sensor |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106646895A (en) * | 2017-01-13 | 2017-05-10 | 湖北工业大学 | Laser beam shaping device and laser beam shaping method based on spatial light modulator |
| CN106646895B (en) * | 2017-01-13 | 2019-05-10 | 湖北工业大学 | A laser beam shaping device and method based on spatial light modulator |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101936780B (en) | 2012-02-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101936779B (en) | Double-optical-wedge spliced rectangular pyramid wavefront sensor | |
| CN102735348B (en) | Wavefront measurement method based on Hartmann wavefront sensor | |
| CN102252832B (en) | Large aperture collimation system wavefront quality detection device and method | |
| CN104677507B (en) | Wide-spectrum shack-Hartmann wavefront sensor absolute calibration device and method | |
| CN103335950B (en) | Device and method for measuring atmospheric turbulence non-isoplanatic wavefront error and turbulence characteristic parameters | |
| CN106644105B (en) | Wavefront sensor, detection method and system based on double helix point spread function | |
| CN104239740B (en) | Mode wavefront restoration method based on Hartmann wavefront sensor | |
| CN109520625B (en) | Wavefront sensor | |
| CN102095385A (en) | A Novel Spherical Absolute Measuring System and Method | |
| CN113325575B (en) | A polarization aberration correction system for a free-form surface optical system | |
| CN108519671A (en) | A closed-loop correction control method for phase translation error of spliced telescope system | |
| CN102749143A (en) | Wavefront reconstruction method for improving measurement accuracy of shack-Hartmann wavefront sensor | |
| Zhu et al. | 600-mm aperture simultaneous phase-shifting Fizeau interferometer | |
| CN103471561B (en) | A kind of three-dimensional small-angle and method | |
| CN114323310B (en) | High-resolution Hartmann wavefront sensor | |
| CN116187395A (en) | A Convolutional Neural Network-Based Detection Method for Block Mirror Translation and Tilt Errors | |
| CN102589472B (en) | Method for highly precisely eliminating adjustment error in spherical surface shape interference detection | |
| CN101936780B (en) | Wavefront sensor with two-sided cone mirror | |
| CN103969031B (en) | Method of least square measures the method for liquid crystal corrector response matrix | |
| Ge et al. | High-accuracy and full-frequency surface measurement method for specular element based on stereo deflectometry | |
| Li et al. | Co-phase error detection for segmented mirrors with ptychography | |
| CN115683364B (en) | Spiral phase shift interferometry method and system based on vortex optical phase modulation | |
| CN112097682B (en) | Method, device and system for detecting convex surface shape of convex lens | |
| CN110793465A (en) | Multi-surface large-dynamic-range synchronous measurement method for micro-transmission element | |
| CN214502843U (en) | Splicing detection system based on shack Hartmann wavefront sensor |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120222 Termination date: 20170812 |