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GB2248685A - High-resolution vision system for part inspection - Google Patents
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GB2248685A - High-resolution vision system for part inspection - Google Patents

High-resolution vision system for part inspection Download PDF

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Publication number
GB2248685A
GB2248685A GB9119777A GB9119777A GB2248685A GB 2248685 A GB2248685 A GB 2248685A GB 9119777 A GB9119777 A GB 9119777A GB 9119777 A GB9119777 A GB 9119777A GB 2248685 A GB2248685 A GB 2248685A
Authority
GB
United Kingdom
Prior art keywords
vision system
inspection
objects
coupled device
charge coupled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB9119777A
Other versions
GB9119777D0 (en
GB2248685B (en
Inventor
Stanley Turcheck
Randy K Baird
James P Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FMC Corp
Original Assignee
FMC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/583,256 external-priority patent/US5103304A/en
Priority claimed from US07/583,117 external-priority patent/US5233328A/en
Priority claimed from US07/586,167 external-priority patent/US5157486A/en
Priority claimed from US07/586,189 external-priority patent/US5142591A/en
Application filed by FMC Corp filed Critical FMC Corp
Publication of GB9119777D0 publication Critical patent/GB9119777D0/en
Publication of GB2248685A publication Critical patent/GB2248685A/en
Application granted granted Critical
Publication of GB2248685B publication Critical patent/GB2248685B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Program-control systems
    • G05B19/02Program-control systems electric
    • G05B19/418Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/02Comparing digital values
    • G06F7/026Magnitude comparison, i.e. determining the relative order of operands based on their numerical value, e.g. window comparator
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T9/00Image coding
    • G06T9/20Contour coding, e.g. using detection of edges
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/40Extraction of image or video features
    • G06V10/50Extraction of image or video features by performing operations within image blocks; by using histograms, e.g. histogram of oriented gradients [HoG]; by summing image-intensity values; Projection analysis
    • G06V10/507Summing image-intensity values; Histogram projection analysis
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Computational Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

A camera sensor 16 may include a charge coupled device used to provide high-resolution in both an X and a Y axis. Data from the charge coupled device resulting from a standard part is stored for comparison with data of parts 11 under inspection. The data from the standard and inspected parts may be digitised and compacted to reduce memory requirements and processing time. <IMAGE>

Description

1 HIGH-RESOLUTION VISION SYSTEM FOR PART INSPECTION
BACKGROUND OF THE INVENTION
The present invention pertains to a system for the inspection of objects such as parts to be assembled, and more particularly, to a vision system capable of a high resolution for a detailed inspection and/or orientation of objects.
vision systems are widely used to view a part being moved past an inspection station and compare the part with a standard part to determine if the inspected part is within acceptable tolerances. Vision systems are also used to inspect a part and determine if the part should be rotated about an axis in order f or the part to be placed into the proper orientation for connection to another part. Currently available inspection and/or orientation systems are relatively expensive and many are designed for use with a specific application.
SUMMARY OF THE INVENTION
The present invention provides a relatively inexpensive high-resolution vision system which is useful in a variety of applications. Accordingly the present invention comprises a vision system for inspection of objects, said system comprising:
2 a camera sensor for sequentially observing plurality of individual objects; storage means for recording a size and a shape of a standard object to which similar objects can be compared; and comparison means for individually comparing a size and a shape of each of a plurality of similar objects to said standard object.
In a preferred form, a visual resolution of.0025 inches (0.064 mm) in both the X axis and in the Y axis is provided, e.g. by means of a charge coupled device used to scan a standard object. The size, shape and desired orientation of the standard object is placed in a storage device and these values are compared with values of size, shape and orientation of an object being inspected. An output signal indicates that the tested object is within acceptable tolerances or that it is outside these tolerances. output signals can also be used to rotate or otherwise orient the tested object for connection to other objects. A microprocessor controller operates at a sample rate which is several times as high as the inspection sample rate of an object, so a multiple number of image edges of the tested object can be inspected.
A clock synchronisation circuit may be connected to the charge coupled device and an analog to digital converter and data compaction circuit may be used to process the CCD output. The stored signals from a standard object may be similarly processed, and the result compared directly with the processed signals obtained from objects under inspection.
a 3 A method of comparing sets of compacted digital data, suitable for use in connection with the present invention is disclosed in our co-pending application entitled "METHOD FOR PROCESSING COMPACTED DATA"; filed on even date herewith.
These and other features of the invention will be apparent from the following description of a preferred embodiment, made by way of example and with reference to the drawings, wherein:-
Figure 1 illustrates a parts feeder with which the present invention can be used.
Figure 2 is a block diagram of a vision system of the present invention.
Figure 3 is a detailed block diagram of a portion of the vision system of Figure 2.
Figure 4 illustrates some of the electronic signals used in Figure 3.
Figures SA, 5B comprise a circuit drawing of the vision system shown in Figure 2.
As shown, a vision system of the present invention is used to inspect and/or orient objects such as parts 11 which can be moved past an inspection station by a parts feeder 10 (Fig. 1). Feeder 10 singulates a plurality of parts 11 which are moved past a light source 12 and a geometric parts sensor 16. Parts sensor 16 senses the geometry of each part and provides signals to a vision controller and interface 17. A position sensor 18 senses the position of each part 11 as it approaches a part diverter 22. Diverter 22 can be used to 4 reorient parts or to move parts into an output trough 23.
Interface 17 (Figs. 2, 3, 5A, 5B) includes a CPU controller 24 having a microprocessor 28 and a plurality of input/output modules 29, 30. One CPU controller which can be used is the Model 68000 made by Motorola Corporation, Phoenix, Arizona. Parts sensor 16 includes a charge coupled device (CCD) 34 (Fig. 3) having an array for recording an image of a part being sensed. CCD 34 includes a one inch (2.54 cm) size linear array of 2048 pixels for recording an image of a part being sensed. A clocking and synchronizing circuit 35 provides a clock signal at a frequency of 10 MHz to scan CCD 34 and serially move the image information to an isolation and amplifying circuit 36. Waveform a of Figure 4 illustrates the signals which are sent to circuit 36 from CCD 34. A black signal pulse (waveform b, Fig. 4) from controller 24 enables a black sample and hold circuit 36a to check the level of analog signals from CCD 34.
The analog signals from circuit 36 are converted to digital signals by an analog-to-digital (A to D) converter 40. A transition detector and data compaction circuit 41 compacts the digital data by recording the changes in levels of the serial digital data received by circuit 41. Because - the number of changes in signal level may be only a fraction of the number (2048) of bits from each scan of the array in CCD 34, the amount of data stored in a data buffer 42 can be greatly reduced below the number 2048. Transition detector 41 includes a counter (not shown) which is rest by a pulse of waveform c (Fig. 4) to synchronize the counter with the arrival of a first pixel of information from a scan of CCD 34. When data buffer 42 contains information from a complete scan of CCD 34, buffer 42 sends an output ready signal (OR) to controller 24. When controller 24 is ready to receive the stored data, controller 24 sends a shift out (SO) signal to buffer 42 and data is transferred over a data line 46 to controller 24. Controller 24 synchronizes operations of sensor 16 using a master reset (MR) signal of waveform d (Fig. 4) to clocking circuit 35 when sufficient time has been allowed for data to be shifted serially from CCD 34. Controller 24 also sends control signals to a systems controller 47 which provides power to operate sensor 16 and controller 24.
When Figure 5A is placed to the left of Figure 5B the lines from the right side of Figure 5A connect to the lines from the left side of Figure 5B to form a detailed circuit of the vision system disclosed in Figure 3.
When parts are to be inspected in feeder 10 (Fig. 1), a standard part is moved past parts sensor 16 and data from sensor 16 (Fig. 3) is stored in CPU controller 24. The parts to be tested are then moved past sensor 16 (Fig. 1) and data from each part is compared with data from the standard part to determine if the tested part is acceptable. It is not necessary to expand the compacted data from either the standard part or from the test part. When the standard part and the tested part are identical, the compacted data from the 6 standard part and the compacted data from the tested part will be the same. When the tested part is only slightly different than the standard part, compacted data from the two parts will be only slightly different but within acceptable tolerances.
output information from CPU controller 24 (Figs. 2, 3, 5) is connected to a display unit 48 (Fig. 2) through a connector board 52 or to other output devices, such as printers, by ports 53 - 55. Instructions can be entered into controller 24 from a keyboard 59 (Fig. 2).
The present invention provides a high resolution, but inexpensive vision system for inspecting and/or orienting parts. A charge coupled device includes 2048 pixels which provides information concerning a plurality of part edges to identify each part passing a sensor.

Claims (6)

Although the best mode contemplated for carrying out the present invention has been herein shown and described, it will be apparent that modification and variation may be made without departing from what is regarded to be the subject matter of the invention as defined in the Claims. 7 CLAIMS:
1. A vision system for an inspection of objects, said system comprising: a camera sensor for sequentially observing a plurality of individual objects; storage means for recording a size and a shape of a standard object to which similar objects can be compared; and comparison means for individually comparing a size and a shape of each of a plurality of similar objects to said standard object.
2. A vision system as defined in Claim 1 including means for providing a visual resolution of.0025 inches (0.064 mm) of an object in both an X axis and in a Y axis.
3. A vision system as def ined in Claim 1 or Claim 2 wherein said camera sensor includes a charge coupled device, a clock synchronisation circuit coupled to said charge coupled device, an analog to digital converter for converting an output of said charge coupled device into digital signals and a compaction circuit for compacting said digital signals.
4. A vision system as claimed in Claim 3 wherein the comparison means compares the compacted digital signals 8 obtained from inspection of an object by means of the system with compacted digital signals held in the storage means and obtained from inspection of the standard object by means of the system.
5. A vision system as defined in any of Claims 1, 2 or 3, including a microprocessor controller, said controller operating at a sample rate which is a multiple of a part inspection rate to enable a multiple number of image edges of each object to be inspected each time an object is inspected.
6. A vision system for inspection of objects substantially as described with reference to or as shown in the drawings.
GB9119777A 1990-09-17 1991-09-16 High-resolution vision system for part inspection Expired - Fee Related GB2248685B (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US07/583,256 US5103304A (en) 1990-09-17 1990-09-17 High-resolution vision system for part inspection
US07/583,117 US5233328A (en) 1990-09-17 1990-09-17 Method for processing compacted data
US07/586,167 US5157486A (en) 1990-09-21 1990-09-21 High resolution camera sensor having a linear pixel array
US07/586,189 US5142591A (en) 1990-09-21 1990-09-21 High resolution camera with hardware data compaction
US58693990A 1990-09-24 1990-09-24
US58744890A 1990-09-25 1990-09-25

Publications (3)

Publication Number Publication Date
GB9119777D0 GB9119777D0 (en) 1991-10-30
GB2248685A true GB2248685A (en) 1992-04-15
GB2248685B GB2248685B (en) 1994-10-19

Family

ID=27560152

Family Applications (6)

Application Number Title Priority Date Filing Date
GB9119780A Expired - Fee Related GB2248934B (en) 1990-09-17 1991-09-16 Automatic windowing for article recognition
GB9119774A Expired - Fee Related GB2248931B (en) 1990-09-17 1991-09-16 High resolution parts handling system
GB9119777A Expired - Fee Related GB2248685B (en) 1990-09-17 1991-09-16 High-resolution vision system for part inspection
GB9119775A Expired - Fee Related GB2248932B (en) 1990-09-17 1991-09-16 Method for processing compacted data
GB9119778A Expired - Fee Related GB2248686B (en) 1990-09-17 1991-09-16 High resolution camera sensor having a linear pixel array
GB9119776A Expired - Fee Related GB2248933B (en) 1990-09-17 1991-09-16 High resolution camera with hardware data compaction

Family Applications Before (2)

Application Number Title Priority Date Filing Date
GB9119780A Expired - Fee Related GB2248934B (en) 1990-09-17 1991-09-16 Automatic windowing for article recognition
GB9119774A Expired - Fee Related GB2248931B (en) 1990-09-17 1991-09-16 High resolution parts handling system

Family Applications After (3)

Application Number Title Priority Date Filing Date
GB9119775A Expired - Fee Related GB2248932B (en) 1990-09-17 1991-09-16 Method for processing compacted data
GB9119778A Expired - Fee Related GB2248686B (en) 1990-09-17 1991-09-16 High resolution camera sensor having a linear pixel array
GB9119776A Expired - Fee Related GB2248933B (en) 1990-09-17 1991-09-16 High resolution camera with hardware data compaction

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE9801170L (en) * 1998-04-02 1999-10-03 Photonic Systems Ab Method and system for monitoring or scanning an object, material or the like
CN105136045B (en) * 2015-09-22 2018-01-05 北京佰能盈天科技有限公司 One kind collection volume station, which is coiled, surveys long method
CN108445808B (en) * 2018-03-30 2024-08-27 深圳一清创新科技有限公司 Sensing device and method for data synchronization

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4678920A (en) * 1985-06-17 1987-07-07 General Motors Corporation Machine vision method and apparatus
US4711579A (en) * 1986-08-12 1987-12-08 H. Fred Johnston System for automatically inspecting a flat workpiece for holes
US4858156A (en) * 1985-05-22 1989-08-15 Soudronic Ag Apparatus for examining objects

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4509075A (en) * 1981-06-15 1985-04-02 Oxbridge, Inc. Automatic optical inspection apparatus
US4608709A (en) * 1983-03-08 1986-08-26 Owens-Illinois, Inc. Method and apparatus for gauging containers
GB8314778D0 (en) * 1983-05-27 1983-07-06 Pa Management Consult Adaptive pattern recognition

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4858156A (en) * 1985-05-22 1989-08-15 Soudronic Ag Apparatus for examining objects
US4678920A (en) * 1985-06-17 1987-07-07 General Motors Corporation Machine vision method and apparatus
US4711579A (en) * 1986-08-12 1987-12-08 H. Fred Johnston System for automatically inspecting a flat workpiece for holes

Also Published As

Publication number Publication date
GB2248686B (en) 1994-12-14
GB2248931B (en) 1995-01-04
GB2248932B (en) 1994-10-12
GB9119775D0 (en) 1991-10-30
GB9119780D0 (en) 1991-10-30
GB9119777D0 (en) 1991-10-30
GB2248933B (en) 1994-08-31
GB2248685B (en) 1994-10-19
GB9119778D0 (en) 1991-10-30
GB2248934A (en) 1992-04-22
GB2248934B (en) 1994-11-30
GB2248686A (en) 1992-04-15
GB2248931A (en) 1992-04-22
GB9119776D0 (en) 1991-10-30
GB2248933A (en) 1992-04-22
GB9119774D0 (en) 1991-10-30
GB2248932A (en) 1992-04-22

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040916