JP2553662B2 - Hologram range finder - Google Patents
Hologram range finderInfo
- Publication number
- JP2553662B2 JP2553662B2 JP63229116A JP22911688A JP2553662B2 JP 2553662 B2 JP2553662 B2 JP 2553662B2 JP 63229116 A JP63229116 A JP 63229116A JP 22911688 A JP22911688 A JP 22911688A JP 2553662 B2 JP2553662 B2 JP 2553662B2
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- Japan
- Prior art keywords
- light
- measured
- splitting
- distance measuring
- parallel light
- Prior art date
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- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は、光を用いて物体の変位を非接触で測定する
光学的測距装置、特にホログラムを用い干渉縞パターン
から距離を測定するホログラム測距装置に関するもので
ある。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical distance measuring device that measures the displacement of an object using light in a non-contact manner, and more particularly, a hologram distance measuring device that measures a distance from an interference fringe pattern using a hologram. It relates to the device.
従来の技術 従来の光学的測距装置の構成を図面に基づいて以下に
説明する。第8図は従来の光学的測距装置のブロック図
である。1はレーザ、2は図中のX方向にビームを走査
する第1の偏向ミラー、3は図中のY方向にビームを走
査する第2の偏向ミラー、4は被測定物体、5はその被
測定物体4からの反射光を集光する集光レンズ、6は集
光レンズの後方に配置されたラインセンサである。2. Description of the Related Art The configuration of a conventional optical distance measuring device will be described below with reference to the drawings. FIG. 8 is a block diagram of a conventional optical distance measuring device. 1 is a laser, 2 is a first deflection mirror for scanning a beam in the X direction in the figure, 3 is a second deflection mirror for scanning a beam in the Y direction in the figure, 4 is an object to be measured, and 5 is an object to be measured. A condenser lens for condensing the reflected light from the measurement object 4 and a line sensor 6 arranged behind the condenser lens.
次にこの従来例の光学的測距装置の原理を第9図を用
いて説明する。第9図においてSを集光レンズ5の中
心、Lをレーザ1からの出射ビームの中心、Oを被測定
物体4上の点、θ及びφを各々点Oからの反射ビーム、
レーザ1からの出射ビームが基線LSと成す角度とし、D
を基線LSの長さと置けば点Oまでの距離hは式(1)で
表される。Next, the principle of the conventional optical distance measuring apparatus will be described with reference to FIG. In FIG. 9, S is the center of the condenser lens 5, L is the center of the emitted beam from the laser 1, O is a point on the object to be measured 4, and θ and φ are reflected beams from the point O, respectively.
The angle formed by the beam emitted from the laser 1 and the base line LS, D
If is set to the length of the base line LS, the distance h to the point O is expressed by the equation (1).
h=DtanθtanΦ(tanθ+tanΦ) ……式(1) ここで角度θは集光レンズ5の光軸の向きであり式
(2)で与えられる tanθ=f/d ……式(2) f:集光レンズ5の焦点距離 d:集光レンズ5の中心点と、ラインセンサ6上のビーム
検出点の距離 従って、第1及び第2の偏向ミラー2、3によりX方
向及びY方向にレーザビームを走査し、ラインセンサ6
上に集光させたラインセンサ6上のビーム検出点Sと出
射ビームの中心L及び被測定物体4上の点Oの間で式
(1)、式(2)を解くことにより被測定物体4の距離
hを測定できる。h = D tan θ tanΦ (tan θ + tan Φ) Equation (1) Here, the angle θ is the direction of the optical axis of the condenser lens 5 and is given by Equation (2) tan θ = f / d Equation (2) f: Focus Focal length d of lens 5: distance between the center point of the condenser lens 5 and the beam detection point on the line sensor 6. Therefore, the first and second deflection mirrors 2 and 3 scan the laser beam in the X and Y directions. Line sensor 6
The object to be measured 4 is solved by solving the equations (1) and (2) between the beam detection point S on the line sensor 6 condensed above, the center L of the outgoing beam and the point O on the object to be measured 4. The distance h can be measured.
発明が解決しようとする課題 しかしながら上記の様な構成では、式(1)、式
(2)から、測距精度はd即ち、集光レンズ5の中心点
とラインセンサ6上のビーム検出点の距離の検出精度で
決まる。ところが、ラインセンサ6上のビーム検出点の
検出分解能はラインセンサ6の構成セルの大きさで決ま
り、測距精度は数10μmのオーダとなってしまい、精密
な組立作業を行う組立ロボット等に用いるには精度が不
充分であった。SUMMARY OF THE INVENTION However, in the above-mentioned configuration, from the formulas (1) and (2), the distance measurement accuracy is d, that is, the center point of the condenser lens 5 and the beam detection point on the line sensor 6. Determined by the distance detection accuracy. However, the detection resolution of the beam detection point on the line sensor 6 is determined by the size of the constituent cells of the line sensor 6, and the distance measurement accuracy is on the order of several tens of μm, which is used for an assembly robot or the like that performs precise assembly work. Was not accurate enough.
本発明は、上記従来の光学的測距装置の課題を解決す
ることを目的とする。An object of the present invention is to solve the problems of the conventional optical distance measuring device.
課題を解決するための手段 本発明のホログラム測距装置は、光源から発せられた
ビームを2つの光路に分割する第1のビーム分割手段
と、この2分割された光路の少なくとも一方に配置され
た非平行光変換手段と、この非平行光変換手段により非
平行光化されたビームを透過及び反射し一方のビームを
被測定物体に照射する第2のビーム分割手段と、前記被
測定物体からの反射光と、前記第1のビーム分割手段に
より2分割されたもう一方のビームとを合波する第1の
ビーム合波手段と、この合波光を2分割する第3のビー
ム分割手段と、この第3のビーム分割手段により分割さ
れた一方の光路中に配置された前記合波光により形成さ
れる干渉縞を記録する光空間変調素子と、この光空間変
調素子からの記録パターン読み出し光と前記第3のビー
ム分割手段により分割された一方のビームを合波する第
2のビーム合波手段と、前記光空間変調素子への記録光
の入射を遮断するビーム遮断手段とを備えた事を特徴と
するものである。Means for Solving the Problems A hologram distance measuring apparatus according to the present invention is arranged in at least one of a first beam splitting unit for splitting a beam emitted from a light source into two optical paths and this optical path divided into two. The non-parallel light converting means, the second beam splitting means for transmitting and reflecting the beam converted into the non-parallel light by the non-parallel light converting means, and irradiating one of the beams to the object to be measured, A first beam combining means for combining the reflected light and the other beam divided into two by the first beam dividing means; a third beam dividing means for dividing the combined light into two; An optical spatial modulation element for recording an interference fringe formed by the combined light, which is arranged in one optical path divided by the third beam splitting means, a recording pattern reading light from this optical spatial modulation element, and the 3's A second beam combining means for combining one of the beams divided by the beam dividing means, and a beam blocking means for blocking the incidence of the recording light on the spatial light modulator. Is.
作用 本発明は、上記した構成により、ある基準位置におい
て、被測定物体に非平行光化された光を照射し、被測定
物体からの反射光と参照光との干渉縞を光空間変調素子
に記録し、この光空間変調素子に読みだし光を照射して
得られる基準干渉縞パターンと、この被測定物体が任意
の位置にある時に前記非平行光を照射し、被測定物体か
ら得られる反射光と参照光との干渉縞を形成し、この干
渉縞パターンと基準干渉縞から、被測定物体の変位を測
定可能とすることで光の波長オーダの精度で被測定物体
の変位を測定可能としたものである。Action The present invention, by the above-described configuration, irradiates the object to be measured with non-parallelized light at a certain reference position, and causes the interference fringes of the reflected light from the object to be measured and the reference light to the spatial light modulator. A reference interference fringe pattern obtained by recording and irradiating the spatial light modulator with read light and the reflection obtained from the measured object by irradiating the non-parallel light when the measured object is at an arbitrary position. By forming interference fringes of light and reference light, and measuring the displacement of the measured object from the interference fringe pattern and the reference interference fringes, the displacement of the measured object can be measured with the accuracy of the wavelength order of light. It was done.
実施例 以下に本発明をその実施例を示す図面に基づいて説明
する。Embodiments The present invention will be described below with reference to the drawings illustrating the embodiments.
第1図は、本発明のホログラム測距装置にかかる第1
の実施例の平面図である。10は第1のレーザでありその
出射光は略平行光である。11aは第1のレーザ10から発
せられたビームを2つの光路に分解する第1のビーム分
割手段、11bは光路変換手段、12はこの2分割された光
路の一方に配置された非平行光変換手段であり、2つの
レンズから成る共焦点光学系である。これによりビーム
は発散あるいは収束光すなわち非平行光に変換される。
13は第1のビーム分割手段11により2分割された、もう
一方の光路中に配置されたビームエクスパンダー、14は
ビーム平行光度調整手段12により非平行光化されたビー
ムを透過及び反射し、その透過光を被測定物体15に照射
する第2のビーム分割手段、16は被測定物体15からの反
射光と、第1のビーム分割手段11により2分割されたも
う一方のビームとを合波する第1のビーム合波手段、17
はこの合波光を2分割する第3のビーム分割手段、18は
光空間変調素子であり、第3のビーム分割手段17の透過
光路中に配置されている、19及び20は各々第3のビーム
分割手段17により2分割された残る一方の光路の光路変
換手段である。21は光空間変調素子18の読み出し用の第
2のレーザ、22は光空間変調素子18からの記録パターン
読み出し光と第3のビーム分割手段17により分割された
一方のビームを合波する第2のビーム光波手段、23はそ
の第2のビーム合波手段22により重畳された干渉縞パタ
ーンを撮像するTVカメラ、24は光空間変調素子18への記
録光の入射を遮断するビーム遮断手段である。FIG. 1 shows the first embodiment of the hologram distance measuring device of the present invention.
It is a top view of an Example of. Reference numeral 10 is a first laser, and its emitted light is substantially parallel light. Reference numeral 11a is a first beam splitting means for splitting the beam emitted from the first laser 10 into two optical paths, 11b is an optical path changing means, and 12 is a non-parallel light converting means arranged in one of the two divided optical paths. The means is a confocal optical system including two lenses. As a result, the beam is converted into diverging or converging light, that is, non-parallel light.
Reference numeral 13 denotes a beam expander which is divided into two by the first beam splitting means 11 and which is arranged in the other optical path, and 14 transmits and reflects the beam which is made non-parallel light by the beam parallel light intensity adjusting means 12, A second beam splitting means for irradiating the measured object 15 with the transmitted light, and 16 combines the reflected light from the measured object 15 and the other beam split into two by the first beam splitting means 11. First beam combining means for
Is a third beam splitting means for splitting the combined light into two, 18 is a spatial light modulator, and is arranged in the transmission optical path of the third beam splitting means 17, and 19 and 20 are third beams, respectively. It is an optical path conversion means for the other optical path which is split into two by the splitting means 17. Reference numeral 21 is a second laser for reading the spatial light modulating element 18, and 22 is a second laser for multiplexing the recording pattern reading light from the spatial light modulating element 18 and one beam split by the third beam splitting means 17. Beam light wave means 23, a TV camera 23 for picking up the interference fringe pattern superimposed by the second beam combiner 22, and 24 a beam cutoff means for blocking the incidence of recording light on the spatial light modulator 18. .
以上の様に構成された本発明の第1の実施例の動作に
ついて第1図〜第5図を用いて説明する。The operation of the first embodiment of the present invention configured as described above will be described with reference to FIGS.
先ず初めに、被測定物体15が第1図に示した基準位置
Z=Z0に有る場合、第1のレーザ10からビームを照射す
る。この出射光は略平行光でありかつ、第1のビーム分
割手段11aで透過光と反射光に2分割される。この反射
光は光路変換手段11bにより光路を略直角に変換し、非
平行光変換手段12に入射させる、この非平行変換手段12
の例えば後側のレンズの焦点位置を調整することで、第
1のレーザ10の略平行光である出射光を第1図に示した
様に発散光に変換する。この発散光は第2のビーム分割
手段14により反射光と透過光に2分割される。この透過
光は基準位置に有る被測定物体15に照射され、その反射
光は再び第2のビーム分割手段14により反射され第1の
ビーム合波手段16に入射し、これを透過する。First, when the measured object 15 is at the reference position Z = Z 0 shown in FIG. 1, the beam is emitted from the first laser 10. This emitted light is substantially parallel light and is split into two by the first beam splitting means 11a into transmitted light and reflected light. The reflected light is converted into a substantially right angle by the optical path changing means 11b and is incident on the non-parallel light converting means 12.
For example, by adjusting the focal position of the lens on the rear side, the emitted light which is substantially parallel light of the first laser 10 is converted into divergent light as shown in FIG. This divergent light is split into two by the second beam splitting means 14 into reflected light and transmitted light. The transmitted light is applied to the object to be measured 15 at the reference position, and the reflected light is reflected by the second beam splitting means 14 again, enters the first beam combining means 16, and is transmitted therethrough.
他方、第1のビーム分割手段11aで2分割されたもう
一方のビームは、ビームエクスパンダー13により拡大さ
れ第1のビーム合波手段16により反射される。On the other hand, the other beam divided into two by the first beam splitting means 11a is expanded by the beam expander 13 and reflected by the first beam combining means 16.
従って、第1のビーム合波手段16により被測定物体15
からの反射光が物体光となり、ビームエクスパンダー13
を透過した光が参照光に相当して第3図に示した様な同
心円状の干渉縞が形成される。この干渉縞は拡散光と平
行光すなわち、球面波と平面波の波面の曲率差に起因す
る1種のニュートンリングであり、その干渉縞ピッチは
波長/2である。この干渉縞パターンは第3のビームスプ
リッタ17により反射光と透過光に分離されが、透過光は
ビーム遮断手段24に入射するが、この時はビーム遮断手
段24はオン状態となっており透過させるので、光は空間
光変調素子18に入射する。Therefore, the measured object 15 is measured by the first beam combining means 16.
The reflected light from becomes the object light, and the beam expander 13
The light that has passed through corresponds to the reference light, and concentric interference fringes as shown in FIG. 3 are formed. This interference fringe is one kind of Newton ring caused by the difference in curvature between the diffused light and the parallel light, that is, the wavefront of the spherical wave and the plane wave, and the pitch of the interference fringe is wavelength / 2. This interference fringe pattern is separated into reflected light and transmitted light by the third beam splitter 17, and the transmitted light is incident on the beam blocking means 24, but at this time, the beam blocking means 24 is in the ON state and is transmitted. Therefore, the light enters the spatial light modulator 18.
この空間光変調素子18の構成を第4図に示す。30はネ
マチック液晶層、31は反射層、32はカバーガラス、33は
透明電極、34は光伝導体、35は遮光層、36は液晶配向膜
でり透明電極33間には電圧が印加されている。干渉縞パ
ターンが光伝導体34側から入射すると、光が照射された
部分は光伝導体34のインピーダンスが低下し、光が照射
されていない部分と比較して高い電圧が印加される。そ
の結果、干渉縞パターンに相当する電圧パターンがネマ
チック液晶層30に印加されネマチック液晶層30の液晶分
子の配向状態が、空間的に変調されて基準位置Z=Z0に
於ける被測定物体15と参照光が形成する干渉縞パターン
が空間光変調素子18に記録される。The structure of the spatial light modulator 18 is shown in FIG. 30 is a nematic liquid crystal layer, 31 is a reflective layer, 32 is a cover glass, 33 is a transparent electrode, 34 is a photoconductor, 35 is a light shielding layer, 36 is a liquid crystal alignment film, and a voltage is applied between the transparent electrodes 33. There is. When the interference fringe pattern is incident from the photoconductor 34 side, the impedance of the photoconductor 34 is lowered in the portion irradiated with light, and a higher voltage is applied as compared with the portion not irradiated with light. As a result, a voltage pattern corresponding to the interference fringe pattern is applied to the nematic liquid crystal layer 30, the alignment state of the liquid crystal molecules of the nematic liquid crystal layer 30 is spatially modulated, and the measured object 15 at the reference position Z = Z 0 is measured. The interference fringe pattern formed by the reference light is recorded in the spatial light modulator 18.
次に被測定物体15が第2図を用いて任意の測定位置Z
=Z1の位置に変位した場合について説明する。図中の番
号10〜24はすべて、第1図と同じものを示す。この時
も、被測定物体15が基準位置Z=Z0に有った時と同様に
第1のビーム合波手段16により、非平行光変換手段1を
透過し発散光に変換されたビームの被測定物体15からの
反射光が物体光となり、ビームエクスパンダー13を透過
した光が参照光に相当して同心円状に干渉縞が形成され
る。Next, the measured object 15 is measured at an arbitrary measurement position Z using FIG.
The case where the position is displaced to the position of = Z 1 will be described. All the numbers 10 to 24 in the figure indicate the same as in FIG. At this time as well, as in the case where the measured object 15 is at the reference position Z = Z 0 , the beam transmitted through the non-parallel light converting means 1 and converted into divergent light by the first beam combining means 16 The reflected light from the measured object 15 becomes the object light, and the light transmitted through the beam expander 13 corresponds to the reference light, and interference fringes are concentrically formed.
しかしながら、この任意の測定位置Z=Z1における発
散光の波面の曲率は基準位置Z=Z0における曲率とは異
なるすなわち、光波長が長い分だけZ=Z1の位置に於け
る波面の曲率は小さくなる。従って、第5図に示した様
に干渉縞ピッチが広くなる。However, the curvature of the wavefront of the divergent light at this arbitrary measurement position Z = Z 1 is different from the curvature at the reference position Z = Z 0, that is, the curvature of the wavefront at the position of Z = Z 1 is equal to the longer light wavelength. Becomes smaller. Therefore, the interference fringe pitch becomes wider as shown in FIG.
この任意の測定位置Z=Z1に被測定物体15が有る場合
は、ビーム遮断手段24はオフ状態となっているので第5
図に示した干渉縞パターンは空間光変調素子18には書き
込まれず、光路変換手段19、20により光路を変換され、
第2のビーム合波手段22に入射する。If the measured object 15 is present at this arbitrary measurement position Z = Z 1 , the beam blocking means 24 is in the OFF state, so
The interference fringe pattern shown in the figure is not written in the spatial light modulator 18, the optical path is changed by the optical path changing means 19, 20,
It is incident on the second beam combining means 22.
他方、第2のレーザ21により空間光変調素子18を照射
すると、空間光変調素子18は前述した様にネマリック液
晶層30の液晶分子の配向状態が、空間的に変調されて基
準位置Z=Z0に於ける被測定物体15と参照光が形成する
干渉縞パターンが記録されているので、第2のレーザ21
からの入射光の偏光状態が空間的に変調される。従っ
て、空間光変調素子18からの反射光を偏光ビームスプリ
ッター(図示せず)を介して第2のビーム合波手段22に
入射する構成とすることで、あるいは第2のビーム合波
手段22そのものを偏光ビームスプリッターとすること
で、この入射光の強度パターンを基準位置Z=Z0に於け
る被測定物体15と参照光が形成する干渉縞パターンとす
ることができる。On the other hand, when the spatial light modulator 18 is irradiated with the second laser 21, the spatial light modulator 18 spatially modulates the alignment state of the liquid crystal molecules of the nematic liquid crystal layer 30 as described above, and the reference position Z = Z. Since the interference fringe pattern formed by the measured object 15 and the reference light at 0 is recorded, the second laser 21
The polarization state of the incident light from is spatially modulated. Therefore, the reflected light from the spatial light modulator 18 is made incident on the second beam combining means 22 via a polarization beam splitter (not shown), or the second beam combining means 22 itself. Is a polarization beam splitter, the intensity pattern of the incident light can be an interference fringe pattern formed by the reference light and the object 15 to be measured at the reference position Z = Z 0 .
従ってTVカメラ23で撮像される画像は、被測定物体15
が基準位置Z=Z0に有る時の干渉縞パターンと、測定位
置Z=Z1に有る時の干渉縞パターンが重畳されたものと
なるので、この2つの干渉縞の比較から波長/2の分解能
で発散光の曲率変化すなわち、Z0とZ1の距離を測定でき
る。Therefore, the image captured by the TV camera 23 is the measured object 15
The interference fringe pattern at the reference position Z = Z 0 and the interference fringe pattern at the measurement position Z = Z 1 are superimposed. With the resolution, it is possible to measure the curvature change of divergent light, that is, the distance between Z 0 and Z 1 .
すなわち、本実施例によれば発散光を物体光とし平行
光を参照光とする干渉縞を、被測定物体がある基準位置
有る時にまず空間光変調素子に記録しこの干渉縞パター
ンと、測定物体が任意の測定位置に有る時の干渉縞パタ
ーンを重畳して比較することで、波長/2の分解能で精度
よく被測定物体の変位を測定できる。That is, according to the present embodiment, interference fringes using divergent light as object light and parallel light as reference light are first recorded in the spatial light modulator when the measured object has a reference position, and this interference fringe pattern and the measured object By superimposing and comparing the interference fringe patterns when is at an arbitrary measurement position, the displacement of the object to be measured can be accurately measured with a resolution of wavelength / 2.
次に、本発明の第2の実施例について第6図を用いて
説明する。第6図は本発明の第2の実施例の可変非平行
光変換手段40の構成図である。40aは第1の凸レンズ、4
0bは第2の凸レンズ、40cは第2の凸レンズ40bの焦点位
置可変手段であり例えば、モータとギア列から構成され
ている。以上の様に構成らえた可変非平行光変換手段40
を第1図及び第2図に示したホログラム測距装置に用い
いれば、物体光の非平行光度すなわち波面の曲率を任意
に設定できるので、被測定物体の位置が基準位置および
測定位置において参照光との間で形成される干渉縞のピ
ッチおよび縞本数を、所望の測定距離範囲言い換えれば
物体光の曲率の変化範囲に対して最適な値に設定するこ
とができ、例えば組立ロボットの視覚装置として用いる
場合、作業内容に応じてダイナミックレンジと精度の選
択が可能となる。Next, a second embodiment of the present invention will be described with reference to FIG. FIG. 6 is a block diagram of the variable non-parallel light converting means 40 of the second embodiment of the present invention. 40a is the first convex lens, 4
Reference numeral 0b is a second convex lens, and 40c is a focal position changing means of the second convex lens 40b, which is composed of, for example, a motor and a gear train. Variable non-parallel light converting means 40 configured as described above
1 is used in the hologram distance measuring apparatus shown in FIGS. 1 and 2, the non-parallel light intensity of the object light, that is, the curvature of the wavefront can be arbitrarily set, so that the position of the measured object can be referred to at the reference position and the measurement position. The pitch of interference fringes formed with light and the number of fringes can be set to an optimum value for a desired measurement distance range, in other words, a change range of the curvature of the object light, for example, a visual device of an assembly robot. When used as, the dynamic range and accuracy can be selected according to the work content.
次に、本発明の第3の実施例について第7図を用いて
説明する。50は焦点距離が異なる2つのレンズからなる
共焦点光学系であり50aは焦点距離がf1である第1の凸
レンズ、50bは焦点距離がf2である第2の凸レンズであ
り、これら2つのレンズは共焦点光学系を構成してい
る。Next, a third embodiment of the present invention will be described with reference to FIG. 50 is a confocal optical system consisting of two lenses with different focal lengths, 50a is a first convex lens with a focal length of f1, 50b is a second convex lens with a focal length of f2, and these two lenses are It constitutes a confocal optical system.
この共焦点光学系50を第1図および第2図に示したホ
ログラム測距装置の第1のビーム合波手段16と第3のビ
ーム分割手段17の間に配置する。この共焦点光学系50を
介することで、物体光の波面の曲率の被測定物体15の距
離位置による変化率は、第1及び第2の凸レンズの焦点
距離の比すなわち(f2/f1)の2乗倍される。This confocal optical system 50 is arranged between the first beam combining means 16 and the third beam splitting means 17 of the hologram distance measuring device shown in FIGS. Through this confocal optical system 50, the rate of change of the curvature of the wavefront of the object light depending on the distance position of the measured object 15 is the ratio of the focal lengths of the first and second convex lenses, that is, (f2 / f1) = 2. It is multiplied.
従って、たとえばf1=10mm,f2=100mmに設定すれば、
物体光の波面の曲率の被測定物体15の距離位置による変
化率は、1/100に低減できる。すなわち、共焦点光学系5
0を介することで、被測定物体の距離による干渉縞のピ
ッチ、縞本数の変化を増減できるので、本発明の第2の
実施例と同様の効果を得ることができる。Therefore, for example, if you set f1 = 10mm and f2 = 100mm,
The rate of change of the curvature of the wavefront of the object light depending on the distance position of the measured object 15 can be reduced to 1/100. That is, the confocal optical system 5
Since the change in the pitch of the interference fringes and the number of fringes due to the distance of the object to be measured can be increased or decreased through 0, the same effect as that of the second embodiment of the present invention can be obtained.
発明の効果 本発明のホログラム測距装置は、光源から発せられた
ビームを2つの光路に分割する第1のビーム分割手段
と、この2分割された光路の少なくとも一方に配置され
た非平行光変換手段と、被測定物体が基準位置に有る時
の干渉縞を記録する光空間変調素子と、この光空間変調
素子からの記録パターン読み出し光と、被測定物体が任
意の測定位置に有る時の干渉縞を合波する合波手段とを
備えることで、被測定物体の変位により非平行光である
物体光の波面の曲率が変化することから、非測定物体の
測定位置における参照光との干渉縞のパターン像と、被
測定物体が基準位置に有る時の干渉縞パターンと比較す
ることで、光の波長オーダの精度で被測定物体の変位を
測定可能としたホログラム測距装置である。Advantageous Effects of Invention The hologram distance measuring apparatus of the present invention includes a first beam splitting means for splitting a beam emitted from a light source into two optical paths, and a non-parallel light conversion disposed in at least one of the two split optical paths. Means, an optical spatial modulation element that records interference fringes when the measured object is at the reference position, recording pattern read light from this optical spatial modulation element, and interference when the measured object is at an arbitrary measurement position Since the curvature of the wavefront of the object light which is non-parallel light changes due to the displacement of the measured object, the interference fringes with the reference light at the measurement position of the non-measured object Is a hologram distance measuring device capable of measuring the displacement of the object to be measured with the accuracy of the wavelength order of light by comparing the pattern image with the pattern image with the interference fringe pattern when the object to be measured is at the reference position.
第1図は本発明にかかるホログラム測距装置の第1の実
施例の平面図、第2図、第3図、第4図、第5図はそれ
ぞれ本発明の第1の実施例の動作を説明するための図、
第6図は本発明にかかるホログラム測距装置の第2の実
施例の可変非平行光変換手段の平面図、第7図は本発明
の第3の実施例の共焦点光学系の平面図、第8図は従来
例の光学測距装置のブロック図、第9図は同装置の原理
説明図である。 10……第1のレーザ、12……非平行光変換手段、15……
被測定物体、18……空間光変調素子、21……第2のレー
ザ、23……TVカメラ、24……ビーム遮断手段、40……可
変非平行光変換手段、50……共焦点光学系。FIG. 1 is a plan view of a first embodiment of a hologram distance measuring apparatus according to the present invention, and FIGS. 2, 3, 4, and 5 show the operation of the first embodiment of the present invention. Diagram to explain,
FIG. 6 is a plan view of the variable non-parallel light converting means of the second embodiment of the hologram distance measuring apparatus according to the present invention, and FIG. 7 is a plan view of the confocal optical system of the third embodiment of the present invention. FIG. 8 is a block diagram of a conventional optical distance measuring device, and FIG. 9 is an explanatory diagram of the principle of the device. 10 …… first laser, 12 …… non-parallel light conversion means, 15 ……
Object to be measured, 18 ... Spatial light modulator, 21 ... Second laser, 23 ... TV camera, 24 ... Beam blocking means, 40 ... Variable non-parallel light converting means, 50 ... Confocal optical system .
フロントページの続き (56)参考文献 特開 昭63−148109(JP,A) 特開 昭62−9203(JP,A) 特開 昭61−41941(JP,A) 特開 昭60−200112(JP,A) 特開 昭60−67834(JP,A) 特開 昭57−161606(JP,A) 特開 昭57−161605(JP,A)Continuation of the front page (56) Reference JP-A 63-148109 (JP, A) JP-A 62-9203 (JP, A) JP-A 61-41941 (JP, A) JP-A 60-200112 (JP , A) JP-A-60-67834 (JP, A) JP-A-57-161606 (JP, A) JP-A-57-161605 (JP, A)
Claims (4)
行光を照射し、前記被測定物体からの反射光と参照光と
で形成される干渉縞を記録したホログラムから再生され
た干渉縞パターンと、任意の位置で前記被測定物体に前
記非平行光を照射し、前記被測定物体からの反射光と前
記参照光とで形成される干渉縞とを重畳することにより
前記被測定物体の変位を測定可能としたことを特徴とす
るホログラム測距装置。1. An interference fringe pattern reproduced from a hologram in which non-parallel light is radiated to an object to be measured at a certain reference position and interference fringes formed by reflected light from the object to be measured and reference light are recorded. And irradiating the non-parallel light to the measured object at an arbitrary position, the displacement of the measured object by superposing interference fringes formed by the reflected light from the measured object and the reference light A hologram distance measuring device characterized by being capable of measuring.
2つの光路に分割する第1のビーム分割手段と、この2
分割された光路の少なくとも一方に配置されたビーム平
行光度調整手段と、この非平行光変換手段により非平行
光化されたビームを透過及び反射し一方のビームを被測
定物体に照射する第2のビーム分割手段と、前記被測定
物体からの反射光と、前記第1のビーム分割手段により
2分割されたもう一方のビームとを合波する第1のビー
ム合波手段と、この合波光を2分割する第3のビーム分
割手段と、この第3のビーム分割手段により分割された
一方の光路中に前記合波光により形成される干渉縞を記
録する光空間変調素子と、この光空間変調素子からの記
録パターン読み出し光と前記第3のビーム分割手段によ
り分割された一方のビームを合波する第2のビーム合波
手段と、前記光空間変調素子への記録光の入射を遮断す
るビーム遮断手段とを備えた事を特徴とする請求項1記
載のホログラム測距装置。2. A light source, a first beam splitting means for splitting a beam emitted from the light source into two optical paths, and the second beam splitting means.
A beam parallel light intensity adjusting means arranged in at least one of the divided optical paths, and a second beam irradiating the measured object with one beam transmitted and reflected by the non-parallel light converting means. The beam splitting means, the first beam combining means for multiplexing the reflected light from the object to be measured, and the other beam split into two by the first beam splitting means, and the combined light Third beam splitting means for splitting, an optical spatial modulation element for recording interference fringes formed by the combined light in one optical path split by the third beam splitting means, and from this optical spatial modulation element Second beam combining means for combining the recording pattern reading light with one of the beams divided by the third beam dividing means, and beam blocking means for blocking the incidence of the recording light on the spatial light modulator. Hologram distance measuring apparatus according to claim 1, characterized in that with a.
共焦点光学系で構成し、少なくともひとつのレンズに可
動手段を設け、ビームの平行光度を可変としたことを特
徴とする請求項2記載のホログラム測距装置。3. The non-parallel light converting means is constituted by a confocal optical system consisting of two lenses, and at least one lens is provided with a movable means so that the parallel light intensity of the beam is variable. The hologram distance measuring device described.
分割する第3のビーム分割手段配置との間に、焦点距離
が異なる2つのレンズからなる共焦点光学系を配置した
ことを特徴とする請求項2又は3記載のホログラム測距
装置。4. The first beam combining means and the combined light
4. The hologram distance measuring apparatus according to claim 2, wherein a confocal optical system including two lenses having different focal lengths is arranged between the third beam splitting means for splitting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63229116A JP2553662B2 (en) | 1988-09-13 | 1988-09-13 | Hologram range finder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63229116A JP2553662B2 (en) | 1988-09-13 | 1988-09-13 | Hologram range finder |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0277604A JPH0277604A (en) | 1990-03-16 |
| JP2553662B2 true JP2553662B2 (en) | 1996-11-13 |
Family
ID=16886997
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63229116A Expired - Fee Related JP2553662B2 (en) | 1988-09-13 | 1988-09-13 | Hologram range finder |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2553662B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6472641B2 (en) * | 2014-11-18 | 2019-02-20 | 株式会社ミツトヨ | Non-contact positioning method and non-contact positioning apparatus |
| CN112611548B (en) * | 2021-01-07 | 2023-03-21 | 昆明理工大学 | Lens focal length measuring device and method based on digital holography |
-
1988
- 1988-09-13 JP JP63229116A patent/JP2553662B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0277604A (en) | 1990-03-16 |
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