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JP2564922B2 - Semiconductor device manufacturing equipment - Google Patents
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JP2564922B2 - Semiconductor device manufacturing equipment - Google Patents

Semiconductor device manufacturing equipment

Info

Publication number
JP2564922B2
JP2564922B2 JP30809788A JP30809788A JP2564922B2 JP 2564922 B2 JP2564922 B2 JP 2564922B2 JP 30809788 A JP30809788 A JP 30809788A JP 30809788 A JP30809788 A JP 30809788A JP 2564922 B2 JP2564922 B2 JP 2564922B2
Authority
JP
Japan
Prior art keywords
semiconductor device
smoke
device manufacturing
nitric acid
nitrite
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP30809788A
Other languages
Japanese (ja)
Other versions
JPH02153522A (en
Inventor
修司 桐山
幸夫 園部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP30809788A priority Critical patent/JP2564922B2/en
Publication of JPH02153522A publication Critical patent/JPH02153522A/en
Application granted granted Critical
Publication of JP2564922B2 publication Critical patent/JP2564922B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、フォトレジストを熱硫酸で除去する半導
体装置の製造装置に関するものである。
The present invention relates to a semiconductor device manufacturing apparatus for removing photoresist with hot sulfuric acid.

〔従来の技術〕[Conventional technology]

従来、この種の半導体装置の製造装置は、第2図に示
すように構成されている。すなわち、第2図において、
1はレジスト除去槽、2はこのレジスト除去槽1内に導
入された硫酸、3は石英管に封入されたヒータ、4は石
英管に封入された熱電対、5は温度制御器、6は硝酸用
タンク、7は硝酸導入管、8は硝酸導入用バルブ、9は
石英管の割れ防止板、10はウエハ、11はこのウエハ10を
保持するバスケットである。
Conventionally, this type of semiconductor device manufacturing apparatus is configured as shown in FIG. That is, in FIG.
1 is a resist removing tank, 2 is sulfuric acid introduced into the resist removing tank 1, 3 is a heater enclosed in a quartz tube, 4 is a thermocouple enclosed in the quartz tube, 5 is a temperature controller, and 6 is nitric acid. Tank, 7 is a nitric acid introduction pipe, 8 is a nitric acid introduction valve, 9 is a quartz tube crack prevention plate, 10 is a wafer, and 11 is a basket for holding the wafer 10.

次に動作について説明する。 Next, the operation will be described.

レジスト除去槽1に、適宜な手段で硫酸2を導入す
る。石英管に封入されたヒータ3で硫酸2を、同様に石
英管で封入された熱電対4で温度をモニタしながら加熱
する。温度制御器5で所定の設定値に液温が達すればヒ
ータ3を切り、所定の設定値以下に液温が下がればヒー
タ3を入れ、液温を所定の設定値で安定させる。硝酸用
タンク6から硝酸導入管7の硝酸導入用バルブ8を開け
ることにより、硝酸を所定の量導入し硝酸導入用バルブ
8を閉じる。石英管およびこの石英管内のヒータ3を防
御する割れ防止板9の上に、除去すべきレジストの付着
したウエハ10の入ったバスケット11を置くことにより、
硫酸2によって炭化水素化されたフォトレジストが硝酸
の酸化作用により除去される。
Sulfuric acid 2 is introduced into the resist removing tank 1 by an appropriate means. The sulfuric acid 2 is heated by the heater 3 enclosed in the quartz tube, while the temperature is monitored by the thermocouple 4 also enclosed in the quartz tube. When the liquid temperature reaches a predetermined set value by the temperature controller 5, the heater 3 is turned off, and when the liquid temperature falls below the predetermined set value, the heater 3 is turned on to stabilize the liquid temperature at the predetermined set value. By opening the nitric acid introducing valve 8 of the nitric acid introducing pipe 7 from the nitric acid tank 6, a predetermined amount of nitric acid is introduced and the nitric acid introducing valve 8 is closed. By placing the basket 11 containing the wafer 10 having the resist to be removed on the quartz tube and the crack prevention plate 9 that protects the heater 3 in the quartz tube,
The photoresist hydrocarburized by sulfuric acid 2 is removed by the oxidizing action of nitric acid.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

従来の半導体装置の製造装置は、以上のように構成さ
れているので、硝酸の酸化作用を安定させるため、適宜
硝酸を適量滴下することが必要で、また、レジスト除去
槽1内の調合均一性,温度変化,あるいは経時変化によ
って酸化力が変化するなどのために安定したフォトレジ
ストの除去ができないなどの問題点があった。
Since the conventional semiconductor device manufacturing apparatus is configured as described above, it is necessary to drop an appropriate amount of nitric acid in order to stabilize the oxidizing action of nitric acid, and the mixing uniformity in the resist removing tank 1 However, there is a problem in that the photoresist cannot be removed stably because the oxidizing power changes due to temperature changes or changes over time.

この発明は、上記のような問題点を解消するためにな
されたもので、酸化作用をレジスト除去槽内で空間的,
および時間的に安定させる機能を備えた半導体装置の製
造装置を得ることを目的とする。
The present invention has been made in order to solve the above-mentioned problems, and the oxidation action is spatially controlled in the resist removing tank.
Another object of the present invention is to obtain a semiconductor device manufacturing apparatus having a time-stabilizing function.

〔課題を解決するための手段〕[Means for solving the problem]

この発明に係る半導体装置の製造装置は、酸素ガスを
キャリアガスとして亜硝酸煙を生成する亜硝酸煙発生器
と、内部に硫酸が充填され、フォトレジストが塗布され
たウエハを収容保持するとともに、前記亜硝酸煙発生器
から亜硝酸煙を導入するレジスト除去槽とで構成したも
のである。
The semiconductor device manufacturing apparatus according to the present invention, a nitrous acid smoke generator that generates nitrous acid smoke using oxygen gas as a carrier gas, and sulfuric acid filled inside, while accommodating and holding a wafer coated with photoresist, The resist removing tank is configured to introduce nitrite smoke from the nitrite smoke generator.

〔作用〕[Action]

この発明において、酸素をキャリアガスとした亜硝酸
煙を安定して硫酸中に供給することにより酸化作用が安
定し、フォトレジストが安定して除去される。
In this invention, the nitrite smoke using oxygen as a carrier gas is stably supplied into sulfuric acid to stabilize the oxidizing action, and the photoresist is stably removed.

〔実施例〕〔Example〕

以下、この発明の一実施例を第1図について説明す
る。
An embodiment of the present invention will be described below with reference to FIG.

第1図において、1はレジスト除去槽、2はこのレジ
スト除去槽1内に導入された硫酸、3は石英管に封入さ
れたヒータ、4は石英管に封入された熱電対、5は温度
制御器、9は割れ防止板で、上面に均一に穴(図示せ
ず)が形成されている。10はウエハ、11はこのウエハ10
を保持するバスケットであり、このバスケット11はレジ
スト除去槽1内の割れ防止板9の上に載置される。ま
た、12はキャリアガスである酸素の圧力調整器、13は電
磁弁、14は流量制御器、15はガスフィルタ、16は酸素供
給管である。17は内部に硝酸18が収容される亜硝酸煙発
生器、19は前記硝酸18を加熱するヒータ、20は前記ヒー
タ19を制御する温度制御器で、硝酸18を一定温度に安定
させる。21は前記亜硝酸煙発生器17内で発生した亜硝酸
煙と酸素とをレジスト除去槽1に導入するキャリアガス
導入管である。
In FIG. 1, 1 is a resist removing tank, 2 is sulfuric acid introduced into the resist removing tank 1, 3 is a heater enclosed in a quartz tube, 4 is a thermocouple enclosed in the quartz tube, and 5 is temperature control. The container 9 is a crack prevention plate, and holes (not shown) are uniformly formed on the upper surface. 10 is a wafer, 11 is this wafer 10
This basket 11 is placed on the crack prevention plate 9 in the resist removing tank 1. Further, 12 is a pressure regulator for oxygen as a carrier gas, 13 is a solenoid valve, 14 is a flow rate controller, 15 is a gas filter, and 16 is an oxygen supply pipe. Reference numeral 17 is a nitrite smoke generator in which nitric acid 18 is housed, 19 is a heater for heating the nitric acid 18, 20 is a temperature controller for controlling the heater 19, and stabilizes the nitric acid 18 at a constant temperature. Reference numeral 21 is a carrier gas introduction pipe for introducing the nitrite smoke and oxygen generated in the nitrite smoke generator 17 into the resist removing tank 1.

次に動作について説明する。 Next, the operation will be described.

レジスト除去槽1に、適宜な手段で硫酸2を入れる。
石英管に封入されたヒータ3で硫酸2を、石英管で封入
された熱電対4で温度モニタしながら加熱する。温度制
御器5で所定の設定値に液温が達すればヒータ3を切
り、所定の設定値以下に液温が下がればヒータ3を入
れ、液温を所定の設定値で安定させる。
The sulfuric acid 2 is put into the resist removing tank 1 by an appropriate means.
The heater 3 enclosed in the quartz tube heats the sulfuric acid 2 while the thermocouple 4 enclosed in the quartz tube monitors the temperature. When the liquid temperature reaches a predetermined set value by the temperature controller 5, the heater 3 is turned off, and when the liquid temperature falls below the predetermined set value, the heater 3 is turned on to stabilize the liquid temperature at the predetermined set value.

酸素を圧力調整器12により圧力を安定させ、電磁弁
(エアー駆動弁)13でオン,オフできるようにし、流量
制御器14で一定の流量に制御し、ガスフィルタ15を通し
て第1図のような硝酸18が入った亜硝酸煙発生器17に酸
素を供給する。
The pressure of the oxygen is stabilized by the pressure regulator 12, the solenoid valve (air driven valve) 13 can be turned on and off, the flow rate controller 14 controls a constant flow rate, and the gas filter 15 is used to control the pressure as shown in FIG. Oxygen is supplied to the nitrite smoke generator 17 containing the nitric acid 18.

また、硝酸18をヒータ19で加熱し、温度制御器20で一
定の温度になるように制御する。
Further, the nitric acid 18 is heated by the heater 19, and the temperature controller 20 controls the temperature to be a constant temperature.

酸素の供給により発生した酸素ガスをキャリアガスと
した亜硝酸煙をキャリアガス導入管21を介してレジスト
除去槽1に導入する。レジスト除去槽1に導入されたキ
ャリアガスは、キャリアガス導入管21の先端部、つまり
割れ防止板9の下方部分に設けられた小孔から噴出し、
ウエハ10側に噴出する。
Nitrite smoke using oxygen gas generated by the supply of oxygen as a carrier gas is introduced into the resist removing tank 1 through a carrier gas introducing pipe 21. The carrier gas introduced into the resist removing tank 1 is jetted from a small hole provided at the tip of the carrier gas introducing pipe 21, that is, the lower portion of the crack prevention plate 9,
It is ejected to the wafer 10 side.

このようにしてレジスト除去槽1の中にフォトレジス
トの付着したウエハ10を、バスケット11に入れて浸漬す
ると、硫酸2により炭化水素の分解されたフォトレジス
トを亜硝酸煙の酸化作用で除去することができる。
When the wafer 10 having the photoresist adhered thereto is placed in the basket 11 and dipped in the basket 11 in this manner, the photoresist decomposed into hydrocarbons by the sulfuric acid 2 is removed by the oxidization action of nitrite smoke. You can

なお、上記実施例では、硝酸18は適宜交換するように
構成されたものであるが、硝酸18の新液を自動的に滴下
し、旧液を自動的に排液するようにしてもよい。
Although the nitric acid 18 is appropriately replaced in the above embodiment, a new solution of nitric acid 18 may be automatically dropped and an old solution may be automatically drained.

〔発明の効果〕〔The invention's effect〕

以上説明したようにこの発明は、酸素ガスをキャリア
ガスとして亜硝酸煙を生成する亜硝酸煙発生器と、内部
に硫酸が充填され、フォトレジストが塗布されたウエハ
を収容保持するとともに、亜硝酸煙発生器から亜硝酸煙
を導入するレジスト除去槽とで構成したので、安定して
レジスト除去ができる利点がある。
INDUSTRIAL APPLICABILITY As described above, the present invention is a nitrite smoke generator that generates nitrite smoke by using oxygen gas as a carrier gas, and stores and holds a wafer coated with sulfuric acid and coated with photoresist. Since it is composed of a resist removing tank for introducing nitrous acid smoke from the smoke generator, there is an advantage that the resist can be stably removed.

【図面の簡単な説明】[Brief description of drawings]

第1図はこの発明の一実施例による半導体装置の製造装
置を示す一部を断面で示した構成図、第2図は従来の半
導体装置の製造装置の一部を断面で示した構成図であ
る。 図において、1はレジスト除去槽、2は硫酸、3は石英
管に封入されたヒータ、4は石英管に封入された熱電
対、5は温度制御器、9は割れ防止板、10はウエハ、11
はバスケット、12は圧力調整器、13は電磁弁、14は流量
制御器、15はガスフィルタ、16は酸素供給管、17は亜硝
酸煙発生器、18は硝酸、19はヒータ、20は温度制御器、
21はキャリアガス導入管である。 なお、各図中の同一符号は同一または相当部分を示す。
FIG. 1 is a sectional view showing a part of a semiconductor device manufacturing apparatus according to an embodiment of the present invention in section, and FIG. 2 is a sectional view showing a part of a conventional semiconductor device manufacturing apparatus in section. is there. In the figure, 1 is a resist removing tank, 2 is sulfuric acid, 3 is a heater enclosed in a quartz tube, 4 is a thermocouple enclosed in a quartz tube, 5 is a temperature controller, 9 is a crack prevention plate, 10 is a wafer, 11
Is a basket, 12 is a pressure regulator, 13 is a solenoid valve, 14 is a flow controller, 15 is a gas filter, 16 is an oxygen supply pipe, 17 is a nitrite smoke generator, 18 is nitric acid, 19 is a heater, and 20 is a temperature. Controller,
Reference numeral 21 is a carrier gas introduction pipe. The same reference numerals in each drawing indicate the same or corresponding parts.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】酸素ガスをキャリアガスとして亜硝酸煙を
生成する亜硝酸煙発生器と、内部に硫酸が充填され、フ
ォトレジストが塗布されたウエハを収容保持するととも
に、前記亜硝酸煙発生器から亜硝酸煙を導入するレジス
ト除去槽とで構成したことを特徴とする半導体装置の製
造装置。
1. A nitrous acid smoke generator for generating nitrous acid smoke using oxygen gas as a carrier gas, and a wafer filled with sulfuric acid and coated with a photoresist for containing and holding the nitrite smoke generator. And a resist removing tank for introducing nitrous acid smoke from the semiconductor device manufacturing apparatus.
JP30809788A 1988-12-05 1988-12-05 Semiconductor device manufacturing equipment Expired - Lifetime JP2564922B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30809788A JP2564922B2 (en) 1988-12-05 1988-12-05 Semiconductor device manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30809788A JP2564922B2 (en) 1988-12-05 1988-12-05 Semiconductor device manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH02153522A JPH02153522A (en) 1990-06-13
JP2564922B2 true JP2564922B2 (en) 1996-12-18

Family

ID=17976828

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30809788A Expired - Lifetime JP2564922B2 (en) 1988-12-05 1988-12-05 Semiconductor device manufacturing equipment

Country Status (1)

Country Link
JP (1) JP2564922B2 (en)

Also Published As

Publication number Publication date
JPH02153522A (en) 1990-06-13

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