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JP2589985B2 - Method for growing compound semiconductor crystal - Google Patents
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JP2589985B2 - Method for growing compound semiconductor crystal - Google Patents

Method for growing compound semiconductor crystal

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Publication number
JP2589985B2
JP2589985B2 JP62192612A JP19261287A JP2589985B2 JP 2589985 B2 JP2589985 B2 JP 2589985B2 JP 62192612 A JP62192612 A JP 62192612A JP 19261287 A JP19261287 A JP 19261287A JP 2589985 B2 JP2589985 B2 JP 2589985B2
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JP
Japan
Prior art keywords
melt
raw material
container
crystal
crucible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP62192612A
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Japanese (ja)
Other versions
JPS6437497A (en
Inventor
圭吾 干川
秀男 中西
拡樹 香田
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NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
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Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP62192612A priority Critical patent/JP2589985B2/en
Publication of JPS6437497A publication Critical patent/JPS6437497A/en
Application granted granted Critical
Publication of JP2589985B2 publication Critical patent/JP2589985B2/en
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Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は電子デバイスや光デバイスなどに用いられる
2元系あるいは3元以上のIII−V族化合物半導体結晶
の育成方法に関するものである。さらに具体的には、液
体封止ブリッジマン法あるいは液体封止温度勾配凝固法
等で代表されるバルク結晶育成技術の改良に関し、特に
原料融液から解離蒸発した揮発性の強いV b族元素が気
密容器内の低温部へ固化堆積することによる炉内汚染を
防止し、炉内清掃作業等を容易ならしめ、かつ結晶組成
を均一に制御した品質の高い化合物半導体結晶を得るた
めの結晶育成技術を提供するものである。
Description: TECHNICAL FIELD The present invention relates to a method for growing a binary or ternary III-V group compound semiconductor crystal used for an electronic device or an optical device. More specifically, the present invention relates to the improvement of bulk crystal growth technology represented by the liquid-sealing Bridgman method or the liquid-sealing temperature gradient solidification method. Crystal growth technology to prevent furnace contamination due to solidification and deposition in low-temperature parts in airtight containers, facilitate furnace cleaning work, and obtain high-quality compound semiconductor crystals with uniform controlled crystal composition Is provided.

(従来技術) 以下、代表的2元系III−V族化合物半導体結晶であ
るGaAs結晶育成の場合を例にとって説明する。
(Prior Art) Hereinafter, a case of growing a GaAs crystal, which is a typical binary III-V compound semiconductor crystal, will be described as an example.

第3図は、従来公知の液体封止垂直ブリッジマン法に
よるGaAs結晶育成を示す炉内の模式図である。第3図に
おいて、1は種子結晶、2は成長したGaAs結晶、3はGa
As融液、4は液体封止剤、5はるつぼ、6はるつぼホル
ダー、7はるつぼ軸、8は単一または複数個の組み合わ
せよりなる発熱体、9は気密容器である。このような炉
内構成において、通常の結晶育成は、既に公知のよう
に、まず、るつぼ5内に種子結晶1、原料となる固体の
GaAs単結晶あるいは多結晶、固体状態の液体封止剤など
を充填し、次に発熱体により高温に加熱し、液体封止剤
の軟化、原料GaAsの融解を経て、種子付後結晶成長を開
始して、第3図に示すごとき結晶成長状態を実現する。
FIG. 3 is a schematic view of the inside of a furnace showing GaAs crystal growth by a conventionally known liquid-sealed vertical Bridgman method. In FIG. 3, 1 is a seed crystal, 2 is a grown GaAs crystal, 3 is Ga
As melt, 4 is a liquid sealant, 5 is a crucible, 6 is a crucible holder, 7 is a crucible shaft, 8 is a heating element composed of a single or a plurality of combinations, and 9 is an airtight container. In such an in-furnace configuration, normal crystal growth is performed by, first, seed crystal 1 and solid raw material in crucible 5 as already known.
Filled with GaAs single crystal or polycrystal, solid-state liquid sealant, etc., then heated to a high temperature with a heating element, softened liquid sealant, melted raw material GaAs, and started crystal growth after seeding Thus, a crystal growth state as shown in FIG. 3 is realized.

(発明が解決しようとする問題点) 上述の従来の結晶育成方法においては、原料結晶の融
解プロセスあるいは結晶成長プロセスにおいて、揮発性
の強いAsが多量に解離蒸発し、液体封止剤4を通って気
密容器9内の低温部に固化堆積する。最近、特にGaAs結
晶に於ては、要求される特性を満足させるために、As過
剰融液から結晶育成を行う必要が生じており、このため
に直接合成法等の手段により予めAs過剰融液をるつぼ5
内に実現して結晶成長を開始すると共に、結晶成長の進
行(固化率の増大)に従って、炉内圧力や融液部の温度
分布等を調節して人為的にAs蒸発量を制御して融液のAs
過剰度を一定に保つ方法が採られる。このような場合、
原料融液合成プロセスではもちろん結晶育成プロセスに
おいても、多量のAsが連続的に蒸発して、気密容器9内
の汚染は著しいものとなる。このような汚染は、特性を
精密に制御した結晶の再現性良い育成を著しく阻害する
ばかりでなく、結晶育成プロセス終了後の気密容器9内
の清掃作業においても、多量の有害物質であるAsあるい
はAs酸化物粉塵の処理等の観点から困難を極める等従来
技術の大きな欠点となっていた。
(Problems to be Solved by the Invention) In the above-described conventional crystal growing method, a large amount of highly volatile As dissociates and evaporates in the raw material crystal melting process or crystal growth process and passes through the liquid sealant 4. And solidifies and deposits at a low temperature portion in the airtight container 9. Recently, especially for GaAs crystals, it has become necessary to grow crystals from excess As melt in order to satisfy the required characteristics. Crucible 5
As the crystal growth starts (increasing the solidification rate), the pressure inside the furnace and the temperature distribution in the melt are adjusted to control the amount of As evaporation artificially. Liquid As
A method of keeping the excess constant is adopted. In such a case,
In the crystal growing process as well as in the raw material melt synthesis process, a large amount of As continuously evaporates, and the contamination in the airtight container 9 becomes remarkable. Such contamination not only significantly impairs the reproducible growth of crystals whose characteristics are precisely controlled, but also causes a large amount of harmful substances such as As and / or As in the cleaning operation of the airtight container 9 after the completion of the crystal growth process. This is a major drawback of the conventional technology, such as extreme difficulty in terms of treatment of As oxide dust.

(発明の目的) 本発明は上述の従来技術の欠点を解決し、特性の均一
な結晶を育成するために必要な連続的なAs蒸発制御を行
いつつ、かつAs粉塵等による気密容器内の汚染を少なく
した実用上極めて有効な結晶育成方法を提供することを
目的とする。
(Object of the Invention) The present invention solves the above-mentioned drawbacks of the prior art, and performs continuous As evaporation control necessary for growing a crystal having uniform characteristics, and contaminates an airtight container with As dust or the like. It is an object of the present invention to provide a crystal growth method that is extremely effective in practical use and has a reduced number of crystals.

(問題点を解決するための手段) 上記の目的を達成するため本発明は、円筒状あるいは
各種形状を有するるつぼなどの容器内に融解又は合成し
て作られた、第III b族元素および第V b族元素よりなる
化合物半導体結晶原料融液の表面を液体封止体で覆い、
且つ高耐圧容器内に配置して該溶液を徐々に固化して所
望の組成および特性の単結晶あるいは多結晶を得る結晶
育成法において、少なくとも1個以上の圧力バランス用
細孔と、内部に揮発性の強いV b族元素の原料融液から
の解離圧に比べて、該V b族元素単体の蒸気圧が十分低
くなるごとき低温部とを有する該密閉容易内に、前記円
筒あるいは各種形状を有するるつぼ等の容器を収容し
て、V b族元素の原料を収容した前記円筒状あるいは各
種形状を有するるつぼ等の容器を加熱してV b族元素の
原料を融解し、前記融液の蒸発物を低温部に流入させて
結晶成長を行うことを特徴とする化合物半導体結晶の育
成方法を発明の要旨とするものである。
(Means for Solving the Problems) In order to achieve the above-mentioned object, the present invention relates to a group IIIb element and a group IIIb element which are melted or synthesized in a container such as a crucible having a cylindrical shape or various shapes. Covering the surface of the compound semiconductor crystal raw material melt comprising the Vb group element with a liquid sealing body,
In addition, in a crystal growing method in which a single crystal or a polycrystal having a desired composition and characteristics is obtained by gradually solidifying the solution by disposing the solution in a high pressure container, at least one or more pressure balancing pores and a volatilization inside Compared to the dissociation pressure of the strong Vb group element from the raw material melt, the cylinder or various shapes are formed in the easy-to-close enclosure having a low-temperature portion such that the vapor pressure of the Vb group element alone becomes sufficiently low. A container such as a crucible having a raw material of the Vb group element is heated, and the container such as a crucible having a cylindrical shape or various shapes containing the raw material of the Vb group element is heated to melt the raw material of the Vb group element, and the melt is evaporated. An object of the present invention is to provide a method for growing a compound semiconductor crystal, characterized in that a crystal is grown by flowing an object into a low temperature part.

しかして、本発明は結晶成長が行われるるつぼ全体を
高温密閉容器内に収納すると共に、この密閉容器の一部
に単体Asの蒸気圧がGaAs融液部のAs解離圧より十分低く
なるような温度領域(低温部,揮発性元素の堆積部)を
設けること、この密閉容器内の圧力と気密容器9全体の
圧力とのバランスをとるための細孔をこの密閉容器の一
部に設けること、更に蒸発した気体に対するコンダクタ
ンスを上記揮発性元素の堆積部に連通する部分を大き
く、圧力バランス用細孔部を小さくすることを特徴とし
たものである。上述の手段により、原料融液作製時およ
び結晶育成時において蒸発するAsのほとんど大部分を上
記密閉容器の低温部にのみ固化堆積せしめ、その結果、
気密容器9の内壁に付着するのを防止することを可能な
らしめるものである。
Thus, according to the present invention, the entire crucible on which crystal growth is performed is housed in a high-temperature closed container, and the vapor pressure of simple As in a part of the closed container is sufficiently lower than the As dissociation pressure of the GaAs melt. Providing a temperature region (low temperature portion, volatile element deposition portion), providing pores in a part of the closed container for balancing the pressure in the closed container and the pressure of the whole hermetic container 9; Further, the present invention is characterized in that the conductance with respect to the vaporized gas is made larger in the portion communicating with the volatile element deposition portion, and the pressure balance pore portion is made smaller. By the above-described means, most of As evaporated during the production of the raw material melt and during the crystal growth is solidified and deposited only in the low-temperature portion of the closed vessel, and as a result,
This makes it possible to prevent the airtight container 9 from adhering to the inner wall.

次に本発明の実施例について説明する。なお、実施例
は一つの例示であって、本発明の精神を逸脱しない範囲
で、種々の変更あるいは改良を行いうることは言うまで
もない。
Next, examples of the present invention will be described. It should be noted that the embodiments are merely examples, and it is needless to say that various changes or improvements can be made without departing from the spirit of the present invention.

(実施例1) 第1図は本発明の一実施例を示す結晶成長状態の模式
図である。
(Example 1) FIG. 1 is a schematic view of a crystal growth state showing one example of the present invention.

図において、1は種子結晶、2は成長したGaAs結晶、
3はGaAs融液、4は液体封止剤、5はるつぼ、6はるつ
ぼホルダー、7はるつぼ軸、8は単一または複数個の組
み合わせよりなる発熱体、9は気密容器である。10は本
発明に係わる密閉蓋であり、るつぼ5を収納するるつぼ
ホルダー6と嵌合部11で接続されてるつぼ5を収納する
密閉容器を構成する。さらにこの密閉蓋10には低温室12
を設け連通孔13によってるつぼホルダー6内部と接続
し、雰囲気的に連通している。一方、14はるつぼホルダ
ー6の一部(図では上方の側壁)に設けた圧力バランス
用の細孔であり、本発明に係わる密閉容器の内部の圧力
と密閉容器外部即ち気密容器9の内部圧力との大きな圧
力差による密閉容器の破壊を防止する作用をなすもので
ある。また、15は低温室12内部に固化堆積したAsを模式
的に示すもので、本発明によれば原料融液合成時および
結晶育成時に蒸発したAsの大部分は低温室12に固化堆積
することが確かめられた。さらに、第1図において16は
結晶成長時に液体封止剤4中をAs蒸気が気泡となって移
動する様子を模式的に示す。
In the figure, 1 is a seed crystal, 2 is a grown GaAs crystal,
3 is a GaAs melt, 4 is a liquid sealant, 5 is a crucible, 6 is a crucible holder, 7 is a crucible shaft, 8 is a heating element composed of a single or a plurality of combinations, and 9 is an airtight container. Reference numeral 10 denotes a closed lid according to the present invention, which constitutes a closed container for storing the crucible 5 connected to the crucible holder 6 for storing the crucible 5 and the fitting portion 11. In addition, a low-temperature room 12
Is connected to the inside of the crucible holder 6 through the communication hole 13 to communicate with the atmosphere. On the other hand, reference numeral 14 denotes pressure balance pores provided in a part (upper side wall in the figure) of the crucible holder 6, and the internal pressure of the closed container according to the present invention and the external pressure of the closed container, that is, the internal pressure of the airtight container 9, This prevents the sealed container from being broken by a large pressure difference. Further, reference numeral 15 schematically shows As solidified and deposited inside the low-temperature chamber 12, and according to the present invention, most of As evaporated during synthesis of the raw material melt and during crystal growth is solidified and deposited in the low-temperature chamber 12. Was confirmed. Further, in FIG. 1, reference numeral 16 schematically shows a state in which As vapor moves as bubbles in the liquid sealant 4 during crystal growth.

以下、上記実施例を適用した結晶育成例を説明する。 Hereinafter, an example of crystal growth to which the above embodiment is applied will be described.

直径80mmのpBN製るつぼ5に、直径5mm長さ30mmの種子
結晶1、金属Ga1050g、金属As1200g、B2O3350gを充填
し、発熱体8により高温に加熱し原料融液を合成・融解
した後、種子結晶1部から結晶成長を開始して、第1図
に示した結晶成長状態を経て融液全体を単結晶化して結
晶育成を終了した。原料融液作製時の気密容器9内の圧
力は約50気圧、結晶育成時の圧力は約2.5気圧に保っ
た。また、気密容器の低温部12の温度は、原料融液作製
時および結晶育成時を通じて450〜500℃の低温に保持し
た。
The pBN crucible 5 having a diameter of 80 mm, the seed crystal 1 having a diameter of 5mm length 30 mm, metal Ga1050g, metal As1200g, filled with B 2 O 3 350g, were synthesized and melt the raw material melt is heated to a high temperature by the heating elements 8 Thereafter, crystal growth was started from one part of the seed crystal, and the entire melt was single-crystallized through the crystal growth state shown in FIG. 1 to complete crystal growth. The pressure in the hermetic container 9 during the preparation of the raw material melt was maintained at about 50 atm, and the pressure during crystal growth was maintained at about 2.5 atm. The temperature of the low-temperature section 12 of the hermetic container was kept at a low temperature of 450 to 500 ° C. throughout the preparation of the raw material melt and the growth of the crystal.

結晶育成終了後に、密閉容器の低温部12内部に固化堆
積したAs15の重量を測定した結果、約67gであった。上
述の原料融液作製時に蒸発するAsの量は、別に行った実
験結果から約10gであることが確かめられているので、
その後の結晶育成時に蒸発したAsの量は約50gであるこ
とが推定される。一方、上述の結晶育成プロセスで圧力
バランス用の細孔14を通って気密容器9の内壁に付着し
たAs(またはAsの酸化物)の全重量は1g以下であり、炉
内の汚染は殆どないことが判った。これは気化したAsに
対するコンダクタンスが細孔14で小さく連通し、連通孔
13では大きくしてあるので、殆どのAsは連通孔13を介し
て低温部(揮発元素の堆積部)12に達し固化堆積する。
低温部12には高温の溶融液3より上方に十分隔てられて
おり、ここで固化する。また連通孔13を介して経路をし
ぼっているので、一旦固化したAsが低温部から剥離し落
下し再び混じることが防げる。
After completion of the crystal growth, the weight of As15 solidified and deposited inside the low-temperature part 12 of the closed vessel was measured, and as a result, was about 67 g. Since the amount of As evaporating during the above-mentioned raw material melt production was confirmed to be about 10 g from the results of experiments conducted separately,
It is estimated that the amount of As evaporated during subsequent crystal growth is about 50 g. On the other hand, the total weight of As (or an oxide of As) attached to the inner wall of the hermetic container 9 through the pressure balancing pores 14 in the above-described crystal growth process is 1 g or less, and there is almost no contamination in the furnace. It turns out. This is because the conductance for vaporized As is small communicating with the pores 14, and the communicating holes
In FIG. 13, since the size is increased, most of the As reaches the low-temperature portion (the deposited portion of the volatile element) 12 through the communication hole 13 and is solidified and deposited.
The low-temperature portion 12 is sufficiently separated from the high-temperature molten liquid 3 and solidifies here. Further, since the path is narrowed through the communication hole 13, it is possible to prevent the once solidified As from being separated from the low-temperature portion, falling, and being mixed again.

(実施例2) 第2図は、本発明の他の実施例を示す結晶成長状態の
模式図である。この図においては、符号1〜11は第1図
と同じものを表す。
Example 2 FIG. 2 is a schematic view of a crystal growth state showing another example of the present invention. In this figure, reference numerals 1 to 11 represent the same as those in FIG.

この場合は、低温室12はるつぼホルダー6の下部に設
けてあり、解離蒸発したAs蒸気はるつぼホルダー6の外
側と密閉蓋10の内側との間に設けた円筒空間状の連通孔
13を通って低温室12に達し固化堆積する。本実施例によ
る原料融液作製および結晶育成によっても、実施例1の
場合と同様に解離蒸発したAsの大部分は低温室12に固化
堆積し、本発明の効果が確認された。更に低温部(揮発
元素の堆積部)を溶融液3よりも下方に位置せしめてい
るので、実施例1に比べ低温化が容易であると共に、温
度制御の容易さという付随的効果が得られる。
In this case, the low temperature chamber 12 is provided below the crucible holder 6, and the dissociated and evaporated As vapor is a cylindrical communication hole provided between the outside of the crucible holder 6 and the inside of the sealing lid 10.
It reaches the low temperature chamber 12 through 13 and solidifies and deposits. Even in the preparation of the raw material melt and the crystal growth according to the present embodiment, most of the dissociated and evaporated As was solidified and deposited in the low-temperature chamber 12 as in the case of Example 1, confirming the effect of the present invention. Further, since the low-temperature portion (portion where the volatile element is deposited) is located below the melt 3, it is easier to lower the temperature than in the first embodiment, and an additional effect of easy temperature control can be obtained.

以上本発明の実施例においては、GaAs結晶の育成の場
合について述べたが、本発明は、蒸気圧の高い元素を含
む他の二元系以上の化合物半導体結晶の育成においても
適用でき、密閉容器10の構成、各部の温度、気密容器9
内の圧力などを適切に選ぶことにより本実施例と同様の
効果があることは言うまでもない。
In the embodiments of the present invention described above, the case of growing a GaAs crystal has been described. However, the present invention can be applied to the growth of other binary or more compound semiconductor crystals containing an element having a high vapor pressure. 10 configuration, temperature of each part, airtight container 9
It is needless to say that the same effects as in the present embodiment can be obtained by appropriately selecting the internal pressure and the like.

(発明の効果) 叙上のように本発明によれば、円筒状あるいは各種形
状を有するるつぼなどの容器内に融解又は合成して作ら
れた、第III b族元素および第V b族元素よりなる化合物
半導体結晶原料融液の表面を液体封止体で覆い、且つ高
耐圧容器内に配置して該溶液を徐々に固化して所望の組
成および特性の単結晶あるいは多結晶を得る結晶育成法
において、少なくとも1個以上の圧力バランス用細孔
と、内部に揮発性の強いV b族元素の原料融液からの解
離圧に比べて、該V b族炭素単体の蒸気圧が十分低くな
るごとき低温部とを有する該密閉容易内に、前記円筒状
あるいは各種形状を有するるつぼ等の容器を収容して、
V b族元素の原料を収容した前記円筒状あるいは各種形
状を有するるつぼ等の容器を加熱してV b族元素の原料
を融解し、前記融液の蒸発物を低温部に流入させて結晶
成長を行うことにより、原料融液作製時あるいは結晶育
成時に作為あるいは無作為的に蒸発した、蒸気圧の高い
元素が気密容器内各部への散逸、固化堆積することを防
止し、気密容器内の汚染を著しく低減する効果がある。
特に、蒸気圧の高い元素を結晶成長と共に連続的に蒸発
させながら偏倚したほぼ一定の融液組成から均一組成の
結晶を再現性よく育成するような場合、本発明の方法を
適用することにより、大きな効果が期待できるものであ
る。
(Effects of the Invention) As described above, according to the present invention, a group IIIb element and a group Vb element formed by melting or synthesizing in a container such as a crucible having a cylindrical shape or various shapes. Crystal growth method of covering the surface of a compound semiconductor crystal raw material melt with a liquid sealing body and disposing the same in a high pressure container to gradually solidify the solution to obtain a single crystal or polycrystal having a desired composition and characteristics In at least one or more pressure balancing pores, the vapor pressure of the Vb group carbon alone becomes sufficiently lower than the dissociation pressure of the highly volatile Vb group element from the raw material melt. A container such as a crucible having the cylindrical shape or various shapes is accommodated in the easy seal having a low temperature portion.
The container such as the crucible or the like having the cylindrical shape or the various shapes accommodating the raw material of the Vb group element is heated to melt the raw material of the Vb group element, and the evaporate of the melt is caused to flow into a low-temperature portion to grow the crystal. This prevents the elements with high vapor pressure, which have been evaporated at random during the preparation of the raw material melt or the crystal growth, from dissipating, solidifying and accumulating in the hermetic container, and contaminating the hermetic container. Is significantly reduced.
In particular, in the case where a crystal having a uniform composition is grown with good reproducibility from a biased substantially constant melt composition while continuously evaporating an element having a high vapor pressure along with crystal growth, by applying the method of the present invention, A great effect can be expected.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の実施例を示す主要部の模式図、第2図
は本発明の他の実施例を示す主要部の模式図、第3図は
従来公知の液体封止垂直ブリッジマン法によるGaAs結晶
育成を示す炉内の模式図を示す。 1……種子結晶 2……GaAs結晶 3……GaAs融液 4……液体封止剤 5……るつぼ 6……るつぼホルダー 7……るつぼ軸 8……発熱体 9……気密容器 10……密閉蓋 11……嵌合部 12……低温室 13……連通孔 14……圧力バランス用細孔 15……固化堆積したAs 16……As蒸気の気泡
FIG. 1 is a schematic view of a main part showing an embodiment of the present invention, FIG. 2 is a schematic view of a main part showing another embodiment of the present invention, and FIG. 3 is a conventionally known liquid-sealed vertical Bridgman method. FIG. 2 is a schematic view of the inside of a furnace showing GaAs crystal growth by the method shown in FIG. DESCRIPTION OF SYMBOLS 1 ... Seed crystal 2 ... GaAs crystal 3 ... GaAs melt 4 ... Liquid sealing agent 5 ... Crucible 6 ... Crucible holder 7 ... Crucible shaft 8 ... Heating element 9 ... Airtight container 10 ... Sealing lid 11… Mating part 12… Low temperature chamber 13… Communication hole 14… Pore for pressure balancing 15… As solidified and deposited 16 Air bubbles of As vapor

フロントページの続き (72)発明者 香田 拡樹 神奈川県厚木市森の里若宮3番1号 日 本電信電話株式会社厚木電気通信研究所 内 (56)参考文献 特開 昭48−12984(JP,A)Continuation of the front page (72) Inventor Hiroki Koda 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Prefecture, Japan Atsugi Telecommunications Research Institute, Inc. (56) References JP-A-48-12984 (JP, A)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】円筒状あるいは各種形状を有するるつぼな
どの容器内に融解又は合成して作られた、第III b族元
素および第V b族元素よりなる化合物半導体結晶原料融
液の表面を液体封止体で覆い、且つ高耐圧容器内に配置
して該溶液を徐々に固化して所望の組成および特性の単
結晶あるいは多結晶を得る結晶育成法において、少なく
とも1個以上の圧力バランス用細孔と、内部に揮発性の
強いV b族元素の原料融液からの解離圧に比べて、該V b
族元素単体の蒸気圧が十分低くなるごとき低温部とを有
する該密閉容易内に、前記円筒状あるいは各種形状を有
するるつぼ等の容器を収容して、V b族元素の原料を収
容した前記円筒状あるいは各種形状を有するるつぼ等の
容器を加熱してV b族元素の原料を融解し、前記融液の
蒸発物を低温部に流入させて結晶成長を行うことを特徴
とする化合物半導体結晶の育成方法。
1. The surface of a melt of a compound semiconductor crystal raw material composed of a Group IIIb element and a Group Vb element, which is formed by melting or synthesizing in a container such as a crucible having a cylindrical or various shapes. In a crystal growth method of obtaining a single crystal or a polycrystal having a desired composition and properties by covering with a sealing body and arranging in a high pressure container to gradually solidify the solution, at least one pressure-balancing thin film is used. Compared with the dissociation pressure of the pores and the highly volatile Vb group element from the raw material melt.
The container containing the cylindrical or crucibles having various shapes is accommodated in the easy seal having a low temperature portion such that the vapor pressure of the elemental group element alone is sufficiently low, and the cylinder accommodating the raw material of the Vb group element. Heating a container such as a crucible having a shape or various shapes to melt the raw material of the Vb group element, and allowing the vaporized product of the melt to flow into a low-temperature portion for crystal growth. Training method.
JP62192612A 1987-08-03 1987-08-03 Method for growing compound semiconductor crystal Expired - Lifetime JP2589985B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62192612A JP2589985B2 (en) 1987-08-03 1987-08-03 Method for growing compound semiconductor crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62192612A JP2589985B2 (en) 1987-08-03 1987-08-03 Method for growing compound semiconductor crystal

Publications (2)

Publication Number Publication Date
JPS6437497A JPS6437497A (en) 1989-02-08
JP2589985B2 true JP2589985B2 (en) 1997-03-12

Family

ID=16294155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62192612A Expired - Lifetime JP2589985B2 (en) 1987-08-03 1987-08-03 Method for growing compound semiconductor crystal

Country Status (1)

Country Link
JP (1) JP2589985B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2576239B2 (en) * 1989-10-19 1997-01-29 日立電線株式会社 Compound semiconductor crystal growth equipment
KR100246712B1 (en) * 1994-06-02 2000-03-15 구마모토 마사히로 Method and apparatus for preparing compound single crystals
JP2800713B2 (en) * 1995-04-04 1998-09-21 株式会社神戸製鋼所 Method for manufacturing compound semiconductor single crystal

Also Published As

Publication number Publication date
JPS6437497A (en) 1989-02-08

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