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JP2592906B2 - Measuring device for connector structural parameters - Google Patents
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JP2592906B2 - Measuring device for connector structural parameters - Google Patents

Measuring device for connector structural parameters

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Publication number
JP2592906B2
JP2592906B2 JP63114890A JP11489088A JP2592906B2 JP 2592906 B2 JP2592906 B2 JP 2592906B2 JP 63114890 A JP63114890 A JP 63114890A JP 11489088 A JP11489088 A JP 11489088A JP 2592906 B2 JP2592906 B2 JP 2592906B2
Authority
JP
Japan
Prior art keywords
ferrule
measuring device
subject
connector
outer diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63114890A
Other languages
Japanese (ja)
Other versions
JPH01285811A (en
Inventor
保次 服部
知彦 上田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP63114890A priority Critical patent/JP2592906B2/en
Publication of JPH01285811A publication Critical patent/JPH01285811A/en
Application granted granted Critical
Publication of JP2592906B2 publication Critical patent/JP2592906B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【発明の詳細な説明】 <産業上の利用分野> 本発明は円柱形状の被検体、例えば単芯光ファイバコ
ネクタの構造パラメータ(内径,外径,内径/外径偏心
量)を高精度で測定する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention measures the structural parameters (inner diameter, outer diameter, eccentricity of inner diameter / outer diameter) of a cylindrical object, for example, a single-core optical fiber connector with high accuracy. The present invention relates to a device that performs

<従来の技術> 今日光ファイバを用いた公衆通信回線においては、大
容量伝送、サービスの多様化を目的としてシングルモー
ド光ファイバによる回線が主流になりつつある。そし
て、このシングルモード光ファイバを用いて伝送路を構
築する際の重要な技術の一つは、シングルモード光ファ
イバを相互に低損失で接続する技術である。この接続技
術としてコネクタによりシングルモード光ファイバを相
互に低損失で接続する為には光ファイバ自体の構造パラ
メータ(外径,モールドフィールド径,モードフィール
ド偏心量)を安定高精度化するのみならずコネクタの構
造パラメータ(内径,外径,内径/外径偏心量)を安定
化することが必要である。即ちコネクタの構造パラメー
タの高精度測定技術が必要となる。
<Prior Art> Today, in a public communication line using an optical fiber, a line using a single mode optical fiber is becoming mainstream for the purpose of large-capacity transmission and diversification of services. One of the important technologies when constructing a transmission line using this single mode optical fiber is a technology for connecting single mode optical fibers to each other with low loss. In order to connect single mode optical fibers to each other with low loss using a connector, not only the structural parameters (outer diameter, mold field diameter, mode field eccentricity) of the optical fiber itself must be stabilized but also high accuracy. It is necessary to stabilize the structural parameters (inner diameter, outer diameter, eccentricity of inner diameter / outer diameter). That is, a high-precision technology for measuring the structural parameters of the connector is required.

ここで、第2図により従来の単芯コネクタの寸法測定
方法を説明する。第2図(a)において、1はレーザ測
長器、2はステージ、3はコネクタの単芯フェルール、
3aはフェルール端面、4は撮像光学系、5は撮像素子を
示す。寸法測定はフェルールの端面3aを撮像することに
よって行なっているが、フェルールの寸法は外径は2〜
3mm、内径は125μm(ファイバ径)である為、フェルー
ルを固定した状態で全体の画像をとり込んだ場合には、
撮像素子5の分解能の制約により十分な精度を得ること
は出来ない。例えば画像認識センサとして一次元のCCD
ラインセンサを用いた場合においてはその画素数(分解
能)は2,000程度であり3mmの被検体を観測した場合の分
解能は1.5μm/画素となる。
Here, a conventional method for measuring the dimensions of a single-core connector will be described with reference to FIG. In FIG. 2 (a), 1 is a laser measuring device, 2 is a stage, 3 is a single-core ferrule of a connector,
3a denotes an end face of a ferrule, 4 denotes an image pickup optical system, and 5 denotes an image pickup device. The dimension measurement is performed by imaging the end face 3a of the ferrule.
3mm, inner diameter is 125μm (fiber diameter), so when the whole image is captured with the ferrule fixed,
Sufficient accuracy cannot be obtained due to the limitation of the resolution of the image sensor 5. For example, a one-dimensional CCD as an image recognition sensor
When a line sensor is used, the number of pixels (resolution) is about 2,000, and the resolution when observing a 3 mm specimen is 1.5 μm / pixel.

したがって、この分解能を向上するためには、第2図
(b)に示すフェルールの端面3aにおける、内径(ロ)
と(ハ)と外径(イ)(ニ)とを別々に撮像して動かす
ことにより全体を把握するようにしている。すなわち、
撮像光学系4はフェルール3の端面3aの部分画像を撮像
素子5にとり込み、第2図(b)の(イ)(ロ)(ハ)
(ニ)の各点の認識をステージ2のaa′方向の移動
により行なっている。この場合、レーザ測長器1はコネ
クタの移動量を正確に測定するために用いられる。
Therefore, in order to improve this resolution, the inner diameter (b) at the end face 3a of the ferrule shown in FIG.
And (c) and the outer diameters (a) and (d) are separately imaged and moved to grasp the whole. That is,
The imaging optical system 4 takes in the partial image of the end face 3a of the ferrule 3 into the imaging device 5, and (a), (b), and (c) of FIG.
The recognition of each point in (d) is performed by moving the stage 2 in the aa 'direction. In this case, the laser length measuring device 1 is used for accurately measuring the amount of movement of the connector.

<発明が解決しようとする課題> しかし、上述にて述べたようにコネクタの構造パラメ
ータの測定を行なおうとした場合、次の如き問題があ
る。すなわち、フェルールの移動量の測定にはレーザ測
長器1が用いられるが、レーザ測長を行なおうとする場
合、微小距離のステージ2の移動検出のために周波数安
定化レーザを用いる必要があり、システムが高価とな
る。しかも、レーザ光の光路が長くなると温度変化等環
境条件に留意する必要も生じてくる。
<Problems to be Solved by the Invention> However, when the structural parameters of the connector are to be measured as described above, there are the following problems. That is, the laser length measuring device 1 is used for measuring the amount of movement of the ferrule, but when performing laser length measurement, it is necessary to use a frequency-stabilized laser for detecting the movement of the stage 2 at a very short distance. , The system becomes expensive. In addition, when the optical path of the laser beam becomes longer, it is necessary to pay attention to environmental conditions such as temperature change.

次に、第2図(b)に示すようにフェルール3の端面
3aが平坦に形成されていない場合、外径位置(イ)
(ニ)と内径位置(ロ)とを別々に認識する際、ステー
ジ2をbb′方向に移動して撮像光学系4の焦点合せ
を再度行なう必要があるが、この焦点合せは微小距離に
おける焦点合せを行なっている関係上、外径位置と内径
位置との間の如く軸方向距離が大きいと各位置での焦点
合せは非常にやっかいである。
Next, as shown in FIG.
If 3a is not formed flat, outer diameter position (a)
When separately recognizing (d) and the inner diameter position (b), it is necessary to move the stage 2 in the bb 'direction and refocus the imaging optical system 4, but this focusing is performed at a small distance. Due to the alignment, if the axial distance is large, such as between the outer diameter position and the inner diameter position, focusing at each position is very troublesome.

また、認識点(イ)(ロ)(ハ)(ニ)のエッジがシ
ャープでない場合、反射照明によるエッジの認識では正
確にできないという問題もある。
Further, if the edges of the recognition points (a), (b), (c), and (d) are not sharp, there is a problem that the recognition of the edges by reflected illumination cannot be performed accurately.

そこで、本発明は上述の課題に鑑み、レーザ測長器を
用いず、焦点合せの面倒も除き、しかも反射照明によら
ず正確な認識を行なうようにしたコネクタの構造パラメ
ータの測定装置を提供する。
In view of the above-described problems, the present invention provides a connector structural parameter measuring device that does not use a laser length measuring device, eliminates troublesome focusing, and performs accurate recognition without using reflected illumination. .

<課題を解決するための手段> 上述の目的を達成する本発明の構成は、 単芯フェルールである被検体の半径方向を位置決めす
るVブロックと、このVブロックに上記被検体を押し付
ける接触式測長器と、上記被検体を載せ軸を中心に一定
角おきに回転するステージと、上記被検体の軸方向に一
端面側に備えた光源と軸方向他端面側に備えた撮像光学
系と、この撮像光学系による上記被検体の撮像した内径
と上記接触式測長器による外径とを予め寸法が既知であ
る標準サンプルと比較して求める画像認識部及びCPU
と、を有するコネクタの構造パラメータの測定装置にあ
る。
<Means for Solving the Problems> A configuration of the present invention that achieves the above object includes a V-block, which is a single-core ferrule, for positioning a subject in a radial direction, and a contact-type measuring device that presses the subject on the V-block. A long device, a stage on which the subject is mounted, and which rotates at regular intervals about an axis, a light source provided on one end surface in the axial direction of the subject, and an imaging optical system provided on the other end surface in the axial direction, An image recognizing unit and a CPU that determine an inner diameter of the object imaged by the imaging optical system and an outer diameter of the contact type length measuring device by comparing with a standard sample whose dimensions are known in advance.
And a device for measuring structural parameters of a connector having:

<実 施 例> ここで、第1図を参照して本発明の実施例を説明す
る。第1図において、3は被検体である円筒形状のフェ
ルール、4はこのフェルールの軸方向一端側にある撮像
光学系、5は撮像素子である。また、6はフェルール3
を載せ回転するステージ、7はフェルール3の半径方向
を位置決めするVブロック、10は撮像素子5に接続され
た画像処理装置、11はフェルール3の半径方向側面に接
触し押圧する接触式測長器、9は画像処理装置10と接触
式測長器11にて得られたデータを処理するCPU、12はフ
ェルール3内に光を導入するライトガイド、13は光源で
ある。
<Embodiment> An embodiment of the present invention will now be described with reference to FIG. In FIG. 1, reference numeral 3 denotes a cylindrical ferrule serving as a subject, 4 denotes an imaging optical system on one end side of the ferrule in the axial direction, and 5 denotes an imaging element. 6 is ferrule 3
, A stage for rotating the ferrule 3, a V-block 7 for positioning the ferrule 3 in the radial direction, an image processing device 10 connected to the image sensor 5, a contact-type length measuring device 11 for contacting and pressing the radial side surface of the ferrule 3. , 9 is a CPU for processing data obtained by the image processing device 10 and the contact type length measuring device 11, 12 is a light guide for introducing light into the ferrule 3, and 13 is a light source.

測定に当っては、まずランプ13を点燈してライドガイ
ド12を介してフェルール3の内壁を透過照明する。透過
照明されたフェルール端面3aのエッジ(ハ)は撮像光学
系4を介して撮像素子5上に像となって結ばれ、撮像素
子5からはこのエッジ(ハ)に当る画像情報が画像処理
装置10に送られる。そしてこの画像処理装置10による処
理結果であるデータがCPU9に転送される。ここでは、例
えばフェルールの内径であるエッジ(ハ)(ロ)のみを
測定するものであり、同一平面上を撮像することになる
ので、最初に焦点合せをしておけば更に焦点合せをする
必要がなくなる。
In the measurement, first, the lamp 13 is turned on, and the inner wall of the ferrule 3 is transmitted and illuminated through the ride guide 12. The edge (c) of the ferrule end surface 3a that has been transmitted and illuminated is formed as an image on the image sensor 5 via the imaging optical system 4, and image information corresponding to the edge (c) is transmitted from the image sensor 5 to the image processing apparatus. Sent to 10. Then, data as a processing result of the image processing device 10 is transferred to the CPU 9. Here, for example, only the edges (c) and (b), which are the inner diameters of the ferrule, are measured, and an image is taken on the same plane. Therefore, if focusing is performed first, further focusing is required. Disappears.

一方、フェルール3の側面は、接触式測長器11の押圧
によってVブロック7に押付けられ、この接触式測長器
11のデータはCPU9に転送される。この場合、ステージ6
の回転にてフェルール3は回転することになるが、接触
式測長器11の押圧力があっても条件によるがその力加減
により(例えば100g位の押圧力まで)支障なく回転が行
なえることが判明している。回転に支障ある押圧力をフ
ェルール3に与える場合には、回転は測長器11による押
圧を解いて行なうことになる。こうして、接触式測長器
11により外径が測定されることになる。
On the other hand, the side surface of the ferrule 3 is pressed against the V-block 7 by the pressing of the contact type length measuring device 11,
The data of 11 is transferred to the CPU 9. In this case, stage 6
The ferrule 3 is rotated by the rotation of. However, even if there is a pressing force of the contact type measuring device 11, depending on the conditions, it can be rotated without any trouble by the force (for example, up to about 100g pressing force). Is known. When a pressing force that hinders rotation is applied to the ferrule 3, the rotation is performed by releasing the pressing by the length measuring device 11. In this way, a contact length measuring instrument
By means of 11, the outer diameter will be measured.

そして、回転ステージ6を一定角度おきに回転し、各
回転角での画像処理装置10による内壁の位置情報Xi、接
触式測長器による外径の位置情報Xoを求め、予め寸法が
既知の標準サンプルのXi,Xo(各々,と表す)と
比較することにより被検コネクタの内径、外径が求ま
る。
Then, by rotating the rotary stage 6 constant angular intervals, the position of the inner wall by the image processing apparatus 10 information X i, the position information X o of the outer diameter due to the contact length measuring instrument determined at each rotational angle, advance dimensions known X i standard sample of, X o the inner diameter of the test connector by comparing (each, represent o) and an outer diameter is obtained.

すなわち、被検体であるフェルールの内径をDi、外径
をDo、標準サンプルの内径をi,外径をとすると次
式(1)(2)となる。
That is, when the inner diameter of the ferrule as a subject is D i , the outer diameter is D o , the inner diameter of the standard sample is i , and the outer diameter is o , the following equations (1) and (2) are obtained.

ここで2θはVブロック7の開き角を示す。 Here, 2θ indicates the opening angle of the V block 7.

また、内径と外径の偏心量(δ)は通常偏心量は内径
に比較して小さいので(3)式にて求まる。
Further, the eccentricity (δ) between the inner diameter and the outer diameter can be obtained by the equation (3) since the eccentricity is usually smaller than the inner diameter.

猶内径/外径偏心量はXo−Xiをフェルールの回転角に
対してプロットしそれに正弦関数をフィッテイングしそ
の振巾より求めても良い。(1),(2)式で用いる
Xo,o,Xi,はは各角度に対する平均値を用いれば良
い。
Grace inner diameter / outer radially polarized Kokororyou is X o -X i may be determined from Fuhaba plot and fitting shiso a sine function to it against the rotation angle of the ferrule. Used in equations (1) and (2)
X o , o , X i , and i may use an average value for each angle.

こうして、本実施例に係るコネクタ構造パラメータ測
定系を用いることにより従来法が有していた欠点は全て
克服され、容易且つ高精度なコネクタの構造パラメータ
の測定が可能となる。猶本実施例による方法を用いた場
合予め基準サンプルの外径,内径を求めておく必要があ
るが、基準サンプルはコネクタである必要はなく内径,
外径がコネクタの寸法に近い金属スリーブ等を用いれば
良い。内壁、外壁の端部でのダレを抑えた基準スリーブ
内径,外径は先に従来法として示したレーザ測長器を用
いることにより高精度に測定することは容易である。
Thus, by using the connector structure parameter measuring system according to the present embodiment, all the disadvantages of the conventional method can be overcome, and the structure parameters of the connector can be easily and accurately measured. When the method according to this embodiment is used, the outer diameter and inner diameter of the reference sample need to be determined in advance, but the reference sample does not need to be a connector, and
A metal sleeve or the like whose outer diameter is close to the dimensions of the connector may be used. It is easy to measure the inner diameter and outer diameter of the reference sleeve in which the sagging at the ends of the inner wall and the outer wall is suppressed with high accuracy by using the laser length measuring device shown as the conventional method.

<具 体 例> 内径0.125MM、外径2.5MMの単芯光コネクタフェルール
を上記実施例による方法で測定した、照明光としてハロ
ゲンランプを用いバンドル型光ファイバでガイドした。
<Specific Example> A single-core optical connector ferrule having an inner diameter of 0.125 MM and an outer diameter of 2.5 MM was measured by the method according to the above-described embodiment. A halogen lamp was used as illumination light and guided by a bundle-type optical fiber.

被検フェルール3を30゜おきに回転し、フェルール内
壁の位置認識は×100対物レンズを介して画素数500×50
0の2次元撮像素子5で受光することにより、またフェ
ルール外壁の認識は0.01μm読取りの接触式測長器11を
用いることにより行った。10回の繰返し測定における測
定値の再現性は標準偏差で外径に関して0.09μm、内径
に関して0.12μm、偏心に関して0.07μmであった。
The ferrule 3 to be inspected is rotated every 30 °, and the position of the inner wall of the ferrule is recognized by the number of pixels 500 × 50 through the × 100 objective lens.
The two-dimensional imaging device 5 of 0 received light, and the outer wall of the ferrule was recognized by using a contact-type length measuring device 11 reading 0.01 μm. The reproducibility of the measured values in ten repeated measurements was 0.09 μm for the outer diameter, 0.12 μm for the inner diameter, and 0.07 μm for the eccentricity as a standard deviation.

<発明の効果> 以上述べた様に本発明に係る装置を用いることにより
従来法が有していた欠点があるレーザ測長器の使用、反
射光の使用、内径と外径との焦点合せは全て克服され、
高精度な単芯フェルールの構造パラメータ測定が可能と
なた。本装置に、フェルールの自動着脱機構を付加する
ことにより高精度な連続測定を行うことも可能である。
<Effect of the Invention> As described above, by using the apparatus according to the present invention, the use of the laser length measuring device, the use of the reflected light, and the focusing of the inner diameter and the outer diameter, which have the disadvantages of the conventional method, can be performed. Everything was overcome,
Highly accurate measurement of structural parameters of single core ferrules is now possible. By adding an automatic ferrule attachment / detachment mechanism to this apparatus, it is also possible to perform highly accurate continuous measurement.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の実施例に係るフェルール構造パラメー
タ測定系のブロック図、第2図(a)は従来法によるフ
ェルール構造パラメータ測定系のブロック図、第2図
(b)はフェルール端面の構成図である。 図中、 3はフェルール、 3aは端面、 4は撮像光学系、 5は撮像素子、 6はステージ、 7はVブロック、 11は接触式測長器、 13はランプである。
FIG. 1 is a block diagram of a ferrule structure parameter measuring system according to an embodiment of the present invention, FIG. 2 (a) is a block diagram of a ferrule structure parameter measuring system according to a conventional method, and FIG. 2 (b) is a configuration of a ferrule end face. FIG. In the figure, 3 is a ferrule, 3a is an end face, 4 is an imaging optical system, 5 is an imaging device, 6 is a stage, 7 is a V block, 11 is a contact type length measuring device, and 13 is a lamp.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】単芯フェルールである被検体の半径方向を
位置決めするVブロックと、 このVブロックに上記被検体を押し付ける接触式測長器
と、 上記被検体を載せ軸を中心に一定角おきに回転するステ
ージと、 上記被検体の軸方向一端面側に備えた光源と軸方向他端
面側に備えた撮像光学系と、 この撮像光学系による上記被検体の撮像した内径と上記
接触式測長器による外径とを予め寸法が既知である標準
サンプルと比較して求める画像認識部及びCPUと、 を有するコネクタの構造パラメータの測定装置。
1. A V-block for positioning a subject in a radial direction, which is a single-core ferrule, a contact-type length measuring device for pressing the subject on the V-block, and placing the subject on a fixed angle around an axis. A stage, a light source provided on one end face side in the axial direction of the subject, and an imaging optical system provided on the other end face side in the axial direction, an inner diameter of the subject imaged by the imaging optical system, and the contact type measurement. An image recognizing unit and a CPU for determining an outer diameter by a long device by comparing with a standard sample whose dimensions are known in advance, and a measuring device for measuring structural parameters of a connector.
JP63114890A 1988-05-13 1988-05-13 Measuring device for connector structural parameters Expired - Fee Related JP2592906B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63114890A JP2592906B2 (en) 1988-05-13 1988-05-13 Measuring device for connector structural parameters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63114890A JP2592906B2 (en) 1988-05-13 1988-05-13 Measuring device for connector structural parameters

Publications (2)

Publication Number Publication Date
JPH01285811A JPH01285811A (en) 1989-11-16
JP2592906B2 true JP2592906B2 (en) 1997-03-19

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