JP2623738B2 - Image display device - Google Patents
Image display deviceInfo
- Publication number
- JP2623738B2 JP2623738B2 JP63197411A JP19741188A JP2623738B2 JP 2623738 B2 JP2623738 B2 JP 2623738B2 JP 63197411 A JP63197411 A JP 63197411A JP 19741188 A JP19741188 A JP 19741188A JP 2623738 B2 JP2623738 B2 JP 2623738B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- cold cathode
- gate electrode
- image display
- display device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000011159 matrix material Substances 0.000 claims description 11
- 244000126211 Hericium coralloides Species 0.000 claims 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 16
- 239000000758 substrate Substances 0.000 description 11
- 239000010408 film Substances 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 6
- 150000002500 ions Chemical class 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 238000001259 photo etching Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910000599 Cr alloy Inorganic materials 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010406 cathode material Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000000788 chromium alloy Substances 0.000 description 1
- RZVXOCDCIIFGGH-UHFFFAOYSA-N chromium gold Chemical compound [Cr].[Au] RZVXOCDCIIFGGH-UHFFFAOYSA-N 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- -1 for example Substances 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 230000005596 ionic collisions Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/30—Cold cathodes, e.g. field-emissive cathode
- H01J1/304—Field-emissive cathodes
- H01J1/3042—Field-emissive cathodes microengineered, e.g. Spindt-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J31/00—Cathode ray tubes; Electron beam tubes
- H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
- H01J31/10—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes
- H01J31/12—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes with luminescent screen
- H01J31/123—Flat display tubes
- H01J31/125—Flat display tubes provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digital selection
- H01J31/127—Flat display tubes provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digital selection using large area or array sources, i.e. essentially a source for each pixel group
Landscapes
- Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は冷陰極を用いた薄型画表示装置に関するもの
である。Description: TECHNICAL FIELD The present invention relates to a thin image display device using a cold cathode.
従来の技術 従来から冷陰極を2次元に配列し、X−Yマトリック
ス電極を用いて制御し画像表示を行なう薄型表示装置は
数多く報告されている。その中でも薄膜電界放出型冷陰
極を用いた薄型表示装置が注目される。この薄型表示装
置は第6図に示すように基板表面に106〜107個/cm2の高
密度に形成したミクロンサイズの薄膜電界放出型冷陰極
を用いるものである。2. Description of the Related Art There have conventionally been reported many thin display devices in which cold cathodes are two-dimensionally arranged and controlled by using XY matrix electrodes to display images. Among them, a thin display device using a thin film field emission type cold cathode attracts attention. This thin display device uses a micron-sized thin-film field emission cold cathode formed at a high density of 10 6 to 10 7 / cm 2 on the substrate surface as shown in FIG.
この冷陰極は図に示すように基板21の表面にマトリッ
クス電極の一方のX電極22を形成し、その表面に絶縁層
23ともう一方のY電極24を形成し、X−Y電極の各交点
の部分のY電極に1.5〜2μmの微小な孔25をホトエッ
チング技術によって1000個以上設け、更に絶縁層23をエ
ッチングする。こうして形成した基板を回転させながら
タングステン,モリブデンなどの高隔点金属を斜蒸着し
て円錐状の冷陰極チップ26を形成する。冷陰極形成後、
表面の不要金属層を除去して薄膜電界放出型冷陰極電子
源が作られる。このX−Yマトリックス電子源と蛍光体
を塗布したフェースプレートとを対向させて画像表示装
置が構成されている。この画像表示装置は各画素に1000
個以上もの微小電子源を有する持っているため、個々の
微小電子源に特性上のバラツキがあっても全体としては
平均化された特性となり画面全体にわたって比較的均一
な明るさが得られる特長を持っている。This cold cathode forms one X electrode 22 of a matrix electrode on the surface of a substrate 21 as shown in the figure, and an insulating layer
23 and the other Y electrode 24 are formed. The Y electrode at each intersection of the X-Y electrodes is provided with 1,000 or more minute holes 25 of 1.5 to 2 μm by a photo-etching technique, and the insulating layer 23 is further etched. . The conical cold cathode chip 26 is formed by obliquely depositing high-separation point metals such as tungsten and molybdenum while rotating the substrate thus formed. After cold cathode formation,
By removing the unnecessary metal layer on the surface, a thin film field emission cold cathode electron source is produced. The XY matrix electron source and the face plate coated with the phosphor are opposed to each other to constitute an image display device. This image display device has 1000 pixels for each pixel.
Because it has more than one microelectron source, even if there are variations in the characteristics of each microelectron source, the characteristics will be averaged as a whole, and a relatively uniform brightness can be obtained over the entire screen. have.
発明が解決しようとする課題 前記の画像表示装置は前述のように良い特長を持って
いるにもかかわらず実用化に至っていない。その理由の
1つは製造工程が複雑でコストが高くなることと表示装
置として必要な面積に一様な電界放出型冷陰極が作れな
いことにある。また他の理由は電子ビームによって残留
ガスがイオン化され、陰極と蛍光体面間に印加される陽
極電圧によって加速された高エネルギのイオンが円錐形
状の冷陰極に衝突し、スパッタするため寿命が短かく、
動作が不安定となることである。Problems to be Solved by the Invention The image display device described above has not yet been put to practical use despite having the good features as described above. One of the reasons is that the manufacturing process is complicated and the cost is high, and that a field emission cold cathode having a uniform area required for a display device cannot be produced. Another reason is that the residual gas is ionized by the electron beam, and high-energy ions accelerated by the anode voltage applied between the cathode and the phosphor surface collide with the conical cold cathode and sputter, resulting in a short life. ,
The operation becomes unstable.
課題を解決するための手段 X−Yマトリックス電極によって制御する電子源を備
えた絶縁性背面板と蛍光体を塗着したフェースプレート
を対向させた画像表示装置において、X−Yマトリック
ス電極の各交点に設ける電子源を、Xアレー電極に接続
した電極(以後冷陰極と呼ぶ)と、これに同一平面上で
対向するYアレー電極(以後冷陰極と対向する部分をゲ
ート電極と呼ぶ)とで構成する。Means for Solving the Problems In an image display device in which an insulating back plate provided with an electron source controlled by an XY matrix electrode and a face plate coated with a phosphor are opposed to each other, each intersection of the XY matrix electrodes The electron source provided in the first embodiment is composed of an electrode connected to the X array electrode (hereinafter referred to as a cold cathode), and a Y array electrode (hereinafter, a portion facing the cold cathode is referred to as a gate electrode) opposing the X array electrode. I do.
作用 このように同一平面上に対向して配置した冷陰極(X
アレー電極)とゲート電極(Yアレー電極)との間に電
圧を印加すると、冷陰極とゲート電極間に高電界が発生
し、電子放出が起る。放出された電子の一部は対向する
ゲート電極に衝突するが、ゲート電極の表面で2次電子
を発生する。発生した2次電子は対向するフェースプレ
ートの蛍光面に印加する正の電圧(以後陽極電圧と呼
ぶ)によって加速され蛍光体に衝突して、蛍光体を発光
させる。Action The cold cathodes (X
When a voltage is applied between the array electrode) and the gate electrode (Y array electrode), a high electric field is generated between the cold cathode and the gate electrode, and electron emission occurs. Some of the emitted electrons collide with the opposing gate electrode, but generate secondary electrons on the surface of the gate electrode. The generated secondary electrons are accelerated by a positive voltage (hereinafter, referred to as an anode voltage) applied to the phosphor screen of the facing face plate and collide with the phosphor, causing the phosphor to emit light.
上記構成のように同一平面内に冷陰極とゲート電極を
構成すると、冷陰極とゲート電極との間隔は1μm程度
であって、この間で残留ガスがイオン化されて陰極尖端
部に衝突するイオンの量は従来の構成のものに比較して
数百分の1となり、陰極尖端部のイオン衝突によるスパ
ターされる量も著るしく減少し長寿命となる。When the cold cathode and the gate electrode are formed on the same plane as in the above configuration, the distance between the cold cathode and the gate electrode is about 1 μm, and the amount of ions that are ionized by the residual gas and collide with the tip of the cathode during this interval Is several hundred times smaller than that of the conventional configuration, and the amount of sputter due to ion collision at the cathode tip is remarkably reduced, resulting in a longer life.
実施例 実施例1 本発明の画像表示装置の断面の一部を第1図に示す。
画像表示装置X−Yマトリックス電極の各交点に電界放
出電子源を設けたガラス基板1と蛍光体を塗着したフェ
ースプレート2を対向させて構成する。前記電界放出電
子源は、X電極3の表面を被覆する絶縁層4の表面にお
互いに対向した冷陰極7とゲート電極5とで構成されて
いる。冷陰極7は絶縁層4に設けたスルーホール6を通
してX電極3に接続されている。第2図はこの電子源を
上面から見た時の電極の構成を単純化して示してある。
ゲート電極5に対向する冷陰極7の端面には多数の凸状
部12が形成されている。冷陰極7に設けた凸状部の尖端
とゲート電極5の間隔は0.5〜2μmである。一方、フ
ェースプレート2は透明なガラス基板で、その表面に透
明電極8、例えばITO膜(酸化インジーム・錫膜、また
はSnO2膜を設け、その表面に低速電子線用蛍光体、例え
ばZnO:Znからなる蛍光体9が塗布されている。Example 1 FIG. 1 shows a part of a cross section of an image display device of the present invention.
A glass substrate 1 provided with a field emission electron source at each intersection of an XY matrix electrode of an image display device and a face plate 2 coated with a phosphor are opposed to each other. The field emission electron source is composed of a cold cathode 7 and a gate electrode 5 facing each other on the surface of an insulating layer 4 covering the surface of the X electrode 3. The cold cathode 7 is connected to the X electrode 3 through a through hole 6 provided in the insulating layer 4. FIG. 2 shows a simplified configuration of electrodes when the electron source is viewed from above.
A large number of convex portions 12 are formed on the end face of the cold cathode 7 facing the gate electrode 5. The distance between the tip of the convex portion provided on the cold cathode 7 and the gate electrode 5 is 0.5 to 2 μm. On the other hand, the face plate 2 is a transparent glass substrate, on the surface of which a transparent electrode 8, for example, an ITO film (indium oxide / tin film or SnO 2 film) is provided, and on the surface thereof, a phosphor for low-speed electron beams, for example, ZnO: Zn Is applied.
このように構成したX電極(冷陰極)とY電極(ゲー
ト電)間に100V〜150Vの電圧を印加すると冷陰極の凸状
部の尖端には〜107V/cmの強電界が発生し、尖端部から
電子放出が起る。この電子は100〜150eVに加速されてゲ
ート電極に衝突し2次電子10を放出する。発生した2次
電子は対向するフェースプレートの透明電極8に印加す
る陽極電圧(0.2〜1KV)によって加速され、蛍光体に衝
突して蛍光体を発光させる。この時、冷陰極の凸状部12
の尖端部分下層の絶縁層11の一部または全部を除去する
と尖端部により強い電界が発生し、電子放出が起り易く
なり、駆動電圧を下げる効果がある。When a voltage of 100 V to 150 V is applied between the X electrode (cold cathode) and the Y electrode (gate electrode) thus configured, a strong electric field of ~ 10 7 V / cm is generated at the tip of the convex portion of the cold cathode. Then, electron emission occurs from the tip. These electrons are accelerated to 100 to 150 eV and collide with the gate electrode to emit secondary electrons 10. The generated secondary electrons are accelerated by the anode voltage (0.2 to 1 KV) applied to the transparent electrode 8 of the facing face plate, and collide with the phosphor to cause the phosphor to emit light. At this time, the convex part 12 of the cold cathode
When a part or the entirety of the insulating layer 11 below the tip portion is removed, a strong electric field is generated at the tip portion, so that electron emission is likely to occur, which has the effect of lowering the driving voltage.
また、実施したより具体的な電極構成の斜視図を第3
図に示す。冷陰極7とゲート電極5は櫛の歯状に形成さ
れ、お互いに噛合った状態に形成した。これは冷陰極に
設けた凸状部12を出来るだけ多くして電子放出電流を多
くするためとエッチング誤差による各冷陰極尖端部から
の放出電流のバラツキによる画素間のバラツキを小さく
するためである。また、冷陰極とゲート電極の対向面が
Y電極の長手方向に垂直(X電極の長手方向)となるよ
うに構成した。これは冷陰極の尖端部から放射した電子
の一部はゲート電極に衝突して2次電子を発生するが、
一部の電子はゲート電極に衝突せず隣の画素まで発散す
るが、この発散は、第3図で示す縦の方向(Yアレーの
方向)に分布して発散する。したがってこのYアレー方
向のクロストークを抑えてやれば、隣の画素とのクロス
トークは抑えられる。もし、第3図の櫛形の電極を90゜
回転させてしまうと、電子が飛び易い隣の画素は、違う
Yアレーの画素になり、例えば隣の画素のゲート電極だ
けに電圧がかかったような場合、クロストークが起こり
易くなる。さらに、電極を櫛の歯状にしているので、第
4図はY電極の長手方向に(A−A′線に沿って)切断
した断面の電子ビームの軌道を示す。第4図からわかる
ように、ゲート電極に衝突しない電子ビームは次の冷陰
極が作る減速電界によって減速され、陽極電圧によって
加速されて蛍光体面に向って曲げられ、隣接する画素ま
で発散しない。従って、一つの画素に対応する電子源か
ら発射した電子は一つの画素内の蛍光体に衝突し、クロ
ストークを防止することができる。Further, a perspective view of a more specific electrode configuration that was implemented is shown in FIG.
Shown in the figure. The cold cathode 7 and the gate electrode 5 are formed in a comb-teeth shape, and are formed in a state where they are engaged with each other. This is in order to increase the electron emission current by increasing the convex portions 12 provided on the cold cathode as much as possible and to reduce the variation between pixels due to the variation in emission current from each cold cathode tip due to an etching error. . Further, the opposed surface of the cold cathode and the gate electrode was configured to be perpendicular to the longitudinal direction of the Y electrode (the longitudinal direction of the X electrode). This is because some of the electrons emitted from the tip of the cold cathode collide with the gate electrode to generate secondary electrons,
Some of the electrons diverge to the next pixel without colliding with the gate electrode, but the divergence diverges in the vertical direction (Y-array direction) shown in FIG. Therefore, if the crosstalk in the Y array direction is suppressed, the crosstalk with an adjacent pixel can be suppressed. If the comb-shaped electrode in FIG. 3 is rotated by 90 °, the next pixel where electrons easily fly becomes a pixel of a different Y array, for example, a voltage is applied only to the gate electrode of the next pixel. In this case, crosstalk is likely to occur. Further, FIG. 4 shows the trajectory of the electron beam in a cross section cut along the longitudinal direction of the Y electrode (along the line AA ') since the electrodes are formed in a comb-like shape. As can be seen from FIG. 4, the electron beam that does not collide with the gate electrode is decelerated by the deceleration electric field generated by the next cold cathode, accelerated by the anode voltage, bent toward the phosphor surface, and does not diverge to the adjacent pixels. Therefore, electrons emitted from the electron source corresponding to one pixel collide with the phosphor in one pixel, and crosstalk can be prevented.
冷陰極のイオンスパタリングによる劣化の速さはパネ
ル内の残留ガス圧Pと電極間隔dの積Pd(イオンの発生
量はPdに比例する)に比例する。従来型の冷陰極ではd
は冷陰極と陽極であって、ほぼ200〜300μmである。一
方、本発明の場合は冷陰極とゲート電極の間隔0.5〜1
μmとすることができるから、この間で発生するイオン
の量は従来例に比べて1/200〜1/600となり、陰極の寿命
は同じ残留ガス圧の場合200〜300倍長くなる。The rate of deterioration of the cold cathode due to ion sputtering is proportional to the product Pd of the residual gas pressure P in the panel and the electrode interval d (the amount of generated ions is proportional to Pd). For a conventional cold cathode, d
Denotes a cold cathode and an anode, which are approximately 200 to 300 μm. On the other hand, in the case of the present invention, the interval between the cold cathode and the gate electrode is 0.5 to 1.
Since it can be set to μm, the amount of ions generated during this period is 1/200 to 1/600 as compared with the conventional example, and the life of the cathode is 200 to 300 times longer at the same residual gas pressure.
実施例2 第5図に実施例2の電極構成の要部を示す。Xアレー
電極X1,X2,X3……XnおよびYアレー電極Y1,Y2,Y3……Ym
でマトリックス電極を構成し、これらのXアレー電極に
接続した櫛状冷陰極とYアレー電極に接続した櫛状ゲー
ト電極の噛み合った電子部15をXアレー電極とYアレー
電極が囲む基板表面に形成した。Second Embodiment FIG. 5 shows a main part of an electrode configuration of a second embodiment. X-array electrodes X 1, X 2, X 3 ...... X n and Y-array electrodes Y 1, Y 2, Y 3 ...... Y m
A matrix electrode is formed, and an interdigitated electronic part 15 of the comb-shaped cold cathode connected to the X array electrode and the comb-shaped gate electrode connected to the Y array electrode is formed on the substrate surface surrounded by the X array electrode and the Y array electrode. did.
即ち、2次電子放出部の電極がXアレー電極およびY
アレー電極表面上に重畳しない構成とした。これは絶縁
層に発生するピンホールによる両電極のショートの発生
をなくすることと、XおよびYアレー電極間の電気容量
を小さくする効果がある。Xアレー電極幅を50μm,Yア
レー電極幅を20μm,画素の大きさを300×300μmとした
とき、ピンホールの発生割合、および電気容量共に1/20
〜1/50に低減することができた。That is, the electrodes of the secondary electron emitting portion are the X array electrode and the Y electrode.
It was configured not to overlap on the surface of the array electrode. This has the effect of eliminating the occurrence of a short circuit between the two electrodes due to the pinholes generated in the insulating layer and reducing the electric capacitance between the X and Y array electrodes. When the X array electrode width is 50 μm, the Y array electrode width is 20 μm, and the pixel size is 300 × 300 μm, both the pinhole generation rate and the electric capacity are 1/20.
It could be reduced to ~ 1/50.
次にこの冷陰極の製造方法について説明する。ガラス
基板の表面にXアレー電極を形成するための金属、例え
ばニッケルを厚さ0.2μm全面に蒸着し、ホトエッチン
グ技術によってストライプ状に分離する。電極幅は0.3m
mとした。次に、絶縁層としてSiO2膜をCVD法によって厚
さ1μm形成し、Xアレー電極上の一部にホトエッチン
グによってスルーホールを形成した。更に、その上に厚
さ0.2μmのタングステン金属膜を蒸着し、同じくホト
エッチング技術によってゲート電極(Yアレー電極)5
と冷陰極7を同時に形成した。Next, a method of manufacturing the cold cathode will be described. A metal, for example, nickel for forming an X array electrode on the surface of a glass substrate is vapor-deposited on the entire surface with a thickness of 0.2 μm and separated into stripes by a photo-etching technique. Electrode width is 0.3m
m. Next, an SiO 2 film was formed as an insulating layer to a thickness of 1 μm by a CVD method, and a through hole was formed in a part of the X array electrode by photoetching. Further, a tungsten metal film having a thickness of 0.2 μm is deposited thereon, and a gate electrode (Y array electrode) 5 is formed by the same photo-etching technique.
And the cold cathode 7 were formed at the same time.
冷陰極の凸状部は1画素当り約500個形成し、ゲート
電極との間隔は1μmとした。次に、こうして製作した
基板全体をSiO2膜エッチング液に浸漬して第2図に示す
冷陰極尖端部の凹部11を形成した。Approximately 500 convex portions of the cold cathode were formed per pixel, and the distance from the gate electrode was 1 μm. Next, the entire substrate thus manufactured was immersed in an SiO 2 film etching solution to form a concave portion 11 at the tip of the cold cathode shown in FIG.
Xアレー電極を形成する金属はニッケルに限られるも
のではなく、アルミニウム,チタン,金クロム合金など
ガラス基板と密着性が良く、比抵抗の低い金属が望まし
い。絶縁層としてはSiO2膜に限られるものではなく、Si
N,BN,SiOなど絶縁性の良い材料であれば良い。冷陰極材
料としてはタングステン以外にモリブデン,タンタル,
チタンなど高隔点金属が望ましい。The metal forming the X array electrode is not limited to nickel, but a metal having good adhesion to a glass substrate and low specific resistance, such as aluminum, titanium, and gold-chromium alloy, is desirable. The insulating layer is not limited to the SiO 2 film, but is
Any material having good insulating properties such as N, BN, and SiO may be used. As cold cathode materials, besides tungsten, molybdenum, tantalum,
High-separation metals such as titanium are desirable.
このようにして480×660個のマトリックス電子源を形
成したガラス基板と厚さ0.2μmのITOを蒸着しZnO:Zn蛍
光体を塗着したフェースプレートとを0.3mmの間隔を保
って対向させ、周囲を低融点ガラスフリットでシール
し、真空排気して画面サイズ10インチの画像表示装置を
作った。In this way, the glass substrate on which the 480 × 660 matrix electron sources were formed and the face plate on which ITO having a thickness of 0.2 μm was vapor-deposited and coated with ZnO: Zn phosphor were opposed at a distance of 0.3 mm, The periphery was sealed with a low-melting glass frit and evacuated to produce an image display device with a screen size of 10 inches.
冷陰極(垂直走査電極)をアース電位とし、ゲート電
極(ビデオ信号変調電極)に150V印加すると、1画素当
り約10μAの電子放出電流を得た。蛍光体面に500V印加
し、フィールド周波数60Hzで線順次駆動を行なうと約50
fLの面輝度を得た。電界放出型冷陰極の電子放出はゲー
ト電圧に対して指数関数的に変化する。ゲート電極に10
0V印加しても電子放出は殆んど起らず、カットオフ状態
にある。従って、ゲート電極には約100Vのバイアス電圧
を印加しておき、ビデオ変調信号電圧は50Vとした。ま
た、電子放出特性は信号電圧に敏感であり、パルス波高
変調よりもパルス幅変調が望ましく128階調のパルス幅
変調を行った。When the cold cathode (vertical scanning electrode) was set to the ground potential and 150 V was applied to the gate electrode (video signal modulation electrode), an electron emission current of about 10 μA per pixel was obtained. When applying 500 V to the phosphor surface and performing line-sequential driving at a field frequency of 60 Hz, about 50
The surface luminance of fL was obtained. The electron emission of the field emission cold cathode changes exponentially with respect to the gate voltage. 10 for gate electrode
Even when 0 V is applied, almost no electron emission occurs and the device is in a cutoff state. Therefore, a bias voltage of about 100 V was applied to the gate electrode, and the video modulation signal voltage was set to 50 V. Further, the electron emission characteristics are sensitive to the signal voltage, so that pulse width modulation is preferable to pulse wave height modulation, and pulse width modulation of 128 gradations was performed.
この実施例ではZnO:Zn蛍光体を用いたが、赤、緑、青
の3原色をストライプ状に塗着すればカラー表示ができ
ることは言うまでもない。In this embodiment, a ZnO: Zn phosphor is used, but it goes without saying that color display can be achieved by applying three primary colors of red, green and blue in a stripe shape.
発明の効果 本発明によれば、Xアレー電極表面に被覆した絶縁層
表面に蒸着した高融点金属薄膜のエッチングによって多
数の冷陰極とゲート電極を同時に形成できるため均一性
が良く、かつ安価に製造できる。Effect of the Invention According to the present invention, a large number of cold cathodes and gate electrodes can be simultaneously formed by etching a refractory metal thin film deposited on the surface of an insulating layer coated on the surface of an X array electrode, so that uniformity is good and the manufacturing cost is low it can.
また冷陰極とゲート電極の対向面をゲートアレー電極
の長手方向に垂直となるように配置することによってク
ロストークを防止することができる。Cross talk can be prevented by arranging the opposing surfaces of the cold cathode and the gate electrode perpendicular to the longitudinal direction of the gate array electrode.
第1図は本発明の一実施例における画像表示装置の部分
断面図、第2図は第1図の実施例における電子源部の要
部平面図、第3図は同実施例における電子源部の斜視
図、第4図は、第3図A−A′線における断面図、第5
図は、本発明の他の実施例における電極配置の概念を示
す平面図、第6図aおよびbは、各々従来の電界放射型
マトリックス表示装置の斜視図および要部拡大斜視図で
ある。 1……絶縁基板、2……フェースプレート、3……Xア
レー電極、4……絶縁層、5……Yアレー電極(ゲート
電極)、6……スルーホール、7……冷陰極、8……透
明電極、9……蛍光体、10……2次電子、11……絶縁層
除去部。FIG. 1 is a partial cross-sectional view of an image display device according to an embodiment of the present invention, FIG. 2 is a plan view of a main part of an electron source unit in the embodiment of FIG. 1, and FIG. FIG. 4 is a sectional view taken along the line AA 'of FIG. 3, and FIG.
FIG. 6 is a plan view showing the concept of electrode arrangement in another embodiment of the present invention. FIGS. 6A and 6B are a perspective view and a main part enlarged perspective view of a conventional field emission type matrix display device, respectively. DESCRIPTION OF SYMBOLS 1 ... Insulating substrate, 2 ... Face plate, 3 ... X array electrode, 4 ... Insulating layer, 5 ... Y array electrode (gate electrode), 6 ... Through hole, 7 ... Cold cathode, 8 ... ... Transparent electrode, 9 ... Phosphor, 10 ... Secondary electron, 11 ... Insulating layer removal part.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 野々村 欽造 大阪府門真市大字門真1006番地 松下電 器産業株式会社内 (56)参考文献 特開 昭59−105252(JP,A) 特開 昭62−261153(JP,A) 特開 昭51−50648(JP,A) 特開 昭63−274047(JP,A) 実開 昭56−167456(JP,U) 特公 昭46−20944(JP,B1) 特公 昭46−20949(JP,B1) 特公 昭54−17551(JP,B2) ────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kinzo Nonomura 1006 Kazuma Kadoma, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (56) References JP-A-59-105252 (JP, A) JP-A-62- 261153 (JP, A) JP-A-51-50648 (JP, A) JP-A-63-274047 (JP, A) JP-A-56-167456 (JP, U) JP-B-46-20944 (JP, B1) JP-B-46-20949 (JP, B1) JP-B-54-17551 (JP, B2)
Claims (4)
2次元電子源を備えた絶縁性背面板と蛍光体を塗着した
フェースプレートを対向させた画像表示装置において、
前記X−Yマトリックス電極の各交点に構成される電子
源が、同一平面上に各々櫛の歯状に形成され、かつ互い
にその櫛の歯が噛み合った形状に構成され、どちらか一
方が冷陰極で、他方がゲート電極に相当することを特徴
とする画像表示装置。1. An image display apparatus comprising: an insulating back plate provided with a two-dimensional electron source controlled by an XY matrix electrode;
An electron source formed at each intersection of the XY matrix electrodes is formed in the shape of a comb tooth on the same plane, and the comb teeth are meshed with each other. Wherein the other corresponds to a gate electrode.
向するゲート電極側の各々の櫛の歯に対し、多数の凸状
部が設けられていることを特徴とする請求項1記載の画
像表示装置。2. The comb teeth on the cold cathode side are provided with a large number of convex portions with respect to the comb teeth on the gate electrode side facing each other. The image display device as described in the above.
いるYアレー電極により囲まれていることを特徴とする
請求項1記載の画像表示装置。3. The image display device according to claim 1, wherein the teeth of the comb on the cold cathode side are surrounded by a Y array electrode serving as a gate electrode.
極の長手方向に垂直(Xアレー電極の長手方向)である
ことを特徴とする請求項1記載の画像表示装置。4. The image display device according to claim 1, wherein the opposing surfaces of the cold cathode and the gate electrode are perpendicular to the longitudinal direction of the Y array electrode (the longitudinal direction of the X array electrode).
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63197411A JP2623738B2 (en) | 1988-08-08 | 1988-08-08 | Image display device |
| EP89308020A EP0354750B1 (en) | 1988-08-08 | 1989-08-07 | Image display apparatus and method of fabrication thereof |
| DE68916875T DE68916875T2 (en) | 1988-08-08 | 1989-08-07 | Image display device and method of manufacturing the same. |
| CA000607771A CA1323901C (en) | 1988-08-08 | 1989-08-08 | Image display apparatus and method of fabrication thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63197411A JP2623738B2 (en) | 1988-08-08 | 1988-08-08 | Image display device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0246636A JPH0246636A (en) | 1990-02-16 |
| JP2623738B2 true JP2623738B2 (en) | 1997-06-25 |
Family
ID=16374070
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63197411A Expired - Fee Related JP2623738B2 (en) | 1988-08-08 | 1988-08-08 | Image display device |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0354750B1 (en) |
| JP (1) | JP2623738B2 (en) |
| CA (1) | CA1323901C (en) |
| DE (1) | DE68916875T2 (en) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2981751B2 (en) * | 1989-03-23 | 1999-11-22 | キヤノン株式会社 | Electron beam generator, image forming apparatus using the same, and method of manufacturing electron beam generator |
| US5217401A (en) * | 1989-07-07 | 1993-06-08 | Matsushita Electric Industrial Co., Ltd. | Method of manufacturing a field-emission type switching device |
| AU6343290A (en) * | 1989-09-29 | 1991-04-28 | Motorola, Inc. | Flat panel display using field emission devices |
| US5267884A (en) * | 1990-01-29 | 1993-12-07 | Mitsubishi Denki Kabushiki Kaisha | Microminiature vacuum tube and production method |
| JP2968014B2 (en) * | 1990-01-29 | 1999-10-25 | 三菱電機株式会社 | Micro vacuum tube and manufacturing method thereof |
| JP2656843B2 (en) * | 1990-04-12 | 1997-09-24 | 双葉電子工業株式会社 | Display device |
| JP2553377Y2 (en) * | 1990-05-01 | 1997-11-05 | 双葉電子工業株式会社 | Fluorescent display |
| JP2634295B2 (en) * | 1990-05-17 | 1997-07-23 | 双葉電子工業株式会社 | Electron-emitting device |
| JP2656851B2 (en) * | 1990-09-27 | 1997-09-24 | 工業技術院長 | Image display device |
| JP2601085B2 (en) * | 1990-11-28 | 1997-04-16 | 松下電器産業株式会社 | Functional electron-emitting device and method of manufacturing the same |
| US5075595A (en) * | 1991-01-24 | 1991-12-24 | Motorola, Inc. | Field emission device with vertically integrated active control |
| JP2601091B2 (en) * | 1991-02-22 | 1997-04-16 | 松下電器産業株式会社 | Electron-emitting device |
| US5140219A (en) * | 1991-02-28 | 1992-08-18 | Motorola, Inc. | Field emission display device employing an integral planar field emission control device |
| GB2259183B (en) * | 1991-03-06 | 1995-01-18 | Sony Corp | Flat image-display apparatus |
| US5382867A (en) * | 1991-10-02 | 1995-01-17 | Sharp Kabushiki Kaisha | Field-emission type electronic device |
| JP3072809B2 (en) | 1991-10-08 | 2000-08-07 | キヤノン株式会社 | Electron emitting element, electron beam generator and image forming apparatus using the element |
| JP2669749B2 (en) * | 1992-03-27 | 1997-10-29 | 工業技術院長 | Field emission device |
| CA2112431C (en) * | 1992-12-29 | 2000-05-09 | Canon Kabushiki Kaisha | Electron source, and image-forming apparatus and method of driving the same |
| US5455597A (en) * | 1992-12-29 | 1995-10-03 | Canon Kabushiki Kaisha | Image-forming apparatus, and designation of electron beam diameter at image-forming member in image-forming apparatus |
| CA2112733C (en) * | 1993-01-07 | 1999-03-30 | Naoto Nakamura | Electron beam-generating apparatus, image-forming apparatus, and driving methods thereof |
| JP3599765B2 (en) * | 1993-04-20 | 2004-12-08 | 株式会社東芝 | Cathode ray tube device |
| DE69423716T2 (en) * | 1993-12-22 | 2000-08-17 | Canon K.K., Tokio/Tokyo | Imaging device |
| JPH07254354A (en) * | 1994-01-28 | 1995-10-03 | Toshiba Corp | Field electron emission device, method of manufacturing field electron emission device, and flat display device using the field electron emission device |
| US5831387A (en) | 1994-05-20 | 1998-11-03 | Canon Kabushiki Kaisha | Image forming apparatus and a method for manufacturing the same |
| JP3062990B2 (en) * | 1994-07-12 | 2000-07-12 | キヤノン株式会社 | Electron emitting device, method of manufacturing electron source and image forming apparatus using the same, and device for activating electron emitting device |
| US6246168B1 (en) | 1994-08-29 | 2001-06-12 | Canon Kabushiki Kaisha | Electron-emitting device, electron source and image-forming apparatus as well as method of manufacturing the same |
| EP0955662B1 (en) * | 1995-03-13 | 2006-01-25 | Canon Kabushiki Kaisha | Methods of manufacturing an electron source and image forming apparatus |
| KR100211945B1 (en) * | 1995-12-20 | 1999-08-02 | 정선종 | Mux and demux circuits using photo gate transistors |
| JP3647436B2 (en) | 2001-12-25 | 2005-05-11 | キヤノン株式会社 | Electron-emitting device, electron source, image display device, and method for manufacturing electron-emitting device |
| JP2009272097A (en) | 2008-05-02 | 2009-11-19 | Canon Inc | Electron source and image display apparatus |
| JP2010262898A (en) | 2009-05-11 | 2010-11-18 | Canon Inc | Electron beam apparatus and image display apparatus |
| CN114975045A (en) * | 2022-05-23 | 2022-08-30 | 中国工程物理研究院流体物理研究所 | An X-ray source and its horizontal field emission structure |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5150648A (en) * | 1974-10-30 | 1976-05-04 | Hitachi Ltd | |
| NO145589C (en) * | 1977-06-30 | 1982-04-21 | Rosenblad Corp | PROCEDURE FOR THE CONDENSATION OF STEAM IN A HEAT EXCHANGE AND A HEAT EXCHANGE FOR USE IN THE PROCEDURE |
| DE3243596C2 (en) * | 1982-11-25 | 1985-09-26 | M.A.N. Maschinenfabrik Augsburg-Nürnberg AG, 8000 München | Method and device for transferring images to a screen |
| FR2568394B1 (en) * | 1984-07-27 | 1988-02-12 | Commissariat Energie Atomique | DEVICE FOR VIEWING BY CATHODOLUMINESCENCE EXCITED BY FIELD EMISSION |
| JPS62261153A (en) * | 1986-05-08 | 1987-11-13 | Nec Corp | Manufacture of semiconductor device |
| JP2654012B2 (en) * | 1987-05-06 | 1997-09-17 | キヤノン株式会社 | Electron emitting device and method of manufacturing the same |
-
1988
- 1988-08-08 JP JP63197411A patent/JP2623738B2/en not_active Expired - Fee Related
-
1989
- 1989-08-07 EP EP89308020A patent/EP0354750B1/en not_active Expired - Lifetime
- 1989-08-07 DE DE68916875T patent/DE68916875T2/en not_active Expired - Fee Related
- 1989-08-08 CA CA000607771A patent/CA1323901C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DE68916875D1 (en) | 1994-08-25 |
| EP0354750A3 (en) | 1990-10-17 |
| EP0354750B1 (en) | 1994-07-20 |
| DE68916875T2 (en) | 1995-01-12 |
| CA1323901C (en) | 1993-11-02 |
| EP0354750A2 (en) | 1990-02-14 |
| JPH0246636A (en) | 1990-02-16 |
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