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JP2645346B2 - Low temperature physical property test equipment - Google Patents
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JP2645346B2 - Low temperature physical property test equipment - Google Patents

Low temperature physical property test equipment

Info

Publication number
JP2645346B2
JP2645346B2 JP28348088A JP28348088A JP2645346B2 JP 2645346 B2 JP2645346 B2 JP 2645346B2 JP 28348088 A JP28348088 A JP 28348088A JP 28348088 A JP28348088 A JP 28348088A JP 2645346 B2 JP2645346 B2 JP 2645346B2
Authority
JP
Japan
Prior art keywords
refrigerator
refrigerant
subject
gaseous refrigerant
vacuum vessel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP28348088A
Other languages
Japanese (ja)
Other versions
JPH02131143A (en
Inventor
祺景 小田
宏 浅見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Heavy Industries Ltd
Original Assignee
Sumitomo Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Heavy Industries Ltd filed Critical Sumitomo Heavy Industries Ltd
Priority to JP28348088A priority Critical patent/JP2645346B2/en
Publication of JPH02131143A publication Critical patent/JPH02131143A/en
Application granted granted Critical
Publication of JP2645346B2 publication Critical patent/JP2645346B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Devices For Use In Laboratory Experiments (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は各種の物質の物理的性質、特に低温度に於け
る物性を調べる際に使用される試験装置に関する。
Description: TECHNICAL FIELD The present invention relates to a test apparatus used for examining physical properties of various substances, particularly physical properties at low temperatures.

[従来の技術] 超電導材料の開発競争は、近年目覚ましいものがある
が、超電導材料を開発するに当っては、新たに調製され
た物質の低温物性を調べることが必須である。従来、物
質の低温物性を調べるための試験装置としては、ギフォ
ード・マクマホン冷凍機又はその改良型冷凍機の冷却部
に、被験体収容室を隣接させて冷凍機の冷却部と被験体
収容室を真空断熱容器に収めた装置が知られている。こ
の装置では、冷凍機の冷却部で発生する寒冷は、ガス又
は固体を介して収容室内の被験体に伝達される。
[Related Art] In recent years, there has been remarkable competition in the development of superconducting materials. However, in developing superconducting materials, it is essential to examine the low-temperature properties of a newly prepared substance. Conventionally, as a test device for examining the low-temperature physical properties of a substance, the cooling unit of the refrigerator and the cooling room of the refrigerator are arranged adjacent to the cooling unit of the Gifford McMahon refrigerator or its improved refrigerator. Devices housed in vacuum insulated containers are known. In this device, the cold generated in the cooling section of the refrigerator is transmitted to the subject in the accommodation room via gas or solid.

この試験装置は組み立てが比較的容易であるものの、
収容室内の被験体を別の被験体に交換する場合には、そ
の都度装置の断熱真空を破壊しなければならず、従って
また、前回の試験で実現されている収容室内の低温雰囲
気を、次回の試験に受け継ぐことができない不都合があ
った。
Although this test device is relatively easy to assemble,
Each time a subject in the chamber is replaced with another, the adiabatic vacuum of the equipment must be broken, and the low-temperature atmosphere in the There was an inconvenience that could not be passed on to the test.

上記のような低温物性試験装置の欠点を改良した装置
として、特願昭62−213329号(特開平1−56151号公
報)には、単一の真空容器内に冷凍機の冷却部と被験体
収容室を挿入すると共に、当該収容室の一部を真空容器
外に開口させ、適当な循環ポンプとパイプを介して、ガ
ス状冷媒を冷凍機の冷却部と被験体収容室との間で循環
させることによって、被験体を冷却する装置が記載され
ている。この装置では、被験体収容室の一部が真空容器
外に開口され、この開口部から被験体を容器内に出し入
れできるので、真空容器の断熱真空を破壊することなく
被験体を交換することができる。
Japanese Patent Application No. 62-213329 (Japanese Patent Application Laid-Open No. 1-56151) discloses an apparatus for improving the above-mentioned drawbacks of the low-temperature physical property test apparatus. While inserting the accommodation room, a part of the accommodation room is opened outside the vacuum vessel, and the gaseous refrigerant is circulated between the cooling part of the refrigerator and the subject accommodation room through an appropriate circulation pump and pipe. An apparatus for cooling a subject by causing the subject to cool is described. In this device, a part of the subject storage chamber is opened outside the vacuum container, and the subject can be put in and out of the container through this opening, so that the subject can be replaced without breaking the adiabatic vacuum of the vacuum container. it can.

[発明が解決しようとする課題] しかしながら、これら従来の低温物性試験装置のなか
にあって、前者は被験体収容室を冷凍機の冷却部に隣接
させているために、また後者は被験体収容室と冷凍機の
冷却部を同一の真空容器内に設置しているために、冷凍
機を運転した際に発生する振動によって、被験体収容室
まで振動してしまうのを回避することができない。被験
体収容室の振動は、例えば光実験、メスバゥワー分光分
析法、X線回折分析法、電子顕微鏡分析法等の如く、被
験体にある種の光線を照射してその物性を分析する場合
には、極めて都合が悪い。
[Problems to be Solved by the Invention] However, in these conventional low-temperature physical property test devices, the former has a subject accommodation room adjacent to a cooling part of a refrigerator, and the latter has a subject accommodation room. Since the chamber and the cooling unit of the refrigerator are installed in the same vacuum vessel, it is not possible to avoid vibration to the subject accommodation room due to vibration generated when the refrigerator is operated. Vibration of the subject storage chamber can be caused by irradiating the subject with a certain type of light, such as in light experiments, Mossbauer spectroscopy, X-ray diffraction analysis, and electron microscopy. Very inconvenient.

これに加えて、従来の低温物性試験装置は、被験体収
容室の設置個所に関係する構造上の制約から、被験体収
容室の周辺に磁石などを付設できない欠点もあった。
In addition to this, the conventional low-temperature physical property test apparatus has a drawback that a magnet or the like cannot be attached around the subject accommodation room due to structural restrictions related to the installation location of the subject accommodation room.

従って、本発明の目的は、断熱真空を破壊することな
く被験体を交換することができるばかりでなく、冷凍機
の振動が被験体収容室に伝わることもなく、しかも必要
に応じて磁石その他の付帯設備を被験体収容室の周辺に
設けることができる低温物性試験装置を提供することに
ある。
Therefore, it is an object of the present invention not only to replace the subject without breaking the adiabatic vacuum, but also to prevent the vibration of the refrigerator from being transmitted to the subject accommodating chamber, and further, if necessary, use a magnet or the like. An object of the present invention is to provide a low-temperature physical property test apparatus in which ancillary equipment can be provided around a subject accommodation room.

[課題を解決するための手段] 本発明に係る低温物性試験装置は、基本的には、冷凍
機の冷却部と被験体収容室とをそれぞれ別個の真空容器
内に収めると共に、循環ポンプを介してガス状冷媒を冷
凍機の冷却部と被験体収容室との間で循環させるための
導管を配置した構成にある。
[Means for Solving the Problems] The low-temperature physical property test apparatus according to the present invention basically includes a cooling unit of a refrigerator and a subject accommodation room in separate vacuum vessels, and a circulating pump. And a conduit for circulating the gaseous refrigerant between the cooling section of the refrigerator and the subject storage chamber.

すなわち、本発明の低温物性試験装置は、(a)ガス
状冷媒を冷却するための熱交換器が隣接された冷却部が
第1真空容器内に位置する冷凍機と、(b)第1真空容
器外に位置し、ガス状冷媒を循環するためのポンプと、
(c)ガス状冷媒の入口及び出口を具えて前記第1真空
容器とは別の第2真空容器内にほぼ全体が収められ、蓋
を有する開口部が第2真空容器外に位置する被験体収容
室と、(d)前記ポンプの吐出側に接続され、ポンプか
ら吐出されたガス状冷媒を、前記冷凍機の冷却部に隣接
された熱交換を経由して、前記被験体収容室の冷媒入口
に供給するためのガス状冷媒移送用第1導管と、(e)
前記被験体収容室の冷媒出口に接続され、当該収容室内
の冷媒を前記ポンプの吸引側に戻すためのガス状冷媒移
送用第2導管とから構成されることを特徴とする。
That is, the low-temperature property test apparatus of the present invention includes: (a) a refrigerator in which a cooling unit adjacent to a heat exchanger for cooling a gaseous refrigerant is located in a first vacuum vessel; A pump located outside the container and for circulating the gaseous refrigerant,
(C) a subject having an inlet and an outlet for a gaseous refrigerant, which is substantially entirely contained in a second vacuum vessel separate from the first vacuum vessel, and whose opening having a lid is located outside the second vacuum vessel; A storage chamber, and (d) a gaseous refrigerant connected to a discharge side of the pump and exchanging gaseous refrigerant discharged from the pump via a heat exchange adjacent to a cooling unit of the refrigerator. A first conduit for the transfer of a gaseous refrigerant to supply to the inlet; (e)
A second conduit for transferring a gaseous refrigerant connected to a refrigerant outlet of the subject storage room and for returning the refrigerant in the storage room to the suction side of the pump.

そして、本発明の低温物性試験装置に於いては、前記
のポンプから吐出されて第1導管を流れるガス状冷媒
を、冷凍機の冷却部に隣接された熱交換器に供給するの
に先立って、前記第2導管を流れるガス状冷媒と間接的
に熱交換させるためのガス/ガス熱交換器を、所望に応
じて前記の第1真空容器内に設けることができる。
In the low-temperature property test apparatus of the present invention, the gaseous refrigerant discharged from the pump and flowing through the first conduit is supplied to a heat exchanger adjacent to a cooling unit of the refrigerator. A gas / gas heat exchanger for indirectly exchanging heat with the gaseous refrigerant flowing through the second conduit may be provided in the first vacuum vessel as desired.

[作用] 本発明の低温物性試験装置では、前記したガス/ガス
熱交換器の設置が、必ずしも必須ではないが、これを設
置した態様では、循環ポンプから吐出されたガス状冷媒
は、導管を通って第1真空容器内に設けられたガス/ガ
ス熱交換器に供給され、ここで循環ポンプの吸引側に戻
るガス状冷媒と熱交換後、冷凍機の冷却部に隣接された
熱交換器に導入されて冷却される。冷却されたガス状冷
媒は、導管に案内されて第1真空容器から第2真空容器
内に挿設された被験体収容室の、好ましくは底部に供給
され、収容室内の被験体を冷却する。被験体から熱を奪
ったガス状冷媒は、導管を介して収容室から第1真空容
器内に導かれ、前記のガス/ガス熱交換器を経て循環ポ
ンプの吸引側に戻される。
[Operation] In the low-temperature physical property test apparatus of the present invention, the installation of the gas / gas heat exchanger described above is not always essential, but in an embodiment in which the gas / gas heat exchanger is installed, the gaseous refrigerant discharged from the circulation pump is connected to a conduit. Through a gas / gas heat exchanger provided in the first vacuum vessel, where it exchanges heat with the gaseous refrigerant returning to the suction side of the circulating pump and then adjacent to the cooling section of the refrigerator And cooled. The cooled gaseous refrigerant is guided to the conduit and is supplied from the first vacuum vessel to the subject accommodation chamber, preferably at the bottom, inserted into the second vacuum vessel to cool the subject in the accommodation chamber. The gaseous refrigerant deprived of heat from the subject is guided from the accommodation chamber into the first vacuum vessel via a conduit, and is returned to the suction side of the circulation pump via the gas / gas heat exchanger.

従って、冷凍機を運転しながらガス状冷媒を上記のよ
うに循環させることにより、収容室内の被験体を室温か
ら所望の低温まで冷却することができる。そして、所望
の温度に冷却された以後は、冷凍機の運転を停止して、
循環ポンプの運転を継続させると、ガス状冷媒は周囲の
熱を次第に吸収して加温されるので、収容室内の冷被験
体の温度を上昇させることがてきる。この場合、ガス状
冷媒用導管の適当な個所にヒーターを付設すれば、加温
速度を増大できるばかりでなく、被験体を室温以上に加
熱することもできる。
Therefore, by circulating the gaseous refrigerant as described above while operating the refrigerator, the subject in the accommodation room can be cooled from room temperature to a desired low temperature. Then, after being cooled to the desired temperature, the operation of the refrigerator is stopped,
If the operation of the circulation pump is continued, the gaseous refrigerant gradually absorbs the surrounding heat and is heated, so that the temperature of the cold test object in the accommodation room can be increased. In this case, if a heater is attached to an appropriate portion of the gaseous refrigerant conduit, not only the heating rate can be increased, but also the subject can be heated to room temperature or higher.

第2真空容器に挿設される被験体収容室は、その一部
が第2真空容器の外側に開口し、その開口部に設置され
た蓋を開くことによって、収容室だけを大気圧下に開放
し、蓋を閉じることによって、吸収室を気密に保持する
ことができる。従って、収容室に被験体を出し入れする
に際して、第2真空容器の断熱真空が破壊されることが
ない。
The subject accommodation room inserted into the second vacuum container has a part thereof opened to the outside of the second vacuum container, and only the accommodation room is exposed to the atmospheric pressure by opening a lid provided at the opening. By opening and closing the lid, the absorption chamber can be kept airtight. Therefore, the adiabatic vacuum of the second vacuum vessel is not broken when the subject is moved in and out of the accommodation room.

本発明の冷凍機には当業界で公知の任意の冷凍機が、
例えば、ギフォード・マクマホンサイクルを利用する単
段式又は2段式ヘリウム冷凍機が使用可能であって、冷
却目標温度に応じて使用冷凍機は選択される。ちなみ
に、単段式ヘリウム冷凍機では40Kに、2段式ヘリウム
冷凍機では10Kにそれぞれガス状冷媒を冷却することが
できる。また、小型ヘリウム液化装置を併設すれば、4K
に近い温度まで冷却することができる。ガス状冷媒とし
ては、冷却目標温度で固化しないガスが使用され、典型
的にはヘリウムガス、窒素ガスが使用される。
The refrigerator of the present invention includes any refrigerator known in the art,
For example, a single-stage or two-stage helium refrigerator using a Gifford McMahon cycle can be used, and the refrigerator to be used is selected according to a cooling target temperature. Incidentally, the gaseous refrigerant can be cooled to 40K in the single-stage helium refrigerator and to 10K in the two-stage helium refrigerator. Also, if a small helium liquefaction unit is installed, 4K
Can be cooled to a temperature close to As the gaseous refrigerant, a gas that does not solidify at the cooling target temperature is used, and helium gas and nitrogen gas are typically used.

[実施例] 第1図は本発明に係る低温物性試験装置の一実施例を
示すものであって、第1真空容器1には2段式ヘリウム
冷凍機2が挿設され、その第1冷却部3及び第2冷却部
4が真空容器内に位置せしめられる。そして、第1冷却
部3及び第2冷却部4にはそれぞれこれに隣接して、典
型的には冷却コイルからなる第1熱交換器5及び第2熱
交換器6が設置され、第2冷却部4は輻射熱シールド7
で遮蔽される。第1真空容器内にはまた、ガス/ガス熱
交換器8が設けられ、真空容器自体はバルブ9を介して
真空ポンプ10に接続される。
[Embodiment] FIG. 1 shows an embodiment of a low-temperature physical property test apparatus according to the present invention, in which a two-stage helium refrigerator 2 is inserted in a first vacuum vessel 1 and a first cooling thereof. The part 3 and the second cooling part 4 are located in the vacuum container. The first cooling unit 3 and the second cooling unit 4 are respectively provided with a first heat exchanger 5 and a second heat exchanger 6, which are typically composed of cooling coils, adjacent to the first cooling unit 3 and the second cooling unit 4, respectively. Part 4 is radiation heat shield 7
Shielded by. A gas / gas heat exchanger 8 is also provided in the first vacuum vessel, and the vacuum vessel itself is connected to a vacuum pump 10 via a valve 9.

一方、第2真空容器11には通常円筒状容器からなる被
験体収容室12のほぼ全体が挿設され、蓋13を有する収容
室の開口部は真空容器の外に位置せしめられる。そし
て、蓋13にはガス状冷媒の導入管及び排出管の取付具14
及び15が設けられる。第2真空容器11は第1真空容器1
と同様、バルブ9′を介して真空ポンプ10′に接続され
る。また、収容室12の冷媒出入口を蓋13に設ける代わり
に、冷媒入口を収容室の下部イに置き、冷媒の出し入れ
を図中の符号22′,14′,イ,ロ,15′及び24で示す経路
で行なうこともできる。この場合、冷媒導管の取付具1
4′及び15′は、第2真空容器11の側壁に設けても差し
支えない。
On the other hand, substantially the entirety of the subject accommodation room 12 usually formed of a cylindrical container is inserted into the second vacuum container 11, and the opening of the accommodation room having the lid 13 is positioned outside the vacuum container. The lid 13 has fittings 14 for introducing and discharging the gaseous refrigerant.
And 15 are provided. The second vacuum vessel 11 is the first vacuum vessel 1
In the same manner as described above, it is connected to a vacuum pump 10 'via a valve 9'. Further, instead of providing the refrigerant inlet / outlet of the storage chamber 12 in the lid 13, the refrigerant inlet is placed in the lower part a of the storage chamber, and the refrigerant is taken in and out by reference numerals 22 ', 14', a, b, 15 'and 24 in the figure. It can also be performed by the route shown. In this case, the coolant conduit fitting 1
4 'and 15' may be provided on the side wall of the second vacuum vessel 11.

バルブV1を有する導管16、同じくを有する導管17
a、導管17b,17c、バルブV3を有する導管18及びバルブV4
を有する導管19は、それぞれ真空容器の外側に設けた循
環ポンプ20が吐出されるガス状冷媒を、第1真空容器1
内に通して第2真空容器11に挿設された被験体収容室12
に供給するための導管であって、導管17aは循環ポンプ
の吐出側を、導管16及びガス/ガス熱交換器8を介して
第1熱交換器5に接続させる。導管17bは第1熱交換器
5と第2熱交換器6を接続させ、導管17cは第2熱交換
器6と第1真空容器の冷媒取り出し管取付具21とを接続
させている。また、導管19は導管16に吐出される冷媒
を、直接導管17cに合流させ、導管18は導管16に吐出さ
れる冷媒をガス/ガス熱交換器8に通して導管17cに合
流させるものである。従って、導管17aを流れる冷媒
と、導管18又は19を流れる冷媒の流量比を変えることに
より、導管17cに流れる冷媒の温度を調節することがで
きる。
Conduit 16 having a valve V 1, a conduit 17 which also has a 2
a, conduit 18 and valve V 4 with conduit 17b, 17c, the valve V 3
Are connected to the gaseous refrigerant discharged from the circulation pump 20 provided outside the vacuum vessel, respectively.
The subject accommodation room 12 inserted into the second vacuum vessel 11
A conduit 17a connects the discharge side of the circulation pump to the first heat exchanger 5 via the conduit 16 and the gas / gas heat exchanger 8. The conduit 17b connects the first heat exchanger 5 and the second heat exchanger 6, and the conduit 17c connects the second heat exchanger 6 and the refrigerant outlet pipe fitting 21 of the first vacuum vessel. The conduit 19 joins the refrigerant discharged to the conduit 16 directly to the conduit 17c, and the conduit 18 joins the refrigerant discharged to the conduit 16 to the conduit 17c through the gas / gas heat exchanger 8. . Therefore, by changing the flow ratio of the refrigerant flowing through the conduit 17a and the refrigerant flowing through the conduit 18 or 19, the temperature of the refrigerant flowing through the conduit 17c can be adjusted.

第1真空容器1の冷媒取り出し管取付具21と、被験体
収容室12の蓋13に設けた冷媒導入管取付具14とは導管22
によって接続され、蓋13の冷媒排出管取付具15と第1真
空容器1の冷媒取り入れ管取付具23とは導管24によって
接続される。この導管22及び24にはここを通過する冷媒
の熱吸収を最少にするために、断熱真空層を有する二重
パイプが通常使用される。また、導管22及び24を一本の
断熱真空管の中に固定した構造のパイプを使用すること
もできる。第1真空容器1の冷媒取り入れ管取付具23
は、バルブV5,V6を有する導管25によりガス/ガス熱交
換器8を介して、循環ポンプ20の吸引側に接続される。
A coolant outlet pipe fitting 21 of the first vacuum vessel 1 and a coolant inlet pipe fitting 14 provided on the lid 13 of the subject housing chamber 12 are connected to a conduit 22.
And the refrigerant discharge pipe fitting 15 of the lid 13 and the refrigerant intake pipe fitting 23 of the first vacuum vessel 1 are connected by a conduit 24. Duplex pipes having an insulated vacuum layer are typically used for the conduits 22 and 24 to minimize heat absorption of the refrigerant passing therethrough. Alternatively, a pipe having a structure in which the conduits 22 and 24 are fixed in a single insulated vacuum tube may be used. Refrigerant intake pipe fitting 23 of first vacuum vessel 1
Is connected to the suction side of the circulation pump 20 via a gas / gas heat exchanger 8 by a conduit 25 having valves V 5 and V 6 .

尚、第1図において、26はヘリウムガスボンベ、27,2
8は圧力計、29は放熱器、30は流量計、31は冷媒導入
管、32は冷媒排出管、33,34はヒーター、35は温度計を
示す。
In FIG. 1, reference numeral 26 denotes a helium gas cylinder, and 27, 2
8 is a pressure gauge, 29 is a radiator, 30 is a flow meter, 31 is a refrigerant introduction pipe, 32 is a refrigerant discharge pipe, 33 and 34 are heaters, and 35 is a thermometer.

上記のような構成の低温物性試験装置に於いて、例え
ば被験体の臨界温度を測定するに際しては、収容室12内
に適当な手段で被験体を静置して蓋13で収容室を密閉す
る。しかる後、ヘリウムガスボンベ26から供給されるヘ
リウムガスにて、収容室内及び各導管内の空気を置換し
つつ、あるいは置換終了後、真空ポンプ10,10′を作動
させて第1真空容器1及び第2真空容器11内を減圧させ
る。各真空容器内の圧力が例えば5×10-2Torr程度以下
に減圧してから、冷凍機2を起動させる。冷凍機が所望
の冷凍レベルに到達した後は、通常バルブ9,9′を閉じ
て真空ポンプ10,10′の運転を停止する。
In the low-temperature physical property test apparatus having the above-described configuration, for example, when measuring the critical temperature of the subject, the subject is allowed to stand still by appropriate means in the accommodation room 12, and the accommodation room is sealed with the lid 13. . Thereafter, while replacing the air in the storage chamber and each conduit with the helium gas supplied from the helium gas cylinder 26, or after the replacement is completed, the vacuum pumps 10, 10 'are operated to operate the first vacuum vessel 1 and the first vacuum vessel. (2) The pressure inside the vacuum vessel 11 is reduced. After the pressure in each vacuum vessel is reduced to, for example, about 5 × 10 −2 Torr or less, the refrigerator 2 is started. After the refrigerator reaches the desired refrigeration level, the valves 9, 9 'are normally closed and the operation of the vacuum pumps 10, 10' is stopped.

冷凍機2が所望のレベルに冷却されれば、バルブV1,V
2,V5及びV6を開放し、バルブV3,V4を閉じて循環ポンプ2
0の運転を開始する。循環ポンプから吐出されるヘリウ
ムガス(ガス状冷媒)は、ガス/ガス熱交換器8を経て
冷凍機の冷却部に隣接する第1熱交換器5に供給されて
冷却される。第1熱交換器5を通過した冷媒は、さらに
第2熱交換器6を通過することで一段と冷却された後、
導管17c,22及び冷媒導入管31を通って被験体収容室12内
に、好ましくはその底部に供給される。冷ヘリウムガス
は被験体を冷却し、冷媒排出管32、導管24及び25を通っ
て循環ポンプ19の吸引側に戻される。従って、冷媒であ
るヘリウムガスを冷凍機の冷却部と被験体収容室との間
で、繰返し循環させることにより本実施例の装置では、
収容室内の被験体の温度を約15Kまで低下させることが
できる。
When the refrigerator 2 is cooled to a desired level, the valves V 1 and V
2, V 5 and opens the V 6, the circulation pump 2 by closing the valves V 3, V 4
0 operation starts. Helium gas (gaseous refrigerant) discharged from the circulation pump is supplied to the first heat exchanger 5 adjacent to the cooling unit of the refrigerator via the gas / gas heat exchanger 8 and cooled. The refrigerant that has passed through the first heat exchanger 5 is further cooled by passing through the second heat exchanger 6,
The gas is supplied into the subject accommodation room 12 through the conduits 17c and 22 and the refrigerant introduction tube 31, preferably at the bottom thereof. The cold helium gas cools the subject and is returned to the suction side of the circulating pump 19 through the refrigerant outlet 32, conduits 24 and 25. Therefore, by repeatedly circulating the helium gas as a refrigerant between the cooling unit of the refrigerator and the subject storage chamber, the apparatus of the present embodiment provides:
The temperature of the subject in the containment chamber can be reduced to about 15K.

一般に超電導材料の臨界温度を測定するに際しては、
被験体を極低温から徐々に昇温させながら臨界温度を測
定する場合と、被験体を任意の温度から徐々に降温させ
て臨界温度を測定する場合があるが、本発明の装置はそ
のいずれにも利用することができる。ちなみに、第1図
に示す装置で被験体を極低温から昇温させる場合には、
上記したような手順で収容室12内の被験体を極低温まで
冷却させた後、循環ポンプの運転を継続して冷凍機の運
転を停止し、収容室12に供給される冷媒の温度を温度計
35でモニターしながら、最も単純にはヒーター33及び/
又は34を働かせる。別法として、冷凍機の運転を停止す
ることなくバルブV2の開度を減少させると共に、バルブ
V3又はV4の開度を増大させ、冷凍機の冷却部に設けた熱
交換器を通過する冷媒対当該熱交換器をバイパスする冷
媒の比率を増大させる手法でも、収容室内の被験体温度
を徐々に上昇させることができる。そして、上記のヒー
ターの出力及び/又は上記の冷媒比の増大速度を適宜調
節することで、被験体温度の昇温速度を調節することが
できる。本装置は微小振動が問題となる精密磁気測定等
において特に有用と考えられる。
Generally, when measuring the critical temperature of a superconducting material,
There are cases where the critical temperature is measured while gradually increasing the temperature of the subject from extremely low temperatures, and cases where the critical temperature is measured by gradually lowering the temperature of the subject from any temperature. Can also be used. By the way, when the subject is heated from extremely low temperature by the device shown in FIG.
After cooling the subject in the accommodation room 12 to the extremely low temperature in the procedure as described above, the operation of the circulation pump is continued to stop the operation of the refrigerator, and the temperature of the refrigerant supplied to the accommodation room 12 is reduced to the temperature. Total
While monitoring at 35, most simply the heater 33 and / or
Or work 34. Alternatively, while decreasing the opening degree of the valve V 2 without stopping the operation of the refrigerator, the valve
Increases the opening degree of the V 3 or V 4, also in a manner that increases the ratio of the refrigerant bypassing the refrigerant-to the heat exchanger through the heat exchanger provided in the cooling portion of the refrigerator, accommodating chamber of the subject temperature Can be gradually raised. Then, by appropriately adjusting the output of the heater and / or the rate of increase of the refrigerant ratio, the rate of temperature increase of the subject can be adjusted. This apparatus is considered to be particularly useful in precision magnetic measurement and the like in which minute vibration is a problem.

第2図は被験体収容室を挿設した第2真空容器の周囲
に、磁石40が設置された本発明の別の実施例を、冷凍機
の冷却部が挿設された第1真空容器を省略して示すもの
であって、第1図と同一部分は第1図と同一番号が付さ
れている。磁石40は鉄芯磁石、超電導磁石(この磁石は
別の容器内に設置され、通常液体ヘリウムに浸されてい
る)のいずれであっても差し支えない。第2図に示す装
置は、被験体Mについて核磁気共鳴(NMR)、電子スピ
ン共鳴(ESR)などの低温物性試験を実施する際に好適
である。
FIG. 2 shows another embodiment of the present invention in which a magnet 40 is installed around a second vacuum vessel in which a subject accommodation room is inserted, and shows a first vacuum vessel in which a cooling unit of a refrigerator is inserted. This is abbreviated, and the same parts as those in FIG. 1 are given the same numbers as in FIG. The magnet 40 may be an iron core magnet or a superconducting magnet (this magnet is installed in another container and is usually immersed in liquid helium). The apparatus shown in FIG. 2 is suitable for performing a low-temperature physical property test such as nuclear magnetic resonance (NMR) and electron spin resonance (ESR) on the subject M.

第3図は光分光分析、メスバゥワー分光分析(γ−
線)、X−線分光分析等に使用する低温物性試験装置の
実施例を、第1真空容器を省略して示したものである。
第1真空容器には、第2図に示した実施例と同様、第1
図に示した構成の第1真空容器が使用されることが勿論
である。この実施例では図示の通り、第2真空容器11及
び被験体収容室12の側壁に、光線導入窓51及び52が設け
られる。これらの光線導入窓には、使用する光線の種類
に応じて、石英ガラス(光)、サファイヤ(光)、アル
ミニウム(γ−線)、ベリリウム(X−線)等を適宜使
用することができる。被験体Mは支持パイプ53及び固定
板54を介して、収容室12内の光線通路上に設置される。
固定板には熱伝導性に優れた銅板などを使用することを
可とし、これには必要に応じてヒーター、温度計を付設
することができる。尚、収容室12内で被験体Mを囲繞す
るチャンバー55は、冷媒導入管31から収容室内に入り、
冷媒排出管32に向かうガスによって、被験体Mが変位し
てしまう不都合を防止する保護チャンバーである。
FIG. 3 shows optical spectroscopy and Moessbauer spectroscopy (γ-
1) shows an example of a low-temperature physical property test apparatus used for X-ray spectroscopy, etc., omitting a first vacuum vessel.
In the first vacuum vessel, as in the embodiment shown in FIG.
It goes without saying that the first vacuum vessel having the configuration shown in the figure is used. In this embodiment, as shown in the figure, light introducing windows 51 and 52 are provided on the side walls of the second vacuum vessel 11 and the subject accommodation room 12. For these light introducing windows, quartz glass (light), sapphire (light), aluminum (γ-ray), beryllium (X-ray), or the like can be appropriately used depending on the type of light used. The subject M is installed on the light beam path in the accommodation room 12 via the support pipe 53 and the fixing plate 54.
A copper plate or the like having excellent thermal conductivity can be used for the fixing plate, and a heater and a thermometer can be attached to the fixing plate if necessary. The chamber 55 surrounding the subject M in the accommodation room 12 enters the accommodation room from the refrigerant introduction pipe 31,
This is a protection chamber for preventing the problem that the subject M is displaced by the gas flowing to the refrigerant discharge pipe 32.

第3図に示す第2真空容器の形状、光線導入窓の位
置、被験体の固定手段などは、使用する光線の種類又は
実験の目的に応じて、適宜変更することができ、また第
2図に示す如く、当該第2真空容器に磁石を付設するこ
とも可能である。
The shape of the second vacuum vessel, the position of the light introducing window, the means for fixing the subject, and the like shown in FIG. 3 can be appropriately changed according to the type of light beam used or the purpose of the experiment. As shown in (2), it is also possible to attach a magnet to the second vacuum vessel.

[発明の効果] 本発明の低温物性試験装置は、被験体収容室が挿設さ
れる真空容器と、冷凍機の冷却部が挿設される真空容器
とが互いに独立しているため、収容室内の被験体を冷却
するに際して冷凍機を運転しても、その振動が被験体収
容室に伝達されることがない。また、NMR、ESR、光実験
等で第2真空容器の形状に制限がある場合でも、広く対
応することができる。さらに、第2真空容器に挿設され
る被験体収容室は、その一部を第2真空容器外に開口し
ているので、冷凍機の冷却部が挿設されている第1真空
容器はもちろん、被験体収容室が挿設されている第2真
空容器についても、その断熱真空を破壊することなく、
被験体の交換を行うことができる。
[Effects of the Invention] In the low-temperature physical property test apparatus of the present invention, the vacuum container in which the test object storage chamber is inserted and the vacuum container in which the cooling unit of the refrigerator is inserted are independent of each other. Even if the refrigerator is operated when cooling the subject, the vibration is not transmitted to the subject accommodation room. Further, even when the shape of the second vacuum vessel is limited by NMR, ESR, optical experiments, etc., it can be widely used. Further, since a part of the subject accommodation room inserted into the second vacuum container is opened outside the second vacuum container, the first vacuum container into which the cooling unit of the refrigerator is inserted is of course also provided. Regarding the second vacuum vessel into which the subject accommodation room is inserted, without breaking the adiabatic vacuum,
The subject can be replaced.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の一実施例である低温物性試験装置の断
面図であり、第2図は本発明の別の実施例である装置
を、その一部を省略して示す断面図であり、第3図は本
発明のさらに別の実施例である装置を、その一部を省略
して示す実施例である。 1:第1真空容器、2:冷凍機、3:第1冷却部、4:第2冷却
部、5:第1熱交換器、6:第2熱交換器、7:輻射熱シール
ド、8:ガス/ガス熱交換器、10,10′:真空ポンプ、11:
第2真空容器、12:被験体収容室、13:蓋、20:循環ポン
プ、26:ヘリウムガスボンベ、
FIG. 1 is a cross-sectional view of a low-temperature physical property test apparatus according to one embodiment of the present invention, and FIG. 2 is a cross-sectional view illustrating a device according to another embodiment of the present invention, with a part thereof being omitted. FIG. 3 shows another embodiment of the present invention, in which a part of the apparatus is omitted. 1: first vacuum vessel, 2: refrigerator, 3: first cooling unit, 4: second cooling unit, 5: first heat exchanger, 6: second heat exchanger, 7: radiant heat shield, 8: gas / Gas heat exchanger, 10, 10 ': vacuum pump, 11:
2nd vacuum vessel, 12: subject accommodation room, 13: lid, 20: circulation pump, 26: helium gas cylinder,

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】(a)ガス状冷媒を冷却するための熱交換
器が隣接された冷却部が第1真空容器内に位置する冷凍
機と、 (b)第1真空容器外に位置し、ガス状冷媒を循環する
ためのポンプと、 (c)ガス状冷媒の入口及び出口を具えて前記第1真空
容器とは別の第2真空容器内にほぼ全体が収められ、蓋
を有する開講部が第2真空容器外に位置する被験体収容
室と、 (d)前記ポンプの吐出側に接続され、ポンプから吐出
されたガス状冷媒を、前記冷凍機の冷却部に隣接された
熱交換を経由して、前記被験体収容室の冷媒入口に供給
するためのガス状冷媒移送用第1導管と、 (e)前記被験体収容室の冷媒出口に接続され、当該収
容室内の冷媒を前記ポンプの吸引側に戻すためのガス状
冷媒移送用第2導管、から構成される低温物性試験装
置。
1. A refrigerator in which a cooling unit adjacent to a heat exchanger for cooling a gaseous refrigerant is located in a first vacuum vessel; and (b) a refrigerator is located outside the first vacuum vessel. A pump for circulating the gaseous refrigerant, and (c) a lecture section having a lid, which is substantially entirely contained in a second vacuum container separate from the first vacuum container and which has an inlet and an outlet for the gaseous refrigerant. And (d) connected to a discharge side of the pump, and exchanges gaseous refrigerant discharged from the pump with heat exchange adjacent to a cooling unit of the refrigerator. A first conduit for transferring a gaseous refrigerant for supplying to a refrigerant inlet of the subject storage chamber, and (e) connected to a refrigerant outlet of the test subject storage chamber to pump the refrigerant in the storage chamber through the pump. Low-temperature physical property test device, comprising a second conduit for transferring a gaseous refrigerant for returning to the suction side of Place.
【請求項2】前記のポンプから吐出されて第1導管を流
れるガス状冷媒を、冷凍機の冷却部に隣接された熱交換
器に供給するのに先立って、前記第2導管を流れるガス
状冷媒と間接的に熱交換させるための熱交換器を、前記
の第1真空容器内に設けたことをさらに特徴とする特許
請求の範囲第1項記載の低温物性試験装置。
2. A gaseous refrigerant discharged from said pump and flowing through a first conduit before being supplied to a heat exchanger adjacent to a cooling part of a refrigerator. 2. The low-temperature physical property test apparatus according to claim 1, further comprising a heat exchanger for indirectly exchanging heat with the refrigerant in the first vacuum vessel.
JP28348088A 1988-11-09 1988-11-09 Low temperature physical property test equipment Expired - Lifetime JP2645346B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28348088A JP2645346B2 (en) 1988-11-09 1988-11-09 Low temperature physical property test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28348088A JP2645346B2 (en) 1988-11-09 1988-11-09 Low temperature physical property test equipment

Publications (2)

Publication Number Publication Date
JPH02131143A JPH02131143A (en) 1990-05-18
JP2645346B2 true JP2645346B2 (en) 1997-08-25

Family

ID=17666091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28348088A Expired - Lifetime JP2645346B2 (en) 1988-11-09 1988-11-09 Low temperature physical property test equipment

Country Status (1)

Country Link
JP (1) JP2645346B2 (en)

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Publication number Priority date Publication date Assignee Title
JP2005221363A (en) * 2004-02-05 2005-08-18 Rigaku Corp Sample support device for x-ray analysis, and x-ray analyzer

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JP2650771B2 (en) * 1990-05-23 1997-09-03 株式会社牧野フライス製作所 Electric discharge machining method and equipment
JP2536957B2 (en) * 1990-08-31 1996-09-25 日立プラント建設株式会社 Clean room
CN102288634B (en) * 2010-06-17 2013-03-13 中国科学院理化技术研究所 Thermal property measuring device
US8433380B1 (en) * 2011-12-28 2013-04-30 Kookmin University Industry Academic Cooperation Foundation Mössbauer spectroscopy system for applying external magnetic field at cryogenic temperature using refrigerator
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005221363A (en) * 2004-02-05 2005-08-18 Rigaku Corp Sample support device for x-ray analysis, and x-ray analyzer

Also Published As

Publication number Publication date
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