JP2686358B2 - Charge amount distribution / particle size measuring device for charged particles - Google Patents
Charge amount distribution / particle size measuring device for charged particlesInfo
- Publication number
- JP2686358B2 JP2686358B2 JP2262346A JP26234690A JP2686358B2 JP 2686358 B2 JP2686358 B2 JP 2686358B2 JP 2262346 A JP2262346 A JP 2262346A JP 26234690 A JP26234690 A JP 26234690A JP 2686358 B2 JP2686358 B2 JP 2686358B2
- Authority
- JP
- Japan
- Prior art keywords
- charge amount
- frequency
- particle size
- laser beam
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- 239000002245 particle Substances 0.000 title claims description 69
- 238000001514 detection method Methods 0.000 claims description 13
- 238000012937 correction Methods 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 9
- 230000005684 electric field Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000035559 beat frequency Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000003908 quality control method Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 239000002537 cosmetic Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
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Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は荷電粒子の帯電量分布・粒度測定装置に関
し、なお詳しくはレーザービーム発生装置と、このレー
ザービーム発生装置から発生したレーザービームに一定
の周波数偏寄を与える音響変調器と、これと接続し前記
レーザービームを2つに分割するビームスプリット機構
と、このビームスプリット機構により分割されたレーザ
ービームを被測定粒子導入口から流入させる被測定粒子
に照射すると共に前記粒子に振動を付与する音波振動発
生機構と電場を発生させる電極とを備えたチャンバと、
前記粒子により散乱されたレーザービームを検知する検
知装置と、この検知装置から帯電量と粒度を算出する演
算装置とからなる荷電粒子の帯電量分布・粒度測定装置
に関する。The present invention relates to a charge amount distribution / particle size measuring device for charged particles, and more specifically to a laser beam generator and a laser beam generated from this laser beam generator. , A beam splitting mechanism which is connected to the acoustic modulator for splitting the laser beam into two, and a laser beam split by the beam splitting mechanism is introduced from a particle inlet for measurement. A chamber provided with a sound wave vibration generating mechanism for irradiating particles and applying vibration to the particles, and an electrode for generating an electric field,
The present invention relates to a charge amount distribution / particle size measuring device for charged particles, which comprises a detection device for detecting a laser beam scattered by the particles and an arithmetic device for calculating the charge amount and particle size from the detection device.
従来、この種荷電粒子の帯電量分布・粒度測定装置に
は、特開昭63−118634に記載されているように、いわゆ
るレーザードップラー法に基づくものがある。即ち、こ
の装置は、一定の周波数で音波振動する電極間に粒子を
落下させるとともに、一方の端からこの粒子に対してレ
ーザービームを照射することにより、荷電している粒子
の帯電量分布の粒子の大きさを同時に測定するものであ
る。つまり、落下する粒子は音波による空気振動が追従
して振動しながら落下していくが、粒子径が大きいもの
ほど粒子の慣性のために基準の音波より遅れて振動し、
他方、電極間に適当な電圧を加えると、粒子はその粒径
および帯電量の大きさと電界の強さに応じて振動しなが
ら、全体として偏りを生じて落下することとなる。この
ときの落下する粒子の位相遅れと偏り程度を、レーザー
ドップラー法により測定するのである。Conventionally, as a charge amount distribution / particle size measuring device of this kind of charged particles, there is one based on a so-called laser Doppler method as described in JP-A-63-118634. In other words, this device drops particles between electrodes that vibrate with sound waves at a certain frequency, and irradiates the particles with a laser beam from one end. The size of is measured at the same time. In other words, the falling particles fall while oscillating following the air vibration caused by the sound waves, but the larger the particle size, the later the particles vibrate due to the inertia of the particles,
On the other hand, when an appropriate voltage is applied between the electrodes, the particles vibrate according to the particle size, the magnitude of the amount of charge and the strength of the electric field, and as a whole, they are biased and fall. The phase delay and the degree of deviation of the falling particles at this time are measured by the laser Doppler method.
しかしながら、上記従来の荷電粒子の帯電量分布・粒
度測定装置において特にその帯電量分布測定で、印加電
圧を0(V=0)にした場合においても、その分布は正
極性または負極性側に帯電した結果がでるという問題が
あった。これでは、粒子の帯電量を真に正確に測定でき
ているのかどうかは、極めて疑わしいものと言わざるを
得ない。そこで、本発明者らはその原因を究明すべく鋭
意努力した結果、落下する粒子にレーザービームを照射
するに当り音響変調器(ブラッグセル)によって2つの
ビームに分ける際のブラッグセルの自己発振周波数、お
よびこのビームを受光した後に周波数変換するために用
いるミキサーの自己発振周波数に誤差が不可避的に介入
し、これが帯電量分布の0点偏寄の主原因であることを
明らかにした。However, even when the applied voltage is set to 0 (V = 0) in the above-mentioned conventional charged amount distribution / particle size measuring device for charged amount distribution / particle size measuring device, the distribution is positively or negatively charged. There was a problem that the result was obtained. It must be said that it is extremely doubtful whether or not the charge amount of the particles can be truly accurately measured. Therefore, as a result of diligent efforts by the present inventors to investigate the cause, the self-oscillation frequency of the Bragg cell at the time of dividing a falling particle into two beams by an acoustic modulator (Bragg cell) when irradiating a laser beam, and It has been clarified that an error inevitably intervenes in the self-oscillation frequency of the mixer used for frequency conversion after receiving this beam, and this is the main cause of the zero-point bias of the charge amount distribution.
即ち、周波数特性における帯電量qの計算は次式で示
される。That is, the calculation of the charge amount q in the frequency characteristic is expressed by the following equation.
ここで、 V:印加電圧 d:電極間距離 θ:レーザービームの交差角の半角 (2θが交差角) η:空気粘度 Cc:カニンガムの補正係数 λ:レーザーの波長。 Here, V: Applied voltage d: Distance between electrodes θ: Half angle of laser beam crossing angle (2θ is crossing angle) η: Air viscosity Cc: Cunningham's correction coefficient λ: Laser wavelength.
He−Neレーザーの場合 λ=0.6328×10-4[cm] D:粒子の空気力学径 Δf:レーザードップラー効果によるビート周波数 ところで、上記従来の装置ではこのビート周波数Δf
をカウントして(いわば電極間での粒子移動速度を測定
して)、帯電量qを求める方法をとっていた。即ち、レ
ーザー光をブラッグセルで所定の自己発振周波数(例え
ば、41MHz)で2つのビームに分け、このビームをフォ
トマルのような受光器で受光した後、所定の自己発振周
波数(例えば、39MHz)のミキサーで周波数変換し、そ
の後信号処理を行い、カウントするものであるため、ブ
ラッグセルとミキサの自己発振周波数の精度がビート周
波数の測定に重要な影響をもつものである処、実際には
ブラッグセルとミキサの自己発振周波数が必ずしも所定
のものとはなっていなかった。In the case of He-Ne laser λ = 0.6328 × 10 -4 [cm] D: Aerodynamic diameter of particle Δf: Beat frequency due to laser Doppler effect By the way, in the above-mentioned conventional apparatus, this beat frequency Δf
Was counted (so to speak, the moving speed of particles between the electrodes was measured) to obtain the charge amount q. That is, the laser light is divided into two beams at a predetermined self-oscillation frequency (for example, 41 MHz) by a Bragg cell, and this beam is received by a photodetector such as a photomultiplier, and then at a predetermined self-oscillation frequency (for example, 39 MHz). Since the frequency conversion is performed by the mixer, then the signal processing is performed, and counting is performed, the accuracy of the self-oscillation frequency of the Bragg cell and the mixer has an important influence on the measurement of the beat frequency. The self-oscillation frequency of was not always a predetermined value.
例えば、上記のブラッグセルの自己発振周波数を41MH
zに設定すると、実際には40.9957798×106Hzとなり0.01
03%の誤差があり、又ミキサーの自己発振周波数を39MH
zとすると、実際には38.9987316×106Hzとなり0.0032%
の誤差があった。これらの誤差は無視し得ないものであ
り、そのまま帯電量の測定にもたらされて、印加電圧を
0にした場合にも帯電量が0にならず、結局、帯電量の
測定値自体の信頼性が疑わしいものとなっていた。For example, the self-oscillation frequency of the Bragg cell above is 41 MHz.
When set to z, it is actually 40.9957798 × 10 6 Hz, 0.01
There is an error of 03%, and the self-oscillation frequency of the mixer is 39 MHz.
z is actually 38.9987316 × 10 6 Hz, which is 0.0032%
There was an error. These errors are not negligible, and they are directly brought to the measurement of the charge amount, and even when the applied voltage is set to 0, the charge amount does not become 0. In the end, the reliability of the measured value of the charge amount itself is high. The sex was suspicious.
尚、このブラッグセルとミキサの自己発振周波数を高
い精度で発振させようと思えば、高価な安定化装置を用
いる必要があり、そのような装置では到底経済的に見合
うものとはならない。In order to oscillate the self-oscillation frequency of the Bragg cell and the mixer with high accuracy, it is necessary to use an expensive stabilizing device, and such a device is not economically economically feasible.
そこで、上記従来技術の有する問題点を解決するため
本発明は、上記従来技術の有する欠点を解消し、ブラッ
グセルとミキサの各自己発振周波数に誤差が存在したと
しても、高い精度で荷電粒子の帯電量分布を測定可能な
装置を提供することを目的とする。Therefore, in order to solve the problems of the above-described conventional technology, the present invention solves the above-mentioned drawbacks of the conventional technology, and charges charged particles with high accuracy even if there is an error in each self-oscillation frequency of the Bragg cell and the mixer. An object is to provide an apparatus capable of measuring a quantity distribution.
上記目的を達成するため、本発明の荷電粒子の帯電量
分布・粒度測定装置の特徴構成は、冒記の「荷電粒子の
帯電量分布・粒度測定装置」であって、演算装置が、前
記音響変調器による周波数と前記検知装置に設けられて
いる周波数変換用ミキサーに用いる周波数とを検出し、
両者の値から補正周波数を算出して帯電量を演算・算出
せしめる補正手段を備えている点にある。In order to achieve the above object, the characteristic configuration of the charge amount distribution / particle size measuring device for charged particles of the present invention is the “charge amount distribution / particle size measuring device for charged particles” at the beginning, in which the arithmetic unit is the acoustic Detects the frequency by the modulator and the frequency used in the frequency conversion mixer provided in the detection device,
A point is provided with a correction unit that calculates a correction frequency from both values and calculates / calculates the charge amount.
次に、本発明にかかる荷電粒子の帯電量分布・粒度測
定装置の作用・効果を説明する。Next, the operation and effect of the charge amount distribution / particle size measuring device for charged particles according to the present invention will be described.
本発明の測定装置が上記構成となっているので、ブラ
ッグセルとミキサの自己発振周波数に誤差が存在したと
しても、これらと目的とする変換後の周波数との差異を
検出して自動的にそれの差異分だけ補正するようになっ
ていて、誤差による影響を受けることがない。つまり、
印加電圧を0にした場合においても、その分布はいずれ
かの極性側に偏寄することなく、従って、常に高い精度
で荷電粒子の帯電量分布を測定できることとなる。しか
も、そのために特別に高価な装置を必要としない。Since the measuring device of the present invention has the above-mentioned configuration, even if there is an error in the self-oscillation frequency of the Bragg cell and the mixer, the difference between these and the frequency after the target conversion is detected and the error is automatically detected. Only the difference is corrected, and it is not affected by the error. That is,
Even when the applied voltage is set to 0, the distribution does not deviate to either polarity side, and therefore the charge amount distribution of the charged particles can always be measured with high accuracy. Moreover, it does not require any specially expensive equipment.
以上のように、本発明によれば、安価で精度のよい荷
電粒子の帯電量分布・粒度測定装置を提供することがで
きた。As described above, according to the present invention, it is possible to provide an inexpensive and accurate charge amount distribution / particle size measuring device for charged particles.
本発明にかかる荷電粒子の帯電量分布・粒度測定装置
の実施例を、図面を参照して詳細に説明する。An embodiment of a charge amount distribution / particle size measuring device for charged particles according to the present invention will be described in detail with reference to the drawings.
第1、2図は、本発明装置の一実施例を示す。即ち、
この荷電粒子の帯電量分布・粒度測定装置は、レーザー
ビーム発生装置(1)と、このレーザービーム発生装置
(1)から発生したレーザービームに一定の周波数偏寄
を与えて2つに分割するビームスプリット機構を備えた
音響変調器(2)と、このビームスプリット機構により
分割されたレーザービームを導入して測定点(10)で被
測定粒子(9)にビーム照射するチャンバ(7)と、こ
のチャンバ(7)から放出される前記粒子(9)によっ
て散乱されたレーザービームを集光する集光装置(11)
と、集光されたビームを検知する検知装置(4)と、こ
の検知装置(4)から帯電量と粒度を算出する演算装置
(12)とからなっている。1 and 2 show one embodiment of the device of the present invention. That is,
This charge amount distribution / particle size measuring device for charged particles is composed of a laser beam generator (1) and a beam generated by the laser beam generator (1) which is divided into two by giving a certain frequency deviation. An acoustic modulator (2) having a split mechanism, a chamber (7) for introducing a laser beam split by the beam split mechanism and irradiating a particle (9) to be measured with a beam at a measurement point (10), Focusing device (11) for focusing the laser beam scattered by the particles (9) emitted from the chamber (7)
A detection device (4) for detecting the condensed beam, and a calculation device (12) for calculating the charge amount and the particle size from the detection device (4).
そして、前記チャンバ(7)は被測定粒子導入口
(6)から下方に流入させる被測定粒子(9)にレーザ
ービーム(5)を照射すると共に、前記粒子(9)に振
動を付与する音波振動発生機構(3)と電場を発生させ
る電極(8)とを備える。又、前記検知装置(4)は集
光されたビームを受入れる光電子増倍管(フォトマル)
(14)と、このフォトマルに接続され周波数変換を行い
ノイズ軽減を図るミキサー(15)と、このミキサー(1
5)からの信号を処理する信号処理機構と、周波数をカ
ウントするカウンター(16)などからなっている。Then, the chamber (7) irradiates the laser beam (5) to the measured particles (9) flowing downward from the measured particle introduction port (6), and at the same time, vibrates the particles (9) with sound wave vibration. It comprises a generating mechanism (3) and an electrode (8) for generating an electric field. Further, the detection device (4) is a photomultiplier tube (photomultiplier) that receives the focused beam.
(14), a mixer (15) connected to this Photomul for frequency conversion to reduce noise, and this mixer (1
It consists of a signal processing mechanism that processes the signal from 5) and a counter (16) that counts the frequency.
一方、演算装置(12)は前記検知装置(4)によって
カウントされた周波数から測定粒子の粒度・帯電量を算
出する中央演算処理装置(CPU)(17)と、その結果を
出力するプリンター等の出力装置(18)等からなってお
り、この演算装置(12)にブラッグセル及びミキサーの
各自己発振周波数の誤差を検出する誤差検出回路(19)
が組込まれていて、その検出された誤差から補正周波数
を計算して帯電量を補正する補正手段(13)か設けられ
ている。On the other hand, the arithmetic unit (12) includes a central processing unit (CPU) (17) that calculates the particle size and charge amount of the measured particles from the frequency counted by the detection unit (4), and a printer that outputs the result. An error detection circuit (19) including an output device (18) and the like, and an arithmetic unit (12) for detecting an error of each self-oscillation frequency of the Bragg cell and the mixer.
And a correction means (13) for correcting the charge amount by calculating a correction frequency from the detected error.
次に、本発明装置の作用を説明する。 Next, the operation of the device of the present invention will be described.
まず、第1図において、チャンバ(7)の被測定粒子
導入口(6)から適当な供給手段を用いて窒素ガスなど
の気流に搬送された被測定粒子(9)を投入する。投入
された粒子は、音波振動発生機構(3)からの音波によ
る振動と所定電圧を加えられた電極(8)からの電界と
によって、帯電量の大きさと振動に応じて落下しつつ、
測定点(10)において2つに分離されたレーザービーム
の照射を受ける。この場合、粒子はその大きさに応じて
基準の音波より遅れて振動すると同時に、帯電量に応じ
てある偏りをもって落下する。粒子からのこのような情
報を反映してビームは散乱することとなる。この散乱ビ
ームは、一旦集光されてフォトマル(14)に導入され、
ここでミキサー(15)による周波数変換を受ける。更
に、変換を受けた信号はフィルタ(20)、波形整形回路
(21)、周波数カウンタ(16)、誤差検出回路(19)を
経て演算された後、プリンタ(18)に出力されるように
なっている。First, in FIG. 1, the particles to be measured (9) conveyed to the air flow of nitrogen gas or the like are introduced from the particles to be measured introduction port (6) of the chamber (7) using an appropriate supply means. The charged particles fall according to the magnitude of the charge amount and the vibration due to the vibration of the sound wave from the sound wave vibration generating mechanism (3) and the electric field from the electrode (8) to which a predetermined voltage is applied,
The measurement point (10) is irradiated with the laser beam divided into two. In this case, the particles vibrate later than the reference sound wave according to their size, and at the same time, they fall with a certain bias depending on the charge amount. The beam will scatter reflecting such information from the particles. This scattered beam is once condensed and introduced into Photomaru (14),
Here, it undergoes frequency conversion by the mixer (15). Further, the converted signal is output through the filter (20), the waveform shaping circuit (21), the frequency counter (16) and the error detection circuit (19) and then output to the printer (18). ing.
次に、帯電量分布の補正を、第3図のフローチャート
をもとに説明する。Next, correction of the charge amount distribution will be described with reference to the flowchart of FIG.
(イ)まず、ブラッグセルの自己発振周波数f1とミキサ
ーの自己発振周波数f2とから実際の変換周波数を検出
し、これと目的とする変換周波数との差Δfc(補正値)
を読出す。(A) First, the actual conversion frequency is detected from the self-oscillation frequency f 1 of the Bragg cell and the self-oscillation frequency f 2 of the mixer, and the difference Δfc (correction value) between this and the desired conversion frequency.
Is read.
(ロ)周波数カウンターにカウントされた全周波数デー
タを、正帯電または負帯電毎に計算機の作業領域を複写
して一定範囲のチャンネルに区分する。(B) All frequency data counted by the frequency counter is divided into channels within a certain range by copying the working area of the computer for each positive charge or negative charge.
(ハ)各チャンネル毎に代表周波数Δfi(iチャンネル
の代表周波数)を補正する。(C) Correct the representative frequency Δfi (representative frequency of the i channel) for each channel.
即ち、Δfi′=Δfi±Δfcとする。 That is, Δfi ′ = Δfi ± Δfc.
(ニ)補正されたΔfi′が0より小さければ、帯電量に
関する前記(1)式のΔfに代えてΔfi′を採用し、帯
電量を算出する。(D) If the corrected Δfi ′ is smaller than 0, Δfi ′ is adopted instead of Δf in the equation (1) regarding the charge amount, and the charge amount is calculated.
(ホ)補正されたΔfi′が0より大きければ、このチャ
ンネルに含まれているデータを逆極性側に移動して
(ニ)と同様に帯電量を算出する。(E) If the corrected .DELTA.fi 'is larger than 0, the data contained in this channel is moved to the opposite polarity side and the charge amount is calculated in the same manner as in (D).
以上のような補正手段を用いることにより、例えば複
写機に用いられるトナーのような帯電粒子を用いて印加
電圧を0として測定しても、帯電量は正しく0点を示
し、0点から偏寄することがなかった。By using the above correction means, even if charged particles such as toner used in a copying machine are used and the applied voltage is measured as 0, the amount of charge correctly indicates 0 point, and the charge amount deviates from 0 point. I had nothing to do.
レーザービーム発生装置(1)としては、He−Neレー
ザー発生装置が一般に用いられるがこれに限定されるも
のではない。ビームスプリット機構としては、レーザー
ビームをプリズムで分離した後ミラーを用いて所定の方
向にビームを送出する構成とするのが一般的であるが、
これ以外の方法でもよい。A He—Ne laser generator is generally used as the laser beam generator (1), but the laser beam generator (1) is not limited to this. As the beam splitting mechanism, it is common to separate the laser beam by a prism and then use a mirror to send the beam in a predetermined direction.
Other methods may be used.
本発明装置は、複写機のトナーの品質管理、品質改良
に適用できる他、多種塗料用粉体、樹脂粉末、化粧品用
粉体等の品質管理、品質改良、研究開発等にも利用でき
る。INDUSTRIAL APPLICABILITY The apparatus of the present invention can be applied not only to the quality control and quality improvement of toner of copying machines, but also to the quality control, quality improvement, research and development of powders for various paints, resin powders, cosmetic powders and the like.
尚、特許請求の範囲の項に図面との対照を便利にする
為に符号を記すが、該記入により本発明は添付図面の構
造に限定されるものではない。In the claims, reference numerals are provided for convenience of comparison with the drawings, but the present invention is not limited to the structure shown in the attached drawings.
第1図は本発明に係る帯電粒子の帯電量分布・粒度測定
装置の一実施例を表す全体概念図、第2図は検知装置と
演算装置に関するフローチャート、第3図は帯電量分布
を補正するフローチャートである。 (1)……レーザービーム発生装置、(2)……音響変
調器、(3)……音波振動発生機構、(4)……レーザ
ービーム検知装置、(5)……レーザービーム、(6)
……被測定粒子導入口、(7)……チャンバ、(8)…
…電極、(9)……被測定粒子、(12)……演算装置、
(13)……補正手段。FIG. 1 is an overall conceptual diagram showing an embodiment of a charge amount distribution / particle size measuring device for charged particles according to the present invention, FIG. 2 is a flow chart relating to a detection device and a computing device, and FIG. 3 is for correcting the charge amount distribution. It is a flowchart. (1) ... Laser beam generator, (2) ... Acoustic modulator, (3) ... Sound wave vibration generating mechanism, (4) ... Laser beam detector, (5) ... Laser beam, (6)
...... Measured particle inlet, (7) …… Chamber, (8) ……
… Electrodes, (9) …… Particles to be measured, (12) …… Computers,
(13) …… Correction means.
Claims (1)
ーザービーム発生装置(1)から発生したレーザービー
ム(5)に一定の周波数偏寄を与えて2つのレーザービ
ームに分割するビームスプリット機構をもつ音響変調器
(2)と、このビームスプリット機構により分割された
レーザービームを被測定粒子導入口(6)から流入させ
る被測定粒子(9)に照射すると共に前記粒子(9)に
振動を付与する音波振動発生機構(3)と電場を発生さ
せる電極(8)とを備えたチャンバ(7)と、前記粒子
(9)により散乱されたレーザービームを検知する検知
装置(4)と、この検知装置(4)から帯電量と粒度を
算出する演算装置(12)とからなる荷電粒子の帯電量分
布・粒度測定装置において、前記演算装置(12)が、前
記音響変調器(2)による周波数と前記検知装置(4)
に設けられている周波数変換用ミキサー(15)に用いる
周波数とを検出し、両者の値から補正周波数を算出して
帯電量を演算・算出せしめる補正手段(13)を備えてい
ることを特徴とする荷電粒子の帯電量分布・粒度測定装
置。1. A laser beam generator (1) and a beam splitting mechanism for dividing a laser beam (5) generated from the laser beam generator (1) into two laser beams by giving a certain frequency deviation. An acoustic modulator (2) having the same and a laser beam divided by the beam splitting mechanism are applied to a particle (9) to be measured which is introduced from an inlet (6) of the particle to be measured, and vibration is imparted to the particle (9). A chamber (7) equipped with a sound wave vibration generating mechanism (3) and an electrode (8) for generating an electric field, a detection device (4) for detecting the laser beam scattered by the particles (9), and this detection A charged particle charge amount distribution / particle size measuring device comprising a calculation device (12) for calculating a charge amount and a particle size from a device (4), wherein the calculation device (12) comprises the acoustic modulator (2). Frequency and detection device (4)
Is equipped with a correction means (13) for detecting the frequency used in the frequency conversion mixer (15) provided in the device, calculating the correction frequency from the values of both, and calculating / calculating the charge amount. Charge amount distribution / particle size measuring device for charged particles.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2262346A JP2686358B2 (en) | 1990-09-28 | 1990-09-28 | Charge amount distribution / particle size measuring device for charged particles |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2262346A JP2686358B2 (en) | 1990-09-28 | 1990-09-28 | Charge amount distribution / particle size measuring device for charged particles |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04138336A JPH04138336A (en) | 1992-05-12 |
| JP2686358B2 true JP2686358B2 (en) | 1997-12-08 |
Family
ID=17374472
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2262346A Expired - Lifetime JP2686358B2 (en) | 1990-09-28 | 1990-09-28 | Charge amount distribution / particle size measuring device for charged particles |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2686358B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5665151B2 (en) * | 2011-02-09 | 2015-02-04 | 独立行政法人産業技術総合研究所 | Electrostatic charge measurement method and apparatus |
| KR20240173424A (en) * | 2023-06-05 | 2024-12-12 | 중앙대학교 산학협력단 | Flow behavior control device and flow behavior control method |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3205413B2 (en) * | 1993-02-15 | 2001-09-04 | 株式会社日立製作所 | Particle measuring device and particle measuring method |
| JP5650609B2 (en) * | 2011-08-15 | 2015-01-07 | 大成建設株式会社 | Charge amount identification device for charged particles |
| CN106950438B (en) * | 2017-04-28 | 2023-06-02 | 中国科学院地球化学研究所 | Non-contact space particle charged detection device and method |
-
1990
- 1990-09-28 JP JP2262346A patent/JP2686358B2/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5665151B2 (en) * | 2011-02-09 | 2015-02-04 | 独立行政法人産業技術総合研究所 | Electrostatic charge measurement method and apparatus |
| KR20240173424A (en) * | 2023-06-05 | 2024-12-12 | 중앙대학교 산학협력단 | Flow behavior control device and flow behavior control method |
| KR102917551B1 (en) | 2023-06-05 | 2026-01-23 | 중앙대학교 산학협력단 | Flow behavior control device and flow behavior control method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04138336A (en) | 1992-05-12 |
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