JP2687906B2 - Reflection characteristics evaluation device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for evaluating reflection characteristics, and more particularly to an apparatus for evaluating the reflection characteristics of a reflective liquid crystal display device.

[0002]

2. Description of the Related Art As a method for evaluating the reflection characteristics of a reflection type liquid crystal display device, as shown in FIG. Can be measured by the measuring device 8. As the light source 2, a white light source such as a halogen light source or a metal halide light source, or a He—Ne laser light source is used. Generally, the incident angle θ of light is 20 from the direction perpendicular to the evaluation sample surface.
In most cases, an angle inclined by 45 degrees is adopted. An example of evaluation by this method is S. Mitsui, Y. Shima
da, K.I. Yamamoto, T .; Takamats
u, N. Kimura, S .; Kozaki, S .; Oga
wa, H.W. Morimoto, M .; Matsuura,
M. Ishii, K .; Awane; "Bright R
effective Multicolor LCDs
Addressed by a-Si TFTs ";
SID 92 DIGEST, pp. 437-440,
(1992) and Naofumi Kimura, Seiichi Mitsui, Yasunori Shimada,
Kunihiko Yamamoto, Shuichi Kanzaki, Hiroshi Morimoto, Masataka Matsuura, "Development of Reflective Color LCD", Sharp Technical Report, No. 56, pp. 2
7-30, June 1993.

As another method, there is a method of irradiating diffused light for evaluation. As a method for obtaining diffused light, an integrating sphere or an integrating hemisphere is used. As an actual product, a panel evaluation device DM manufactured by Autronic
There are S501 and DMS703. DMS50 in FIG.
1 shows a schematic view of 1. This panel evaluation system uses the integral hemisphere 1
3, a slit 17 is provided in the integrating hemisphere 13,
The measuring device 8 can move along the slit 17. By irradiating the inner surface of the integrating hemisphere with the light guided from the external halogen light source 2 through the filter 3 to the circumference of the bottom surface of the integrating hemisphere 13 by the optical fiber 14,
The evaluation sample 11 placed on the stage 16 can be irradiated with diffused light. The reflected light from the evaluation sample 11 is received by the measuring instrument 8 and the angle dependence is measured.

[0004]

In the conventional example of the reflection characteristic evaluation apparatus, in the case of the method of irradiating light from a certain direction, only the reflection characteristic in the vertical direction can be measured, and the place where the diffused light actually hits the room. Therefore, it is not possible to make an evaluation that is consistent with the brightness and color felt by the human eye. Therefore, it is not possible to measure the angle dependence of the reflection characteristics.

On the other hand, in the case of the method of irradiating diffused light using an integrating hemisphere or the like, a slit is provided to measure the angle dependence, and the diffused light is not incident from the angle of the slit portion, so that a perfect No diffuse light can be obtained. Therefore, the brightness and the color are evaluated differently from those of the actual human eye.

An object of the present invention is to quantitatively measure the brightness and color of the reflection characteristic to be equal to the sense of the human eye.
An object of the present invention is to provide a reflection characteristic evaluation device capable of measuring the angle dependency.

[0007]

A reflection characteristic evaluation apparatus according to a first aspect of the present invention comprises means for irradiating an evaluation sample with diffused light, and a measuring device for measuring the reflection angle dependence of the reflection light from the evaluation sample. And a means for removing an irradiation component of the diffused light from the angle of regular reflection with respect to the reflection measurement angle to the evaluation sample.

In the reflection characteristic evaluation apparatus of the second invention, in the first invention, the irradiation means is an integrating sphere, the inner surface of the integrating sphere is irradiated with light using a light source, and a part of the integrating sphere is evaluated. A sample measurement hole is provided, and the evaluation sample is irradiated with diffused light reflected inside the integrating sphere through the measurement hole, and the measuring device is provided outside the integrating sphere, and at the location of the measuring device. A photometric hole arranged in combination, a photometric hole for the evaluation sample and a specular reflection removing hole in the specular reflection direction are provided in the integrating sphere, and the specular reflection removing hole removes the irradiation component. It is characterized by constituting means.

In the reflection characteristic evaluation apparatus of the third invention, in the first invention, the irradiating means is an integrating hemisphere, the inner surface of the integrating hemisphere is irradiated with light using a light source, and the light is reflected by the inner surface of the integrating hemisphere. Irradiating diffused light to the evaluation sample placed on the bottom surface of the integrating hemisphere, the measuring device is provided outside the integrating hemisphere, and a photometric hole arranged in accordance with the location of the measuring device, and the evaluation sample. On the other hand, the photometric hole and the specular reflection removing hole in the specular reflection direction are provided in the integrating hemisphere, and the specular reflection removing hole constitutes means for removing the irradiation component.

In a reflection characteristic evaluation apparatus of a fourth invention, in the first invention, the irradiating means is an integrating sphere, the inner surface of the integrating sphere is irradiated with light using a light source, and a part of the integrating sphere is evaluated. A sample measurement hole is provided, and the evaluation sample is irradiated with diffused light reflected inside the integrating sphere through the measurement hole, and the measuring device is provided outside the integrating sphere, and the measuring device depends on the reflection angle. Slits are provided in the integrating sphere in accordance with the trajectory that moves to measure the property,
A slide type cover having the same quality as the inner surface of the integrating sphere is provided for covering the slit photometric direction and the evaluation sample other than the photometric direction and the regular reflection direction, and the slide type cover constitutes means for removing the irradiation component. It is characterized by

In the reflection characteristic evaluation apparatus of the fifth invention, in the first invention, the irradiating means is an integrating hemisphere, the inner surface of the integrating hemisphere is irradiated with light using a light source, and the light is reflected by the inner surface of the integrating hemisphere. Irradiating diffused light to the evaluation sample placed on the bottom surface of the integrating hemisphere, the measuring device is provided outside the integrating hemisphere, the slit according to the trajectory that the measuring device moves to measure the reflection angle dependence. Provided in the integrating hemisphere, a sliding cover of the same quality as the inner surface of the integrating hemisphere that covers the photometric direction of the slit and the evaluation sample other than the photometric direction and the regular reflection direction is provided, and the slide type cover is the irradiation. It is characterized in that it constitutes means for removing components.

A reflection characteristic evaluation apparatus of a sixth invention is the reflection characteristic evaluation apparatus according to the fourth invention or the fifth invention, wherein the slide type cover of the slit is changed in association with the movement of the measuring instrument for measuring the reflection angle dependency. To do.

[0013]

The light applied to the inner surface of the integrating sphere is diffused and applied to the evaluation sample. Therefore, it is possible to make the light irradiation condition equivalent to that under normal indoor diffused light, and it is possible to make it look the same as when viewed under normal indoor diffused light not only in one direction but also from any direction. . Therefore, the angle dependence of the reflection characteristic can be measured. However, with respect to the evaluation sample having a large specular reflection component, the human eye removes the specular reflection component to evaluate brightness and color, and therefore the specular reflection component must be removed also in the evaluation device. Therefore,
In the present invention, in addition to the hole for the luminance meter which is a measuring instrument, a hole is provided at a position corresponding to the angle of regular reflection with respect to this hole and the evaluation sample surface, and light does not enter only from the regular reflection direction. Makes the diffused light incident on the evaluation sample. Therefore, even an evaluation sample with a large specular reflection can be evaluated quantitatively equivalent to the human sense of eye.

[0014]

Embodiments of the present invention will be described below in detail with reference to the drawings.

Embodiment 1 FIG. 1 is a schematic diagram of a reflection characteristic evaluation apparatus according to a first embodiment of the present invention.

This reflection characteristic evaluation apparatus comprises an integrating sphere 1. The diameter of the integrating sphere 1 is about 20 cm, but there is no particular restriction on the size. A white perfect diffusion material such as BaSO ₄ is used in the integrating sphere. A halogen light source 2 is provided on the lower side surface of the integrating sphere 1 so as to irradiate the inner surface of the integrating sphere. The light source is C through the filter 3.
Alternatively, it is adjusted to be a D65 light source. In this embodiment, the filter 3 is a C light source spectrum filter.

The integrating sphere 1 has an evaluation sample hole 5 in its lower portion, and the evaluation sample 11 is installed in the sample holder 10 so as to close the evaluation sample hole 5.
Inside the integrating sphere 1, a partition wall 4 is provided between the light source 2 and the evaluation sample hole 5 so that the light from the light source does not directly enter the evaluation sample 11.

A plurality of integrating spheres 1 are provided on the upper side (4 in the figure).
2 and a plurality of (three in the figure) holes 7 for removing specular reflection.

Hole 5 for evaluation sample, hole 6 for photometry
The regular reflection removing hole 7 has a diameter of about 1 to 3 cm. The photometric hole 7 and the regular reflection removing hole 7 are provided so as to have a regular reflection positional relationship with the hole surface for the evaluation sample. In this embodiment, 0 degrees, 15 degrees, 30 degrees,
It is located at 45 degrees.

The reason for providing the regular reflection removing hole 7 is as follows.

The light applied to the inner surface of the integrating sphere is diffused and applied to the evaluation sample 11. Therefore, it is possible to make the light irradiation condition equivalent to that under normal indoor diffused light, and it is possible to make it look the same as when viewed under normal indoor diffused light not only in one direction but also from any direction. . However, for an evaluation sample such as a reflective LCD with a flat glass substrate on a reflection plate and a large specular reflection component on the surface, the human eye evaluates brightness and color by removing the specular reflection component. Therefore, the specular reflection component must be removed also in the evaluation device. Therefore, in addition to the photometric hole 6, a hole 7 is provided on the integrating sphere at a position corresponding to the angle of regular reflection with respect to the hole 6 and the evaluation sample surface.

A luminance meter is used as the measuring device 8, and the luminance meter is installed on a circular rail 9 centered on the evaluation sample hole 5 so that the luminance meter can freely move on the rail. Has become. The luminance meter is moved to the position of the photometric hole 6 at the desired measurement angle, and the photometric hole 6 and the corresponding specular reflection removing hole 7 other than the corresponding photometric hole 6 are covered with the lid 12. This allows measurement.

In this embodiment, 0 °, 15 °, 30 °, 4 °
The angle dependence of 5 degrees can be evaluated. When measuring at each angle, open each photometric hole 6 and the hole 7 corresponding to its regular reflection direction, and cover the other holes with the lid 12. Thus, light does not enter only from the direction of specular reflection, and diffused light enters the evaluation sample from other directions. Therefore, even an evaluation sample with a large specular reflection can be evaluated quantitatively equivalent to the human sense of eye.

The brightness was evaluated by subjective evaluation in an ordinary office room using evaluation samples having various reflection characteristics in which the surface shape of the reflection plate was changed. In the evaluation, the evaluation sample is shown to the subject, and the standard sample brightness is set to 1
A value of 0 was used, and a method of receiving the brightness of the evaluation sample was used. The evaluation results were the average of 20 men and women. FIG. 8 shows the relationship between the result of this subjective evaluation and the result evaluated by the device of the present invention. A luminance meter was used as the measuring instrument of the present invention. The results of the two types of brightness evaluation are almost proportional, and it can be said that the evaluation device of the present invention was able to quantitatively measure the brightness and color of the reflection characteristics equal to the human eye's sense.

Embodiment 2 FIG. 2 is a schematic diagram of a reflection characteristic evaluation apparatus according to a second embodiment of the present invention.

This reflection characteristic evaluation apparatus has an integrating hemisphere 13. The diameter of the integrating hemisphere 13 is about 20 cm, but there is no particular restriction on the size. BaSO _{4 in the} integrating hemisphere
The white perfect diffusion material such as is used. Integrating hemisphere 13
Light is guided by an optical fiber 14 from a light source provided with a halogen light source 2 and a C light source spectrum filter 3 around the bottom surface of the, and illuminates the inner surface of the integrating hemisphere.

An evaluation sample stage 16 is provided on the bottom surface of the integrating hemisphere 13, and the evaluation sample 11 is installed so as to cover the bottom surface of the integrating hemisphere 13.

The integrating hemisphere 13 has a plurality (4 in the figure) of photometric holes 6 and a plurality (3 in the figure) of holes 7 for removing specular reflection. The photometric hole 6 and the regular reflection removing hole 7 have a diameter of about 1 to 3 cm. The photometric hole 6 and the regular reflection removing hole 7 are provided so as to have a regular reflection positional relationship with the bottom surface of the integrating hemisphere. In this embodiment, the positions are 0, 15, 30, and 45 degrees.

A luminance meter is used as the measuring instrument 8, and an arm 15 whose angle can be freely changed with the center of the integrating hemisphere as the central axis.
Is provided outside the integrating hemisphere 13, and a luminance meter is installed at the tip of the arm 15. Move the arm 15 to move the luminance meter to the position of the photometric hole 6 at the desired measurement angle,
Measurement can be performed by putting a lid 12 on the photometric hole 6 and the regular reflection removing hole 7 other than the photometric hole 6 and the corresponding regular reflection removing hole 7.

Embodiment 3 FIG. 3 is a schematic diagram of a reflection characteristic evaluation apparatus according to a third embodiment of the present invention. In this embodiment, the integrating sphere 1 is the same as the first embodiment.
A slit 17 is provided on the upper part of the measuring instrument 8 in accordance with the trajectory of movement of the measuring device 8 to measure the reflection angle dependency, and the slit 17 is closed by a slide-type cover 18. This is the same as the first embodiment. The inside of the sliding cover 18 is made of the same material as the integrating sphere 1.

FIG. 5 is a view showing the structure of the cover 18.
(A) is a top view and (b) is a sectional view. The slide type cover 18 that closes the slit 17 of the integrating sphere 1 is composed of a large number of slide pieces 19, and two slide pieces 20 of these slide pieces have a photometric hole 6 and a regular reflection removing hole 7. It is provided.

As shown in FIG. 3, the cover 18 is slid so that the photometric hole 6 and the regular reflection removing hole 7 are in a regular reflection positional relationship with the evaluation sample hole surface. Measurement can be performed by moving the luminance meter 8 on the rail 9 to the position of the photometric hole 6 at a desired measurement angle.

In the above example, the sliding cover 18 and the luminance meter 8 are moved separately, but the sliding cover 18 may be moved in association with the movement of the luminance meter.

Embodiment 4 FIG. 4 is a schematic diagram of a reflection characteristic evaluation apparatus according to a fourth embodiment of the present invention. In this embodiment, a slit 17 is provided above the integrating hemisphere 13 in the second embodiment, and the slit 17 is closed by a slide type cover 18. Other configurations are the same as those in the second embodiment. Is. In the structure of the cover 18,
5, the cover 18 is slid, and the photometric hole 6 and the specular reflection removing hole 7 are in the positional relationship of specular reflection with respect to the bottom surface of the integrating hemisphere, as shown in FIG. To do so. Measurement can be performed by moving the arm 15 and moving the luminance meter to the position of the photometric hole 6 at a desired measurement angle.

Also in this case, it is preferable that the sliding cover 18 be moved in association with the movement of the arm 15 as in the third embodiment.

[0036]

According to the present invention, there is provided a reflection characteristic evaluation device capable of quantitatively measuring the brightness and color of the reflection characteristic to be equal to the sense of the human eye, and further measuring the angle dependence. be able to.

[Brief description of the drawings]

FIG. 1 is a schematic diagram of a reflection characteristic evaluation apparatus according to a first embodiment of the present invention.

FIG. 2 is a schematic diagram of a reflection characteristic evaluation apparatus according to a second embodiment of the present invention.

FIG. 3 is a schematic diagram of a reflection characteristic evaluation apparatus according to a third embodiment of the present invention.

FIG. 4 is a schematic diagram of a reflection characteristic evaluation apparatus according to a fourth embodiment of the present invention.

FIG. 5 is a schematic view of a sliding type cover of the third and fourth embodiments of the present invention.

FIG. 6 is a schematic diagram of a conventional reflection characteristic evaluation apparatus using one-direction incident light.

FIG. 7 is a schematic view of a conventional diffused light reflection characteristic evaluation apparatus.

FIG. 8 is a diagram showing a relationship between subjective evaluation of brightness and evaluation using the evaluation device of the present invention.

[Explanation of symbols]

 1 integrating sphere 2 light source 3 filter 4 partition 5 hole for evaluation sample 6 hole for photometry 7 hole for removing specular reflection 8 measuring instrument 9 rail 10 sample holder 11 evaluation sample 12 lid 13 integrating hemisphere 14 optical fiber 15 arm 16 stage 17 slit 18 cover 19,20 slide pieces

Claims (6)

(57) [Claims] 1. The light from a light source is reflected by its inner surface and diffused.
An integrating sphere that irradiates the evaluation sample with light, and a plurality of integrating spheres provided in a part of the integrating sphere to illuminate the evaluation sample.
A measurement hole that takes out the reflected light emitted, and the irradiation component is removed in the direction of regular reflection with this measurement hole.
A plurality of holes for removing specular reflection and the holes for measurement provided outside the integrating sphere.
Dependence on the reflection angle of the reflected light emitted from the evaluation sample
Equipped with a measuring device for measuring specularity, and for removing specular reflection corresponding to one of the photometric holes
When using one of the holes, the other metering hole and
The reflection characteristic evaluation device is characterized in that the regular reflection removing hole is provided with a lid . 2. The light from a light source is reflected by its inner surface and diffused.
An integrating hemisphere that irradiates the evaluation sample with light, and a plurality of integrating hemispheres provided in a part of the integrating hemisphere
A measuring hole that takes out the reflected light that has been irradiated, and removes the irradiation component in the direction of specular reflection with this measuring hole.
A plurality of holes for removing specular reflection and a hole for measurement provided outside the integrating hemisphere.
Depends on the reflection angle of the reflected light from the evaluation sample
Equipped with a measuring device to measure the existence of one of the holes for photometry and corresponding specular reflection removal
When using one of the holes, the other metering hole and
The reflection characteristic evaluation device is characterized in that the regular reflection removing hole is provided with a lid . 3. The photometric holes are 0 degrees, 15 degrees, and 30 degrees.
The hole for specular reflection removal is 1
The reflection characteristic evaluation apparatus according to claim 1, wherein the reflection characteristic evaluation apparatus is provided at positions of 5 degrees, 30 degrees, and 45 degrees. 4. The light from the light source is reflected by its inner surface and diffused.
An integrating sphere for morphism irradiation light to the evaluation sample, reflected irradiated to the evaluation sample on a part of the integrating sphere
A measuring hole for taking out light and a measuring hole provided outside the integrating sphere
Dependence on the reflection angle of the reflected light emitted from the evaluation sample
And a measuring device for metering a sex, the measuring device is provided in slits the integrating sphere in accordance with the trajectory that moves in order to measure the reflection angle dependence, the slit photometric direction and the said slits A slide type cover having the same quality as the inner surface of the integrating sphere was provided for the evaluation sample except for the photometric direction and the regular reflection direction .
Reflection characteristic evaluation apparatus characterized and this. 5. The light from a light source is reflected by its inner surface and diffused.
An integrating hemisphere that irradiates the evaluation sample with light, and a part of the integrating hemisphere that has been irradiated to the evaluation sample.
A measuring hole for taking out the emitted light and a measuring hole provided outside the integrating hemisphere
Depends on the reflection angle of the reflected light from the evaluation sample
And a measuring device for metering a patency, the measuring device is provided in slits the integrating hemisphere to match the trajectory of moving in order to measure the reflection angle dependence, the slit photometric direction of the slit and The evaluation sample is provided with a sliding cover of the same quality as the inner surface of the integrating hemisphere that covers other than the photometric direction and the specular reflection direction.
Reflection characteristic evaluation apparatus characterized and this was. 6. The reflection characteristic evaluation device according to claim 4, wherein the slide type cover of the slit changes in association with the movement of a measuring device for measuring the reflection angle dependency.