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JP2702254B2 - Disturbance electromagnetic wave distribution measuring method and apparatus - Google Patents
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JP2702254B2 - Disturbance electromagnetic wave distribution measuring method and apparatus - Google Patents

Disturbance electromagnetic wave distribution measuring method and apparatus

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Publication number
JP2702254B2
JP2702254B2 JP2830790A JP2830790A JP2702254B2 JP 2702254 B2 JP2702254 B2 JP 2702254B2 JP 2830790 A JP2830790 A JP 2830790A JP 2830790 A JP2830790 A JP 2830790A JP 2702254 B2 JP2702254 B2 JP 2702254B2
Authority
JP
Japan
Prior art keywords
electromagnetic field
electromagnetic
conductor plate
distribution
electromagnetic wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2830790A
Other languages
Japanese (ja)
Other versions
JPH03233370A (en
Inventor
一雄 村川
伸夫 桑原
不二雄 雨宮
正満 徳田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
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Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP2830790A priority Critical patent/JP2702254B2/en
Publication of JPH03233370A publication Critical patent/JPH03233370A/en
Application granted granted Critical
Publication of JP2702254B2 publication Critical patent/JP2702254B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電子装置から発生する妨害電磁波の分布を
測定する方法及び装置に関するものである。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for measuring the distribution of an interfering electromagnetic wave generated from an electronic device.

〔従来の技術〕[Conventional technology]

電子機器などから発生する電磁妨害波が、周辺装置に
電磁干渉を与えることに起因して発生する様々な電波障
害が問題化している。このため、機器から発生する電磁
妨害波を抑え、電波障害を起こさない機器を製造販売す
ることが社会的責任となって来ている。この電磁妨害波
を押えるためには、機器から発生する電磁妨害波の発生
位置を特定し、対策を行うことが最も効果的である。
Various types of radio interference caused by electromagnetic interference generated by electronic devices and the like causing electromagnetic interference to peripheral devices have become a problem. For this reason, it has become a social responsibility to manufacture and sell devices that suppress electromagnetic interference generated from devices and do not cause radio interference. In order to suppress this electromagnetic interference wave, it is most effective to specify the position where the electromagnetic interference wave generated from the device is generated and take measures.

従来、機器における妨害波源の位置探知は、装置(機
器)近傍の電磁界を微小ダイポールアンテナ、または、
微小ループアンテナを用いて測定することにより行って
いた。この方法は、手軽にできる利点があるが、センサ
を人の手に持って移動するため、測定の再現性に乏し
く、妨害波源の探知を人の熟練に頼らなければならない
欠点があった。そのため、センサを機械的に移動させ
て、測定の再現性を求める方法が試みられている。
Conventionally, the location of an interfering wave source in equipment is determined by using an electromagnetic field near the equipment (equipment) as a small dipole antenna or
This was performed by measuring using a small loop antenna. Although this method has an advantage that it can be easily used, it has a drawback that the reproducibility of the measurement is poor because the sensor is moved while being held by a person's hand, and that the detection of an interference wave source must rely on a person's skill. For this reason, a method of mechanically moving a sensor to obtain reproducibility of measurement has been attempted.

この方法の1つとして、電磁界センサをロボットを用
いて電子装置(機器)の周辺を移動させ、その情報をコ
ンピュータ処理することにより、視覚的に認識する方法
が試みられている。しかし、この方法はセンサを3次元
的に動かすため、センサの移動位置を決定するために、
高度の画像処理を必要とする欠点がある。
As one of the methods, a method has been attempted in which an electromagnetic field sensor is moved around an electronic device (equipment) using a robot, and the information is visually processed by computer processing. However, since this method moves the sensor three-dimensionally, in order to determine the movement position of the sensor,
It has the disadvantage of requiring a high degree of image processing.

また、別の方法として、多数のセンサを平面的に設置
し、それを電子的にスキャンして、そのとき得られた情
報をコンピュータを用いて処理することにより、視覚的
に認識する方法が試みられている。
As another method, a method of visually recognizing a large number of sensors arranged in a plane, electronically scanning the sensors, and processing the obtained information using a computer has been attempted. Have been.

この方法は、多数の電磁界センサを2次元的に1cmか
ら0.5cmおきに配置し、これを電子的にスキャンする構
造となっているために、隣接センサの電磁結合が発生
する。多数のセンサの受信特性のばらつきが生じる。
多数のセンサを接続するために多数のケーブルを装置
内に配線する必要があり、ケーブル相互の結合が生じる
等の問題があり、これにより測定値に誤差が生じる欠点
がある。
This method has a structure in which a large number of electromagnetic field sensors are two-dimensionally arranged at intervals of 1 cm to 0.5 cm and are electronically scanned, so that electromagnetic coupling between adjacent sensors occurs. Variations in the reception characteristics of many sensors occur.
In order to connect a large number of sensors, it is necessary to wire a large number of cables in the apparatus, and there is a problem that the cables are coupled to each other.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

上記従来技術における欠点を改善することが、本発明
の解決しようとする課題である。
It is an object of the present invention to solve the above disadvantages in the prior art.

即ち、本発明の目的は、人の熟練に頼ることなく測定
の再現性があり、しかも測定誤差が少なく、測定精度の
高い妨害電磁波分布測定方法及び装置を提供することに
ある。
That is, an object of the present invention is to provide a method and an apparatus for measuring the distribution of disturbed electromagnetic waves, which have reproducibility of measurement without depending on human skill, have small measurement errors, and have high measurement accuracy.

〔課題を解決するための手段〕 上記目的達成のため、本発明では、電子装置を被測定
物として、そこから発生する妨害電磁波の分布を測定す
る妨害電磁波分布測定装置において、前記被測定物の大
きさに比較して小さな寸法の穴をその導体面に複数個、
穿たれた導体板(金属板)と、前記導体板の一方の面の
近傍に配置された前記被測定物から導体板に穿たれた穴
を介して洩れてくる電磁界成分を、該導体板の他方の面
の近傍に配置されていて、妨害電磁波として測定する電
磁界センサと、前記電磁界センサを前記導体板の他方の
面に沿って別の位置に移動させて電磁界成分の測定を繰
り返させる電磁界センサ移動手段と、各位置において測
定された電磁界成分から妨害電磁波分布を求める処理装
置と、を具備した。
[Means for Solving the Problems] To achieve the above object, in the present invention, an electronic device is an object to be measured, and in a disturbance electromagnetic wave distribution measuring device for measuring a distribution of disturbance electromagnetic waves generated therefrom, Several holes with smaller dimensions compared to the size on the conductor surface,
The conductor plate (metal plate) pierced and an electromagnetic field component leaking from the object to be measured disposed near one surface of the conductor plate through a hole pierced in the conductor plate are connected to the conductor plate. An electromagnetic field sensor arranged near the other surface of the conductor plate and measuring the electromagnetic field component as an interfering electromagnetic wave, and measuring the electromagnetic field component by moving the electromagnetic field sensor to another position along the other surface of the conductor plate. An electromagnetic field sensor moving means to be repeated and a processing device for obtaining a disturbing electromagnetic wave distribution from an electromagnetic field component measured at each position are provided.

〔作用〕[Action]

先ず、被測定物である電子装置の大きさに比較して小
さな寸法の穴をその導体面に複数個、穿たれた導体板
(金属板)を空間的に配置する。
First, a plurality of holes each having a size smaller than the size of an electronic device as an object to be measured are arranged on the conductor surface, and a perforated conductor plate (metal plate) is spatially arranged.

次に該導体板の一方の面の近傍に被測定物を配置する
と共に、該導体板の他方の面の近傍に電磁界センサを配
置する。そして該電磁界センサにより、被測定物から導
体板に穿たれた穴を介して洩れてくる電磁界成分を妨害
電磁波として測定する。そして更に、電磁界センサを前
記導体板の他方の面に沿って別の位置に移動させて電磁
界成分の測定を繰り返す。そのようにして各位置におい
て測定された電磁界成分から妨害電磁波分布を求める。
Next, an object to be measured is arranged near one surface of the conductor plate, and an electromagnetic field sensor is arranged near the other surface of the conductor plate. The electromagnetic field sensor measures an electromagnetic field component leaking from an object to be measured through a hole formed in the conductor plate as a disturbing electromagnetic wave. Further, the electromagnetic field sensor is moved to another position along the other surface of the conductor plate, and the measurement of the electromagnetic field component is repeated. The disturbing electromagnetic wave distribution is obtained from the electromagnetic field components measured at each position in this manner.

その結果、 (イ)金属板に開いた穴の近傍の電磁界は直接波だけの
電磁界強度より大きいため、低いレベルの妨害波に対し
ても測定できる。
As a result, (a) Since the electromagnetic field near the hole opened in the metal plate is larger than the electromagnetic field strength of only the direct wave, it can be measured even for a low-level interference wave.

(ロ)センサは一個だけ用いるので隣接センサとの電磁
結合を考慮する必要が無い。
(B) Since only one sensor is used, there is no need to consider electromagnetic coupling with an adjacent sensor.

(ハ)センサは一個のためセンサ間のばらつきによる測
定誤差を考慮する必要がない。
(C) Since there is only one sensor, there is no need to consider measurement errors due to variations between sensors.

(ニ)電磁界センサは一個のため装置内に多数のケーブ
ルを収容する必要がない。従って、ケーブル相互の結合
が生じることはない。
(D) Since there is only one electromagnetic field sensor, there is no need to accommodate a large number of cables in the device. Therefore, there is no coupling between the cables.

等の利点がある。There are advantages such as.

以下、本発明にかかる妨害電磁波分布測定法の原理と
して、図を参照して具体的に説明する。
Hereinafter, the principle of the method for measuring the distribution of disturbing electromagnetic waves according to the present invention will be specifically described with reference to the drawings.

第7図は、本発明にかかる妨害電磁波分布測定法の原
理説明のための斜視図である。同図において、1は導体
板、2は導体板に穿った穴を示す。導体板1の上方に測
定対象としての電子装置3を配置した場合、装置3から
放射された電磁界をEおよびHとする。なお、図では分
り易くするため、穴2を相対的に大きく描いているが、
実際は、電子装置3に比較すると、かなり小さなもので
ある。
FIG. 7 is a perspective view for explaining the principle of the method for measuring the distribution of disturbing electromagnetic waves according to the present invention. In the figure, reference numeral 1 denotes a conductor plate, and 2 denotes a hole formed in the conductor plate. When the electronic device 3 to be measured is disposed above the conductor plate 1, the electromagnetic fields radiated from the device 3 are E and H. In addition, although the hole 2 is drawn relatively large in the figure for easy understanding,
Actually, it is considerably smaller than the electronic device 3.

第7A図は、第7図における導体板1の穴2の近傍の断
面図である。
FIG. 7A is a sectional view of the vicinity of the hole 2 of the conductive plate 1 in FIG.

第7A図において、穴2の或る縁をK点とし、該K点か
らの任意方向の距離をrで表し、該方向を角度θ(導体
板1の面とその方向とのなす角)で表す。
In FIG. 7A, a certain edge of the hole 2 is defined as a point K, a distance in an arbitrary direction from the point K is represented by r, and the direction is represented by an angle θ (an angle between the surface of the conductive plate 1 and the direction). Represent.

このとき、穴2の近傍における電磁界の振舞いについ
て述べる。波長に比して導体板(金属板)1の厚さが無
視できる場合、穴2の近傍における電界強度Eは次式の
ように与えられる。
At this time, the behavior of the electromagnetic field in the vicinity of the hole 2 will be described. When the thickness of the conductor plate (metal plate) 1 is negligible compared to the wavelength, the electric field strength E near the hole 2 is given by the following equation.

E=|α*sinθ*r−1/2|(r≪1cm) ……(1) ここで、αは比較定数を示す。また*印は乗算を示
す。式(1)より導体面においては電磁界の接線成分は
零であるが、金属面から離れると一旦無限大になって、
急速に減少する特徴がある。
E = | α * sin θ * r −1/2 | (r≪1 cm) (1) where α represents a comparison constant. The mark * indicates multiplication. From equation (1), the tangent component of the electromagnetic field is zero on the conductor surface, but becomes infinite once away from the metal surface,
There is a feature that decreases rapidly.

このときの電磁界分布の測定例を第8図に示す。第8
図は、第8A図に見られる如く、θ=270度として、距離
rを可変させたときの電界強度の測定例を示すグラフで
ある。上述の特徴が認められるであろう。
FIG. 8 shows a measurement example of the electromagnetic field distribution at this time. 8th
FIG. 8A is a graph showing a measurement example of the electric field intensity when θ = 270 degrees and the distance r is varied, as seen in FIG. 8A. The above features will be appreciated.

また、導体板1を装置3から数cm程度離した場合で
も、妨害波源からの直接波より充分大きい電磁界分布を
与える。このため、導体板と装置との結合が大きすぎる
場合、導体板と装置を離し粗結合となるようにして妨害
波測定を行うことができる。
Further, even when the conductor plate 1 is separated from the device 3 by about several cm, an electromagnetic field distribution sufficiently larger than the direct wave from the interference wave source is given. For this reason, when the coupling between the conductor plate and the device is too large, the conductor plate and the device are separated from each other so as to form a coarse coupling, and the interference wave measurement can be performed.

以上が妨害電磁波の測定が可能なことを示す原理説明
である。
The above is the description of the principle showing that the measurement of the interference electromagnetic wave is possible.

〔実施例〕〔Example〕

第1図は、本発明の一実施例としての妨害電磁波分布
測定装置の基本構造を示す側断面図である。
FIG. 1 is a side sectional view showing a basic structure of a disturbance electromagnetic wave distribution measuring apparatus as one embodiment of the present invention.

同図において、1は導体板、2は導体板上の穴、3は
被測定装置(電子装置)、4は誘電体板、5は電磁界セ
ンサ(収納ケース6の中にあり、図示せず)、6は収納
ケース、7はセンサ駆動系、8は妨害電磁波測定信号受
信装置(計測装置)、9は制御装置、10はデータ表示
部、11は同軸ケーブル、12は制御ケーブル、である。
In the figure, 1 is a conductor plate, 2 is a hole on the conductor plate, 3 is a device to be measured (electronic device), 4 is a dielectric plate, 5 is an electromagnetic field sensor (in the storage case 6, not shown). ), 6 is a storage case, 7 is a sensor driving system, 8 is an interference electromagnetic wave measurement signal receiving device (measuring device), 9 is a control device, 10 is a data display section, 11 is a coaxial cable, and 12 is a control cable.

被測定装置3からの妨害電磁波によって導体板1に電
流が誘導され、これらの電流が等価的な電流放射源とな
り電磁波が放射される。このとき導体板1の近傍に現れ
る電磁界は、到来する電磁界強度に比例するため、電磁
界センサ5によってこれを測定し、センサ駆動系7で電
磁界センサを2次元的に移動させて測定を繰り返すこと
により、電磁界分布を2次元的に測定することができ、
その結果、妨害電磁波分布を求めることができる。
Currents are induced in the conductive plate 1 by the disturbing electromagnetic waves from the device under test 3, and these currents become equivalent current radiation sources and emit electromagnetic waves. At this time, the electromagnetic field appearing in the vicinity of the conductor plate 1 is proportional to the intensity of the incoming electromagnetic field. Therefore, the electromagnetic field sensor 5 measures the electromagnetic field, and the sensor driving system 7 moves the electromagnetic field sensor two-dimensionally. By repeating the above, the electromagnetic field distribution can be measured two-dimensionally,
As a result, the disturbing electromagnetic wave distribution can be obtained.

第2図は、本発明の一実施例を示す斜視図である。同
図において、第1図におけるのと同じものには同符号を
付してある。
FIG. 2 is a perspective view showing one embodiment of the present invention. In the figure, the same components as those in FIG. 1 are denoted by the same reference numerals.

すでに明らかなように、1は導体板(30*30cm、厚さ
1mm)、2は導体上の穴(穴の直径8mm)、3は被測定装
置、4は誘電体板(30*30cm、厚さ3mm)、5は電磁界
センサ(直径3cm:本出願と同日付で特許出願中)、6は
収納ケース、7はセンサ駆動系、8は妨害電磁波測定信
号受信装置、9は制御装置、10はデータ表示部、11は同
軸ケーブル、12は制御ケーブルを示す。
As already evident, 1 is a conductor plate (30 * 30cm, thickness
2) Hole on conductor (diameter of hole 8mm), 3 is device to be measured, 4 is dielectric plate (30 * 30cm, thickness 3mm), 5 is electromagnetic field sensor (diameter 3cm: same as this application) A patent is pending on the date), 6 is a storage case, 7 is a sensor drive system, 8 is a disturbance electromagnetic wave measurement signal receiving device, 9 is a control device, 10 is a data display unit, 11 is a coaxial cable, and 12 is a control cable.

第2図において、導体板1には、被測定装置3からの
電磁波を検出する目的のため、一定間隔で円形の穴2が
設けられている。誘電体板4は被測定装置3と導体板1
を電気的に分離するために用いており、電磁波に対して
透明な材料、例えばテフロン板等を用いることが出来
る。
In FIG. 2, circular holes 2 are provided in a conductor plate 1 at regular intervals for the purpose of detecting electromagnetic waves from the device under test 3. The dielectric plate 4 is composed of the device under test 3 and the conductor plate 1.
Is used to electrically separate the material, and a material transparent to electromagnetic waves, for example, a Teflon plate or the like can be used.

面電流センサとしての電磁界センサ5は、導体板1に
流れる電流を測定するのに用いる。センサ駆動系7は、
電磁界センサ5を2次元的に移動させるための装置で、
指令で制御されるパルスモータの微動台等を用いること
が出来る。妨害電磁波測定信号受信装置8としては、テ
ストレシーバ等の妨害波測定用のレベルメータが利用で
きる。また、制御装置9およびデータ表示部10としては
通常の計算機用のワークステーションが利用できる。
The electromagnetic field sensor 5 as a surface current sensor is used for measuring a current flowing through the conductor plate 1. The sensor drive system 7 is
A device for moving the electromagnetic field sensor 5 two-dimensionally,
It is possible to use a fine moving table of a pulse motor controlled by a command. As the disturbing electromagnetic wave measurement signal receiving device 8, a level meter for measuring disturbing waves such as a test receiver can be used. In addition, a normal computer workstation can be used as the control device 9 and the data display unit 10.

一連の妨害電磁波分布の測定手順をまとめると以下の
ようになる。
The following is a summary of the procedure for measuring the distribution of the disturbing electromagnetic waves.

(1)被測定装置3を誘電体板4の上に載せ、電源を入
れて動作させる。
(1) The device under test 3 is placed on the dielectric plate 4 and turned on to operate.

(2)電磁界センサ5を駆動装置系7によって一定量移
動させる。
(2) The electromagnetic field sensor 5 is moved by a certain amount by the drive system 7.

(3)電磁界センサ5の出力(電流)を受信装置8によ
って測定する。
(3) The output (current) of the electromagnetic field sensor 5 is measured by the receiving device 8.

(4)各測定点での電流の測定値を保存し、数値処理し
てデータ表示部10に出力する。
(4) The measured value of the current at each measurement point is stored, numerically processed, and output to the data display unit 10.

以上(2)から(4)の処理を、電磁界センサ5を2
次元的に移動させつつ、繰り返し行うことで、妨害電磁
波分布を2次元的に測定することできる。
The above processes (2) to (4) are performed by
By repeatedly performing the movement while moving it two-dimensionally, it is possible to two-dimensionally measure the disturbing electromagnetic wave distribution.

第1図、第2図に示した実施例は、導体板1に穿った
穴2の形状が円形であったが、これを矩形状にすること
もできる。
In the embodiment shown in FIGS. 1 and 2, the shape of the hole 2 formed in the conductor plate 1 is circular, but it can be made rectangular.

穴2の形状が円形である場合と、矩形状である場合と
では、導体板1における電流分布が異なってくる。この
様子を第3図に示す。
The current distribution in the conductive plate 1 differs between the case where the shape of the hole 2 is circular and the case where it is rectangular. This is shown in FIG.

第3図(a),(b)は穴2の形状が円形の場合であ
るが、電界の方向によって、電流分布が特に異なるとい
うことがない(流れる方向は違っても電流分布自体は変
わらない)。
3 (a) and 3 (b) show the case where the shape of the hole 2 is circular, the current distribution does not particularly differ depending on the direction of the electric field (the current distribution itself does not change even if the flowing direction differs). ).

これに対し、第3図(c),(d)は穴2の形状が矩
形の場合であるが、電界の方向によって、電流分布が大
きく異なるということが認められるであろう。
In contrast, FIGS. 3 (c) and 3 (d) show the case where the shape of the hole 2 is rectangular, but it will be recognized that the current distribution greatly differs depending on the direction of the electric field.

即ち第3図(c)では、穴2の矩形の向きが電界Eの
方向に平行であるため、変位電流Idが小で電波の透過も
小であるのに対し、第3図(d)では、穴2の矩形の向
きが電界Eの方向に直交しているため、変位電流Idが大
で電波の透過も大となっている。
That is, in FIG. 3 (c), since the direction of the rectangle of the hole 2 is parallel to the direction of the electric field E, the displacement current Id is small and the transmission of radio waves is small, whereas in FIG. 3 (d), Since the direction of the rectangle of the hole 2 is orthogonal to the direction of the electric field E, the displacement current Id is large and the transmission of radio waves is also large.

従って、穴2の形状を変えることで妨害電磁波の測定
に指向特性を持たせることが出来る。このように穴2の
形状を矩形にした場合、妨害電磁波に対する導体板1の
受信特性に指向性を持たせることができる。従って、被
測定装置3として電子回路の基板のように、回路パター
ンが直線的な場合の妨害電磁波分布を測定する場合に
は、導体板1の穴の形状を円形とするより長方形にする
ことで、測定感度を上げて測定できる利点がある。ま
た、被測定装置3を90度回転させて測定することで、回
路パターンに関連する妨害電磁波分布を測定することが
出来るという利点もある。
Therefore, by changing the shape of the hole 2, it is possible to give a directional characteristic to the measurement of the interfering electromagnetic wave. When the shape of the hole 2 is rectangular as described above, directivity can be provided to the reception characteristics of the conductor plate 1 with respect to the interfering electromagnetic waves. Therefore, when measuring the disturbing electromagnetic wave distribution in the case where the circuit pattern is linear, such as the substrate of an electronic circuit as the device under test 3, the hole of the conductive plate 1 should be made rectangular rather than circular. There is an advantage that measurement can be performed with increased measurement sensitivity. In addition, there is an advantage that the measurement can be performed by rotating the device under test 3 by 90 degrees, so that the distribution of interfering electromagnetic waves related to the circuit pattern can be measured.

第4図は、本出願と同日付で特許出願中の電磁界セン
サ5の一例を示す側断面図、第4A図はその要部を示す上
面図である。
FIG. 4 is a side sectional view showing an example of the electromagnetic field sensor 5 for which a patent application has been filed on the same date as the present application, and FIG. 4A is a top view showing a main part thereof.

これらの図において、21は電界との結合により誘導電
圧を得るための結合線路、22は結合線路を構成するため
の基板、23は基板のアース面、24a,24bは結合線路21を
無反射終端し、誘導電圧を取り出すための特性インピー
ダンスと等価な終端抵抗、25は信号送信用ケーブル(例
えば同軸ケーブル)、26は全体の収納ケースとしての匡
体、27は結合線路21を電気的に分離するための誘導体
板、である。
In these figures, 21 is a coupling line for obtaining an induced voltage by coupling with an electric field, 22 is a substrate for forming the coupling line, 23 is a ground plane of the substrate, and 24a and 24b are non-reflective terminations of the coupling line 21. Then, a terminating resistor equivalent to a characteristic impedance for extracting an induced voltage, 25 is a signal transmission cable (for example, a coaxial cable), 26 is a housing as a whole storage case, and 27 is a coupling line 21 which is electrically separated. Derivative plate for

要するに、構成としては、表面、裏面共にアース面を
なしている回路基板の表面では、結合線路部分を残して
他の部分をエッチングにより除去し、結合線路の両端を
回路基板の特性インピーダンス50Ω(終端抵抗)でアー
ス面へ終端し、何れか一方の終端抵抗(図では24bの
側)からその両端電圧を同軸ケーブルで取り出すように
し、回路基板表面の結合線路部分の上に誘電体板を被せ
接着剤で接着すると、第4図に示す構成のセンサが得ら
れるわけである。
In short, on the front side of the circuit board, both the front and back sides of which are grounded, the other part is removed by etching except for the coupling line portion, and both ends of the coupling line are subjected to the characteristic impedance of the circuit board of 50Ω (termination). Terminating to the ground plane with a resistor), take out the voltage at both ends from one of the terminating resistors (24b side in the figure) with a coaxial cable, and cover with a dielectric plate on the coupling line part on the circuit board surface and bond By bonding with the agent, a sensor having the configuration shown in FIG. 4 is obtained.

第4A図は、結合線路21の部分を上から見た上面図を示
しており、x軸、y軸を図示の如く定める。
FIG. 4A is a top view of the coupling line 21 viewed from above, and the x-axis and y-axis are defined as shown.

ここで結合線路21に沿って、x軸のプラス方向から電
磁界が入射した場合、結合線路21の終端点24bに誘導さ
れ、ケーブル25を介して取り出される電圧は次のような
指向特性がある。
Here, when an electromagnetic field is incident from the plus direction of the x-axis along the coupling line 21, the voltage guided to the terminal point 24b of the coupling line 21 and taken out through the cable 25 has the following directional characteristics. .

V(θ)=cos2(θ/2) ……(2) このときθは、結合線路21を含む面に対して、入射電
磁界のなす角度を示す。式(2)より電界はx軸のプラ
ス方向からくる電磁界(θ=0)に対しては感度が最大
で、x軸のマイナス方向からくる電磁界(θ=π)のと
き感度が最小となる指向性を有することが分かる。終端
抵抗24aから出力を取り出すようにすれば、感度はこの
逆になる。
V (θ) = cos 2 (θ / 2) (2) At this time, θ indicates an angle between the plane including the coupling line 21 and the incident electromagnetic field. According to equation (2), the electric field has a maximum sensitivity with respect to an electromagnetic field (θ = 0) coming from the plus direction of the x-axis, and has a minimum sensitivity when an electromagnetic field (θ = π) comes from the minus direction of the x-axis. It can be seen that the directivity is high. If the output is taken out from the terminating resistor 24a, the sensitivity is reversed.

このようなことにより、近傍電磁界センサは、電磁界
の到来方向を見いだすことができ、電磁界分布の特徴を
ベクトル的にとらえることができる。
Thus, the near electromagnetic field sensor can detect the arrival direction of the electromagnetic field, and can grasp the characteristics of the electromagnetic field distribution in a vector manner.

実際には、かかるセンサを4個組み合せて、無指向性
にしたものを用いることができる。
In practice, an omnidirectional one can be used by combining four such sensors.

次に測定例を説明する。 Next, a measurement example will be described.

本発明による妨害電磁波分布測定装置を用いて、妨害
電磁波分布の測定を行った。そのときの測定系を第5図
に示す。
The distribution of the disturbing electromagnetic wave was measured using the disturbing electromagnetic wave distribution measuring device according to the present invention. FIG. 5 shows the measurement system at that time.

第5図において、13は妨害源である球状ダイポールア
ンテナ(直径10cm)を用いている。14は球状ダイポール
アンテナに信号を与える発信器、15は光ファイバを示
す。
In FIG. 5, reference numeral 13 uses a spherical dipole antenna (diameter: 10 cm) as a disturbance source. Reference numeral 14 denotes a transmitter that supplies a signal to the spherical dipole antenna, and 15 denotes an optical fiber.

第5図において、球状ダイポールアンテナ13は導体板
1の中央からオフセットした位置に配置し、放射電界が
導体板1に並行になるように設置した。発信器14の周波
数を100MHzとし、信号を光ファイバ15に通して球状ダイ
ポールアンテナ13に与えた。球状ダイポールアンテナ13
によって放射される電磁波によって誘導される電流を電
磁界センサ5によって測定した結果を第6図に示す。
In FIG. 5, the spherical dipole antenna 13 is arranged at a position offset from the center of the conductor plate 1, and is installed so that the radiated electric field is parallel to the conductor plate 1. The frequency of the transmitter 14 was set to 100 MHz, and the signal was passed through the optical fiber 15 and given to the spherical dipole antenna 13. Spherical dipole antenna 13
FIG. 6 shows the result of measuring the current induced by the electromagnetic wave radiated by the electromagnetic field sensor 5.

第6図より妨害源に近いほど、検出電流が大きいこと
が分かる。以上の結果より、本発明にかかる妨害電磁波
分布測定装置を用いて、妨害源分布の測定を行うことが
出来る。
From FIG. 6, it can be seen that the closer to the disturbance source, the greater the detected current. From the above results, it is possible to measure the distribution of interference sources using the apparatus for measuring the distribution of interference electromagnetic waves according to the present invention.

〔発明の効果〕〔The invention's effect〕

以上、説明したように本発明にかかる妨害電磁波分布
装置は、本発明では一個のセンサを二次元的に移動さ
せ妨害電磁波分布を測定するため、従来用いられている
複数(1000個程度)のセンサを二次元的に配置した妨害
電磁波分布測定装置に付随する各センサの特性のばらつ
き、隣接センサ間の結合および複数のケーブル間の相互
誘導等の問題が無く、システム構成が単純化する、セ
ンサを金属の収納ケースで外部の不要雑音から分離して
いるため、一個のセンサを露出して電磁界を検出する装
置に対して測定の再現性が保てる、面電流センサをセ
ンサ駆動装置で移動して測定するため、センサの位置を
高精度に決定出来るため測定の再現性が高い、収納ケ
ースによって、センサ駆動装置および同軸ケーブルを妨
害電磁波から分離するため、センサ以外から妨害波を受
信することがない、という特徴がある。以上のことよ
り、安価で高性能な妨害電磁波分布測定方法及び装置を
提供できるという利点がある。
As described above, the disturbing electromagnetic wave distribution device according to the present invention measures the disturbing electromagnetic wave distribution by moving one sensor two-dimensionally in the present invention. There is no problem such as variations in the characteristics of each sensor associated with the two-dimensionally arranged electromagnetic interference distribution measurement device, coupling between adjacent sensors, mutual induction between multiple cables, etc. Move the surface current sensor with the sensor driver to keep the reproducibility of measurement for a device that detects an electromagnetic field by exposing one sensor because it is separated from external unnecessary noise by a metal storage case. Since the position of the sensor can be determined with high accuracy for measurement, the reproducibility of measurement is high.The storage case separates the sensor driver and coaxial cable from interfering electromagnetic waves. It is characterized in that it does not receive interference waves from sources other than sensors. As described above, there is an advantage that an inexpensive and high-performance interference electromagnetic wave distribution measuring method and apparatus can be provided.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の一実施例の基本構造を示す側断面図、
第2図は同斜視図、第3図は穴の形状と電流分布の関係
を示す説明図、第4図は電磁界センサの一例を示す側断
面図、第4A図はその要部を示す上面図、第5図は妨害電
磁波の測定系の一例を示す概要図、第6図は測定結果を
示す特性図、第7図は本発明による測定原理を示す斜視
図、第7A図はその要部を示す断面図、第8図は電磁界分
布の測定例を示す特性図、第8A図は測定条件を示す説明
図、である。 符号の説明 1……導体板、2……穴、3……被測定装置、4……誘
電体板、5……電磁界センサ、6……収納ケース、7…
…センサ駆動系、8……受信装置、9……制御装置、10
……データ表示部、11……同軸ケーブル、12……制御ケ
ーブル、13……球状ダイポールアンテナ、14……発信
器、15……光ファイバ
FIG. 1 is a side sectional view showing a basic structure of one embodiment of the present invention,
FIG. 2 is a perspective view of the same, FIG. 3 is an explanatory view showing the relationship between the shape of the hole and current distribution, FIG. 4 is a side sectional view showing an example of the electromagnetic field sensor, and FIG. FIG. 5, FIG. 5 is a schematic diagram showing an example of a measurement system of an electromagnetic interference wave, FIG. 6 is a characteristic diagram showing a measurement result, FIG. 7 is a perspective view showing a measurement principle according to the present invention, and FIG. FIG. 8 is a characteristic diagram showing an example of measurement of an electromagnetic field distribution, and FIG. 8A is an explanatory diagram showing measurement conditions. DESCRIPTION OF SYMBOLS 1 ... conductor plate, 2 ... hole, 3 ... device to be measured, 4 ... dielectric plate, 5 ... electromagnetic field sensor, 6 ... storage case, 7 ...
... Sensor drive system, 8 ... Receiving device, 9 ... Control device, 10
... Data display section, 11 ... Coaxial cable, 12 ... Control cable, 13 ... Spherical dipole antenna, 14 ... Transmitter, 15 ... Optical fiber

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電子装置を被測定物として、そこから発生
する妨害電磁波の分布を測定する妨害電磁波分布測定方
法において、 前記被測定物の大きさに比較して小さな寸法の穴をその
導体面に複数個、穿たれた導体板を空間的に配置する第
1の段階と、 前記導体板の一方の面の近傍に前記被測定物を配置する
と共に、該導体板の他方の面の近傍に電磁界センサを配
置する第2の段階と、 前記電磁界センサにより、前記被測定物から導体板に穿
たれた穴を介して洩れてくる電磁界成分を妨害電磁波と
して測定する第3の段階と、 前記電磁界センサを前記導体板の他方の面に沿って別の
位置に移動させて電磁界成分の測定を繰り返す第4の段
階と、 各位置において測定された電磁界成分から妨害電磁波分
布を求める第5の段階と、から成ることを特徴とする妨
害電磁波分布測定方法。
1. A method for measuring the distribution of electromagnetic interference generated from an electronic device as an object to be measured, wherein a hole having a size smaller than the size of the object is formed in a conductive surface thereof. A first step of spatially disposing a plurality of perforated conductor plates, and disposing the device under test in the vicinity of one surface of the conductor plate, and in the vicinity of the other surface of the conductor plate. A second step of disposing an electromagnetic field sensor; and a third step of measuring, as the disturbing electromagnetic wave, an electromagnetic field component leaking from the DUT through a hole formed in the conductor plate by the electromagnetic field sensor. A fourth step of moving the electromagnetic field sensor to another position along the other surface of the conductor plate and repeating the measurement of the electromagnetic field component; and distributing the disturbing electromagnetic wave distribution from the electromagnetic field component measured at each position. The fifth step of seeking Electromagnetic interference distribution measurement method characterized.
【請求項2】電子装置を被測定物として、そこから発生
する妨害電磁波の分布を測定する妨害電磁波分布測定装
置において、 前記被測定物の大きさに比較して小さな寸法の穴をその
導体面に複数個、穿たれた導体板と、 前記導体板の一方の面の近傍に配置された前記被測定物
から導体板に穿たれた穴を介して洩れてくる電磁界成分
を、該導体板の他方の面の近傍に配置されていて、妨害
電磁波として測定する電磁界センサと、 前記電磁界センサを前記導体板の他方の面に沿って別の
位置に移動させて電磁界成分の測定を繰り返させる電磁
界センサ移動手段と、 各位置において測定された電磁界成分から妨害電磁波分
布を求める計測装置と、を具備して成ることを特徴とす
る妨害電磁波分布測定装置。
2. A disturbing electromagnetic wave distribution measuring device for measuring a distribution of disturbing electromagnetic waves generated from an electronic device as an object to be measured, wherein a hole having a size smaller than the size of the object to be measured is formed in a conductor surface thereof. A plurality of conductor plates pierced; and an electromagnetic field component leaking through holes pierced in the conductor plate from the DUT arranged near one surface of the conductor plate. An electromagnetic field sensor that is disposed near the other surface of the conductor plate and measures as an interfering electromagnetic wave, and measures the electromagnetic field component by moving the electromagnetic field sensor to another position along the other surface of the conductor plate. A disturbing electromagnetic wave distribution measuring device comprising: an electromagnetic field sensor moving means to be repeated; and a measuring device for obtaining a disturbing electromagnetic wave distribution from an electromagnetic field component measured at each position.
JP2830790A 1990-02-09 1990-02-09 Disturbance electromagnetic wave distribution measuring method and apparatus Expired - Lifetime JP2702254B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2830790A JP2702254B2 (en) 1990-02-09 1990-02-09 Disturbance electromagnetic wave distribution measuring method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2830790A JP2702254B2 (en) 1990-02-09 1990-02-09 Disturbance electromagnetic wave distribution measuring method and apparatus

Publications (2)

Publication Number Publication Date
JPH03233370A JPH03233370A (en) 1991-10-17
JP2702254B2 true JP2702254B2 (en) 1998-01-21

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Country Link
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