JP2715638B2 - Manufacturing method of silver ion conductive solid electrolyte thin film - Google Patents
Manufacturing method of silver ion conductive solid electrolyte thin filmInfo
- Publication number
- JP2715638B2 JP2715638B2 JP2203275A JP20327590A JP2715638B2 JP 2715638 B2 JP2715638 B2 JP 2715638B2 JP 2203275 A JP2203275 A JP 2203275A JP 20327590 A JP20327590 A JP 20327590A JP 2715638 B2 JP2715638 B2 JP 2715638B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- solid electrolyte
- silver
- ion conductive
- silver ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000010409 thin film Substances 0.000 title claims description 59
- 239000007784 solid electrolyte Substances 0.000 title claims description 48
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 title claims description 25
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 230000001590 oxidative effect Effects 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 229910052785 arsenic Inorganic materials 0.000 claims description 3
- 229910052796 boron Inorganic materials 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 229910052732 germanium Inorganic materials 0.000 claims description 3
- 229910052711 selenium Inorganic materials 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 229910052714 tellurium Inorganic materials 0.000 claims description 3
- 229910052720 vanadium Inorganic materials 0.000 claims description 3
- 238000000151 deposition Methods 0.000 claims description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 18
- 239000004332 silver Substances 0.000 description 18
- 238000010438 heat treatment Methods 0.000 description 16
- 229910052709 silver Inorganic materials 0.000 description 16
- 239000010408 film Substances 0.000 description 14
- 229910021612 Silver iodide Inorganic materials 0.000 description 12
- 238000000034 method Methods 0.000 description 10
- JKFYKCYQEWQPTM-UHFFFAOYSA-N 2-azaniumyl-2-(4-fluorophenyl)acetate Chemical compound OC(=O)C(N)C1=CC=C(F)C=C1 JKFYKCYQEWQPTM-UHFFFAOYSA-N 0.000 description 8
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 8
- 229940045105 silver iodide Drugs 0.000 description 8
- 230000008020 evaporation Effects 0.000 description 6
- 238000001704 evaporation Methods 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 239000003792 electrolyte Substances 0.000 description 4
- 229910052697 platinum Inorganic materials 0.000 description 4
- SJIINOLTGWLIOL-UHFFFAOYSA-N [B]=O.[Ag] Chemical compound [B]=O.[Ag] SJIINOLTGWLIOL-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- VUQJFUDRDSVDCY-UHFFFAOYSA-N oxotungsten;silver Chemical compound [Ag].[W]=O VUQJFUDRDSVDCY-UHFFFAOYSA-N 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000011244 liquid electrolyte Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 230000002441 reversible effect Effects 0.000 description 2
- 229910001923 silver oxide Inorganic materials 0.000 description 2
- AYKOTYRPPUMHMT-UHFFFAOYSA-N silver;hydrate Chemical compound O.[Ag] AYKOTYRPPUMHMT-UHFFFAOYSA-N 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910005793 GeO 2 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000002847 impedance measurement Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- OTCVAHKKMMUFAY-UHFFFAOYSA-N oxosilver Chemical compound [Ag]=O OTCVAHKKMMUFAY-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
Classifications
-
- Y02E60/12—
Landscapes
- Conductive Materials (AREA)
- Primary Cells (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は、銀イオン伝導性固体電解質薄膜に関し、と
くに電池,コンデンサ,エレクトロクロミックディスプ
レイ,イオニックメモリなど電気化学的現象を利用した
素子に利用される銀イオン伝導性固体電解質薄膜の製造
法に関する。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a silver ion conductive solid electrolyte thin film, and more particularly to silver used for an element utilizing an electrochemical phenomenon such as a battery, a capacitor, an electrochromic display, and an ionic memory. The present invention relates to a method for producing an ion-conductive solid electrolyte thin film.
従来の技術 電気化学現象を利用した素子は、電解質とこの電解質
を介して配される一対の電極により構成されている。2. Description of the Related Art An element utilizing electrochemical phenomena is composed of an electrolyte and a pair of electrodes disposed via the electrolyte.
このような素子に用いる電解質として、従来より電池
に用いている液体電解質や固体電解質を挙げることがで
きる。Examples of the electrolyte used in such an element include a liquid electrolyte and a solid electrolyte conventionally used in batteries.
しかし、液体電解質を用いた場合、電池の超小形化が
困難であり、また、漏液の問題を皆無とすることができ
ない。However, when a liquid electrolyte is used, it is difficult to miniaturize the battery, and the problem of liquid leakage cannot be eliminated.
これに対し、固体電解質を用い電池を全固体化する
と、こうした問題を解決し信頼性を高め、電池の超小形
化、薄膜化を可能とすることができる。素子の超小形化
は、イオニックメモリ(超小形電池を集積化した電位記
憶素子)や画像表示素子(超小形エレクトロクロミック
素子を集積化した電位記憶素子)としての応用を目指す
ものである。On the other hand, if the battery is made solid using a solid electrolyte, such problems can be solved, reliability can be improved, and the battery can be miniaturized and thinned. The miniaturization of the element aims at application as an ionic memory (a potential storage element in which a microminiature battery is integrated) and an image display element (a potential storage element in which a microelectrochromic element is integrated).
こうした素子に用いる電解質の一つとして、銀イオン
伝導性固体電解質がある。例えばAgI−Ag2O−MOy(Mは
W,Cr,Mo,P,V,Te,Se,As,B,Si,Geより選ばれる少なくとも
一種の元素)固体電解質があり、これはAgI、AgxMOy、A
gを順次銀電極上に堆積したのち、酸化雰囲気中で加熱
酸化することにより形成することができる。One of the electrolytes used for such a device is a silver ion conductive solid electrolyte. For example AgI-Ag 2 O-MO y (M is
At least one element selected from W, Cr, Mo, P, V, Te, Se, As, B, Si, and Ge) solid electrolytes, which are AgI, Ag x MO y , A
g can be formed by sequentially depositing g on a silver electrode and then oxidizing it by heating in an oxidizing atmosphere.
発明が解決しようとする課題 しかしながら、前記固体電解質を用いて固体電解質薄
膜を形成する場合、一回の工程で厚さ3000Å以上の固体
電解質薄膜を形成すると、薄膜内での組成が不均一とな
り、また、膜にひび割れが生じてしまう。そのため、膜
厚方向へのイオン伝導性の低下、及び、膜のクラックに
よる電極間の短絡が生じるといった問題を有している。However, when a solid electrolyte thin film is formed using the solid electrolyte, when a solid electrolyte thin film having a thickness of 3,000 mm or more is formed in a single step, the composition in the thin film becomes non-uniform, In addition, cracks occur in the film. Therefore, there is a problem that the ion conductivity decreases in the film thickness direction and a short circuit between the electrodes occurs due to cracks in the film.
本発明は、以上の問題点を解決し、良好な銀イオン伝
導性固体電解質薄膜の製造法を提供することを目的とす
る。An object of the present invention is to solve the above problems and provide a method for producing a good silver ion conductive solid electrolyte thin film.
課題を解決するための手段 この課題を解決するため本発明の銀イオン伝導性固体
電解質薄膜の製造法は、AgI、AgxMOy(xは0<x≦1
の範囲の任意の数)、Agを順次堆積した後、前記堆積層
を酸化雰囲気中で加熱酸化してAgI−Ag2O−MOy(MはW,
Cr,Mo,P,V,Te,Se,As,B,Si,およびGeからなる群より選ば
れる少なくとも一種の元素、yはMの原子価によりきま
る整数)固体電解質層を作製する工程を複数回繰り返す
ことによって、前記固体電解質層が複数層積層された所
望の厚さの固体電解質薄膜を得ることを特徴とする。Means for Solving the Problems In order to solve the problems, a method for producing a silver ion conductive solid electrolyte thin film of the present invention is based on AgI, Ag x MO y (x is 0 <x ≦ 1).
, Ag is sequentially deposited, and the deposited layer is heated and oxidized in an oxidizing atmosphere to obtain AgI-Ag 2 O-MO y (M is W,
At least one element selected from the group consisting of Cr, Mo, P, V, Te, Se, As, B, Si, and Ge, and y is an integer determined by the valency of M). By repeating the process a plurality of times, a solid electrolyte thin film having a desired thickness in which a plurality of the solid electrolyte layers are stacked is obtained.
作用 AgI−AgxMOy−Agの積層膜では、銀がAgxMOy層中に拡
散するとともに、AgxMOy層中の銀が加熱時に酸化されて
Ag2O−MOyの酸素酸銀塩となり、さらに、ヨウ化銀と反
応してAgI−Ag2MOyの固体電解質薄膜を形成する。ま
た、このAgI,AgxMOy,Agの各層を銀層が積層表面でな
く、その内部に形成した場合、銀層の加熱酸化が起こり
難く、良好な固体電解質薄膜を得ることができない。In the multilayer films of action AgI-Ag x MO y -Ag, with silver diffuses into Ag x MO y layer, a silver Ag x MO y layer is oxidized during heating
It becomes oxygen silver of Ag 2 O-MO y, further forming a solid electrolyte thin film of AgI-Ag 2 MO y reacts with silver iodide. Further, the AgI, Ag x MO y, rather than each silver layer is laminated surface of Ag, when formed therein, hardly occurs thermal oxidation of the silver layer, it is impossible to obtain a good solid electrolyte thin film.
前記の方法により容易に固体電解質薄膜を作製するこ
とが出来るが、膜厚が大きくなると各層間での反応が不
十分となり、また、反応にともなう体積変化のため膜に
多数のクラックが入ってしまう。このため、十分に反応
しやすく、体積変化の影響を受けにくい、膜厚の小さな
膜を形成し、これを積層させることにより膜厚の大きな
固体電解質薄膜を作製する。Although the solid electrolyte thin film can be easily prepared by the above method, the reaction between the layers becomes insufficient when the film thickness is large, and a large number of cracks are formed in the film due to a volume change accompanying the reaction. . For this reason, a thin film having a small thickness is formed which easily reacts and is hardly affected by a change in volume, and a solid electrolyte thin film having a large thickness is formed by laminating the films.
実施例 以下、本発明の一実施例の銀イオン伝導性固体電解質
薄膜について図面により詳細に説明するが、本発明は、
これら実施例に限定されるものではない 実施例1 Ag6I4WO4銀イオン伝導性固体電解質薄膜を以下の方法
で作製した。Hereinafter, the silver ion conductive solid electrolyte thin film of one embodiment of the present invention will be described in detail with reference to the drawings.
The present invention is not limited to these examples. Example 1 An Ag 6 I 4 WO 4 silver ion conductive solid electrolyte thin film was produced by the following method.
第1図に本発明の銀イオン伝導性固体電解質薄膜の作
成工程図を示す。FIG. 1 shows a process chart for producing the silver ion conductive solid electrolyte thin film of the present invention.
まず、第1図(A)に示すようにヨウ化銀に銀を15重
量%添加した材料を所定量、抵抗加熱蒸着装置の加熱ボ
ートに入れ、加熱蒸着してガラス基板9上に厚さ2500Å
のヨウ化銀薄膜10を作製した。First, as shown in FIG. 1 (A), a predetermined amount of a material obtained by adding silver to silver iodide by 15% by weight is put into a heating boat of a resistance heating vapor deposition apparatus, and is heated and vapor-deposited to a thickness of 2500 mm on a glass substrate 9.
A silver iodide thin film 10 was produced.
次に、このヨウ化銀薄膜10上に銀一酸化タングステン
Ag0.2WO3薄膜を以下の方法で作製した。銀と酸化タング
ステンをモル比で1:5に混合した材料粉末を1t/cm2でプ
レス成型した後、石英ガラス管中に封入し、600℃で6
時間焼成して銀一酸化タングステンAg0.2WO3を合成し
た。この銀一酸化タングステンAg0.2WO3を所定量、抵抗
加熱蒸着装置の加熱ボートに入れ、加熱蒸着して第1図
(B)に示すようにヨウ化銀薄膜上に厚さ700Åの銀一
酸化タングステンAg0.2WO3薄膜11を作製した。さらに、
第1図(C)に示すように銀を所定量、抵抗加熱蒸着装
置の加熱ボートに入れ、厚さ200Åの銀薄膜12を最後に
形成した。Next, silver tungsten monoxide is deposited on the silver iodide thin film 10.
An Ag 0.2 WO 3 thin film was prepared by the following method. A material powder in which silver and tungsten oxide were mixed at a molar ratio of 1: 5 was press-molded at 1 t / cm 2 , and then sealed in a quartz glass tube.
After firing for a time, silver tungsten monoxide Ag 0.2 WO 3 was synthesized. A predetermined amount of this silver tungsten monoxide, Ag 0.2 WO 3 , was placed in a heating boat of a resistance heating vapor deposition apparatus, heated and vapor-deposited, and a 700-mm-thick silver monoxide was deposited on the silver iodide thin film as shown in FIG. A tungsten Ag 0.2 WO 3 thin film 11 was produced. further,
As shown in FIG. 1 (C), a predetermined amount of silver was put in a heating boat of a resistance heating evaporation apparatus, and a silver thin film 12 having a thickness of 200 ° was finally formed.
この積層膜を第1図(D)に示すように大気中、300
℃で6時間、加熱酸化処理して厚さ2800ÅのAg6I4WO4銀
イオン伝導性固体電解質薄膜13を作製した。This laminated film was placed in the air for 300 minutes as shown in FIG.
By heat oxidation treatment at 6 ° C. for 6 hours, an Ag 6 I 4 WO 4 silver ion conductive solid electrolyte thin film 13 having a thickness of 2800 ° was prepared.
そして、この固体電解質薄膜13上に前記の第1図に示
す薄膜形成の工程(A)から(D)を再度繰り返す(第
1図(E)〜(H))ことにより固体電解質層を積層さ
せ、厚さ5500ÅのAg6I4WO4銀イオン伝導性固体電解質薄
膜17を作製した。Then, the solid electrolyte layer is laminated on the solid electrolyte thin film 13 by repeating the thin film forming steps (A) to (D) shown in FIG. 1 again (FIGS. 1 (E) to (H)). An Ag 6 I 4 WO 4 silver ion conductive solid electrolyte thin film 17 having a thickness of 55005 was produced.
このようにして得たガラス基板18上に形成した銀イオ
ン伝導性固体電解質薄膜17上に、第2図に示すように可
逆性電極として金属銀薄膜(幅1mm、電極間距離1mm)1
9,20を2000Å形成し、その全導電率を交流複素インピー
ダンス測定方法により測定し、また、電子導電率をブロ
ッキング電極として白金薄膜2000Å(幅1mm)21を金属
銀薄膜20との電極間隔1mmで電子ビーム加熱蒸着、およ
び抵抗加熱蒸着により形成し、ワグナー測定法により測
定した。On the silver ion conductive solid electrolyte thin film 17 formed on the glass substrate 18 thus obtained, a metal silver thin film (width 1 mm, distance between electrodes 1 mm) 1 as a reversible electrode as shown in FIG.
9,20 mm is formed and its total electric conductivity is measured by the AC complex impedance measuring method. The platinum thin film 2,000 mm (width 1 mm) 21 is used as a blocking electrode with the electronic conductivity being 1 mm between the metallic silver thin film 20 and the electrode. It was formed by electron beam heating evaporation and resistance heating evaporation and measured by Wagner measurement.
その結果、得られた銀イオン伝導性固体電解質の全導
電率は、9×10-3S/cm、また、その電子導電率は、2×
10-10S/cmであった。As a result, the total conductivity of the obtained silver ion conductive solid electrolyte was 9 × 10 −3 S / cm, and its electronic conductivity was 2 × 10 3 S / cm.
It was 10 -10 S / cm.
さらに、第3図に示すように白金薄膜2000Å23を形成
したガラス基板22上に上記と同様の方法で、銀イオン導
電性固体電解質Ag6I4WO4の薄膜24を形成し、その上に金
属銀薄膜25を2000Å形成しその膜厚方向の全導電率およ
び電子導電率を測定した。Further, as shown in FIG. 3, a thin film 24 of a silver ion conductive solid electrolyte Ag 6 I 4 WO 4 is formed on a glass substrate 22 having a platinum thin film 2000Å23 formed thereon in the same manner as described above, and a metal is formed thereon. A silver thin film 25 was formed by 2000 mm, and the total electric conductivity and the electronic electric conductivity in the thickness direction were measured.
その結果、全導電率は4×10-3S/cm、電子導電率は9
×10-11S/cmであった。As a result, the total conductivity was 4 × 10 −3 S / cm and the electronic conductivity was 9
× 10 −11 S / cm.
これらの結果、本実施例の作製方法により作製された
銀イオン伝導性固体電解質Ag6I4WO4薄膜が面方向および
膜厚方向に優れた銀イオン伝導性を有し、かつ、電子絶
縁性に優れていることがわかった。As a result, the silver ion conductive solid electrolyte Ag 6 I 4 WO 4 thin film produced by the production method of this example has excellent silver ion conductivity in the plane direction and the film thickness direction, and has an electronic insulating property. Was found to be excellent.
実施例2 4AgI−Ag2O−B2O3銀イオン伝導性固体電解質薄膜を以
下の方法で作製した。EXAMPLE 2 4AgI-Ag 2 O-B 2 O 3 silver-ion-conducting solid electrolyte film was prepared in the following manner.
まず、実施例1に示す第1図と同様の方法でガラス基
板上に厚さ2500Åのヨウ化銀の薄膜を形成した。First, a thin film of silver iodide having a thickness of 2500 ° was formed on a glass substrate in the same manner as in FIG. 1 shown in Example 1.
次に、このヨウ化銀薄膜上に銀一酸化ほう素Ag0.2B2O
3の薄膜を以下の方法で作製した。Next, on this silver iodide thin film, silver boron monoxide Ag 0.2 B 2 O
The thin film of No. 3 was produced by the following method.
銀と酸化ほう素B2O3をモル比1:5で混合した材料粉末
を1t/cm2でプレス成型した後、石英ガラス管中に封入
し、600℃で6時間焼成して銀一酸化タングステンAg0.2
B2O3を合成した。A material powder obtained by mixing silver and boron oxide B 2 O 3 at a molar ratio of 1: 5 is press-molded at 1 t / cm 2 , sealed in a quartz glass tube, and calcined at 600 ° C. for 6 hours for silver monoxide. Tungsten Ag 0.2
B 2 O 3 was synthesized.
この銀一酸化ほう素Ag0.2B2O3を所定量、抵抗加熱蒸
着装置の加熱ボートに入れ、加熱蒸着してヨウ化銀薄膜
上に厚さ700Åの銀一酸化ほう素Ag0.2B2O3薄膜を作製し
た。A predetermined amount of this silver boron monoxide Ag 0.2 B 2 O 3 is placed in a heating boat of a resistance heating vapor deposition apparatus, and is heated and vapor-deposited to form a 700-mm-thick silver boron monoxide Ag 0.2 B 2 O on a silver iodide thin film. Three thin films were prepared.
さらに、銀を所定量、抵抗加熱蒸着装置の加熱ボート
に入れ、厚さ200Åの銀薄膜を最後に形成した。Further, a predetermined amount of silver was put into a heating boat of a resistance heating evaporation apparatus, and a silver thin film having a thickness of 200 mm was finally formed.
この積層膜を大気中、300℃で6時間、加熱酸化処理
して固体電解質薄膜を作製した。This laminated film was heated and oxidized in air at 300 ° C. for 6 hours to produce a solid electrolyte thin film.
そして、この固体電解質薄膜上に前記の薄膜形成の工
程を再度繰り返すことにより固体電解質層を積層させ、
厚さ5500Åの4AgI−Ag2O−B2O3銀イオン伝導性固体電解
質薄膜を作製した。Then, a solid electrolyte layer is laminated on the solid electrolyte thin film by repeating the above-mentioned thin film forming process again,
The 4AgI-Ag 2 O-B 2 O 3 silver-ion-conducting solid electrolyte thin film having a thickness of 5500Å was prepared.
このようにして得た銀イオン伝導性固体電解質薄膜上
に、第2図に示すように可逆性電極として金属銀薄膜
(幅1mm、電極間距離1mm)を2000Å形成し、その全導電
率を交流複素インピーダンス測定方法により測定し、ま
た、電子導電率をブロッキング電極として白金薄膜2000
Å(幅1mm)と金属銀薄膜(幅1mm)2000Åをそれらの電
極間隔1mmで電子ビーム加熱蒸着、および抵抗加熱蒸着
により形成し、ワグナー測定法により測定した。On the silver ion conductive solid electrolyte thin film thus obtained, a metal silver thin film (width: 1 mm, distance between electrodes: 1 mm) was formed as a reversible electrode as shown in FIG. Measured by the complex impedance measurement method, and used a platinum thin film 2000
{(Width 1 mm) and metallic silver thin film (width 1 mm) 2000} were formed by electron beam heating evaporation and resistance heating evaporation at an electrode spacing of 1 mm, and measured by Wagner measurement.
その結果、得られた銀イオン伝導性固体電解質の全導
電率は、3×10-3S/cm、また、その電子導電率は、4×
10-10S/cmであった。As a result, the total conductivity of the obtained silver ion conductive solid electrolyte was 3 × 10 −3 S / cm, and its electronic conductivity was 4 × 10 −3 S / cm.
It was 10 -10 S / cm.
さらに、白金薄膜2000Åを形成したガラス基板上に、
第3図に示した方法と同様の方法で銀イオン導電性固体
電解質4AgI−Ag2O−B2O3の薄膜を形成し、その膜厚方向
の全導電率および電子導電率を測定した。Furthermore, on a glass substrate on which 2000 mm of platinum thin film was formed,
A thin film of silver ion conductive solid electrolyte 4AgI-Ag 2 O-B 2 O 3 is formed in a manner similar to that shown in FIG. 3, was measured total Conductivity and electron conductivity of the film thickness direction.
その結果、全導電率は1×10-3S/cm、電子導電率は1
×10-10S/cmであった。As a result, the total conductivity was 1 × 10 −3 S / cm, and the electronic conductivity was 1
× 10 −10 S / cm.
これらの結果、本発明の作製方法により作製された銀
イオン伝導性固体電解質4AgI−Ag2O−B2O3薄膜が面方向
および膜厚方向に優れた銀イオン伝導性を有し、かつ、
電子絶縁性に優れていることがわかった。As a result, the silver ion conductive solid electrolyte 4AgI-Ag 2 O-B 2 O 3 thin film produced by the production method of the present invention has excellent silver ion conductivity in the plane direction and the film thickness direction, and
It turned out that it was excellent in electronic insulation.
以上、銀イオン伝導性固体電解質としてWO3,B2O3を使
用した例を示したが、その他の酸化物CrO3,MoO3,P2O5,V
2O5,TeO,SeO2,As2O3,SiO2,GeO2を用いても同様の効果が
得られる。Above, an example using WO 3 , B 2 O 3 as a silver ion conductive solid electrolyte was shown, but other oxides CrO 3 , MoO 3 , P 2 O 5 , V
Similar effects can be obtained by using 2 O 5 , TeO, SeO 2 , As 2 O 3 , SiO 2 , and GeO 2 .
発明の効果 以上の実施例の説明で明らかなように本発明の銀イオ
ン伝導性固体電解質薄膜の製造法によれば、素子を集積
化しイオニックメモリ(超小形電池を集積化した電位記
憶素子)や画像表示素子(超小形エレクトロクロミック
素子を集積化した表示素子)などに応用することができ
る銀イオン伝導性固体電解質薄膜を容易に得ることがで
きるものである。Advantages of the Invention As is clear from the description of the above embodiments, according to the method for producing a silver ion conductive solid electrolyte thin film of the present invention, an element is integrated and an ionic memory (a potential storage element in which a microminiature battery is integrated) or A silver ion conductive solid electrolyte thin film which can be applied to an image display element (a display element in which a micro electrochromic element is integrated) or the like can be easily obtained.
第1図(A)〜(H)は、本発明の一実施例の銀イオン
伝導性固体電解質薄膜の製造法における実施例1および
実施例2に示す固体電解質薄膜の作製工程図、第2図
は、同面方向の全導電率および電子導電率の測定用セル
の構成を示す断面図、第3図は、同膜厚方向の全導電率
および電子導電率の測定用セルの構成を示す断面図であ
る。 9……ガラス基板、10,14……AgI層、11,15……Ag0.2WO
3層、12,16……Ag層、13,17……固体電解質薄膜。1 (A) to 1 (H) are process charts of the solid electrolyte thin film shown in Examples 1 and 2 in the method for producing a silver ion conductive solid electrolyte thin film according to one embodiment of the present invention, FIG. Is a cross-sectional view showing a configuration of a cell for measuring total and electronic conductivity in the same plane direction, and FIG. 3 is a cross-sectional view showing a configuration of a cell for measuring total and electronic conductivity in the same film thickness direction. FIG. 9: Glass substrate, 10, 14: AgI layer, 11, 15: Ag 0.2 WO
3 layers, 12,16 ... Ag layer, 13,17 ... Solid electrolyte thin film.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭54−102526(JP,A) 特開 昭50−16836(JP,A) 特開 昭50−10453(JP,A) ────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-54-102526 (JP, A) JP-A-50-16836 (JP, A) JP-A-50-10453 (JP, A)
Claims (1)
意の数)、Agを順次堆積した後、前記堆積層を酸化雰囲
気中で加熱酸化してAgI−Ag2O−MOy(MはW,Cr,Mo,P,V,
Te,Se,As,B,Si,およびGeからなる群より選ばれる少なく
とも一種の元素、yはMの原子価によりきまる整数)固
体電解質層を作製する工程を複数回繰り返すことによっ
て、前記固体電解質層が複数層積層された固体電解質薄
膜を得ることを特徴とする銀イオン伝導性固体電解質薄
膜の製造法。1. After sequentially depositing AgI, Ag x MO y (x is any number in the range of 0 <x ≦ 1) and Ag, the deposited layer is heated and oxidized in an oxidizing atmosphere to obtain AgI-Ag 2 O−MO y (M is W, Cr, Mo, P, V,
At least one element selected from the group consisting of Te, Se, As, B, Si, and Ge, and y is an integer determined by the valency of M) The solid electrolyte layer is repeatedly formed a plurality of times to obtain the solid electrolyte. A method for producing a silver ion conductive solid electrolyte thin film, comprising obtaining a solid electrolyte thin film having a plurality of layers laminated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2203275A JP2715638B2 (en) | 1990-07-31 | 1990-07-31 | Manufacturing method of silver ion conductive solid electrolyte thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2203275A JP2715638B2 (en) | 1990-07-31 | 1990-07-31 | Manufacturing method of silver ion conductive solid electrolyte thin film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0495350A JPH0495350A (en) | 1992-03-27 |
| JP2715638B2 true JP2715638B2 (en) | 1998-02-18 |
Family
ID=16471354
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2203275A Expired - Fee Related JP2715638B2 (en) | 1990-07-31 | 1990-07-31 | Manufacturing method of silver ion conductive solid electrolyte thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2715638B2 (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5010453A (en) * | 1973-06-06 | 1975-02-03 | ||
| JPS5016836A (en) * | 1973-06-20 | 1975-02-21 | ||
| JPS54102526A (en) * | 1978-01-30 | 1979-08-13 | Japan Storage Battery Co Ltd | Solid electrolyte cell |
| JPH0821255B2 (en) * | 1990-04-16 | 1996-03-04 | 松下電器産業株式会社 | Method for producing thin film solid electrolyte |
| JPH0495353A (en) * | 1990-07-31 | 1992-03-27 | Matsushita Electric Ind Co Ltd | Production method of silver iodide-silver oxyate solid electrolyte thin film |
-
1990
- 1990-07-31 JP JP2203275A patent/JP2715638B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0495350A (en) | 1992-03-27 |
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