JP2720751B2 - Differential thermal analyzer - Google Patents
Differential thermal analyzerInfo
- Publication number
- JP2720751B2 JP2720751B2 JP5092052A JP9205293A JP2720751B2 JP 2720751 B2 JP2720751 B2 JP 2720751B2 JP 5092052 A JP5092052 A JP 5092052A JP 9205293 A JP9205293 A JP 9205293A JP 2720751 B2 JP2720751 B2 JP 2720751B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- differential thermal
- thermal analyzer
- heating furnace
- furnace
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、縦型筒状加熱炉を用い
る示差熱分析装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a differential thermal analyzer using a vertical cylindrical heating furnace.
【0002】[0002]
【従来の技術】試料と基準物質を並べて加熱炉の中に置
き、両者を一定の速度で加熱しながら両者の温度差ΔT
を温度Tの関数として測定する技法を示差熱分析(Diff
erential Thermal Analysis、DTA)という。試料の
物理的変化や化学的変化は一般に熱容量の変化や反応熱
の発生等を伴うため、基準物質として熱変化を生じない
物質(一般にはα−アルミナ)を使用し、両者の昇温時
の温度差ΔTを測定することにより、試料の熱特性を測
定することができる。温度Tに対するこの温度差ΔTは
温度差曲線(DTA曲線)と呼ばれ、試料の熱変化に対
応してベースラインシフトや吸熱・発熱ピークが現われ
る。2. Description of the Related Art A sample and a reference material are placed side by side in a heating furnace, and a temperature difference ΔT between the two is heated while heating both at a constant rate.
Is a technique for measuring the temperature as a function of temperature T using differential thermal analysis (Diff
erential Thermal Analysis (DTA). Since a physical change or a chemical change of a sample generally involves a change in heat capacity or generation of reaction heat, use a substance (generally α-alumina) that does not cause a heat change as a reference substance. By measuring the temperature difference ΔT, the thermal characteristics of the sample can be measured. This temperature difference ΔT with respect to the temperature T is called a temperature difference curve (DTA curve), and a baseline shift and an endothermic / exothermic peak appear in response to a change in the heat of the sample.
【0003】従来の示差熱分析装置(Differential The
rmal Analyzer、DTA)の概要を図3により説明す
る。装置は縦型円筒状の加熱炉50と、主制御部61等
の制御装置から成る。加熱炉50は、本体部51、本体
部51の上部に設けられたフード部54及び本体部51
の下部に設けられた接続部53から成り、接続部53を
基礎部55に気密に差し込んで使用される。加熱用のヒ
ータ線52は本体部51にのみ設けられている。A conventional differential thermal analyzer (Differential The
An outline of the Rmal Analyzer (DTA) will be described with reference to FIG. The apparatus includes a vertical cylindrical heating furnace 50 and a control device such as a main control unit 61. The heating furnace 50 includes a main body 51, a hood 54 provided above the main body 51, and a main body 51.
The connecting portion 53 is provided at the lower part of the base portion 55. The connecting portion 53 is airtightly inserted into the base portion 55 for use. The heater wire 52 for heating is provided only in the main body 51.
【0004】加熱炉50の本体部51の内部のほぼ中央
に、横並びに配置された第1及び第2試料皿20、21
が設けられる。両試料皿20、21は、1本の線を共有
する2組の熱電対22、23、24の高温端となってお
り、一方には被測定試料が、他方には基準物質が載置さ
れる。熱電対22、23、24は導管25を通って主制
御部61に接続される。主制御部61は所定の昇温プロ
グラムで試料を加熱するように温度制御部62に対して
制御信号を送ると共に、熱電対22、23、24の端子
間の電圧を測定し、被測定試料と基準物質との温度差Δ
Tを検出する。これら試料の温度Tと温度差ΔTのデー
タは主制御部61から記録部63に送られ、記録紙上に
記録される。また、主制御部61内でDTA曲線を解析
することにより、試料の分解温度等が検出される。The first and second sample dishes 20, 21 arranged side by side are arranged substantially at the center of the inside of the main body 51 of the heating furnace 50.
Is provided. Both sample dishes 20, 21 are the hot ends of two sets of thermocouples 22, 23, 24 sharing one line, one on which the sample to be measured is placed and the other on which the reference substance is placed. You. Thermocouples 22, 23, 24 are connected to main controller 61 through conduit 25. The main control unit 61 sends a control signal to the temperature control unit 62 so as to heat the sample according to a predetermined temperature raising program, measures the voltage between the terminals of the thermocouples 22, 23, and 24, and connects the sample to be measured with the thermocouple. Temperature difference Δ with reference material
T is detected. The data of the temperature T and the temperature difference ΔT of the sample are sent from the main control unit 61 to the recording unit 63 and recorded on recording paper. Further, by analyzing the DTA curve in the main control section 61, the decomposition temperature and the like of the sample are detected.
【0005】[0005]
【発明が解決しようとする課題】上記構成の示差熱分析
装置ではヒータ線52が加熱源となり、それにより試料
及び基準物質が加熱されるが、試料及び基準物質は、比
較的低温では主に炉内の空気の対流により、高温になる
と炉壁からの輻射により加熱される。しかし、上記従来
の構成では試料及び基準物質の上下は空洞となっている
ため、上下からの輻射はなく、逆に試料からの輻射によ
り熱が逃げる。このため、試料及び基準物質の上部の空
間の形状、温度の不均一性により試料と基準物質との間
に輻射ムラが生じ、正確な熱分析が行なえないという問
題がある。In the differential thermal analyzer having the above-mentioned structure, the heater wire 52 serves as a heating source, thereby heating the sample and the reference material. Due to the convection of the air inside, when the temperature becomes high, it is heated by radiation from the furnace wall. However, in the above-described conventional configuration, since the upper and lower portions of the sample and the reference material are hollow, there is no radiation from above and below, and on the contrary, heat escapes by the radiation from the sample. For this reason, there is a problem that radiation unevenness occurs between the sample and the reference material due to the non-uniformity of the shape and the temperature of the space above the sample and the reference material, and accurate thermal analysis cannot be performed.
【0006】このような問題は示差熱分析装置のみにと
どまらず、熱重量測定装置、膨張測定装置(熱機械測定
装置)等の、縦型筒状加熱炉を用いる熱分析装置一般に
対して言える。本発明はこのような課題を解決するため
に成されたものであり、その目的とするところは、試料
の(基準物質を用いる場合には、試料と基準物質との)
加熱ムラを少なくし、正確な熱分析を行なうことができ
る熱分析装置を提供することにある。[0006] Such a problem is not limited to the differential thermal analyzer, but can be applied to general thermal analyzers using a vertical cylindrical heating furnace, such as a thermogravimetric measuring device and an expansion measuring device (thermomechanical measuring device). The present invention has been made to solve such a problem, and an object of the present invention is to make a sample (when a reference material is used, a sample and a reference material).
An object of the present invention is to provide a thermal analyzer capable of performing accurate thermal analysis by reducing heating unevenness.
【0007】[0007]
【課題を解決するための手段】上記課題を解決するため
に成された本発明に係る示差熱分析装置は、縦長型筒状
の加熱炉の略中央に試料を配置する示差熱分析装置にお
いて、加熱炉の上端部から炉長の1/4〜1/2の位置
に、炉壁に接続した横断壁を設けたことを特徴としてい
る。Means for Solving the Problems A differential thermal analyzer according to the present invention made to solve the above-mentioned problem is a differential thermal analyzer in which a sample is arranged at substantially the center of a vertically long cylindrical heating furnace. A transverse wall connected to the furnace wall is provided at a position 1/4 to 1/2 of the furnace length from the upper end of the heating furnace.
【0008】[0008]
【作用】試料(基準物質を用いる場合には、試料と基準
物質)は縦長の筒状(円筒状、多角形筒状のいずれに拘
らず)加熱炉の略中央に配置され、横断壁は加熱炉の上
端部から炉長の1/4〜1/2の位置に配置される。こ
のため、横断壁は試料(及び基準物質)の直上または近
い上部に存在し、試料の上部を覆うこととなる。この横
断壁は加熱炉の炉壁に接続されているため、熱伝達によ
り炉壁から熱が供給され、しかも、横断壁の上部にもま
だ、ヒータにより加熱されている炉壁が存在する(少な
くとも1/4は存在する)ため、横断壁の温度は炉壁の
温度とほぼ等しい。従って、試料は周囲の側壁と上部の
横断壁よりほぼ均一な輻射を受け、試料(及び基準物
質)は均等な加熱を受けるようになる。なお、試料の下
部は広い空洞になっているため、従来の加熱炉と同様
に、比較的低温では炉内の空気の対流により試料及び基
準物質はほぼ均一に加熱される。The sample (in the case of using a reference material, the sample and the reference material) is placed at the substantially center of a vertically long cylindrical (both cylindrical and polygonal) heating furnace, and the transverse wall is heated. It is arranged at a position 1/4 to 1/2 of the furnace length from the upper end of the furnace. For this reason, the transverse wall exists immediately above or near the sample (and the reference substance), and covers the upper portion of the sample. Since this transverse wall is connected to the furnace wall of the heating furnace, heat is supplied from the furnace wall by heat transfer, and there is still a furnace wall heated by the heater above the transverse wall (at least). (1/4 is present), so the temperature of the transverse wall is approximately equal to the temperature of the furnace wall. Thus, the sample receives substantially uniform radiation from the surrounding sidewalls and the upper transverse wall, and the sample (and reference material) receives uniform heating. Since the lower part of the sample has a wide cavity, the sample and the reference substance are heated almost uniformly by convection of air in the furnace at a relatively low temperature, similarly to the conventional heating furnace.
【0009】[0009]
【実施例】本発明の第1の実施例である示差熱分析装置
の加熱炉を図1により説明する。本実施例の示差熱分析
装置では、加熱炉10の本体部11にはフード部を設け
ず、代わりに本体部11の上部からほぼ1/3程度の位
置に、本体部11の内壁から内部にほぼ水平に延びる天
蓋部14(横断壁)を設けている。第1、第2試料皿2
0、21は従来(図3)の示差熱分析装置とほぼ同様の
位置に置かれているため、天蓋部14は試料及び基準物
質のほぼ直上を覆うようになっている。なお、本実施例
の示差熱分析装置では測定時の雰囲気を調整するため、
雰囲気ガスを逃がす孔15を天蓋部14の中央に設けて
いる。また、基礎部は図3に示した従来のものと同じで
あるため、図示を省略した。FIG. 1 shows a heating furnace of a differential thermal analyzer according to a first embodiment of the present invention. In the differential thermal analyzer of the present embodiment, the hood is not provided on the main body 11 of the heating furnace 10, but instead, at about 1/3 from the upper part of the main body 11, from the inner wall of the main body 11 to the inside. A canopy portion 14 (transverse wall) extending substantially horizontally is provided. First and second sample dishes 2
Since the reference numerals 0 and 21 are located at substantially the same positions as those of the conventional differential thermal analyzer (FIG. 3), the canopy 14 covers almost directly above the sample and the reference substance. In the differential thermal analyzer of the present embodiment, in order to adjust the atmosphere at the time of measurement,
A hole 15 for releasing the atmospheric gas is provided at the center of the canopy portion 14. Further, since the base portion is the same as the conventional one shown in FIG. 3, illustration is omitted.
【0010】本実施例の示差熱分析装置の加熱炉10は
以上のような構造を有しているため、ヒータ線12に通
電して加熱したとき、その熱は円筒状の本体部11の内
壁に伝わると共に、内壁を通じて天蓋部14にも伝達さ
れる。ここで、本体部11のヒータ線12は天蓋部14
の更に上部にも設けられているため、天蓋部14は内壁
との温度差がほとんどない。従って、第1、第2試料皿
20、21上の試料及び基準物質は周囲及び上部よりム
ラなく輻射を受け、両者は均等に加熱される。Since the heating furnace 10 of the differential thermal analyzer of the present embodiment has the above-described structure, when the heater wire 12 is energized and heated, the heat is transferred to the inner wall of the cylindrical main body 11. And transmitted to the canopy part 14 through the inner wall. Here, the heater wire 12 of the main body 11 is
The canopy 14 has almost no temperature difference with the inner wall. Therefore, the sample and the reference material on the first and second sample dishes 20 and 21 receive radiation uniformly from the surroundings and the upper portion, and both are uniformly heated.
【0011】本発明の第2実施例の示差熱分析装置の加
熱炉の構成を図2(a)に示す。本実施例の加熱炉30
は試料の雰囲気調整を行なわない場合に使うものであ
り、雰囲気ガスを逃がすための通気孔を設ける必要がな
いため、天蓋部34をフラットにし、試料及び基準物質
の上部を完全に覆って、より均等な輻射を行なうように
している。FIG. 2A shows the configuration of a heating furnace of a differential thermal analyzer according to a second embodiment of the present invention. Heating furnace 30 of the present embodiment
Is used when the atmosphere of the sample is not adjusted, and since there is no need to provide a vent hole for releasing the atmosphere gas, the canopy part 34 is flattened, and the top of the sample and the reference material is completely covered. Emit even radiation.
【0012】本発明の第3実施例の示差熱分析装置の加
熱炉の構成を図2(b)に示す。本実施例の加熱炉40
は、第1実施例と同様、雰囲気調整を行なう場合に使用
するものであるが、第1実施例で用いた通気孔45付天
蓋部44に加え、炉の下部よりセラミックス製の反射板
47を第1、第2試料皿20、21の真下の位置まで差
し込んでいる。これにより、試料及び基準物質は周囲及
び上部から均等な輻射を受けることに加え、下面からの
輻射損失が最小限に抑えられるため、さらに均等な加熱
が行なわれる。なお、反射効率を上げるために、反射板
47の上面に白金等の金属層を設けるようにしてもよ
い。FIG. 2 (b) shows a configuration of a heating furnace of a differential thermal analyzer according to a third embodiment of the present invention. Heating furnace 40 of the present embodiment
Is used to adjust the atmosphere, as in the first embodiment. In addition to the canopy 44 with the vent hole 45 used in the first embodiment, a ceramic reflector plate 47 is provided from the lower part of the furnace. The first and second sample dishes 20 and 21 are inserted to the positions directly below. Thus, the sample and the reference material receive uniform radiation from the surroundings and the upper portion, and furthermore, radiation loss from the lower surface is minimized, so that more uniform heating is performed. Note that a metal layer such as platinum may be provided on the upper surface of the reflection plate 47 in order to increase the reflection efficiency.
【0013】[0013]
【0014】[0014]
【発明の効果】本発明に係る示差熱分析装置では、試料
(及び基準物質)の直上に周囲の炉壁とほぼ同じ温度と
なっている横断壁が存在するため、試料(及び基準物
質)は周囲の側壁と上部の横断壁よりほぼ均一な輻射を
受け、試料は均一な加熱を受ける(試料と基準物質とが
併置されている場合には、両者が均等に加熱される)。
このため、ベースラインシフトのない、正確な分析を行
なうことができる。In the differential thermal analyzer according to the present invention, the sample (and the reference substance) has a cross-section wall having a temperature almost equal to that of the surrounding furnace wall immediately above the sample (and the reference substance). The sample receives substantially uniform radiation from the surrounding side wall and the upper transverse wall, and receives uniform heating (when the sample and the reference material are juxtaposed, both are heated equally).
Therefore, an accurate analysis without a baseline shift can be performed.
【図1】 本発明の第1実施例である示差熱分析装置の
加熱炉の縦断面図。FIG. 1 is a longitudinal sectional view of a heating furnace of a differential thermal analyzer according to a first embodiment of the present invention.
【図2】 本発明の第2及び第3実施例である示差熱分
析装置の加熱炉の縦断面図。FIG. 2 is a longitudinal sectional view of a heating furnace of the differential thermal analyzer according to the second and third embodiments of the present invention.
【図3】 従来の示差熱分析装置の加熱炉の縦断面図及
び制御装置のブロック図。FIG. 3 is a longitudinal sectional view of a heating furnace of a conventional differential thermal analyzer and a block diagram of a control device.
10、30、40、50、70…加熱炉 11、51…加熱炉本体部 12、52…ヒ
ータ線 14、34、44…天蓋部 20、21…第1、第2試料皿 22、23、2
4…熱電対 47…反射板10, 30, 40, 50, 70 ... heating furnace 11, 51 ... heating furnace main body 12, 52 ... heater wire 14, 34, 44 ... canopy 20, 21 ... first and second sample dishes 22, 23, 2
4: Thermocouple 47: Reflector
Claims (1)
置する示差熱分析装置において、加熱炉の上端部から炉
長の1/4〜1/2の位置に、炉壁に接続した横断壁を
設けたことを特徴とする示差熱分析装置。1. A differential thermal analyzer in which a sample is arranged at substantially the center of a vertically long cylindrical heating furnace, connected to a furnace wall at a position 1/4 to 1/2 of the furnace length from an upper end of the heating furnace. A differential thermal analyzer characterized by having a crossed wall provided.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5092052A JP2720751B2 (en) | 1993-03-25 | 1993-03-25 | Differential thermal analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5092052A JP2720751B2 (en) | 1993-03-25 | 1993-03-25 | Differential thermal analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06281603A JPH06281603A (en) | 1994-10-07 |
| JP2720751B2 true JP2720751B2 (en) | 1998-03-04 |
Family
ID=14043746
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5092052A Expired - Fee Related JP2720751B2 (en) | 1993-03-25 | 1993-03-25 | Differential thermal analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2720751B2 (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5821150A (en) * | 1981-07-30 | 1983-02-07 | Shimadzu Corp | Apparatus of differential thermal analysis |
| JPS58132861U (en) * | 1982-03-02 | 1983-09-07 | セイコーインスツルメンツ株式会社 | heating furnace |
| JPS60207046A (en) * | 1984-03-30 | 1985-10-18 | Shimadzu Corp | Sample cell for heat flux differential scanning calorimeter |
| JPS60209158A (en) * | 1984-03-31 | 1985-10-21 | Shimadzu Corp | Sample cell for heat flux differential scanning calorimeter |
| JPS60169562U (en) * | 1984-04-19 | 1985-11-11 | 株式会社島津製作所 | Sample cell for heat flux differential scanning calorimeter |
-
1993
- 1993-03-25 JP JP5092052A patent/JP2720751B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06281603A (en) | 1994-10-07 |
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