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JP2725249B2 - Electroplating electrode observation and automatic plating equipment - Google Patents
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JP2725249B2 - Electroplating electrode observation and automatic plating equipment - Google Patents

Electroplating electrode observation and automatic plating equipment

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Publication number
JP2725249B2
JP2725249B2 JP15274689A JP15274689A JP2725249B2 JP 2725249 B2 JP2725249 B2 JP 2725249B2 JP 15274689 A JP15274689 A JP 15274689A JP 15274689 A JP15274689 A JP 15274689A JP 2725249 B2 JP2725249 B2 JP 2725249B2
Authority
JP
Japan
Prior art keywords
plating
electrode
anode
electrode surface
electrolytic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15274689A
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Japanese (ja)
Other versions
JPH0320500A (en
Inventor
元伺 池谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kagaku Gijutsu Shinko Jigyodan
Original Assignee
Kagaku Gijutsu Shinko Jigyodan
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Application filed by Kagaku Gijutsu Shinko Jigyodan filed Critical Kagaku Gijutsu Shinko Jigyodan
Priority to JP15274689A priority Critical patent/JP2725249B2/en
Publication of JPH0320500A publication Critical patent/JPH0320500A/en
Application granted granted Critical
Publication of JP2725249B2 publication Critical patent/JP2725249B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は通電しながら電極表面を観察し、さらに電極
表面の状態に応じて電極供給電圧または電流を制御する
ようにした電解メッキ電極観察及び自動メッキ装置に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention observes an electrode surface while energizing, and further controls and monitors an electrode supply voltage or current in accordance with the state of the electrode surface. The present invention relates to an automatic plating apparatus.

〔従来の技術〕[Conventional technology]

一般に、陰極として水素吸蔵金属を使用し、電解液中
で陽極との間で通電すると、水素イオンが電解液中を輸
送されて陰極で水素原子が生成され、これが陰極に吸蔵
され、その結果金属の硬度が増大し、一方ぜい性が増大
するという性質がある。このように水素吸蔵合金の電解
水素吸蔵や陽極にメッキ材料金属を使用したり、電解液
は金属イオンを含むメッキ液を用いて陰極メッキする電
気メッキの技術は広い工業的応用のある分野であり、最
近はICやLSIのメッキ電着技術も開発されている。
In general, when a hydrogen storage metal is used as a cathode and a current is passed between the anode and the electrolyte in the electrolyte, hydrogen ions are transported in the electrolyte to generate hydrogen atoms at the cathode, and this is occluded by the cathode. Has the property of increasing the hardness while increasing the brittleness. The electroplating technique of electroplating hydrogen-absorbing alloys using hydrogen as a plating material metal for the anode and the anode or using a plating solution containing metal ions as the electrolyte is a field with a wide range of industrial applications. Recently, plating technology for plating ICs and LSIs has also been developed.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

ところで、電解メッキにおいても前述したように陰極
であるメッキ基板では水素原子が生成され、生成した水
素原子同士あるいは生成した水素原子と陰極中の水素原
子とが結合して水素ガスが発生し、これが陰極表面から
気泡として発生するためにメッキを行う表面に気孔が点
在して形成されてしまい、均一で良質なメッキを実現す
ることは困難なことが多い。
By the way, in electrolytic plating, as described above, hydrogen atoms are generated on the plating substrate serving as the cathode, and the generated hydrogen atoms are combined with each other or the generated hydrogen atoms and the hydrogen atoms in the cathode to generate hydrogen gas. Since air bubbles are generated from the cathode surface, pores are scattered and formed on the surface to be plated, and it is often difficult to realize uniform and high-quality plating.

本発明は上記問題点を解決するためのもので、通電中
に電極その場観察が可能であるとともに、撮像した電極
表面像を画像処理し、処理結果に応じて電極へ供給する
電圧または電流を制御することにより均一で良質なメッ
キを自動的に行うことが可能な電解メッキ電極観察及び
自動メッキ装置を提供することを目的とする。
The present invention has been made to solve the above problems, and enables in-situ observation of an electrode during energization, performs image processing on a captured electrode surface image, and adjusts a voltage or a current supplied to the electrode according to a processing result. An object of the present invention is to provide an electroplating electrode observation and automatic plating apparatus capable of automatically performing uniform and high-quality plating by controlling the apparatus.

〔課題を解決するための手段〕[Means for solving the problem]

本発明は、電解液を満たした電解槽内に配置した陽極
と陰極間に通電し、顕微鏡により電極表面の変化を連続
的に観察する装置であって、顕微鏡を通して電極表面を
撮像する手段と、撮像して得られた画像情報を処理する
画像処理手段とを備え、通電しつつ電極表面状態を観察
するようにした電解メッキ電極観察装置、および電解液
を満たした電解槽内に配置した陽極と陰極間に通電し、
顕微鏡を通して電極表面を撮像する撮像手段と、撮像し
て得られた画像情報を処理する画像処理手段と、画像処
理結果に応じて電極へ供給する電圧または電流が制御さ
れる手段とを備えた自動メッキ装置を特徴としている。
The present invention is an apparatus for energizing between an anode and a cathode disposed in an electrolytic cell filled with an electrolytic solution, a device for continuously observing changes in the electrode surface with a microscope, and a means for imaging the electrode surface through a microscope, With an image processing means for processing image information obtained by imaging, an electrolytic plating electrode observation device so as to observe the electrode surface state while energizing, and an anode disposed in an electrolytic tank filled with an electrolyte Apply electricity between the cathodes,
An image pickup means for picking up an image of an electrode surface through a microscope, an image processing means for processing image information obtained by image pick-up, and a means for controlling a voltage or a current supplied to the electrode in accordance with a result of the image processing; It features a plating device.

〔作用〕[Action]

本発明は、通電しながら電極の表面を電解槽に設けた
窓を通して光学顕微鏡で観察することにより、陰極にお
いては水素吸蔵やメッキ状態を、陽極においては陽極材
料の酸化の状態を観察することができる。また、顕微鏡
像をTVカメラ等の撮像装置で連続的に撮像して画像処理
し、処理結果に応じて電極への供給電圧または電流を制
御するようにしたので、所望の特性をもつ電気メッキが
可能であり、また、例えば気泡が生じて気孔が生じてい
る場合には電圧の極性を変えて電極表面を研磨し、気孔
が消滅したら再び電圧または電流の極性を変えてメッキ
するということを繰り返すことにより均一で良質なメッ
キを行うことが可能となる。
In the present invention, by observing the surface of the electrode with a light microscope through a window provided in the electrolytic cell while energizing, it is possible to observe the state of hydrogen absorption and plating at the cathode and the state of oxidation of the anode material at the anode. it can. In addition, since a microscope image is continuously captured by an imaging device such as a TV camera and image processing is performed, and a supply voltage or a current to the electrode is controlled according to a processing result, electroplating having desired characteristics can be performed. It is also possible to change the polarity of the voltage to polish the electrode surface when bubbles are generated and pores are generated, and to repeat plating when the pores disappear by changing the polarity of voltage or current again. As a result, uniform and high-quality plating can be performed.

〔実施例〕〔Example〕

以下、実施例を説明する。 Hereinafter, examples will be described.

第1図は本発明の電解メッキ電極観察装置における要
部断面図、第2図は電解メッキ装置の全体構成を示す
図、第3図は波形図である。図中、1は光学顕微鏡、2
は鏡筒、3は対物レンズ、4は電解槽、5は電解液、6
はメッキ基板、7は白金電極、8はカバーガラス、9は
水流ポンプ、10は熱電対、11は気泡、21はTVカメラ、22
はモニタ、23はコンピュータ、24は電圧発生器である。
FIG. 1 is a cross-sectional view of a main part of an electroplating electrode observation apparatus according to the present invention, FIG. 2 is a view showing the overall configuration of the electroplating apparatus, and FIG. 3 is a waveform diagram. In the figure, 1 is an optical microscope, 2
Is a lens barrel, 3 is an objective lens, 4 is an electrolytic tank, 5 is an electrolytic solution, 6
Is a plating substrate, 7 is a platinum electrode, 8 is a cover glass, 9 is a water flow pump, 10 is a thermocouple, 11 is a bubble, 21 is a TV camera, 22
Is a monitor, 23 is a computer, and 24 is a voltage generator.

第1図において、電解槽4はXYステージ12上に載置さ
れ、電解液5中にはメッキ材料金属である白金電極(陽
極)7との間で通電されるメッキ基板(陰極)6がカバ
ーガラス8の窓に対向して配置されており、XYステージ
12で視野を定めながらカバーガラスの窓を通して光学顕
微鏡1により、通電中のメッキ基板表面の観察が行われ
る。この基板表面の変化は、後述するように顕微鏡に取
り付けたTVカメラで撮像することができる。対物レンズ
3は、倍率が高くなると試料との距離が小さくなるため
その間に電解液を入れることが困難になるので、長距離
焦点レンズを使用する。ただし、倍率が200倍程度まで
なら通常の対物レンズで充分である。
In FIG. 1, an electrolytic cell 4 is mounted on an XY stage 12, and a plating substrate (cathode) 6 which is energized between a plating material metal and a platinum electrode (anode) 7 is covered in an electrolytic solution 5. The XY stage is located opposite the window of glass 8
While the field of view is determined at 12, the surface of the plated substrate during energization is observed by the optical microscope 1 through the window of the cover glass. This change in the substrate surface can be imaged by a TV camera attached to a microscope as described later. The objective lens 3 uses a long-distance focusing lens because the distance from the sample decreases as the magnification increases, and it becomes difficult to insert an electrolytic solution during this. However, if the magnification is up to about 200 times, a normal objective lens is sufficient.

通電すると、陰極側では電解液を通して輸送される水
素イオンにより水素ガスが発生するためカバーガラス8
を5°〜30°傾斜させて浮力により気泡を視野外へ導く
ようにする。もちろん、カバーガラスを傾斜させずに水
平に設け、装置全体を傾けることにより気泡を視野外に
導いて観察するようにしてもよい。また、電解槽4には
水流ポンプまたはスクリュウ9が設置され、電解液をメ
ッキ基板に向かって強制的に送ることにより同様に発生
した気泡を視野外に導くようにする。そして発生したガ
スはガス放出口12より放出するようにして電解槽内の圧
力上昇を防ぐようにしている。また、熱電対10により電
解液温度を測定しながらメッキを行う。
When energized, hydrogen gas is generated on the cathode side by hydrogen ions transported through the electrolytic solution.
At an angle of 5 ° to 30 ° so as to guide bubbles out of the visual field by buoyancy. Of course, the cover glass may be provided horizontally without being inclined, and the air bubbles may be guided out of the field of view by obliquely tilting the entire apparatus. In addition, a water flow pump or screw 9 is provided in the electrolytic cell 4 to force the electrolytic solution toward the plating substrate to similarly guide generated bubbles out of the field of view. The generated gas is released from the gas discharge port 12 to prevent the pressure in the electrolytic cell from rising. Further, plating is performed while measuring the temperature of the electrolytic solution with the thermocouple 10.

このような構成により、通電しながら陰極メッキ面の
状態を連続的に観察したり、水素吸蔵の状態も同様に観
察することができる。
With such a configuration, it is possible to continuously observe the state of the cathode plating surface while energizing, and also observe the state of occlusion of hydrogen.

また、上記説明では陰極の観察について説明したが、
もちろん陽極の観察を行うことも可能であり、その場合
は電気分解による陽極表面の酸化状態を観察することに
なる。
In the above description, observation of the cathode has been described.
Of course, it is also possible to observe the anode, in which case the oxidation state of the anode surface due to electrolysis is observed.

次に、第1図の観察装置を利用した自動メッキ装置に
ついて第2図、第3図により説明する。
Next, an automatic plating apparatus using the observation apparatus shown in FIG. 1 will be described with reference to FIGS.

半導体ウエハ等にIC用微細メッキを行う場合、メッキ
の付着状態を制御するために、電極には単に一定の電圧
を印加するのではなく、電圧または電流波形を変えて、
電着と電解研磨を繰り返すことが好ましい。
When performing fine plating for ICs on semiconductor wafers and the like, in order to control the adhesion state of plating, instead of simply applying a constant voltage to the electrodes, change the voltage or current waveform,
It is preferable to repeat electrodeposition and electrolytic polishing.

第2図においては、TVカメラ21で光学顕微鏡1により
観察した電極表面像を連続的に撮像し、必要に応じて電
極表面像をモニタ22で観察しながらコンピュータ23で画
像処理を行う。そして、画像処理結果に応じて電圧発生
器24により電極への印加電圧を制御する。例えば、メッ
キ開始初期においては、“金属付着”が点在して観察さ
れるので、その数、付着面積、さらに焦点深度から推定
される付着の厚みから付着金属量を算出し、供給電圧波
形をコンピュータ23により変化させてメッキ形成速度を
最適に制御する。
2, the electrode surface image observed by the optical microscope 1 with the TV camera 21 is continuously captured, and the computer 23 performs image processing while observing the electrode surface image with the monitor 22 as necessary. Then, the voltage applied to the electrodes is controlled by the voltage generator 24 according to the image processing result. For example, in the early stage of plating, “metal adhesion” is observed interspersed. Therefore, the amount of metal adhesion is calculated from the number, the adhesion area, and the adhesion thickness estimated from the depth of focus, and the supply voltage waveform is calculated. The plating speed is controlled optimally by changing it by the computer 23.

また、例えばモニタによる電極表面の観察、及び画像
処理により、電極表面に気孔が発生していることが認識
された場合には、コンピュータ23により電圧発生器24を
制御して第3図に示すように電極へ印加する電圧の極性
を変え、電着モードから電解研磨モードに変えて電極表
面を研磨して気孔を消滅させる。そして、気孔がほとん
ど無くなったか、消滅したことが観察されたときには再
度極性を変えて電着モードにする。このように電着と研
磨とを繰り返しながらメッキ処理を行うことにより均質
で良好なメッキを行うことができる。もちろん、電圧発
生器24に代えて電流発生器を使用してもよい。
When it is recognized that pores are generated on the electrode surface, for example, by observing the electrode surface with a monitor and performing image processing, the computer 23 controls the voltage generator 24 to control the voltage generator 24 as shown in FIG. Then, the polarity of the voltage applied to the electrode is changed, and the electrode surface is polished by changing from the electrodeposition mode to the electropolishing mode to eliminate pores. When it is observed that the pores have almost disappeared or disappeared, the polarity is changed again and the electrodeposition mode is set. By performing plating while repeating electrodeposition and polishing in this manner, uniform and favorable plating can be performed. Of course, a current generator may be used instead of the voltage generator 24.

また、気泡の発生は均一なメッキを行うために重要な
要素であるので、気泡の発生位置、数、大きさ、成長速
度等もデータとして取り込み、コンピュータで即時に画
像処理し、電極状態を判断する情報として用い、直ちに
フィードバックして電流波形を変えるようにする。この
場合、電圧または電流波形はコンピュータが合成して発
生させるので、所望の特性を持つ電気メッキが可能にな
る。なお、発生した気泡を放置しておくと金属表面には
大きな気孔が生じてしまうので、気泡発生後早い段階で
除去する必要がある。そのために、画像処理結果により
気泡の発生が認識された場合には前述した水流ポンプや
スクリュウにフィードバックをかけて駆動したり、図示
は省略するが超音波の利用や電極への振動付与を行い、
或いはこれらの方法を併用するなどして早期に気泡を除
去することが望ましい。
In addition, since the generation of bubbles is an important factor for uniform plating, the position, number, size, growth rate, etc., of the bubbles are also captured as data and immediately processed by a computer to determine the electrode state. The current waveform is changed and the current waveform is changed immediately by feedback. In this case, since the voltage or current waveform is synthesized and generated by a computer, electroplating having desired characteristics can be performed. If the generated bubbles are left untreated, large pores are formed on the metal surface, so it is necessary to remove the bubbles at an early stage after the generation of the bubbles. Therefore, when the generation of air bubbles is recognized as a result of the image processing, the above-described water flow pump or screw is driven with feedback, or the use of ultrasonic waves or the application of vibration to electrodes (not shown) is performed,
Alternatively, it is desirable to remove bubbles early by using these methods in combination.

また、陽極に電解メッキ用の金属片を複数個用意し、
異なった種類の金属を制御して多層膜として電着させる
ことも可能である。
Also, prepare a plurality of metal pieces for electrolytic plating on the anode,
It is also possible to control different types of metals and electrodeposit them as a multilayer film.

このように電極表面を観察し、さらに画像処理して表
面の状態を分析することを併用して電極へ供給する電圧
または電流を変えることにより、最適な状態で自動的に
メッキ処理を行うことが可能となる。
By changing the voltage or current supplied to the electrode in combination with observing the electrode surface and analyzing the surface state by further image processing, the plating process can be performed automatically in the optimum state. It becomes possible.

なお、上記説明では電気メッキについて説明したが、
水素吸蔵の場合も同様であり、したがって、最近話題の
「低温核融合」の陰極電極の表面状態や水素貯蔵用金属
または合金の表面状態を、電解水素吸蔵中に連続的に観
察できる点でも有効である。この場合にパラジウム金属
では水素化パラジウム等の水素化物相や、金属表面の盛
り上がり(ブリスタリング)、剥離(フレーク)および
その位置から気泡発生等が連続的にビデオに録画でき
る。電解水素吸蔵による水素脆性防止法の基礎的研究に
も有効である。
In the above description, electroplating has been described.
The same is true for hydrogen storage, and therefore it is also effective in that the surface state of the cathode electrode and the surface state of the metal or alloy for hydrogen storage, which has recently been talked about, can be continuously observed during electrolytic hydrogen storage. It is. In this case, in the case of palladium metal, a hydride phase such as palladium hydride, swelling (blistering), peeling (flakes) of the metal surface, and generation of bubbles from the position can be continuously recorded on a video. It is also effective for basic research on hydrogen embrittlement prevention by electrolytic hydrogen storage.

〔発明の効果〕〔The invention's effect〕

以上のように本発明によれば通電しながら電極の表面
を観察することができ、陰極においては水素吸蔵やメッ
キ状態を観察し、陽極においては陽極材料の酸化の状態
を観察することができる。また、TVカメラ等で連続的に
撮像して画像処理し、処理結果に応じて電極への供給電
圧または電流を制御したり、気泡除去の対策を講じるこ
とにより、自動的に均一かつ良質なメッキを行うことが
可能となる。
As described above, according to the present invention, it is possible to observe the surface of the electrode while energizing, observe the hydrogen occlusion and plating state at the cathode, and observe the oxidation state of the anode material at the anode. In addition, by automatically capturing images with a TV camera and performing image processing, controlling the supply voltage or current to the electrodes according to the processing results, and taking measures to remove air bubbles, automatically uniform and high-quality plating Can be performed.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の電解メッキ装置における要部断面図、
第2図は電解メッキ装置の全体構成を示す図、第3図は
波形図である。 1……光学顕微鏡、2……鏡筒、3……対物レンズ、4
……電解槽、5……電解液、6……メッキ基板、7……
白金電極、8……カバーガラス、9……水流ポンプ、10
……熱電対、11……気泡、21……ビデオカメラ、22……
モニタ、23……コンピュータ、24……電圧発生器。
FIG. 1 is a sectional view of a main part of an electrolytic plating apparatus according to the present invention,
FIG. 2 is a diagram showing the overall configuration of the electrolytic plating apparatus, and FIG. 3 is a waveform diagram. 1 ... optical microscope, 2 ... barrel, 3 ... objective lens, 4
... electrolytic bath, 5 ... electrolytic solution, 6 ... plating substrate, 7 ...
Platinum electrode, 8 Cover glass, 9 Water pump, 10
…… Thermocouple, 11 …… Bubble, 21 …… Video camera, 22 ……
Monitor, 23 ... Computer, 24 ... Voltage generator.

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電解液を満たした電解槽内に配置した陽極
と陰極間に通電し、顕微鏡により電極表面の変化を連続
的に観察する装置であって、顕微鏡を通して電極表面を
撮像する手段と、撮像して得られた画像情報を処理する
画像処理手段とを備え、通電しつつ電極表面状態を観察
することを特徴とする電解メッキ電極観察装置。
An apparatus for continuously observing a change in an electrode surface with a microscope by applying a current between an anode and a cathode disposed in an electrolytic cell filled with an electrolyte, and means for imaging the electrode surface through a microscope. And an image processing means for processing image information obtained by imaging, and observing the state of the electrode surface while applying power.
【請求項2】電解液を満たした電解槽内に配置した陽極
と陰極間に通電し、顕微鏡を通して電極表面を撮像する
撮像手段と、撮像して得られた画像情報を処理する画像
処理手段と、画像処理結果に応じて電極へ供給する電圧
または電流が制御される手段とを備えたことを特徴とす
る自動メッキ装置。
2. An imaging device for energizing between an anode and a cathode disposed in an electrolytic cell filled with an electrolytic solution and imaging an electrode surface through a microscope, and an image processing device for processing image information obtained by imaging. Means for controlling the voltage or current supplied to the electrodes according to the image processing result.
【請求項3】陽極は異なる複数の金属からなる請求項1
または2記載の装置。
3. An anode comprising a plurality of different metals.
Or the apparatus according to 2.
JP15274689A 1989-06-15 1989-06-15 Electroplating electrode observation and automatic plating equipment Expired - Fee Related JP2725249B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15274689A JP2725249B2 (en) 1989-06-15 1989-06-15 Electroplating electrode observation and automatic plating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15274689A JP2725249B2 (en) 1989-06-15 1989-06-15 Electroplating electrode observation and automatic plating equipment

Publications (2)

Publication Number Publication Date
JPH0320500A JPH0320500A (en) 1991-01-29
JP2725249B2 true JP2725249B2 (en) 1998-03-11

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Country Link
JP (1) JP2725249B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
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JP2018009879A (en) * 2016-07-13 2018-01-18 国立大学法人九州大学 Observation device of electrode surface, and observation method using the same

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WO2015035528A1 (en) * 2013-09-13 2015-03-19 New Tech Copper Spa. Portable and submersible viewing device for viewing the interior of electrolytic cells
JP7225980B2 (en) * 2019-03-20 2023-02-21 住友金属鉱山株式会社 Observation device for electrolytic cell
CN119194572A (en) * 2024-11-13 2024-12-27 江西华创新材有限公司 An electrochemical device capable of in-situ observation of electrolytic copper foil deposition process

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018009879A (en) * 2016-07-13 2018-01-18 国立大学法人九州大学 Observation device of electrode surface, and observation method using the same

Also Published As

Publication number Publication date
JPH0320500A (en) 1991-01-29

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