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JP2734065B2 - Pass / fail judgment method of preliminary test in reflow - Google Patents
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JP2734065B2 - Pass / fail judgment method of preliminary test in reflow - Google Patents

Pass / fail judgment method of preliminary test in reflow

Info

Publication number
JP2734065B2
JP2734065B2 JP1055465A JP5546589A JP2734065B2 JP 2734065 B2 JP2734065 B2 JP 2734065B2 JP 1055465 A JP1055465 A JP 1055465A JP 5546589 A JP5546589 A JP 5546589A JP 2734065 B2 JP2734065 B2 JP 2734065B2
Authority
JP
Japan
Prior art keywords
reflow
pass
temperature
curve
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1055465A
Other languages
Japanese (ja)
Other versions
JPH02234491A (en
Inventor
雅夫 日高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1055465A priority Critical patent/JP2734065B2/en
Publication of JPH02234491A publication Critical patent/JPH02234491A/en
Application granted granted Critical
Publication of JP2734065B2 publication Critical patent/JP2734065B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はリフローにおける予備テストの合否判定方法
に関し、加熱室内を搬送される基板の温度変化の測定結
果を表示する記録紙などの表示部に、測定結果ととも
に、許容巾を有する合否判定曲線を表示することによ
り、合否判定を簡単に行えるようにしたものである。
Description: BACKGROUND OF THE INVENTION The present invention relates to a pass / fail judgment method of a preliminary test in reflow, and relates to a display unit such as a recording paper for displaying a measurement result of a temperature change of a substrate conveyed in a heating chamber. By displaying a pass / fail judgment curve having an allowable width together with the measurement results, the pass / fail judgment can be easily performed.

(従来の技術) ペースト状半田により、ICチップ,LSIチップ,抵抗チ
ップ,コンデンサチップ等の電子部品が搭載された基板
は、リフロー装置へ送られ、ペースト状半田の加熱処理
が行われる。この加熱処理には、温度条件や温度勾配な
どの処理条件があり、例えば温度が高すぎるとICやLSI
などは熱破壊され、また温度が低すぎると、半田は十分
に硬化しないこととなる。かかる処理条件は、基板,電
子部品,半田等の種類、或いは電子部品の実装密度など
によって異るものであり、したがって実装基板の品種が
変更される場合には、処理条件も変更しなければならな
い。
(Prior Art) A board on which electronic components such as an IC chip, an LSI chip, a resistor chip, and a capacitor chip are mounted by the paste solder is sent to a reflow device, and the paste solder is heated. This heat treatment has processing conditions such as temperature conditions and temperature gradients. For example, if the temperature is too high, IC or LSI
Etc. are thermally destroyed, and if the temperature is too low, the solder will not be sufficiently cured. Such processing conditions vary depending on the type of the board, electronic components, solder, etc., or the mounting density of the electronic components. Therefore, when the type of the mounting substrate is changed, the processing conditions must also be changed. .

このため、リフロー装置により本格的な加熱処理を行
うに先立ち、一般に予備テストが行われる、従来、この
予備テストは、リフロー装置のヒータの温度、基板搬送
コンベヤの速度、基板に熱風や冷風を吹付けるファンの
回転速度などを適当に設定するとともに、サンプル基板
に感温センサを装着し、このサンプル基板を加熱室内を
搬送して行われ、その結果を記録紙に記録して合否を判
定するようになっていた。
For this reason, a preliminary test is generally performed before a full-scale heating process is performed by the reflow device. Conventionally, this preliminary test is performed by blowing hot air or cold air onto the substrate, the temperature of the heater of the reflow device, the speed of the substrate transport conveyor, and the substrate. In addition to appropriately setting the rotation speed of the fan to be attached, a temperature sensor is mounted on the sample substrate, the sample substrate is transported in a heating chamber, and the result is recorded on a recording paper to determine whether the result is acceptable. Had become.

第5図は上記のようにして記録紙に記録された温度曲
線を示すものであって、上記合否の判定は、このグラフ
にスケールを当てて、予熱部,均熱部,リフロー部,冷
却部の温度や時間,或いは予熱部の立上り勾配や冷却部
の立下り勾配等の温度勾配を測ることにより行われてい
た。
FIG. 5 shows the temperature curve recorded on the recording paper as described above. The pass / fail judgment is made by applying a scale to this graph and determining whether the preheating section, the soaking section, the reflow section, and the cooling section. Temperature or time, or a temperature gradient such as a rising gradient of a preheating portion or a falling gradient of a cooling portion.

(発明が解決しようとする課題) しかしながら上記従来手段は、記録紙にスケールを当
てて温度曲線を測ることにより、合否の判断を行うもの
であるため、合否判定作業はきわめてわずらわしく、合
否判断に多大な手間と時間を要するものであった。
(Problems to be Solved by the Invention) However, the above-mentioned conventional means determines pass / fail by measuring the temperature curve by applying a scale to the recording paper. It took a lot of trouble and time.

殊に上記合否判断で“否”となった場合には、ヒータ
の温度,コンベヤやファンの速度等を調整し直し、再度
サンプル基板によるテストを行わねばならず、かかる予
備テストは“合”の判定が得られるまで繰り返し行わね
ばならないため、きわめて多大な時間と手間を要するも
のであった。
In particular, if the result of the above pass / fail judgment is "No", the temperature of the heater, the speed of the conveyor and the fan, etc. must be readjusted and the test using the sample substrate must be performed again. Since it has to be repeated until a judgment is obtained, an extremely large amount of time and labor is required.

したがって本発明は、簡単にリフローの予備テストの
合否判定ができる方法を提供することを目的とする。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a method capable of easily determining whether or not a reflow preliminary test is successful.

(課題を解決するための手段) このために本発明は、ペースト状半田により電子部品
が実装された基板に感温センサを装着し、この基板をリ
フロー装置の加熱室内を搬送しながら、この基板の温度
変化を測定して、その測定結果を記録表示装置の表示部
に表示するにあたり、上部表示部に、上記測定による上
記基板の温度変化曲線とともに、許容巾を有する帯状の
合否判定曲線を表示するようにし、かつこの合否判定曲
線が、予熱部と、均熱部と、リフロー部と、冷却部とを
有し、これらの4つの部分の許容巾を、要求される条件
の厳しさに応じて設定するようにし、このうちリフロー
部の許容巾を予熱部および均熱部の許容巾よりも狭くし
たものである。
(Means for Solving the Problems) For this purpose, the present invention provides a method in which a temperature sensor is mounted on a board on which electronic components are mounted by paste-like solder, and the board is transported through a heating chamber of a reflow apparatus. When the temperature change of the substrate is measured and the measurement result is displayed on the display unit of the recording display device, a band-shaped pass / fail judgment curve having an allowable width is displayed on the upper display unit together with the temperature change curve of the substrate by the above measurement. And the pass / fail judgment curve has a preheating section, a soaking section, a reflow section, and a cooling section, and the allowable width of these four sections is determined according to the strictness of required conditions. The allowable width of the reflow section is narrower than the allowable width of the preheating section and the soaking section.

(作用) 上記構成において、合否の判定は、測定された温度曲
線の合否判定曲線からのずれ具合を見ることにより行
う。この場合、温度曲線の良否は予熱部、均熱部、リフ
ロー部毎に判定するが、リフローの良否は殊にリフロー
部の温度管理の適否に左右されるので、リフロー部の許
容巾を狭くしてその合否判定を厳格に行う。
(Operation) In the above configuration, the pass / fail judgment is made by checking the degree of deviation of the measured temperature curve from the pass / fail judgment curve. In this case, the quality of the temperature curve is determined for each of the preheating section, the soaking section, and the reflow section. However, since the quality of the reflow depends particularly on the appropriateness of the temperature control of the reflow section, the allowable width of the reflow section is reduced. Strictly make a pass / fail decision.

(実施例) 次に、図面を参照しながら本発明の実施例を説明す
る。
Example Next, an example of the present invention will be described with reference to the drawings.

第1図はリフロー装置の側面図であって、1は加熱
室、2は基板3を加熱室1内を搬送するコンベヤであ
る。加熱室1内には、ヒートブロックのようなヒータH1
〜H9がコンベヤ2上の基板3の上方と下方に配設されて
いる。また基板3の上方には、基板3に熱風を吹き付け
るファンF1〜F3と、加熱室1の出口近くにあって基板3
に冷風を吹き付ける冷却ファンF4が配設されている。
FIG. 1 is a side view of the reflow apparatus, wherein 1 is a heating chamber, and 2 is a conveyor for transporting the substrate 3 in the heating chamber 1. In the heating chamber 1, a heater H1 such as a heat block is provided.
To H9 are disposed above and below the substrate 3 on the conveyor 2. Above the substrate 3, fans F1 to F3 for blowing hot air onto the substrate 3 and the substrate 3 near the outlet of the heating chamber 1 are provided.
A cooling fan F4 that blows cold air is provided.

第2図は予備テストに供されるサンプル基板3を示す
ものであって、その上面には電子部品Pがペースト状半
田4により搭載されている。5(5a〜5c)は基板3の上
面に装着された感温センサとしての熱電対であって、基
板3の中央部と両側部に接着テープ6により装着されて
いる。本実施例は、3つの感温センサ5a〜5cにより、基
板3の3点の温度変化を測定するものであるが、感温セ
ンサの数は任意であり、その数を多くする程、基板3の
多数の点の温度変化を測定して、木目細かい合否判定を
行うことができる。
FIG. 2 shows a sample substrate 3 to be subjected to a preliminary test, on which an electronic component P is mounted by a paste solder 4. Reference numerals 5 (5a to 5c) denote thermocouples as temperature-sensitive sensors mounted on the upper surface of the substrate 3, which are mounted on the central portion and both side portions of the substrate 3 with an adhesive tape 6. In the present embodiment, three temperature sensors 5a to 5c are used to measure the temperature changes at three points on the substrate 3. However, the number of temperature sensors is arbitrary. By measuring the temperature changes at a number of points, a fine pass / fail decision can be made.

第1図に示すように、この感温センサ5a〜5cは、A/D
変換器11を介してコンピュータ12に接続されており、ま
たコンピュータ12には表示装置としてのプリンタ13が接
続されており、表示部としての記録紙14に感温センサ5a
〜5cにより測定された温度変化曲線が記録される。なお
表示装置としてはCRTのような画像装置でもよい。
As shown in FIG. 1, the temperature sensors 5a to 5c
It is connected to a computer 12 via a converter 11, and a printer 13 as a display device is connected to the computer 12, and a recording paper 14 as a display unit is attached to a temperature sensor 5a.
The temperature change curve measured by ~ 5c is recorded. Note that the display device may be an image device such as a CRT.

第3図は制御ブロック図であって、上記各ファンF1〜
F4及びコンベヤ2を駆動するモータM1〜M5の制御部A1〜
A5と、各ヒータH1〜H9の制御部B1〜B9は、コンピュータ
12に接続されており、各機器F1〜F4,2,H1〜H9は、コン
ピュータ12による一括集中制御と、単独の制御が選択的
に行えるようになっている。
FIG. 3 is a control block diagram showing each of the fans F1 to F3.
Controllers A1 to F4 and motors M1 to M5 for driving conveyor 2
A5 and the control units B1 to B9 of the heaters H1 to H9 are connected to a computer.
The devices F1 to F4, 2, and H1 to H9 are selectively connected to the centralized control by the computer 12 or can be independently controlled.

第4図は、上記基板3を加熱室1内を搬送させて得ら
れた記録紙14の温度曲線をグラフ表示するものであっ
て、a,b,cはそれぞれ各センサ5a,5b,5cの温度曲線であ
る。またNは帯状の合否判定曲線であって、作業者は温
度曲線a〜cとこの曲線Nのずれの具合から合否の判定
をする。この曲線Nは、予熱部,均熱部,リフロー部
(半田溶融部),冷却部から成っており、かつ曲線Nの
巾D1,D2,D3は各部の許容巾を意味している。因みに、こ
の曲線Nは、例えば次のようなファクターを基にして設
定される。
FIG. 4 is a graph showing a temperature curve of the recording paper 14 obtained by transporting the substrate 3 in the heating chamber 1, wherein a, b, and c indicate the respective sensors 5a, 5b, and 5c. It is a temperature curve. N is a band-shaped pass / fail judgment curve, and the operator judges pass / fail based on the degree of deviation between the temperature curves a to c and the curve N. The curve N includes a preheating section, a soaking section, a reflow section (solder melting section), and a cooling section, and the widths D1, D2, and D3 of the curve N mean allowable widths of the respective sections. Incidentally, the curve N is set based on the following factors, for example.

(1)予熱部の立ち上りの勾配(150℃まで毎秒2.2℃上
昇) (2)均熱部の温度と時間(150℃〜170℃を60〜75秒継
続) (3)リフロー部の温度とその時間、殊に最高温度(20
0℃以上20秒以内、220℃以上10秒以下、最高225℃) (4)冷却部の立下り勾配(140℃まで毎秒2〜3℃下
降) 勿論これらのファクターは、基板,半田,電子部品の
種類等により異る。また上記(1)〜(4)のファクタ
ーのうち、殊にリフロー部に関する(3)のファクター
がきわめて重要である。このため、図から明らかなよう
に、リフローの許容巾D3は狭く、その合否判定は厳格に
行われる。また相当の温度のばらつきが許容され予熱
部,均熱部の巾D2,D3はかなり大きく設定されている。
このように要求される条件の厳しさに応じて、曲線Nの
許容巾Dを設定する。
(1) Rising slope of preheating section (2.2 ° C / sec up to 150 ° C) (2) Temperature and time of soaking section (150 ° C to 170 ° C continued for 60 to 75 seconds) (3) Temperature of reflow section and its Time, especially the highest temperature (20
(0 ° C or more and 20 seconds or less, 220 ° C or more and 10 seconds or less, maximum 225 ° C) (4) Falling slope of cooling part (2-3 ° C / sec down to 140 ° C) Of course, these factors are for board, solder, and electronic components Depends on the type of Among the factors (1) to (4), the factor (3) relating to the reflow section is particularly important. Therefore, as is clear from the figure, the allowable width D3 of the reflow is narrow, and the pass / fail judgment is strictly performed. Also, considerable temperature variation is allowed, and the widths D2 and D3 of the preheating section and the soaking section are set to be considerably large.
The allowable width D of the curve N is set according to the strictness of the required conditions.

上記テスト結果が“合”と判定されると、続いて本格
的なリフローが行われる。また“否”と判定されると、
ヒータH1〜H9の温度やコンベヤ2,ファンF1〜F5の速度を
調整し直し、再度上記テストが行われる。このテスト
は、“合”の判定が得られるまで、繰り返し行われる。
なお合否の判定基準は任意であるが、例えばリフロー部
においては、曲線Nから僅かにずれていても、“否”と
判定するのが望ましく、またリフロー部以外において
は、少々ずれていても“合”と判定してよい。また上記
予備テストは、本格的なリフローに先立って行われるも
のであるが、本格的なリフローを行っている際中にも、
リフローが正常に行われているかどうかをチェックする
ために適宜サンプル基板を抽出して行ってもよい。
If the test result is determined to be “OK”, then a full-fledged reflow is performed. If it is determined as “No”,
The temperatures of the heaters H1 to H9 and the speeds of the conveyor 2 and the fans F1 to F5 are readjusted, and the above test is performed again. This test is repeatedly performed until a "Pass" judgment is obtained.
The criteria for the pass / fail is arbitrary. For example, in the reflow section, it is desirable to determine “No” even if the curve N is slightly deviated from the curve N. "". The preliminary test is performed prior to full-scale reflow, but during full-scale reflow,
In order to check whether reflow is performed normally, a sample substrate may be appropriately extracted and performed.

また上記テストのデータは、コンピュータ12のデータ
ベースとして蓄積され、長期間の間に、多種多用な基板
に関するデータが蓄積されることとなる。したがって新
規な基板が現出したときには、データベースの中からそ
の基板に最も近似するデータを抽出し、そのデータに基
いて上記機器M1〜M5,2、H1〜H9を制御することにより、
より高い確率で“合”の結果が得られることとなり、そ
れだけ試行錯誤による予備テストの無駄な繰り返しをな
くすことができる。
The test data is stored as a database of the computer 12, and data relating to various types of substrates is stored over a long period of time. Therefore, when a new board appears, by extracting the data closest to the board from the database, and controlling the devices M1 to M5, 2, H1 to H9 based on the data,
As a result, the result of "go" is obtained with a higher probability, so that unnecessary repetition of the preliminary test by trial and error can be eliminated.

(発明の効果) 本発明によれば、リフローの予備テストの合否の判定
をきわめて簡単かつ正確に行うことができる。また温度
曲線の良否は予熱部、均熱部、リフロー部毎に判定する
が、リフローの良否は殊にリフロー部の温度管理の適否
に左右されるので、リフロー部の許容巾を狭くしてその
合否判定を厳格に行うことにより、信頼性の高い合否判
定を行うことができる。
(Effects of the Invention) According to the present invention, it is possible to determine whether pass / fail of the reflow preliminary test is extremely simple and accurate. Although the quality of the temperature curve is determined for each of the preheating section, the soaking section, and the reflow section, the quality of the reflow depends on the appropriateness of the temperature control of the reflow section in particular. By strictly performing the pass / fail determination, a highly reliable pass / fail determination can be performed.

【図面の簡単な説明】[Brief description of the drawings]

図は本発明の実施例を示すものであって、第1図はリフ
ロー装置の側面図、第2図は基板の斜視図、第3図はブ
ロック図、第4図は温度曲線図、第5図は従来手段の温
度曲線図である。 1……加熱室 3……基板 4……ペースト状半田 13……記録表示装置 14……記録表示部 P……電子部品 5a〜5c……感温センサ
1 shows an embodiment of the present invention. FIG. 1 is a side view of a reflow device, FIG. 2 is a perspective view of a substrate, FIG. 3 is a block diagram, FIG. 4 is a temperature curve diagram, and FIG. The figure is a temperature curve diagram of the conventional means. DESCRIPTION OF SYMBOLS 1 ... Heating chamber 3 ... Substrate 4 ... Paste solder 13 ... Record display device 14 ... Record display part P ... Electronic components 5a-5c ... Temperature sensor

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】ペースト状半田により電子部品が実装され
た基板に感温センサを装着し、この基板をリフロー装置
の加熱室内を搬送しながら、この基板の温度変化を測定
して、その測定結果を記録表示装置の表示部に表示する
にあたり、上部表示部に、上記測定による上記基板の温
度変化曲線とともに、許容巾を有する帯状の合否判定曲
線を表示するようにし、かつこの合否判定曲線が、予熱
部と、均熱部と、リフロー部と、冷却部とを有し、これ
らの4つの部分の許容巾を、要求される条件の厳しさに
応じて設定するようにし、このうちリフロー部の許容巾
を予熱部および均熱部の許容巾よりも狭くすることを特
徴とするリフローにおける予備テストの合否判定方法。
A temperature sensor is mounted on a board on which electronic components are mounted by solder paste, and a temperature change of the board is measured while transporting the board in a heating chamber of a reflow device. In displaying on the display unit of the recording display device, the upper display unit, along with the temperature change curve of the substrate by the above measurement, to display a band-shaped pass / fail determination curve having an allowable width, and the pass / fail determination curve, It has a preheating part, a soaking part, a reflow part, and a cooling part, and the allowable width of these four parts is set according to the strictness of the required conditions. A pass / fail judgment method for a preliminary test in reflow, characterized in that the allowable width is narrower than the allowable widths of the preheating section and the soaking section.
JP1055465A 1989-03-08 1989-03-08 Pass / fail judgment method of preliminary test in reflow Expired - Fee Related JP2734065B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1055465A JP2734065B2 (en) 1989-03-08 1989-03-08 Pass / fail judgment method of preliminary test in reflow

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1055465A JP2734065B2 (en) 1989-03-08 1989-03-08 Pass / fail judgment method of preliminary test in reflow

Publications (2)

Publication Number Publication Date
JPH02234491A JPH02234491A (en) 1990-09-17
JP2734065B2 true JP2734065B2 (en) 1998-03-30

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