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JP2736105B2 - Semiconductor laser device - Google Patents
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JP2736105B2 - Semiconductor laser device - Google Patents

Semiconductor laser device

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Publication number
JP2736105B2
JP2736105B2 JP4941589A JP4941589A JP2736105B2 JP 2736105 B2 JP2736105 B2 JP 2736105B2 JP 4941589 A JP4941589 A JP 4941589A JP 4941589 A JP4941589 A JP 4941589A JP 2736105 B2 JP2736105 B2 JP 2736105B2
Authority
JP
Japan
Prior art keywords
semiconductor laser
wavelength
light
laser
polarization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP4941589A
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Japanese (ja)
Other versions
JPH02228625A (en
Inventor
茂 大島
美都子 中村
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Toshiba Corp
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Toshiba Corp
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Priority to JP4941589A priority Critical patent/JP2736105B2/en
Publication of JPH02228625A publication Critical patent/JPH02228625A/en
Application granted granted Critical
Publication of JP2736105B2 publication Critical patent/JP2736105B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) この発明は、コヒーレント光通信に利用可能な半導体
レーザ装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Field of Industrial Application) The present invention relates to a semiconductor laser device that can be used for coherent optical communication.

(従来の技術) 一般にコヒーレント光通信に用いられる半導体レーザ
装置では、半導体レーザの光電力及び発振波長(発振周
波数)を検出し、その検出出力に基づいて半導体レーザ
の発振出力を制御することによってレーザ光の安定化を
図っている。第4図に従来装置の構成を示す。
(Prior Art) In a semiconductor laser device generally used for coherent optical communication, the laser power is detected by detecting the optical power and oscillation wavelength (oscillation frequency) of the semiconductor laser and controlling the oscillation output of the semiconductor laser based on the detected output. Light is stabilized. FIG. 4 shows the configuration of a conventional apparatus.

第4図において、11は半導体レーザで、この半導体レ
ーザ11の前方から出射されたレーザ光は光学レンズ12,1
3によって伝送用の光ファイバ14の端部に集光され、後
方から出射されたレーザ光は光学レンズ15によって平行
光に変換された後、ビームスプリッタ16で2系統に分岐
される。このうち、一方のレーザ光は光学レンズ17によ
って第1の光検出器18に集光され、その検出出力によっ
てレーザ光の光電力をモニタできるようになっている。
他方のレーザ光は、光軸方向に長さLだけ離間されて平
行に対向配置された反射鏡19,20からなるファブリペロ
共振器に入射される。この共振器レーザ光に特定の周波
数で共振して半導体レーザ11の発振波長を安定化させる
もので、ここを透過したレーザ光は光学レンズ21によっ
て第2の光検出器22に集光され、その検出出力によって
レーザ光の波長をモニタすることができるようになって
いる。
In FIG. 4, reference numeral 11 denotes a semiconductor laser, and a laser beam emitted from the front of the semiconductor laser 11 is an optical lens 12,1.
The laser light condensed on the end of the transmission optical fiber 14 by 3 and emitted from the rear is converted into parallel light by the optical lens 15 and then split by the beam splitter 16 into two systems. One of the laser beams is condensed on the first photodetector 18 by the optical lens 17, and the optical power of the laser beam can be monitored based on the detection output.
The other laser beam is made incident on a Fabry-Perot resonator comprising reflecting mirrors 19 and 20 which are spaced apart by a length L in the optical axis direction and arranged in parallel and opposed to each other. The resonator laser light resonates at a specific frequency to stabilize the oscillation wavelength of the semiconductor laser 11, and the laser light transmitted therethrough is condensed by the optical lens 21 on the second photodetector 22, The wavelength of the laser beam can be monitored by the detection output.

ところで、上記ファブリペロ共振器は、その透過光が
C/(2nL)で定まる自由スペクトル間隔を周期として出
力される。尚、Cは光速、nはファブリペロ共振器中の
屈折率、Lは反射鏡間の距離を表わしている。第5図に
周波数対透過光強度特性を示す。
By the way, in the above Fabry-Perot resonator, the transmitted light is
Output with the free spectral interval determined by C / (2nL) as the cycle. C represents the speed of light, n represents the refractive index in the Fabry-Perot resonator, and L represents the distance between the reflecting mirrors. FIG. 5 shows frequency versus transmitted light intensity characteristics.

しかしながら、上記のような従来の半導体レーザ装置
は以下のような問題を有する。
However, the conventional semiconductor laser device as described above has the following problems.

今、第5図において、A点を共振周波数とするように
フィードバック系を構築したとすると、半導体レーザ11
が電源投入時にaの範囲の周波数で発振しなければ、フ
ァブリペロ共振器はA点にレーザ光の周波数を引込むこ
とができない。すなわち、通常のファブリペロ共振器で
は設定周波数が引込み可能な周波数帯域の中心にないた
め、安定したレーザ光の波長制御を行ない難い。また、
設定周波数を任意に定めるためには、ファブリペロ共振
器の距離Lをサブミクロンの精度で微調整するか、ファ
ブリペロ共振器への入射角度を微調整するかしなければ
ならない。前者はピエゾ素子を用いて実現できるが、微
調整後の安定性に問題がある。後者は入射角度を変化さ
せるため、フィネスも変化してしまうという問題があ
る。つまり、従来の半導体レーザ装置では設定周波数を
調整するのが難しかった。
Now, assuming that a feedback system is constructed so that point A has a resonance frequency in FIG.
If the laser does not oscillate at a frequency in the range a when the power is turned on, the Fabry-Perot resonator cannot pull the frequency of the laser beam to the point A. That is, in a normal Fabry-Perot resonator, the set frequency is not at the center of the pull-in frequency band, so that it is difficult to perform stable wavelength control of laser light. Also,
In order to arbitrarily determine the set frequency, it is necessary to finely adjust the distance L of the Fabry-Perot resonator with submicron accuracy or to finely adjust the incident angle on the Fabry-Perot resonator. The former can be realized using a piezo element, but has a problem in stability after fine adjustment. The latter has a problem that the finesse also changes because the angle of incidence is changed. That is, it was difficult to adjust the set frequency in the conventional semiconductor laser device.

(発明が解決しようとする課題) 以上述べたように従来の半導体レーザ装置では、レー
ザ光の設定周波数がファブリペロ共振器の引込み可能な
周波数帯域の中心にないため、波長制御を安定して行な
うことが困難であり、設定周波数の微調整が容易でな
い。
(Problems to be Solved by the Invention) As described above, in the conventional semiconductor laser device, since the set frequency of the laser beam is not at the center of the frequency band in which the Fabry-Perot resonator can be pulled, it is necessary to stably control the wavelength. And it is not easy to fine-tune the set frequency.

この発明は上記の問題を解決するためになされたもの
で、レーザ光の設定周波数の微調整を簡単に行なうこと
のできる半導体レーザ装置を提供することを目的とす
る。
SUMMARY OF THE INVENTION The present invention has been made to solve the above problem, and has as its object to provide a semiconductor laser device that can easily perform fine adjustment of a set frequency of laser light.

[発明の構成] (課題を解決するための手段) 上記目的を達成するためにこの発明に係る半導体レー
ザ装置は、発振波長を制御可能な半導体レーザと、この
半導体レーザで発生されるレーザ光を2系統以上に分岐
する分岐手段と、この分岐手段で分岐された一方のレー
ザ光から光電力を検出する光電力検出部と、前記分岐手
段で分岐された他方のレーザ光をレーザ光の波長により
楕円率が変わる楕円偏光に変換する第1の偏光変換手段
と、この手段を透過したレーザ光を直線偏光に変換する
第2の偏光変換手段と、この手段を透過したレーザ光の
波長変化を偏光角度に応じて光電力変化に変換する偏光
ビームスプリッタと、この偏光ビームスプリッタを透過
したレーザ光を受光してレーザ光の光電力を検出し、そ
の検出結果からレーザ光の波長変化を読取る波長検出部
と、前記光電力検出部及び波長検出部の各検出結果に基
づいて前記半導体レーザの発振を制御する制御手段とを
具備したことを特徴とする。
[Structure of the Invention] (Means for Solving the Problems) In order to achieve the above object, a semiconductor laser device according to the present invention includes a semiconductor laser capable of controlling an oscillation wavelength, and a laser beam generated by the semiconductor laser. A branching unit that branches into two or more systems, an optical power detection unit that detects optical power from one of the laser beams branched by the branching unit, and the other laser beam that is branched by the branching unit according to the wavelength of the laser beam. First polarization converting means for converting elliptical polarization into elliptically polarized light, second polarization converting means for converting laser light transmitted through this means into linearly polarized light, and polarization change of laser light transmitted through this means. A polarizing beam splitter that converts the optical power into a change in optical power according to the angle, receives the laser beam transmitted through the polarizing beam splitter, detects the optical power of the laser beam, and detects the And a wavelength detecting section for reading the length change, characterized by comprising a control means for controlling the oscillation of the semiconductor laser on the basis of the detection results of the optical power detector and the wavelength detector.

(作用) 上記構成の半導体レーザ装置によれば、半導体レーザ
の発振出力を2系統に分岐して、一方を第1の光電力検
出手段に導いて光電力を検出し、他方を第1の偏光変換
手段によって楕円偏波に偏光し、第2の偏光変換手段に
よって直線偏波に変換し、偏光ビームスプリッタで波長
変化を光電力変化に変換した後、その偏波面を捕えて波
長変化を検出し、光電力及び波長の各検出結果に基づい
て半導体レーザの発振を制御するので、レーザ光を容易
に安定化することができ、さらに偏光ビームスプリッタ
の偏光角度を変えることによって半導体レーザの発振波
長を容易に微調整することができる。
(Operation) According to the semiconductor laser device having the above configuration, the oscillation output of the semiconductor laser is branched into two systems, one of which is guided to the first optical power detection means to detect the optical power, and the other is the first polarized light. The light is polarized into elliptically polarized light by the conversion means, converted into linearly polarized light by the second polarization conversion means, and the wavelength change is converted into the optical power change by the polarization beam splitter. Since the oscillation of the semiconductor laser is controlled based on the detection results of the optical power and the wavelength, the laser beam can be easily stabilized, and the oscillation wavelength of the semiconductor laser can be changed by changing the polarization angle of the polarization beam splitter. It can be fine-tuned easily.

(実施例) 以下、第1図乃至第3図を参照してこの発明の一実施
例を説明する。但し、第1図において第4図と同一部分
には同一符号を付して示し、ここではその説明を省略す
る。
(Embodiment) An embodiment of the present invention will be described below with reference to FIGS. However, in FIG. 1, the same parts as those in FIG. 4 are denoted by the same reference numerals, and description thereof is omitted here.

第1図はその構成を示すもので、ここで用いる半導体
レーザ11は外部からの制御電圧によってその発振波長を
制御可能なものとする。この半導体レーザ11の前方から
出射されたレーザ光は第4図と同様に光ファイバ14に入
射され、後方から出射されたレーザ光は第4図と同様に
ビームスプリッタ16によって2系統に分岐され、一方は
光電力モニタ用の第1の光検出器18に入射される。他方
のレーザ光は第1の複屈折物質23、第2の複屈折物質24
を通過し、さらに1/4波長板25及び偏光ビームスプリッ
タ26を通過した後、光学レンズ21によって波長モニタ用
の第2の光検出器22に集光される。
FIG. 1 shows the configuration of the semiconductor laser 11. The oscillation wavelength of the semiconductor laser 11 used here can be controlled by an external control voltage. The laser light emitted from the front of the semiconductor laser 11 enters the optical fiber 14 as in FIG. 4, and the laser light emitted from the rear is split into two systems by the beam splitter 16 as in FIG. One is incident on a first photodetector 18 for monitoring the optical power. The other laser light includes a first birefringent substance 23 and a second birefringent substance 24.
Then, after passing through a / 4 wavelength plate 25 and a polarizing beam splitter 26, the light is condensed on a second photodetector 22 for wavelength monitoring by an optical lens 21.

第1及び第2の光検出器18,22の各検出信号は共に波
長制御回路27に送られる。この波長制御回路27は入力し
た2つの検出信号からレーザ光の光電力及び波長を検出
し、その検出値から波長誤差を求め、この誤差に応じた
制御電圧を発生して半導体レーザ11に供給し、これによ
って半導体レーザ11の発振波長を制御するものである。
The detection signals of the first and second photodetectors 18 and 22 are both sent to the wavelength control circuit 27. The wavelength control circuit 27 detects the optical power and wavelength of the laser light from the two input detection signals, obtains a wavelength error from the detected values, generates a control voltage corresponding to the error, and supplies the control voltage to the semiconductor laser 11. Thus, the oscillation wavelength of the semiconductor laser 11 is controlled.

上記第1及び第2の複屈折物質23,24はC軸が偏波方
向と45゜の角度をなすように設置され、1/4波長板25は
C軸が偏波方向と平行もしくは垂直になるように設置さ
れる。また、偏光ビームスプリッタ24の偏光角度は半導
体レーザ11の設定周波数に応じて決定される。例えば、
第1の複屈折物質を方解石、第2の複屈折物質24をルチ
ルとすれば、これらは互いに光軸が直交するように設置
され、光進行方向の長さがほぼ6:1に設定される。
The first and second birefringent substances 23 and 24 are installed such that the C axis forms an angle of 45 ° with the polarization direction, and the quarter-wave plate 25 has the C axis parallel or perpendicular to the polarization direction. It is installed so that it becomes. Further, the polarization angle of the polarization beam splitter 24 is determined according to the set frequency of the semiconductor laser 11. For example,
If the first birefringent material is calcite and the second birefringent material 24 is rutile, they are installed so that their optical axes are orthogonal to each other, and the length in the light traveling direction is set to approximately 6: 1. .

上記構成において、以下その動作原理を第2図及び第
3図を参照して説明する。
The operation principle of the above configuration will be described below with reference to FIGS.

まず、複屈折物質23,24についてC軸と平行、垂直に
x,y座標をとって考えると、レーザ光の電界をex,eyとす
れば、第1の複屈折物質23の入射直前の電界は、 exi=Asinωt …(1) eyi=Asinωt …(2) と表わすことができる。また、第2の複屈折物質24の透
過直後の電界exo,eyoは、 と表わすことができる。ここでnho,nheはそれぞれ方解
石の常光、異常光の屈折率、nro,nreはそれぞれルチル
の常光、異常光の屈折率を表わし、l1,l2はそれぞれ方
解石でなる第1の複屈折物質23、ルチルでなる第2の複
屈折物質24の光軸方向の長さを表わす。
First, the birefringent substances 23 and 24 are parallel and perpendicular to the C axis.
x, considering taking y coordinates, if the electric field of the laser beam e x, and e y, field just before entrance of the first birefringent material 23, e xi = Asinωt ... (1 ) e yi = Asinωt ... (2) can be expressed. The second immediately after transmission of the birefringent material 24 electric field e xo, e yo is Can be expressed as Here, n ho and n he are the refractive index of ordinary light and extraordinary light of calcite, respectively, n ro and n re are the refractive index of ordinary light and extraordinary light of rutile, respectively, and l 1 and l 2 are the first calcite, respectively. And the length of the second birefringent substance 24 made of rutile in the optical axis direction.

今、(3),(4)式に示される位相項 の差をδとおき、δの温度特性を計算すると、 となる。尚、(5)式中のダッシュ「′」はΔT=0の
値を意味し、α1は方解石とルチルの熱膨張係数で
ある。
Now, the phase terms shown in equations (3) and (4) Is set to δ, and the temperature characteristic of δ is calculated, Becomes The dash “′” in the equation (5) means a value of ΔT = 0, and α 1 and α 2 are thermal expansion coefficients of calcite and rutile.

(5)式において、ΔTの項が0となる条件、すなわ
を考える。(6)式において の物理定数を代入すると、 0.89l1=5.2l2 …(7) と整理できる。すなわち、 l1:l2=5.8:1≒6:1 とすれば、(6)式を満たし、位相差δは温度によらず
一定となることがわかる。
In the equation (5), the condition that the term of ΔT becomes 0, that is, think of. In equation (6) By substituting the physical constant of, we can rearrange as 0.89l 1 = 5.2l 2 … (7). That is, if l 1 : l 2 = 5.8: 1 ≒ 6: 1, the expression (6) is satisfied and the phase difference δ is constant regardless of the temperature.

次に(3),(4)式からωtを消去した式を求める
と exo 2+exo 2−2exoeyocosδ=A2sin2δ …(8) となる。これは楕円の方程式であり、複屈折物質通過後
は楕円偏光となることを意味している。さらにx,y軸か
ら45゜回転させたX,Y軸に座標変換を行なうと、(8)
式は (1−cosδ)eX 2+(1+cosδ)eY 2=A2sin2δ …(9) のように変形できる。これはX,Y軸を長軸もしくは短軸
とした楕円の方程式である。
Next (3) and (4) obtaining the expression was erased ωt e xo 2 + e xo 2 -2e xo e yo cosδ = A 2 sin 2 δ from equation (8). This is an elliptic equation, which means that the light becomes elliptically polarized light after passing through the birefringent material. Further, when coordinate transformation is performed on the X and Y axes rotated 45 ° from the x and y axes, (8)
The equation can be modified as (1−cos δ) e X 2 + (1 + cos δ) e Y 2 = A 2 sin 2 δ (9) This is an elliptic equation with the X and Y axes as major or minor axes.

上記第1及び第2の複屈折物質23,24によって形成さ
れた楕円偏光は1/4波長板25によってさらに偏光が加え
られる。すなわち、(3)式及び(4)式の位相項をφ
1として書き直し、 exo=Asin(ωt+φ) …(10) eyo=Asin(ωt+φ) …(11) とする。これを45゜回転させた座標軸の電界成分をeX,e
Yで表わすと、 となる。この光が1/4波長板25を通過すれば、eXの位相
項がπ/2だけ大きくなる。ここで1/4波長板を通過した
後のレーザ光は、電界成分をeXh,eYhとすれば、 となり、(14)式及び(15)式よりY軸から の角度だけ傾いた直線偏光となる。
The elliptically polarized light formed by the first and second birefringent substances 23 and 24 is further polarized by a quarter-wave plate 25. That is, the phase terms in equations (3) and (4) are
1, rewritten as φ 2, e xo = Asin ( ωt + φ 1) ... (10) e yo = Asin (ωt + φ 2) ... a (11). The electric field components of the coordinate axes obtained by rotating this by 45 ° are e X , e
Expressed as Y , Becomes When this light passes through the quarter-wave plate 25, the phase term of e X increases by π / 2. Here, assuming that the electric field components are e Xh and e Yh , the laser light after passing through the quarter-wave plate From the Y-axis from equations (14) and (15) It becomes linearly polarized light inclined by the angle of.

以上のことをまとめると、複屈折物質23,24を通過し
たレーザ光は、第2図の楕円aのように長軸、短軸がX,
Y軸で定まる楕円偏光となる。さらに1/4波長板25を通過
すると、同図中bのようにY軸から の角度だけ傾いた直線偏光となる。この際、(6)式を
満たす条件のもとでは偏光方向は温度に依存せず安定で
あり、 で与えられる。
To summarize the above, the laser light that has passed through the birefringent substances 23 and 24 has a long axis and a short axis X and a short axis as shown by an ellipse a in FIG.
It becomes elliptically polarized light determined by the Y axis. Further, when the light passes through the quarter-wave plate 25, as shown in FIG. It becomes linearly polarized light inclined by the angle of. At this time, under the condition satisfying the expression (6), the polarization direction is stable without depending on the temperature, Given by

上記1/4波長板25を通過したレーザ光は偏光ビームス
プリッタ26を介し、光学レンズ21によって第2の光検出
器22に集光されるが、偏光ビームスプリッタ26はレーザ
光の波長変化を光強度変化に変換するので、第2の光検
出器22ではレーザ光の偏光面を光強度変化として検出す
ることができる。第3図に偏光ビームスプリッタ26を通
過した後の光強度特性を示す。
The laser light that has passed through the quarter-wave plate 25 is condensed on the second photodetector 22 by the optical lens 21 via the polarization beam splitter 26, and the polarization beam splitter 26 detects a change in the wavelength of the laser light. Since the light is converted into a change in intensity, the second photodetector 22 can detect the plane of polarization of the laser light as a change in light intensity. FIG. 3 shows the light intensity characteristics after passing through the polarizing beam splitter 26.

今、(16)式からわかるように、波長(周波数)が変
化すると偏光面が回転し、光強度が正弦波状に変化す
る。このため、偏光ビームスプリッタ26を回転させれ
ば、第3図中の波線を実線のように平行移動させること
ができる。したがって、例えば波長を図中A点に固定し
ようとしたとき、波線上のA1点の光強度であった場合、
偏光ビームスプリッタ26を回転させてその特性を平行移
動させれば実線上のA2点に調整することができる。すな
わち、容易に微調整が可能であり、しかも微調整後は固
定波長Aが引込み可能な波長範囲aのほぼ中心にあるこ
とから、安定なフィードバック制御を行なうことができ
る。上記実施例では、波長制御回路27により、第1及び
第2の光検出器18,22の検出信号からレーザ光の光電力
及び波長をモニタし、そのモニタ値に基いて半導体レー
ザ11の発振出力をフィードバック制御している。
Now, as can be seen from equation (16), when the wavelength (frequency) changes, the plane of polarization rotates and the light intensity changes in a sinusoidal manner. Therefore, by rotating the polarization beam splitter 26, the dashed line in FIG. 3 can be translated as indicated by the solid line. Thus, for example, when attempting to fixed in the figure point A wavelength, indicating an intensity of the A 1 point on a wavy line,
If caused to translate its properties by rotating the polarization beam splitter 26 can be adjusted to A 2 points on the solid line. That is, fine adjustment can be easily performed, and after the fine adjustment, the fixed wavelength A is substantially at the center of the pull-in wavelength range a, so that stable feedback control can be performed. In the above embodiment, the wavelength control circuit 27 monitors the optical power and wavelength of the laser light from the detection signals of the first and second photodetectors 18 and 22, and the oscillation output of the semiconductor laser 11 based on the monitored values. Has feedback control.

数値例として、l1′=6〔mm〕、l2′=1〔mm〕、λ
=1.5〔μm〕とすれば、(16)式より第3図の正弦波
の周期は1.7〔nm〕であることがわかる。このように、
上記構成の半導体レーザ装置は極めて高感度な波長検出
機能を持つといえる。
As numerical examples, l 1 ′ = 6 [mm], l 2 ′ = 1 [mm], λ
= 1.5 [μm], it can be seen from equation (16) that the period of the sine wave in FIG. 3 is 1.7 [nm]. in this way,
It can be said that the semiconductor laser device having the above configuration has an extremely sensitive wavelength detecting function.

したがって、上記構成では、固定波長が引込み可能な
波長範囲の中心にあるため、安定な波長制御が可能であ
り、しかも固定波長の微調整も極めて容易に行なうこと
ができる。さらに、温度変化に対しても安定であり、波
長の検出感度も高いという優れた特徴を有するので、コ
ヒーレント光通信に好適する。
Therefore, in the above configuration, since the fixed wavelength is at the center of the pull-in wavelength range, stable wavelength control is possible, and fine adjustment of the fixed wavelength can be performed very easily. Further, it has excellent characteristics that it is stable against a temperature change and has high wavelength detection sensitivity, so that it is suitable for coherent optical communication.

尚、この発明は上記実施例に限定されるものではな
く、例えば温度安定性の良好な複屈折物質の間に波長板
を挿入して偏波面を調整してもよい。さらに偏光ビーム
スプリッタを回転して調整するかわりに、1/2波長板を
挿入して回転調整するようにしても同様の効果が得られ
る。
Note that the present invention is not limited to the above-described embodiment. For example, a polarization plate may be adjusted by inserting a wave plate between birefringent materials having good temperature stability. Further, instead of rotating and adjusting the polarization beam splitter, a similar effect can be obtained by inserting a half-wave plate and adjusting the rotation.

[発明の効果] 以上のようにこの発明によれば、レーザ光の設定周波
数の微調整を簡単に行なうことのできる半導体レーザ装
置を提供することができる。
[Effects of the Invention] As described above, according to the present invention, it is possible to provide a semiconductor laser device capable of easily performing fine adjustment of the set frequency of laser light.

【図面の簡単な説明】[Brief description of the drawings]

第1図はこの発明に係る半導体レーザ装置の一実施例の
構成を示す図、第2図は同実施例の楕円偏波変換手段を
説明するための図、第3図は同実施例の波長微調整手段
を説明するための図、第4図は従来の半導体レーザ装置
の構成を示す図、第5図は従来の半導体レーザ装置の動
作を説明するための図である。 11……半導体レーザ、12,13,15,18,21……光学レンズ、
14……光ファイバ、16……ビームスプリッタ、17,22…
…光検出器、19,20……反射鏡、23,24……複屈折物質、
25……1/4波長板、26……偏光ビームスプリッタ、27…
…制御回路。
FIG. 1 is a view showing a configuration of an embodiment of a semiconductor laser device according to the present invention, FIG. 2 is a view for explaining an elliptically polarized wave conversion means of the embodiment, and FIG. FIG. 4 is a diagram for explaining the fine adjustment means, FIG. 4 is a diagram showing the configuration of a conventional semiconductor laser device, and FIG. 5 is a diagram for explaining the operation of the conventional semiconductor laser device. 11… Semiconductor laser, 12,13,15,18,21 …… Optical lens,
14 ... optical fiber, 16 ... beam splitter, 17,22 ...
… Photodetectors, 19, 20… Reflector, 23, 24… Birefringent substances,
25 ... quarter wave plate, 26 ... polarization beam splitter, 27 ...
... Control circuit.

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】発振波長を制御可能な半導体レーザと、こ
の半導体レーザで発生されるレーザ光を2系統以上に分
岐する分岐手段と、この分岐手段で分岐された一方のレ
ーザ光から光電力を検出する光電力検出部と、前記分岐
手段で分岐された他方のレーザ光をレーザ光の波長によ
り楕円率が変わる楕円偏光に変換する第1の偏光変換手
段と、この手段を透過したレーザ光を直線偏光に変換す
る第2の偏光変換手段と、この手段を透過したレーザ光
の波長変化を偏光角度に応じて光電力変化に変換する偏
光ビームスプリッタと、この偏光ビームスプリッタを透
過したレーザ光を受光してレーザ光の光電力を検出し、
その検出結果からレーザ光の波長変化を読取る波長検出
部と、前記光電力検出部及び波長検出部の各検出結果に
基づいて前記半導体レーザの発振を制御する制御手段と
を具備したことを特徴とする半導体レーザ装置。
1. A semiconductor laser capable of controlling an oscillation wavelength, a branching means for branching laser light generated by the semiconductor laser into two or more systems, and an optical power from one of the laser lights branched by the branching means. An optical power detection unit for detecting, a first polarization conversion unit for converting the other laser beam branched by the branching unit into elliptically polarized light whose ellipticity changes according to the wavelength of the laser beam, and a laser beam transmitted through this unit. Second polarization conversion means for converting the light into linearly polarized light, a polarization beam splitter for converting a wavelength change of the laser light transmitted through the means into an optical power change in accordance with a polarization angle, and a laser beam transmitted through the polarization beam splitter. Receives light and detects the optical power of the laser light,
A wavelength detector that reads a change in the wavelength of the laser light from the detection result, and a control unit that controls oscillation of the semiconductor laser based on each detection result of the optical power detector and the wavelength detector. Semiconductor laser device.
【請求項2】第1の偏光変換手段は、2種類の複屈折物
質をレーザ光の光軸上に配置し、各複屈折物質の光路長
差を温度によらず一定となるようにしたことを特徴とす
る請求項(1)記載の半導体レーザ装置。
2. The first polarization conversion means has two types of birefringent substances arranged on the optical axis of the laser beam so that the difference in the optical path length of each birefringent substance is constant regardless of the temperature. The semiconductor laser device according to claim 1, wherein:
【請求項3】前記2種類の複屈折物質は、一方が方解
石、他方がルチルであり、各光軸は互いに直交するよう
に設置し、光進行方向の長さをほぼ6:1に特定すること
を特徴とする請求項(2)記載の半導体レーザ装置。
3. The two types of birefringent materials are one of calcite and the other of rutile, each of which is installed so that their optical axes are orthogonal to each other, and specifies the length of the light traveling direction to be approximately 6: 1. The semiconductor laser device according to claim 2, wherein:
【請求項4】前記第2の偏光変換手段は、1/4波長板と
し、また前記偏光ビームスプリッタの偏光角度を変えて
前記半導体レーザの発振波長を調整するようにしたこと
を特徴とする請求項(1)記載の半導体レーザ装置。
4. The apparatus according to claim 1, wherein said second polarization conversion means is a quarter-wave plate, and the oscillation wavelength of said semiconductor laser is adjusted by changing a polarization angle of said polarization beam splitter. The semiconductor laser device according to item (1).
JP4941589A 1989-03-01 1989-03-01 Semiconductor laser device Expired - Fee Related JP2736105B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4941589A JP2736105B2 (en) 1989-03-01 1989-03-01 Semiconductor laser device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4941589A JP2736105B2 (en) 1989-03-01 1989-03-01 Semiconductor laser device

Publications (2)

Publication Number Publication Date
JPH02228625A JPH02228625A (en) 1990-09-11
JP2736105B2 true JP2736105B2 (en) 1998-04-02

Family

ID=12830435

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4941589A Expired - Fee Related JP2736105B2 (en) 1989-03-01 1989-03-01 Semiconductor laser device

Country Status (1)

Country Link
JP (1) JP2736105B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6567437B1 (en) 2000-01-31 2003-05-20 Mitsubishi Denki Kabushiki Kaisha Wavelength monitoring device and its adjusting method, and wavelength stabilizing light source and transmission system having plural wavelength stabilizing light source

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4569017B2 (en) * 2001-03-08 2010-10-27 住友電気工業株式会社 Optical device
JP7062882B2 (en) * 2017-04-28 2022-05-09 富士通オプティカルコンポーネンツ株式会社 Wavelength monitor device, light source device and optical module

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6567437B1 (en) 2000-01-31 2003-05-20 Mitsubishi Denki Kabushiki Kaisha Wavelength monitoring device and its adjusting method, and wavelength stabilizing light source and transmission system having plural wavelength stabilizing light source

Also Published As

Publication number Publication date
JPH02228625A (en) 1990-09-11

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