JP2767610B2 - IC card test equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention is capable of sequentially performing tests while flowing a large number of IC cards on a transport path, particularly an IC card test apparatus.
It relates to an IC card test device.

[Conventional technology]

IC cards are attracting attention as a new medium replacing magnetic cards. Since this IC card has a built-in complex semiconductor device such as a CPU and a memory, it is necessary to perform a test one by one before shipping as a product. In addition, a test for confirming normal operation under low temperature conditions or normal operation under high temperature conditions is required. Conventionally, in a test apparatus of this type, an object to be tested is set one by one in the apparatus, and after performing heating or cooling to a predetermined temperature, the test is performed to determine the quality.

[Problems to be solved by the invention]

When mass-producing IC cards, the test process must be suitable for mass processing. However, in the conventional device, as described above, it is necessary to set IC cards one by one in the device, and it is necessary to wait until the IC card reaches a predetermined temperature. Very difficult to do.

Therefore, an object of the present invention is to provide an IC card test apparatus that can continuously test a large number of IC cards.

[Means for solving the problem]

The present invention relates to an IC card test apparatus, comprising: a table on which a loading cassette containing a large number of IC cards stacked vertically and accommodated; a mechanism for moving the table up and down; and a mechanism for removing the IC card from the loading cassette. A temperature control unit having a temperature control room in which the temperature of the room is controlled to a predetermined temperature, and a holding device for keeping the IC card carried in by the load means in the temperature control room for a predetermined time. And has a plurality of n rails arranged in parallel to each other and coming out of the temperature control chamber (n-
1) The IC card is temporarily held between the rails, and then is transported along the transport direction, and is temporarily held between n rails of the transport means (n-1). ) Test means for performing a test on each of the IC cards, and another n rails oriented in the transport direction and connected to the n rails of the transport means, each of which is sent out from the transport means.
A sorting stage for temporarily holding IC cards, a table for loading and unloading cassettes for stacking and stacking a large number of IC cards vertically, a mechanism for moving the table up and down, and a n-1)
A mechanism for selectively moving only i of the IC cards that have passed the test by the test means in the transport direction and introducing the same into the carry-out cassette; and a failure in the test by the test means, (N-1-i) IC cards remaining on the rail
And a discharging means for moving the n rails of the classification stage in a direction perpendicular to the transport direction by a distance necessary for discharging, and then discharging the rejected goods to a storage bin. is there.

(Operation)

In the IC card testing apparatus according to the present invention, a large number of IC cards are supplied in a carry-in cassette. The IC card is sequentially carried into the device by the carrying means.
The carried-in IC card stays in the temperature control room for a predetermined time by the holding device. The IC card that has reached the temperature required for the test is temporarily held on the transporting means, and the necessary test is performed during that time. The IC card after the test is sent to the classification stage, the good products that pass the test are carried out to the carry-out cassette by the carry-out means, and the defective products that fail are discharged to the storage for rejected goods by the discharge means. .

〔Example〕

Hereinafter, the present invention will be described in detail based on one embodiment shown in the drawings.
FIG. 1 is a schematic diagram showing the internal structure of the device according to this embodiment. This device has a double structure surrounded by an outer housing 10 and an inner housing 20. The plurality of IC cards to be tested are supplied to the loading unit 100. The IC card of the carry-in section 100 is carried into the test apparatus main body from the carry-in port 11, passes through the temperature control section 200, the test section 300, and the classification section 400, and passes through the carry-out port 1.
2 to the unloading section 500. Hereinafter, the structure and operation of each unit will be described in order.

Structure and operation of the loading unit 100 The loading unit 100 has a basic structure as shown in FIG.
Base 110, table 120, support 130, loading cassette 140,
It is composed of a loading device 150. The carry-in cassette 140 is only placed on the table 120, and can be lifted from the table 120 and moved. Prop 130
Is extendable and retractable, so that the table 120 and the loading cassette 140 placed thereon can be moved up and down. FIG. 2 shows a state where the table 120 is at the lowest position. As shown in the figure, a large number of IC cards are stacked and accommodated in the carry-in cassette 140. The loading device 150 is provided with an IC in the loading cassette 140 by a retractable loading rod 151.
The card C1 is pushed rightward as shown in the figure, and the loading operation into the loading entrance 11 is performed. Subsequently, when the support 130 pushes the table 120 up and the second IC card C2 reaches the position of the carry-in entrance 11, the carry-in rod 151 carries the IC card C2.
In this way, the IC cards in the loading cassette 140 are
From 1 it is carried into the device body.

In the apparatus of this embodiment, three transport paths are prepared as described later, and three rows of IC cards, each of which is stacked up to ten vertically, are provided in the carry-in cassette 140, as shown in FIG. They are arranged in a vertical direction. Also, the loading rod
151 are also provided, one for each row, for a total of three,
Three IC cards are carried in at the same time by these three carrying rods.

Structure and Operation of Temperature Control Unit 200 The IC card taken into the carry-in entrance 11 is introduced into the temperature control chamber 220 by the transport path 210 constituted by a belt conveyor or the like. In the temperature control room 220, a temperature controller 230 is provided.
And a holding device 240 are provided. The temperature controller 230 incorporates a heating mechanism such as a heater and a cooling mechanism, and can maintain the inside of the temperature control chamber 220 at a predetermined temperature. In the apparatus of this embodiment, the inside of the temperature control chamber 220 is maintained at a constant temperature and functions as a constant temperature chamber. Temperature control room 22
Since 0 is doubly surrounded by the outer casing 10 and the inner casing 20, a heat insulating effect is obtained. Temperature control room 220
The holding device 240 provided near the center of the
41 and a turbulence device 242 for rotating it are incorporated. The rotation support 241 has a third partial perspective view.
As shown in the figure, the rotating shaft 243 and the two support plates 2
44,245. The rotation shaft 243 rotates clockwise in FIG. On the other hand, the two support plates 244 and 245
The rotating shaft 243 is fixed so as to be perpendicular to the axial direction. Moreover, the distance between the two indication plates 244 and 245 is
It is designed to be slightly shorter than the width of the card. Grooves 244a, 245a are formed on the inner surfaces of the support plates 244, 245, respectively. A plurality of grooves 244a and 245a are provided radially toward the center (36 sets in this example), and a pair of opposed grooves 244a and 245a can hold both sides of one IC card. I can do it.

FIG. 4 shows the rotation support 241 shown in FIG.
And 245 correspond to a side sectional view cut and shown. As shown in this figure, the IC transported by the transport path 210
The card C3 is fitted and held in one set of grooves. By synchronizing the rotation speed of the rotating shaft 243 and the carrying speed of the IC card, the IC cards can be sequentially held in the grooves as shown in the figure. In this manner, each IC card is held in the temperature control chamber 220 until the rotating support 241 rotates 180 °, and is heated or cooled to a predetermined temperature. The IC card C4 that has reached the position rotated by 180 ° is separated from the groove by the transport mechanism described later, and is transported to the test unit 300.

As described above, in the apparatus of this embodiment, actually, three rows of transport paths are prepared. That is, the transport path 21
0 is composed of three parallel transport paths. Although only a single rotating support 241 is shown in FIG. 3 for convenience of explanation, actually, three sets of rotating supports 241 are provided on the rotating shaft 243 side by side.

FIG. 5 is a plan view of a transport mechanism in the test section 300. FIG. This test section 300 is also the same inner casing as the temperature control section 200
Since it is provided in the unit 20, it is also kept at a constant temperature. As described above, in this embodiment, three rows of transport paths A, B, and C are provided, but each transport path extends in the transport direction (a direction from left to right in the figure). rail
It is delimited by 310,320,330,340. The IC cards C5 to C10 moving on the transport path are held on both sides by the rails. In this embodiment, an elongate groove extending in the transport direction is formed on each rail, and the IC card is slidably held in the transport direction by fitting both sides of the IC card into these grooves. FIG. 6 is a cross-sectional view of the rail shown in FIG. 5 taken along the cutting line XX. It is clear that both sides of the IC cards C5, C7, and C9 are supported by the four rails. Is shown in Along this rail, IC
To move the card, driving bodies 351 to 356 are provided. In FIG. 6, drivers 351, 353, and 355 have the functions of abutting the rear ends of the IC cards C 5, C 7, and C 9, respectively, and pushing the IC card forward. The feature of the rails shown in FIG. 5 is that each rail is divided into three parts. That is, the rails 310 to 340 include a front part R1 composed of rails 311, 321, 331, and 341 and rails 312, 32, respectively.
Middle section R2 consisting of 2,332,342 and rails 313,323,333,343
And a rear part R3 consisting of
The reason for the division is that the middle section R2 moves in the vertical direction (the direction perpendicular to the plane of FIG. 5).
A test head 360 is located above the middle section R2.
380 (see FIG. 1).

The IC card is introduced at a predetermined cycle from the front section R1 to the middle section R2. In this embodiment, since two IC cards are transported together in one transport path, as shown in FIG. 5, six IC cards C5 to C10 are introduced into the middle section R2 at a time. Will be. Since both sides of the IC card are supported by grooves in the rail, the IC card does not move off the rail in the vertical direction (the direction perpendicular to the plane of FIG. 5), and does not move in the horizontal direction (the vertical direction in FIG. 5). Direction).
Now, as shown in FIG. 5, it is assumed that six IC cards C5 to C10 have been introduced into the middle section R2, and how the tests are performed on these six IC cards will be described. FIG. 7 is a side view showing a state immediately after the IC card is introduced into the middle section R2. In this state, if the middle section R2 moves upward as it is, the state shown in FIG. 8 can be obtained. That is, since the IC card is held by the rail, it moves upward together with the rail. On the lower surface of the test head 360, an electrode 361 is provided for each IC card, and this electrode 361 comes into contact with an external contact terminal of the IC card. Here, test data is transmitted from the test apparatus 380 via the cable 370 and the electrode 361.
Given to IC card. The IC card outputs answer data corresponding to the test data, and the test equipment compares the answer data with the expected data.If they match, the IC card passes, otherwise, the IC card fails. Gives the test result. When the test is completed, the rail is lowered again to the original position and returns to the state shown in FIG.
In this way, the six IC cards C6 to C10
Is moved to the subsequent stage R3 by the driving bodies 351 to 356. Subsequently, the next six IC cards are introduced from the front part R1 to the middle part R2, and the same operation is repeated.

Structure and Operation of Classification Unit 400 As described above, the IC card after the test is
It is transported to R3 and further introduced into the classification stage R4.
This classification stage R4 includes, as shown in FIG.
Is an extension of the four rails, 314,324,33
Consists of 4,344. Fig. 9 shows the classification stage R4
Shows a state in which three IC cards C11, C12, and C13 are introduced. On the right side of the sorting stage R4, a carry-out cassette 540 (the figure shows a flat cross section) in the carry-out section 500 is located. Unloading devices 410, 420, and 430 are provided above the sorting stages in the transport paths A, B, and C, respectively, and unloading devices 440 are provided at positions off the transport paths (in FIG. 9,
(Indicated by broken lines). FIG. 10 is a side view showing the positional relationship and the structure of the unloading device 410 with respect to the transport path A. The unloading device 410 has a swing bar 411, and by moving the swing bar 411 in the direction of the arrow in the figure, the IC card C11 sandwiched between the rails 314 and 324 is moved out of the carry-out port 12 (see FIG. 10). (Not shown) can be carried out into the carry-out cassette 540. The unloading devices 420 and 430 for the transport paths B and C have exactly the same function.

Now, in FIG. 9, it can be understood that if all the unloading devices 410, 420, and 430 are driven, all three IC cards C11, C12, and C13 are unloaded to the position shown by the one-dot chain line in the unloading cassette 540. As described above, normally, three IC cards are simultaneously carried out into the carry-out cassette 540. However,
If there is an unsuccessful IC card, the unsuccessful IC card is not carried out. Whether each IC card has passed or failed can be recognized by receiving information from the test device 380. Now, in FIG. 9, it is assumed that the IC cards C11 and C12 pass, but the IC card C13 fails. In this case, unloading device 4
10 and 420 perform the unloading operation, and the IC cards C11 and C12
Is carried out to the carry-out cassette 540. However, since the unloading device 430 does not perform the unloading operation, the IC card C13 remains on the classification stage R4 as it is. This failed IC
The card C13 is discharged to the storage 450 for rejected products. This discharging operation is shown in FIG. When the IC cards C11 and C12, which are acceptable products, are carried out to the carry-out cassette 540,
Classification stage R4 (ie rails 314,324,334,344)
Move integrally in the lower part of the figure, that is, in the direction perpendicular to the transport direction. And the IC card C13 is the discharging device 4
When the IC card C13 reaches just below 40, the IC card C13 is discharged to the storage 450 by the discharge device 440. Discharge device 44
0 may have substantially the same structure as the discharge device 410 shown in FIG.
However, the swing bar pushes the IC card in the opposite direction.
In this way, the rejected products remaining in the classification stage R4 are discharged immediately below the discharge device 440. If two or three IC cards remain as rejected products, the discharging operation is performed every time the remaining IC cards come directly below the discharging device 440 while moving the classification stage R4 below the figure. become.

Thus, finally, the accepted product is carried out to the carry-out cassette 540, and the rejected product is discharged to the storage 450. The classification stage R4 returns to the original position and waits for the next IC card.

Structure and Operation of the Unloading Unit 500 The unloading unit 500 includes a base, a table, columns (not shown), and an unloading cassette 540, in substantially the same manner as the unloading unit 100 shown in FIG. The unloading mechanism is not necessary here because it is already provided in the classification unit 400. As described above, at the start of the operation of this apparatus, the loading cassette 140 is set at the lowest position, and gradually rises from there. On the other hand, the unloading cassette 540 is set at the uppermost position, and gradually descends from there.
Therefore, the IC card at the top of the carry-in cassette 140 is stored at the bottom of the carry-out cassette 540. However,
Since the IC card is turned upside down in the temperature control unit 200, if the unloading cassette 540 is eventually turned upside down,
The loaded state of the C card is exactly the same as the state in the carry-in cassette 140. For this reason, it is preferable that the carry-in cassette 140 and the carry-out cassette 540 have exactly the same structure, and that the top, bottom, left, and right are targeted.

In the apparatus of this embodiment, as shown in FIG. 9, sensors 551, 552, and 553 are provided in the vicinity of the carry-out port for each conveyance path. These sensors can detect the arrival of an IC card. If this sensor does not detect the arrival of the IC card at a predetermined time, it can be determined that the IC card has been clogged in the middle of the transport path. In this case, this device has a function of stopping all operations and reporting an abnormality.

In the above, one embodiment illustrating the present invention has been described. In short, the present invention carries out a test after continuously carrying in an IC card, holding it in a temperature control room, and performing a classification based on the test result. It is characterized by the fact that a series of test steps of carrying out after carrying out, can be performed continuously, the detailed configuration of each part is not limited to this embodiment, and various changes are possible. is there.

〔The invention's effect〕

As described above, according to the present invention, in the IC card test device, the IC card is continuously loaded, the IC card is held in the temperature control room, the test is performed, and based on the test result, the IC is performed on the classification stage. Since the cards are sorted and then transported out, a large number of IC card tests can be performed continuously.

[Brief description of the drawings]

FIG. 1 is a schematic diagram showing a basic configuration of a conveyed goods classifying apparatus according to one embodiment of the present invention, and FIG. 2 is a carry-in section of the apparatus shown in FIG.
FIG. 3 is a block diagram of the temperature control unit 2 of the apparatus shown in FIG.
FIG. 4 is an explanatory view of the operation of the rotary support shown in FIG. 3, FIG. 5 is a plan view showing a transport path in the test section 300 of the apparatus shown in FIG. 1, FIG. 6 is a cross-sectional view of the transport path shown in FIG. 5 taken along section line XX. FIGS. 7 and 8 are side views illustrating the operation of the test unit 300 of the apparatus shown in FIG. FIG. 9 is a plan view showing the classification unit 400 of the device shown in FIG. 1, FIG. 10 is a side view for explaining the operation of the unloading device of the device shown in FIG. 9, and FIG. FIG. 9 is a plan view illustrating an operation of discharging a defective product by a classification unit 400. 10 ... outer casing, 11 ... carry-in, 12 ... carry-out, 20 ...
Inner case, 100 ... Loading section, 110 ... Base, 120 ... Table, 130 ... Post, 140 ... Loading cassette, 150 ...
Loading device, 151 ... Loading rod, 200 ... Temperature control unit, 210 ...
... Conveyance path, 220 ... Temperature control room, 230 ... Temperature controller, 24
0 ... Reserving device, 241 ... Rotating support, 242 ... Drive device, 243 ... Rotating shaft, 244,245 ... Support plate, 244a, 245a ...
… Groove, 300 …… Test part, 310-314,320-324,330-334,
340-344… rail, 351-356… driving body, 360… test head, 361… electrode, 370… cable, 380…
Test device, 410, 420, 430: Unloading device, 411: Swing bar, 440: Ejecting device, 450: Storage for rejected products, 540: Unloading cassette, 551 to 553: Sensor, C1 to C
13 …… IC card, R1 …… front section, R2 …… middle section, R3 ……
Rear part, R4: Classification stage, A, B, C: Transport path.

Continuation of the front page (56) References JP-A-63-58268 (JP, A) JP-A-54-143668 (JP, A) JP-A-59-121486 (JP, A) JP-A-1-55468 (JP) , U) Real opening 60-164265 (JP, U) (58) Fields investigated (Int. Cl. ⁶ , DB name) G06K 17/00 G01R 31/28

Claims (1)

(57) [Claims] 1. A loading means having a table on which a loading cassette containing a large number of IC cards stacked vertically and accommodated therein, a mechanism for moving the table up and down, and a mechanism for removing the IC cards from the loading cassette. A temperature control unit having a temperature control room in which the room temperature is controlled to a predetermined temperature, and a holding device for keeping the IC card carried in by the carry-in means in the temperature control room for a predetermined time; And a plurality n arranged in parallel with each other
(N-
1) The IC card is temporarily held between the rails, and then is transported along the transport direction, and is temporarily held between n rails of the transport means (n -1) test means for performing a test on the IC cards; and n different rails facing the transport direction and connected to n rails of the transport means, and each IC sent from the transport means. A sorting stage for temporarily holding cards, a table on which an unloading cassette for accommodating a large number of IC cards stacked one above the other, a mechanism for moving the table up and down, unloading means having: a mechanism for moving only i of the n-1) IC cards that have passed the test by the testing means in the transport direction and selectively introducing them into the unloading cassette; The test failed, and the (n−1-i) IC cards remaining on the rails of the classification stage were discharged from the n rails of the classification stage in a direction perpendicular to the transport direction. A discharge device for moving a necessary distance, and then discharging the rejected product to a storage for rejected products, an IC card test device.