JP2798546B2 - Cutting dies for semiconductor devices - Google Patents
Cutting dies for semiconductor devicesInfo
- Publication number
- JP2798546B2 JP2798546B2 JP4059389A JP5938992A JP2798546B2 JP 2798546 B2 JP2798546 B2 JP 2798546B2 JP 4059389 A JP4059389 A JP 4059389A JP 5938992 A JP5938992 A JP 5938992A JP 2798546 B2 JP2798546 B2 JP 2798546B2
- Authority
- JP
- Japan
- Prior art keywords
- punch
- cutting
- die
- semiconductor device
- semiconductor devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005520 cutting process Methods 0.000 title claims description 38
- 239000004065 semiconductor Substances 0.000 title claims description 16
- 239000002699 waste material Substances 0.000 claims description 11
- 230000000630 rising effect Effects 0.000 claims description 4
- 238000004080 punching Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 101100008048 Caenorhabditis elegans cut-4 gene Proteins 0.000 description 1
- 101100008049 Caenorhabditis elegans cut-5 gene Proteins 0.000 description 1
- 241000406668 Loxodonta cyclotis Species 0.000 description 1
- 230000009194 climbing Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
Landscapes
- Lead Frames For Integrated Circuits (AREA)
- Punching Or Piercing (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体装置用成形装置
に関し、特に成形装置の金型に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a molding apparatus for semiconductor devices, and more particularly to a mold for the molding apparatus.
【0002】[0002]
【従来の技術】従来の切断金型は、図2(A)に示すよ
うに切断する刃となるポンチ1とダイス2とを有してい
る。2. Description of the Related Art A conventional cutting die has a punch 1 and a die 2 as cutting blades as shown in FIG.
【0003】次に動作について説明する。半導体装置を
切断する際に、ポンチ1がダイス2上の被切断物4に接
触した時に剪断力が働き、被切断物4を打ち抜く。Next, the operation will be described. When the semiconductor device is cut, when the punch 1 comes into contact with the object 4 on the die 2, a shearing force acts to punch the object 4.
【0004】その後、下死点5まで降下を続けて停止
し、ポンチ1は上昇し元の位置に戻り、一連の切断動作
が終了する。[0004] Thereafter, the punch 1 continues to descend to the bottom dead center 5 and stops, the punch 1 rises and returns to the original position, and a series of cutting operations ends.
【0005】切断した時に発生する切断クズ6は、一般
的には図2(B)のように1個ずつ排出されるが、ポン
チが切断クズを付着したまま上昇し、その切断クズがは
い上ってしまう『切断クズはい上り』が起こる場合があ
る(図2(C))。[0005] The cutting debris 6 generated when cutting is generally discharged one by one as shown in FIG. 2 (B). However, the punch rises with the cutting debris attached, and the cutting debris is removed. In some cases, “cutting waste” may occur (FIG. 2C).
【0006】この切断クズはい上りは重大な品質事故を
引き起こすため、その防止策として、ポンチのストロー
クを延長し下死点をテーパー部7より突き出す方法(図
3(A))と、ポンチのストロークと下死点は従来のま
までテーパー部を下死点より上へ移行する方法がある
(図3(B))。これらの方策により切断クズを除去し
てきた。[0006] Since this cutting waste may cause a serious quality accident, as a preventive measure, a method of extending the punch stroke and projecting the bottom dead center from the tapered portion 7 (FIG. 3A), There is a method of shifting the tapered portion above the bottom dead center while keeping the bottom dead center as it is in the related art (FIG. 3B). Cutting debris has been removed by these measures.
【0007】[0007]
【発明が解決しようとする課題】この従来の切断金型に
おいて、図3(A)の場合は、ポンチとダイスの接触面
積が大きいために摩耗しやすく、工具寿命が短いという
欠点があった。In the conventional cutting die shown in FIG. 3A, there is a disadvantage that the contact area between the punch and the die is large, so that the die is easily worn and the tool life is short.
【0008】また図3(B)の場合は、摩耗も少ない
が、ダイスの強度が低下するという欠点がある。In the case of FIG. 3B, the wear is small, but the strength of the die is reduced.
【0009】本発明の目的は、切断クズはい上り現象
を、工具寿命等に悪影響を与えることなく、防止するよ
うにした半導体装置用切断金型を提供することにある。 An object of the present invention is to provide a cutting waste phenomenon.
Without affecting the tool life, etc.
An object of the present invention is to provide a cutting die for a semiconductor device.
【0010】[0010]
【課題を解決するための手段】前記目的を達成するた
め、本発明に係る半導体装置用切断金型は、被切断物を
加工するポンチを有する半導体装置の切断金型であっ
て、前記ポンチは、軸方向に沿って分割した構造とし、
切断クズのはい上がりを防止するために互いに軸方向に
差動可能としたものである。In order to achieve the above object, a cutting die for a semiconductor device according to the present invention is a cutting die for a semiconductor device having a punch for processing an object to be cut. , With a structure divided along the axial direction,
In order to prevent the cutting waste from rising, it is possible to make a differential in the axial direction.
【0011】[0011]
【実施例】以下、本発明の実施例を図により説明する。
図1及び図4は、本発明者が図3に示す従来例の問題を
改善するために考案した参考例を示すものである。 DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings.
1 and 4 illustrate the problems of the prior art shown in FIG.
It shows a reference example devised for improvement.
【0012】図1に示す半導体装置用切断金型は、図1
(A)に示すように被切断物をダイス2上にセットし、
図1(B)に示すようにポンチ1を下死点5まで下降さ
せて被切断物4をダイス2により打ち抜き加工するよう
になっている。 The cutting die for a semiconductor device shown in FIG.
An object to be cut is set on the die 2 as shown in FIG.
Figure 1 (B) of the object to be cut 4 is lowered to the bottom dead center 5 punch 1 as shown in to punching by a die 2
It has become.
【0013】そして図1(B)に示すように、ポンチ1
が下死点5まで下降中の状態で、イジェクトピン3がポ
ンチ1の下端より迫り出し、切断クズ6をイジェクトピ
ン3により下方に落下させ、切断クズのはい上りを防止
する。[0013] Then, as shown in FIG. 1 (B), the punch 1
Is descending to the bottom dead center 5, the eject pin 3 protrudes from the lower end of the punch 1, and the cutting waste 6 is dropped downward by the eject pin 3, thereby preventing the cutting waste from going up.
【0014】図4に示す半導体装置用切断金型では、イ
ジェクトピン3の本数を増加させ、多ピンイジェクタ型
ポンチ8から複数のイジェクトピン3を迫り出させて切
断クズのはい上りを防止するようにしている。 In the cutting die for a semiconductor device shown in FIG. 4, the number of eject pins 3 is increased, and a plurality of eject pins 3 protrude from the multi-pin ejector type punch 8 to prevent cutting dust from entering. Like that.
【0015】図6に示す半導体装置用切断金型では、ポ
ンチ10の中心部に孔10aを設けた高圧エアー型ポン
チ10として構成し、孔10aから高圧エアーを噴射さ
せて切断クズのはい上りを防止するようにしている。 The cutting die for a semiconductor device shown in FIG. 6 is constituted as a high-pressure air-type punch 10 having a hole 10a at the center of the punch 10, and high-pressure air is injected from the hole 10a to cut off cutting dust. Try to prevent .
【0016】ところで、半導体装置用切断金型では、対
象となる被切断物は非常に小さく、それにともないポン
チ自体も非常に小型で細長くなる傾向にある。 In a cutting die for a semiconductor device,
The elephant to be cut is very small.
The tips themselves tend to be very small and elongated.
【0017】従って、切断くずのはい上がりを防止する
ための工夫をポンチ自体に施すには、ポンチの小型化に
対応し継続的使用に耐え得るものでなければならず、図
1、図4及び図6に示す半導体装置用切断金型を改良す
る必要がある。 Therefore, it is possible to prevent the cutting waste from rising.
The punch itself by reducing the size of the punch.
It must be capable of withstanding continuous use.
1. Improve the cutting die for semiconductor device shown in FIGS. 4, 4 and 6.
Need to be
【0018】そこで、本発明の実施例に係る半導体装置
用切断金型は図5に示すように、被切断物を打ち抜くポ
ンチ9を、軸方向に沿って分割した差動型ポンチとして
構成し、打ち抜き後に2つのポンチ9、9を互いに差動
させることで切断くずはい上がりを防止するようにした
ものである。 Therefore, a semiconductor device according to an embodiment of the present invention
As shown in Fig. 5, a cutting die for punching
Punch 9 as a differential punch divided along the axial direction
After punching, the two punches 9, 9 are
To prevent cutting waste from rising
Things.
【0019】[0019]
【発明の効果】以上説明したように本発明によれば、ポ
ンチを軸方向に沿って分割し、例えば1本のポンチを左
右に2分割した差動型ポンチとして構成し、打抜き後に
2つのポンチを互いに差動させることにより、切断クズ
のはい上りを防止することができ、切断金具の工具寿命
を短縮することがない。さらに、本発明によれば、ポン
チを軸方向に分割した構造であって、ポンチに分割機構
を付加して分割したものではないため、ポンチ自体の小
型化を図ることができ、しかもポンチが軸方向に細長く
なった際にも対処することができる。As described above, according to the present invention, the punch is divided along the axial direction, for example, one punch is constituted as a differential punch in which the punch is divided into two right and left parts. Are made different from each other, it is possible to prevent the cutting waste from climbing up, and the tool life of the cutting fitting is not shortened. Further, according to the present invention, since the punch is divided in the axial direction and is not divided by adding a dividing mechanism to the punch, it is possible to reduce the size of the punch itself. It is possible to cope with the case of becoming elongated in the direction.
【図1】図3に示す従来例を改善した半導体装置用切断
金型を示す図であり、(A)は作動前状態図、(B)は
作動後状態図である。FIG. 1 is an improvement of the conventional example shown in FIG .
It is a figure which shows a metal mold | die , (A) is a state figure before operation | movement, (B) is a state figure after operation | movement.
【図2】従来例を示す図である。FIG. 2 is a diagram showing a conventional example.
【図3】従来例を示す図である。FIG. 3 is a diagram showing a conventional example.
【図4】図3に示す従来例を改善した半導体装置用切断
金型を示す図である。FIG. 4 is an improved cutting example of a conventional semiconductor device shown in FIG .
It is a figure showing a metallic mold .
【図5】本発明の一実施例に係る半導体装置用切断金型
を示す図である。FIG. 5 is a view showing a cutting die for a semiconductor device according to one embodiment of the present invention.
【図6】図3に示す従来例を改善した半導体装置用切断
金型を示す図である。FIG. 6 is an improvement of the conventional example shown in FIG .
It is a figure showing a metallic mold .
1 ポンチ 2 ダイス 3 イジェクトピン 4 被切断物 5 下死点 6 切断クズ 7 テーパー部 8 多ピンイジェクト型ポンチ 9 差動型ポンチ 10 高圧エアー型ポンチ DESCRIPTION OF SYMBOLS 1 Punch 2 Dice 3 Eject pin 4 Object to be cut 5 Bottom dead center 6 Cutting waste 7 Tapered part 8 Multi-pin eject type punch 9 Differential type punch 10 High pressure air type punch
Claims (1)
体装置の切断金型であって、 前記ポンチは、軸方向に沿って分割した構造とし、切断
クズのはい上がりを防止するために互いに軸方向に差動
可能としたものであることを特徴とする半導体装置用切
断金型。1. A cutting die for a semiconductor device having a punch for processing an object to be cut, wherein the punch has a structure divided along an axial direction, and the punches are separated from each other in order to prevent cutting waste from rising. A cutting mold for a semiconductor device, characterized in that the cutting mold can be made differential in a direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4059389A JP2798546B2 (en) | 1992-02-13 | 1992-02-13 | Cutting dies for semiconductor devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4059389A JP2798546B2 (en) | 1992-02-13 | 1992-02-13 | Cutting dies for semiconductor devices |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05226539A JPH05226539A (en) | 1993-09-03 |
| JP2798546B2 true JP2798546B2 (en) | 1998-09-17 |
Family
ID=13111884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4059389A Expired - Lifetime JP2798546B2 (en) | 1992-02-13 | 1992-02-13 | Cutting dies for semiconductor devices |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2798546B2 (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5363689A (en) * | 1976-11-17 | 1978-06-07 | Jiyunichi Nabeya | Punching method and punching die being used therein |
| JPS6256237U (en) * | 1985-09-30 | 1987-04-07 | ||
| JPH0296744U (en) * | 1989-01-21 | 1990-08-01 |
-
1992
- 1992-02-13 JP JP4059389A patent/JP2798546B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH05226539A (en) | 1993-09-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |