JP2801355B2 - Nickel-plated copper wire and its manufacturing method - Google Patents
Nickel-plated copper wire and its manufacturing methodInfo
- Publication number
- JP2801355B2 JP2801355B2 JP10694290A JP10694290A JP2801355B2 JP 2801355 B2 JP2801355 B2 JP 2801355B2 JP 10694290 A JP10694290 A JP 10694290A JP 10694290 A JP10694290 A JP 10694290A JP 2801355 B2 JP2801355 B2 JP 2801355B2
- Authority
- JP
- Japan
- Prior art keywords
- nickel
- copper
- wire
- core wire
- plated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/015—Manufacture or treatment of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/015—Manufacture or treatment of bond wires
- H10W72/01565—Thermally treating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/521—Structures or relative sizes of bond wires
- H10W72/522—Multilayered bond wires, e.g. having a coating concentric around a core
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5525—Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/555—Materials of bond wires of outermost layers of multilayered bond wires, e.g. material of a coating
Landscapes
- Electroplating Methods And Accessories (AREA)
- Non-Insulated Conductors (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明はニッケルめっき銅線とその製造方法に関し、
更に詳しくは、耐食性が優れ、電子部品や電子機器のリ
ード線に用いた場合に、耐変色性が良好であるニッケル
めっき銅線とその製造方法に関する。The present invention relates to a nickel-plated copper wire and a method for manufacturing the same.
More specifically, the present invention relates to a nickel-plated copper wire having excellent corrosion resistance and good discoloration resistance when used for a lead wire of an electronic component or an electronic device, and a method of manufacturing the same.
(従来の技術) 電子部品や電子機器のリード線には、半田付け性が良
好であることからして、従来から銀被覆銅線が多用され
ている。しかし、このリード線は銀で被覆されているの
で高価である。(Prior Art) Silver-coated copper wires have been frequently used for lead wires of electronic components and electronic devices because of their good solderability. However, this lead is expensive because it is coated with silver.
このため、最近では、銅または銅合金から成る芯線の
表面に、銀に代えてニッケルめっきを施したリード線が
広く用いられている。このニッケルめっき銅線は、芯線
の構成材料である銅または銅合金の良導電性,良加工
性,耐熱性のような特性が充分に発揮されることに加え
て、ニッケル特有の耐食性も備えており、かつ銀に比べ
て安価であるという利点がある。For this reason, in recent years, lead wires in which the surface of a core wire made of copper or a copper alloy is plated with nickel instead of silver are widely used. This nickel-plated copper wire not only exhibits the properties such as good conductivity, good workability, and heat resistance of copper or copper alloy as a constituent material of the core wire, but also has the corrosion resistance peculiar to nickel. And has the advantage of being cheaper than silver.
(発明が解決しようとする課題) ところで、上記したニッケルめっき銅線を用いて、例
えば、ダイオード製造時におけるシリコンチップの半田
付けを行なった場合、ニッケルめっき銅線は、この工程
において、300〜400℃の温度で約1時間の半田付け、更
に200〜250℃の温度で16時間のキュアという高温環境に
曝される。(Problems to be Solved by the Invention) By the way, for example, when a silicon chip is soldered at the time of manufacturing a diode using the above-described nickel-plated copper wire, the nickel-plated copper wire becomes 300 to 400 in this step. It is exposed to a high temperature environment of about 1 hour of soldering at a temperature of 200 ° C. and curing for 16 hours at a temperature of 200 to 250 ° C.
しかしながら、ニッケルめっき銅線が上記したような
高温環境に曝されると、芯線の部分を構成する銅成分が
ニッケルめっき層の中を表面に向かって拡散し、その結
果、ニッケルめっき銅線の表面は変色してその耐食性が
低下するという問題が発生する。However, when the nickel-plated copper wire is exposed to the high-temperature environment as described above, the copper component constituting the core wire diffuses through the nickel-plated layer toward the surface. Has a problem in that it is discolored and its corrosion resistance is reduced.
本発明は上記した問題を解決し、高温環境下にあって
も表面の変色が少なく、したがって耐食性の低下も少な
いニッケルめっき銅線の製造方法の提供を目的とする。An object of the present invention is to solve the above-mentioned problems, and to provide a method for producing a nickel-plated copper wire with less discoloration of the surface even under a high-temperature environment, and hence less decrease in corrosion resistance.
(課題を解決するための手段) 本発明者らは、上記した目的を達成するために鋭意研
究を重ねたところ、ニッケルめっき層を粗大結晶粒のニ
ッケルで構成すると、この粗大結晶粒にはピンホールや
粒界が少ないので、芯線の銅成分の表面への拡散が抑制
され、その結果、表面変色と耐食性の低下が抑制される
との事実を見出した。(Means for Solving the Problems) The present inventors have conducted intensive studies in order to achieve the above-mentioned object. As a result, when the nickel plating layer is composed of coarse crystal grains of nickel, the coarse crystal grains have no pin. It has been found that since there are few holes and grain boundaries, diffusion of the copper component of the core wire to the surface is suppressed, and as a result, surface discoloration and deterioration of corrosion resistance are suppressed.
そして、このニッケルめっき層におけるニッケルの結
晶粒径の大小は、その下地である芯線の銅の結晶粒径の
大小に規定されるとの知見も勘案することにより、本発
明のニッケルめっき銅線とその製造方法を開発するに到
った。The nickel-plated copper wire of the present invention is also considered in view of the fact that the crystal grain size of nickel in the nickel-plated layer is determined by the crystal grain size of copper of the core wire as the base. We have developed a manufacturing method.
すなわち、本発明のニッケルめっき銅線は、銅または
銅合金から成り、銅の結晶粒径が5.0μm以上である芯
線と、該芯線の表面に電気めっき法で被覆形成されてい
る厚み0.1〜5.0μmのニッケルめっき層とから成ること
を特徴とし、また、その製造方法は、伸線処理された銅
または銅合金から成る芯線に焼鈍処理を施して銅の結晶
粒径を5.0μm以上に調整し、ついで、前記芯線の表面
に電気めっきを施して厚み0.1〜5.0μmのニッケルめっ
き層を形成することを特徴とする。That is, the nickel-plated copper wire of the present invention is made of copper or a copper alloy, and has a core wire having a crystal grain size of copper of 5.0 μm or more, and a thickness of 0.1 to 5.0, which is formed by electroplating the surface of the core wire. and a nickel plating layer having a thickness of μm, and a method for producing the same is characterized in that a core wire made of drawn copper or a copper alloy is subjected to an annealing treatment to adjust the crystal grain size of copper to 5.0 μm or more. Then, electroplating is performed on the surface of the core wire to form a nickel plating layer having a thickness of 0.1 to 5.0 μm.
まず、本発明のニッケルめっき銅線の芯線は、銅また
は銅合金で構成される。具体的にはタフピッチ銅(TP
C)や、Cu−0.1%Ag,Cu−0.15%Snなどである。また、
鋼線の表面に銅をクラッドして成るEF線であってもよ
い。First, the core of the nickel-plated copper wire of the present invention is made of copper or a copper alloy. Specifically, tough pitch copper (TP
C), Cu-0.1% Ag, Cu-0.15% Sn, and the like. Also,
An EF wire formed by cladding copper on the surface of a steel wire may be used.
この芯線においては、銅の結晶粒径が5.0μm以上の
大きさに調整されている。この結晶粒径が5.0μmより
小さい場合には、この芯線の表面に後述する電気めっき
法でニッケルめっき層を形成したときに、ニッケルの結
晶粒径は、銅の結晶粒径の大きさに追随するので、ニッ
ケルの結晶粒径も小さくなり、その結果、ニッケルめっ
き層にはピンホールや粒界が多数存在するようになっ
て、ニッケルめっき層による芯線からの銅の拡散防止効
果が低下するからである。In this core wire, the crystal grain size of copper is adjusted to a size of 5.0 μm or more. When the crystal grain size is smaller than 5.0 μm, when a nickel plating layer is formed on the surface of the core wire by an electroplating method described later, the nickel crystal grain size follows the copper crystal grain size. Therefore, the crystal grain size of nickel also becomes small, and as a result, many pinholes and grain boundaries are present in the nickel plating layer, and the effect of the nickel plating layer to prevent copper from diffusing from the core wire is reduced. It is.
芯線の表面に形成されるニッケルめっき層の厚みは0.
1〜5.0μmに設定される。この厚みが0.1μmより薄い
場合は、得られるニッケルめっき銅線の耐変色性や耐食
性が不充分となり、また厚みを5.0μmより厚くして
も、そのめっき層ではニッケルの粗大結晶が形成されな
いからである。ニッケルめっき層の好ましい厚みは、0.
5〜3.0μm程度である。The thickness of the nickel plating layer formed on the surface of the core wire is 0.
It is set to 1 to 5.0 μm. If the thickness is less than 0.1 μm, the resulting nickel-plated copper wire will have insufficient discoloration resistance and corrosion resistance, and even if the thickness is greater than 5.0 μm, nickel-coarse crystals will not be formed in the plating layer. It is. The preferred thickness of the nickel plating layer is 0.
It is about 5 to 3.0 μm.
本発明のニッケルめっき銅線は次のようにして製造さ
れる。The nickel-plated copper wire of the present invention is manufactured as follows.
まず、所定の線径にまで伸線処理された芯線に焼鈍処
理を施して銅の結晶粒径を5.0μm以上の大きさに調整
する。First, the core wire drawn to a predetermined wire diameter is annealed to adjust the crystal grain size of copper to a size of 5.0 μm or more.
伸線処理を受けた芯線は、その伸線時に加えられた減
面加工によって、一般に、銅の結晶粒径が小さくなって
いる。In the core wire that has been subjected to the wire drawing, the crystal grain size of copper is generally small due to the surface reduction applied during the wire drawing.
したがって、この芯線に焼鈍処理を施すことにより、
銅の結晶粒を粗大化し、その結晶粒径を5.0μm以上に
調整する。Therefore, by performing an annealing treatment on this core wire,
The copper crystal grains are coarsened and the crystal grain size is adjusted to 5.0 μm or more.
焼鈍処理の条件は、伸線された芯線への減面加工率や
その結果としての銅結晶粒径の大きさによって適宜選定
されるが、通常、焼鈍温度300℃以上,焼鈍時間0.1〜25
0分の範囲内で選定される。The conditions of the annealing treatment are appropriately selected depending on the reduction rate of the area of the drawn core wire and the size of the resulting copper crystal grain size. Usually, the annealing temperature is 300 ° C. or more and the annealing time is 0.1 to 25.
Selected within the range of 0 minutes.
ついで、焼鈍処理が施された芯線に電気めっき法でニ
ッケルめっきが施される。Next, nickel plating is applied to the annealed core wire by an electroplating method.
このときの電気めっきの条件、例えば、用いるめっき
浴の組成,浴温,電流密度などは、従来からニッケルめ
っきに採用されている条件を転用すればよい。このと
き、上記条件の外、めっき時間などを適宜選定すること
により、ニッケルめっき層の厚みを0.1〜5.0μmの範囲
に調節する。The conditions of the electroplating at this time, for example, the composition of the plating bath to be used, the bath temperature, the current density, etc., may be the same as the conditions conventionally used for nickel plating. At this time, the thickness of the nickel plating layer is adjusted to a range of 0.1 to 5.0 μm by appropriately selecting a plating time and the like in addition to the above conditions.
この電気めっきの過程で、ニッケルめっき層は下地で
ある芯線の銅結晶粒に沿って成長していく。したがっ
て、銅結晶の粒径が5.0μm以上であるため、ニッケル
めっき層を構成するニッケルの結晶粒は粗大化し、銅の
拡散防止効果が大きくなる。In the course of the electroplating, the nickel plating layer grows along the copper crystal grains of the core wire as the base. Therefore, since the grain size of the copper crystal is 5.0 μm or more, the crystal grains of nickel constituting the nickel plating layer are coarsened, and the effect of preventing copper diffusion is increased.
(発明の実施例) 実施例1〜9,比較例1〜3 第1表に示した材料と、銅の結晶粒径を有する線径0.
8mmの芯線に、N2雰囲気炉内で第1表に示した条件の焼
鈍処理を行なって、それぞれの銅結晶粒径を第1表に示
した大きさに調整した。(Examples of the Invention) Examples 1 to 9 and Comparative Examples 1 to 3 The materials shown in Table 1 and a wire diameter having a crystal grain diameter of copper of 0.1 were used.
An 8 mm core wire was subjected to an annealing treatment in an N 2 atmosphere furnace under the conditions shown in Table 1 to adjust the respective copper crystal grain sizes to the sizes shown in Table 1.
ついで、各芯線に下記条件の電気めっきを施して、第
1表に示した厚みでニッケルめっき層を形成した。Next, each core wire was subjected to electroplating under the following conditions to form a nickel plating layer having a thickness shown in Table 1.
浴組成 :スルファミン酸ニッケル300g/, 塩化ニッケル30g/,ホウ酸30g/ 浴温 :55℃ 電流密度:5A/dm2 得られた各ニッケルめっき銅線につき、下記の仕様で
評価試験を行った。Bath composition: Nickel sulfamate 300 g /, Nickel chloride 30 g /, Boric acid 30 g / Bath temperature: 55 ° C Current density: 5 A / dm 2 The obtained nickel-plated copper wires were evaluated according to the following specifications.
銅拡散量:ニッケルめっき銅線に、350℃の水素雰囲
気中で1時間の熱処理を施し、ついで250℃の大気雰囲
気中で16時間の熱処理を施したのち、表面(ニッケルめ
っき層の表面)から100Åの深さまでのめっき層中にお
ける銅の量を定量した。この定量値が小さいものほど、
ニッケルめっき層の銅拡散防止能は良好であることを示
す。Copper diffusion amount: Nickel-plated copper wire is subjected to heat treatment for 1 hour in a hydrogen atmosphere at 350 ° C, and then to heat treatment for 16 hours in an air atmosphere at 250 ° C, from the surface (the surface of the nickel plating layer). The amount of copper in the plating layer up to a depth of 100 mm was quantified. The smaller the quantitative value, the more
This shows that the nickel plating layer has good copper diffusion preventing ability.
耐食性 :銅拡散量の測定の場合と同じ条件でニッケ
ルめっき銅線に熱処理を施したのち、15%塩酸溶液に浸
漬して乾燥し、ついで、200℃の大気雰囲気中で10時間
の熱処理を施し、発生した腐食面積を線材の全面に対す
る腐食部分の面積の割合(%)として算出した。Corrosion resistance: heat-treated nickel-plated copper wire under the same conditions as those used for copper diffusion measurement, immersed in a 15% hydrochloric acid solution and dried, and then heat-treated at 200 ° C in an air atmosphere for 10 hours. The corrosion area generated was calculated as the ratio (%) of the area of the corroded portion to the entire surface of the wire.
この値が小さいものほど、耐食性に優れていることを
表す。The smaller the value, the better the corrosion resistance.
加工性 :ニッケルめっき銅線の50mm長さに対し、正
方向40回,逆方向30回の捻回テストを行い、ニッケルめ
っきの健全性を評価した。Workability: Twisting test was performed 40 times in the forward direction and 30 times in the reverse direction for a 50 mm length of the nickel-plated copper wire, and the soundness of the nickel plating was evaluated.
○:ニッケルめっきの剥離なし、 ×:ニッケルめっきの剥離あり。:: No peeling of nickel plating, ×: Peeling of nickel plating.
以上の結果を一括して第1表に示した。 The above results are collectively shown in Table 1.
(発明の効果) 以上の説明で明らかなように、本発明のニッケルめっ
き銅線は、芯線の銅結晶粒径が大きいので、芯線表面に
形成されるニッケルめっき層のニッケル結晶粒径も大き
くなり、その結果、高温環境に曝されて芯線の銅成分が
表面に拡散しようとしても、前記ニッケルめっき層がそ
れを抑制して、表面の変色が抑制され、また耐食性も向
上する。したがって、本発明のニッケルめっき銅線は、
電子部品や電子機器のリード線として、その工業的価値
は大である。 (Effects of the Invention) As is clear from the above description, the nickel-plated copper wire of the present invention has a large copper crystal grain size of the core wire, so that the nickel crystal grain size of the nickel plating layer formed on the core wire surface also becomes large. As a result, even if the copper component of the core wire attempts to diffuse to the surface due to exposure to a high-temperature environment, the nickel plating layer suppresses the diffusion, suppressing discoloration of the surface and improving corrosion resistance. Therefore, the nickel-plated copper wire of the present invention
Its industrial value is great as a lead wire for electronic components and electronic equipment.
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) C25D 5/00 - 7/12──────────────────────────────────────────────────続 き Continued on front page (58) Field surveyed (Int. Cl. 6 , DB name) C25D 5/00-7/12
Claims (2)
5.0μm以上である芯線と、該芯線の表面に電気めっき
法で被覆形成されている厚み0.1〜5.0μmのニッケルめ
っき層とから成ることを特徴とするニッケルめっき銅
線。Claims: 1. A copper or copper alloy having a crystal grain size of copper.
A nickel-plated copper wire comprising: a core wire having a thickness of 5.0 μm or more; and a nickel plating layer having a thickness of 0.1 to 5.0 μm and formed on the surface of the core wire by electroplating.
線に焼鈍処理を施して銅の結晶粒径を5.0μm以上に調
整し、ついで、前記芯線の表面に電気めっきを施して厚
み0.1〜5.0μmのニッケルめっき層を形成することを特
徴とするニッケルめっき銅線の製造方法。2. A core wire made of a drawn copper or copper alloy is subjected to an annealing treatment to adjust the crystal grain size of copper to 5.0 μm or more, and then the surface of said core wire is electroplated to a thickness of 0.1 μm. A method for producing a nickel-plated copper wire, comprising forming a nickel-plated layer having a thickness of 5.0 μm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10694290A JP2801355B2 (en) | 1990-04-23 | 1990-04-23 | Nickel-plated copper wire and its manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10694290A JP2801355B2 (en) | 1990-04-23 | 1990-04-23 | Nickel-plated copper wire and its manufacturing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH046296A JPH046296A (en) | 1992-01-10 |
| JP2801355B2 true JP2801355B2 (en) | 1998-09-21 |
Family
ID=14446435
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10694290A Expired - Lifetime JP2801355B2 (en) | 1990-04-23 | 1990-04-23 | Nickel-plated copper wire and its manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2801355B2 (en) |
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| JP2009004256A (en) * | 2007-06-22 | 2009-01-08 | Hitachi Cable Ltd | Composite conductor and wiring cable using the same |
| JP5159269B2 (en) * | 2007-11-22 | 2013-03-06 | 東京特殊電線株式会社 | Composite wires and coils |
| JP5708846B1 (en) * | 2014-02-26 | 2015-04-30 | 株式会社オートネットワーク技術研究所 | Stranded conductor and insulated wire |
| JP6219553B2 (en) * | 2015-09-01 | 2017-10-25 | 古河電気工業株式会社 | Plating material excellent in heat resistance and method for producing the same |
| CN113106505A (en) * | 2020-01-13 | 2021-07-13 | 深圳市业展电子有限公司 | Surface treatment process for improving high-temperature anti-oxidation performance of resistor body and resistor body thereof |
-
1990
- 1990-04-23 JP JP10694290A patent/JP2801355B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH046296A (en) | 1992-01-10 |
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