JP2810554B2 - Circuit board manufacturing method - Google Patents
Circuit board manufacturing methodInfo
- Publication number
- JP2810554B2 JP2810554B2 JP3058817A JP5881791A JP2810554B2 JP 2810554 B2 JP2810554 B2 JP 2810554B2 JP 3058817 A JP3058817 A JP 3058817A JP 5881791 A JP5881791 A JP 5881791A JP 2810554 B2 JP2810554 B2 JP 2810554B2
- Authority
- JP
- Japan
- Prior art keywords
- powder
- insulating film
- film
- substrate
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0213—Electrical arrangements not otherwise provided for
- H05K1/0216—Reduction of cross-talk, noise or electromagnetic interference
- H05K1/0218—Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
- Paints Or Removers (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Structure Of Printed Boards (AREA)
Description
【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION
【0001】[0001]
【産業上の利用分野】本発明は回路基板の製造方法に関
し、特にカメラ等の光学機器、家電製品、コンピュータ
ー、ワードプロセッサーあるいは計測機器等に用いられ
る回路基板の製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a circuit board, and more particularly to a method of manufacturing a circuit board used for an optical device such as a camera, a home appliance, a computer, a word processor or a measuring device.
【0002】[0002]
【従来の技術】従来、回路基板を製造する一般的な方法
は、絶縁性基板上にフォトリソ技術または導電性ペース
トを用いたスクリーン印刷等で銅箔の回路パターンを形
成し、その後ソルダーレジスト等を回路の表面に塗布し
て絶縁層を設け、次いで絶縁層の表面に導電性ペースト
を塗布してシールド層を設けさらにシールド層上にソル
ダーレジスト等で絶縁層を設けるものであった。2. Description of the Related Art Conventionally, a general method of manufacturing a circuit board is to form a circuit pattern of a copper foil on an insulating substrate by photolithography or screen printing using a conductive paste, and then apply a solder resist or the like. In this method, an insulating layer is provided by coating the surface of a circuit, and then a conductive paste is applied to the surface of the insulating layer to form a shield layer.
【0003】電磁波をシールドする方法には、上記のシ
ールド層を設ける方法の他に回路基板を板金で囲んでシ
ールドする方法が挙げられる。また、回路パターン上の
絶縁層は、ドライフィルムをラミネートすることによっ
ても設けられている。As a method of shielding electromagnetic waves, there is a method of shielding a circuit board by surrounding it with a sheet metal, in addition to the method of providing the above-mentioned shield layer. The insulating layer on the circuit pattern is also provided by laminating a dry film.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、従来の
回路基板の製造方法によると、回路を構成する銅線の角
部で絶縁層の厚みが薄くなるため、この部分で絶縁層が
破損し易かった。また、従来の回路基板の製造方法は銅
線と銅線の間に気泡等が混入して絶縁破壊あるいは絶縁
不良が発生しやすく、大きな問題となっていた。さらに
は、従来の回路基板の製造方法は、工程が複雑で製造時
間も長くかかるため、コスト的にも問題があった。However, according to the conventional method of manufacturing a circuit board, since the thickness of the insulating layer is reduced at the corners of the copper wires constituting the circuit, the insulating layer is easily damaged at this portion. . Further, in the conventional method of manufacturing a circuit board, air bubbles and the like are mixed between copper wires, which easily causes insulation breakdown or insulation failure, which has been a serious problem. Further, the conventional circuit board manufacturing method has a problem in terms of cost because the process is complicated and the manufacturing time is long.
【0005】また、従来の板金により回路基板を囲んで
シールドする方法は、板金を設置するために広いスペー
スを必要とし、製品の小型化には不向きなものであっ
た。Further, the conventional method of shielding a circuit board by surrounding it with a sheet metal requires a large space for installing the sheet metal and is not suitable for miniaturization of a product.
【0006】本発明は、この様な従来技術の欠点を改善
するためになされたものであり、回路パターン上の絶縁
層,シールド層の膜厚が均一で絶縁不良がなく、また電
磁波シールド効果が高い回路基板およびその製造方法を
提供することを目的とするものである。The present invention has been made in order to improve such disadvantages of the prior art, and has a uniform insulating layer and shield layer on a circuit pattern, no insulation failure, and an electromagnetic wave shielding effect. It is an object to provide a high circuit board and a method for manufacturing the same.
【0007】[0007]
【課題を解決するための手段】本発明による回路基板の
製造方法は、基板上に導線からなる回路パターンを形成
する第1の工程と、前記回路パターンに第1の絶縁膜を
被覆する第2の工程と、前記第1の絶縁膜に導電膜を被
覆する第3の工程とを有し、少なくとも前記第3の工程
に、電着塗料中に前記基板を浸漬して前記導線を電極と
した電着塗装法を用いることを特徴とするものである。According to the present invention, there is provided a method of manufacturing a circuit board, comprising: a first step of forming a circuit pattern composed of conductive wires on the board; and a second step of coating the circuit pattern with a first insulating film. And a third step of coating the first insulating film with a conductive film. At least in the third step, the substrate is immersed in an electrodeposition paint to make the conductive wire an electrode. It is characterized by using an electrodeposition coating method.
【0008】[0008]
【0009】本発明の回路基板は、カメラ等の光学機
器、家電製品、ワードプロセッサー、コンピューター、
あるいは計測機器等のあらゆる電機製品に使用されるも
のである。本発明の回路基板は、図1に示すように、絶
縁性基板1上に形成されている導線2の周囲を第1の絶
縁膜4が被覆し、第1の絶縁膜4の周囲を導電膜3が被
覆するものである。導電膜3は電磁波をシールドするシ
ールド層である。導線2により絶縁性基板1上に回路パ
ターンが形成される。導線2は銅で形成するのが好まし
い。導電膜3の周囲は、必要に応じ更に絶縁膜5が被覆
する。絶縁膜5は、本発明の回路基板を、電機製品に設
置したとき本発明の回路基板が他の部品に接触して短絡
するのを防ぐためのものである。[0009] The circuit board of the present invention can be used for optical devices such as cameras, home appliances, word processors, computers,
Alternatively, it is used for all electric products such as measuring instruments. As shown in FIG. 1, a circuit board according to the present invention has a first insulating film 4 covering the periphery of a conductive wire 2 formed on an insulating substrate 1, and a conductive film surrounding the first insulating film 4. 3 is to coat. The conductive film 3 is a shield layer that shields electromagnetic waves. A circuit pattern is formed on the insulating substrate 1 by the conductor 2. The conductor 2 is preferably formed of copper. The periphery of the conductive film 3 is further covered with an insulating film 5 as necessary. The insulating film 5 is for preventing the circuit board of the present invention from contacting other components and short-circuiting when the circuit board of the present invention is installed on an electric appliance.
【0010】本発明の回路基板では、各膜3,4,5の
うち少なくとも膜3を電着塗装法により形成する。電着
塗装法により形成した膜は、最終的に熱又は光を照射し
て硬化させる。In the circuit board of the present invention, at least the film 3 among the films 3, 4, and 5 is formed by an electrodeposition coating method. The film formed by the electrodeposition coating method is finally cured by irradiating heat or light.
【0011】電着塗装法とは、被膜となる物質の溶解し
た溶液(以下、電着塗料)中に、一対の電極を配置して
直流電圧を加えることにより、電極上に上記物質を付着
させるものである。従って、本発明においては基板上に
形成された導線2が一方の電極となる。他方の電極とし
ては、例えばステンレス板を用いると良い。In the electrodeposition coating method, a pair of electrodes are arranged in a solution in which a substance to be a film is dissolved (hereinafter referred to as an electrodeposition coating), and a direct current voltage is applied thereto, whereby the above substances are attached to the electrodes. Things. Therefore, in the present invention, the conductive wire 2 formed on the substrate serves as one electrode. As the other electrode, for example, a stainless plate may be used.
【0012】電着塗装法については、従来から提案がな
されている。例えば、特開昭55−11175号公報に
より電着塗料を2回塗り重ねる方法が提案されている。
また、本出願人も特開平2−6564号でセラミック粉
体及び弗素樹脂粉体を含有する電着塗料を提案してい
る。[0012] Electrodeposition coating methods have been conventionally proposed. For example, Japanese Patent Application Laid-Open No. 55-11175 proposes a method of applying an electrodeposition coating twice.
The present applicant has also proposed in JP-A-2-6564 an electrodeposition paint containing a ceramic powder and a fluorine resin powder.
【0013】絶縁性基板1には、一般に知られている、
例えばポリカーボネート樹脂、ポリエーテルイミド樹
脂、ガラス繊維充填ABS樹脂、ガラスエポキシ樹脂等
の絶縁基板を用いることができる。The insulating substrate 1 has a generally known structure.
For example, an insulating substrate such as a polycarbonate resin, a polyetherimide resin, a glass fiber-filled ABS resin, and a glass epoxy resin can be used.
【0014】導線2による回路パターンは、一般に知ら
れているフォトリソ技術により形成することができる。
即ち、絶縁性基板1上に、例えば銅箔をラミネートし、
更に銅箔上にレジストを塗布した後、所望のパターンを
有するマスクを用いて露光、つづいて現像、エッチング
により回路パターンを形成することができる。The circuit pattern of the conductor 2 can be formed by a generally known photolithography technique.
That is, for example, a copper foil is laminated on the insulating substrate 1,
Further, after applying a resist on the copper foil, a circuit pattern can be formed by exposure using a mask having a desired pattern, followed by development and etching.
【0015】導線2の周囲には、電着可能な樹脂を用い
て電着塗装法により絶縁膜4を形成する。An insulating film 4 is formed around the conductor 2 by an electrodeposition coating method using an electrodepositable resin.
【0016】電着塗装法に使用される樹脂は、従来から
種々研究されている。樹脂が電着し得るためには、電着
塗料としたとき、荷電するものでなければならない。荷
電した樹脂は、直流電圧を印加したときアノードあるい
はカソードへ引かれ電極上に析出して被膜となる。本発
明で使用する樹脂としては、例えばアクリル・メラミン
系、アクリル系、エポキシ系、ウレタン系、アルキツド
系等、従来から電着塗装法に用いられている樹脂が使用
できる。Various resins have been studied for the electrodeposition coating method. In order for the resin to be able to be electrodeposited, it must be charged when it is used as an electrodeposition paint. When a DC voltage is applied, the charged resin is drawn to the anode or the cathode and deposits on the electrode to form a film. As the resin used in the present invention, for example, resins conventionally used in the electrodeposition coating method such as acryl / melamine type, acrylic type, epoxy type, urethane type and alkyd type can be used.
【0017】本発明で使用する樹脂は、アニオン系樹脂
でもカチオン系樹脂でもかまわないが、実用的にはカル
ボキシル基を有する水溶性樹脂あるいは水分散性樹脂が
好ましい。カルボキシル基を有する樹脂プレポリマー
は、アンモニアまたは有機アミンに中和されることによ
り、水に溶解または分散する。The resin used in the present invention may be an anionic resin or a cationic resin, but practically a water-soluble resin having a carboxyl group or a water-dispersible resin is preferred. The resin prepolymer having a carboxyl group is dissolved or dispersed in water by being neutralized by ammonia or an organic amine.
【0018】電着塗料中における樹脂濃度は5〜20重
量%、好ましくは7〜15重量%の範囲が望ましい。The resin concentration in the electrodeposition paint is preferably in the range of 5 to 20% by weight, more preferably 7 to 15% by weight.
【0019】本発明で使用する電着塗料は、所望の樹脂
を水に溶解または分散したものが好ましいが、電着塗料
中に、更にアルコール系やグリコールエーテル系等の有
機溶剤を含有してもかまわない。有機溶剤の含有量は数
パーセントで十分である。The electrodeposition paint used in the present invention is preferably one in which a desired resin is dissolved or dispersed in water. However, the electrodeposition paint may further contain an alcohol-based or glycol ether-based organic solvent. I don't care. A few percent content of organic solvent is sufficient.
【0020】絶縁膜4には、セラミック粉体を含有させ
てもかまわない。絶縁膜4にセラミック粉体を含有させ
ると、絶縁膜4に熱を加えて硬化させる際に低温、例え
ば90〜100℃程度で十分に硬化させることができ
る。その結果、熱変形のない回路基板を得ることができ
る。The insulating film 4 may contain ceramic powder. When the insulating film 4 contains ceramic powder, it can be sufficiently cured at a low temperature, for example, about 90 to 100 ° C. when the insulating film 4 is cured by applying heat. As a result, a circuit board free from thermal deformation can be obtained.
【0021】セラミック粉体を含有する電着塗料を用い
て電着膜を形成すると、熱硬化が低温で行われる理由に
ついては、明らかでないが、セラミック粉体は、表面が
すぐに酸化されてしまう金属粒子と異なり、粉体表面が
ある程度活性化されたまま安定な状態で維持されるた
め、硬化時に粉体表面が架橋点となり電着膜の硬化を促
進するためと考えられる。When an electrodeposition film is formed using an electrodeposition coating material containing ceramic powder, it is not clear why the thermosetting is performed at a low temperature, but the surface of the ceramic powder is immediately oxidized. Unlike metal particles, it is considered that the powder surface is maintained in a stable state while being activated to some extent, so that the powder surface becomes a cross-linking point at the time of curing to accelerate the curing of the electrodeposited film.
【0022】絶縁膜4に含有せしめるセラミック粉体と
しては、例えば酸化アルミニウム、窒化チタン、窒化マ
ンガン、窒化タングステン、タングステンカーバイト、
窒化ランタン、硅酸アルミニウム、二硫化モリブテン、
酸化チタン、グラファイト、硅酸化合物等が挙げられ
る。Examples of the ceramic powder contained in the insulating film 4 include aluminum oxide, titanium nitride, manganese nitride, tungsten nitride, tungsten carbide,
Lanthanum nitride, aluminum silicate, molybdenum disulfide,
Examples include titanium oxide, graphite, and silicate compounds.
【0023】セラミック粉体は、粒径が大きすぎると絶
縁膜4の硬化が過剰となり脆くなる。また粒径が小さす
ぎると十分な効果が得られない。このため、セラミック
粉体の粒径は平均粒径で0.1〜5μm、特には0.5
〜2μmが好ましい。If the particle size of the ceramic powder is too large, the insulating film 4 is excessively hardened and becomes brittle. On the other hand, if the particle size is too small, a sufficient effect cannot be obtained. Therefore, the average particle diameter of the ceramic powder is 0.1 to 5 μm, particularly 0.5 μm.
22 μm is preferred.
【0024】絶縁膜4の形成に用いる電着塗料に含有す
るセラミック粉体の量としては、塗膜の物性例えば密着
性が良好で且つ、低温でも十分に硬化させることができ
る塗膜4を得るために、電着可能な樹脂100重量部に
対してセラミック粉体を0.5〜30重量部、特に2〜
25重量部分散させるのが好ましい。絶縁膜4中のセラ
ミック粉体の共析量としては10〜30wt%,特に1
5〜25wt%が好ましい。The amount of the ceramic powder contained in the electrodeposition coating material used for forming the insulating film 4 is such that the coating film 4 has good physical properties, such as good adhesion, and can be sufficiently cured even at a low temperature. For this reason, 0.5 to 30 parts by weight, especially 2 to 30 parts by weight of the ceramic powder is added to 100 parts by weight of the electrodepositable resin.
It is preferable to disperse 25 parts by weight. The amount of eutectoid of the ceramic powder in the insulating film 4 is 10 to 30 wt%, especially 1 to 30 wt%.
5-25 wt% is preferable.
【0025】粉体の含有する電着塗料を用いて電着塗装
を行うと、形成された膜中に粉体が析出するのは、電着
塗料中では粉体粒子の周囲に樹脂分子が吸着していて、
樹脂分子が電極に引き付けられるのに伴って粉体も電極
方向に移動するためと思われる。When electrodeposition coating is performed using an electrodeposition coating material containing powder, the powder is deposited in the formed film because resin molecules are adsorbed around the powder particles in the electrodeposition coating material. Have been
This is probably because the powder moves in the electrode direction as the resin molecules are attracted to the electrode.
【0026】絶縁膜4の形成後、シールド層となる導電
膜3を絶縁膜4の周囲に形成する。導電膜3は、導電粉
体を含有する電着塗料を用いて電着塗装を行うことによ
り形成する。電着塗料中に含有する導電粉体としては、
表面を金属めっきしたセラミック粉体(以下、金属化セ
ラミック粉体)あるいは表面を金属めっきした天然マイ
カ粉体(以下、金属化天然マイカ粉体)が好ましい。金
属化セラミック粉体あるいは金属化天然マイカ粉体は、
電着塗料中にどちらか一方のみを含有してもよいし、両
方を混合して含有してもかまわない。電着塗料中に金属
化セラミック粉体あるいは金属化天然マイカを含有させ
ると、前述したように電着終了後に加熱処理を行って電
着膜を硬化させる際に、加熱温度として通常の130〜
180℃必要なところを90℃〜100℃の低温で完全
に硬化させることができ好ましい。After the formation of the insulating film 4, a conductive film 3 serving as a shield layer is formed around the insulating film 4. The conductive film 3 is formed by performing electrodeposition coating using an electrodeposition paint containing a conductive powder. As the conductive powder contained in the electrodeposition paint,
A ceramic powder whose surface is metal-plated (hereinafter, metallized ceramic powder) or a natural mica powder whose surface is metal-plated (hereinafter, metallized natural mica powder) is preferable. Metallized ceramic powder or metallized natural mica powder
Either one of them may be contained in the electrodeposition paint, or both may be mixed and contained. When the metallized ceramic powder or the metallized natural mica is contained in the electrodeposition paint, when the heat treatment is performed after the completion of the electrodeposition to cure the electrodeposited film, the heating temperature is usually set to 130 to
It is preferable that 180 ° C. can be completely cured at a low temperature of 90 ° C. to 100 ° C.
【0027】本発明に於て用いられる金属化セラミック
粉体及び金属化天然マイカ粉体としては、セラミック粉
体或いは天然マイカ粉体の表面を、たとえばCu,N
i,Ag,Au,Sn等でめっきしたものが用いられ
る。これらの粉体表面のめっきはシールド性やコストの
点からCu,Ag及びNiを好適に用いることができ
る。粉体表面へのめっき方法としては無電解めっきが適
している。また、粉体表面のめっき厚としては0.05
〜3μm、特に0.15〜2μmとした場合、優れたシ
ールド性と低温硬化時の良好な塗膜物性を得ることがで
きる。3μmより厚くめっきを形成した場合、表面特性
が金属粒子と類似してしまい、表面が極めて活性なた
め、空気中で酸化されて低温による電着膜の硬化が不十
分となり易い。As the metallized ceramic powder and the metallized natural mica powder used in the present invention, for example, Cu, N
Those plated with i, Ag, Au, Sn or the like are used. For plating on the surface of these powders, Cu, Ag and Ni can be suitably used from the viewpoint of shielding properties and cost. Electroless plating is suitable as a plating method for the powder surface. The plating thickness on the powder surface is 0.05
When the thickness is from 3 to 3 μm, particularly from 0.15 to 2 μm, excellent shielding properties and good physical properties of the coating film at the time of low-temperature curing can be obtained. When the plating is formed thicker than 3 μm, the surface characteristics are similar to those of the metal particles, and the surface is extremely active. Therefore, the plating is oxidized in the air and the curing of the electrodeposited film at a low temperature tends to be insufficient.
【0028】又、粉体へのNiめっきの形成に於て、例
えば特開昭61−276979号公報に開示されている
様に、粉体の水性懸濁液を作製し、次いでこの懸濁液に
無電解ニッケルめっき老化液を添加して粉体表面にニッ
ケルめっきを形成させて、りん含有率の低い、例えば5
%以下としたNiめっきを施した場合、導電性が向上し
てCuめっき粉体とほぼ同等のシールド性を有する電着
膜を形成できる。In the formation of Ni plating on a powder, an aqueous suspension of the powder is prepared as disclosed in, for example, Japanese Patent Application Laid-Open No. 61-26979. To the surface of the powder by adding an electroless nickel plating aging solution, to obtain a low phosphorus content, e.g.
% Or less, the conductivity is improved, and an electrodeposition film having almost the same shielding properties as the Cu plating powder can be formed.
【0029】導電粉体に使用するセラミック粉体として
は、絶縁膜4に含有するセラミック粉体と同様のものが
使用できる。又、天然マイカとしてはフロゴバイトマイ
カ、セリサイトマイカ、マスコバイトマイカ等が挙げら
れる。As the ceramic powder used for the conductive powder, the same ceramic powder as that contained in the insulating film 4 can be used. Examples of natural mica include phlogovite mica, sericite mica, and muscobite mica.
【0030】金属化セラミック粉体あるいは金属化天然
マイカの平均粒径は、0.1〜5μm、好ましくは0.
5〜2μmの範囲が望ましく、0.1μm未満では二次
凝集作用が大きく、5μmを越えると沈降性あるいは化
粧性の問題で好ましくない。The average particle size of the metallized ceramic powder or metallized natural mica is 0.1 to 5 μm, preferably 0.1 to 5 μm.
The range of 5 to 2 μm is desirable, and if it is less than 0.1 μm, the secondary aggregating action is large, and if it exceeds 5 μm, it is not preferable because of sedimentation or cosmetic problems.
【0031】導電粉体としては、金属化セラミック粉体
及び金属化天然マイカの他に、表面を金属めっきした樹
脂粉体(以下、金属化樹脂粉体)や金属粉体を用いるこ
ともできる。As the conductive powder, in addition to metallized ceramic powder and metallized natural mica, resin powder (hereinafter, metallized resin powder) whose surface is plated with metal or metal powder can also be used.
【0032】金属化樹脂粉体に使用する樹脂粉体として
は、例えばフッ素樹脂、ポリエチレン樹脂、アクリル樹
脂、ポリスチレン樹脂、ナイロン等を用いることができ
る。樹脂粉体表面に施す金属めっきとしては、金属化セ
ラミック粉体の場合と同様のものを用いることができ
る。金属化樹脂粉体の平均粒径も、金属化セラミック粉
体の場合と同様である。As the resin powder used for the metallized resin powder, for example, fluorine resin, polyethylene resin, acrylic resin, polystyrene resin, nylon and the like can be used. As the metal plating applied to the surface of the resin powder, the same metal plating as in the case of the metallized ceramic powder can be used. The average particle size of the metallized resin powder is the same as that of the metallized ceramic powder.
【0033】金属粉体としては、例えばAu,Pd,A
g,Ni,Cu,Sn,Co,Mn,Fe,Te等の粉
体が挙げられる。金属粉体の粒径は平均粒子径0.01
〜5μm、好ましくは0.05〜4μm、更には0.0
5〜0.1μmの範囲が望ましく、0.01μm未満で
は2次凝集作用を生じ、5μmを越えると電着塗料中で
粉体が沈降してしまい好ましくない。金属粉体は、例え
ば熱プラズマ蒸発法等を用いて製造されたものが好まし
い。As the metal powder, for example, Au, Pd, A
g, Ni, Cu, Sn, Co, Mn, Fe, Te and the like powder. The average particle diameter of the metal powder is 0.01
-5 μm, preferably 0.05-4 μm, and more preferably 0.0
A range of 5 to 0.1 μm is desirable. If it is less than 0.01 μm, a secondary agglomeration action occurs, and if it exceeds 5 μm, the powder sediments in the electrodeposition paint, which is not preferable. The metal powder is preferably manufactured using, for example, a thermal plasma evaporation method.
【0034】尚、本発明において、導電粉体の粒径は、
遠心沈降式粒度分布測定器を用いて測定した値である。
この測定器として実際に用いたものはSACP−3(島
津製作所製)である。In the present invention, the particle size of the conductive powder is as follows:
It is a value measured using a centrifugal sedimentation type particle size distribution analyzer.
What was actually used as this measuring instrument is SACP-3 (manufactured by Shimadzu Corporation).
【0035】電着塗料中における導電粉体の含有量は、
電着可能な樹脂100重量部に対して0.2〜30重量
部、好ましくは10〜20重量部、更には7〜15重量
部の範囲が望ましい。The content of the conductive powder in the electrodeposition paint is as follows:
0.2 to 30 parts by weight, preferably 10 to 20 parts by weight, and more preferably 7 to 15 parts by weight with respect to 100 parts by weight of the electrodepositable resin.
【0036】なお、導電膜3中の導電粉体はX線マイク
ロアナライザーにより同定することができ、更に導電粉
体の共析量は熱重量分析で解析することにより測定する
ことができる。塗膜3中の導電粉体の共析量は5〜50
wt%,特に10〜40wt%,更には15〜35wt
%が好ましい。The conductive powder in the conductive film 3 can be identified by an X-ray microanalyzer, and the amount of eutectoid of the conductive powder can be measured by analyzing by thermogravimetric analysis. The amount of eutectoid of the conductive powder in the coating film 3 is 5 to 50.
wt%, especially 10 to 40 wt%, furthermore 15 to 35 wt%
% Is preferred.
【0037】導電膜3中に含有する導電粉体には金属化
セラミック粉体、金属化天然マイカ粉体、金属化樹脂粉
体及び金属粉体のうちの一種だけを用いてもよいし、例
えば金属化セラミック粉体と金属粉体というように二種
以上を混合して用いてもよい。好ましくは、金属化セラ
ミック粉体及び金属化天然マイカ粉体から選ばれる一種
または二種の導電粉体と、金属化樹脂粉体及び金属粉体
から選ばれる一種または二種の導電粉体とを混合して使
用するのが良い。これは、導電膜3中において、金属化
セラミック粉体及び/又は金属化天然マイカ粉体の空隙
を、金属粉体及び/又は金属化樹脂粉体が満たし、各粉
体間の接触面積が増大するためシールド性が一層向上す
ると共に、金属化セラミック粉体及び/又は金属化天然
マイカ粉体の作用により低温で導電膜3を硬化させるこ
とができるためである。この場合、導電粉体の混合割合
は、金属化セラミック粉体及び金属化天然マイカ粉体か
ら選ばれた一種または二種の導電粉体100重量部に対
して、金属化樹脂粉体及び金属粉体から選ばれた一種ま
たは二種の導電粉体を20〜300重量部とするのが好
ましい。As the conductive powder contained in the conductive film 3, only one of metalized ceramic powder, metalized natural mica powder, metalized resin powder and metal powder may be used. Two or more kinds such as metalized ceramic powder and metal powder may be mixed and used. Preferably, one or two kinds of conductive powder selected from metallized ceramic powder and metallized natural mica powder, and one or two kinds of conductive powder selected from metallized resin powder and metal powder It is good to mix and use. This is because the metal powder and / or the metallized resin powder fill the voids of the metallized ceramic powder and / or the metallized natural mica powder in the conductive film 3 and the contact area between the powders increases. Therefore, the shielding property is further improved, and the conductive film 3 can be cured at a low temperature by the action of the metallized ceramic powder and / or the metallized natural mica powder. In this case, the mixing ratio of the conductive powder is such that the metallized resin powder and the metal powder are mixed with 100 parts by weight of one or two types of conductive powder selected from metallized ceramic powder and metallized natural mica powder. It is preferable that one or two kinds of conductive powders selected from the body be 20 to 300 parts by weight.
【0038】導電膜3を電着塗装法により形成すること
により、導電膜3中に導電粉体が高密度に析出し、薄膜
であっても優れたシールド機能を示す。By forming the conductive film 3 by the electrodeposition coating method, the conductive powder is deposited in the conductive film 3 at a high density, and exhibits an excellent shielding function even in the case of a thin film.
【0039】導電膜3の形成後、必要に応じ更に絶縁膜
5を導電膜3の周囲に形成する。絶縁膜5は、絶縁膜4
のところで説明した材料と同様の材料を用い、絶縁膜4
と同様にして形成すればよい。従って、絶縁膜5につい
てもセラミック粉体を含有させてもよいし、含有させな
くてもよい。セラミック粉体は、絶縁層4と絶縁層5の
両方に含有してもよいし、どちらか一方のみに含有して
もよい。また、絶縁層4と絶縁層5のいずれにもセラミ
ック粉体を含有させなくてもよい。After the formation of the conductive film 3, an insulating film 5 is further formed around the conductive film 3 if necessary. The insulating film 5 is the insulating film 4
Using the same material as described in the above, the insulating film 4
It may be formed in the same manner as described above. Therefore, the insulating film 5 may or may not contain ceramic powder. The ceramic powder may be contained in both the insulating layer 4 and the insulating layer 5, or may be contained in only one of them. Also, neither the insulating layer 4 nor the insulating layer 5 may contain ceramic powder.
【0040】こうして、導線2の周囲に絶縁膜4,導電
膜3及び必要に応じて絶縁膜5を形成したのち、絶縁膜
4,5及び導電膜3を、熱,光あるいは熱及び光の両方
により硬化させる。樹脂を硬化させるエネルギーとして
は、熱でも光でもかまわないが、一様にしかも簡単に付
与できるという点で熱が好ましい。膜を硬化させる温度
及び加熱時間は、90〜100℃で20〜180分が好
ましい。また、熱及び光以外のエネルギーでも絶縁膜あ
るいは導電膜を硬化させることができる。After the insulating film 4, the conductive film 3 and the insulating film 5, if necessary, are formed around the conductor 2, the insulating films 4, 5 and the conductive film 3 are formed by heat, light or both heat and light. To cure. The energy for curing the resin may be heat or light, but heat is preferred because it can be applied uniformly and easily. The temperature for curing the film and the heating time are preferably from 90 to 100 ° C. and from 20 to 180 minutes. Further, the insulating film or the conductive film can be cured with energy other than heat and light.
【0041】絶縁膜4の厚みは5〜30μm、更には7
〜25μmが好ましい。The thickness of the insulating film 4 is 5 to 30 μm, and
2525 μm is preferred.
【0042】導電膜3の厚みは7〜40μm、更には1
0〜25μmが好ましい。The thickness of the conductive film 3 is 7 to 40 μm,
0-25 μm is preferred.
【0043】必要に応じ設ける絶縁膜5の厚みは10〜
30μm、更には10〜25μmが好ましい。The thickness of the insulating film 5 provided as required is 10 to
It is preferably 30 μm, more preferably 10 to 25 μm.
【0044】絶縁膜4,5及び導電膜3を電着塗装法に
より形成する場合、基板上の導線を電極としてもう一方
の電極と共に電着塗料中に浸漬して行う。電着塗料の温
度は20〜25℃、水濃イオン濃度はpH8〜9が好ま
しい。また、印加電圧は50〜170Vの直流電圧が好
ましく、電流密度は0.5〜3A/dm2、処理時間は
1〜5分が好ましい。絶縁膜4,5及び導電膜3に使用
する樹脂は、膜毎に種類を変えてもよい。When the insulating films 4, 5 and the conductive film 3 are formed by an electrodeposition coating method, they are immersed in an electrodeposition coating material together with the other electrode using a conductive wire on the substrate as an electrode. The temperature of the electrodeposition paint is preferably 20 to 25 ° C., and the concentration of the water-concentrated ion is preferably pH 8 to 9. Further, the applied voltage is preferably a DC voltage of 50~170V, current density 0.5~3A / dm 2, treatment time is preferably 1 to 5 minutes. The type of resin used for the insulating films 4 and 5 and the conductive film 3 may be changed for each film.
【0045】[0045]
【実施例】以下、実施例を示し本発明をさらに具体的に
説明するが、本発明は係る実施例のみに限定されるもの
ではない。EXAMPLES Hereinafter, the present invention will be described in more detail with reference to examples, but the present invention is not limited to these examples.
【0046】 実施例1 0.6mm厚のガラスエポキシ樹脂基板上に18μmの
銅箔をラミネートしたものを用いて、その表面にネガ型
レジスト(東京応化社製、OMR−83、粘度450c
p)をスピンナー塗布して、厚さ5μmの感光性材料層
を形成した。次いで、線巾0.5〜50mm,スペース
1〜20mmの範囲の各々のパターンマスクを用いて露
光し、現像した。次に、銅エッチング液(上村工業社
製、アルファイン)を用いて、スプレー方式によりエッ
チングし、銅パターン回路を形成した。Example 1 Using a glass epoxy resin substrate having a thickness of 0.6 mm laminated with a 18 μm copper foil, a negative resist (OMR-83, manufactured by Tokyo Ohka Co., viscosity 450c)
p) was applied by spinner to form a photosensitive material layer having a thickness of 5 μm. Subsequently, exposure and development were performed using each pattern mask having a line width of 0.5 to 50 mm and a space of 1 to 20 mm. Next, using a copper etchant (Alpha-in, manufactured by Uemura Kogyo Co., Ltd.), etching was performed by a spray method to form a copper pattern circuit.
【0047】その後、脱塩水を用いてアクリル・メラミ
ン系樹脂(商品名:ハニブライトCL−1;ハニー化成
社製)を濃度15wt%に稀釈した電着塗料を用いて、
pH8.5、浴温25℃の条件下で、基板を陽極とし
て、陰極にステンレス板を用いて、150Vの直流電圧
を3分間印加し、15μm厚の絶縁膜4を銅パターン回
路の上に形成した。Thereafter, using an electrodeposition paint obtained by diluting an acrylic / melamine resin (trade name: Hanibright CL-1; manufactured by Honey Kasei Co., Ltd.) to a concentration of 15 wt% using demineralized water,
Under a condition of pH 8.5 and a bath temperature of 25 ° C., a DC voltage of 150 V is applied for 3 minutes using a substrate as an anode and a stainless steel plate as a cathode to form a 15 μm thick insulating film 4 on the copper pattern circuit. did.
【0048】次に、別に用意したアクリル・メラミン系
樹脂(商品名ハニブライトCL−1、ハニー化成社製)
100重量部に、平均粒子径0.7μmのアルミナ上に
ニッケルめっきを0.2μmの厚さで施した粉体15重
量部を分散させ、更に脱塩水で樹脂と粉体の混合物が1
5wt%になるように稀釈した電着塗料中で、絶縁膜4
の形成条件と同一条件下で、絶縁膜4の周囲に厚さ17
μmの導電膜3を形成した。Next, a separately prepared acrylic / melamine resin (trade name: Hanibright CL-1, manufactured by Honey Kasei Co., Ltd.)
To 100 parts by weight, 15 parts by weight of a powder obtained by applying nickel plating to a thickness of 0.2 μm on alumina having an average particle diameter of 0.7 μm are dispersed, and the mixture of the resin and the powder is further mixed with demineralized water to obtain 1 part.
In the electrodeposition paint diluted to 5 wt%, the insulating film 4
Under the same conditions as the formation conditions, a thickness of 17
A μm conductive film 3 was formed.
【0049】さらに、絶縁膜4と同じ電着塗料を用い
て、絶縁膜4の形成条件と同一条件で導電膜3の周囲に
厚さ15μm厚の絶縁膜5を形成した最後に基板を水洗
し、その後97℃±1℃のオーブンに基板を入れて15
0分間加熱処理して本発明の回路基板を得た。Further, using the same electrodeposition paint as that for the insulating film 4, the insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 under the same conditions as those for forming the insulating film 4. Finally, the substrate was washed with water. Then, put the substrate in an oven at
Heat treatment was performed for 0 minutes to obtain a circuit board of the present invention.
【0050】得られた回路基板の物性(付着性、耐酸
性、耐アルカリ性、燃焼性)、絶縁抵抗および体積固有
抵抗を測定した。その結果を下記の表1〜3に示す。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability), insulation resistance and volume resistivity of the obtained circuit board were measured. The results are shown in Tables 1 to 3 below.
【0051】得られた絶縁膜及び導電膜は、緻密で隣接
する膜に十分に付着しており、耐酸性,耐アルカリ性及
び耐燃焼性も申し分ないものであった。The obtained insulating film and conductive film were dense and sufficiently adhered to the adjacent film, and were also excellent in acid resistance, alkali resistance and combustion resistance.
【0052】また、回路基板の電磁波シールド効果の測
定を、製品に組込み後、トランスミッションライン法
(ASTM ES7・83)で行なった。その結果を図
2に示す。電磁波シールド効果は、図2に示す通り、無
電解めっきとほぼ同一の効果であった(参考例1及び参
考例2参照)。Further, the measurement of the electromagnetic wave shielding effect of the circuit board was carried out by a transmission line method (ASTM ES783) after being incorporated into the product. The result is shown in FIG. The electromagnetic wave shielding effect was almost the same as the electroless plating as shown in FIG. 2 (see Reference Examples 1 and 2).
【0053】更に、この回路基板を、図1のように切断
して回路基板の断面を、オリンパス社製金属顕微鏡で観
察した(倍率400倍)。その結果、絶縁膜4,5及び
導電膜3はいずれも均一な厚みに形成されていた。Further, the circuit board was cut as shown in FIG. 1, and a cross section of the circuit board was observed with a metal microscope manufactured by Olympus (400 times magnification). As a result, the insulating films 4, 5 and the conductive film 3 were all formed to a uniform thickness.
【0054】 参考例1 ABS基板に膜厚0.7μmの銅薄膜および膜厚0.4
μmのニッケル薄膜を、ABS基板側から順次無電解め
っきで積層して金属めっき部材を得た。Reference Example 1 A copper thin film having a thickness of 0.7 μm and a film thickness of 0.4 were formed on an ABS substrate.
A μm nickel thin film was sequentially laminated by electroless plating from the ABS substrate side to obtain a metal plated member.
【0055】この金属めっき部材の電磁波シールド効果
の測定を、実施例1と同様の方法で行なった。その結果
を図2に示す。The measurement of the electromagnetic wave shielding effect of the metal plated member was performed in the same manner as in Example 1. The result is shown in FIG.
【0056】 参考例2 ABS基板に、ニッケル粉末を吹付け塗装してニッケル
塗膜を形成した。Reference Example 2 An ABS substrate was spray-coated with nickel powder to form a nickel coating film.
【0057】このニッケル塗膜を形成した部材の電磁波
シールド効果の測定を、実施例1と同様の方法で行なっ
た。その結果を図2に示す。The electromagnetic wave shielding effect of the member having the nickel coating film formed thereon was measured in the same manner as in Example 1. The result is shown in FIG.
【0058】 比較例1 実施例1と同様のガラスエポキシ樹脂基板上に実施例1
と同様にして銅パターン回路を形成した後、従来の方法
により、ソルダーレジスト(商品名FINEDEL D
SR・2200(C)、田村製作所製)、銀ペースト
(商品名LS−500、アサヒ化学研究所製)、ソルダ
ーレジスト(商品名FINEDEL DSR・2200
(C)、田村製作所製)をそれぞれ30μm,35μ
m,30μmの厚みで基板側から順次形成して回路基板
を得た。Comparative Example 1 Example 1 was formed on the same glass epoxy resin substrate as in Example 1.
After a copper pattern circuit is formed in the same manner as described above, a solder resist (trade name FINEDEL D) is formed by a conventional method.
SR-2200 (C), Tamura Seisakusho), silver paste (trade name LS-500, manufactured by Asahi Chemical Laboratory), solder resist (trade name FINEDEL DSR-2200)
(C), manufactured by Tamura Seisakusho) at 30 μm and 35 μm, respectively.
A circuit board was obtained by sequentially forming the circuit boards with thicknesses of m and 30 μm from the substrate side.
【0059】得られた回路基板の物性、絶縁抵抗および
体積固有抵抗を実施例1と同様にして測定した。その結
果を表1〜3に示す。The physical properties, insulation resistance and volume resistivity of the obtained circuit board were measured in the same manner as in Example 1. The results are shown in Tables 1 to 3.
【0060】[0060]
【表1】 [Table 1]
【0061】 (注)上記表の試験方法は下記のとおりである。 (1)付着性…JIS D0202 (2)耐酸性…10Vol%H2SO4で常温20分間浸
漬処理 (3)耐アルカリ性…5wt%NaOHで常温30分浸
漬処理 (4)燃焼性…UL94試験法(Note) The test methods in the above table are as follows. (1) Adhesion: JIS D0202 (2) Acid resistance: Immersion treatment with 10 Vol% H 2 SO 4 at room temperature for 20 minutes (3) Alkali resistance: Immersion treatment with 5 wt% NaOH at room temperature for 30 minutes (4) Flammability: UL94 test method
【0062】[0062]
【表2】 [Table 2]
【0063】(注)上記表の絶縁抵抗は、JIS Z3
197に準拠し、くし型電極G−10、基材吸湿処理は
55℃、98%RH,DC 500Vで1分値を示す。
抵抗値の測定はYHP社製、超絶縁抵抗測定器HP43
29Aを用いた。(Note) The insulation resistance in the above table is based on JIS Z3
In accordance with 197, the comb-shaped electrode G-10 and the substrate moisture absorption treatment show a value of 1 minute at 55 ° C., 98% RH, 500 V DC.
Measurement of resistance value is made by YHP, super insulation resistance measuring instrument HP43
29A was used.
【0064】[0064]
【表3】 [Table 3]
【0065】(注)上記表の固有抵抗値は、JIS C
6481により測定した値である。(Note) The specific resistance values in the above table are based on JIS C
6481.
【0066】実施例2 実施例1で用いたニッケルめっきアルミナ粉体15重量
部を、銅めっきアルミナ粉体10重量部にかえた以外
は、実施例1と同様にして本発明の回路基板を作成し
た。銅めっきアルミナ粉体のめっき厚みは0.2μmで
あった。また、アルミナ粉体の平均粒子径は1.2μm
であった。Example 2 A circuit board according to the present invention was prepared in the same manner as in Example 1, except that 15 parts by weight of the nickel-plated alumina powder used in Example 1 was changed to 10 parts by weight of the copper-plated alumina powder. did. The plating thickness of the copper-plated alumina powder was 0.2 μm. The average particle diameter of the alumina powder is 1.2 μm
Met.
【0067】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)、絶縁抵抗、体積固有抵抗及び電
磁波シールド効果を実施例1と同様の方法で測定した。
その結果、実施例1と同様の良好な効果が得られた。The physical properties (adhesion, acid resistance, alkali resistance, and flammability), insulation resistance, volume specific resistance, and electromagnetic wave shielding effect of this circuit board were measured in the same manner as in Example 1.
As a result, the same good effects as in Example 1 were obtained.
【0068】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0069】実施例3 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路及び絶縁膜4を形成した。Example 3 A copper pattern circuit and an insulating film 4 were formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0070】次に、別に用意したアクリル・メラミン系
樹脂(商品名ハニブライトCL−1、ハニ−化成社製)
100重量部に、平均粒子径1.0μmのアルミナ上に
銅めっきを0.2μmの厚さで施した粉体7重量部を分
散し、更に脱塩水で樹脂と粉体の混合物が15wt%に
なるように希釈した電着塗料中で、絶縁膜4の形成条件
と同一条件下で、絶縁膜4の周囲に厚さ17μmの導電
膜3を形成した。Next, a separately prepared acrylic / melamine resin (trade name: Hanibright CL-1, manufactured by Hani Kasei Co., Ltd.)
To 100 parts by weight, 7 parts by weight of a powder obtained by applying a copper plating on alumina having an average particle diameter of 1.0 μm to a thickness of 0.2 μm are dispersed, and then a mixture of the resin and the powder is reduced to 15 wt% with deionized water. The conductive film 3 having a thickness of 17 μm was formed around the insulating film 4 in the diluted electrodeposition paint under the same conditions as those for forming the insulating film 4.
【0071】最後に、基板を水洗し、その後、97℃±
1℃のオーブンに基板を入れて150分間加熱処理して
本発明の回路基板を得た。Finally, the substrate was washed with water, and then at 97 ° C. ±
The substrate was placed in a 1 ° C. oven and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0072】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)及び電磁波シールド効果を実施例
1と同様の方法で測定した。その結果、実施例1と同様
の良好な効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, and flammability) and the electromagnetic wave shielding effect of this circuit board were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0073】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0074】実施例4 0.8mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路を形成した。Example 4 A copper pattern circuit was formed on a 0.8 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0075】その後、脱塩水を用いてアルキッド系樹脂
(商品名TF121、神東塗料(株)社製)を濃度15
tw%に希釈した電着塗料を用いてpH8.5,浴温2
5℃の条件下で、基板を陽極として陰極にステンレス板
を用いて、150Vの直流電圧を3分間印加し、15μ
m厚の絶縁膜4を銅パターン回路の上に形成した。Thereafter, an alkyd resin (trade name: TF121, manufactured by Shinto Paint Co., Ltd.) having a concentration of 15 was prepared by using deionized water.
pH 8.5, bath temperature 2 using electrodeposition paint diluted to tw%
Under a condition of 5 ° C., a 150 V DC voltage was applied for 3 minutes using a stainless steel plate as a cathode with the substrate as an anode,
An m-thick insulating film 4 was formed on the copper pattern circuit.
【0076】次に、別に用意したアルキッド系樹脂(商
品名TF121、神東塗料(株)社製)100重量部
に、平均粒子径1.0μmのアルミナ上にニッケルめっ
きを0.1μmの厚さで施した粉体7重量部を分散し、
更に脱塩水で樹脂と粉体の混合物が15wt%になるよ
うに稀釈した電着塗料中で、絶縁膜4の形成条件と同一
条件下で、絶縁膜4の周囲に厚さ17μmの導電膜3を
形成した。Next, 100 parts by weight of an alkyd resin (trade name: TF121, manufactured by Shinto Paint Co., Ltd.) separately prepared was coated with nickel plating on alumina having an average particle diameter of 1.0 μm to a thickness of 0.1 μm. Disperse 7 parts by weight of the powder applied in
Further, a 17 μm thick conductive film 3 was formed around the insulating film 4 under the same conditions as those for forming the insulating film 4 in an electrodeposition paint diluted with deionized water so that the mixture of the resin and the powder became 15 wt%. Was formed.
【0077】さらに、絶縁膜4と同じ電着塗料を用い
て、絶縁膜4の形成条件と同一条件で導電膜3の周囲に
厚さ15μm厚の絶縁膜5を形成した。Further, an insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 using the same electrodeposition paint as the insulating film 4 under the same conditions as those for forming the insulating film 4.
【0078】最後に基板を水洗し、その後、97℃±1
℃のオーブンに基板を入れて150分間加熱処理して本
発明の回路基板を得た。Finally, the substrate was washed with water, and thereafter, at 97 ° C. ± 1.
The substrate was placed in an oven at a temperature of 150 ° C. and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0079】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)、絶縁抵抗、体積固有抵抗、及び
電磁波シールドを実施例1と同様の方法で測定した。そ
の結果、実施例1と同様の良好な効果が得られた。The physical properties (adhesion, acid resistance, alkali resistance, and flammability), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0080】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0081】 実施例5 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路及び絶縁膜4を形成した。Example 5 A copper pattern circuit and an insulating film 4 were formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0082】次に、別に用意したアクリル・メラミン系
樹脂(商品名ハニブライトCL−1、ハニ−化成社製)
100重量部に、平均粒子径0.03μmの銅粉体10
重量部を分散し、更に脱塩水で樹脂と粉体の混合物が1
5wt%になるように稀釈した電着塗料中で、絶縁膜4
の形成条件と同一条件下で、絶縁膜4の周囲に厚さ17
μmの導電膜3を形成した。Next, a separately prepared acrylic / melamine resin (trade name: Hanibright CL-1, manufactured by Hani Kasei Co., Ltd.)
100 parts by weight of copper powder 10 having an average particle diameter of 0.03 μm
Parts by weight, and the mixture of resin and powder
In the electrodeposition paint diluted to 5 wt%, the insulating film 4
Under the same conditions as the formation conditions, a thickness of 17
A μm conductive film 3 was formed.
【0083】さらに、絶縁膜4と同じ電着塗料を用い
て、絶縁膜4の形成条件と同一条件で導電膜3の周囲に
厚さ15μm厚の絶縁膜5を形成した。Further, an insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 under the same conditions as those for forming the insulating film 4 using the same electrodeposition paint as the insulating film 4.
【0084】最後に、基板を水洗し、その後、97℃±
1℃のオーブンに基板を入れて150分間加熱処理して
本発明の回路基板を得た。Finally, the substrate was washed with water, and then at 97 ° C. ±
The substrate was placed in a 1 ° C. oven and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0085】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)、絶縁抵抗、体積固有抵抗及び電
磁波シールドを実施例1と同様の方法で測定した。その
結果、実施例1と同様の良好な効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, and flammability), insulation resistance, volume resistivity, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0086】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0087】 実施例6 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路及び絶縁膜4を形成した。Example 6 A copper pattern circuit and an insulating film 4 were formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0088】次に、別に用意したアクリル・メラミン系
樹脂(商品名ハニブライトCL−1、ハニ−化成社製)
100重量部に、平均粒子径0.02μmの銅粉体10
重量部を分散し、更に脱塩水で樹脂と粉体の混合物が1
5wt%になるように稀釈した電着塗料中で、絶縁膜4
の形成条件と同一条件下で、絶縁膜4の周囲に厚さ15
μmの導電膜3を形成した。Next, a separately prepared acrylic / melamine resin (trade name: Hanibright CL-1, manufactured by Hani Kasei Co., Ltd.)
100 parts by weight of copper powder 10 having an average particle diameter of 0.02 μm
Parts by weight, and the mixture of resin and powder
In the electrodeposition paint diluted to 5 wt%, the insulating film 4
Under the same conditions as the formation conditions, a thickness of 15
A μm conductive film 3 was formed.
【0089】最後に、基板を水洗し、その後、97℃±
1℃のオーブンに基板を入れて150分間加熱処理して
本発明の回路基板を得た。Finally, the substrate was washed with water, and then at 97 ° C. ±
The substrate was placed in a 1 ° C. oven and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0090】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)及び電磁波シールド効果を実施例
1と同様の方法で測定した。その結果、実施例1と同様
の良好な効果が得られた。The physical properties (adhesion, acid resistance, alkali resistance, and combustibility) of this circuit board and the electromagnetic wave shielding effect were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0091】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0092】 実施例7 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路及び絶縁膜4を形成した。Example 7 A copper pattern circuit and an insulating film 4 were formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0093】その後、脱塩水を用いてアルキッド系樹脂
(商品名TF121、神東塗料(株)社製)を濃度15
tw%に稀釈した電着塗料を用いてpH8.5,浴温2
5℃の条件下で、基板を陽極として陰極にステンレス板
を用いて、150Vの直流電圧を3分間印加し、15μ
m厚の絶縁膜4を銅パターン回路の上に形成した。Then, an alkyd resin (trade name: TF121, manufactured by Shinto Paint Co., Ltd.) having a concentration of 15 was prepared using deionized water.
pH 8.5, bath temperature 2 using electrodeposition paint diluted to tw%
Under a condition of 5 ° C., a 150 V DC voltage was applied for 3 minutes using a stainless steel plate as a cathode with the substrate as an anode,
An m-thick insulating film 4 was formed on the copper pattern circuit.
【0094】次に、別に用意したアルキッド系樹脂(商
品名TF121、神東塗料(株)社製)100重量部
に、平均粒子径0.03μmのニッケル粉体15重量部
を分散し、更に脱塩水で樹脂と粉体の混合物が15wt
%になるように稀釈した電着塗料中で、絶縁膜4の形成
条件と同一条件下で、絶縁膜4の周囲に厚さ20μmの
導電膜3を形成した。Next, 15 parts by weight of nickel powder having an average particle diameter of 0.03 μm were dispersed in 100 parts by weight of an alkyd resin (trade name: TF121, manufactured by Shinto Paint Co., Ltd.) separately prepared, and further removed. 15wt of mixture of resin and powder with salt water
% Of the conductive film 3 having a thickness of 20 μm was formed around the insulating film 4 under the same conditions as those for forming the insulating film 4 in the electrodeposition paint diluted so as to have a concentration of 10%.
【0095】さらに、絶縁膜4と同じ電着塗料を用い
て、絶縁膜4の形成条件と同一条件で導電膜3の周囲に
厚さ15μm厚の絶縁膜5を形成した。Further, an insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 using the same electrodeposition paint as the insulating film 4 under the same conditions as those for forming the insulating film 4.
【0096】最後に基板を水洗し、その後、97℃±1
℃のオーブンに基板を入れて150分間加熱処理して本
発明の回路基板を得た。Finally, the substrate was washed with water, and thereafter, at 97 ° C. ± 1.
The substrate was placed in an oven at a temperature of 150 ° C. and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0097】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)、絶縁抵抗、体積固有抵抗、及び
電磁波シールドを実施例1と同様の方法で測定した。そ
の結果、実施例1と同様の良好な効果が得られた。The physical properties (adhesion, acid resistance, alkali resistance, and flammability), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0098】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0099】 実施例8 実施例1で用いたニッケルめっきアルミナ粉体15重量
部を、ニッケルめっきアルミナ粉体7重量部と銅粉体5
重量部の混合物にかえた以外は、実施例1と同様にして
本発明の回路基板を作成した。ニッケルめっきアルミナ
粉体のめっき厚みは0.2μmであった。アルミナ粉体
の平均粒子径は1.2μmであった。銅粉体の平均粒子
径は0.03μmであった。Example 8 15 parts by weight of the nickel-plated alumina powder used in Example 1 was replaced with 7 parts by weight of the nickel-plated alumina powder and 5 parts by weight of the copper powder.
A circuit board of the present invention was prepared in the same manner as in Example 1 except that the mixture was replaced by parts by weight. The plating thickness of the nickel-plated alumina powder was 0.2 μm. The average particle size of the alumina powder was 1.2 μm. The average particle size of the copper powder was 0.03 μm.
【0100】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)、絶縁抵抗、体積固有抵抗、及び
電磁波シールドを実施例1と同様の方法で測定した。そ
の結果、実施例1と同様の良好な効果が得られた。The physical properties (adhesion, acid resistance, alkali resistance, and flammability), insulation resistance, volume resistivity, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0101】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0102】実施例9 実施例6で用いた銅粉体10重量部を、ニッケルめっき
アルミナ粉体5重量部と銅粉体10重量部の混合物にか
えた以外は、実施例6と同様にして本発明の回路基板を
作成した。、ニッケルめっきアルミナ粉体のめっき厚み
は0.2μmであった。アルミナ粉体の平均粒子径は
1.0μmであった。銅粉体の平均粒子径は0.02μ
mであった。Example 9 The procedure of Example 6 was repeated, except that 10 parts by weight of the copper powder used in Example 6 was changed to a mixture of 5 parts by weight of nickel-plated alumina powder and 10 parts by weight of copper powder. A circuit board of the present invention was made. The plating thickness of the nickel-plated alumina powder was 0.2 μm. The average particle size of the alumina powder was 1.0 μm. Average particle size of copper powder is 0.02μ
m.
【0103】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)及び電磁波シールド効果を実施例
1と同様の方法で測定した。その結果、実施例1と同様
の良好な効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, and combustibility) of this circuit board and the electromagnetic wave shielding effect were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0104】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0105】実施例10 実施例4で用いたニッケルめっきアルミナ粉体7重量部
を、銅めっきアルミナ粉体7重量部とニッケル粉体5重
量部の混合物にかえた以外は、実施例4と同様にして本
発明の回路基板を作成した。銅めっきアルミナ粉体のめ
っき厚みは0.2μmであった。アルミナ粉体の平均粒
子径は1.0μmであった。ニッケル粉体の平均粒子径
は0.03μmであった。Example 10 Same as Example 4 except that 7 parts by weight of nickel-plated alumina powder used in Example 4 was changed to a mixture of 7 parts by weight of copper-plated alumina powder and 5 parts by weight of nickel powder. Thus, a circuit board of the present invention was prepared. The plating thickness of the copper-plated alumina powder was 0.2 μm. The average particle size of the alumina powder was 1.0 μm. The average particle size of the nickel powder was 0.03 μm.
【0106】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性)、絶縁抵抗、体積固有抵抗、及び
電磁波シールドを実施例1と同様の方法で測定した。そ
の結果、実施例1と同様の良好な効果が得られた。The physical properties (adhesion, acid resistance, alkali resistance, and flammability), insulation resistance, volume resistivity, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 1. As a result, the same good effects as in Example 1 were obtained.
【0107】また、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0108】 実施例11 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路を形成した。Example 11 A copper pattern circuit was formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0109】その後、アクリル・メラミン系樹脂(商品
名ハニブライトCL−1、ハニ−化成社製)中に平均粒
径1.5μmの窒化アルミニウムを樹脂の3重量%分散
させた後、脱塩水で樹脂と粉体の混合物が15重量%に
なるように稀釈した電着塗料を用いて、pH8.5、浴
温25℃の条件下で、基板を陽極として、陰極にステン
レス板を用いて、150Vの直流電圧を3分間印加し、
15μm厚、粉体の共析量25重量%の絶縁膜4を銅パ
ターン回路の上に形成した。Thereafter, aluminum nitride having an average particle size of 1.5 μm was dispersed in an acrylic / melamine resin (trade name: Hanibright CL-1, manufactured by Hani Kasei Co., Ltd.) at 3% by weight of the resin, and then the resin was deionized with deionized water. Using an electrodeposition paint diluted so that the mixture of the powder and the powder becomes 15% by weight, at a pH of 8.5 and a bath temperature of 25 ° C., using a substrate as an anode, a stainless steel plate as a cathode, and 150 V Apply DC voltage for 3 minutes,
An insulating film 4 having a thickness of 15 μm and an eutectoid amount of powder of 25% by weight was formed on the copper pattern circuit.
【0110】次に、別に用意したアクリルメラミン系樹
脂(商品名ハニブライトCL−1、ハニー化成社製)1
00重量部に、平均粒子径1.0μmのアルミナ上にニ
ッケルめっきを0.1μmの厚さで施した粉体10重量
部を分散し、更に脱塩水で樹脂と粉体の混合物が15w
t%になるように稀釈した電着塗料中で、絶縁膜4の形
成条件と同一条件下で、絶縁膜4の周囲に厚さ17μ
m、粉体の共析量30重量%の導電膜3を形成した。Next, an acrylic melamine resin (trade name: Honeybright CL-1, manufactured by Honey Kasei Co., Ltd.) 1
In 100 parts by weight, 10 parts by weight of a powder obtained by applying nickel plating to a thickness of 0.1 μm on alumina having an average particle diameter of 1.0 μm is dispersed, and a mixture of the resin and the powder is further mixed with demineralized water to form a 15 w
Under the same conditions as those for forming the insulating film 4, a thickness of 17 μm
m, a conductive film 3 having an eutectoid amount of powder of 30% by weight was formed.
【0111】さらに、絶縁膜4と同じ電着塗料を用い
て、絶縁膜4の形成条件と同じ条件で導電膜3の周囲に
厚さ15μm厚の絶縁膜5を形成した。Further, an insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 under the same conditions as those for forming the insulating film 4 using the same electrodeposition paint as the insulating film 4.
【0112】最後に基板を水洗し、その後、97℃±1
℃のオーブンに基板を入れて150分間加熱処理して本
発明の回路基板を得た。Lastly, the substrate was washed with water, and thereafter, at 97 ° C. ± 1.
The substrate was placed in an oven at a temperature of 150 ° C. and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0113】得られた回路基板の物性(付着性、耐酸
性、耐アルカリ性、燃焼性)、絶縁抵抗、体積固有抵
抗、硬度(鉛筆)及び耐傷性(消ゴム)を測定した。そ
の結果を下記の表4〜6に示す。The physical properties (adhesion, acid resistance, alkali resistance, and flammability), insulation resistance, volume specific resistance, hardness (pencil) and scratch resistance (eraser) of the obtained circuit board were measured. The results are shown in Tables 4 to 6 below.
【0114】得られた絶縁膜及び導電膜は、緻密で隣接
する膜に十分に付着しており、耐酸性、耐アルカリ性、
耐燃焼性、硬度及び耐傷性も申し分ないものであった。The obtained insulating film and conductive film are dense and sufficiently adhered to the adjacent film, and are resistant to acid and alkali.
The flame resistance, hardness and scratch resistance were also satisfactory.
【0115】また、回路基板の電磁波シールド効果の測
定を、製品に組込み後、トランスミッションライン法
(ASTM ES7・83)で行なった。その結果、電
磁波シールド効果は、実施例1と同様に良好なものであ
った。Further, the measurement of the electromagnetic wave shielding effect of the circuit board was performed by a transmission line method (ASTM ES 7.883) after assembling into the product. As a result, the electromagnetic wave shielding effect was as good as in Example 1.
【0116】更に、実施例1と同様にして基板の断面を
観察したところ、各膜とも均一の厚みに形成されてい
た。Further, when the cross section of the substrate was observed in the same manner as in Example 1, each film was formed to have a uniform thickness.
【0117】[0117]
【表4】 [Table 4]
【0118】(注)上記表の試験方法は下記のとおりで
ある。(Note) The test methods in the above table are as follows.
【0119】 (1)付着性…JIS D0202 (2)耐酸性…10Vol %H2SO4で常温、20分
間浸漬処理 (3)耐アルカリ性…5wt%NaOHで常温、30分
間浸漬処理 (4)耐燃性…UL94試験法 (5)硬度…JIS K5400 (6)耐傷性…絶縁塗膜を消しゴムで擦したときの下地
の露出に要した回数(1) Adhesion: JIS D0202 (2) Acid resistance: Immersion treatment with 10 Vol% H 2 SO 4 at room temperature for 20 minutes (3) Alkali resistance: Immersion treatment with 5 wt% NaOH at room temperature for 30 minutes (4) Flame resistance Properties: UL94 test method (5) Hardness: JIS K5400 (6) Scratch resistance: Number of times required to expose the base when rubbing the insulating coating with an eraser
【0120】[0120]
【表5】 [Table 5]
【0121】(注)上記表の絶縁抵抗は、JIS Z3
197は準拠し、くし型電極G−10、基材吸湿処理は
55℃、98%RH、DC 500Vで1分値を示す。
抵抗値の測定はYHP社製、超絶縁抵抗測定器HP43
29Aを用いた。(Note) The insulation resistance in the above table is based on JIS Z3
197 is compliant, and the comb-shaped electrode G-10 shows a value of 1 minute at 55 ° C., 98% RH and 500 V DC for the substrate moisture absorption treatment.
Measurement of resistance value is made by YHP, super insulation resistance measuring instrument HP43
29A was used.
【0122】[0122]
【表6】 [Table 6]
【0123】(注)上記表の固有抵抗値は、JIS C
6481により測定した値である。(Note) The specific resistance values in the above table are based on JIS C
6481.
【0124】実施例12 0.6mm厚のガラスエポキシ樹脂基板上に、実施例1
と同様にして銅パターン回路を形成した。Example 12 Example 1 was placed on a 0.6 mm thick glass epoxy resin substrate.
A copper pattern circuit was formed in the same manner as described above.
【0125】その後、実施例11の絶縁膜4に使用した
窒化アルミニウム粉体3重量%を、平均粒子径1.0μ
mのアルミナ粉体5重量%にかえた以外は実施例11と
同様にして絶縁膜4を形成した。Thereafter, 3% by weight of the aluminum nitride powder used for the insulating film 4 of Example 11 was mixed with an average particle diameter of 1.0 μm.
An insulating film 4 was formed in the same manner as in Example 11, except that the alumina powder was changed to 5% by weight.
【0126】次に、別に用意したアクリルメラミン系樹
脂(商品名ハニブライトCL−1、ハニー化成社製)1
00重量部に、平均粒子径1.0μmのアルミナ上にニ
ッケルめっきを0.3μmの厚さで施した粉体15重量
部を分散し、更に脱塩水で樹脂と粉体の混合物が15w
t%になるように稀釈した電着塗料中で、絶縁膜4の形
成条件と同一条件下で、絶縁膜4の周囲に厚さ15μ
m、粉体の共析量27重量%の導電膜3を形成した。Next, an acrylic melamine-based resin (trade name: Honeybright CL-1, manufactured by Honey Kasei Co., Ltd.) 1
15 parts by weight of a powder obtained by applying nickel plating to a thickness of 0.3 μm on alumina having an average particle diameter of 1.0 μm are dispersed in 00 parts by weight.
In the electrodeposition paint diluted to t%, under the same conditions as those for forming the insulating film 4, a thickness of 15 μm is formed around the insulating film 4.
m, a conductive film 3 having an eutectoid amount of powder of 27% by weight was formed.
【0127】さらに絶縁膜4と同じ電着塗料を用いて、
絶縁膜4の形成条件と同じ条件で導電膜3の周囲に厚さ
15μm厚の絶縁膜5を形成した。Further, using the same electrodeposition paint as the insulating film 4,
An insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 under the same conditions as those for forming the insulating film 4.
【0128】最後に基板を水洗し、その後、97℃±1
℃のオーブンに基板を入れて150分間加熱処理して本
発明の回路基板を得た。Finally, the substrate was washed with water, and thereafter, at 97 ° C. ± 1.
The substrate was placed in an oven at a temperature of 150 ° C. and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0129】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性、硬度及び耐傷性)、絶縁抵抗、体
積固有抵抗、及び電磁波シールドを実施例11と同様の
方法で測定した。その結果、実施例11と同様の良好な
効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability, hardness and scratch resistance), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 11. As a result, the same good effects as in Example 11 were obtained.
【0130】また、実施例11と同様にして基板の断面
を観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 11, each film was formed to have a uniform thickness.
【0131】実施例13 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路を形成した。Example 13 A copper pattern circuit was formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0132】その後、アルキッド系樹脂(商品名TF1
21、神東塗料(株)社製)中に平均粒径2.0μmの
炭化ケイ素を樹脂の1重量%分散させた後、脱塩水で樹
脂と粉体の混合物が15重量%になるように稀釈した電
着塗料を用いて、pH8.5、浴温25℃の条件下で、
基板を陽極として、陰極にステンレス板を用いて、15
0Vの直流電圧を、3分間印加し、15μm厚、粉体の
共析量25重量%の絶縁膜4を銅パターン回路の上に形
成した。Thereafter, an alkyd resin (trade name: TF1)
21, manufactured by Shinto Paint Co., Ltd.), silicon carbide having an average particle size of 2.0 μm is dispersed by 1% by weight of the resin, and the mixture of the resin and the powder is adjusted to 15% by weight with demineralized water. Using the diluted electrodeposition paint, at pH 8.5 and a bath temperature of 25 ° C.,
Using a substrate as an anode and a stainless steel plate as a cathode, 15
A DC voltage of 0 V was applied for 3 minutes to form an insulating film 4 having a thickness of 15 μm and an eutectoid amount of powder of 25% by weight on the copper pattern circuit.
【0133】次に、別に用意したアルキッド系樹脂(商
品名TF121、神東塗料(株)社製)100重量部
に、平均粒子径1.0μmのアルミナ上に銅めっきを
0.2μmの厚さで施した粉体10重量部を分散し、更
に脱塩水で樹脂と粉体の混合物が15wt%になるよう
に稀釈した電着塗料中で、絶縁膜4の形成条件と同一条
件下で、絶縁膜4の周囲に厚さ17μm、粉体の共析量
30重量%の導電膜3を形成した。Next, 100 parts by weight of an alkyd-based resin (trade name: TF121, manufactured by Shinto Paint Co., Ltd.) was separately coated with copper plating on alumina having an average particle diameter of 1.0 μm and a thickness of 0.2 μm. Under the same conditions as those for forming the insulating film 4 in an electrodeposition paint diluted with 15% by weight of a resin-powder mixture with demineralized water. A conductive film 3 having a thickness of 17 μm and an eutectoid amount of powder of 30% by weight was formed around the film 4.
【0134】さらに、絶縁膜4と同じ電着塗料を用い
て、絶縁膜4の形成条件と同じ条件で導電膜3の周囲に
厚さ15μm厚の絶縁膜5を形成した。Further, an insulating film 5 having a thickness of 15 μm was formed around the conductive film 3 using the same electrodeposition paint as the insulating film 4 under the same conditions as those for forming the insulating film 4.
【0135】最後に基板を水洗し、その後、97℃±1
℃のオーブンに基板を入れて150分間加熱処理して本
発明の回路基板を得た。Finally, the substrate was washed with water, and thereafter, at 97 ° C. ± 1.
The substrate was placed in an oven at a temperature of 150 ° C. and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0136】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性、硬度及び耐傷性)、絶縁抵抗、体
積固有抵抗、及び電磁波シールドを実施例11と同様の
方法で測定した。その結果、実施例11と同様の良好な
効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability, hardness and scratch resistance), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 11. As a result, the same good effects as in Example 11 were obtained.
【0137】また、実施例11と同様にして基板の断面
を観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 11, each film was formed to have a uniform thickness.
【0138】実施例14 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路を形成した。Example 14 A copper pattern circuit was formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0139】その後、実施例11の絶縁膜4に使用した
窒化アルミニウム粉体3重量%を、平均粒子径5.0μ
mのアルミナ粉体1.5重量%にかえた以外は実施例1
1と同様にして絶縁膜4を形成した。Thereafter, 3% by weight of the aluminum nitride powder used for the insulating film 4 of Example 11 was mixed with an average particle size of 5.0 μm.
Example 1 except that the alumina powder was changed to 1.5% by weight.
An insulating film 4 was formed in the same manner as in Example 1.
【0140】次に、実施例11と同様の導電膜3を実施
例11と同様にして形成した。Next, a conductive film 3 similar to that of the eleventh embodiment was formed in the same manner as the eleventh embodiment.
【0141】最後に、基板を水洗いし、その後97℃±
1℃のオーブンに基板を入れて150分間加熱処理して
本発明の回路基板を得た。Finally, the substrate was washed with water, and then at 97 ° C. ±
The substrate was placed in a 1 ° C. oven and heat-treated for 150 minutes to obtain a circuit board of the present invention.
【0142】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性、硬度及び耐傷性)及び電磁波シー
ルド効果を実施例11と同様の方法で測定した。その結
果、実施例11と同様の良好な効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability, hardness and scratch resistance) of this circuit board and the electromagnetic wave shielding effect were measured in the same manner as in Example 11. As a result, the same good effects as in Example 11 were obtained.
【0143】また、実施例11と同様にして基板の断面
を観察したところ、各膜とも均一の厚みに形成されてい
た。Further, when the cross section of the substrate was observed in the same manner as in Example 11, each film was formed to have a uniform thickness.
【0144】実施例15 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路及び絶縁膜4を形成した。Example 15 A copper pattern circuit and an insulating film 4 were formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0145】その後、実施例5と同様の導電膜3を実施
例5と同様にして形成した。Thereafter, a conductive film 3 similar to that of the fifth embodiment was formed in the same manner as the fifth embodiment.
【0146】更に、実施例11と同様の絶縁膜5を実施
例11と同様にして形成し、最後は実施例11と同様に
して膜の硬化を行ない本発明の回路基板を作成した。Further, the same insulating film 5 as in Example 11 was formed in the same manner as in Example 11, and finally, the film was cured in the same manner as in Example 11, thereby producing a circuit board of the present invention.
【0147】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性、硬度及び耐傷性)、絶縁抵抗、体
積固有抵抗、及び電磁波シールドを実施例11同様の方
法で測定した。その結果、実施例11と同様の良好な効
果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability, hardness and scratch resistance), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 11. As a result, the same good effects as in Example 11 were obtained.
【0148】また、実施例11と同様にして基板の断面
を観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 11, each film was formed to have a uniform thickness.
【0149】実施例16 実施例12の導電膜3で用いたニッケルめっきアルミナ
粉体10重量部を、平均粒子径0.02μmの銀粉体5
重量部にかえた以外は、実施例12と同様にして本発明
の回路基板を作成した。Example 16 10 parts by weight of the nickel-plated alumina powder used in the conductive film 3 of Example 12 was mixed with silver powder 5 having an average particle diameter of 0.02 μm.
A circuit board of the present invention was prepared in the same manner as in Example 12, except that the weight part was changed.
【0150】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性、硬度及び耐傷性)、絶縁抵抗、体
積固有抵抗、及び電磁波シールドを実施例11と同様の
方法で測定した。その結果、実施例11と同様の良好な
効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability, hardness and scratch resistance), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 11. As a result, the same good effects as in Example 11 were obtained.
【0151】また、実施例11と同様にして基板の断面
を観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 11, each film was formed to have a uniform thickness.
【0152】実施例17 0.6mm厚のガラスエポキシ樹脂基板上に実施例1と
同様にして銅パターン回路を形成した。Example 17 A copper pattern circuit was formed on a 0.6 mm thick glass epoxy resin substrate in the same manner as in Example 1.
【0153】その後、絶縁膜4,導電膜3及び絶縁膜5
を、それぞれ実施例11,実施例8及び実施例11と同
様に形成し、本発明の回路基板を作成した。Thereafter, the insulating film 4, the conductive film 3, and the insulating film 5
Were formed in the same manner as in Example 11, Example 8 and Example 11, respectively, to produce a circuit board of the present invention.
【0154】この回路基板の物性(付着性、耐酸性、耐
アルカリ性、燃焼性、硬度及び耐傷性)、絶縁抵抗、体
積固有抵抗、及び電磁波シールドを実施例11と同様の
方法で測定した。その結果、実施例11と同様の良好な
効果が得られた。The physical properties (adhesion resistance, acid resistance, alkali resistance, flammability, hardness and scratch resistance), insulation resistance, volume specific resistance, and electromagnetic wave shield of this circuit board were measured in the same manner as in Example 11. As a result, the same good effects as in Example 11 were obtained.
【0155】また、実施例11と同様にして基板の断面
を観察したところ、各膜とも均一の厚みに形成されてい
た。When the cross section of the substrate was observed in the same manner as in Example 11, each film was formed to have a uniform thickness.
【0156】[0156]
【発明の効果】以上説明したように、本発明によれば回
路基板の絶縁膜、導電膜を緻密で均一な厚みの薄膜とす
ることができる。また、絶縁不良がなく、優れた電磁波
シールド効果を有する回路基板を得ることができる。As described above, according to the present invention, the insulating film and the conductive film of the circuit board can be formed into a dense and thin film having a uniform thickness. Further, a circuit board having no insulation failure and having an excellent electromagnetic wave shielding effect can be obtained.
【図1】本発明による回路基板の一例を示す断面図であ
る。FIG. 1 is a sectional view showing an example of a circuit board according to the present invention.
【図2】本発明による回路基板のシールド効果を示すグ
ラフの一例である。FIG. 2 is an example of a graph showing a shielding effect of a circuit board according to the present invention.
1 基板 2 導線 3 導電膜 4 絶縁膜 5 絶縁膜 DESCRIPTION OF SYMBOLS 1 Substrate 2 Conductor 3 Conductive film 4 Insulating film 5 Insulating film
フロントページの続き (31)優先権主張番号 特願平2−74203 (32)優先日 平2(1990)3月24日 (33)優先権主張国 日本(JP) (31)優先権主張番号 特願平2−77494 (32)優先日 平2(1990)3月26日 (33)優先権主張国 日本(JP) (31)優先権主張番号 特願平2−77495 (32)優先日 平2(1990)3月26日 (33)優先権主張国 日本(JP) 前置審査Continued on the front page (31) Priority claim number Japanese Patent Application No. 2-74203 (32) Priority date Hei 2 (1990) March 24 (33) Priority claim country Japan (JP) (31) Priority claim number Special (2) Priority Date 2-77494 (32) Priority Date 2 (1990) March 26 (33) Priority Claiming Country Japan (JP) (31) Priority Claim Number Japanese Patent Application No. 2-77495 (32) Priority Date Hei 2 (1990) March 26 (33) Priority claiming country Japan (JP) Preliminary examination
Claims (4)
成する第1の工程と、前記回路パターンに第1の絶縁膜
を被覆する第2の工程と、前記第1の絶縁膜に導電膜を
被覆する第3の工程とを有し、少なくとも前記第3の工
程に、電着塗料中に前記基板を浸漬して前記導線を電極
とした電着塗装法を用いることを特徴とする回路基板の
製造方法。A first step of forming a circuit pattern made of a conductive wire on a substrate; a second step of covering the circuit pattern with a first insulating film; and forming a conductive film on the first insulating film. A third step of coating, wherein at least the third step uses an electrodeposition coating method in which the substrate is immersed in an electrodeposition coating and the conductive wire is used as an electrode. Production method.
料中に回路パターンを浸漬して導線を電極とした電着塗
装法を用いる請求項1記載の回路基板の製造方法。2. The method for producing a circuit board according to claim 1, wherein in the second step and the third step, a circuit pattern is immersed in an electrodeposition paint, and an electrodeposition coating method using a conductive wire as an electrode is used.
成する第1の工程、前記回路パターンに第1の絶縁膜を
被覆する第2の工程および前記第1の絶縁膜に導電膜を
被覆する第3の工程とを有する回路基板の製造方法にお
いて、前記第2の工程及び前記第3の工程に、電着塗料
中に前記基板を浸漬して前記導線を電極とした電着塗装
法を適用して絶縁膜および導電膜を形成後、両膜の樹脂
を硬化処理することを特徴とする回路基板の製造方法。3. A first step of forming a circuit pattern made of a conductive wire on a substrate, a second step of coating the circuit pattern with a first insulating film, and coating a conductive film on the first insulating film. In the method for manufacturing a circuit board having a third step, an electrodeposition coating method in which the substrate is immersed in an electrodeposition paint and the conductive wire is used as an electrode is applied to the second step and the third step. Forming an insulating film and a conductive film, and then curing the resin of both films.
成する第1の工程、前記回路パターンに第1の絶縁膜を
被覆する第2の工程、前記第1の絶縁膜に導電膜を被覆
する第3の工程および前記導電層に第2の絶縁膜を被覆
する第4の工程を有する回路基板の製造方法において、
前記第2の工程、前記第3の工程および前記第4の工程
に、電着塗料中に前記基板を浸漬して前記導線を電極と
した電着塗装法を適用して、第1の絶縁膜、導電膜およ
び第2の絶縁膜を形成後、これらの膜の樹脂を硬化処理
することを特徴とする回路基板の製造方法。4. A first step of forming a circuit pattern made of a conductive wire on a substrate, a second step of coating the circuit pattern with a first insulating film, and coating a conductive film on the first insulating film. A method of manufacturing a circuit board, comprising: a third step and a fourth step of covering the conductive layer with a second insulating film.
In the second step, the third step, and the fourth step, an electrodeposition coating method in which the substrate is immersed in an electrodeposition coating and the conductive wire is used as an electrode is applied to form a first insulating film. Forming a conductive film and a second insulating film, and then curing the resin of these films.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3058817A JP2810554B2 (en) | 1990-03-22 | 1991-03-22 | Circuit board manufacturing method |
Applications Claiming Priority (13)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2-75148 | 1990-03-22 | ||
| JP7514890 | 1990-03-22 | ||
| JP7217790 | 1990-03-23 | ||
| JP2-74653 | 1990-03-23 | ||
| JP2-72177 | 1990-03-23 | ||
| JP7465390 | 1990-03-23 | ||
| JP7420390 | 1990-03-24 | ||
| JP2-74203 | 1990-03-24 | ||
| JP2-77495 | 1990-03-26 | ||
| JP7749490 | 1990-03-26 | ||
| JP2-77494 | 1990-03-26 | ||
| JP7749590 | 1990-03-26 | ||
| JP3058817A JP2810554B2 (en) | 1990-03-22 | 1991-03-22 | Circuit board manufacturing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04211189A JPH04211189A (en) | 1992-08-03 |
| JP2810554B2 true JP2810554B2 (en) | 1998-10-15 |
Family
ID=27564959
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3058817A Expired - Fee Related JP2810554B2 (en) | 1990-03-22 | 1991-03-22 | Circuit board manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2810554B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101144967B (en) * | 2007-06-28 | 2011-04-06 | 武汉立胜超滤科技发展有限公司 | Electrophoresis coating method and whole set apparatus for pattern transfer of positive electrophoresis coating on printing board |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001192570A (en) * | 1999-11-01 | 2001-07-17 | Jsr Corp | Aqueous dispersion for forming conductive layer, conductive layer, electronic component, circuit board, and method of manufacturing the same |
| JP2008227147A (en) * | 2007-03-13 | 2008-09-25 | National Institute Of Advanced Industrial & Technology | Conductive line structure, manufacturing method thereof, and wiring board |
| JP4364271B2 (en) | 2007-11-29 | 2009-11-11 | 株式会社東芝 | Electronics |
| JP5606212B2 (en) * | 2010-08-09 | 2014-10-15 | 株式会社シミズ | Colored resin composition for electrodeposition coating, water-based electrodeposition coating, coating method and coated article |
| JP5606211B2 (en) * | 2010-08-09 | 2014-10-15 | 株式会社シミズ | Resin composition for electrodeposition paint, water-based electrodeposition paint, coating method and coated article |
| JP5747527B2 (en) * | 2011-01-28 | 2015-07-15 | 日亜化学工業株式会社 | Method for manufacturing light emitting device |
| JP6533382B2 (en) * | 2014-11-13 | 2019-06-19 | 株式会社フジクラ | Wiring board and method of manufacturing the same |
| CN110798966A (en) * | 2019-11-19 | 2020-02-14 | 江苏上达电子有限公司 | Method for implementing novel electromagnetic shielding for circuit board |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61138268U (en) * | 1985-02-19 | 1986-08-27 | ||
| JPS6214800U (en) * | 1985-07-10 | 1987-01-29 | ||
| JPS643476U (en) * | 1987-06-26 | 1989-01-10 | ||
| JPS6428994A (en) * | 1987-07-24 | 1989-01-31 | Meiko Electronics Co Ltd | Manufacture of printed wiring board |
| JPH0195014U (en) * | 1987-12-16 | 1989-06-22 |
-
1991
- 1991-03-22 JP JP3058817A patent/JP2810554B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101144967B (en) * | 2007-06-28 | 2011-04-06 | 武汉立胜超滤科技发展有限公司 | Electrophoresis coating method and whole set apparatus for pattern transfer of positive electrophoresis coating on printing board |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04211189A (en) | 1992-08-03 |
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| Date | Code | Title | Description |
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| LAPS | Cancellation because of no payment of annual fees |