JP2836859B2 - Three-dimensional spatial and time-resolved absorption spectrum measurement device - Google Patents
Three-dimensional spatial and time-resolved absorption spectrum measurement deviceInfo
- Publication number
- JP2836859B2 JP2836859B2 JP25339789A JP25339789A JP2836859B2 JP 2836859 B2 JP2836859 B2 JP 2836859B2 JP 25339789 A JP25339789 A JP 25339789A JP 25339789 A JP25339789 A JP 25339789A JP 2836859 B2 JP2836859 B2 JP 2836859B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- absorption spectrum
- pinhole
- absorption
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) この発明は、吸収スペクトル測定装置に関するもので
ある。さらに詳しくは、この発明は、3次元空間分解と
時間分解測定を可能とする共焦点光誘起吸収スペクトル
測定装置に関するものである。Description: TECHNICAL FIELD The present invention relates to an absorption spectrum measuring device. More specifically, the present invention relates to a confocal light-induced absorption spectrum measuring apparatus that enables three-dimensional spatial resolution and time-resolved measurement.
(従来の技術とその課題) 従来より、光学的手段を用いた物質現象、その構造の
解析のための方法が各種提案されてきており、顕微鏡技
術についてもレーザ光の利用等の新しい手法からなるも
のが各種実用化されてきている。(Prior art and its problems) Conventionally, various methods for analyzing material phenomena and their structures using optical means have been proposed, and microscopic techniques also include new methods such as the use of laser light. Various things have been put to practical use.
しかしながら、このような顕微鏡技術の進歩・発展に
もかかわらず、顕微鏡技術は物質の2次元構造に関する
情報しか得られないという制約があった。However, despite the progress and development of such microscope technology, there is a limitation that the microscope technology can only obtain information on the two-dimensional structure of a substance.
たとえば、よく知られている、第2図に示したような
構成からなる透過型顕微鏡においては、薄い板状で中味
が均質な試料を考えると、この試料を深さ方向(Z軸)
に動かしても得られる信号は全く変わらず、どこにあっ
ても一定量の吸収があり、深さ方向、つまり物質の3次
元構造は観測することができない。For example, in a well-known transmission microscope having a configuration as shown in FIG. 2, when a thin plate-like sample having a uniform content is considered, this sample is taken in the depth direction (Z axis).
The signal obtained does not change at all, and there is a certain amount of absorption anywhere, and the depth direction, that is, the three-dimensional structure of the substance, cannot be observed.
第3図に示した螢光顕微鏡の場合には、図中のaとb
の試料の位置を比較すると、aの位置の方向が励起され
る面積は小さいが、励起される分子の濃度は高くなる。
しかしながら、全体としての励起分子の個性はaとbの
位置で変わらず、結果として検出される信号もaとbの
位置で変わらない。このため、この螢光顕微鏡において
も、深さ方向の情報を観測することができない。In the case of the fluorescence microscope shown in FIG. 3, a and b in FIG.
When the positions of the sample are compared, the area where the direction of the position a is excited is small, but the concentration of the excited molecule is high.
However, the personality of the excited molecule as a whole does not change at positions a and b, and the resulting detected signal does not change at positions a and b. For this reason, even in this fluorescence microscope, information in the depth direction cannot be observed.
また、第4図は、共焦点レーザ走査吸収顕微鏡を示し
たものであり、第2図の透過型顕微鏡とは、光源の前と
検出器の前とにピンホールを有している点で相違してい
る。これはレーザ光を使用してはじめて実現されること
である。しかしながら、このレーザ走査吸収顕微鏡にお
いても、検出される光は試料をコヒーレントに透過した
ものなので、やはり同様に深さ方向の3次元情報を得る
ことはできない。FIG. 4 shows a confocal laser scanning absorption microscope, which differs from the transmission microscope of FIG. 2 in that a pinhole is provided in front of a light source and in front of a detector. doing. This is realized only by using a laser beam. However, even in this laser scanning absorption microscope, since the detected light is transmitted through the sample coherently, it is not possible to obtain three-dimensional information in the depth direction.
以上のいずれのものも3次元空間分解能を有しておら
ず、顕微鏡技術の弱点となっていた。None of the above has a three-dimensional spatial resolution, which is a weak point of the microscope technology.
一方、このような弱点を解消するものとして、たとえ
ば第5図に示した共焦点レーザ走査螢光顕微鏡がある。
この顕微鏡は、光源の前と検出器の前とにピンホールが
あることで第3図の螢光顕微鏡とは相違している。On the other hand, to solve such a weak point, there is a confocal laser scanning fluorescence microscope shown in FIG. 5, for example.
This microscope differs from the fluorescence microscope of FIG. 3 in that there are pinholes in front of the light source and in front of the detector.
励起される分子の状態は変わらないが、図中のbの位
置の試料からインコヒーレントに発光した螢光はピンホ
ール上でディフォーカスされるため、ピンホールをほと
んど透過することができない。これに対して、aの位置
ではピンホールに像を結ぶのでエネルギーのほとんどが
検出器に当る。このため、aとbの位置では、観測され
る信号強度が異なり、このことから、深さ方向の差異が
認識可能となる。つまり、深さ方向の情報を観測するこ
とができる。Although the state of the excited molecule does not change, the fluorescent light emitted incoherently from the sample at the position b in the drawing is defocused on the pinhole, so that it can hardly pass through the pinhole. On the other hand, at the position a, an image is formed on the pinhole, and most of the energy strikes the detector. For this reason, the observed signal intensity differs at the positions a and b, and from this, it is possible to recognize the difference in the depth direction. That is, information in the depth direction can be observed.
しかしながら、このレーザ走査螢光顕微鏡の場合に
は、螢光顕微鏡としての制約があり、しかも光励起以外
の吸収がある場合に、レーザ走査による螢光だけを測定
することはできないという欠点がある。However, this laser scanning fluorescence microscope has a drawback that it has limitations as a fluorescence microscope, and cannot measure only fluorescence by laser scanning when there is absorption other than light excitation.
この発明は、以上の通りの事情に鑑みてなされたもの
であり、レーザ光による光励起吸収を3次元での空間分
解測定を可能とし、さらには、ダイナミックな時間変化
をも観測可能とする、新しい方式の吸収顕微鏡、さらに
は、波長分解能も有した吸収スペクトル測定装置を提供
することを目的としている。The present invention has been made in view of the above circumstances, and has been developed to provide a three-dimensional space-resolved measurement of photoexcitation absorption by a laser beam, and furthermore, a new method capable of observing a dynamic time change. It is an object of the present invention to provide an absorption microscope of a system and an absorption spectrum measuring apparatus having a wavelength resolution.
(課題を解決するための手段) この発明は、上記の課題を解決するものとして、ピン
ホールモニタ光の光路方向と同方向、あるいは逆方向か
らピンホール励起光を入射させてモニタ光と励起光とを
共焦点とし、試料の光誘起吸収の3次元空間分解測定を
行うことを特徴とする吸収スペクトル測定装置を提供す
る。(Means for Solving the Problems) The present invention solves the above-mentioned problems by providing pinhole excitation light from the same direction as the optical path direction of the pinhole monitor light or from the opposite direction, thereby enabling the monitor light and the excitation light. And a three-dimensional spatially-resolved measurement of light-induced absorption of a sample using the confocal point as a confocal point.
またさらに、この発明は、モニタ光および励起光にパ
ルスレーザ光を用いて時間分解測定を行う上記の吸収ス
ペクトル測定装置をも提供する。Furthermore, the present invention also provides the above-mentioned absorption spectrum measuring apparatus for performing time-resolved measurement using pulse laser light as monitor light and excitation light.
第1図は、この発明の吸収スペクトル測定装置の構成
を実施例として示したものである。FIG. 1 shows the configuration of an absorption spectrum measuring apparatus according to the present invention as an embodiment.
この第1図に示したように、ピンホールモニタ光源か
らの光はコンデンサレンズを介して試料に入射し、対物
レンズを介してピンホールおよび検出器へと向う。また
一方、ピンホール励起光源からの光はダイクロイックミ
ラー、対物レンズを介して試料に入射し、試料を光励起
する。As shown in FIG. 1, the light from the pinhole monitor light source enters the sample via the condenser lens, and travels to the pinhole and the detector via the objective lens. On the other hand, light from the pinhole excitation light source is incident on the sample via a dichroic mirror and an objective lens, and optically excites the sample.
ピンホールを介した検出器では、この光励起による吸
収を観測する。この時、吸収の測定ではあるが、従来の
吸収顕微鏡とは異なり、3次元空間分解能を有してい
る。The detector via the pinhole observes the absorption due to the light excitation. At this time, although it is an absorption measurement, it has a three-dimensional spatial resolution unlike a conventional absorption microscope.
観測モニタ光および励起光ともにピンホール、すなわ
ちレーザ光を用い、かつ、モニタ光と励起光は全く同じ
光路を通るようにし、共焦点系を形成する。A pinhole, ie, a laser beam, is used for both the observation monitor light and the excitation light, and the monitor light and the excitation light pass through exactly the same optical path to form a confocal system.
このような構成からなるこの発明のスペクトル測定装
置においては、試料の位置a,bを比較すると、位置aの
方が励起光によって励起される分子の濃度は高いがその
面積は小さい。モニタ光は励起された領域だけを通るの
で、aの方が吸光度が大きいため、信号強度としては小
さくなる。In the spectrum measuring apparatus of the present invention having such a configuration, when comparing the positions a and b of the sample, the position a has a higher concentration of molecules excited by the excitation light but a smaller area at the position a. Since the monitor light passes only through the excited region, the signal intensity becomes smaller because a has a higher absorbance.
このような原理から、試料についての深さ方向の情報
を観測することができる。つまり、3次元空間分解吸収
スペクトル測定が可能となる。From such a principle, information on the sample in the depth direction can be observed. That is, three-dimensional spatially resolved absorption spectrum measurement becomes possible.
分解能は、xy空間としては (N.A.はレンズの開口数)(λは光の波長)であり、Z
軸は(深さ方向)としては である。Resolution is as xy space (NA is the numerical aperture of the lens) (λ is the wavelength of light)
The axis is (in the depth direction) It is.
この発明の装置においては、光励起以外の吸収があっ
ても、励起光を照射したときと、しないときとの差によ
って光励起吸収だけを測定でき、また、励起光およびモ
ニタ光としてパルスレーザ光を用いることにより時間分
解測定も可能となる。In the device of the present invention, even if there is absorption other than light excitation, only the light excitation absorption can be measured by the difference between when the excitation light is irradiated and when it is not irradiated, and pulse laser light is used as the excitation light and monitor light. This also enables time-resolved measurement.
また、モニタ光の波長を変えることにより、吸収スペ
クトルの測定も可能となる。Further, by changing the wavelength of the monitor light, it becomes possible to measure the absorption spectrum.
なお、検出器の前にピンホールを置くことにより、散
乱光等の影響を除きコントラストを上げることができ
る。また、この発明の装置においては、励起光を微小領
域に絞るため、それほどレーザのパワーが大きくなくと
も、物質を励起するのに必要なエネルギーを供給するこ
とができる。By placing a pinhole in front of the detector, it is possible to increase the contrast without the influence of scattered light and the like. Further, in the device of the present invention, since the excitation light is focused on a very small area, it is possible to supply the energy necessary for exciting the substance even if the power of the laser is not so large.
(発明の効果) この発明により、以上詳しく説明した通り、レーザ光
を用いての3次元空間分解および時間分解測定可能な吸
収スペクトル装置、すなわち共焦点レーザ誘起吸収顕微
鏡が実現される。(Effect of the Invention) According to the present invention, as described in detail above, an absorption spectrum apparatus capable of three-dimensional spatial and time-resolved measurement using a laser beam, that is, a confocal laser-induced absorption microscope is realized.
第1図は、この発明の装置の構成を実施例として示した
光学構成図である。 第2図、第3図、第4図および第5図は各々、従来の顕
微鏡について示した光学構成図である。FIG. 1 is an optical configuration diagram showing the configuration of the apparatus of the present invention as an embodiment. FIG. 2, FIG. 3, FIG. 4, and FIG. 5 are optical configuration diagrams each showing a conventional microscope.
フロントページの続き (56)参考文献 特開 昭47−33662(JP,A) 特開 昭63−131116(JP,A) 特開 昭63−306414(JP,A) 特開 昭64−59018(JP,A) Tech Rep ISSP Ser A No.2081(1988)p 1−16 Proc.SPIE Int.So c.Opt.Fng.Vol 1127 (1989)p 101−108 (58)調査した分野(Int.Cl.6,DB名) G01N 21/00 - 21/01 G01N 21/17 - 21/74 JOIS WPI/LContinuation of the front page (56) References JP-A-47-33662 (JP, A) JP-A-63-131116 (JP, A) JP-A-63-306414 (JP, A) JP-A-64-59018 (JP) , A) Tech Rep ISSP Ser A No. 2081 (1988) p1-16 Proc. SPIE Int. SoC. Opt. Fng. Vol 1127 (1989) p 101-108 (58) Fields investigated (Int. Cl. 6 , DB name) G01N 21/00-21/01 G01N 21/17-21/74 JOIS WPI / L
Claims (2)
あるいは逆方向からピンホール励起光を入射させてモニ
タ光と励起光とを共焦点とし、試料の光誘起吸収の3次
元空間分解測定を行うことを特徴とする吸収スペクトル
測定装置。An optical path direction of the pinhole monitor light;
Alternatively, an absorption spectrum measurement apparatus characterized in that pinhole excitation light is incident from the opposite direction to make monitor light and excitation light confocal, and three-dimensional spatially resolved measurement of light-induced absorption of a sample is performed.
用いて時間分解測定を行う請求項(1)記載の吸収スペ
クトル測定装置。2. The absorption spectrum measuring apparatus according to claim 1, wherein the time-resolved measurement is performed by using pulse laser light as the monitor light and the excitation light.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25339789A JP2836859B2 (en) | 1989-09-27 | 1989-09-27 | Three-dimensional spatial and time-resolved absorption spectrum measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25339789A JP2836859B2 (en) | 1989-09-27 | 1989-09-27 | Three-dimensional spatial and time-resolved absorption spectrum measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03113349A JPH03113349A (en) | 1991-05-14 |
| JP2836859B2 true JP2836859B2 (en) | 1998-12-14 |
Family
ID=17250804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25339789A Expired - Lifetime JP2836859B2 (en) | 1989-09-27 | 1989-09-27 | Three-dimensional spatial and time-resolved absorption spectrum measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2836859B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007086047A (en) * | 2005-08-22 | 2007-04-05 | National Institute Of Advanced Industrial & Technology | Spectrochemical analysis and three-dimensional shape observation method and apparatus |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3216506B2 (en) * | 1995-12-14 | 2001-10-09 | 横河電機株式会社 | Optical property measurement device with measurement area confirmation function |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63131116A (en) * | 1986-11-21 | 1988-06-03 | Hitachi Ltd | confocal microscope |
| JPH07111505B2 (en) * | 1987-06-09 | 1995-11-29 | オリンパス光学工業株式会社 | Photoelectric microscope |
| JPH0776711B2 (en) * | 1987-08-31 | 1995-08-16 | 新技術事業団 | High time resolved total internal reflection spectroscopy and measurement equipment |
-
1989
- 1989-09-27 JP JP25339789A patent/JP2836859B2/en not_active Expired - Lifetime
Non-Patent Citations (2)
| Title |
|---|
| Proc.SPIE Int.Soc.Opt.Fng.Vol 1127(1989)p 101−108 |
| Tech Rep ISSP Ser A No.2081(1988)p 1−16 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007086047A (en) * | 2005-08-22 | 2007-04-05 | National Institute Of Advanced Industrial & Technology | Spectrochemical analysis and three-dimensional shape observation method and apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03113349A (en) | 1991-05-14 |
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