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JP2844838B2 - Center detection method for electronic components - Google Patents
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JP2844838B2 - Center detection method for electronic components - Google Patents

Center detection method for electronic components

Info

Publication number
JP2844838B2
JP2844838B2 JP2118307A JP11830790A JP2844838B2 JP 2844838 B2 JP2844838 B2 JP 2844838B2 JP 2118307 A JP2118307 A JP 2118307A JP 11830790 A JP11830790 A JP 11830790A JP 2844838 B2 JP2844838 B2 JP 2844838B2
Authority
JP
Japan
Prior art keywords
center
lead
electronic component
pitch sequence
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2118307A
Other languages
Japanese (ja)
Other versions
JPH0414299A (en
Inventor
章洋 熊崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2118307A priority Critical patent/JP2844838B2/en
Publication of JPH0414299A publication Critical patent/JPH0414299A/en
Application granted granted Critical
Publication of JP2844838B2 publication Critical patent/JP2844838B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 産業上の利用分野 本発明は、1辺に2本以上のリードを持つ電子部品を
基板に装着する場合に、電子部品の中心を求める検出方
法に関するものである。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a detection method for determining the center of an electronic component when an electronic component having two or more leads on one side is mounted on a substrate.

従来の技術 従来、1辺に2本以上のリードを持つ電子部品、たと
えばQFP,SOP等を基板に装着する場合、電子部品の装着
後に、基板とランドのずれが生じないように、電子部品
を基板に接着する前に、電子部品のセンター位置を機械
的に求める例が多い。また最近では、この機械式センタ
ーリング方式に変り、認識装置を用いて画像処理におい
てセンターリングをする方法も増加しつつある。
2. Description of the Related Art Conventionally, when mounting an electronic component having two or more leads on one side, for example, a QFP or SOP, on a substrate, the electronic component is mounted so that a displacement between the substrate and the land does not occur after the mounting of the electronic component. In many cases, the center position of the electronic component is mechanically determined before bonding to the substrate. Recently, instead of the mechanical centering method, the number of methods of performing centering in image processing using a recognition device is increasing.

発明が解決しようとする課題 これらの電子部品のセンターを求める方法すなわちセ
ンターリング方法において、機械式センターリングの場
合、システムが簡易でしかも制御的にはセンターリング
用爪を動かす程度であり構造,機構,制御全てに容易に
システム構築が可能である反面、メカ的に電子部品をつ
かみ強制的にセンターリングを行なうため、電子部品の
リードを曲げてしまったり、また位置精度もメカの良し
悪しに大きく左右されるという欠点を有している。
Problems to be Solved by the Invention In the method of finding the center of these electronic components, that is, the centering method, in the case of a mechanical centering, the system is simple and the control is such that the centering claw is moved. , Although it is possible to easily construct a system for all controls, on the other hand, mechanically grasping the electronic components and forcibly centering them, the leads of the electronic components may be bent, and the positional accuracy may be large depending on the quality of the mechanism. It has the drawback of being influenced by.

また、認識装置を用いて画像処理によりセンターリン
グを行なう方法においては、画像処理のため電子部品に
対するメカ的ダメージは一切なく、また純電子的に位置
の割出しが可能なため、位置精度も非常に高いという利
点を有している。しかしながら、従来の画像処理による
方法では、電子部品のリードの位置を1本1本測定し、
その全部のリードの位置から最小二乗法等の計算手段を
用いて当該電子部品のセンターを算出するとか、各辺の
リードの位置を近似直線で結びその直線により作られた
外接長方形のセンターを求めるという方法が取られてお
り、前者においてはメモリー容量の増加、計算時間の増
加という問題があり、後者ではセンター位置精度が悪い
という問題がある。
Also, in the method of performing centering by image processing using a recognition device, there is no mechanical damage to electronic components due to the image processing, and since the position can be determined purely electronically, the position accuracy is extremely high. It has the advantage of being high. However, in the conventional image processing method, the positions of the leads of the electronic component are measured one by one,
The center of the electronic component is calculated using the least squares method or the like from the positions of all the leads, or the center of a circumscribed rectangle formed by the straight lines is obtained by connecting the positions of the leads on each side with an approximate straight line. The former method has a problem that the memory capacity increases and the calculation time increases, and the latter method has a problem that the center position accuracy is poor.

本発明の目的は、上記のような従来の問題点を解消し
て画像処理におけるセンターリング方式の利点を有しつ
つメモリーの削減、計算時間の縮小を図りながら、なお
かつ位置精度は高める方法を提供しようとするものであ
る。
SUMMARY OF THE INVENTION An object of the present invention is to provide a method that solves the above-described conventional problems and has the advantage of the centering method in image processing while reducing the memory and the calculation time while increasing the position accuracy. What you want to do.

課題を解決するための手段 本発明は、1辺にリードが2本以上存在する電子部品
を、基板上に装着するときに、当該電子部品の仕様書に
基づきリード本数並びにリードピッチデータを理論ピッ
チ数列として登録すると共に中心値を算出し、装着する
電子部品の全リード位置を計測し、前記理論ピッチ数列
のリード位置と前記計測したリード位置とを比較し、そ
れぞれの差分を算出し、この差分の最大量が最小になる
ように、変移量を求め、前記理論ピッチ数列の中心値に
前記変移量を加味して変移後のセンターとし、この変移
後のセンターを各辺で求め、対向する辺の変移後のセン
ター同志を結んだ交点を部品のセンターとするものであ
る。また、装着する電子部品の全リード位置の計測デー
タに基づき各辺毎に測定ピッチ数列を作成し、前記理論
ピッチ数列と測定ピッチ数列をリード並びの端のリード
の点の値の差分を零として重ね合わせそれぞれの差分を
算出し、この差分の最大量を最小になるように変移量を
求めるようにしたものである。
Means for Solving the Problems According to the present invention, when an electronic component having two or more leads on one side is mounted on a substrate, the number of leads and lead pitch data are converted to a theoretical pitch based on the specification of the electronic component. Register as a sequence and calculate the center value, measure all the lead positions of the electronic components to be mounted, compare the lead position of the theoretical pitch sequence with the measured lead position, calculate the respective difference, and calculate the difference Is determined so that the maximum amount of the minimum is minimized, and the center value of the theoretical pitch sequence is taken into account by taking the amount of the shift into consideration, and the center after the shift is determined. The intersection between the centers after the transition is the center of parts. Further, a measurement pitch sequence is created for each side based on the measurement data of all the lead positions of the electronic components to be mounted, and the difference between the theoretical pitch sequence and the measurement pitch sequence at the point of the lead at the end of the lead arrangement is set to zero. The difference between the superpositions is calculated, and the amount of displacement is determined so that the maximum amount of the difference is minimized.

作用 上記の如く本発明は、まずあらかじめ当該電子部品の
リードピッチデータ及び各辺のリードの本数から、リー
ドピッチを幅とした固定数列(この数列を理論ピッチ数
列と呼ぶ)を作成し、登録すると同時に、中心位置を算
出する。
As described above, according to the present invention, first, a fixed sequence having a lead pitch as a width (this sequence is called a theoretical pitch sequence) is created and registered in advance from the lead pitch data of the electronic component and the number of leads on each side. At the same time, the center position is calculated.

次に、電子部品のリード位置を測定し、各辺毎にリー
ド位置の数列を作成する(この数列を測定ピッチ数列と
呼ぶ)。
Next, the lead position of the electronic component is measured, and a sequence of lead positions is created for each side (this sequence is called a measurement pitch sequence).

次に、上記2つの数列を特定点を決めこの点の値の差
分を0として重ね合せ夫々の差分を計算し、リードピッ
チデータから求められた数列つまり理論ピッチ数列を基
準として、この数列とリードを計測して求めた数列つま
り、測定ピッチ数列のプラス側の最大差とマイナス側の
最大差を抽出する。このプラス側とマイナス側の差を足
して2分の1にしたものを中心位置の変移量とし、この
変移量だけ理論ピッチ数列の中心値に加味して変移後の
センターとするとこれが各辺の中心に近似し、しかも実
測リードとのバラつきは最小となる。
Next, a specific point is determined for the above two sequences, the difference between the values at this point is set to 0, and the respective differences are calculated. Based on the sequence obtained from the lead pitch data, that is, the theoretical pitch sequence, this sequence and the read sequence are read. Is extracted, that is, the maximum difference on the plus side and the maximum difference on the minus side of the sequence of measured pitches are extracted. When the difference between the plus side and the minus side is added and halved, the shift amount of the center position is defined as the shift amount of the center position, and the shift amount is added to the center value of the theoretical pitch sequence to obtain the center after the shift. It is close to the center, and the deviation from the measured lead is minimized.

理論ピッチ数列の中心はあらかじめ計算で求めておけ
るので測定ピッチ数列との比較と、その中でのプラス,
マイナスの最大値さえ求まれば容易に変移量を計算で
き、電子部品の各辺の中心を求めることができる。
Since the center of the theoretical pitch sequence can be obtained in advance by calculation, comparison with the measured pitch sequence, plus and minus
If only the negative maximum value is obtained, the displacement can be easily calculated, and the center of each side of the electronic component can be obtained.

電子部品の中心は、前記で求めた各辺の中心位置を対
向する辺の中心位置同志で結んでできた交点とすればよ
い。
The center of the electronic component may be an intersection formed by connecting the center positions of the sides obtained above with the center positions of the opposing sides.

上記した構成によれば、電子部品の仕様書のデータそ
のものを用いて電子部品のセンターを求めるため、デー
タの入力も容易になり、しかも実際に測定する電子部品
のリードピッチのバラつきがあっても夫々の平均的なセ
ンターを求めるため大きな誤差は生じない。
According to the above-described configuration, since the center of the electronic component is determined using the data itself of the specification of the electronic component, the input of data becomes easy, and even if there is variation in the lead pitch of the electronic component actually measured. There is no large error because each average center is determined.

また、本方法とリードピッチ検定のためのピッチ誤差
許容値を並用し、許容値以上の電子部品を排除する方法
を用いれば、センターリングの精度はより以上に向上す
ると言える。
In addition, it can be said that the centering accuracy is further improved by using this method and the method of eliminating the electronic components exceeding the allowable value by using the pitch error allowable value for the lead pitch test in parallel.

実施例 以下、本発明の一実施例として図面を基に説明する。An embodiment of the present invention will be described below with reference to the drawings.

第2図は、QFPを撮像した後、リード位置をリードa
を基準に測定した例である。
FIG. 2 shows that after the QFP is imaged,
This is an example in which measurement was performed with reference to FIG.

次に、理論ピッチ数列と前記で測定したリード位置の
測定ピッチ数列をリードaを基準として重ね合せたもの
が第3図である。この時、理論ピッチ数列と測定ピッチ
数列を比較し差の有無を測定する。この第3図の例の場
合、リードbで「ΔM」、リードdで「ΔP」の差が発
生していることがわかる。ここで発生した差分「ΔM」
と「ΔP」が最小になる位置がリードの平均中心と考え
られるため理論ピッチ数列の中心値にΔC加味する。
Next, FIG. 3 shows the theoretical pitch sequence and the measured pitch sequence of the lead position measured above superimposed on the basis of the lead a. At this time, the theoretical pitch sequence and the measured pitch sequence are compared to determine whether there is a difference. In the example of FIG. 3, it can be seen that a difference of “ΔM” occurs in the lead b and a difference of “ΔP” occurs in the lead d. Difference “ΔM” generated here
Since the position where “ΔP” becomes minimum is considered to be the average center of the lead, ΔC is added to the center value of the theoretical pitch sequence.

第4図に示すように、理論ピッチ数列の中心値にΔC
加味したものが中心C′でありこの辺の中心となる。こ
れらを4辺くり返し、4辺の対向するC′同志を結んだ
線分の交点を電子部品の中心とする。
As shown in FIG. 4, the center value of the theoretical pitch sequence is ΔC
The added one is the center C ', which is the center of this side. These are repeated on four sides, and the intersection of the line connecting the four opposite C's is defined as the center of the electronic component.

第1図(a),第1図(b)は上記動作のフローチャ
ートである。
1 (a) and 1 (b) are flowcharts of the above operation.

第1図(a),第1図(b)のフローチャートに基づ
いて動作の流れを説明する。
The flow of the operation will be described based on the flowcharts of FIGS. 1 (a) and 1 (b).

まずステップ1及びステップ2で電子部品の基本デー
タを入力し、ステップ3で理論ピッチ数列と中心値Cを
計算する。次に測定すべき電子部品を撮像し、ステップ
4でリード位置を検出し、ステップ5でリード位置から
測定ピッチ数列を算出する。ステップ6で代表リードを
決定するが、本実施例ではリード並びの端のリードとし
た。ステップ7でステップ3及び5で求めた理論ピッチ
数列と測定ピッチ数列とを代表リード点を重ね合せ比較
していく。ステップ8及びステップ9で差分を算出しス
テップ10で中心のシフト量を算出する。ステップ11でシ
フト後の理論ピッチ数列の中心値に前記シフト量(変移
量)を加味したものを辺の中心とする。ステップ12で以
上の動作を4辺全て実行したかを確認し、ステップ13に
て電子部品の中心を計算する。
First, basic data of an electronic component is inputted in steps 1 and 2, and in step 3, a theoretical pitch sequence and a center value C are calculated. Next, the electronic component to be measured is imaged, the lead position is detected in step 4, and the measured pitch sequence is calculated from the lead position in step 5. In step 6, the representative lead is determined. In the present embodiment, the lead at the end of the lead arrangement is used. In step 7, the representative read point is compared with the theoretical pitch sequence obtained in steps 3 and 5 and the measured pitch sequence is compared. In steps 8 and 9, the difference is calculated, and in step 10, the center shift amount is calculated. In step 11, the center value of the side is obtained by adding the shift amount (shift amount) to the center value of the shifted theoretical pitch sequence. In step 12, it is checked whether all the above operations have been performed, and in step 13, the center of the electronic component is calculated.

発明の効果 本発明は、上記のような構成をとったので、小さなメ
モリーでまた計算も容易に電子部品の中心を求めること
ができるとともに、精度は全リード位置の平均値を取っ
た場合と比べ遜色がないという効果を有する。
Effect of the Invention Since the present invention has the above-described configuration, the center of the electronic component can be obtained with a small memory and can be easily calculated, and the accuracy is smaller than that obtained when the average value of all the lead positions is obtained. It has the effect of being comparable.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の一実施例として示した部品装着位置決
め方法のフローチャート、第2図は電子部品のリード位
置測定の説明図、第3図は理論ピッチ数列と測定ピッチ
数列の比較図、第4図は理論ピッチの中心値に差分を加
味した場合の説明図である。
FIG. 1 is a flowchart of a component mounting and positioning method shown as one embodiment of the present invention, FIG. 2 is an explanatory diagram of a lead position measurement of an electronic component, FIG. 3 is a comparison diagram of a theoretical pitch sequence and a measured pitch sequence, FIG. FIG. 4 is an explanatory diagram when a difference is added to the center value of the theoretical pitch.

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】一辺にリードが2本以上存在する電子部品
を、基板上に接着するときに、当該電子部品の仕様書に
基づきリード本数並びにリードピッチデータを理論ピッ
チ数列として登録すると共に中心値を算出し、装着する
電子部品の全リード位置を計測し、前記理論ピッチ数列
のリード位置と前記計測したリード位置とを比較し、そ
れぞれの差分を算出し、この差分の最大量が最小になる
ように、変移量を求め、前記理論ピッチ数列の中心値に
前記変移量を加味して変移後のセンターとし、この変移
後のセンターを各辺で求め、対向する辺の変移後のセン
ター同志を結んだ交点を部品のセンターとする電子部品
の中心検出方法。
When an electronic component having two or more leads on one side is bonded to a substrate, the number of leads and lead pitch data are registered as a theoretical pitch sequence based on the specification of the electronic component and a central value is registered. Is calculated, all the lead positions of the electronic components to be mounted are measured, the lead positions of the theoretical pitch sequence are compared with the measured lead positions, and the respective differences are calculated, and the maximum amount of this difference is minimized. In this way, the amount of displacement is obtained, and the center value of the theoretical pitch sequence is added to the amount of the displacement to obtain the center after the change, and the center after this change is obtained on each side, and the centers of the opposing sides after the change are determined. A method of detecting the center of an electronic component with the connected intersection as the center of the component.
【請求項2】装着する電子部品の全リード位置の計測デ
ータに基づき各辺毎に測定ピッチ数列を作成し、前記理
論ピッチ数列と測定ピッチ数列をリード並びの端のリー
ドの点の値の差分を零として重ね合わせそれぞれの差分
を算出し、この差分の最大量を最小になるように変移量
を求めるようにしたことを特徴とする請求項1記載の電
子部品の中心検出方法。
2. A measurement pitch sequence is created for each side based on measurement data of all lead positions of an electronic component to be mounted, and a difference between the theoretical pitch sequence and the measurement pitch sequence at a value of a lead point at an end of a row of leads is arranged. 2. The method for detecting the center of an electronic component according to claim 1, wherein a difference between the superimposed positions is calculated by setting 零 to zero, and a displacement amount is determined so as to minimize the maximum amount of the difference.
JP2118307A 1990-05-07 1990-05-07 Center detection method for electronic components Expired - Fee Related JP2844838B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2118307A JP2844838B2 (en) 1990-05-07 1990-05-07 Center detection method for electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2118307A JP2844838B2 (en) 1990-05-07 1990-05-07 Center detection method for electronic components

Publications (2)

Publication Number Publication Date
JPH0414299A JPH0414299A (en) 1992-01-20
JP2844838B2 true JP2844838B2 (en) 1999-01-13

Family

ID=14733447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2118307A Expired - Fee Related JP2844838B2 (en) 1990-05-07 1990-05-07 Center detection method for electronic components

Country Status (1)

Country Link
JP (1) JP2844838B2 (en)

Also Published As

Publication number Publication date
JPH0414299A (en) 1992-01-20

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