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JP2851227B2 - Method for detecting the position of a light beam incident on a CCD - Google Patents
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JP2851227B2 - Method for detecting the position of a light beam incident on a CCD - Google Patents

Method for detecting the position of a light beam incident on a CCD

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Publication number
JP2851227B2
JP2851227B2 JP19218693A JP19218693A JP2851227B2 JP 2851227 B2 JP2851227 B2 JP 2851227B2 JP 19218693 A JP19218693 A JP 19218693A JP 19218693 A JP19218693 A JP 19218693A JP 2851227 B2 JP2851227 B2 JP 2851227B2
Authority
JP
Japan
Prior art keywords
light beam
intensity
intensity distribution
distribution coefficient
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP19218693A
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Japanese (ja)
Other versions
JPH0743113A (en
Inventor
篤志 北町
昌宏 清川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
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Kubota Corp
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Filing date
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Priority to JP19218693A priority Critical patent/JP2851227B2/en
Publication of JPH0743113A publication Critical patent/JPH0743113A/en
Application granted granted Critical
Publication of JP2851227B2 publication Critical patent/JP2851227B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、平行光線束、或いは収
束光線束をCCDイメージセンサに入射させて、その入
射光線束の最大強度を示す位置を検出するCCDへの入
射光線束の位置検出方法に関し、例えば、基準面に載置
された対象物にレーザ光線束を照射して、その反射光線
束をCCDイメージセンサで検出することにより前記対
象物の前記基準面からの距離を計測する三次元デジタイ
ザ等に利用されるCCDへの入射光線束の位置検出方法
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for detecting the position of a light beam incident on a CCD, which detects a position where a parallel light beam or a convergent light beam is incident on a CCD image sensor, and detects the position of the maximum intensity of the incident light beam. For example, a tertiary method for measuring the distance of the object from the reference surface by irradiating the object placed on the reference surface with a laser beam and detecting the reflected light beam with a CCD image sensor. The present invention relates to a method for detecting the position of a light beam incident on a CCD used in an original digitizer or the like.

【従来の技術】一般に、CCDイメージセンサに入射す
る平行光線束、或いは収束光線束の強度中心位置を、C
CDイメージセンサの出力データに基づいて少なくとも
単位画素間隔の精度で求める必要がある場合に、CCD
への入射光線束の強度分布が複数画素に及ぶと、どの画
素位置を強度中心位置として特定すればよいのかという
問題が生じる。例えば、上述の三次元デジタイザの場
合、入射光線束のCCDイメージセンサ上でのビームス
ポットは、通常複数画素に及び、測定対象物表面の基準
面に対する傾斜各や、表面色、さらにはノイズの影響等
を考えると、単にCCDの最大出力位置を前記ビームス
ポットの強度中心位置とすることは甚だ危険である。そ
こで、従来、CCDの出力をフィルタリングによりノイ
ズ除去して得られる出力データを微分して、極大値とな
る位置を強度中心位置として特定する方法が提案されて
いた。
2. Description of the Related Art Generally, the intensity center position of a parallel light beam or a convergent light beam incident on a CCD image sensor is represented by C
When it is necessary to obtain at least the unit pixel interval accuracy based on the output data of the CD image sensor, the CCD
If the intensity distribution of the incident light beam on a plurality of pixels, a problem arises as to which pixel position should be specified as the intensity center position. For example, in the case of the above-described three-dimensional digitizer, the beam spot of the incident light beam on the CCD image sensor usually covers a plurality of pixels, and the influence of each inclination of the surface of the measurement object with respect to the reference plane, the surface color, and noise. In consideration of the above, it is extremely dangerous to simply set the maximum output position of the CCD as the intensity center position of the beam spot. Therefore, conventionally, there has been proposed a method of differentiating output data obtained by removing noise from a CCD output by filtering, and specifying a position having a maximum value as an intensity center position.

【0002】[0002]

【発明が解決しようとする課題】上述した従来のCCD
への入射光線束の位置検出方法では、微分処理をハード
ウェアで実現する場合にはその構成が複雑で、しかも、
高価なものとなるという欠点や、ソフトウェアで実現す
れば長大な処理時間がかかり、システムの許容時間に納
まらないという欠点がある。そこで、本願出願人は、先
にCCDイメージセンサに基準光線束を入射させて得ら
れる強度データを正規化した強度分布係数群を生成し
て、前記CCDイメージセンサに前記平行光線束、或い
は収束光線束を入射させて得られる強度データ群と前記
強度分布係数群との積和を、単位画素だけずらせながら
演算導出して得られる極大値を求めて、前記CCDイメ
ージセンサへの前記入射光線束の最大強度を示す位置
を、前記極大値をとる画素群で構成される領域のうち、
前記強度分布係数群の最大強度位置に対応する位置とし
て求める方法を提案している(特願平4−316974
号)。
The conventional CCD described above.
In the method of detecting the position of the light beam incident on the light source, when the differentiation processing is realized by hardware, the configuration is complicated, and
There are disadvantages that it is expensive, and that if it is realized by software, it takes a long processing time and does not fit within the permissible time of the system. Therefore, the applicant of the present application first generates an intensity distribution coefficient group in which intensity data obtained by irradiating a reference light beam to a CCD image sensor is normalized, and outputs the parallel light beam or the convergent light beam to the CCD image sensor. The maximum value obtained by calculating and deriving the product sum of the intensity data group obtained by injecting the bundle and the intensity distribution coefficient group while shifting the unit pixel is obtained, and calculating the maximum value of the incident light beam onto the CCD image sensor. The position showing the maximum intensity, of the region composed of the pixel group having the maximum value,
A method of finding the position corresponding to the maximum intensity position of the intensity distribution coefficient group has been proposed (Japanese Patent Application No. 4-316974).
issue).

【0003】ところで、上述の方法において、CCDイ
メージセンサの単位画素ピッチよりも細かい精度で入射
光線束の最大強度位置を求める必要がある場合には、強
度分布係数群を、単位画素ピッチ内で異なる位置に対応
させて複数組生成して、CCDイメージセンサに測定光
線束を入射させて得られる強度データ群と前記強度分布
係数群との積和を、単位画素だけずらせながら演算導出
して得られる極大値を、前記複数の強度分布係数毎に求
めて、前記CCDイメージセンサへの前記入射光線束の
最大強度を示す位置を、前記極大値をとる画素群で構成
される複数の領域のうち、前記極大値のなかで最大の値
をとる強度分布係数群の最大強度位置に対応する位置と
して求めることになる。この場合、単位画素ピッチの1
/nの精度で入射光線束の最大強度を示す位置を特定す
るためには、n個の強度分布係数群を生成して上述の演
算処理を行う必要があるが、これら演算処理を全てハー
ドウェアで実現すると、回路数が増加して基板の大型化
を招き、装置への大きな収容空間が要求され、且つ、経
済性に欠けるという欠点があり、少なくとも1個の強度
分布係数群に対する演算処理回路を設けて、複数の強度
分布係数群に対してその演算処理回路を時間をずらせて
重複して用いるようなソフトウェアで実現すると、処理
速度が遅くなり実用に供しえないという欠点があった。
In the above-described method, when it is necessary to determine the maximum intensity position of the incident light beam with a finer precision than the unit pixel pitch of the CCD image sensor, the intensity distribution coefficient group differs within the unit pixel pitch. A plurality of sets are generated corresponding to the positions, and the product sum of the intensity data group obtained by irradiating the measurement light beam onto the CCD image sensor and the intensity distribution coefficient group is calculated and derived while shifting by the unit pixel. The local maximum value is determined for each of the plurality of intensity distribution coefficients, and the position indicating the maximum intensity of the incident light beam on the CCD image sensor is determined, among a plurality of regions including the pixel group having the local maximum value, It is determined as a position corresponding to the maximum intensity position of the intensity distribution coefficient group having the maximum value among the maximum values. In this case, the unit pixel pitch of 1
In order to specify the position indicating the maximum intensity of the incident light beam with an accuracy of / n, it is necessary to generate n intensity distribution coefficient groups and perform the above-described arithmetic processing. However, the number of circuits increases, the size of the substrate is increased, a large accommodation space for the device is required, and there is a drawback that economy is low. The arithmetic processing circuit for at least one intensity distribution coefficient group If the software is used to repeatedly use the arithmetic processing circuit for a plurality of intensity distribution coefficient groups with a time lag, the processing speed becomes slow and cannot be put to practical use.

【0004】本発明の目的は、CCDイメージセンサへ
の入射光線束のビームスポットが、複数画素に及ぶ場合
に、ハードウェア及びソフトウェアの負担を軽減しなが
らもその強度中心位置を単位画素間隔以上の精度で求め
うるCCDへの入射光線束の位置検出方法を提供するこ
とにある。
An object of the present invention is to reduce the burden on hardware and software when the beam spot of a light beam incident on a CCD image sensor covers a plurality of pixels, and to set the intensity center position at a unit pixel interval or more. An object of the present invention is to provide a method for detecting the position of a light beam incident on a CCD which can be obtained with high accuracy.

【0005】[0005]

【課題を解決するための手段】この目的を達成するため
本発明によるCCDへの入射光線束の位置検出方法の特
徴構成は、CCDイメージセンサに基準光線束を入射さ
せて得られる強度データを正規化した強度分布係数群
を、前記CCDイメージセンサの単位画素ピッチ内で異
なる位置に対応させて2n組(nは正整数)生成して、
前記CCDイメージセンサに測定用光線束を入射させて
得られる強度データ群と前記強度分布係数群との積和
を、単位画素だけずらせながら演算導出して得られる極
大値を、前記2n組の強度分布係数毎に求めて、前記C
CDイメージセンサへの前記入射光線束の最大強度を示
す位置を、前記極大値と、前記極大値をとる画素群で構
成される領域のうち各強度分布係数群の最大強度位置に
対応する画素位置との組み合わせに基づいて、前記単位
画素ピッチの1/(4n)の精度で特定する点にある。
In order to achieve this object, a feature of the method for detecting the position of a light beam incident on a CCD according to the present invention is that the intensity data obtained by making a reference light beam incident on a CCD image sensor is normalized. Generated 2n sets (n is a positive integer) corresponding to different positions within the unit pixel pitch of the CCD image sensor,
The maximum value obtained by calculating and deriving the product sum of the intensity data group obtained by irradiating the measuring light beam onto the CCD image sensor and the intensity distribution coefficient group by shifting the unit pixel by the unit pixel is calculated as the intensity of the 2n sets. Obtained for each distribution coefficient,
A position indicating the maximum intensity of the incident light beam onto the CD image sensor is defined as the maximum value, and a pixel position corresponding to the maximum intensity position of each intensity distribution coefficient group in a region formed of the pixel group having the maximum value. Is specified with an accuracy of 1 / (4n) of the unit pixel pitch.

【0006】[0006]

【作用】2n個の強度分布係数群を生成して、それら強
度分布係数群に対する積和、及び、極大積和をとる画素
群で構成される領域のうち、各強度分布係数群の最大強
度位置に対応する画素位置を求めるハードウェア或いは
ソフトウェアを設けると、それらにより求まる極大積和
のうち、最大積和をとる強度分布係数群、或いは、その
隣接する強度分布係数群の間に、前記CCDイメージセ
ンサへの前記入射光線束の最大強度を示す位置を特定で
きるのである。
In this embodiment, 2n intensity distribution coefficient groups are generated, and a product sum of the intensity distribution coefficient groups and a maximum intensity position of each intensity distribution coefficient group in a region constituted by a pixel group that takes a maximum sum of products. If the hardware or software for obtaining the pixel position corresponding to is provided, the CCD image is located between the intensity distribution coefficient group that takes the maximum sum of products or the adjacent intensity distribution coefficient group among the maximum sum of products obtained by the hardware or software. The position at which the maximum intensity of the light beam incident on the sensor is indicated can be specified.

【0007】[0007]

【発明の効果】本発明によれば、CCDイメージセンサ
への入射光線束のビームスポットが、複数画素に及ぶ場
合に、ハードウェア及びソフトウェアの負担を軽減しな
がらもその強度中心位置を単位画素間隔以上の精度で,
高速に、しかも、経済性よく求めうるCCDへの入射光
線束の位置検出方法を提供できるようになった。
According to the present invention, when the beam spot of a light beam incident on a CCD image sensor extends over a plurality of pixels, the intensity center position is reduced by a unit pixel interval while reducing the load on hardware and software. With the above accuracy,
It has become possible to provide a method for detecting the position of a light beam incident on a CCD, which can be obtained at high speed and economically.

【0008】[0008]

【実施例】以下に実施例を説明する。三次元デジタイザ
は、図6及び図7に示すように、レーザ発振器でなる光
源1からの測定光線束を、回動ミラー4、固定ミラー5
を介してX−Y基準平面2上に載置された測定対象物3
に向けて走査し、その測定対象物3表面からの散乱光線
束を固定ミラー6、回動ミラー4、収光光学系7を介し
て一次元CCDイメージセンサ8に入力させて、前記X
−Y基準平面2から前記測定対象物3の表面までの距離
0を測定する。つまり、前記X−Y基準平面2から散
乱した光線束の検出位置X0と、前記測定対象物3表面
からの散乱光線束の検出位置X1とのなす距離が、前記
測定光線束の前記X−Y基準平面2への入射位置と、前
記測定対象物3の表面への入射位置の前記X−Y基準平
面2への写像位置との距離ΔX0に比例するという関係
を用いて、前記距離Z0を求めるのである。
Embodiments will be described below. As shown in FIGS. 6 and 7, the three-dimensional digitizer converts the measurement light beam from the light source 1 composed of a laser oscillator into a rotating mirror 4 and a fixed mirror 5.
Object 3 placed on XY reference plane 2 via
, And the scattered light beam from the surface of the measuring object 3 is input to the one-dimensional CCD image sensor 8 via the fixed mirror 6, the rotating mirror 4, and the light collecting optical system 7.
Measure the distance Z 0 from the Y reference plane 2 to the surface of the measuring object 3. That is, the distance between the detection position X 0 of the light beam scattered from the XY reference plane 2 and the detection position X 1 of the scattered light beam from the surface of the measurement target 3 is the X of the measurement light beam. The distance is calculated by using a relationship that is proportional to the distance ΔX 0 between the incident position on the Y reference plane 2 and the position of the incident position on the surface of the measurement target 3 on the XY reference plane 2. it is determine the Z 0.

【0009】以下に、前記一次元CCDイメージセンサ
8への入射光線束の位置検出方法について説明する。図
2及び図3に示すように、前記一次元CCDイメージセ
ンサ8への入射光線束はセンサ8上でほぼ円形状に分布
するが、光源1にレーザ発振器を用いてあるのでその強
度分布はガウス分布となる。今、ノイズ等の誤差要因を
除去した基準光線束を上述のセンサ8に入射させた場合
に、前記センサ8の出力分布はガウス分布の離散データ
と等しい値となる。図2に示すように、基準光線束の最
大強度位置を前記CCDイメージセンサ8の任意の画素
の中央位置に合わせて入射させたときに得られる離散デ
ータを、基準光線束の最大強度で正規化して得られるm
個の係数データを第一強度分布係数群として生成する。
図3に示すように、基準光線束の最大強度位置を前記C
CDイメージセンサ8の任意の画素の境界位置に合わせ
て入射させたときに得られる離散データを、同じく基準
光線束の最大強度で正規化して得られるm個の係数デー
タを第二強度分布係数群として生成する。
A method for detecting the position of the light beam incident on the one-dimensional CCD image sensor 8 will be described below. As shown in FIGS. 2 and 3, the light beam incident on the one-dimensional CCD image sensor 8 is distributed in a substantially circular shape on the sensor 8, but since the light source 1 uses a laser oscillator, its intensity distribution is Gaussian. Distribution. Now, when the reference light beam from which error factors such as noise have been removed is made incident on the sensor 8, the output distribution of the sensor 8 has a value equal to the discrete data of the Gaussian distribution. As shown in FIG. 2, discrete data obtained when the maximum intensity position of the reference light beam is adjusted to the center position of an arbitrary pixel of the CCD image sensor 8 and the incident light is normalized by the maximum intensity of the reference light beam. M obtained
Is generated as a first intensity distribution coefficient group.
As shown in FIG. 3, the maximum intensity position of the reference light beam is
The m pieces of coefficient data obtained by normalizing the discrete data obtained when the light is incident on the boundary position of an arbitrary pixel of the CD image sensor 8 with the maximum intensity of the reference light beam are also used as a second intensity distribution coefficient group. Generate as

【0010】一方、前記測定対象物3表面からの散乱光
線束を、前記固定ミラー6、回動ミラー4、収光光学系
7を介して前記一次元CCDイメージセンサ8へ入射さ
せた場合、図4に示すように、前記センサ8から出力さ
れる強度データは、構成画素数512個のうちの複数画
素からなる領域にピーク値を持つように表される。
On the other hand, when a scattered light beam from the surface of the measuring object 3 is made incident on the one-dimensional CCD image sensor 8 via the fixed mirror 6, the rotating mirror 4, and the light collecting optical system 7, FIG. As shown in FIG. 4, the intensity data output from the sensor 8 is represented so as to have a peak value in an area composed of a plurality of pixels among the 512 constituent pixels.

【0011】前記センサ8から順番に出力される前記強
度データと前記第一強度分布係数群とを前記第一強度分
布係数群を構成するデータ数だけ対応付けて積和を演算
導出する処理を、単位画素だけずらせながら全出力デー
タについて実行する。その結果、積和が極大値となる画
素群で構成される第一領域に前記入射光線束の最大強度
位置が存在すると判別する。つまり、図1に示すよう
に、前記センサ8から出力される前記強度データ(d
1,d2,・・・)を、予め第一強度分布係数群(s
1,s2,・・・,sm)が格納された第一相関回路C
1に入力して、積和を以下のように演算する。 d1・s1+d2・s2+・・・・・・+dm・sm d2・s1+d3・s2+・・・・・・+d(m+1)・sm ・・・・・・・・・・・・・・・・・・・・・・・・・・・・ そして、現在の積和とラッチ回路C3に格納された以前
の積和とをコンパレータ回路C2で比較して、現在の積
和が大であるときにのみ、現在の積和を前記ラッチ回路
C3に格納するという演算を前記センサ8の全画素につ
いて行う。それらの積和の中で極大値をとる演算データ
が、第一強度分布係数群と最も相関関係が強いデータと
して前記ラッチ回路C3に残る。このとき、前記ラッチ
回路C3に格納された積和に対応する画素位置であっ
て、前記第一強度分布係数群の最大係数値に対応する画
素位置を示すデータがカウンタ回路C6を介してラッチ
回路C7に、またその時の輝度データがシフトレジスタ
C4を介してラッチ回路C5に格納される。
A process for calculating and deriving a sum of products by associating the intensity data sequentially output from the sensor 8 with the first intensity distribution coefficient group by the number of data constituting the first intensity distribution coefficient group, The process is executed for all output data while shifting by the unit pixel. As a result, it is determined that the maximum intensity position of the incident light flux exists in the first region including the pixel group in which the sum of products has the maximum value. That is, as shown in FIG. 1, the intensity data (d
, D2,...) To the first intensity distribution coefficient group (s
1, s2,..., Sm) are stored.
1 and the sum of products is calculated as follows. d1 · s1 + d2 · s2 + ... + dm · sm d2 · s1 + d3 · s2 + ... + d (m + 1) · sm ... ............ The current product sum is compared with the previous product sum stored in the latch circuit C3 by the comparator circuit C2, and only when the current product sum is large, The calculation of storing the sum of the products in the latch circuit C3 is performed for all the pixels of the sensor 8. The operation data having the maximum value in the sum of the products remains in the latch circuit C3 as data having the strongest correlation with the first intensity distribution coefficient group. At this time, data indicating a pixel position corresponding to the sum of products stored in the latch circuit C3 and corresponding to the maximum coefficient value of the first intensity distribution coefficient group is latched via the counter circuit C6. C7 and the luminance data at that time are stored in the latch circuit C5 via the shift register C4.

【0012】同じく、前記センサ8から順番に出力され
る前記強度データと前記第二強度分布係数群とを前記第
二強度分布係数群を構成するデータ数だけ対応付けて積
和を演算導出する処理を、単位画素だけずらせながら全
出力データについて実行する。その結果、積和が極大値
となる画素群で構成される第二領域に前記入射光線束の
最大強度位置が存在すると判別する。演算方法は、上述
と同様である。
A process for calculating and deriving a product sum by associating the intensity data sequentially output from the sensor 8 with the second intensity distribution coefficient group by the number of data constituting the second intensity distribution coefficient group. Is performed for all output data while shifting by unit pixels. As a result, it is determined that the maximum intensity position of the incident light beam exists in the second region including the pixel group in which the sum of products has the maximum value. The calculation method is the same as described above.

【0013】ラッチ回路C3とC3’のデータ、即ち、
各強度分布係数群の極大値と、ラッチ回路C7とC7’
のデータ、即ち、各強度分布係数群の最大強度位置に対
応する画素位置を、データ処理プロセッサDSPに入力
して、以下のように前記入射光線束の最大強度位置を特
定するのである。つまり、第一強度分布係数群の積和の
極大値をV1、最大強度位置に対応する画素位置をP1
とし、第二強度分布係数群の積和の極大値をV2、最大
強度位置に対応する画素位置をP2として、前記センサ
8の単位画素ピッチを4分割して考えると、図5に示す
ように、前記入射光線束の最大強度位置Pが、V1>V
2,P1=P2ならば、0.00≦P<0.25の範囲
にあり、V1<V2,P1=P2ならば、0.25≦P
<0.50の範囲にあり、V1>V2,P1=P2+1
ならば、−0.25≦P<0.00範囲にあり、V1<
V2,P1=P2+1ならば、−0.5≦P<−0.2
5の範囲にあると判別できる。即ち、CCDイメージセ
ンサ8への前記入射光線束の最大強度を示す位置を、2
組の強度分布係数群から単位画素ピッチの1/4の精度
で特定できるのである。
The data of the latch circuits C3 and C3 ', that is,
The local maximum value of each intensity distribution coefficient group, and latch circuits C7 and C7 '
, I.e., the pixel position corresponding to the maximum intensity position of each intensity distribution coefficient group is input to the data processor DSP, and the maximum intensity position of the incident light beam is specified as follows. That is, the maximum value of the product sum of the first intensity distribution coefficient group is V1, and the pixel position corresponding to the maximum intensity position is P1.
Assuming that the maximum value of the product sum of the second intensity distribution coefficient group is V2 and the pixel position corresponding to the maximum intensity position is P2, and the unit pixel pitch of the sensor 8 is divided into four, as shown in FIG. , The maximum intensity position P of the incident light beam is V1> V
2, if P1 = P2, the range is 0.00 ≦ P <0.25; if V1 <V2, P1 = P2, 0.25 ≦ P
<0.50, V1> V2, P1 = P2 + 1
Then, the range is -0.25 ≦ P <0.00, and V1 <
If V2, P1 = P2 + 1, -0.5≤P <-0.2
5 can be determined. That is, the position indicating the maximum intensity of the light beam incident on the CCD image sensor 8 is defined as 2
It is possible to specify from the set of intensity distribution coefficient groups with an accuracy of 1/4 of the unit pixel pitch.

【0014】以下に別実施例を説明する。先の実施例で
は、CCDイメージセンサが512個の画素数を持つも
のについて説明したが、これについて限定するものでは
ない。
Another embodiment will be described below. In the above embodiment, the CCD image sensor having 512 pixels has been described, but the present invention is not limited to this.

【0015】先の実施例では、m個の係数データで強度
分布係数群を構成するものを説明したが、mの値は特に
限定するものではない。
In the above embodiment, the case where the intensity distribution coefficient group is constituted by m pieces of coefficient data has been described, but the value of m is not particularly limited.

【0016】先の実施例では、二種類の強度分布係数群
を用いた場合を説明したが、これに限定するものではな
く、単位画素間の強度中心位置を異ならせて得られる2
n(nは正整数)種類の強度分布係数群を用いた場合に
は、CCDイメージセンサ8への入射光線束の最大強度
を示す位置が、単位画素間隔の1/(4n)の精度で求
まる。以下に詳述する。今、図8に示すように、単位画
素長さdを1/(2n)のピッチで基準光線束を入射さ
せて得られる2n個の強度分布係数群S1 ,S2 ,・・
・,S2nを生成する。各強度分布係数群の積和の極大値
のうち最大の値をとる強度分布係数群Si の最大画素位
置をPi とすると、入射光線束の真の最大強度を示す位
置Pは、Pi −(l/2)≦P<Pi +(l/2)の範
囲にあると推定される。但し、l=d/(2n)とす
る。次に、強度分布係数群の積和の極大値のうち最大の
値をとる強度分布係数群Si で特定される画素位置をQ
i 、その強度分布係数群Si とd/2だけずれた位置に
対応する強度分布係数群Sj で特定される画素位置をQ
j とすると、i<jのときに、Qi =Qj ならば、Pi
≦P<Pi +l/2の範囲にあり、Qi =Qj −1なら
ば、Pi −l/2≦P<Pi の範囲にあり、i>jのと
きに、Qi =Qj ならば、Pi −l/2≦P<Pi の範
囲にあり,Qi =Qj +1ならば、Pi ≦P<Pi +l
/2範囲にあると判別できる。即ち、CCDイメージセ
ンサ8への前記入射光線束の最大強度を示す位置を、2
n組の強度分布係数群から単位画素ピッチの1/(4
n)の精度で特定できるのである。
In the above embodiment, the case where two types of intensity distribution coefficient groups are used has been described. However, the present invention is not limited to this case.
When n (n is a positive integer) kinds of intensity distribution coefficient groups are used, the position indicating the maximum intensity of the light beam incident on the CCD image sensor 8 is obtained with an accuracy of 1 / (4n) of the unit pixel interval. . Details will be described below. Now, as shown in FIG. 8, 2n number of intensity distribution coefficient groups S1, S2,... Obtained by injecting a reference light beam with a unit pixel length d at a pitch of 1 / (2n).
, S2n are generated. Assuming that the maximum pixel position of the intensity distribution coefficient group Si that takes the maximum value among the maximum values of the sum of products of the respective intensity distribution coefficient groups is Pi, the position P indicating the true maximum intensity of the incident light beam is Pi − (l / 2) ≦ P <Pi + (l / 2). However, 1 = d / (2n). Next, the pixel position specified by the intensity distribution coefficient group Si having the maximum value among the maximum values of the product sum of the intensity distribution coefficient group is represented by Q
i, the pixel position specified by the intensity distribution coefficient group Sj corresponding to the position shifted from the intensity distribution coefficient group Si by d / 2 is Q
j, when i <j, if Qi = Qj, Pi
.Ltoreq.P <Pi + l / 2, if Qi = Qj-1, Pi-l / 2.ltoreq.P <Pi, i> j, if Qi = Qj, Pi-l / 2 ≦ P <Pi, and if Qi = Qj + 1, then Pi ≦ P <Pi + 1
/ 2 range. That is, the position indicating the maximum intensity of the light beam incident on the CCD image sensor 8 is defined as 2
From the n sets of intensity distribution coefficient groups, 1 / (4
It can be specified with the accuracy of n).

【0017】先の実施例で用いた演算処理回路はこれに
限定するものではなく、公知の技術を用いて適宜構成す
ることができる。
The arithmetic processing circuit used in the above embodiment is not limited to this, and can be appropriately configured using a known technique.

【0018】先の実施例では、強度分布係数群の各係数
を、用いた光源(レーザ)に合わせてガウス分布するよ
うに設定してあるが、強度分布係数群の各係数は用いる
光源の種類等により適宜設定すればよい。センサ8への
入射光線束は、平行光線束、或いは収束光線束のいずれ
にも適用できる。
In the above embodiment, each coefficient of the group of intensity distribution coefficients is set so as to have a Gaussian distribution according to the light source (laser) used. Etc. may be set as appropriate. The light beam incident on the sensor 8 can be applied to either a parallel light beam or a convergent light beam.

【0019】尚、特許請求の範囲の項に図面との対照を
便利にする為に符号を記すが、該記入により本発明は添
付図面の構成に限定するものではない。
In the claims, reference numerals are provided for convenience of comparison with the drawings, but the present invention is not limited to the configuration shown in the attached drawings.

【図面の簡単な説明】[Brief description of the drawings]

【図1】演算処理装置のブロック構成図FIG. 1 is a block diagram of an arithmetic processing unit.

【図2】第一強度分布係数群を示す説明図FIG. 2 is an explanatory diagram showing a first intensity distribution coefficient group.

【図3】第二強度分布係数群を示す説明図FIG. 3 is an explanatory diagram showing a second intensity distribution coefficient group.

【図4】入射光線束に対するCCDイメージセンサの出
力図
FIG. 4 is an output diagram of a CCD image sensor with respect to an incident light beam.

【図5】要部の説明図FIG. 5 is an explanatory view of a main part.

【図6】三次元デジタイザのブロック構成図FIG. 6 is a block diagram of a three-dimensional digitizer.

【図7】三次元デジタイザの原理図FIG. 7 is a principle diagram of a three-dimensional digitizer.

【図8】別実施例を示す要部の説明図FIG. 8 is an explanatory view of a main part showing another embodiment.

【符号の説明】[Explanation of symbols]

8 CCDイメージセンサ 8 CCD image sensor

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI G01J 1/42 G01J 1/42 E 1/44 1/44 P G06T 7/00 G06F 15/70 460D (56)参考文献 特開 平6−160084(JP,A) 特開 平2−179405(JP,A) 特開 昭63−317703(JP,A) 特開 昭63−293427(JP,A) (58)調査した分野(Int.Cl.6,DB名) G01B 11/00 11/30 G01C 3/00 - 3/32 G01J 1/00 - 1/60 G06T 7/00──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 6 Identification symbol FI G01J 1/42 G01J 1/42 E 1/44 1/44 P G06T 7/00 G06F 15/70 460D (56) References JP JP-A-6-160084 (JP, A) JP-A-2-179405 (JP, A) JP-A-63-317703 (JP, A) JP-A-63-293427 (JP, A) (58) Fields investigated (Int) .Cl. 6 , DB name) G01B 11/00 11/30 G01C 3/00-3/32 G01J 1/00-1/60 G06T 7/00

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 CCDイメージセンサ(8)に基準光線
束を入射させて得られる強度データを正規化した強度分
布係数群を、前記CCDイメージセンサ(8)の単位画
素ピッチ内で異なる位置に対応させて2n組(nは正整
数)生成して、 前記CCDイメージセンサ(8)に測定用光線束を入射
させて得られる強度データ群と前記強度分布係数群との
積和を、単位画素だけずらせながら演算導出して得られ
る極大値を、前記2n組の強度分布係数毎に求めて、 前記CCDイメージセンサ(8)への前記入射光線束の
最大強度を示す位置を、前記極大値と、前記極大値をと
る画素群で構成される領域のうち各強度分布係数群の最
大強度位置に対応する画素位置との組み合わせに基づい
て、前記単位画素ピッチの1/(4n)の精度で特定す
るCCDへの入射光線束の位置検出方法。
An intensity distribution coefficient group obtained by normalizing intensity data obtained by making a reference light beam incident on a CCD image sensor corresponds to different positions within a unit pixel pitch of the CCD image sensor. Then, 2n sets (n is a positive integer) are generated, and the product sum of the intensity data group and the intensity distribution coefficient group obtained by irradiating the measuring light beam to the CCD image sensor (8) is expressed by a unit pixel. A maximum value obtained by calculating and deriving while shifting is obtained for each of the 2n sets of intensity distribution coefficients, and a position indicating the maximum intensity of the light beam incident on the CCD image sensor (8) is defined as the maximum value, Based on a combination with a pixel position corresponding to the maximum intensity position of each intensity distribution coefficient group in a region composed of the pixel group having the maximum value, the pixel is specified with an accuracy of 1 / (4n) of the unit pixel pitch. C Position detecting method of the incident light beam to the D.
JP19218693A 1993-08-03 1993-08-03 Method for detecting the position of a light beam incident on a CCD Expired - Lifetime JP2851227B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19218693A JP2851227B2 (en) 1993-08-03 1993-08-03 Method for detecting the position of a light beam incident on a CCD

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19218693A JP2851227B2 (en) 1993-08-03 1993-08-03 Method for detecting the position of a light beam incident on a CCD

Publications (2)

Publication Number Publication Date
JPH0743113A JPH0743113A (en) 1995-02-10
JP2851227B2 true JP2851227B2 (en) 1999-01-27

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Country Link
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WO2002077571A2 (en) * 2001-03-26 2002-10-03 Koninklijke Philips Electronics N.V. Method of and a device for coupling optical fibres and opto-electronic components
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Also Published As

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