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JP2853242B2 - Josephson junction element - Google Patents
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JP2853242B2 - Josephson junction element - Google Patents

Josephson junction element

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Publication number
JP2853242B2
JP2853242B2 JP2050225A JP5022590A JP2853242B2 JP 2853242 B2 JP2853242 B2 JP 2853242B2 JP 2050225 A JP2050225 A JP 2050225A JP 5022590 A JP5022590 A JP 5022590A JP 2853242 B2 JP2853242 B2 JP 2853242B2
Authority
JP
Japan
Prior art keywords
ybco
josephson junction
substrate
superconductor
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2050225A
Other languages
Japanese (ja)
Other versions
JPH03252180A (en
Inventor
純一 喜多
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimazu Seisakusho KK
Original Assignee
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimazu Seisakusho KK filed Critical Shimazu Seisakusho KK
Priority to JP2050225A priority Critical patent/JP2853242B2/en
Publication of JPH03252180A publication Critical patent/JPH03252180A/en
Application granted granted Critical
Publication of JP2853242B2 publication Critical patent/JP2853242B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Superconductor Devices And Manufacturing Methods Thereof (AREA)

Description

【発明の詳細な説明】 <産業上の利用分野> 本発明は超電導ジョセフソン接合素子を有する素子に
関し、例えばSQUID、赤外検出器、ミキサ、三端子素
子、コンピュータ等の、ジョセフソン効果を利用したあ
らゆるデバイスに応用可能な素子に関する。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a device having a superconducting Josephson junction device, for example, utilizing the Josephson effect of a SQUID, an infrared detector, a mixer, a three-terminal device, a computer, etc. The present invention relates to an element that can be applied to any device.

<従来の技術> YBCO等を初めとする高温超電導体薄膜を用いたジョセ
フソン接合素子については、既に多くの提案や報告がな
されているが、現時点においては粒界を用いたものしか
実現されていない。
<Prior art> Many proposals and reports have been made on Josephson junction devices using high-temperature superconductor thin films such as YBCO, but at present, only those using grain boundaries have been realized. Absent.

その理由は、高温超電導体のコヒーレント長がÅオー
ダから十数Åと短いため、トンネル型にしろ、弱結合型
にしろ、人為的にジョセフソン効果が得られる形状がで
きないことに起因している。
The reason is that the coherent length of high-temperature superconductors is as short as Å10 to a dozen or so, so it is impossible to artificially obtain the Josephson effect regardless of tunnel type or weak coupling type. .

<発明が解決しようとする課題> ところで、粒界を利用したジョセフソン接合では、粒
界を制御することができないため、その臨界電流値Ic
ジョセフソン効果発生の有無等のばらつきを抑えること
はできていない。すなわち、現時点では再現性良く高性
能なジョセフソン接合素子を製造することができてな
い。
<SUMMARY invention> Now, the Josephson junctions utilizing grain boundary, it is not possible to control the grain boundary, to suppress the variation in the presence or absence of the critical current value I c and Josephson effect occurs Is not done. That is, at present, a high-performance Josephson junction device with good reproducibility has not been manufactured.

本発明の目的は、再現性が良く、かつ、高性能の粒界
ジョセフソン接合素子を提供することにある。
An object of the present invention is to provide a high-performance grain boundary Josephson junction device with good reproducibility.

<課題を解決するための手段> 上記の目的を達成するため、本発明では、実施例に対
応する第1図に示すように、基板1の表面を、所定の角
度θで互いに傾斜する上段平面1aと下段平面1bとに形成
し、これら上段平面1aと下段平面1bとの境界部分に形成
されるくさび形状の垂直段部1cを挟んでその上下段両側
の平面1a,1bに超電導体エピタキシャル成長薄膜を形成
し、かつ、その上下段の超電導体薄膜2a,2bを垂直段部1
c近傍で縮幅してブリッジを形成している。
<Means for Solving the Problems> In order to achieve the above object, according to the present invention, as shown in FIG. 1 corresponding to the embodiment, the upper surface of the substrate 1 is inclined at a predetermined angle θ. 1a and a lower plane 1b, and a superconductor epitaxially grown thin film is formed on both upper and lower planes 1a and 1b with a wedge-shaped vertical step 1c formed at a boundary portion between the upper plane 1a and the lower plane 1b. Are formed, and the upper and lower superconductor thin films 2a and 2b are vertically
The bridge is narrowed in the vicinity of c to form a bridge.

<作用> YBCOを初めとする高温超電導体薄膜では、一般に、臨
界超電導電流に結晶異方性が存在し、特にc軸に直行す
る方向に対して臨界電流密度Jcが大となる。
<Effect> In a high-temperature superconductor thin film such as YBCO, generally, the critical superconducting current has crystal anisotropy, and the critical current density Jc is particularly large in the direction perpendicular to the c-axis.

そして、結晶の相互の結合状態によって、臨界電流密
度Jcが変化することが知られている(PHY−SICAL REVIE
W LETTERS,Vol61,No.2,pp219−222)。
Then, the mutual coupling state of the crystal, the critical current density J c is known to vary (PHY-SICAL REVIE
W LETTERS, Vol 61, No. 2, pp 219-222).

また、YBCO薄膜を用いて、その自然発生的にできたc
軸が数度ずれたジョセフソン接合を用いて、良好なSQUI
Dを得た報告もある(Cur−rent in YBCO Bridge by MO
−CVD Thin Film,by Tsutomo Yamashita et al.)。
In addition, using a YBCO thin film, the naturally occurring c
Good SQUI using Josephson junction with axis shifted several degrees
There is also a report that obtained D (Cur-rent in YBCO Bridge by MO
-CVD Thin Film, by Tsutomo Yamashita et al.).

本発明はこのような事実を利用している。 The present invention utilizes such a fact.

すなわち、高温超電導体薄膜等の臨界超電導電流の結
晶異方性のある超電導体薄膜を、傾斜段差のある基板上
にエピタキシャル成長させることで、上下段の薄膜の結
晶軸方向を、第2図に模式的に示すように、その基板の
傾斜角θだけ強制的にずらせ、その垂直段部においてブ
リッジを形成することによって、ブリッジの臨界電流密
度Jcを低下させて再現性良く高性能のジョセフソン接合
を得ている。
In other words, a superconducting thin film having a crystal anisotropy of critical superconducting current, such as a high-temperature superconducting thin film, is epitaxially grown on a substrate having an inclined step. manner as shown, shifting forces by the inclination angle θ of the substrate, the by forming a bridge in the vertical stepped portion, reproducibly high performance Josephson junction by reducing the critical current density J c of the bridge Have gained.

<実施例> 第1図は本発明実施例の要部外観図である。<Example> FIG. 1 is an external view of a main part of an example of the present invention.

Mg0(100),あるいはSrTi03(100),(110)等の基
板1にはθ≒7°程度の傾斜段差が形成されており、そ
の上段および下段の平面1aおよび1bに、垂直段部1cを挟
んでそれぞれc軸配向のYBCOエピタキシャル成長膜2a,2
bが形成されている。
Mg0 (100), or SrTi0 3 (100), the substrate 1 such as a (110) is formed sloped step of about theta ≒ 7 ° is at its upper and lower planes 1a and 1b, the vertical stepped portion 1c The c-axis oriented YBCO epitaxial growth films 2a and 2
b is formed.

そして、垂直段部1cの近傍で、YBCOエピタキシャル成
長膜2a,2bはその幅が狭くなっており、ここがブリッジ
3となって上段および下段側平面の薄膜2a,2bを相互に
接合している。
In the vicinity of the vertical step portion 1c, the width of the YBCO epitaxially grown films 2a and 2b is reduced, and the YBCO epitaxial growth films 2a and 2b serve as bridges 3 to join the upper and lower flat films 2a and 2b to each other.

以上の構造は、次のような手順によって製造できる。 The above structure can be manufactured by the following procedure.

まず、上記したような材質の基板1の表面を、所定の
角度θで互いに傾斜する上段平面1aと下段平面1bとに形
成し、これら上段平面1aと下段平面1bとの境界部分にく
さび形状の垂直段部1cを形成する。その方法としては、
アルゴンイオンミリング装置で基板1表面を削る際に、
電流密度の勾配をつけておく方法を採用できる。
First, the surface of the substrate 1 made of the above-described material is formed into an upper plane 1a and a lower plane 1b that are inclined at a predetermined angle θ, and a wedge-shaped boundary is formed between the upper plane 1a and the lower plane 1b. The vertical step 1c is formed. As a method,
When shaving the substrate 1 surface with an argon ion milling machine,
A method of giving a gradient of the current density can be adopted.

次に、以上のような傾斜段差がついた基板1の上下段
平面1a,1bの表面に、YBCOを、それぞれの面に対してc
軸が垂直に立つようにエピタキシャル成長させる。ここ
で、基板1を650℃以上に加熱しておけば、YBCOの場
合、基板の格子定数と或る程度ミスフィットになってい
たとしても、c軸配向にエピタキシャル成長する。
Next, YBCO is applied to the surface of the upper and lower step planes 1a and 1b of the substrate 1 having the above-described inclined steps, and c is applied to each surface.
Epitaxial growth is performed so that the axis is vertical. Here, if the substrate 1 is heated to 650 ° C. or more, in the case of YBCO, even if a certain degree of misfit with the lattice constant of the substrate occurs, epitaxial growth occurs in the c-axis orientation.

その後、フォトリソグラフィ技術、イオンミリング技
術を用いた加工により、YBCO薄膜2a,2bを、垂直段部1c
を横切るようにその近傍の幅を1μm以下に狭くする。
Then, the YBCO thin films 2a and 2b are vertically processed by the photolithography technology and ion milling technology
, The width in the vicinity is narrowed to 1 μm or less.

以上のような本発明実施例の構造によると、第2図に
その垂直段部1cに対向する方向から見た模式図を示すよ
うに、上段側平面1a上のYBCO薄膜2aのc軸の方向(図中
実線矢印)と、下段側平面1b上のYBCO薄膜2bのc軸の方
向(図中点線矢印)とは、ほぼ平面1aと1bとの傾斜角度
θだけ相互にずれることになる。
According to the structure of the embodiment of the present invention as described above, the c-axis direction of the YBCO thin film 2a on the upper plane 1a as shown in FIG. 2 is a schematic view seen from the direction facing the vertical step 1c. (The solid arrow in the figure) and the direction of the c-axis of the YBCO thin film 2b on the lower plane 1b (dotted arrow in the figure) are shifted from each other substantially by the inclination angle θ between the planes 1a and 1b.

このことは、微小断面積のブリッジ3において、結晶
c軸が相互にθだけずれて接合される部分が生じること
を意味し、その部分における臨界電流密度Jcが低下し、
極めて小さい接合臨界電流Icを持つウィークリンクが得
られることを意味する。
This means that in the bridge 3 of the small cross-sectional area means that the portion crystal c axis is joined shifted by θ from each other occurs, decreases the critical current density J c at that portion,
Means that the weak links with very small junction critical current I c is obtained.

ここで注目すべき点は、このc軸のずれが、基板に形
成した傾斜段差(垂直段部1c)によって強制的に、か
つ、再現性よく生ずるという点であって、臨界電流Ic
小さい高性能のジョセフソン接合素子を再現性よく得ら
れるという点である。また、注目すべきもう1つの点
は、YBCO薄膜2a,2bを形成する面が平面であるため、膜
の配向性が向上し、ばらつきが抑えられるという点であ
る。
Here Notably, the deviation of the c-axis, forced by the inclined step formed on a substrate (vertical stepped portion 1c), and be a point that occurs reproducibly, small critical current I c The point is that a high-performance Josephson junction device can be obtained with good reproducibility. Another point to be noted is that since the surfaces on which the YBCO thin films 2a and 2b are formed are flat, the orientation of the films is improved, and variations are suppressed.

なお、傾斜角θの大きさは、0°<θ<30°程度の範
囲が好ましいが、特に30°を越えてはならないというも
のではない。
The magnitude of the inclination angle θ is preferably in the range of about 0 ° <θ <30 °, but is not particularly limited to 30 °.

また、超電導体薄膜の結晶軸は特にc軸に限定するも
のではないが、電極部分での臨界電流を大きくするため
には現時点ではc軸配向膜とすることが望ましい。
Further, the crystal axis of the superconductor thin film is not particularly limited to the c-axis, but at the present time it is desirable to use a c-axis oriented film in order to increase the critical current at the electrode portion.

更に、超電導体薄膜の種類はYBCOに限らず、臨界超電
導電流密度に結晶軸異方性があるものなら、例えばBi系
やTl系等、任意の超電導体を使用することができる。
Further, the type of the superconductor thin film is not limited to YBCO, and any superconductor such as a Bi-based or Tl-based superconductor can be used as long as the critical superconducting current density has crystal axis anisotropy.

更にまた、基板の材質としては、使用する超電導体が
エピタキシャル成長できるものであれば他の任意の材質
を使用することができる。
Further, as the material of the substrate, any other material can be used as long as the superconductor to be used can epitaxially grow.

<発明の効果> 以上説明したように、本発明によれば、基板の表面
を、所定の角度で互いに傾斜する上段平面と下段平面と
に形成し、これら上段平面と下段平面との境界部分にく
さび形状の垂直段部を形成し、これら上段平面及び下段
平面の表面に、垂直段部を跨ぐように超電導体のエピタ
キシャル成長膜を形成して、その垂直段部において縮幅
部を形成してブリッジとしたので、上段側と下段側の超
電導体薄膜は、上下段両側の平面の傾斜角とほぼ同程度
の角度だけ結晶軸が相互にずれることになり、極めて小
さい臨界電流密度の接合が再現性よく得られる。また、
超電導体薄膜を形成する上下段両側が平面であるため、
膜の配向性が向上し、ばらつきが抑えられるので、極め
て小さい臨界電流密度の接合がより再現性よく得られ、
ひいては、従来再現性がないとされていた粒界を用いた
ジョセフソン接合素子が、高性能で再現性のよいものと
なる。
<Effects of the Invention> As described above, according to the present invention, the surface of the substrate is formed into an upper plane and a lower plane that are inclined at a predetermined angle, and the surface of the substrate is formed at the boundary between the upper plane and the lower plane. A wedge-shaped vertical step is formed, and an epitaxially grown superconductor film is formed on the upper and lower planes so as to straddle the vertical step, and a narrower portion is formed in the vertical step to form a bridge. As a result, the crystal axes of the upper and lower superconducting thin films are shifted from each other by almost the same angle as the inclination angle of the plane on both the upper and lower stages. Well obtained. Also,
Because both upper and lower steps forming the superconductor thin film are flat,
Since the orientation of the film is improved and the variation is suppressed, a junction having an extremely small critical current density can be obtained with higher reproducibility,
As a result, a Josephson junction element using a grain boundary, which has conventionally been regarded as having no reproducibility, has high performance and good reproducibility.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明実施例の要部外観図、第2図はその模式
的な作用説明図である。 1……基板 1a……上段側平面 1b……下段側平面 1c……垂直段部 2a,2b……YBCOエピタキシャル成長膜
FIG. 1 is an external view of a main part of an embodiment of the present invention, and FIG. 2 is a schematic operation explanatory view thereof. 1 Substrate 1a Upper plane 1b Lower plane 1c Vertical step 2a, 2b YBCO epitaxial growth film

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】基板表面が所定の角度で互いに傾斜する上
段平面と下段平面とに形成され、これら上段平面と下段
平面との境界部分である垂直段部を挟んでその上下段両
側の平面に超電導体エピタキシャル成長薄膜が形成さ
れ、かつ、その上下段の超電導体薄膜が上記垂直段部近
傍で縮幅されてなるジョセフソン接合素子。
An upper surface and a lower surface which are inclined at a predetermined angle from each other are formed on an upper surface and a lower surface, and the upper and lower surfaces of the upper surface and the lower surface are sandwiched by a vertical step which is a boundary between the upper surface and the lower surface. A Josephson junction device in which a superconductor epitaxially grown thin film is formed, and the superconductor thin films of the upper and lower stages are reduced in width in the vicinity of the vertical step.
JP2050225A 1990-02-28 1990-02-28 Josephson junction element Expired - Lifetime JP2853242B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2050225A JP2853242B2 (en) 1990-02-28 1990-02-28 Josephson junction element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2050225A JP2853242B2 (en) 1990-02-28 1990-02-28 Josephson junction element

Publications (2)

Publication Number Publication Date
JPH03252180A JPH03252180A (en) 1991-11-11
JP2853242B2 true JP2853242B2 (en) 1999-02-03

Family

ID=12853099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2050225A Expired - Lifetime JP2853242B2 (en) 1990-02-28 1990-02-28 Josephson junction element

Country Status (1)

Country Link
JP (1) JP2853242B2 (en)

Also Published As

Publication number Publication date
JPH03252180A (en) 1991-11-11

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