JP2873501B2 - Resin sealing method for semiconductor integrated device in surface mounting of electric wiring board - Google Patents
Resin sealing method for semiconductor integrated device in surface mounting of electric wiring boardInfo
- Publication number
- JP2873501B2 JP2873501B2 JP26583190A JP26583190A JP2873501B2 JP 2873501 B2 JP2873501 B2 JP 2873501B2 JP 26583190 A JP26583190 A JP 26583190A JP 26583190 A JP26583190 A JP 26583190A JP 2873501 B2 JP2873501 B2 JP 2873501B2
- Authority
- JP
- Japan
- Prior art keywords
- resin
- stencil
- sealing
- hole
- squeegee
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は電気配線基板の表面実装に於ける半導体集積
素子の樹脂封止方法に関する。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin sealing method for a semiconductor integrated device in surface mounting of an electric wiring board.
従来技術とその問題点 近時、電気配線基板例えばプリント配線基板の表面実
装に於ては、その高密度化にともない、半導体集積素子
を裸状態でプリント基板に直接搭載し、該素子とプリン
ト基板との電気的接続が行なわれる傾向にある。この場
合プリント基板上に裸状態で搭載された半導体集積素子
は品質維持などを目的として電気絶縁性樹脂で封止する
ことが必要となる。2. Description of the Related Art In recent years, in the surface mounting of an electric wiring board, for example, a printed wiring board, a semiconductor integrated device is directly mounted on a printed circuit board in a bare state with the increase in density, and the device and the printed circuit board are mounted. Electrical connection with the battery. In this case, the semiconductor integrated element mounted in a bare state on the printed circuit board needs to be sealed with an electrically insulating resin for the purpose of maintaining quality and the like.
本出願人は先に、電気配線基板の表面実装に於て、該
基板上に裸状態で搭載された半導体集積素子を樹脂封止
するに際し、上記素子の搭載パターンと同一の通孔パタ
ーンを有する孔版を用い、該通孔と上記素子の位置合せ
を行ない且つ通孔と素子間に、素子封止に必要な空隙を
形成した後、この空隙内に上記通孔を通じて、液状封止
樹脂をスキージの作動により押込み充填する電気配線基
板の表面実装に於ける半導体素子の樹脂封止方法を提案
した(例えば特開昭64−82639号公報参照)。The applicant has previously described that, in surface mounting of an electric wiring board, when sealing a semiconductor integrated element mounted in a bare state on the board with a resin, the mounting pattern of the element has the same through-hole pattern as that of the element. Using a stencil, aligning the through hole with the element and forming a gap required for element sealing between the through hole and the element, and then squeezing the liquid sealing resin through the through hole in the gap. (See, for example, JP-A-64-82639).
本出願人提案の上記樹脂封止方法によれば I 封止樹脂層の厚みが均一となり、安定で確実な樹脂
封止効果が得られる、 II 最小の樹脂封止面積での樹脂封止が可能となり、部
品搭載の高密化に対処できる、 III 封止樹脂層の厚みは、通孔の有効高さによって決
まるので、厚みのコントロールが容易となる、 IV LSIなど大型のものでも一回の操作で樹脂封止で
き、素子の大型、小型の如何に拘らず安定した樹脂封止
が可能となる、 V 素子の搭載個数に拘らず、プリント基板を基準にし
て、1回の操作によって1枚のプリント基板を処理で
き、生産性に優れる、 などの利点が得られるが、その後の研究により、封止樹
脂層の厚みの均一性並びに生産性の点で若干の問題点が
あることが判明した。即ち先に提案の樹脂封止法によれ
ば、第5図イに示すように、スキージ(a)の移動開始
点側よりも終了点側で樹脂(b)の充填量が多くなり、
その結果第5図ロの樹脂転写時に、スキージ移動終了点
側で、樹脂(b)と孔版(c)との接触面積が大きくな
り、終了点側で糸引き(d)現象を生ずる。この糸引き
(d)は第5図ロに示す状態で一定時間放置することに
より糸切れし、消滅するが、糸引き量が多く糸切れまで
に相当の時間がかかるので、時間的ロスが大きく生産性
が低下する。また糸切れが移動終了点側でのみ生ずるの
で、この糸切れ部分が第5図ハに示すように高くなり、
封止樹脂層の厚みが均一でなくなる。According to the resin sealing method proposed by the present applicant, I the thickness of the sealing resin layer becomes uniform, and a stable and reliable resin sealing effect is obtained. II The resin sealing with a minimum resin sealing area is possible. The thickness of the III encapsulation resin layer is determined by the effective height of the through-hole, making it easy to control the thickness. Resin sealing enables stable resin sealing irrespective of the size of the element, large or small. V Regardless of the number of mounted elements, one print is performed by one operation based on the printed circuit board. Although advantages such as the ability to process the substrate and excellent productivity are obtained, subsequent research has revealed that there are some problems in terms of uniformity of the thickness of the sealing resin layer and productivity. That is, according to the previously proposed resin sealing method, as shown in FIG. 5A, the filling amount of the resin (b) is larger on the end point side than on the movement start point side of the squeegee (a),
As a result, the contact area between the resin (b) and the stencil (c) becomes large on the squeegee movement end point side during the resin transfer shown in FIG. 5B, and a stringing (d) phenomenon occurs on the end point side. This stringing (d) breaks and disappears when left for a certain period of time in the state shown in FIG. 5B. However, since the amount of stringing is large and it takes a considerable amount of time to break the thread, the time loss is large. Productivity decreases. Further, since the thread break occurs only on the movement end point side, the thread break portion becomes high as shown in FIG.
The thickness of the sealing resin layer is not uniform.
このような問題点を解消する一つの方策として、孔版
へのスキージの押付け圧を高めることが考えれるが、封
止に用いる液状樹脂は粘性が高いので、押付け圧を高め
ても孔版及びスキージへのダメージが大きくなるだけ
で、樹脂充填状態の不均一性解消には、あまり効果がな
い。またスキージの移動速度を遅くすれば、樹脂充填状
態の不均一性は解消される傾向となるが、生産性を考慮
し、移動速度はあまり遅くできないので、移動速度の制
御で不均一性を解消することは実質的に困難である。One way to solve such problems is to increase the pressing pressure of the squeegee against the stencil.However, since the liquid resin used for sealing has a high viscosity, even if the pressing pressure is increased, the stencil and the squeegee may be pressed. However, it is not so effective in eliminating the non-uniformity of the resin filling state. If the squeegee moving speed is reduced, the unevenness of the resin filling state tends to be eliminated.However, considering the productivity, the moving speed cannot be reduced so much. It is practically difficult to do.
本発明はこのような従来の問題点を一掃することを目
的としてなされたものである。The present invention has been made to eliminate such a conventional problem.
問題点を解決するための手段 本発明者等は上記問題点を解消するべきく鋭意研究を
重ねた結果、スキージによる樹脂充填を終えた後に、ド
クタナイフによる切り返しを、スキージの移動終了点側
を出発点として、移動距離の中間地点まで行うときは、
上記問題点を悉く解消し得ることを見出し、茲に本発明
を完成するに至ったものである。Means for Solving the Problems The present inventors have conducted intensive studies to solve the above problems, and as a result, after filling the resin with the squeegee, turning back with the doctor knife, starting from the end point of the squeegee movement end point As a point, when going to the middle point of the travel distance,
The present inventors have found that all the above problems can be solved, and have completed the present invention.
即ち本発明は、電気配線基板上に裸状態で搭載された
半導体集積素子を樹脂封止するに際し、上記素子の搭載
パターンと同一の通孔パターンを有する孔版を用い、該
通孔と上記素子の位置合せを行ない且つ通孔と素子間
に、素子封止に必要な空隙を形成した後、この空隙内に
上記通孔を通じて液状封止樹脂をスキージの作動により
押込み充填する樹脂封止法に於て、上記スキージ作動に
よる液状封止樹脂の押込み充填に引続き、その移動終了
点側からドクターナイフを孔版との接触状態を保持しつ
つ孔版通孔の中間部位まで移動させることにより、上記
通孔のスキージ移動開始点側と終了点側との封止樹脂充
填状態を略々均一化し、その後、孔版を基板から退去さ
せて封止樹脂の転写を行なうことを特徴とする電気配線
基板の表面実装に於ける半導体集積素子の樹脂封止方法
に係る。That is, the present invention uses a stencil having the same through-hole pattern as the mounting pattern of the element when sealing the semiconductor integrated element mounted in a bare state on the electric wiring board with a resin, and In the resin encapsulation method, alignment is performed and a gap necessary for element sealing is formed between the through hole and the element, and then a liquid sealing resin is pushed into the gap through the through hole by operating a squeegee. Then, following the indentation and filling of the liquid sealing resin by the squeegee operation, the doctor knife is moved from the movement end point side to the intermediate portion of the stencil through-hole while maintaining the contact state with the stencil, whereby the through-hole of the stencil is opened. The surface mounting of the electric wiring board is characterized in that the filling state of the sealing resin on the squeegee movement start point side and the end point side is substantially uniform, and then the sealing resin is transferred by removing the stencil from the substrate. In According to the resin encapsulation method of a semiconductor integrated device.
実 施 例 以下に本発明樹脂封止法の一実施状況を添附図面にも
とづき説明すると、次の通りである。EXAMPLE An embodiment of the resin encapsulation method of the present invention will be described below with reference to the accompanying drawings.
第1図(イ)〜(ロ)は本発明樹脂封止法の基本的原
理を工程順に示す概略説明図であり、プリント基板
(1)上に裸状態で搭載された半導体集積素子(2)を
樹脂封止するために、上記素子(2)の搭載パターンと
同一の通孔パターンを有する孔版(3)が用いられる。FIGS. 1 (a) to 1 (b) are schematic explanatory views showing the basic principle of the resin sealing method of the present invention in the order of steps, and show a semiconductor integrated device (2) mounted in a bare state on a printed circuit board (1). A stencil (3) having the same through-hole pattern as the mounting pattern of the element (2) is used for resin sealing.
第1図(イ)に示された第1工程に於て孔版(3)が
スクリーン印刷機(図示せず)の所定位置に固定セット
され、また基板(1)が上記印刷機のスライドテーブル
(4)上に固定セットされ、更に上記孔版(3)上に所
定量の液状封止樹脂(5)が供給される。In a first step shown in FIG. 1 (a), a stencil (3) is fixedly set at a predetermined position of a screen printing machine (not shown), and a substrate (1) is mounted on a slide table (not shown) of the printing machine. 4) The liquid sealing resin (5) is fixedly set on the stencil, and a predetermined amount of the liquid sealing resin (5) is supplied onto the stencil (3).
次に上記印刷機の作動をして、孔版(3)の通孔(3
a)と、基板(1)上に搭載の半導体素子(2)との位
置合せが行なわれた後、孔版(3)が基板(1)面に押
付けられ、各通孔(3a)内にこれに対応する上記素子
(2)が同心状に収納される。この収納状態が第2図に
拡大して示され、通孔(3a)と、これに収納された素子
(2)との間には、素子(2)の樹脂封止に必要な空隙
(6)が形成されている。Next, the above-mentioned printing press is operated, and the through-holes (3
After the alignment of a) with the semiconductor element (2) mounted on the substrate (1) is performed, the stencil (3) is pressed against the surface of the substrate (1), and the stencil (3) is inserted into each through hole (3a). Are concentrically accommodated. This storage state is shown in an enlarged manner in FIG. 2, and a gap (6) required for resin sealing of the element (2) is provided between the through hole (3a) and the element (2) stored therein. ) Is formed.
次にスキージ(7)の作動をして樹脂(5)が通孔
(3a)内の空隙(6)に押出し充填される。この状態が
第3図に示されている。しかる後、第1図(ロ)に示さ
れるように印刷機の作動をして孔版(3)が当初に位置
まで退去され、茲に樹脂層(5a)で封止された素子
(2)が得られる。Next, by operating the squeegee (7), the resin (5) is extruded and filled into the gap (6) in the through hole (3a). This state is shown in FIG. Thereafter, as shown in FIG. 1 (b), the stencil (3) is retreated to the initial position by operating the printing press, and the element (2) sealed with the resin layer (5a) is removed. can get.
第3図に示されるように、通孔(3a)の空隙(6)内
に充填された樹脂(5)は、スキージ(7)を常法通り
の移動速度で移動すると、従来法通り移動終了点側で、
どうしても盛上り(51)傾向となり、充填量が多くな
る。而してこの状態のままで、樹脂(5)を通孔(3a)
から基板(1)に転写させたのでは、先に従来技術とし
て述べたように、終了点側で糸引き現象を生じ、この糸
引き現象は封止樹脂層の厚みの不均一原因となり、また
生産性低下の原因ともなる。As shown in FIG. 3, the resin (5) filled in the space (6) of the through hole (3a) is moved as usual by the conventional method when the squeegee (7) moves at a normal moving speed. On the point side,
Inevitably, there is a tendency to rise (51), and the filling amount increases. Thus, in this state, the resin (5) has through holes (3a).
Transfer from the substrate (1) to the substrate (1) causes a stringing phenomenon on the end point side as described above as a prior art, and this stringing phenomenon causes an uneven thickness of the sealing resin layer. It may cause a decrease in productivity.
本発明ではこのような問題点を解消するために、第4
図(イ)〜(ニ)に示すような対策をとっている。即ち
第4図(イ)に示すようにスキージ(7)作動による樹
脂(5)の充填操作に於ては、スキージ(7)を常法に
従い移動する限り、その移動終了点側で樹脂(5)がど
うしても盛上り(51)傾向となるので、この充填操作に
引続き、第4図(ロ)に示すように移動終了点側からド
クタナイフ(8)による切り返し操作を行ない、この切
り返しで、盛上り(51)部分の樹脂を移動距離の中間部
位まで押し戻して行く。この押し戻しで終了点側と開始
点側とで樹脂(5)の充填状態が略々均一となり、而し
て、この状態で樹脂の転写を行なうと、第4図(ハ)に
示すように、終了点側と開始点側とで樹脂切れがよくな
り、之等の部分では実質的に糸引き現象は発生しない。
一方ドクタナイフ(8)の下端部に於ては、押し戻した
樹脂との接触により糸引き(52)が生ずるが、接触面積
小により糸引き量は少なく、短時間の放置で糸切れし、
糸引きによる時間的ロスは少なくなり、生産性を改善で
きる。また糸切れは、移動距離間の中間地点で生ずるの
で、糸切れによる樹脂は、樹脂層(5a)の上面の中間地
点に回収され、回収後両側に流動して実質的に平らにな
るので、糸切れによる厚み不均一の問題も解消できる。In the present invention, in order to solve such a problem,
The following measures are taken as shown in FIGS. That is, as shown in FIG. 4 (a), in the filling operation of the resin (5) by the operation of the squeegee (7), as long as the squeegee (7) is moved in a usual manner, the resin (5) is located at the end point of the movement. ) Inevitably tends to swell (51). Following this filling operation, as shown in FIG. 4 (b), a switching operation with the doctor knife (8) is performed from the end point of the movement. (51) Push the resin back to the middle part of the moving distance. By this pushing back, the filling state of the resin (5) becomes substantially uniform between the end point side and the start point side, and when the resin is transferred in this state, as shown in FIG. The resin breakage is improved between the end point side and the start point side, and substantially no stringing phenomenon occurs in these portions.
On the other hand, at the lower end of the doctor knife (8), stringing (52) occurs due to contact with the pushed back resin, but the threading amount is small due to the small contact area, and the thread breaks in a short time,
Time loss due to stringing is reduced, and productivity can be improved. In addition, since the yarn break occurs at an intermediate point between the moving distances, the resin due to the yarn break is collected at the intermediate point on the upper surface of the resin layer (5a), and flows to both sides after the collection to be substantially flat. The problem of uneven thickness due to yarn breakage can also be solved.
ちなみに、本発明法による好ましい操作条件を列挙す
ると、次の通りである。Incidentally, the preferred operating conditions according to the method of the present invention are listed as follows.
効果 本発明法によれば、次の通りの効果が得られる。Effects According to the method of the present invention, the following effects can be obtained.
ドクタナイフによる切り返しにより、通孔内充填の
樹脂量が、スキージ移動開始点側と終了点側で略々均一
化するので、転写時に、開始点側はもとより、終了点側
に於ても、糸引き現象が発生することが実質的になくな
る。By turning back with the doctor knife, the amount of resin filled in the through-hole becomes almost uniform at the squeegee movement start point side and end point side, so at the time of transfer, not only the start point side but also the end point side The phenomenon does not substantially occur.
転写時に於て、糸引き現象は両地点の中間で、ドク
タナイフの下端部に於て生ずるが、糸引き量は少ないの
で、糸切れが短時間で起こり、糸切れ待ちの時間的ロス
が少なく、生産性を向上できる。At the time of transfer, the threading phenomenon occurs between the two points and occurs at the lower end of the doctor knife, but since the amount of threading is small, thread breakage occurs in a short time, and the time loss in waiting for thread breakage is small. Productivity can be improved.
糸切れは封止樹脂層の中間部位で起こるので、糸切
れによる樹脂は上記層の中間部位から両側に等分に流動
して回収される。従って封止樹脂層の厚みは、全体が略
々均一に保持される。Since the thread break occurs in the middle portion of the sealing resin layer, the resin due to the thread break flows equally to both sides from the middle portion of the layer and is collected. Therefore, the entire thickness of the sealing resin layer is maintained substantially uniformly.
第1図(イ),(ロ)は、本発明法の基本原理説明図、
第2図は、孔版の通孔と封止対象の素子との位置合せ状
況を示す部分拡大断面図、第3図は通孔内への封止樹脂
の充填状況を示す部分拡大断面図、第4図(イ)〜
(ニ)は、本発明法の要部の説明図、第5図(イ)〜
(ハ)は従来法の説明図である。 図に於て、(1)は基板、(2)は半導体集積素子、
(3)は孔版、(4)はスライドテーブル、(5)は封
止樹脂、(6)は空隙、(7)はスキージ、(8)はド
クタナイフである。1 (a) and 1 (b) are diagrams for explaining the basic principle of the method of the present invention,
FIG. 2 is a partially enlarged cross-sectional view showing the alignment state between the through hole of the stencil and the element to be sealed, FIG. 3 is a partially enlarged cross-sectional view showing the filling state of the sealing resin into the through hole, Fig. 4 (a) ~
(D) is an explanatory view of a main part of the method of the present invention, and FIGS.
(C) is an explanatory view of the conventional method. In the figure, (1) is a substrate, (2) is a semiconductor integrated device,
(3) is a stencil, (4) is a slide table, (5) is a sealing resin, (6) is a gap, (7) is a squeegee, and (8) is a doctor knife.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭63−53955(JP,A) 特開 昭64−82639(JP,A) 特開 平2−205390(JP,A) 特開 平2−299847(JP,A) 特開 平3−181142(JP,A) (58)調査した分野(Int.Cl.6,DB名) H01L 23/28 - 23/30 H01L 21/56 ────────────────────────────────────────────────── (5) Continuation of the front page (56) References JP-A-63-53955 (JP, A) JP-A-64-82639 (JP, A) JP-A-2-205390 (JP, A) JP-A-2- 299847 (JP, A) JP-A-3-181142 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) H01L 23/28-23/30 H01L 21/56
Claims (1)
体集積素子を樹脂封止するに際し、上記素子の搭載パタ
ーンと同一の通孔パターンを有する孔版を用い、該通孔
と上記素子の位置合せを行ない且つ通孔と素子間に、素
子封止に必要な空隙を形成した後、この空隙内に上記通
孔を通じて液状封止樹脂をスキージの作動により押込み
充填する樹脂封止法に於て、上記スキージ作動による液
状封止樹脂の押込み充填に引続き、その移動終了点側か
らドクターナイフを孔版との接触状態を保持しつつ孔版
通孔の中間部位まで移動させることにより、上記通孔の
スキージ移動開始点側と終了点側との封止樹脂充填状態
を略々均一化し、その後、孔版を基板から退去させて封
止樹脂の転写を行なうことを特徴とする電気配線基板の
表面実装に於ける半導体集積素子の樹脂封止方法。When sealing a semiconductor integrated element mounted in a bare state on an electric wiring board with a resin, a stencil having the same through-hole pattern as the mounting pattern of the element is used. In the resin encapsulation method, alignment is performed and a gap necessary for element sealing is formed between the through hole and the element, and then a liquid sealing resin is pushed into the gap through the through hole by operating a squeegee. Then, following the indentation and filling of the liquid sealing resin by the squeegee operation, the doctor knife is moved from the movement end point side to the intermediate portion of the stencil through-hole while maintaining the contact state with the stencil, whereby the through-hole of the stencil is opened. The surface mounting of the electric wiring board is characterized in that the filling state of the sealing resin on the squeegee movement start point side and the end point side is substantially uniform, and then the sealing resin is transferred by removing the stencil from the substrate. In Resin sealing method of the conductor integrated device.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26583190A JP2873501B2 (en) | 1990-10-02 | 1990-10-02 | Resin sealing method for semiconductor integrated device in surface mounting of electric wiring board |
| US07/624,440 US5232651A (en) | 1989-12-11 | 1990-12-10 | Method of sealing electric parts mounted on electric wiring board with resin composition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26583190A JP2873501B2 (en) | 1990-10-02 | 1990-10-02 | Resin sealing method for semiconductor integrated device in surface mounting of electric wiring board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04142045A JPH04142045A (en) | 1992-05-15 |
| JP2873501B2 true JP2873501B2 (en) | 1999-03-24 |
Family
ID=17422662
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26583190A Expired - Lifetime JP2873501B2 (en) | 1989-12-11 | 1990-10-02 | Resin sealing method for semiconductor integrated device in surface mounting of electric wiring board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2873501B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7383770B2 (en) | 2004-01-14 | 2008-06-10 | Tokai Shoji Co., Ltd. | Printing device for electronic parts having a roller and a squeegee arrangement |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6063646A (en) * | 1998-10-06 | 2000-05-16 | Japan Rec Co., Ltd. | Method for production of semiconductor package |
-
1990
- 1990-10-02 JP JP26583190A patent/JP2873501B2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7383770B2 (en) | 2004-01-14 | 2008-06-10 | Tokai Shoji Co., Ltd. | Printing device for electronic parts having a roller and a squeegee arrangement |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04142045A (en) | 1992-05-15 |
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