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JP2898520B2 - Method for producing nitrogen-containing carbon film - Google Patents
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JP2898520B2 - Method for producing nitrogen-containing carbon film - Google Patents

Method for producing nitrogen-containing carbon film

Info

Publication number
JP2898520B2
JP2898520B2 JP5238573A JP23857393A JP2898520B2 JP 2898520 B2 JP2898520 B2 JP 2898520B2 JP 5238573 A JP5238573 A JP 5238573A JP 23857393 A JP23857393 A JP 23857393A JP 2898520 B2 JP2898520 B2 JP 2898520B2
Authority
JP
Japan
Prior art keywords
graphite
carbon film
nitrogen
containing carbon
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP5238573A
Other languages
Japanese (ja)
Other versions
JPH0790588A (en
Inventor
丈雄 松井
雅子 湯田坂
理恵 菊地
芳正 大木
進 吉村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Chemical Corp
Kagaku Gijutsu Shinko Jigyodan
Panasonic Holdings Corp
Original Assignee
Mitsubishi Chemical Corp
Kagaku Gijutsu Shinko Jigyodan
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Chemical Corp, Kagaku Gijutsu Shinko Jigyodan, Matsushita Electric Industrial Co Ltd filed Critical Mitsubishi Chemical Corp
Priority to JP5238573A priority Critical patent/JP2898520B2/en
Publication of JPH0790588A publication Critical patent/JPH0790588A/en
Application granted granted Critical
Publication of JP2898520B2 publication Critical patent/JP2898520B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Chemical Vapour Deposition (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、窒素含有炭素膜の製
造方法に関するものである。さらに詳しくは、この発明
は、エレクトロニクス、バイオマテリアル等の分野にお
いて有用な、高機能性薄膜の提供を可能とする、新しい
窒素含有のグラファイト状炭素膜の製造方法に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing a nitrogen-containing carbon film. More specifically, the present invention relates to a new method for producing a nitrogen-containing graphite-like carbon film, which can provide a highly functional thin film useful in the fields of electronics, biomaterials, and the like.

【0002】[0002]

【従来の技術とその課題】従来より、エレクトロニク
ス、バイオマテリアル等の分野においては、高機能性薄
膜の検討が精力的に進められており、さらに新たな物性
を備えた高機能性薄膜の創出への期待が寄せられてい
る。このような新しい物性を備えた高機能性薄膜のひと
つとして、異種原子をインターカレーションした炭素薄
膜や、異種原子によって一部の炭素原子を置換したグラ
ファイト厚膜が注目されている。
2. Description of the Related Art Conventionally, in the fields of electronics, biomaterials, and the like, highly functional thin films have been studied energetically, and the creation of highly functional thin films having new physical properties has been promoted. The expectation of is put. As one of the highly functional thin films having such new physical properties, a carbon thin film in which different atoms are intercalated and a graphite thick film in which some carbon atoms are replaced by different atoms are attracting attention.

【0003】この異種原子置換炭素膜、特にグラファイ
ト状炭素膜についてもその物性について基礎的な研究が
進められている。現在までのところ、この異種原子置換
グラファイト状炭素膜については、ホウ素置換グラファ
イト(BxC)やBN置換グラファイト(BxCyN)
が報告されている。
[0003] Fundamental research has been conducted on the physical properties of this heteroatom-substituted carbon film, particularly a graphite-like carbon film. Until now, this type of heteroatom-substituted graphite-like carbon film has been characterized by boron-substituted graphite (BxC) and BN-substituted graphite (BxCyN).
Have been reported.

【0004】たとえば、BN置換グラファイトについて
は、BCl3 /CCl4 /N2 /H 2 を高温(2000
℃)で、または、BCl3 /CH3 CNを800℃で反
応させて合成することや高温高圧下でグラファイト中に
Bを拡散させることなどが報告されている。しかしなが
ら、これまでの異種原子置換グラファイト状炭素膜は、
一般的に高温高圧での合成反応によって形成されている
ため、他種の異種原子置換薄膜の製造にはまったく適し
ていないという問題がある。また、1000℃前後の反
応でも、HClのような反応の腐食性ガスが発生すると
いう問題があり、反応副生成物としての腐食性ガスに装
置が耐えられるようにしなければならず、排ガス処理の
ための設備も大がかりなものとなるという欠点があっ
た。
For example, regarding BN-substituted graphite
Is BClThree/ CClFour/ NTwo/ H TwoAt high temperature (2000
° C) or BClThree/ CHThreeCN at 800 ℃
And in graphite under high temperature and high pressure
It has been reported that B is diffused. But
The conventional heteroatom-substituted graphite-like carbon film
Generally formed by synthesis reaction at high temperature and pressure
Therefore, it is perfectly suitable for the production of other kinds of heteroatom-substituted thin films
There is no problem. In addition, anti-
However, if a corrosive gas such as HCl is generated,
Of corrosive gas as a reaction by-product.
Equipment must be able to withstand
Is disadvantageous in that the equipment for
Was.

【0005】このため、従来の技術をもってしても、窒
素等の他の異種原子を置換したグラファイト状炭素膜の
製造には至っていないのが実情である。この発明は、以
上の通りの事情に鑑みてなされたものであり、従来の方
法の欠点を解消し、異種原子として窒素を含有するグラ
ファイト状炭素膜の新しい製造方法を提供することを目
的としている。
[0005] For this reason, the fact is that even with the conventional technology, the production of a graphite-like carbon film in which another heteroatom such as nitrogen is substituted has not been achieved. The present invention has been made in view of the above circumstances, and has as its object to solve the drawbacks of the conventional method and to provide a new method for producing a graphite-like carbon film containing nitrogen as a hetero atom. .

【0006】[0006]

【課題を解決するための手段】この発明は、上記の課題
を解決するものとして、含窒素環状有機化合物を化学気
相蒸着することを特徴としている。つまり、この発明に
おいては、従来のように高温高圧合成方法を採用するこ
となく、また、反応副生物としてHCl等の腐食性化合
物を発生させることなく化学気相蒸着(CVD)するこ
とに大きな特徴がある。
SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems, and is characterized in that a nitrogen-containing cyclic organic compound is subjected to chemical vapor deposition. In other words, the present invention is characterized in that chemical vapor deposition (CVD) is performed without employing a high-temperature and high-pressure synthesis method as in the prior art and without generating corrosive compounds such as HCl as a reaction by-product. There is.

【0007】この場合の原料物質は、ピロール、イミダ
ゾール、ピリジン、ピペリジン、トリアゾール、テトラ
ゾール等の含窒素環状有機化合物の適宜なものを用いる
ことができる。そして、これら原料物質にはHCl等の
腐食性化合物を生成させる塩素等の元素を含有しないも
のを用いることとする。また、反応には、キャリアガス
として、Ar,He,Ne等の反応しにくい不活性気体
が好ましく使用される。反応温度は通常600〜100
0℃程度の温度が採用される。また、反応は、常圧、減
圧下に行うのが好ましく、成膜速度は、0.1〜50Å
/sec程度とするのが好ましい。基板として各種の固
体、たとえば石英、ガラス、Ni,Pt,Si,その他
のものを適宜に採用する。
In this case, as the raw material, an appropriate nitrogen-containing cyclic organic compound such as pyrrole, imidazole, pyridine, piperidine, triazole or tetrazole can be used. And these raw materials do not contain an element such as chlorine which generates a corrosive compound such as HCl. In the reaction, an inert gas such as Ar, He, Ne or the like which is difficult to react is preferably used as a carrier gas. The reaction temperature is usually 600 to 100
A temperature of about 0 ° C is employed. The reaction is preferably carried out under normal pressure and reduced pressure.
/ Sec is preferable. Various solids, for example, quartz, glass, Ni, Pt, Si, and others are appropriately used as the substrate.

【0008】もちろん、この発明においては、熱CVD
法、減圧CVD法、プラズマCVD法、光CVD法等の
様々な手段としての各種のCVD法を用いることができ
る。以下実施例を示し、さらに詳しくこの発明について
説明する。
Of course, in the present invention, thermal CVD
Various methods such as a CVD method, a low pressure CVD method, a plasma CVD method, and a photo CVD method can be used. Hereinafter, the present invention will be described in more detail with reference to Examples.

【0009】[0009]

【実施例】石英反応管内において、原料の環状含窒素複
素環化合物を温度制御しつつ気化させ、キャリアガス
(Ar等)により基板上の反応域に導入し、基板上に薄
膜を生成させた。原料には環状ヘテロ化合物であるピロ
ールを用い、キャリアガスとしてArを用い、その流量
は300cc/minとした。反応温度は600,75
0,800,1000℃とした。
EXAMPLE In a quartz reaction tube, a cyclic nitrogen-containing heterocyclic compound as a raw material was vaporized while controlling the temperature, and introduced into a reaction region on a substrate by a carrier gas (Ar or the like) to form a thin film on the substrate. Pyrrole, which is a cyclic hetero compound, was used as a raw material, Ar was used as a carrier gas, and the flow rate was 300 cc / min. Reaction temperature is 600,75
0,800,1000 ° C.

【0010】図1はこの実施例で用いた薄膜生成装置の
概略図である。石英管内にはNi基板と原料物質として
のピロールを置き、基板を炉により所定の温度に加熱
し、また原料ピロールをヒーターにより気化温度程度に
加熱し、石英管内にArガスを流入させた。1時間後、
上記の各反応温度において、Ni基板上に厚さ約1〜5
μmの灰色の薄膜が得られた。
FIG. 1 is a schematic view of a thin film forming apparatus used in this embodiment. A Ni substrate and pyrrole as a raw material were placed in a quartz tube, the substrate was heated to a predetermined temperature by a furnace, and the raw material pyrrole was heated to a vaporization temperature by a heater, and Ar gas was introduced into the quartz tube. One hour later,
At each of the above reaction temperatures, a thickness of about 1-5
A μm gray thin film was obtained.

【0011】各反応温度で生成した薄膜をX線回折によ
り解析したところ、750℃以上で生成した膜では、グ
ラファイト状の層状構造が確認された。すなわち、この
X線回折による強度は、図2に示した通りであり、これ
から求めたX線回折d値は、表1に示した通りであっ
た。反応温度600℃で生成された膜ではX線回折のピ
ークは見られず、グラファイトは生成していないのに対
し、750℃以上では格子面間隔d値〜3.35Aが得
られ、グラファイト状構造の膜が生成していることがわ
かった。X線の回折の半値幅は750℃のものでは1.
0degとやや広く、結晶性がまだ乱れがあるのに対
し、蒸着感度が高くなると半値幅は小さくなり、結晶性
が良くなることが確かめられた。
When the thin film formed at each reaction temperature was analyzed by X-ray diffraction, a graphite-like layered structure was confirmed in the film formed at 750 ° C. or higher. That is, the intensity by the X-ray diffraction was as shown in FIG. 2, and the X-ray diffraction d value obtained therefrom was as shown in Table 1. In the film formed at a reaction temperature of 600 ° C., no X-ray diffraction peak was observed and no graphite was generated, whereas at 750 ° C. or more, a lattice spacing d value of ~ 3.35 A was obtained, and the graphite-like structure was obtained. It was found that a film was formed. When the half width of X-ray diffraction is 750 ° C., 1.
It was confirmed that the crystallinity was still slightly disordered with 0 deg, and the half width was reduced and the crystallinity was improved when the deposition sensitivity was increased.

【0012】さらに、この生成された薄膜をX線光電子
分光法(XPS)により、N濃度、Cエネルギー状態、
および、Nエネルギー状態を確認した。表1に例示した
ように、反応温度800℃のときに、N濃度は最大の1
5atm%にも及び反応温度が上昇するにしたがいN濃
度は減少し、また反応温度が下降してもN濃度は減少し
た。
Further, the resulting thin film is subjected to X-ray photoelectron spectroscopy (XPS) to determine the N concentration, C energy state,
And the N energy state was confirmed. As illustrated in Table 1, when the reaction temperature is 800 ° C., the N concentration is 1 which is the maximum.
The N concentration decreased as the reaction temperature increased to 5 atm%, and the N concentration decreased as the reaction temperature decreased.

【0013】このことから、各反応温度で生成された薄
膜のC/Nを求めると、表1に例示したように、800
℃で生成した薄膜のC/Nは4.6、750℃で生成し
た薄膜のC/Nは13.8であった。
From this, when the C / N of the thin film formed at each reaction temperature was determined, as shown in Table 1,
C / N of the thin film formed at 750 ° C. was 4.6, and C / N of the thin film formed at 750 ° C. was 13.8.

【0014】[0014]

【表1】 [Table 1]

【0015】さらに、X線光電子分光法(XPS)によ
り解析した各結合エネルギーの強度は、C1sスペクトル
を用いた場合においては、たとえば図3に例示したよう
に、グラファイトに近い284.5eVの結合エネルギ
ーにおいて、その強度のピークが見られた。図4は、N
1sのスペクトルを例示したものである。
Further, when the C 1s spectrum is used, the intensity of each binding energy analyzed by X-ray photoelectron spectroscopy (XPS) is 284.5 eV, which is close to that of graphite, as exemplified in FIG. In energy, a peak of the intensity was seen. FIG.
It is an example of the spectrum of 1s .

【0016】以上の例と同様にして、ピロールに代えて
イミダゾール、トリアゾール、テトラゾール、ピリジ
ン、ピリミジンの各々を原料として気相蒸着させた。ピ
ロールの場合と同様に格子面間隔としてグラファイト近
似の、窒素含有膜が得られた。
In the same manner as in the above example, vapor deposition was carried out using imidazole, triazole, tetrazole, pyridine and pyrimidine as raw materials instead of pyrrole. As in the case of pyrrole, a nitrogen-containing film having a lattice spacing similar to graphite was obtained.

【0017】[0017]

【発明の効果】以上詳しく説明した通り、この発明によ
り窒素含有グラファイト状炭素薄膜の作成が可能となっ
た。
As described above in detail, according to the present invention, a nitrogen-containing graphite-like carbon thin film can be formed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の実施例における薄膜生成装置の概略
図である。
FIG. 1 is a schematic diagram of a thin film forming apparatus according to an embodiment of the present invention.

【図2】この発明の実施例におけるX線回折角と強度の
関係を示した関係図である。
FIG. 2 is a relationship diagram showing a relationship between an X-ray diffraction angle and intensity in an example of the present invention.

【図3】この発明の実施例における結合エネルギー(C
IS)と−温度毎の強度の関係を示した関係図である。
FIG. 3 shows a binding energy (C) according to an embodiment of the present invention.
FIG. 3 is a relationship diagram showing the relationship between IS ) and the intensity at each temperature.

【図4】この発明の実施例における結合エネルギー(N
IS)と温度毎の強度の関係を示した関係図である。
FIG. 4 shows the binding energy (N
FIG. 3 is a relationship diagram showing the relationship between IS ) and the intensity for each temperature.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 湯田坂 雅子 神奈川県川崎市多摩区南生田5−8−4 −202 (72)発明者 菊地 理恵 神奈川県大和市つきみ野2−1−6− 303 (72)発明者 大木 芳正 神奈川県相模原市大野台3−30−2 (72)発明者 吉村 進 神奈川県横浜市緑区鴨志田529−18 (58)調査した分野(Int.Cl.6,DB名) C23C 16/26 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Masako Yudazaka 5-8-4 -202 Minamiikuta, Tama-ku, Kawasaki City, Kanagawa Prefecture (72) Inventor Rie Kikuchi 2-1-6-303, 303, Tsukimino, Yamato-shi, Kanagawa Prefecture 72) Inventor Yoshimasa Oki 3-30-2 Ohnodai, Sagamihara City, Kanagawa Prefecture (72) Inventor Susumu Yoshimura 529-18, Kamoshida, Midori-ku, Yokohama-shi, Kanagawa Prefecture (58) Field surveyed (Int.Cl. 6 , DB name) C23C 16/26

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 含窒素環状有機化合物を原料として化学
気相蒸着によりグラファイト状窒素含有炭素膜を製造す
ることを特徴とする窒素含有炭素膜の製造方法。
1. A method for producing a nitrogen-containing carbon film, comprising producing a graphite-like nitrogen-containing carbon film by chemical vapor deposition using a nitrogen-containing cyclic organic compound as a raw material.
【請求項2】 塩素等の腐食性化合物を生成する元素を
含まない原料を化学気相蒸着する請求項1の製造方法。
2. The method according to claim 1, wherein a raw material not containing an element that generates a corrosive compound such as chlorine is subjected to chemical vapor deposition.
JP5238573A 1993-09-24 1993-09-24 Method for producing nitrogen-containing carbon film Expired - Lifetime JP2898520B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5238573A JP2898520B2 (en) 1993-09-24 1993-09-24 Method for producing nitrogen-containing carbon film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5238573A JP2898520B2 (en) 1993-09-24 1993-09-24 Method for producing nitrogen-containing carbon film

Publications (2)

Publication Number Publication Date
JPH0790588A JPH0790588A (en) 1995-04-04
JP2898520B2 true JP2898520B2 (en) 1999-06-02

Family

ID=17032231

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5238573A Expired - Lifetime JP2898520B2 (en) 1993-09-24 1993-09-24 Method for producing nitrogen-containing carbon film

Country Status (1)

Country Link
JP (1) JP2898520B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4766701B2 (en) 2005-09-30 2011-09-07 旭化成ケミカルズ株式会社 Nitrogen-containing carbon material and method for producing the same
WO2008108009A1 (en) * 2007-03-07 2008-09-12 Tokyo Institute Of Technology n-TYPE CARBON SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE UTILIZING THE SAME
US8092771B2 (en) 2007-03-28 2012-01-10 Asahi Kasei Chemicals Corporation Nitrogen-containing carbon material and process for producing the same
US8486565B2 (en) 2007-03-28 2013-07-16 Asahi Kasei Chemicals Corporation Electrode, and lithium ion secondary battery, electric double layer capacitor and fuel cell using the same
US8999604B2 (en) * 2009-12-25 2015-04-07 Kabushiki Kaisha Toyota Chuo Kenkyusho Oriented amorphous carbon film and process for forming the same
CN104108708B (en) * 2014-07-25 2015-11-25 深圳新宙邦科技股份有限公司 A kind of nitrogen-doped graphene and preparation method thereof
CN106185903B (en) * 2016-07-15 2018-07-17 浙江大学 A kind of method that ice crystal auxiliary prepares high flexibility graphene film

Also Published As

Publication number Publication date
JPH0790588A (en) 1995-04-04

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