JP2947415B2 - Manufacturing method of thin copper foil-clad circuit board - Google Patents
Manufacturing method of thin copper foil-clad circuit boardInfo
- Publication number
- JP2947415B2 JP2947415B2 JP63171734A JP17173488A JP2947415B2 JP 2947415 B2 JP2947415 B2 JP 2947415B2 JP 63171734 A JP63171734 A JP 63171734A JP 17173488 A JP17173488 A JP 17173488A JP 2947415 B2 JP2947415 B2 JP 2947415B2
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- etching
- copper
- thickness
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Laminated Bodies (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電子部品を実装するプリント配線板製造用
の銅箔と電気絶縁体とより製造された銅箔張積層板、銅
張フィルム、銅張シートなどの銅箔張回路基板や補強さ
れた銅箔であって、厚みが数μm〜20μm、所望厚みに
対する厚みのバラツキが±1.0μm以下である薄銅箔張
回路基板の製造法である。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a copper-clad laminate, a copper-clad film, and a copper foil for manufacturing a printed wiring board on which electronic components are mounted and an electrical insulator. A method of manufacturing a copper-clad circuit board or a reinforced copper foil, such as a copper-clad sheet, having a thickness of several μm to 20 μm, and a variation in thickness with respect to a desired thickness of ± 1.0 μm or less. is there.
銅箔張回路基板の製造法は、銅箔と絶縁体とを重ね通
常積層成形等によって製造され、用いる銅箔としては、
電解法による厚み105μm、70μm、35μm、18μm、1
2μmなどが量産され、アルミニウム箔等の担体上に形
成された5μm、9μmなどの銅箔も作られている。
又、圧延法による銅箔があるが、製造法との関係から薄
くなるほど高価なものとなり実質的には35μm以下の厚
さの箔は実用化されていない。The method of manufacturing a copper foil-clad circuit board is a method in which a copper foil and an insulator are laminated and usually manufactured by lamination molding, etc.
Electrolytic thickness 105μm, 70μm, 35μm, 18μm, 1
2 μm and the like are mass-produced, and copper foils such as 5 μm and 9 μm formed on a carrier such as an aluminum foil are also produced.
In addition, there is a copper foil formed by a rolling method. However, the thinner the copper foil becomes, the more expensive it becomes due to the relationship with the manufacturing method, and a foil having a thickness of 35 μm or less has not been practically used.
このような銅箔を積層成形に用いる場合、その厚みが
18μmより薄いと皺になりやすく、銅箔を絶縁体と重ね
合わせる作業が極めて困難となるので殆ど実用化されて
いない。またアルミニウム箔等の担体上に形成された銅
箔は、この点を改善したものであるが高価であり、更に
銅箔によるプリント配線を形成する前に担体であるアル
ミニウム箔等の除去工程が必要という問題があった。When such a copper foil is used for lamination molding, its thickness is
When it is thinner than 18 μm, it is apt to be wrinkled, and it is extremely difficult to lay a copper foil on an insulator. Copper foil formed on a carrier such as an aluminum foil improves this point, but is expensive, and requires a step of removing the aluminum foil as a carrier before forming a printed wiring using the copper foil. There was a problem.
また、プリント配線板加工工程において塩化銅や塩化
鉄などのエッチング液にて銅箔張回路基板を予備エッチ
ングして銅箔を研磨した後、プリント配線板の製造工程
に用いる方法が知られていたが、予備エッチングによる
銅箔の除去量を多くしたり、或いは1m角などの大面積を
エッチングして、薄銅張回路基板を製造することは出来
なかった。Also, a method is known in which a copper foil-clad circuit board is pre-etched with an etchant such as copper chloride or iron chloride in a printed wiring board processing step to polish the copper foil, and then used in a printed wiring board manufacturing step. However, it was not possible to manufacture a thin copper-clad circuit board by increasing the removal amount of copper foil by pre-etching or etching a large area such as 1 m square.
本発明は、大型回路基板として使用可能な薄銅箔張回
路基板を生産性よく製造する方法について鋭意検討した
結果、従来のエンチング法に比較して非常に遅い速度で
銅張回路基板の銅箔全面をエッチングして、もとの銅箔
の厚さの25〜90%を除去する方法によって厚み精度の高
い薄銅張回路基板が得られることを見出し、本発明に到
達した。As a result of intensive studies on a method of manufacturing a thin copper foil-clad circuit board that can be used as a large-sized circuit board with high productivity, the copper foil of the copper-clad circuit board has a very low speed as compared with the conventional etching method. The present inventors have found that a thin copper-clad circuit board with high thickness accuracy can be obtained by a method of etching the entire surface to remove 25 to 90% of the original copper foil thickness, and arrived at the present invention.
すなわち、本発明は、銅箔と電気絶縁体とより製造さ
れた銅箔張回路基板を過酸化水素2〜4w/v%、硫酸3〜
7w/v%を主剤とし、助剤としてアルコールを0.1〜5w/v
%配合してなる水溶液からなる銅エッチング液を用い、
温度25〜50℃、銅濃度30〜60g/にて、0.01〜0.3μm/
秒の速度で銅箔全面をエッチングして、もとの銅箔の厚
さの25〜90%を除去し、所望厚みに対して残存銅箔の厚
みのバラツキが±1.0μm以内とし後、防錆剤或いは剥
離可能な樹脂により銅箔面を保護したことを特徴とする
薄銅箔張回路基板の製造法である。That is, the present invention provides a copper foil-clad circuit board manufactured from a copper foil and an electrical insulator by using 2 to 4 w / v% of hydrogen peroxide,
7w / v% as main agent, alcohol as auxiliary agent 0.1-5w / v
% Using a copper etching solution consisting of an aqueous solution
At a temperature of 25 to 50 ° C and a copper concentration of 30 to 60 g /, 0.01 to 0.3 μm /
The entire surface of the copper foil is etched at a speed of seconds to remove 25 to 90% of the original copper foil thickness, and after the thickness variation of the remaining copper foil is within ± 1.0 μm with respect to the desired thickness, prevention is performed. A method for manufacturing a thin copper foil-clad circuit board, wherein a copper foil surface is protected by a rust agent or a peelable resin.
以下、本発明の構成について説明する。 Hereinafter, the configuration of the present invention will be described.
本発明の銅箔と電気絶縁体とより製造された銅箔張回
路基板は、特に限定はなく電子、電気材料用として用い
られている種々の市販品等のいずれも使用可能である
が、本発明の製造法を適用する場合、通常、公称厚みが
18μm以上の銅箔を用いた片面或いは両面銅張のフィル
ム、シート、繊維強化絶縁樹脂積層板、金属芯積層板、
内層にプリント配線網を形成した多層シールド板などで
ある。電気絶縁体層は、ポリイミド樹脂、ポリエステル
樹脂等のフィルムやシート、熱硬化性樹脂や耐熱性の熱
可塑性樹脂とガラス(Eガラス、Dガラス、Sガラス、
石英ガラス(クオーツ)その他)、セラミックス類(ア
ルミナ、窒化硼素、その他)、全芳香族ポリアミド、ポ
リイミド、セミカーボン、フッ素樹脂、その他の耐熱性
エンジニアリングプラスチックなどを一種或いは二種以
上適宜併用してなる繊維、チョップなどを用いた多孔質
フィルム或いはシート状の補強基材とを組み合わせてな
るプリプレグを用いて製造されるもの、又は、鉄、アル
ミニウム板等に絶縁性の接着剤や接着フィルムを被覆し
てなるものなどである。また、通常の銅張積層板は積層
成形の圧力により、銅箔表面が補強基材の凹凸を一部反
映して例えばガラス織布基材の場合約40μmピッチで4
μm程度のうねりを持ったものとなるが、このうねりを
機械的に精密研磨して取ったものを使用することもでき
る。The copper foil-clad circuit board manufactured from the copper foil and the electric insulator of the present invention is not particularly limited, and any of various commercially available products used for electronic and electric materials can be used. When applying the manufacturing method of the invention, the nominal thickness is usually
Single-sided or double-sided copper-clad film, sheet, fiber-reinforced insulating resin laminate, metal core laminate using copper foil of 18 μm or more,
Examples include a multilayer shield plate having a printed wiring network formed in an inner layer. The electric insulator layer is made of a film or sheet such as a polyimide resin or a polyester resin, a thermosetting resin or a heat-resistant thermoplastic resin and glass (E glass, D glass, S glass,
Quartz glass (quartz) and others, ceramics (alumina, boron nitride, and others), wholly aromatic polyamides, polyimides, semicarbons, fluorocarbon resins, and other heat-resistant engineering plastics are used alone or in combination as appropriate. Fabricated using a prepreg in combination with a porous film using a fiber, chop or a sheet-like reinforcing substrate, or by coating an insulating adhesive or adhesive film on an iron, aluminum plate, etc. And so on. In addition, in the case of a normal copper-clad laminate, the surface of the copper foil partially reflects the unevenness of the reinforcing substrate due to the pressure of the laminating molding.
The undulation is about μm, but the undulation obtained by mechanically precisely polishing the undulation can also be used.
本発明の銅エッチングは、エッチング速度を低下させ
0.01〜0.3μm/秒の範囲、好ましくは0.03〜0.20μm/秒
の範囲のエッチング速度とする。エッチング速度が0.3
μm/秒より速いと僅かなエッチング処理時間の差により
エッチングが進行するので、所望の厚みとの交差が大き
くなるばかりでなく、厚みの場所によるバラツキが大き
くなる傾向があり、所定の銅箔厚みに対するバラツキ幅
を±1.0μm以内にすることが困難となるので好ましく
ない。また、エッチング速度が0.01μm/秒より遅い場合
には、エッチングに時間がかかり実用的でない。The copper etching of the present invention reduces the etching rate
The etching rate is in the range of 0.01 to 0.3 μm / sec, preferably in the range of 0.03 to 0.20 μm / sec. 0.3 etching rate
If the speed is faster than μm / sec, the etching proceeds due to a slight difference in the etching processing time, so that not only the intersection with the desired thickness is increased, but also the variation depending on the thickness tends to increase, and the predetermined copper foil thickness It is not preferable because it becomes difficult to make the variation width to ± 1.0 μm or less. On the other hand, when the etching rate is lower than 0.01 μm / sec, the etching takes a long time and is not practical.
上記において、エッチング速度を遅くする方法として
は、濃度、温度又は銅箔面上のエッチング液の接触量
(スプレー法の場合にはスプレー圧力或いはスプレーノ
ズル数)を低くするものであるが、温度を低くするこ
と、エッチング液の薬剤濃度を低くすること又はこれら
を組み合わせることが好適である。In the above, as a method of lowering the etching rate, the concentration, the temperature, or the contact amount of the etching solution on the copper foil surface (in the case of the spray method, the spray pressure or the number of spray nozzles) is reduced. It is preferable to lower the concentration, lower the chemical concentration of the etching solution, or to combine them.
具体的には過酸化水素の濃度は2〜4w/v%、硫酸の濃
度は3〜7w/v%で温度25〜50℃、銅濃度30〜60g/が好
適である。この過酸化水素/硫酸系のエッチング剤に
は、過酸化水素の安定剤、銅の溶解促進剤などの添加剤
を加える方法は好ましいものである。このような添加剤
としてはメタノール、エタノール、プロパノール、ブタ
ノールなどの1価アルコール;エチレングリコール、プ
ロピレングリコール、ブタンジオール、ペンタンジオー
ルなどの2価のアルコール;グリセリン、ペンタエリス
リトールなどの3価以上のアルコール;ポリエチレング
リコールなどのグリコールエーテル類;アミノ安息香
酸、アミノテトラゾール、フェニル尿素などの含窒素有
機環状化合物類などが例示され、通常0.1〜5%の範囲
から適宜選択される。Specifically, the concentration of hydrogen peroxide is preferably 2 to 4 w / v%, the concentration of sulfuric acid is 3 to 7 w / v%, the temperature is preferably 25 to 50 ° C, and the copper concentration is preferably 30 to 60 g /. The method of adding an additive such as a stabilizer for hydrogen peroxide and a dissolution promoter for copper to the hydrogen peroxide / sulfuric acid type etching agent is preferable. Such additives include monohydric alcohols such as methanol, ethanol, propanol and butanol; dihydric alcohols such as ethylene glycol, propylene glycol, butanediol and pentanediol; trihydric or higher alcohols such as glycerin and pentaerythritol; Examples thereof include glycol ethers such as polyethylene glycol; nitrogen-containing organic cyclic compounds such as aminobenzoic acid, aminotetrazole, and phenylurea, and are appropriately selected usually from a range of 0.1 to 5%.
その他に、CuCl2を主剤とする塩化第二銅エッチング
液の場合には例えばCuCl2・2H2O 1.421bとHCl(20゜B
e′)0.6galを溶解して水溶液1galとしたもの(CuCl2・
2H2O 170g/、HCl 19w/v%の水溶液)程度の濃度以下
とした水溶液を用い、温度30〜40℃で行う方法が例示さ
れる。In addition, in the case of a cupric chloride etching solution containing CuCl 2 as a main component, for example, CuCl 2 .2H 2 O 1.421b and HCl (20 ° B.
e ′) 0.6 gal dissolved to make 1 gal aqueous solution (CuCl 2 ·
2H 2 O 170 g /, using an aqueous solution was HCl 19w / v% aqueous solution) about a concentration below the method at a temperature 30 to 40 ° C. are exemplified.
NH4OH,NH4Cl,Cu,NaClO2,NH4NO3などを含む水溶液の所
謂『アルカリエッチング液』の場合には例えばNH4OH 3m
ol/,NaClO2 10mol/、NH4Cl 1mol/,NH4HCO3 1mo
l/、NH4NO3 1mol/程度の濃度以下とし、水溶液中
のCu濃度を10 lb/gal(74.89g/)以下、温度30〜45℃
に保つ方法、又は通常の液濃度としてエッチング温度を
20〜30℃程度にする方法が例示される。In the case of a so-called “alkali etching solution” of an aqueous solution containing NH 4 OH, NH 4 Cl, Cu, NaClO 2 , NH 4 NO 3 , for example, NH 4 OH 3m
ol /, NaClO 2 10mol /, NH 4 Cl 1mol /, NH 4 HCO 3 1mo
l /, NH 4 NO 3 and 1mol / degree of concentration or less, the Cu concentration in the aqueous solution 10 lb / gal (74.89g /) or less, a temperature 30-45 ° C.
Or the normal solution concentration and the etching temperature
A method of setting the temperature to about 20 to 30 ° C. is exemplified.
(NH4)2S2O8を主剤とする過硫酸塩エッチング液の場
合には例えば(NH4)2S2O8 2lb/gal(240g/)程度の
濃度以下とした水溶液を用い、20〜35℃の温度で行う方
法が例示される。In the case of a persulfate etching solution containing (NH 4 ) 2 S 2 O 8 as a main component, for example, an aqueous solution having a concentration of about 2 lb / gal (240 g /) or less of (NH 4 ) 2 S 2 O 8 is used. A method performed at a temperature of 3535 ° C. is exemplified.
塩化第二鉄を主剤とするエッチング液の場合、40゜B
e′の塩化第二鉄液に、35%HCl 20〜1vol%加えた液又
はこれを水で希釈した液を用い、20〜35℃で行う方法が
例示される。40 ゜ B for an etchant containing ferric chloride as the main component
For example, a method in which 20% to 1% by volume of 35% HCl is added to the ferric chloride solution of e 'or a solution obtained by diluting the solution with water at 20 to 35 ° C. is used.
クロム酸/硫酸エッチング液の場合には例えばCrO3 2
40g/、Na2SO4 40.5g/、H2SO4(96%)180g/程度
の濃度以下とした水溶液を用いる方法が例示される。In the case of a chromic acid / sulfuric acid etching solution, for example, CrO 3 2
An example is a method using an aqueous solution having a concentration of about 40 g /, Na 2 SO 4 40.5 g /, H 2 SO 4 (96%) of about 180 g / or less.
しかしながら例えばアルカリエッチング液では、液の
安定性が悪いという欠点があり、過硫酸塩エッチング液
ではエッチングされた銅が水溶液から析出し易い欠点が
あり、酸化第二鉄エッチング液では溶解銅濃度の変化に
よりエッチング速度が大きく変化する欠点があり、更に
クロム酸/硫酸エッチング液の場合、積層板の樹脂を侵
すという欠点があるので、本発明においては過酸化水素
/硫酸系のエッチング液が液管理の点や公害などの点か
ら選択する。However, for example, the alkali etching solution has a disadvantage that the stability of the solution is poor, the persulfate etching solution has a disadvantage that the etched copper tends to precipitate from the aqueous solution, and the ferric oxide etching solution has a change in the dissolved copper concentration. In the present invention, a hydrogen peroxide / sulfuric acid based etching solution is used for controlling the solution. Select from points such as points and pollution.
本発明の製造法におけるエッチング方法としては通常
スプレーエッチングを行うのが適当であり、水平或いは
垂直にして行う。エッチングにより所定厚みの銅箔とす
るためには、エッチング液によって、所定のエッチング
条件下におけるエッチング速度を測定して、エッチング
時間を設定する方法を使用する。例えば、両面に同一厚
みの銅箔を張った両面銅張板を用い、これを水平におい
て両面を同時に同一の厚みにするには、上下両面のエッ
チング速度が同一となるようにスプレー圧等をコントロ
ールしてエッチング速度を揃え、所定時間エッチングす
る方法による。又、垂直に立てて行う方法は上記に例示
した所謂アルカリエッチングなどの方法においては作業
環境の問題が生じるので行うことはできないが、過酸化
水素/硫酸系の場合、同一スプレー圧力で両面を同時に
同一速度でエッチングでき、水平に置く場合のように上
下面間のエッチング速度の差を補正する必要がないこと
から好適な方法の一つである。さらに、従来のエッチン
グマシンは、通常、一定速度で移動する積層板の面に対
してノズルの噴射方向を出来るだけ垂直とする方法が取
られているが、本発明の場合には積層板表面に均一にス
プレーされればよく、30゜〜50゜程度傾けて使用するこ
ともできるものである。As an etching method in the production method of the present invention, spray etching is usually appropriate, and is performed horizontally or vertically. In order to form a copper foil having a predetermined thickness by etching, a method of setting an etching time by measuring an etching rate under a predetermined etching condition using an etchant is used. For example, to use a double-sided copper-clad board with copper foil of the same thickness on both sides, and to make the both sides the same thickness at the same time horizontally, control the spray pressure etc. so that the etching rates on the upper and lower sides are the same The etching rate is made uniform by performing the etching for a predetermined time. In addition, the method of standing vertically cannot be performed in the above-described methods such as the so-called alkali etching because of the problem of the working environment. However, in the case of a hydrogen peroxide / sulfuric acid system, both sides are simultaneously sprayed at the same spray pressure. This is one of the preferable methods because the etching can be performed at the same rate and it is not necessary to correct the difference in the etching rate between the upper and lower surfaces as in the case where the substrate is placed horizontally. Further, in the conventional etching machine, a method is generally adopted in which the jet direction of the nozzle is made as perpendicular as possible to the surface of the laminate moving at a constant speed. As long as it is sprayed uniformly, it can be used at an angle of about 30 to 50 degrees.
上記に詳細に説明した方法によりエッチング速度を好
ましくは0.03〜0.20μm/秒の速度で銅箔全面をエッチン
グして残存銅箔の厚みバラツキを所定厚みの±1.0μm
とし、その後のプリント配線製造工程における高密度の
配線の形成を可能とする。例えば厚さ9μm〜3μm程
度の薄銅張板は、公称厚さ18μm(1/2 OZ)の銅箔を使
用した銅張積層板をエッチングすることにより容易に高
厚み精度で製造され、しかも元の銅張積層板の接着力は
そのまま生かされたものとできるものである。また、厚
さ12μm〜20μm程度の銅張板は、公称厚さ35μm(1
OZ)の銅箔を使用した銅張積層板をエッチングすること
により同様に製造される。Etching rate by the method described in detail above preferably 0.03 ~ 0.20μm / second etch the entire copper foil at a rate of ± 1.0μm of the thickness variation of the remaining copper foil of the predetermined thickness
This makes it possible to form high-density wiring in the subsequent printed wiring manufacturing process. For example, a thin copper-clad board having a thickness of about 9 μm to 3 μm can be easily manufactured with high thickness accuracy by etching a copper-clad laminate using a copper foil having a nominal thickness of 18 μm (1/2 OZ). The adhesive strength of the copper-clad laminate can be utilized as it is. A copper-clad plate having a thickness of about 12 μm to 20 μm has a nominal thickness of 35 μm (1
It is similarly manufactured by etching a copper-clad laminate using a copper foil of OZ).
上記したエッチング剤で処理した積層板の銅箔面は清
浄化した後、適宜乾燥し、銅箔面の保護のために防錆剤
の塗布や剥離可能な樹脂による被覆を行う。After the copper foil surface of the laminate treated with the above-mentioned etching agent is cleaned, it is appropriately dried, and then a rust preventive agent is applied or the resin is coated with a peelable resin to protect the copper foil surface.
ここに清浄化とは、中和、酸洗浄、水洗、湯洗などの
公知の不純物の除去法でよく、用いた銅エッチング液の
安定剤その他の成分を考慮して適宜選択するが、通常は
中和→酸洗浄→(防錆或いは保護膜被覆)を行うのが好
ましい。Here, the cleaning may be a known method of removing impurities such as neutralization, acid washing, water washing, and hot water washing, and is appropriately selected in consideration of a stabilizer and other components of the used copper etching solution, but is usually selected. It is preferable to perform neutralization → acid washing → (rust prevention or protection film coating).
適宜乾燥した後、本発明の防錆剤或いは剥離可能な樹
脂により銅箔面を保護する。防錆剤としては公知の銅の
防錆剤が挙げられ、ベンゾトリアゾールなどのアゾール
化合物が挙げられ、これに界面活性剤等を適宜併用した
ものが例示される。又、剥離可能な樹脂としては、ポリ
エチレ、ポリプロピレン、エチレン−プロピレン樹脂、
エチレン−酢酸ビニル樹脂、塩化ビニリデン、ポリアク
リレート共重合体、1,2−ポリブタジエン樹脂、ポリエ
ステル樹脂、その他の熱可塑性樹脂製のフィルム類やフ
ォトレジストフィルム;パラフィンワックス、ポリエチ
レンワックス、ロジン、低分子量ポリスチレンなどの汎
用溶媒溶解性の樹脂類;フォトレジスト樹脂液などが例
示され、洗浄された銅箔面に直接圧着などしても良い
し、前記の防錆処理した面にさらに圧着などして銅箔面
を被覆する。After being appropriately dried, the copper foil surface is protected by the rust inhibitor of the present invention or a peelable resin. Examples of the rust preventive include known copper rust preventives, such as azole compounds such as benzotriazole, and those obtained by appropriately using a surfactant or the like in combination. Also, as the peelable resin, polyethylene, polypropylene, ethylene-propylene resin,
Ethylene-vinyl acetate resin, vinylidene chloride, polyacrylate copolymer, 1,2-polybutadiene resin, polyester resin, other thermoplastic resin films and photoresist films; paraffin wax, polyethylene wax, rosin, low molecular weight polystyrene Resin-soluble resins such as general-purpose resins; photoresist resin liquids, etc., which may be directly press-bonded to the cleaned copper foil surface, or may be further press-bonded to the rust-proofed surface to form a copper foil. Cover the surface.
以下、実施例、比較例により本発明を具体的に説明す
る。なお、エッチングした銅箔の厚みは、うず電流方式
で測定した。Hereinafter, the present invention will be specifically described with reference to Examples and Comparative Examples. The thickness of the etched copper foil was measured by an eddy current method.
実施例1 1020×1020mmで板厚1.6mm、公称18μm銅箔(日鉱グ
ルード社、TC箔)を両面に張ったガラス布基材エポキシ
樹脂積層板を水平スプレーエッチングマシンを用い、過
酸化水素/硫酸エッチング液(三菱瓦斯化学(株)製、
FES−6000、H2O2=7.78w/v%,H2SO4=11.7w/v%)の3
倍希釈液を用い、下記条件でエッチングした。Example 1 A glass cloth-based epoxy resin laminate having a 1020 × 1020 mm plate thickness of 1.6 mm and a nominal 18 μm copper foil (Nikko Gourde Co., TC foil) stretched on both sides was subjected to hydrogen peroxide / sulfuric acid using a horizontal spray etching machine. Etching solution (Mitsubishi Gas Chemical Co., Ltd.,
FES-6000, H 2 O 2 = 7.78w / v%, H 2 SO 4 = 11.7w / v%) of 3
Etching was performed using a double dilution under the following conditions.
.エッチング条件. ・温度 30℃ ・スプレー圧力 上面1.5kg/cm2. 下面1.3kg/cm2. ・Cu=40g/ ・エッチング速度 0.18μm/sec ついで、中和→酸洗浄→水洗した後、水溶性の防錆剤
(例えば、C.B.ブライト(三菱瓦斯化学(株)製)、コ
ロミンCB(花王アトラス(株)製など)を用いて、防錆
処理をして、渦電流式膜厚計(電測工業(株)製、ダー
メス渦電流式膜厚計、形式DS−1)で銅箔の厚みを測定
することにより、第1表に記載の薄銅張板を連続して10
枚製造した。. Etching conditions.・ Temperature 30 ° C ・ Spray pressure 1.5kg / cm 2 on the upper surface 1.3kg / cm 2 on the lower surface ・ Cu = 40g / ・ Etching rate 0.18μm / sec Then neutralization → acid washing → water washing, then water-soluble rust prevention An eddy current type film thickness meter (Denso Kogyo Co., Ltd.) ), Dermes eddy current film thickness meter, type DS-1) was used to measure the thickness of the copper foil to continuously apply the thin copper-clad plate shown in Table 1 to 10
Were manufactured.
比較例1 実施例1において、エッチング液としてFES−6000の
原液を用い、エッチング条件を下記とする他は同様とし
た。結果を第1表に示した。Comparative Example 1 The procedure of Example 1 was repeated except that a stock solution of FES-6000 was used as an etching solution, and the etching conditions were as follows. The results are shown in Table 1.
.エッチング条件. ・温度 50℃ ・スプレー圧力 上面1.5kg/cm2. 下面1.0kg/cm2. ・Cu=40g/ ・エッチング速度 0.63μm/sec 比較例2 公称厚さ9μmの片面接着処理電解銅箔を用いて実施
例と同様の両面板10枚を、40kg/cm2、170℃、2時間の
積層成形条件で製造した。9μm銅箔を皺の発生なしに
取り扱うことは困難を極め、積層成形品の30%に皺が発
生した。得られた両面板の測定結果を第2表に示した。. Etching conditions.・ Temperature 50 ℃ ・ Spray pressure Upper surface 1.5kg / cm 2, Lower surface 1.0kg / cm 2・ Cu = 40g / ・ Etching rate 0.63μm / sec Comparative Example 2 Ten double-sided boards similar to those of the example were manufactured under the conditions of 40 kg / cm 2 , 170 ° C., and 2 hours of lamination using a 9 μm nominal thickness single-sided electrolytic copper foil. It was extremely difficult to handle the 9 μm copper foil without wrinkles, and wrinkles occurred in 30% of the laminated molded articles. Table 2 shows the measurement results of the obtained double-sided boards.
比較例3 厚さ40μmのアルミニウム箔に公称厚さ9μmの銅メ
ッキ並びにメッキ面を凹凸処理した箔を使用して比較例
2と同様にして両面板を製造した後、アルミニウム箔を
エッチング除去した。得られた両面板の測定結果を第2
表に示した。Comparative Example 3 A double-sided board was manufactured in the same manner as in Comparative Example 2 using copper foil having a nominal thickness of 9 μm on a 40 μm-thick aluminum foil and a foil having a plated surface with unevenness, and then the aluminum foil was removed by etching. The measurement result of the obtained double-sided board is
It is shown in the table.
〔発明の作用および効果〕 以上、発明の詳細な説明および実施例、比較例から明
瞭な如く、本発明の製造法によれば、従来のアルミクラ
ッド銅箔を用いた場合と同等以上の銅箔厚み精度を有す
る薄銅張積層板が容易に製造され、しかも、銅薄の剥離
強度においても優れたものであることが理解される。 [Functions and Effects of the Invention] As described above, according to the production method of the present invention, as is clear from the detailed description of the invention and the Examples and Comparative Examples, a copper foil equivalent to or more than the case using a conventional aluminum clad copper foil It is understood that a thin copper-clad laminate having a thickness accuracy can be easily manufactured, and that the peel strength of copper thin is excellent.
この結果、従来は高価なアルミニウム箔等の担体上に
形成された5μm、9μmなどの銅箔を使用する方法に
よってしか製造出来なかった薄銅張積層板を精度よく安
価に容易に製造することが可能となるものであることが
理解され、その産業上の意義は極めて大きいものであ
る。As a result, thin copper-clad laminates that could only be produced by a method using a copper foil of 5 μm or 9 μm or the like formed on a carrier such as an expensive aluminum foil can be manufactured accurately and inexpensively easily. It is understood that this is possible, and its industrial significance is extremely large.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭50−65868(JP,A) 特開 昭62−200796(JP,A) ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-50-65868 (JP, A) JP-A-62-200796 (JP, A)
Claims (1)
回路基板を過酸化水素2〜4w/v%、硫酸3〜7w/v%を主
剤とし、助剤としてアルコールを0.1〜5w/v%配合して
なる水溶液からなる銅エッチング液を用い、温度25〜50
℃、銅濃度30〜60g/にて、0.01〜0.3μm/秒の速度で
銅箔全面をエッチングして、もとの銅箔の厚さの25〜90
%を除去し、所望厚みに対して残存銅箔の厚みのバラツ
キが±1.0μm以内とし後、防錆剤或いは剥離可能な樹
脂により銅箔面を保護したことを特徴とする薄銅箔張回
路基板の製造法.1. A copper foil-clad circuit board produced from a copper foil and an electrical insulator is made mainly of hydrogen peroxide 2-4 w / v%, sulfuric acid 3-7 w / v%, and alcohol as an auxiliary agent in an amount of 0.1-4.0 w / v%. Use a copper etching solution consisting of an aqueous solution containing 5 w / v%
° C, at a copper concentration of 30 to 60 g /, etching the entire surface of the copper foil at a rate of 0.01 to 0.3 μm / sec, 25 to 90 of the original copper foil thickness
%, And the copper foil surface is protected by a rust inhibitor or a peelable resin after the thickness variation of the remaining copper foil is within ± 1.0 μm with respect to a desired thickness. Substrate manufacturing method.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63171734A JP2947415B2 (en) | 1988-07-12 | 1988-07-12 | Manufacturing method of thin copper foil-clad circuit board |
| DE68923904T DE68923904T2 (en) | 1988-05-20 | 1989-05-18 | Method for producing a substrate for circuit boards laminated with a thin copper foil. |
| EP89108934A EP0342669B1 (en) | 1988-05-20 | 1989-05-18 | Method for preparing thin copper foil-clad substrate for circuit boards |
| US07/354,954 US4917758A (en) | 1988-05-20 | 1989-05-19 | Method for preparing thin copper foil-clad substrate for circuit boards |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63171734A JP2947415B2 (en) | 1988-07-12 | 1988-07-12 | Manufacturing method of thin copper foil-clad circuit board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0222887A JPH0222887A (en) | 1990-01-25 |
| JP2947415B2 true JP2947415B2 (en) | 1999-09-13 |
Family
ID=15928695
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63171734A Expired - Fee Related JP2947415B2 (en) | 1988-05-20 | 1988-07-12 | Manufacturing method of thin copper foil-clad circuit board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2947415B2 (en) |
Cited By (1)
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|---|---|---|---|---|
| KR20230089142A (en) * | 2021-12-13 | 2023-06-20 | 주식회사 제이에스제이 | Method for manufacturing heavey copper printed circuit board |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5316402A (en) * | 1991-12-13 | 1994-05-31 | Tombow Pencil Co., Ltd. | Penholder cap |
| JP2566664Y2 (en) * | 1993-08-31 | 1998-03-30 | セーラー万年筆株式会社 | Applicator |
| MY144503A (en) | 1998-09-14 | 2011-09-30 | Ibiden Co Ltd | Printed circuit board and method for its production |
| EP1835052A3 (en) * | 1998-09-14 | 2007-09-26 | Ibiden Co., Ltd. | Process for manufacturing a multilayer printed circuit board, and multilayer printed circuit board |
| JP2002141666A (en) * | 2000-10-31 | 2002-05-17 | Mitsubishi Gas Chem Co Inc | Manufacturing method of multilayer copper clad board |
| JP2003078234A (en) * | 2001-08-31 | 2003-03-14 | Toppan Printing Co Ltd | Printed wiring board and method of manufacturing the same |
| JP2005340785A (en) * | 2004-04-30 | 2005-12-08 | Hitachi Via Mechanics Ltd | Printed circuit board, processing method of printed circuit board, and manufacturing method of printed circuit board |
| CN115250576B (en) * | 2021-04-28 | 2025-04-01 | 南通深南电路有限公司 | Printed circuit board etching method |
| CN114351191B (en) * | 2022-01-12 | 2023-09-12 | 九江德福科技股份有限公司 | Copper foil surface density adjusting device and acting surface manufacturing method thereof |
| DE102024112039A1 (en) * | 2024-04-29 | 2025-10-30 | Valeo Eautomotive Germany Gmbh | Laminated sheet metal for an electric machine with improved insulation and method for its manufacture |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5065868A (en) * | 1973-10-13 | 1975-06-03 | ||
| JPS62200796A (en) * | 1986-02-27 | 1987-09-04 | イビデン株式会社 | Manufacture of extra-thin copper laminated board |
-
1988
- 1988-07-12 JP JP63171734A patent/JP2947415B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20230089142A (en) * | 2021-12-13 | 2023-06-20 | 주식회사 제이에스제이 | Method for manufacturing heavey copper printed circuit board |
| KR102575861B1 (en) * | 2021-12-13 | 2023-09-11 | 주식회사 제이에스제이 | Method for manufacturing heavey copper printed circuit board |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0222887A (en) | 1990-01-25 |
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