JP2967448B2 - Oscillator characteristics selection method - Google Patents
Oscillator characteristics selection methodInfo
- Publication number
- JP2967448B2 JP2967448B2 JP1840793A JP1840793A JP2967448B2 JP 2967448 B2 JP2967448 B2 JP 2967448B2 JP 1840793 A JP1840793 A JP 1840793A JP 1840793 A JP1840793 A JP 1840793A JP 2967448 B2 JP2967448 B2 JP 2967448B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- oscillator
- phase
- resonance
- selecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Measurement Of Resistance Or Impedance (AREA)
Description
【０００１】[0001]
【産業上の利用分野】本発明は、発振子の特性選別方法
に関し、特に、共振抵抗Ｒ1 や共振点−反共振点間にお
ける位相の最小値θmin などをもとに、発振子の特性を
選別する方法に関する。BACKGROUND OF THE INVENTION The present invention relates to a characteristic evaluation method oscillator particular, resonant resistance R 1 and the resonance point - on the basis of such minimum theta min of the phase between the anti-resonance point, the characteristics of the oscillator The method of sorting.
【０００２】[0002]
【従来の技術】従来、圧電発振子の特性選別にあたって
は、インピーダンス−周波数特性曲線における波形選別
及びＱｅ＝ｔａｎθ（θは位相）による発振条件の選別
等を行っていた。これを、図２及び図３を参照して説明
する。2. Description of the Related Art Conventionally, in selecting characteristics of a piezoelectric oscillator, a waveform has been selected in an impedance-frequency characteristic curve, and an oscillation condition has been selected by Qe = tan θ (θ is a phase). This will be described with reference to FIGS.
【０００３】図２は、圧電発振子の等価回路を示す。圧
電発振子の特性選別にあたっては、発振周波数ｆ0 のほ
か、図２の等価回路における共振抵抗Ｒ1 や図３に示す
共振点−反共振点間におけるリップルＲp の大きさなど
が測定され、これらに基づいて特性が選別されている。FIG. 2 shows an equivalent circuit of a piezoelectric oscillator. In selecting the characteristics of the piezoelectric oscillator, in addition to the oscillation frequency f 0 , the resonance resistance R 1 in the equivalent circuit of FIG. 2 and the magnitude of the ripple R p between the resonance point and the anti-resonance point shown in FIG. 3 are measured. Characteristics are selected based on these.
【０００４】また、発振子の発振条件は、一般に位相０
°のループゲインが１以上あることであり、共振点−反
共振点間における位相の最小値θmin が或る値ａ以上、
すなわち、θmin ≧ａを満たす必要がある。従って、位
相も発振子の特性選別に際しての重要なファクターであ
る。よって、微小リップルなども含め、位相−周波数特
性曲線に基づき、位相値によっても発振子の特性が選別
されている。もっとも、実際には、位相θではなく、Ｑ
ｅ＝ｔａｎθで表されるファクターＱｅをもとに特性が
選別されていた。例えば、上記発振条件についてはＱｅ
min ≧ｂを満足するが否かにより選別されていた。ｂ
は、発振条件を満たすための或る値であり、上記値ａに
相当するものである。[0004] In general, the oscillation condition of an oscillator generally has a phase 0
° has a loop gain of 1 or more, and the minimum value θ min of the phase between the resonance point and the anti-resonance point is a certain value a or more,
That is, it is necessary to satisfy θ min ≧ a. Therefore, the phase is also an important factor in selecting the characteristics of the oscillator. Therefore, the characteristics of the oscillator are selected based on the phase value based on the phase-frequency characteristic curve including the minute ripple. However, actually, instead of the phase θ, Q
Characteristics were selected based on a factor Qe represented by e = tan θ. For example, for the above oscillation condition, Qe
Selection was made based on whether or not min ≧ b was satisfied. b
Is a certain value for satisfying the oscillation condition, and corresponds to the value a.
【０００５】さらに、共振抵抗Ｒ1 と位相の最大値θ
max とは理論的に相関が強いものであるため、Ｒ1 を直
接選別せず、θmax で代用し、選別していた。すなわ
ち、最終的には、発振周波数ｆ0 付近における位相をた
よりに共振抵抗Ｒ1 を選別しているのが現状であった。Furthermore, the resonance resistance R 1 and the maximum value θ of the phase
Since max is theoretically strongly correlated, R 1 was not directly selected, but was substituted by θ max . That is, in the end, what were selected resonance resistance R 1 in the phase relying near the oscillation frequency f 0 is at present.
【０００６】[0006]
【発明が解決しようとする課題】しかしながら、圧電発
振子では、半田、ペーストもしくは外装樹脂等によるダ
ンピングの影響により、上記共振抵抗Ｒ1 とθmax との
相関がとりきれないことがあった。従って、現実には、
共振抵抗Ｒ1 と位相θとを別々に、すなわち測定機にお
いて２回選別することが必要であった。あるいは、２台
の測定機を直列に設置して、共振抵抗Ｒ1 及び位相θを
それぞれの測定機で測定しなければならなった。[SUMMARY OF THE INVENTION However, in the piezoelectric oscillator, the solder, the effect of damping by a paste or exterior resin, the correlation between the resonant resistance R 1 and theta max was sometimes not completely removed. Therefore, in reality,
Separately and resonance resistance R 1 and the phase theta, i.e. it was necessary to screen two times in measuring machine. Alternatively, two measuring instruments must be installed in series, and the resonance resistance R 1 and the phase θ must be measured by each measuring instrument.
【０００７】他方、現在の測定機では、インピーダン
ス、位相、Ｑｅ及びインダクタンスのうち２種類の周波
数特性しか同時に画面上に表示することができない。す
なわち、図３に示すようにインピーダンス−周波数特性
と位相−周波数特性とを同時に表示することはできる
が、Ｑｅ及びインダクタンスＬの周波数特性について
は、モードを変更し、画面を切換ねば表示することがで
きなかった。よって、発振条件を満足するようにＱｅ≧
ｂであることを選別するには、測定画面の切換が必要で
あるため、測定に長時間を要するという問題があった。On the other hand, with the current measuring instrument, only two kinds of frequency characteristics of impedance, phase, Qe and inductance can be simultaneously displayed on the screen. That is, as shown in FIG. 3, the impedance-frequency characteristics and the phase-frequency characteristics can be displayed simultaneously, but the frequency characteristics of Qe and inductance L can be displayed by changing the mode and switching the screen. could not. Therefore, Qe ≧
Since it is necessary to switch the measurement screen in order to judge b, there is a problem that it takes a long time for the measurement.
【０００８】のみならず、上述した種々のファクターを
測定するには、図３に示されているように共振点及び反
共振点を含むように広い周波数範囲に渡りインピーダン
ス−周波数特性等を画面上に表示しなければならなかっ
た。他方、測定機の画面上における測定ポイント数には
制限があるため、このような広い周波数範囲にわたり特
性を表示した場合に、測定の精度が充分でないという問
題もあった。In order to measure not only the above-mentioned various factors but also the impedance-frequency characteristics over a wide frequency range including the resonance point and the anti-resonance point as shown in FIG. Had to be displayed. On the other hand, since the number of measurement points on the screen of the measuring instrument is limited, there is also a problem that the accuracy of measurement is not sufficient when characteristics are displayed over such a wide frequency range.
【０００９】本発明の目的は、多数の測定機を必要とす
ることなく、迅速かつ高精度に特性選別を行い得る発振
子の特性選別方法を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a method of selecting characteristics of an oscillator capable of performing characteristics selection quickly and with high accuracy without requiring a large number of measuring machines.
【００１０】[0010]
【課題を解決するための手段】本発明の発振子の特性選
別方法は、共振子の共振周波数をｆr 、発振周波数をｆ
0 、製品の初期公差、温度による変動分及び経時変動分
を考慮した周波数変動分をΔｆとしたときに、共振周波
数ｆr と、ｆ0 ＋Δｆとの間の周波数範囲で、インピー
ダンス−周波数特性及び位相−周波数特性を測定し、当
該測定結果に基づいて得られた共振抵抗Ｒ1 及び上記周
波数範囲内における位相の最小値θmin に基づいて発振
子の特性を選別することを可能とする、特性選別方法で
ある。According to the oscillator characteristic selecting method of the present invention, the resonance frequency of the resonator is set to f r , and the oscillation frequency is set to f
0, the initial tolerance of products, the frequency variation in consideration of the variation and aging variation with temperature is taken as Delta] f, in the frequency range between the resonant frequency f r, and f 0 + Delta] f, the impedance - frequency characteristic and Measure the phase-frequency characteristics and
Oscillation is performed based on the resonance resistance R 1 obtained based on the measurement result and the minimum value θ min of the phase within the above frequency range.
This is a characteristic selection method that enables selection of child characteristics .
【００１１】[0011]
【作用】共振子周波数ｆr と、ｆ0 ＋Δｆとの間の周波
数範囲、すなわち従来に比べて比較的狭い周波数範囲で
発振子の特性が選別されるので、測定機の画面上におけ
る測定ポイント間ピッチの周波数幅を狭くすることがで
き、測定精度を高め得る。[Action] and resonator frequency f r, the frequency range between f 0 + Delta] f, that is, characteristics of the resonator in a relatively narrow frequency range as compared with the prior art are selected, between the measurement point on the machine's screen The frequency width of the pitch can be narrowed, and the measurement accuracy can be increased.
【００１２】また、後述の実施例から明らかなように、
上記のような比較的狭い周波数範囲内を表示しただけ
で、測定された共振抵抗Ｒ1 及び位相の最小値θ min に
基づいて発振子の特性を確実に選別することができる。Also, as will be apparent from the embodiments described below,
By simply displaying the relatively narrow frequency range as described above, the measured resonance resistance R 1 and the minimum value θ min of the phase
Based on this, the characteristics of the oscillator can be reliably selected.
【００１３】[0013]
【実施例の説明】以下、本発明の実施例を説明すること
により、本発明を明らかにする。図１は、本発明の一実
施例により発振子の特性選別を行う場合の測定機画面を
説明するための図である。本発明の特性選別方法では、
図示のようにインピーダンス−周波数特性及び位相−周
波数特性を利用する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be clarified by describing embodiments of the present invention. FIG. 1 is a diagram for explaining a measuring instrument screen when selecting characteristics of an oscillator according to an embodiment of the present invention. In the property selection method of the present invention,
As shown, impedance-frequency characteristics and phase-frequency characteristics are used.
【００１４】また、周波数範囲としては、少なくとも、
共振周波数ｆr から発振周波数ｆ0プラス１．０％まで
の周波数範囲が測定画面に入るように選択する。この
１．０％とは、発振子の初期公差による変動、温度によ
る周波数変動分及び経時変化による周波数変動分を考慮
して定められるものであり、特性選別の対象となる発振
子により適宜定められるものである。The frequency range is at least
Frequency range from the resonance frequency f r 0 plus 1.0 percent oscillation frequency f is selected to enter the measurement screen. The value of 1.0% is determined in consideration of the variation due to the initial tolerance of the oscillator, the frequency variation due to the temperature, and the frequency variation due to the aging, and is appropriately determined depending on the oscillator whose characteristics are to be selected. Things.
【００１５】本実施例では、上記のように共振周波数ｆ
r と発振周波数＋１．０％の間の周波数範囲が入るよう
に測定画面が選択される。従って、図２に示した従来法
の場合に比べて、より狭い周波数範囲で発振子の種々の
ファクタを選別し得るため、測定精度を高め得る。一例
を挙げると、従来法では、インピーダンス−周波数特性
の波形選別にあたり、２５０ｋＨｚの周波数範囲を利用
し、測定ポイント数が１０１ポイントであったため、１
ポイントあたりの周波数範囲は約２．４８ｋＨｚであ
り、Ｑｅ選別にあたっては、２ＭＨｚ±１．０％の周波
数範囲すなわち４０ｋＨｚの範囲を用いており、測定ポ
イントが６８ポイントであったため、４０ｋＨｚ／６８
ポイント、すなわち１ポイントあたり０．５８８ｋＨｚ
の精度で測定が行われていた。In this embodiment, as described above, the resonance frequency f
The measurement screen is selected so that a frequency range between r and the oscillation frequency + 1.0% falls. Therefore, as compared with the conventional method shown in FIG. 2, various factors of the oscillator can be selected in a narrower frequency range, so that the measurement accuracy can be improved. As an example, in the conventional method, the frequency range of 250 kHz is used for selecting the waveform of the impedance-frequency characteristic, and the number of measurement points is 101 points.
The frequency range per point is about 2.48 kHz. In Qe selection, a frequency range of 2 MHz ± 1.0%, that is, a range of 40 kHz is used. Since the measurement points are 68 points, 40 kHz / 68
Points, ie 0.588 kHz per point
The measurement was performed with an accuracy of.
【００１６】これに対して、同じ発振子を測定するにあ
たり、本実施例の方法では、１９４０ＫＨｚ〜２０２０
ＫＨｚの範囲で測定し得るため、（２０２０−１９４
０）／ポイント数で求められる精度が、従来例に比べて
飛躍的に高められる。On the other hand, when measuring the same oscillator, the method of the present embodiment employs a frequency of 1940 kHz to 2020 kHz.
(2020-194) because it can be measured in the range of KHz.
0) / the number of points required is greatly improved in accuracy compared to the conventional example.
【００１７】次に、図１を参照して、本実施例の方法に
より発振子の特性選別を確実に行い得ることを説明す
る。図１において、インピーダンス−周波数特性曲線Ａ
は、少なくとも共振周波数から発振周波数＋１．０％の
周波数範囲が入るように表されている。従って、このイ
ンピーダンス−特性曲線Ａにより、共振抵抗Ｒ1 を必ず
測定することができる。Next, with reference to FIG. 1, a description will be given of how the characteristics of the oscillator can be reliably selected by the method of this embodiment. In FIG. 1, an impedance-frequency characteristic curve A
Is represented so that at least the frequency range from the resonance frequency to the oscillation frequency + 1.0% falls. Therefore, the impedance - the characteristic curve A, it is possible to measure the resonant resistance R 1 always.
【００１８】また、発振を決定する共振周波数−反共振
周波数間における位相の最小値θmi n ≧ａなる条件によ
る選別は、図１に示す位相−周波数特性曲線Ｂにおい
て、θ min の値を測定することにより行い得る。なお、
発振周波数ｆ0 が多少ずれたとしても、発振周波数は、
ｆ0 ＋１％までの範囲に入ることは経験により確かめら
れており、従って、周波数範囲の上限を上記のように設
定したとしても、θminの値を確実に測定し得る。よっ
て、共振抵抗Ｒ1 と、θmin に基づく選別を、測定機に
おいて同一画面上で行うことができる。Also, the resonance frequency which determines the oscillation-anti-resonance
Minimum value θ of phase between frequenciesmi n≧ a
Selection is performed according to the phase-frequency characteristic curve B shown in FIG.
And θ minBy measuring the value of In addition,
Oscillation frequency f0The oscillation frequency is
f0Experience has shown that the range is up to + 1%
Therefore, the upper limit of the frequency range is set as described above.
Even ifminCan be reliably measured. Yo
And the resonance resistance R1And θminSorting based on
Can be performed on the same screen.
【００１９】さらに、共振周波数−反共振周波数間にお
いて発生するリップルＲp についても、図１から明らか
なように、共振周波数とｆ0 ＋１．０％の範囲でインピ
ダンス−周波数特性及び位相−周波数特性が表示される
ため、同一画面で選別することができる。Furthermore, the resonance frequency - for even the ripple R p occurring between the anti-resonant frequency, as is clear from FIG. 1, the impedance at the resonance frequency and f 0 + 1.0% of range - frequency characteristic and the phase - frequency characteristics Is displayed, it is possible to sort on the same screen.
【００２０】なお、実際の測定にあたっては、θmin に
よる選別は、ｆ0 −１．０％〜ｆ0＋１．０％の範囲に
おいて、θをＱｅ＝ｔａｎθに測定機内で変換すること
により部分解析すればよい。In the actual measurement, selection by θ min is performed by partial analysis by converting θ into Qe = tan θ in the measuring instrument in the range of f 0 −1.0% to f 0 + 1.0%. do it.
【００２１】[0021]
【発明の効果】本発明によれば、測定画面を切り換える
ことなく、共振抵抗Ｒ1 と、発振条件を決定付けるファ
クタであるθmin による特性選別を行い得るため、複数
の測定機を用いることなく迅速に発振子の特性選別を行
うことができる。しかも、使用する周波数範囲が、上記
のように共振周波数と、発振周波数ｆ0 ＋Δｆの間の狭
い範囲でよいため、特性選別の精度を効果的に高め得
る。According to the present invention, without switching the measurement screen, the resonance resistance R 1, because that can make characteristic evaluation by theta min is a factor that determines the oscillation condition, without using a plurality of measuring The characteristics of the oscillator can be quickly selected. Moreover, since the frequency range to be used may be a narrow range between the resonance frequency and the oscillation frequency f 0 + Δf as described above, the accuracy of the characteristic selection can be effectively improved.
【図１】本発明の一実施例の発振子の特性選別方法を説
明するための図。FIG. 1 is a diagram for explaining a method of selecting characteristics of an oscillator according to an embodiment of the present invention.
【図２】発振子の等価回路を示す図。FIG. 2 is a diagram showing an equivalent circuit of an oscillator.
【図３】従来の特性選別方法の一例を説明するための
図。FIG. 3 is a diagram for explaining an example of a conventional characteristic selection method.
Claims (1)
初期公差、温度による変動分及び経時変動分を考慮した
周波数変動分をΔｆとしたときに、共振周波数ｆr と、
（ｆ0 ＋Δｆ）との間の周波数範囲でインピーダンス−
周波数特性及び位相−周波数特性を測定し、当該測定結
果に基づいて得られた共振抵抗Ｒ1 及び上記周波数範囲
内における位相の最小値θmin に基づいて発振子の特性
を選別することを特徴とする発振子の特性選別方法。1. A method for selecting characteristics of an oscillator, wherein a resonance frequency of the oscillator is f r , an oscillation frequency is f 0 , a frequency variation considering an initial tolerance of a product, a variation due to temperature, and a variation with time. When the component is Δf, the resonance frequency fr and
(F 0 + Δf)
Measure the frequency characteristics and phase-frequency characteristics, and
Characteristics of the resonator on the basis of the minimum value theta min of the phase in the resonant resistance R 1 and the frequency ranges obtained based on results
A method for selecting the characteristics of an oscillator, characterized by selecting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1840793A JP2967448B2 (en) | 1993-02-05 | 1993-02-05 | Oscillator characteristics selection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1840793A JP2967448B2 (en) | 1993-02-05 | 1993-02-05 | Oscillator characteristics selection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06230053A JPH06230053A (en) | 1994-08-19 |
| JP2967448B2 true JP2967448B2 (en) | 1999-10-25 |
Family
ID=11970821
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1840793A Expired - Lifetime JP2967448B2 (en) | 1993-02-05 | 1993-02-05 | Oscillator characteristics selection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2967448B2 (en) |
-
1993
- 1993-02-05 JP JP1840793A patent/JP2967448B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06230053A (en) | 1994-08-19 |
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