JP3003964B2 - Measurement interferometer - Google Patents
Measurement interferometerInfo
- Publication number
- JP3003964B2 JP3003964B2 JP3241766A JP24176691A JP3003964B2 JP 3003964 B2 JP3003964 B2 JP 3003964B2 JP 3241766 A JP3241766 A JP 3241766A JP 24176691 A JP24176691 A JP 24176691A JP 3003964 B2 JP3003964 B2 JP 3003964B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical element
- reflecting mirror
- quarter
- wave plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Instruments For Measurement Of Length By Optical Means (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は,測長用干渉計に関する
ものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a length measuring interferometer.
【0002】[0002]
【従来の技術】従来、測長用干渉計については様々な方
式の提案が成されてきた。最も基本的な構成としては、
1/2波長毎の干渉縞(フリンジ)を検出し、このフリ
ジン数を計数することにより移動距離を測定するマイケ
ルソン干渉計がある。2. Description of the Related Art Conventionally, various types of interferometers for length measurement have been proposed. The most basic configuration is
There is a Michelson interferometer that detects an interference fringe (fringe) for every half wavelength and measures the moving distance by counting the number of fringes.
【0003】更に、S.J.Bennett によって
提案された所謂ダブルパス型の干渉計がある。これは1
フリンジが1/4波長に相当するため、前述のマイケル
ソン干渉計に比べ感度を倍にできるものである。(S.
J.Bennett Optics Communic
ation, vol.4(1972))Further, S.M. J. There is a so-called double-pass interferometer proposed by Bennett. This is 1
Since the fringe corresponds to a quarter wavelength, the sensitivity can be doubled as compared with the above-mentioned Michelson interferometer. (S.
J. Bennett Optics Comics
ation, vol. 4 (1972))
【0004】図6に基づき、前記Bennett干渉計
について説明する。入射光1は2つの偏光成分(光の進
行方向に垂直な面内で互いに直角方向に振動する直線偏
光成分)を含んでおり、今、入射方向を含む面で振動す
る偏光成分を実線で示し1aとし、これと直交して振動
する偏光成分を破線で示し1bとして説明する。偏光成
分1aは偏光プリズム3の偏光膜4を透過して1/4波
長板6を通って移動鏡7で反射し、再び1/4波長板6
を通り偏光プリズム3に戻る。偏光成分1aは1/4波
長板6を2回通過したので、振動面が90°回転してい
るため、偏光プリズム3の偏光膜4で反射されてコーナ
ーキューブ19に向かい、ここで反射され偏光プリズム
3の偏光膜4で反射されて、再び1/4波長板6を通り
移動鏡7に当たり、また1/4波長板6を通り偏光プリ
ズム3に戻る。ここで偏光成分1aはさらに1/4波長
板6を2度通過したので、振動面が90°回転するた
め、今度は偏光プリズム3を透過して測定光10aとし
て図示しない干渉縞検出部に向かう。The Bennett interferometer will be described with reference to FIG. Incident light 1 includes a two polarization components (the linearly polarized light component vibrating in the direction perpendicular to each other within a plane perpendicular to the traveling direction of light), now a polarization component oscillating in a plane including the incident direction by the solid line 1a, and a polarized light component that vibrates orthogonally thereto is indicated by a broken line and described as 1b. The polarized component 1a transmits through the polarizing film 4 of the polarizing prism 3, passes through the quarter-wave plate 6, is reflected by the movable mirror 7, and is again reflected by the quarter-wave plate 6.
And returns to the polarizing prism 3. Since the polarized light component 1a has passed through the quarter-wave plate 6 twice, the oscillating plane has been rotated by 90 °, so it is reflected by the polarizing film 4 of the polarizing prism 3 to the corner cube 19, where it is reflected and polarized. The light is reflected by the polarizing film 4 of the prism 3, passes through the quarter-wave plate 6 again, hits the moving mirror 7, and returns to the polarizing prism 3 through the quarter-wave plate 6. Here since polarization component 1a was further passed through the quarter wave plate 6 twice, because the vibration surface is rotated 90 °, this time fringe detection unit (not shown) as measuring light 1 0 a is transmitted through the polarization prism 3 Head for.
【0005】一方、前記偏光成分1aと直交する振動成
分の偏光成分1b(破線にて示す)は、偏光成分1aと
振動面の向きが90°異なるため、偏光プリズム3に於
ける透過、反射の関係が偏光成分1aとは正反対であ
り、破線に示す経路に沿って参照光10bとして干渉縞
検出部へ向かい、ここで偏光成分10a、10bとを干
渉させることで干渉縞ができることになる。On the other hand, a polarization component 1b (shown by a broken line) of a vibration component orthogonal to the polarization component 1a has a direction of a vibration plane different from that of the polarization component 1a by 90 °. relationship is opposite of the polarized light component 1a, along a path shown in broken line towards the interference fringe detector as reference light 1 0 b, the interference fringes where by causing interference between polarization components 1 0 a, 1 0 b Can be done.
【0006】今、実線に示した経路を測定光路、破線で
示した経路を参照光路と呼ぶことにする。移動鏡7が偏
光プリズム3に近づく或いは遠去かるように図中で左右
に移動すると、参照光路長と測定光路長の差が変化する
ため干渉縞が移動する。この縞の数を数えると、移動縞
の移動距離(元の位置と移動後の位置との間の長さ)が
わかり、測長ができる。Now, the path shown by a solid line is called a measurement optical path, and the path shown by a broken line is called a reference optical path. When the movable mirror 7 moves right and left in the figure so as to approach or move away from the polarizing prism 3, the interference fringes move because the difference between the reference optical path length and the measurement optical path length changes. By counting the number of these stripes, the movement distance of the moving stripe (the length between the original position and the moved position) can be determined, and the length can be measured.
【0007】[0007]
【発明が解決しようとする課題】然し従来のこの様な干
渉計では、光源からの光を測定光と参照光とに分割する
ための半透鏡または偏光プリズム等の分割光学素子の有
効径は、測長ビーム径より大きくする必要がある。そこ
で、測長ビーム径を大きくしようとすれば光学素子自体
も大きくなり、装置全体が大型化してしまい、従ってコ
スト高とならざるを得ない。さらに、図6に示す如きダ
ブルパス型干渉計においても測長ビーム径やビーム間隔
を大きくしようとすると、偏光プリズム3やコーナーキ
ューブ19の有効径を大きくしなければならないと云う
問題は解消されない。However, in such a conventional interferometer, the effective diameter of a split optical element such as a semi-transparent mirror or a polarizing prism for splitting light from a light source into measurement light and reference light is as follows. It is necessary to make it larger than the diameter of the measurement beam. Therefore, if an attempt is made to increase the diameter of the measurement beam, the size of the optical element itself increases, and the size of the entire apparatus increases, so that the cost must be increased. Further, even in a double-pass interferometer as shown in FIG. 6, if an attempt is made to increase the measurement beam diameter or the beam interval, the problem that the effective diameter of the polarizing prism 3 and the corner cube 19 must be increased is not solved.
【0008】本発明は、上記の問題を解消し、ダブルパ
ス型干渉計においても、測長ビーム径や、ビーム間隔よ
りも偏光プリズム径を小さくすることが出来、さらにコ
ーナーキューブを必要としなくて済む構成の干渉計を提
供することを目的とするものである。The present invention solves the above-mentioned problems, and in the double-pass interferometer, it is possible to reduce the diameter of the measuring beam and the diameter of the polarizing prism as compared with the beam interval, and it is not necessary to use a corner cube. An object of the present invention is to provide an interferometer having a configuration.
【0009】
[0009]
【課題を解決するための手段】上記目的を達成するた
め、本発明による測長用干渉計は、平行光束を集光して
分割光学素子へ傾斜して入射せしめる第1の集光手段
と、前記分割光学素子にて分割された透過及び反射した
発散光をそれぞれ平行光束にする第2、第3の集光手段
と、該第2、第3の集光手段の後方に配置された1/4
波長板と、該1/4波長板を出射した平行光束の光軸に
対し垂直に位置する固定及び可動の反射鏡と、該反射鏡
により反射した平行光束を再び、前記1/4波長板、前
記第2、第3の集光手段を通過せしめて収束光とし、該
収束光の収束点に反射鏡を設け、該反射鏡と前記第2、
第3の集光手段とにより夫々キャッツアイを構成せしめ
たことを特徴とするものである。 また、本発明による測
長用干渉計は、前記分割光学素子と前記第2、第3の集
光手段を、焦点距離がその直径と等しい半球レンズ2枚
を偏光膜を介して球状に形成してなる光学素子と置換し
てなることを特徴としている。 Means for Solving the Problems To achieve the above object,
Therefore, the length measuring interferometer according to the present invention focuses the parallel light beam and
The first method of obliquely entering the split optical elementFocusing means
When,SaidTransmitted and reflected by split optical element
The second and third light beams are converted into parallel light beams, respectively.Focusing means
When,TheSecond and third light collecting meansBehindPlaced in1/4
A wave plate;1/4To the optical axis of the collimated light beam emitted from the wave plate
Fixed and movable reflecting mirrors located vertically with respect to the reflecting mirror
The parallel light beam reflected by thePrevious
RecordSecond, thirdFocusing meansTo make a convergent light,
A reflecting mirror is provided at the convergence point of the converging light, and the reflecting mirror andSaidSecond,
ThirdFocusing meansAnd make up the cat's eye
And thatIs what you do. In addition, the measurement according to the present invention
The long interferometer isThe split optical element and the second and thirdCollection
Light meansWith two hemispherical lenses whose focal length is equal to their diameter
Is replaced with a spherically formed optical element via a polarizing film.
Is characterized byare doing.
【0010】[0010]
【作用】以上の通り、収束光を分割光学素子に対し斜め
から入射せしめ、収束した光束が最も集中している部分
に分割光学素子を用いることになるので、ダブルパス型
干渉計において、測定光および参照光のそれぞれのビー
ム間隔は、分割光学素子の有効径によらず、任意に広く
設定できる。また分割光学素子より出射した測定光、参
照光のそれぞれは発散光であり、これを平行光にするレ
ンズは同時に平行光の収束位置に設けられた反射鏡とキ
ャッツアイを構成し、従ってコーナーキューブを用いな
くても光学系のアライメントが容易になる。As described above, the convergent light is obliquely incident on the splitting optical element, and the splitting optical element is used in the portion where the converged light flux is most concentrated. The beam interval between the reference beams can be set arbitrarily wide regardless of the effective diameter of the split optical element. Each of the measurement light and the reference light emitted from the splitting optical element is a divergent light, and the lens for converting the light into a parallel light constitutes a catseye and a reflecting mirror provided at the converging position of the parallel light at the same time. Alignment of the optical system is facilitated even without using.
【0011】[0011]
【実施例】以下図1に基づき本発明による測長用干渉計
の実施例を詳説する。図示しない光源からの直線偏光の
平行光束1は、レンズ2によって収束光となり、分割光
学素子(半透鏡でも分割光学素子でも良いがここでは偏
光プリズムを使用する)3に対して斜めに入射する。こ
こでレンズ2の焦点位置に偏光プリズム3の一方の端面
3aが位置するように配置する。光束の一方は偏光膜4
を透過し、レンズ5により平行光束となり、1/4波長
板6を通り円偏光となった後に可動反射鏡7で反射され
る。反射光は再び1/4波長板6を経て直線偏光に変換
されるが、この時、偏光面が90°回転されるので、今
度は偏光膜4で反射する。この光束は収束光であり、そ
の収束位置に偏光プリズム3の別の端面3bが位置する
ようにしてある。この端面3bに反射鏡8を蒸着等で形
成すれば、この反射鏡8で反射された光は再び偏光膜4
で反射し、レンズ5で平行光となり、1/4波長板6を
通り、可動反射鏡7へと向かう。ここでレンズ5と反射
鏡8はキャッツアイを構成することになる。可動反射鏡
7で反射した光束は、今度は偏光膜4を透過して、レン
ズ9で平行光10となり、図示しない干渉縞検出部へと
向かう。この平行光束10を測定光とする。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a length measuring interferometer according to the present invention will be described below in detail with reference to FIG. A parallel light beam 1 of linearly polarized light from a light source (not shown) is converged by a lens 2 and obliquely enters a split optical element (a semi-transmissive mirror or a split optical element, but a polarizing prism is used here) 3. Here, the polarizing prism 3 is disposed such that one end face 3 a of the polarizing prism 3 is located at the focal position of the lens 2. One of the light beams is a polarizing film 4
Is transmitted by the lens 5, becomes a parallel light beam by the lens 5, passes through the 波長 wavelength plate 6, becomes circularly polarized light, and is reflected by the movable reflecting mirror 7. The reflected light is again converted into linearly polarized light via the quarter-wave plate 6, but at this time, since the polarization plane is rotated by 90 °, the reflected light is reflected by the polarizing film 4. This light beam is convergent light, and another end face 3b of the polarizing prism 3 is located at the converging position. If the reflecting mirror 8 is formed on the end face 3b by vapor deposition or the like, the light reflected by the reflecting mirror 8 is again reflected on the polarizing film 4.
, And becomes parallel light at the lens 5, passes through the 波長 wavelength plate 6, and travels to the movable reflecting mirror 7. Here, the lens 5 and the reflecting mirror 8 constitute a cat's eye. The light beam reflected by the movable reflecting mirror 7 passes through the polarizing film 4 and becomes a parallel light 10 by a lens 9, and travels to an interference fringe detecting unit (not shown). This parallel light flux 10 is used as measurement light.
【0012】一方、レンズ2から入射し偏光膜4で反射
した方の光束1はレンズ11で平行光になり、1/4波
長板12を経て、固定された参照鏡13で反射し、偏光
膜4を透過して偏光プリズム3の端面に形成された反射
鏡8に焦点を結ぶ。反射鏡8で反射された光は偏光膜4
を透過して、再びレンズ11、1/4波長板12を通
り、参照鏡13で反射する。ここでレンズ5と反射鏡8
の場合と同様に、レンズ11と反射鏡8はキャッツアイ
を構成している。参照鏡13での反射光は偏光膜4で反
射して、レンズ9で平行になる。この平行光束を参照光
とすると前述の測定光と干渉し、干渉縞検出部において
干渉縞が検出できる。On the other hand, the light beam 1 incident from the lens 2 and reflected by the polarizing film 4 becomes parallel light by the lens 11, passes through the quarter-wave plate 12, is reflected by the fixed reference mirror 13, and is reflected by the polarizing film. Then, the light passes through the mirror 4 and is focused on the reflecting mirror 8 formed on the end face of the polarizing prism 3. The light reflected by the reflecting mirror 8 is applied to the polarizing film 4.
Through the lens 11, the quarter-wave plate 12, and reflected by the reference mirror 13. Here, the lens 5 and the reflecting mirror 8
As in the case of (1), the lens 11 and the reflecting mirror 8 constitute a cat's eye. Light reflected by the reference mirror 13 is reflected by the polarizing film 4 and becomes parallel by the lens 9. When this parallel light beam is used as the reference light, it interferes with the above-described measurement light, and the interference fringe detecting unit can detect the interference fringe.
【0013】図2は、本発明の第2の実施例を示すもの
であり、図1における2個のレンズ2、9の代わりに1
個のレンズ14を使用したものであり、この場合レンズ
枚数が削減できる。FIG. 2 shows a second embodiment of the present invention. In place of the two lenses 2 and 9 in FIG.
In this case, the number of lenses 14 is used. In this case, the number of lenses can be reduced.
【0014】図3は、本発明の第3の実施例を示すもの
であり、図1における反射鏡8の位置を偏光プリズム3
の端面3bから離し、反射鏡15としたものである。こ
の場合、反射鏡15の反射面と偏光プリズム3の偏光膜
4との間隔が長くなるので、光束が偏光膜4に入射する
角度を小さくできる。FIG. 3 shows a third embodiment of the present invention, in which the position of the reflecting mirror 8 in FIG.
End faces away from the 3 b of, it is obtained by a reflecting mirror 15. In this case, since the distance between the reflecting surface of the reflecting mirror 15 and the polarizing film 4 of the polarizing prism 3 is increased, the angle at which the light beam enters the polarizing film 4 can be reduced.
【0015】更に、図4は、本発明の第4の実施例を示
すものであり、偏光プリズム3に換えて半球レンズ16
a、16bを使用したものである。図において、前記半
球レンズ16a、16bは、偏光膜17を介して球状に
形成されており、かつそれぞれの焦点距離は半球の直径
と同じになっている。また、半球レンズ16bの外周に
凹面状の反射鏡18が備えられている。従って、この半
球レンズ16a、16bが、第1の実施例における偏光
プリズム3、レンズ5、11の機能を果たすことにな
り、これら光学素子を省略し得、コンパクトな干渉計を
提供することができる。そのうえ、2枚の半球レンズ1
6a、16bを回転自在に構成しておき、偏光膜4に入
射する光束の角度を変えられるようにしておけば、移動
鏡7、参照鏡13に光束が垂直に入射するよう調整する
のが極めて容易となり、光学的アライメントも簡単とな
る。FIG. 4 shows a fourth embodiment of the present invention.
a and 16b. In the figure, the hemispherical lenses 16a and 16b are formed in a spherical shape via a polarizing film 17, and their respective focal lengths are equal to the diameter of the hemisphere. Further, a concave reflecting mirror 18 is provided on the outer periphery of the hemispherical lens 16b. Therefore, the hemispherical lenses 16a and 16b fulfill the functions of the polarizing prism 3 and the lenses 5 and 11 in the first embodiment, and these optical elements can be omitted, and a compact interferometer can be provided. . Besides, two hemispherical lenses 1
If the light beams 6a and 16b are configured to be rotatable so that the angle of the light beam incident on the polarizing film 4 can be changed, it is extremely necessary to adjust the light beam to enter the movable mirror 7 and the reference mirror 13 vertically. This facilitates optical alignment.
【0016】図5は、第4の実施例の変形例である。即
ち、第4の実施例においては、光束は偏光膜17の上下
を通っているが、この実施例では光束が偏光膜17に入
射する角度が上下で異なるので、偏光膜17で分割され
る光強度の割合が異なることになる。そこで、図5のよ
うに入射する光束が偏光膜17の左右を通るようにした
ことで、入射する光束の角度を同じにできると云う利点
がある。FIG. 5 shows a modification of the fourth embodiment. That is, in the fourth embodiment, the light beam passes above and below the polarizing film 17, but in this embodiment, the angle at which the light beam enters the polarizing film 17 differs between the upper and lower directions. The percentage of intensity will be different. Therefore, as shown in FIG. 5, there is an advantage that the angle of the incident light beam can be made the same by making the incident light beam pass right and left of the polarizing film 17.
【0017】[0017]
【発明の効果】本発明によれば、収束光を測長用干渉計
に対して斜めに入射せしめるようにしたので、偏光プリ
ズム等の分割光学素子を小さくすることができると共
に、コーナーキューブを用いなくても光学的アライメン
トが容易になる。また、測定光、参照光のそれぞれのビ
ーム間隔はプリズムの有効径によらず任意に広く設定で
きると云う新規の効果が期待され、コンパクトで低コス
トのダブルパス型の測長用干渉計を提供できる。According to the present invention, the convergent light is made to be obliquely incident on the length measuring interferometer, so that the size of the splitting optical element such as the polarizing prism can be reduced and the corner cube is used. Even without this, optical alignment becomes easy. In addition, a new effect is expected in that the beam intervals of the measurement light and the reference light can be arbitrarily set irrespective of the effective diameter of the prism, and a compact and low-cost double-path type interferometer for length measurement can be provided. .
【図1】本発明による測長用干渉計の第1の実施例を示
す概略構成図である。FIG. 1 is a schematic configuration diagram showing a first embodiment of a length measuring interferometer according to the present invention.
【図2】本発明による測長用干渉計の第2の実施例を示
す概略構成図である。FIG. 2 is a schematic configuration diagram showing a second embodiment of the length measuring interferometer according to the present invention.
【図3】本発明による測長用干渉計の第3の実施例を示
す概略構成図である。FIG. 3 is a schematic configuration diagram showing a third embodiment of the length measuring interferometer according to the present invention.
【図4】本発明による測長用干渉計の第4の実施例を示
す概略構成図である。FIG. 4 is a schematic configuration diagram showing a fourth embodiment of the length measuring interferometer according to the present invention.
【図5】第4の実施例の変形例を示す概略構成図であ
る。FIG. 5 is a schematic configuration diagram showing a modification of the fourth embodiment.
【図6】測長用干渉計の従来例を示す概略構成図であ
る。FIG. 6 is a schematic configuration diagram showing a conventional example of a length measuring interferometer.
1 光源からの平行光 2 レンズ 3 分割光学素子(偏光プリズム) 4 偏光膜 5 レンズ 6 1/4波長板 7 移動鏡 8 反射鏡 9 レンズ 10 平行光 11 レンズ 12 1/4波長板 13 参照鏡 14 レンズ 15 反射鏡 16a 半球レンズ 16b 半球レンズ 17 偏光膜 18 反射鏡 19 コーナーキューブ REFERENCE SIGNS LIST 1 parallel light from light source 2 lens 3 split optical element (polarizing prism) 4 polarizing film 5 lens 6 1/4 wavelength plate 7 moving mirror 8 reflecting mirror 9 lens 10 parallel light 11 lens 12 1/4 wavelength plate 13 reference mirror 14 Lens 15 Reflecting mirror 16a Hemispherical lens 16b Hemispherical lens 17 Polarizing film 18 Reflecting mirror 19 Corner cube
フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01B 9/00 - 11/30 102 Continuation of front page (58) Field surveyed (Int.Cl. 7 , DB name) G01B 9/00-11/30 102
Claims (2)
して入射せしめる第1の集光手段と、前記 分割光学素子にて分割された透過及び反射した発散
光をそれぞれ平行光束にする第2、第3の集光手段と、 該第2、第3の集光手段の後方に配置された1/4波長
板と、 該1/4波長板を出射した平行光束の光軸に対し垂直に
位置する固定及び可動の反射鏡と、 該反射鏡により反射した平行光束を再び、前記1/4波
長板、前記第2、第3の集光手段を通過せしめて収束光
とし、該収束光の収束点に反射鏡を設け、該反射鏡と前
記第2、第3の集光手段とにより夫々キャッツアイを構
成せしめたことを特徴とする測長用干渉計。1. A a first condensing means allowed to obliquely incident to splitting optical element condenses the parallel light beam to the respective parallel light beams divided transmitted and reflected divergent light by the splitting optical element second, a third condensing means, the second, and a quarter-wave plate disposed behind the third focusing means, the optical axis of the parallel light beam emitted the quarter-wave plate and the fixed and movable reflectors located vertically again collimated light flux reflected by the reflecting mirror, the quarter-wave plate, and the second, convergent light passed through the third condensing means, said convergence a reflecting mirror provided on the converging point of light, the reflecting mirror and front
A cath's eye is constituted by the second and third condensing means , respectively.
光手段を、焦点距離がその直径と等しい半球レンズ2枚
を偏光膜を介して球状に形成してなる光学素子と置換し
てなることを特徴とする、請求項1に記載の測長用干渉
計。Wherein said splitting optical element and the second, third condensing
Light means, characterized by being replaced with an optical element obtained by forming a spherical two hemispheres focal length equal to its diameter lens through the polarizing film, the interference length measuring according to claim 1 Total.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3241766A JP3003964B2 (en) | 1991-09-20 | 1991-09-20 | Measurement interferometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3241766A JP3003964B2 (en) | 1991-09-20 | 1991-09-20 | Measurement interferometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0579816A JPH0579816A (en) | 1993-03-30 |
| JP3003964B2 true JP3003964B2 (en) | 2000-01-31 |
Family
ID=17079213
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3241766A Expired - Fee Related JP3003964B2 (en) | 1991-09-20 | 1991-09-20 | Measurement interferometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3003964B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002333311A (en) * | 2001-05-10 | 2002-11-22 | Matsushita Electric Ind Co Ltd | Shape measuring device and method |
| JP4514209B2 (en) * | 2004-10-15 | 2010-07-28 | キヤノン株式会社 | Position detection apparatus and method |
| GB0713982D0 (en) * | 2007-07-18 | 2007-08-29 | Univ Birmingham | Improved interferometer |
-
1991
- 1991-09-20 JP JP3241766A patent/JP3003964B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0579816A (en) | 1993-03-30 |
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