JP3019503B2 - Manufacturing method of printed wiring board - Google Patents
Manufacturing method of printed wiring boardInfo
- Publication number
- JP3019503B2 JP3019503B2 JP3193907A JP19390791A JP3019503B2 JP 3019503 B2 JP3019503 B2 JP 3019503B2 JP 3193907 A JP3193907 A JP 3193907A JP 19390791 A JP19390791 A JP 19390791A JP 3019503 B2 JP3019503 B2 JP 3019503B2
- Authority
- JP
- Japan
- Prior art keywords
- photosensitive
- mask film
- printed wiring
- wiring board
- solder resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、パーソナルコンピュー
タやワードプロセッサなどの各種電子機器に使用される
プリント配線板の製造方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a printed wiring board used for various electronic devices such as a personal computer and a word processor.
【0002】[0002]
【従来の技術】近年、各種電子機器に数多く使用されて
いるプリント配線板は、電子機器の小型・軽量化や多機
能化に伴い、配線の高密度化や電子部品の表面実装化が
著しく、絶縁基板上に形成される導体パターンや電子部
品が実装されるランドはますます狭ピッチ、細線化や小
形状化し、はんだ不要部分のはんだ付着の防止、導体パ
ターンの酸化に対する保護、絶縁性の維持やはんだ付け
性の向上などの目的でプリント配線板上に形成されるソ
ルダレジストやロードマップも高解像度、高位置精度が
要求されるようなり、その形成方法もスクリーン印刷法
からマスクフィルムによる写真現像法に代わりつつあ
る。2. Description of the Related Art In recent years, printed wiring boards, which are widely used in various electronic devices, are becoming increasingly compact and lightweight, and have become more and more multifunctional. The lands on which conductive patterns and electronic components are formed on insulating substrates are becoming increasingly narrower, thinner and smaller, preventing solder from sticking to unnecessary parts, protecting the conductive patterns from oxidation, and maintaining insulation. Resists and roadmaps formed on printed wiring boards for the purpose of improving solderability and solderability are also required to have high resolution and high positional accuracy, and the formation method has changed from screen printing to photo development using mask films. It is replacing the law.
【0003】以下に、従来のプリント配線板について説
明する。図3は従来のプリント配線板の写真現像法によ
るソルダレジストおよびロードマップ形成の製造過程を
示すものである。Hereinafter, a conventional printed wiring board will be described. FIG. 3 shows a conventional manufacturing process for forming a solder resist and a road map by a photo-developing method on a printed wiring board.
【0004】図3において、1は絶縁基板、2は導体パ
ターン、3aは感光性ソルダレジストインキ、3bはソ
ルダレジスト、4はソルダレジスト形成用マスクフィル
ム、5aは感光性ロードマップインキ、5bはロードマ
ップ、6はロードマップ形成用マスクフィルムである。In FIG. 3, reference numeral 1 denotes an insulating substrate, 2 denotes a conductor pattern, 3a denotes a photosensitive solder resist ink, 3b denotes a solder resist, 4 denotes a mask film for forming a solder resist, 5a denotes a photosensitive roadmap ink, and 5b denotes a load. Reference numeral 6 denotes a road map forming mask film.
【0005】以上のように構成されたプリント配線板の
ソルダレジストおよびロードマップの形成について、以
下に説明する。[0005] The formation of the solder resist and the road map of the printed wiring board configured as described above will be described below.
【0006】まず、所定の大きさに切断された銅張積層
板(図示せず)にスクリーン印刷法や写真現像法法など
によりエッチングレジストを形成した後、塩化第2銅な
どの溶液を用いてエッチングを行い、導体パターン2を
形成し、エッチングレジストを剥離する。First, an etching resist is formed on a copper-clad laminate (not shown) cut to a predetermined size by a screen printing method, a photo-developing method, or the like, and then using a solution such as cupric chloride. The conductor pattern 2 is formed by etching, and the etching resist is removed.
【0007】図3(a)に示すように、絶縁基板1上に
導体パターン2が形成されたプリント配線板に感光性ソ
ルダレジストインキ3aを塗布し、熱風などにより指触
乾燥を行う。As shown in FIG. 3A, a photosensitive solder resist ink 3a is applied to a printed wiring board having a conductor pattern 2 formed on an insulating substrate 1, and touch drying is performed by hot air or the like.
【0008】次に、図3(b)に示すように、ソルダレ
ジスト形成用マスクフィルム4を指触乾燥された感光性
ソルダレジストインキ3a面に密着させ、紫外線露光し
たのち、図3(c)のように、未露光部分を所定の現像
液で現像・除去し、ソルダレジスト3bを形成する。そ
の後、図3(d)に示すように、感光性ロードマップイ
ンキ5aをソルダレジスト3b上にロードマップ5b形
成に必要な部分よりやや大きな範囲に塗布し、同様に指
触乾燥を行い、図3(e)に示すように、ロードマップ
形成用マスクフィルム6を指触乾燥した感光性ロードマ
ップインキ5a面に密着させ、紫外線露光したのち、図
3(f)のように、未露光部を所定の現像液で現像・除
去する。Next, as shown in FIG. 3 (b), the mask film 4 for forming a solder resist is brought into close contact with the surface of the photosensitive solder resist ink 3a which has been dried by touch, and after being exposed to ultraviolet light, FIG. 3 (c). Then, the unexposed portion is developed and removed with a predetermined developing solution to form a solder resist 3b. Thereafter, as shown in FIG. 3 (d), a photosensitive roadmap ink 5a is applied on the solder resist 3b to a slightly larger area than that required for forming the roadmap 5b, and the touch drying is performed similarly. As shown in FIG. 3E, the mask film 6 for forming a road map is brought into close contact with the surface of the photosensitive road map ink 5a which has been dried by touch, and is exposed to ultraviolet rays. Then, as shown in FIG. Develop and remove with developer.
【0009】その後、絶縁基板や導体パターンへの接着
性や硬度などを向上させるため熱風などで再度処理し、
ソルダレジスト3bとロードマップ5bをプリント配線
板上に形成する。[0009] After that, it is treated again with hot air or the like to improve the adhesion and hardness to the insulating substrate and the conductor pattern.
A solder resist 3b and a road map 5b are formed on a printed wiring board.
【0010】[0010]
【発明が解決しようとする課題】しかしながら、上記従
来の構成では、プリント配線板上に形成されたソルダレ
ジスト3bおよびロードマップ5bは高解像性を有する
ものの、感光性ソルダレジストインキ3aの塗布、指触
乾燥、ソルダレジスト形成用マスクフィルム4の位置合
わせ、露光、現像、そして感光性ロードマップインキ5
aの塗布、指触乾燥、ロードマップ形成用マスクフィル
ム6の位置合わせ、露光、現像と製造工程が煩雑で長時
間を有するため量産性に乏しく、またソルダレジスト3
bとロードマップ5bの形成工程が別となるため形成さ
れたソルダレジスト3bとロードマップ5bの相対位置
精度の維持が困難である。However, in the above-described conventional configuration, although the solder resist 3b and the road map 5b formed on the printed wiring board have high resolution, the application of the photosensitive solder resist ink 3a is difficult. Touch drying, alignment of mask film 4 for solder resist formation, exposure, development, and photosensitive roadmap ink 5
a) coating, touch drying, positioning of the mask film 6 for forming a road map, exposure, development, and the manufacturing process are complicated and have a long time.
Therefore, it is difficult to maintain the relative positional accuracy between the formed solder resist 3b and the road map 5b because the steps of forming the road map 5b and the road map 5b are different.
【0011】さらに、現像・形成後の表面に凹凸を有す
るソルダレジスト3b上に感光性ロードマップインキ5
aの塗布を行うため塗布された感光性ロードマップイン
キ5aとソルダレジスト3b表面、絶縁基板1や導体パ
ターン2表面との間が凹凸状態になる。このため露光時
のロードマップ形成用マスクフィルム6と十分な密着状
態が保持できず、マスクフィルム遮閉部分での紫外線の
回折現象を招き、現像・形成後のロードマップ5b形状
が設計状態であるマスクフィルムの形状を再現せず、著
しい場合は文字・記号などの判読ができず、ロードマッ
プ形成工程におけるプリント配線板製造の歩止りを悪化
させるという問題点を有していた。Further, a photosensitive roadmap ink 5 is formed on the solder resist 3b having the uneven surface after development and formation.
As a result, the photosensitive roadmap ink 5a and the surface of the solder resist 3b, the surface of the insulating substrate 1 and the surface of the conductive pattern 2 are unevenly formed. For this reason, a sufficient adhesion state with the road map forming mask film 6 at the time of exposure cannot be maintained, which causes a diffraction phenomenon of ultraviolet rays at the mask film shielding portion, and the shape of the road map 5b after development and formation is in a designed state. If the shape of the mask film is not reproduced, characters and symbols cannot be read when the shape is remarkable, and the yield of printed wiring board production in the road map forming process is deteriorated.
【0012】本発明は上記従来の問題点を解決するもの
で、感光性ソルダレジストインキおよび感光性ロードマ
ップインキでのソルダレジストおよびロードマップ形成
工程におけるプリント配線板製造歩留りと生産性を著し
く向上させ、ソルダレジストとロードマップの相対位置
精度や形状の再現性の優れたプリント配線板を提供する
ことを目的とする。The present invention solves the above-mentioned conventional problems, and significantly improves the production yield and productivity of a printed wiring board in a step of forming a solder resist and a road map using a photosensitive solder resist ink and a photosensitive road map ink. It is an object of the present invention to provide a printed wiring board excellent in relative positional accuracy between a solder resist and a road map and reproducibility of a shape.
【0013】[0013]
【課題を解決するための手段】この目的を達成するため
に本発明は、プリント配線板の導体パターンを形成する
工程と、プリント配線板上に高感度の感光性インキを塗
布、乾燥して第1の感光層を形成する工程と、この第1
の感光層上に感光性インキと同じ主成分で色調が異なり
かつ低感度の感光性のインキを塗布、乾燥して第2の感
光層を形成する工程と、第1、第2の感光層を所望の形
状で写真濃度差をつけたマスクフィルムで露光し、現像
することによりソルダレジストとロードマップを同時に
形成する工程とを有している。In order to achieve this object, the present invention comprises a step of forming a conductive pattern on a printed wiring board, and a step of applying a high-sensitivity photosensitive ink on the printed wiring board and drying the ink. Forming a first photosensitive layer;
Forming a second photosensitive layer by applying a photosensitive ink having the same main component as the photosensitive ink but having a different color tone and a low sensitivity on the photosensitive layer, followed by drying to form the first and second photosensitive layers. Forming a solder resist and a road map at the same time by exposing and developing with a mask film having a desired density and a photographic density difference.
【0014】[0014]
【作用】この構成によって、感光性ソルダレジストイン
キの塗布、指触乾燥、ソルダレジスト形成用マスクフィ
ルムの位置合わせ、露光、現像工程を省略することが可
能となり、また第1の感光性インキの塗布、指触乾燥、
第2の感光性インキの塗布、指触乾燥後、同時に1枚の
マスクフィルムで紫外線露光・現像するため、ソルダレ
ジストとロードマップとの位置関係を設計状態に維持す
ることができ、さらに、感光性ロードマップインキ塗布
後の感光性ロードマップインキと感光性ソルダレジスト
インキ、絶縁基板や導体パターン表面との間に著しい凹
凸状態の発生は抑制され、露光時のマスクフィルムとの
密着状態を保持することができ、マスクフィルム遮閉部
分での紫外線回折現象を招くこともほとんどなくなり、
現像・形成後のソルダレジストおよびロードマップ形状
はマスクフィルムの形状を精度よく再現することができ
る。With this structure, it is possible to omit the application of the photosensitive solder resist ink, the drying of the touch, the alignment of the mask film for forming the solder resist, the exposure and the development steps, and the application of the first photosensitive ink. , Touch dry,
After the application of the second photosensitive ink and the drying of the touch, it is possible to maintain the positional relationship between the solder resist and the roadmap in the designed state because the mask is exposed and developed with one mask film at the same time. The occurrence of significant unevenness between the photosensitive roadmap ink after application of the photosensitive roadmap ink and the photosensitive solder resist ink, the surface of the insulating substrate or conductor pattern is suppressed, and the close contact with the mask film during exposure is maintained. Can hardly cause the ultraviolet diffraction phenomenon in the mask film shielding part,
The shape of the solder resist and roadmap after development and formation can accurately reproduce the shape of the mask film.
【0015】[0015]
【実施例】(実施例1)以下本発明の一実施例につい
て、図面を参照しながら説明する。(Embodiment 1) An embodiment of the present invention will be described below with reference to the drawings.
【0016】図1(a)、(b)、(c)、(d)は、
本発明の第1の実施例におけるプリント配線板の製造過
程を示すものである。図1において、11は絶縁基板、
12は導体パターン、13は高感度の感光性インキ、1
4は低感度の感光性インキ、15はマスクフィルム、1
6はソルダレジスト、17はロードマップである。FIGS. 1 (a), (b), (c), (d)
FIG. 3 shows a process of manufacturing a printed wiring board according to the first embodiment of the present invention. In FIG. 1, 11 is an insulating substrate,
12 is a conductor pattern, 13 is a photosensitive ink of high sensitivity, 1
4 is a low-sensitivity photosensitive ink, 15 is a mask film, 1
6 is a solder resist and 17 is a road map.
【0017】以上のように構成されたプリント配線板の
ソルダレジストおよびロードマップ形成について、説明
する。The formation of the solder resist and the road map of the printed wiring board configured as described above will be described.
【0018】まず、通常のプリント配線板の製造に用い
られるソルダレジストおよびロードマップ形成用マスク
フィルムを作成する。このソルダレジスト形成用マスク
フィルムはネガパターンを、ロードマップ形成用マスク
フィルムはポジパターンをそれぞれ準備する。First, a solder resist and a mask film for forming a road map, which are used for manufacturing a normal printed wiring board, are prepared. The mask film for forming a solder resist prepares a negative pattern, and the mask film for forming a road map prepares a positive pattern.
【0019】次に、ポリエステルフィルムに感光層の塗
布された未露光のフィルムにまず、ソルダレジスト形成
用マスクフィルムのネガパターンを密着させ、通常の露
光条件にて露光し、ついでロードマップ形成用マスクフ
ィルムのポジパターンを同位置に密着させ、通常の露光
量の約1/3〜1/5の条件で露光し、通常条件にて現
像を行い、写真濃度差を有するマスクフィルム15を得
る。Next, first, a negative pattern of a mask film for forming a solder resist is brought into close contact with an unexposed film in which a photosensitive layer is applied to a polyester film, and the film is exposed under ordinary exposure conditions. The positive pattern of the film is brought into close contact with the same position, exposed under the condition of about 1/3 to 1/5 of the normal exposure, and developed under the normal condition to obtain the mask film 15 having a photographic density difference.
【0020】その後、絶縁基板11上に導体パターン1
2を形成したプリント配線板上にアルカリ現像型の高感
度の感光性インキ13をスクリーン印刷、ロールコータ
やカーテンコータなどの手段を用いて塗布し、熱風循環
槽などで温度60〜85℃、時間15〜30分程度の条
件で指触乾燥を行う。Thereafter, the conductor pattern 1 is placed on the insulating substrate 11.
2 is applied on the printed wiring board formed with 2 by using screen printing, means such as a roll coater or a curtain coater, and the temperature is 60 to 85 [deg.] C. in a hot air circulation tank. Dry to the touch under conditions of about 15 to 30 minutes.
【0021】次に、図1(b)に示すように、低感度の
感光性インキ14を高感度の感光性インキ13と同様の
方法により低感度の感光性インキ上に塗布し、指触乾燥
を行い、その後、図1(c)に示すように、予め準備さ
れたマスクフィルム15を高感度の感光性インキ13面
に密着させ、露光量約900〜1100mJ/cm2 程度
の条件で紫外線露光する。ここで、紫外光線はマスクフ
ィルム作成時に露光量の多い部分、すなわちソルダレジ
スト形成部分では遮光され、低感度の感光性インキ14
は感光されず、高感度の感光性インキ13のみ感光し、
マスクフィルム作成時に露光量の少ないか、または未露
光部分すなわち、ロードマップ形成部分では低感度の感
光性インキ14および高感度の感光性インキ13のどち
らとも透過感光する。Next, as shown in FIG. 1 (b), the low-sensitivity photosensitive ink 14 is applied on the low-sensitivity photosensitive ink 13 in the same manner as the high-sensitivity photosensitive ink 13, and then dried by touch. Then, as shown in FIG. 1 (c), a mask film 15 prepared in advance is brought into close contact with the surface of the photosensitive ink 13 of high sensitivity, and is exposed to ultraviolet light under the condition of an exposure amount of about 900 to 1100 mJ / cm 2. I do. Here, the ultraviolet rays are shielded from light at a portion where the exposure amount is large at the time of forming the mask film, that is, at a portion where the solder resist is formed.
Is not exposed, only the photosensitive ink 13 of high sensitivity is exposed,
When the mask film is formed, the photosensitive film is exposed to light with both the low-sensitivity photosensitive ink 14 and the high-sensitivity photosensitive ink 13 in a portion having a small exposure amount or in an unexposed portion, that is, in a portion where the road map is formed.
【0022】ついで、図1(d)に示すように、炭酸ナ
トリウムを主成分とする現像液で低感度の感光性インキ
14および高感度の感光性インキ13の未露光部分を同
時に現像・除去する。その後、熱風循環槽などで温度1
30〜160℃、時間30〜60分程度の条件で最終の
乾燥・硬化を行って、絶縁基板11、導体パターン12
とソルダレジスト16やロードマップ17との密着性を
安定化させる。Then, as shown in FIG. 1 (d), the unexposed portions of the low-sensitivity photosensitive ink 14 and the high-sensitivity photosensitive ink 13 are simultaneously developed and removed with a developing solution containing sodium carbonate as a main component. . After that, the temperature is set to 1 in a hot air circulation tank, etc.
The final drying and curing are performed under the conditions of 30 to 160 ° C. and the time of about 30 to 60 minutes, and the insulating substrate 11 and the conductive pattern 12 are formed.
And the solder resist 16 and the road map 17 in close contact with each other.
【0023】以上のような本発明の実施例では、従来の
感光性ソルダレジストの未露光部分の現像・除去後に感
光性ロードマップを塗布する方法と比較して、ソルダレ
ジストおよびロードマップ形成工程の所要時間は約半減
となり、また形成後のソルダレジストとロードマップの
相対位置関係は従来方法で最大約0.15mmあったも
のが設計値通りと格段に改善されると同時に、形成後の
ソルダレジストおよびロードマップのマスクフィルムに
対する再現率は60〜100%が90〜100%と向上
することができる。In the embodiment of the present invention as described above, a solder resist and a road map forming step are compared with a conventional method of applying a photosensitive road map after developing and removing an unexposed portion of the photosensitive solder resist. The required time is reduced by about half, and the relative positional relationship between the formed solder resist and the road map is about 0.15 mm at the maximum by the conventional method. And the recall of the road map with respect to the mask film can be improved from 60 to 100% to 90 to 100%.
【0024】(実施例2)以下本発明の第2の実施例に
ついて図面を参照しながら説明する。図2は本発明の第
2の実施例を示すプリント配線板の製造過程の断面図で
ある。図2において、11は絶縁基板、12は導体パタ
ーン、13は高感度の感光性インキ、14は低感度の感
光性インキ、16はソルダレジスト、17はロードマッ
プで、以上は図1の構成と同様なものである。図1の構
成と異なるのは、マスクフィルム15の作成方法であ
り、通常のプリント配線板の製造に用いられるソルダレ
ジストおよびロードマップ形成用マスクフィルムを作成
し、ソルダレジスト形成用マスクフィルム、ロードマッ
プ形成用マスクフィルムにネガパターンを準備し、ポリ
エステルフィルムに感光層の塗布された未露光のフィル
ムに、まずソルダレジスト形成用マスクフィルムのネガ
パターンを密着させ、通常の露光条件にて露光し、つい
でロードマップ形成用マスクフィルムのネガパターンを
同位置に密着させ、通常の露光量の約1/3〜1/5の
条件で露光し、通常条件にて現像を行い、写真濃度差を
もたせた点である。(Embodiment 2) Hereinafter, a second embodiment of the present invention will be described with reference to the drawings. FIG. 2 is a cross-sectional view showing a process of manufacturing a printed wiring board according to a second embodiment of the present invention. In FIG. 2, reference numeral 11 denotes an insulating substrate, 12 denotes a conductor pattern, 13 denotes a high-sensitivity photosensitive ink, 14 denotes a low-sensitivity photosensitive ink, 16 denotes a solder resist, and 17 denotes a road map. It is similar. 1 is different from the configuration of FIG. 1 in a method of forming a mask film 15, in which a solder resist and a mask film for forming a road map used for manufacturing a normal printed wiring board are formed, and a mask film for forming a solder resist and a road map are formed. Prepare a negative pattern on the mask film for formation, first adhere the negative pattern of the mask film for solder resist formation to the unexposed film coated with the photosensitive layer on the polyester film, and expose under normal exposure conditions, A negative pattern of a mask film for forming a road map is brought into close contact with the same position, exposed under conditions of about 1/3 to 1/5 of a normal exposure, developed under normal conditions, and provided with a photographic density difference. It is.
【0025】上記のように構成されたプリント配線板の
ソルダレジストおよびロードマップ形成方法について説
明する。まず、図2(a)に示すように、実施例1と同
様の方法を用い、絶縁基板11上に導体パターン12を
形成したプリント配線板上にアルカリ現像型の高感度の
感光性インキ13をスクリーン印刷、ロールコータやカ
ーテンコータなどの手段を用いて塗布し、熱風循環槽な
どで温度60〜85℃、時間15〜30分程度の条件で
指触乾燥を行う。A method of forming a solder resist and a road map of the printed wiring board configured as described above will be described. First, as shown in FIG. 2A, using a method similar to that of the first embodiment, a highly sensitive photosensitive ink 13 of an alkali developing type is applied on a printed wiring board having a conductive pattern 12 formed on an insulating substrate 11. It is applied by means of screen printing, a roll coater, a curtain coater, or the like, and touch drying is performed in a hot air circulating tank or the like at a temperature of 60 to 85 ° C. for about 15 to 30 minutes.
【0026】次に、図2(b)に示すように、低感度の
感光性インキ14を高感度の感光性インキ13と同様の
方法で塗布し、指触乾燥を行う。その後、図2(c)に
示すように写真濃度差をつけたマスクフィルム15を用
いて、低感度の感光インキ14面に密着させ、露光量約
900〜1100 mJ/cm2 程度で高感度の感光性イン
キと低感度の感光性インキを同時に紫外線露光し、図2
(d)に示すように、炭酸ナトリウムを主成分とする現
像液で低感度の感光性インキ14および高感度の感光性
インキ13の未露光部を現像・除去する。その後、熱風
循環槽などで温度130〜160℃、時間30〜60分
程度の条件で最終の硬化を行い、絶縁基板11やソルダ
レジスト16やロードマップ17との密着性を安定化さ
せる。Next, as shown in FIG. 2B, a low-sensitivity photosensitive ink 14 is applied in the same manner as the high-sensitivity photosensitive ink 13, and touch drying is performed. Then, as shown in FIG. 2 (c), a low-sensitivity photosensitive ink 14 is brought into close contact with a mask film 15 having a photographic density difference, and a high-sensitivity light is exposed at an exposure amount of about 900 to 1100 mJ / cm 2. The photosensitive ink and the low-sensitivity photosensitive ink were simultaneously exposed to ultraviolet light, and FIG.
As shown in (d), the unexposed portions of the low-sensitivity photosensitive ink 14 and the high-sensitivity photosensitive ink 13 are developed and removed with a developer containing sodium carbonate as a main component. Thereafter, final curing is performed in a hot air circulation tank or the like at a temperature of 130 to 160 ° C. for a time of about 30 to 60 minutes to stabilize the adhesion with the insulating substrate 11, the solder resist 16, and the road map 17.
【0027】以上のようなにマスクフィルム15の作成
方法を上記のように替えることにより、プリント配線板
表面に高絶縁性を有し、被膜強度の優れた絶縁被膜の形
成ができる。By changing the method of forming the mask film 15 as described above as described above, it is possible to form an insulating film having high insulation properties and excellent film strength on the surface of the printed wiring board.
【0028】なお、本発明の実施例において、プリント
配線板の構造は片面プリント配線板としたが、両面や多
層プリント配線板であってもよく、また高感度の感光性
インキ13および低感光性インキ14はアルカリ現像型
としたが、溶剤現像型としてもよいことは言うまでもな
い。In the embodiments of the present invention, the structure of the printed wiring board is a single-sided printed wiring board, but it may be a double-sided or multilayer printed wiring board. Although the ink 14 is of the alkali development type, it goes without saying that the ink 14 may be of the solvent development type.
【0029】[0029]
【発明の効果】以上のように本発明は、感度の異なる同
じ主成分の2種類の感光性インキを用い、かつ写真濃度
差をつけた1枚のマスクフィルムで同時に紫外線露光・
現像することにより、ソルダレジストおよびロードマッ
プ形成工程におけるプリント配線板製造歩留りと生産性
を著しく向上させ、ソルダレジストとロードマップの相
対位置精度や形状の再現性の優れたプリント配線板を実
現できるものである。As described above, according to the present invention, two types of photosensitive inks having the same main component having different sensitivities are used, and a single mask film having a photographic density difference is used for simultaneous exposure to ultraviolet light.
By developing, the production yield and productivity of the printed wiring board in the solder resist and road map formation process are remarkably improved, and a printed wiring board excellent in the relative positional accuracy of the solder resist and the road map and in the reproducibility of the shape can be realized. It is.
【図1】(a)〜(d)は本発明の第1の実施例におけ
るプリント配線板の製造方法における要部工程の断面図FIGS. 1A to 1D are cross-sectional views of main steps in a method for manufacturing a printed wiring board according to a first embodiment of the present invention.
【図2】(a)〜(d)は本発明の第2の実施例におけ
るプリント配線板の製造方法における要部工程の断面図FIGS. 2A to 2D are cross-sectional views of main steps in a method for manufacturing a printed wiring board according to a second embodiment of the present invention.
【図3】(a)〜(f)は従来のプリント配線板の製造
方法における要部工程の断面図3 (a) to 3 (f) are cross-sectional views of main steps in a conventional method for manufacturing a printed wiring board.
11 絶縁基板 12 導体パターン 13 高感度の感光性インキ 14 低感度の感光性インキ 15 マスクフィルム 16 ソルダレジスト 17 ロードマップ Reference Signs List 11 Insulating substrate 12 Conductive pattern 13 High-sensitivity photosensitive ink 14 Low-sensitivity photosensitive ink 15 Mask film 16 Solder resist 17 Road map
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H05K 3/28 H05K 3/00 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H05K 3/28 H05K 3/00
Claims (2)
る工程と、上記プリント配線板上に高感度の感光性イン
キを塗布、乾燥して第1の感光層を形成する工程と、こ
の第1の感光層上に前記感光性インキと同じ主成分で色
調が異なりかつ低感度の感光性インキを塗布、乾燥して
第2の感光層を形成する工程と、上記第1、第2の感光
層を所望の形状で写真濃度差をつけたマスクフィルムで
露光・現像することによりソルダレジストとロードマッ
プを同時に形成する工程とを有するプリント配線板の製
造方法。A step of forming a conductive pattern on a printed wiring board; a step of applying a high-sensitivity photosensitive ink on the printed wiring board and drying to form a first photosensitive layer; A step of applying a photosensitive ink having the same main component as the photosensitive ink but having a different color tone and a low sensitivity on the photosensitive layer and drying to form a second photosensitive layer; and forming the first and second photosensitive layers. Forming a solder resist and a road map at the same time by exposing and developing with a mask film having a photographic density difference in a desired shape.
ンが描画されたソルダレジスト形成用マスクフィルムを
密着させ、適正露光量で露光し、前記ソルダレジスト形
成用マスクフィルム引き離し、次にポジパターンが描画
されたロードマップ形成用マスクフィルムを前記フィル
ムに密着させ、適正露光量の3/1〜1/5の露光量で
露光し、前記ロードマップ形成用マスクフィルムを引き
離した後、現像することにより作成したプリント配線板
の露光用マスクフィルム。 2. A film having a photosensitive layer and a negative pattern
Solder mask formation mask film
Closely contact and expose with the proper exposure amount, the solder resist type
Separate the mask film for formation, then draw a positive pattern
The filled roadmap forming mask film
At an exposure of 3/1 to 1/5 of the appropriate exposure.
Exposure and pull the mask film for roadmap formation
Printed wiring board created by developing after release
Exposure mask film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3193907A JP3019503B2 (en) | 1991-08-02 | 1991-08-02 | Manufacturing method of printed wiring board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3193907A JP3019503B2 (en) | 1991-08-02 | 1991-08-02 | Manufacturing method of printed wiring board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0537140A JPH0537140A (en) | 1993-02-12 |
| JP3019503B2 true JP3019503B2 (en) | 2000-03-13 |
Family
ID=16315728
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3193907A Expired - Fee Related JP3019503B2 (en) | 1991-08-02 | 1991-08-02 | Manufacturing method of printed wiring board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3019503B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101802046B1 (en) * | 2013-02-28 | 2017-11-27 | 토카이 신에이 일렉트로닉스 인더스트리 가부시키가이샤 | Substrate manufacturing method, substrate, and mask film |
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|---|---|---|---|---|
| JP5255545B2 (en) * | 2009-09-29 | 2013-08-07 | 三菱製紙株式会社 | Method for forming solder resist |
| JP2011119522A (en) * | 2009-12-04 | 2011-06-16 | Sharp Corp | Printed wiring board and manufacturing method of the same |
| KR101298103B1 (en) * | 2012-10-31 | 2013-08-20 | 홍석현 | Apparatus and method for manufacturing fine circuit pattern and fine circuit pattern manufactured thereby |
| WO2014156783A1 (en) | 2013-03-29 | 2014-10-02 | 日本ゼオン株式会社 | Fragrance composition and method for producing same |
| JP5639697B1 (en) * | 2013-08-08 | 2014-12-10 | 東海神栄電子工業株式会社 | Circuit board manufacturing method capable of visually recognizing identification characters / symbols and pictures |
| JP5643416B1 (en) * | 2013-12-24 | 2014-12-17 | 互応化学工業株式会社 | Manufacturing method of coated wiring board |
| JP6022110B1 (en) * | 2015-05-21 | 2016-11-09 | 株式会社メイコー | Printed wiring board and method for manufacturing printed wiring board |
| JP5973689B1 (en) * | 2015-05-21 | 2016-08-23 | 株式会社メイコー | Printed wiring board and method for manufacturing printed wiring board |
| WO2016185607A1 (en) * | 2015-05-21 | 2016-11-24 | 株式会社メイコー | Printed wiring board and production method for printed wiring board |
| CN119743905B (en) * | 2024-12-23 | 2025-10-28 | 广州添利电子科技有限公司 | Processing method for improving excessive side etching of solder resist of printed circuit board |
-
1991
- 1991-08-02 JP JP3193907A patent/JP3019503B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101802046B1 (en) * | 2013-02-28 | 2017-11-27 | 토카이 신에이 일렉트로닉스 인더스트리 가부시키가이샤 | Substrate manufacturing method, substrate, and mask film |
| US9857687B2 (en) | 2013-02-28 | 2018-01-02 | Tokai Shinei Electronics Inidustry Co., Ltd | Method of manufacturing substrate and substrate and mask film |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0537140A (en) | 1993-02-12 |
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