JP3030102B2 - Coating method - Google Patents
Coating methodInfo
- Publication number
- JP3030102B2 JP3030102B2 JP3037707A JP3770791A JP3030102B2 JP 3030102 B2 JP3030102 B2 JP 3030102B2 JP 3037707 A JP3037707 A JP 3037707A JP 3770791 A JP3770791 A JP 3770791A JP 3030102 B2 JP3030102 B2 JP 3030102B2
- Authority
- JP
- Japan
- Prior art keywords
- acid
- resin
- parts
- image
- visible light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000576 coating method Methods 0.000 title description 46
- 229920005989 resin Polymers 0.000 claims description 71
- 239000011347 resin Substances 0.000 claims description 71
- 239000000203 mixture Substances 0.000 claims description 44
- 238000005530 etching Methods 0.000 claims description 43
- 238000000034 method Methods 0.000 claims description 29
- 239000007788 liquid Substances 0.000 claims description 17
- 239000003505 polymerization initiator Substances 0.000 claims description 15
- 125000003010 ionic group Chemical group 0.000 claims description 7
- 239000002253 acid Substances 0.000 description 46
- 239000011248 coating agent Substances 0.000 description 41
- 238000004070 electrodeposition Methods 0.000 description 26
- -1 for example Polymers 0.000 description 23
- 229910052751 metal Inorganic materials 0.000 description 23
- 239000002184 metal Substances 0.000 description 23
- 239000000243 solution Substances 0.000 description 23
- 239000004925 Acrylic resin Substances 0.000 description 21
- 229920000178 Acrylic resin Polymers 0.000 description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 21
- 150000001875 compounds Chemical class 0.000 description 21
- 230000018109 developmental process Effects 0.000 description 20
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 19
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 16
- 239000007864 aqueous solution Substances 0.000 description 14
- 238000004519 manufacturing process Methods 0.000 description 13
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 12
- 229910052802 copper Inorganic materials 0.000 description 12
- 239000010949 copper Substances 0.000 description 12
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 12
- 229910052753 mercury Inorganic materials 0.000 description 12
- 239000002904 solvent Substances 0.000 description 12
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 11
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 10
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 10
- 239000000047 product Substances 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 9
- 239000011889 copper foil Substances 0.000 description 9
- 230000003472 neutralizing effect Effects 0.000 description 9
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 8
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 8
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 8
- 239000003822 epoxy resin Substances 0.000 description 8
- 229920000647 polyepoxide Polymers 0.000 description 8
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 7
- 239000003513 alkali Substances 0.000 description 7
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 7
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 6
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 6
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 6
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 6
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 6
- 125000000129 anionic group Chemical group 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 6
- 125000002091 cationic group Chemical group 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 239000004020 conductor Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 6
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 6
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 6
- 239000011259 mixed solution Substances 0.000 description 6
- 239000003921 oil Substances 0.000 description 6
- 235000019198 oils Nutrition 0.000 description 6
- 239000007787 solid Substances 0.000 description 6
- 235000021122 unsaturated fatty acids Nutrition 0.000 description 6
- 150000004670 unsaturated fatty acids Chemical class 0.000 description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 5
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 5
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 description 5
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 5
- 235000011114 ammonium hydroxide Nutrition 0.000 description 5
- 229960003280 cupric chloride Drugs 0.000 description 5
- 230000007547 defect Effects 0.000 description 5
- 239000003999 initiator Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- 125000001302 tertiary amino group Chemical group 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 239000004372 Polyvinyl alcohol Substances 0.000 description 4
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- 235000011054 acetic acid Nutrition 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 235000019270 ammonium chloride Nutrition 0.000 description 4
- 239000012298 atmosphere Substances 0.000 description 4
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 4
- 239000000975 dye Substances 0.000 description 4
- 150000004820 halides Chemical class 0.000 description 4
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N lactic acid Chemical compound CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 description 4
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 4
- 229910001507 metal halide Inorganic materials 0.000 description 4
- 150000005309 metal halides Chemical class 0.000 description 4
- 239000000178 monomer Substances 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 4
- 238000000059 patterning Methods 0.000 description 4
- 229920002451 polyvinyl alcohol Polymers 0.000 description 4
- 229910052724 xenon Inorganic materials 0.000 description 4
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 4
- WOGITNXCNOTRLK-VOTSOKGWSA-N (e)-3-phenylprop-2-enoyl chloride Chemical compound ClC(=O)\C=C\C1=CC=CC=C1 WOGITNXCNOTRLK-VOTSOKGWSA-N 0.000 description 3
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 3
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 3
- CDSULTPOCMWJCM-UHFFFAOYSA-N 4h-chromene-2,3-dione Chemical class C1=CC=C2OC(=O)C(=O)CC2=C1 CDSULTPOCMWJCM-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 3
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 3
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 3
- 206010034960 Photophobia Diseases 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 150000008064 anhydrides Chemical class 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 238000007664 blowing Methods 0.000 description 3
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 3
- 239000007795 chemical reaction product Substances 0.000 description 3
- 238000004040 coloring Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- UAOMVDZJSHZZME-UHFFFAOYSA-N diisopropylamine Chemical compound CC(C)NC(C)C UAOMVDZJSHZZME-UHFFFAOYSA-N 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 235000019253 formic acid Nutrition 0.000 description 3
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 3
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 3
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 3
- 208000013469 light sensitivity Diseases 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 150000002762 monocarboxylic acid derivatives Chemical class 0.000 description 3
- 239000003973 paint Substances 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 150000007519 polyprotic acids Polymers 0.000 description 3
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 229910000029 sodium carbonate Inorganic materials 0.000 description 3
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 3
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 3
- WBYWAXJHAXSJNI-VOTSOKGWSA-M .beta-Phenylacrylic acid Natural products [O-]C(=O)\C=C\C1=CC=CC=C1 WBYWAXJHAXSJNI-VOTSOKGWSA-M 0.000 description 2
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 2
- RBGUKBSLNOTVCD-UHFFFAOYSA-N 1-methylanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2C RBGUKBSLNOTVCD-UHFFFAOYSA-N 0.000 description 2
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 2
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 2
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 description 2
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Chemical compound CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 2
- GUUVPOWQJOLRAS-UHFFFAOYSA-N Diphenyl disulfide Chemical compound C=1C=CC=CC=1SSC1=CC=CC=C1 GUUVPOWQJOLRAS-UHFFFAOYSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- 239000004606 Fillers/Extenders Substances 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- DKGAVHZHDRPRBM-UHFFFAOYSA-N Tert-Butanol Chemical compound CC(C)(C)O DKGAVHZHDRPRBM-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 229920000180 alkyd Polymers 0.000 description 2
- XXROGKLTLUQVRX-UHFFFAOYSA-N allyl alcohol Chemical compound OCC=C XXROGKLTLUQVRX-UHFFFAOYSA-N 0.000 description 2
- 125000003277 amino group Chemical group 0.000 description 2
- YZXBAPSDXZZRGB-DOFZRALJSA-N arachidonic acid Chemical compound CCCCC\C=C/C\C=C/C\C=C/C\C=C/CCCC(O)=O YZXBAPSDXZZRGB-DOFZRALJSA-N 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- 229930016911 cinnamic acid Natural products 0.000 description 2
- 235000013985 cinnamic acid Nutrition 0.000 description 2
- 150000001893 coumarin derivatives Chemical class 0.000 description 2
- PAFZNILMFXTMIY-UHFFFAOYSA-N cyclohexylamine Chemical compound NC1CCCCC1 PAFZNILMFXTMIY-UHFFFAOYSA-N 0.000 description 2
- PESYEWKSBIWTAK-UHFFFAOYSA-N cyclopenta-1,3-diene;titanium(2+) Chemical class [Ti+2].C=1C=C[CH-]C=1.C=1C=C[CH-]C=1 PESYEWKSBIWTAK-UHFFFAOYSA-N 0.000 description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N cyclopentadiene Chemical compound C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 description 2
- 125000005442 diisocyanate group Chemical group 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 239000001530 fumaric acid Substances 0.000 description 2
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 2
- 230000002209 hydrophobic effect Effects 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- QQVIHTHCMHWDBS-UHFFFAOYSA-N isophthalic acid Chemical compound OC(=O)C1=CC=CC(C(O)=O)=C1 QQVIHTHCMHWDBS-UHFFFAOYSA-N 0.000 description 2
- 239000004310 lactic acid Substances 0.000 description 2
- 235000014655 lactic acid Nutrition 0.000 description 2
- DZVCFNFOPIZQKX-LTHRDKTGSA-M merocyanine Chemical compound [Na+].O=C1N(CCCC)C(=O)N(CCCC)C(=O)C1=C\C=C\C=C/1N(CCCS([O-])(=O)=O)C2=CC=CC=C2O\1 DZVCFNFOPIZQKX-LTHRDKTGSA-M 0.000 description 2
- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 2
- NWVVVBRKAWDGAB-UHFFFAOYSA-N p-methoxyphenol Chemical compound COC1=CC=C(O)C=C1 NWVVVBRKAWDGAB-UHFFFAOYSA-N 0.000 description 2
- 239000003504 photosensitizing agent Substances 0.000 description 2
- 239000000049 pigment Substances 0.000 description 2
- 229920001225 polyester resin Polymers 0.000 description 2
- 239000004645 polyester resin Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- CYIDZMCFTVVTJO-UHFFFAOYSA-N pyromellitic acid Chemical compound OC(=O)C1=CC(C(O)=O)=C(C(O)=O)C=C1C(O)=O CYIDZMCFTVVTJO-UHFFFAOYSA-N 0.000 description 2
- 239000000376 reactant Substances 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- CXMXRPHRNRROMY-UHFFFAOYSA-N sebacic acid Chemical compound OC(=O)CCCCCCCCC(O)=O CXMXRPHRNRROMY-UHFFFAOYSA-N 0.000 description 2
- 150000005846 sugar alcohols Polymers 0.000 description 2
- 230000008961 swelling Effects 0.000 description 2
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- PUPZLCDOIYMWBV-UHFFFAOYSA-N (+/-)-1,3-Butanediol Chemical compound CC(O)CCO PUPZLCDOIYMWBV-UHFFFAOYSA-N 0.000 description 1
- KMOUUZVZFBCRAM-OLQVQODUSA-N (3as,7ar)-3a,4,7,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C=CC[C@@H]2C(=O)OC(=O)[C@@H]21 KMOUUZVZFBCRAM-OLQVQODUSA-N 0.000 description 1
- PVPBBTJXIKFICP-UHFFFAOYSA-N (7-aminophenothiazin-3-ylidene)azanium;chloride Chemical compound [Cl-].C1=CC(=[NH2+])C=C2SC3=CC(N)=CC=C3N=C21 PVPBBTJXIKFICP-UHFFFAOYSA-N 0.000 description 1
- OYHQOLUKZRVURQ-NTGFUMLPSA-N (9Z,12Z)-9,10,12,13-tetratritiooctadeca-9,12-dienoic acid Chemical compound C(CCCCCCC\C(=C(/C\C(=C(/CCCCC)\[3H])\[3H])\[3H])\[3H])(=O)O OYHQOLUKZRVURQ-NTGFUMLPSA-N 0.000 description 1
- WRIDQFICGBMAFQ-UHFFFAOYSA-N (E)-8-Octadecenoic acid Natural products CCCCCCCCCC=CCCCCCCC(O)=O WRIDQFICGBMAFQ-UHFFFAOYSA-N 0.000 description 1
- CGOJOQBYEAVATL-QPJJXVBHSA-N (e)-3-(4-methoxyphenyl)prop-2-enoyl chloride Chemical compound COC1=CC=C(\C=C\C(Cl)=O)C=C1 CGOJOQBYEAVATL-QPJJXVBHSA-N 0.000 description 1
- FKTHNVSLHLHISI-UHFFFAOYSA-N 1,2-bis(isocyanatomethyl)benzene Chemical compound O=C=NCC1=CC=CC=C1CN=C=O FKTHNVSLHLHISI-UHFFFAOYSA-N 0.000 description 1
- YHMYGUUIMTVXNW-UHFFFAOYSA-N 1,3-dihydrobenzimidazole-2-thione Chemical compound C1=CC=C2NC(S)=NC2=C1 YHMYGUUIMTVXNW-UHFFFAOYSA-N 0.000 description 1
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- DTOSIQBPPRVQHS-PDBXOOCHSA-N alpha-linolenic acid Chemical compound CC\C=C/C\C=C/C\C=C/CCCCCCCC(O)=O DTOSIQBPPRVQHS-PDBXOOCHSA-N 0.000 description 1
- 235000020661 alpha-linolenic acid Nutrition 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- PYKYMHQGRFAEBM-UHFFFAOYSA-N anthraquinone Natural products CCC(=O)c1c(O)c2C(=O)C3C(C=CC=C3O)C(=O)c2cc1CC(=O)OC PYKYMHQGRFAEBM-UHFFFAOYSA-N 0.000 description 1
- 150000004056 anthraquinones Chemical class 0.000 description 1
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- 150000008365 aromatic ketones Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
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- 229910052759 nickel Inorganic materials 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
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- 235000021313 oleic acid Nutrition 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 150000001451 organic peroxides Chemical class 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- RPQRDASANLAFCM-UHFFFAOYSA-N oxiran-2-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1CO1 RPQRDASANLAFCM-UHFFFAOYSA-N 0.000 description 1
- 125000005740 oxycarbonyl group Chemical group [*:1]OC([*:2])=O 0.000 description 1
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- 229910052760 oxygen Inorganic materials 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 239000003208 petroleum Substances 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
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- 239000005033 polyvinylidene chloride Substances 0.000 description 1
- 235000011118 potassium hydroxide Nutrition 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
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- 238000004080 punching Methods 0.000 description 1
- 239000012264 purified product Substances 0.000 description 1
- WBHHMMIMDMUBKC-XLNAKTSKSA-N ricinelaidic acid Chemical compound CCCCCC[C@@H](O)C\C=C\CCCCCCCC(O)=O WBHHMMIMDMUBKC-XLNAKTSKSA-N 0.000 description 1
- 229960003656 ricinoleic acid Drugs 0.000 description 1
- FEUQNCSVHBHROZ-UHFFFAOYSA-N ricinoleic acid Natural products CCCCCCC(O[Si](C)(C)C)CC=CCCCCCCCC(=O)OC FEUQNCSVHBHROZ-UHFFFAOYSA-N 0.000 description 1
- 235000019512 sardine Nutrition 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000000600 sorbitol Substances 0.000 description 1
- 239000003549 soybean oil Substances 0.000 description 1
- 235000012424 soybean oil Nutrition 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- HWCKGOZZJDHMNC-UHFFFAOYSA-M tetraethylammonium bromide Chemical compound [Br-].CC[N+](CC)(CC)CC HWCKGOZZJDHMNC-UHFFFAOYSA-M 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 150000003568 thioethers Chemical class 0.000 description 1
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0073—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces
- H05K3/0082—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces characterised by the exposure method of radiation-sensitive masks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
- H05K3/061—Etching masks
- H05K3/064—Photoresists
Landscapes
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明はエツチング加工物の製造
方法に関し、さらに詳しくは、可視光レ−ザ−を用いて
塗膜を硬化させ、非露光部膜を現像処理によつて除去
し、さらに可視光及び/又は紫外線露光した後、エツチ
ング処理することにより良好なエツチングパタ−ンを形
成する加工物や回路パタ−ンを得ることができる耐エツ
チング性に優れたエツチングレジストの形成方法に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing an etched product, and more particularly to a method for curing a coating film using a visible light laser and removing a non-exposed portion film by a development process. Further, the present invention relates to a method of forming an etching resist excellent in etching resistance, which can obtain a processed product or a circuit pattern which forms a good etching pattern by performing an etching treatment after exposure to visible light and / or ultraviolet light.
【0002】[0002]
【従来の技術とその課題】感光性組成物はフオトレジス
ト、平版ないし凸版用製版材、オフセツト印刷用PS
版、情報記録材料、レリ−フ像作製材料等多種の用途に
広く使われている。これら感光性組成物は紫外光に感光
するものが多いが、その感度は一般に数十〜数百mJ/
cm2であるため高出力の光源を必要とし、しかも記録
に対するエネルギ−変換効率が悪いという問題がある。
他方、レ−ザ−のような高エネルギ−密度の光源を用い
て直接描画することにより画像を形成する方法がある。
この方法は、エネルギ−変換効率がよくなるという利点
だけでなく、画像形成工程が大幅に簡略化できるという
利点がある。この場合、直接描画の走査露光光源として
紫外レ−ザ−を用いるよりも、寿命、強度の面で安定な
発振線が得られる可視レ−ザ−を用いるほうが有利であ
る。2. Description of the Related Art A photosensitive composition is a photoresist, a lithographic or letterpress plate-making material, a PS for offset printing.
It is widely used in various applications such as plates, information recording materials, and relief image forming materials. Many of these photosensitive compositions are sensitive to ultraviolet light, and their sensitivity is generally tens to hundreds of mJ /
cm 2 , there is a problem that a high-output light source is required, and energy conversion efficiency for recording is poor.
On the other hand, there is a method of forming an image by directly drawing using a high energy density light source such as a laser.
This method has the advantage that not only the energy conversion efficiency is improved but also that the image forming process can be greatly simplified. In this case, it is more advantageous to use a visible laser capable of obtaining a stable oscillation line in terms of life and intensity than using an ultraviolet laser as a scanning exposure light source for direct writing.
【0003】このため、可視レ−ザ−によつて走査露光
が可能な感度を有する可視光感光性組成物の出現が望ま
れており、波長488nmの可視領域に安定な発振線を
持つAr+レ−ザ−に対して高感度な可視光感光性組成
物が多く提案されている(例えば、特開昭62−318
48号公報、特開昭61−233736号公報、特開昭
60−221403号公報、プリント回路学会第1回学
術講演大会要旨集91頁、Printed Circuit World Conv
ention IV.technical paper 22−2など参照)。[0003] For this reason, it has been desired to develop a visible light-sensitive composition having a sensitivity capable of performing scanning exposure with a visible laser, and Ar + having a stable oscillation line in the visible region having a wavelength of 488 nm. Many visible light-sensitive compositions having high sensitivity to lasers have been proposed (for example, JP-A-62-318).
No. 48, JP-A-61-233736, JP-A-60-221403, Abstracts of the 1st Annual Conference of the Printed Circuit Society of Japan, 91 pages, Printed Circuit World Conv
ention IV. technical paper 22-2).
【0004】これら可視光感光性組成物の形態はフイル
ム状又は液状であるが、これらは以下に述べるような欠
点を有している。[0004] These visible light-sensitive compositions are in the form of a film or liquid, but they have the following disadvantages.
【0005】フイルム状に成型された可視光感光性膜
は、膜厚が数十μmと厚いため、光照射により形成され
る画像が鮮明でない、フイルムを導体表面に空隙なく均
一に密着することが困難である、フイルムを有効利用で
きない(ロスが出る)ために製品が高価になる、等の問
題を有している。Since the visible light-sensitive film molded into a film has a thickness of several tens of μm, an image formed by light irradiation is not clear, and the film can be uniformly adhered to the conductor surface without gaps. It is difficult to use the film effectively (there is a loss) and the product is expensive.
【0006】他方、液状の可視光感光性組成物は、導体
表面への密着性は良いものの、微細な画像パタ−ンを得
るための、可視光感光性に優れた解像度の高いエツチン
グレジスト膜を形成しうるものはこれまで得られていな
い。On the other hand, the liquid visible light-sensitive composition has good adhesion to the conductor surface, but has a high resolution etching resist film excellent in visible light sensitivity to obtain a fine image pattern. What can be formed has not been obtained so far.
【0007】本発明者らは先に、このような液状感光性
組成物の可視光感光性における問題点を解消し、エツチ
ング加工物すなわち金属箔を貼布した積層板や金属板等
の導体表面に30μm以下の厚さで均一に塗布すること
ができ、可視光感光性に優れしかも高解像度の画像を形
成することができるエツチングレジスト膜の形成法を提
案した(特願平1−232855号明細書参照)。この
光硬化型エツチングレジストは活性光線による露光後、
弱アルカリまたは弱酸で現像、水洗、乾燥し、レジスト
膜を形成し、酸又はアルカリで金属をエツチングし、画
像パタ−ンを得るものである。[0007] The present inventors have previously solved the problem of the visible light sensitivity of such a liquid photosensitive composition, and have described an etching-processed product, that is, a conductor surface such as a laminated plate or a metal plate on which a metal foil is adhered. A method of forming an etching resist film which can be uniformly coated with a thickness of 30 μm or less, has excellent visible light sensitivity and can form a high-resolution image has been proposed (Japanese Patent Application No. 1-223855). Book). This photocurable etching resist is exposed to actinic rays,
It is developed with a weak alkali or weak acid, washed with water, and dried to form a resist film, and a metal is etched with an acid or alkali to obtain an image pattern.
【0008】しかしながら、近年、エツチング加工物や
回路パタ−ンの多品種少量生産を行なう場合が増加し、
その製造工程の合理化のため、可視光レ−ザ−直描法は
ますます注目されているが、この可視光レ−ザ−でパタ
−ン露光する場合、高速で走査しようとする、レジスト
膜の硬化が十分でないため、板厚の厚い金属板をエツチ
ング処理することが困難となり、また、回路パタ−ンの
精度が悪く、液状組成物より得られた光硬化性塗膜を使
用しても線巾150μm以下のような細密なパタ−ンの
エツチング処理が困難となる等の欠点が生ずる。However, in recent years, the number of cases in which a variety of etching products and circuit patterns are produced in a large variety and in small quantities has increased.
In order to rationalize the manufacturing process, the visible light laser direct drawing method has been receiving more and more attention. However, when performing pattern exposure with this visible light laser, the resist film to be scanned at a high speed is required. Insufficient curing makes it difficult to etch a thick metal plate, and the circuit pattern is poor in accuracy. There are drawbacks such as difficulty in etching a fine pattern having a width of 150 μm or less.
【0009】一方、走査速度を遅くして露光量を増せ
ば、細密なパタ−ンのエツチング処理を行なうことがで
きるが、走査時間が長くなり、生産性が悪く、工業的な
使用に適さなくなり、また、露光量が多過ぎても細密な
パタ−ンを得にくくなる。現在工業的に使用できるレ−
ザ−描画装置の能力から、工業的に使用するためには、
エツチングに耐えるレジスト膜を形成する露光量として
は、5mJ/cm2以下程度であることが必要である。On the other hand, if the scanning speed is reduced to increase the amount of exposure, a fine pattern etching process can be performed. However, the scanning time becomes longer, the productivity is deteriorated, and it is not suitable for industrial use. Also, even if the exposure amount is too large, it is difficult to obtain a fine pattern. Currently available industrially
Due to the capability of the drawing apparatus, for industrial use,
The amount of exposure for forming a resist film that resists etching needs to be about 5 mJ / cm 2 or less.
【0010】[0010]
【課題を解決するための手段】本発明者らは、上記した
ような問題点のない、可視光レ−ザ−直描法による微細
加工のための工業的に有用な、金属板又は金属箔張り積
層板のエツチングレジスト膜形成法について鋭意検討し
た結果、液状レジストを金属板又は金属箔張積層板に塗
布、乾燥し、可視光レ−ザ−により露光し、現像、水
洗、乾燥を行なつた後、さらに可視光及び/又は紫外線
で短時間露光することにより、板厚の厚い金属板のエツ
チング加工回路パタ−ン精度が著しく向上することを見
出し、本発明を完成するに至つた。DISCLOSURE OF THE INVENTION The present inventors have developed an industrially useful metal plate or metal foil for fine processing by a visible light laser direct drawing method which does not have the above-mentioned problems. As a result of intensive studies on the method of forming an etching resist film on the laminate, a liquid resist was applied to a metal plate or a metal foil-clad laminate, dried, exposed by a visible light laser, developed, washed with water, and dried. Thereafter, it was found that the precision of the etching circuit pattern of a thick metal plate was significantly improved by further short-time exposure with visible light and / or ultraviolet light, and the present invention was completed.
【0011】かくして本発明に従えば、可視光照射によ
り架橋もしくは重合し得る感光性基とイオン性基とを含
有する光硬化性樹脂及び光重合開始剤を含有する液状感
光性組成物を塗装した塗装板を可視光レ−ザ−により露
光し、現像した後、さらに可視光及び/又は紫外線露光
することを特徴とするエツチングレジスト膜の形成方法
が提供される。Thus, according to the present invention, a liquid photosensitive composition containing a photocurable resin containing a photosensitive group capable of being crosslinked or polymerized by irradiation with visible light and an ionic group and a photopolymerization initiator was coated. There is provided a method for forming an etching resist film, which comprises exposing a coated plate with a visible light laser, developing the coated plate, and further exposing the coated plate to visible light and / or ultraviolet light.
【0012】本発明の方法によれば、特に板厚の厚い金
属板の微細エツチング加工や微細な回路パタ−ンを金属
箔張積層板上に形成するのに適した生産性の高いエツチ
ングレジスト膜を得ることができる。According to the method of the present invention, a highly productive etching resist film particularly suitable for fine etching of a thick metal plate and forming a fine circuit pattern on a metal foil-clad laminate. Can be obtained.
【0013】以下、本発明についてさらに詳細に説明す
る。Hereinafter, the present invention will be described in more detail.
【0014】本発明における光照射により架橋もしくは
重合しうる感光性基とイオン性基とを含有する光硬化性
樹脂には、アニオン性またはカチオン性のイオン性基を
含有する重合性不飽和樹脂が包含される。これらの樹脂
については特に制限はないが、代表的なものとしては、
例えば、重合性不飽和基を側鎖又は主鎖に含有するアク
リル樹脂、ポリエステル樹脂、ウレタン樹脂、エポキシ
樹脂及びポリブタジエン樹脂等が挙げられる。これら樹
脂における不飽和基の含有量は不飽和当量として一般に
150〜3000の範囲内が適しており、また、該樹脂
は一般に300以上、好ましくは1000〜3万の範囲
内の数平均分子量を有することができる。さらにイオン
性基の含有量は、未露光部分が現像液により溶解又は膨
潤して除去されるのに必要な量であり、一般には0.2
〜5.5モル/kg樹脂程度でありうる。In the present invention, the photocurable resin containing a photosensitive group which can be crosslinked or polymerized by light irradiation and an ionic group includes a polymerizable unsaturated resin containing an anionic or cationic ionic group. Included. There is no particular limitation on these resins, but as typical ones,
For example, an acrylic resin, a polyester resin, a urethane resin, an epoxy resin, a polybutadiene resin, or the like containing a polymerizable unsaturated group in a side chain or a main chain can be used. The content of unsaturated groups in these resins is generally suitable as an unsaturated equivalent in the range of 150 to 3,000, and the resin generally has a number average molecular weight of 300 or more, preferably in the range of 1,000 to 30,000. be able to. Further, the content of the ionic group is an amount necessary for removing an unexposed portion by dissolving or swelling with a developer, and generally 0.2.
程度 5.5 mol / kg resin.
【0015】これらの樹脂は、一般に揮発性溶剤及び/
又は分子中に1個以上の重合性不飽和基含有化合物を加
え、さらに光重合開始剤、前記した重合性不飽和樹脂以
外の重合性不飽和樹脂、飽和樹脂、必要に応じて、流動
性調節剤、体質顔料、着色顔料、染料等の添加剤と混合
し、液状感光性組成物とする。さらに、前記光硬化性樹
脂中のイオン性基の一部又は全部を酸又はアルカリで中
和することにより、本発明の感光性組成物は水溶液又は
水分散液の状態で使用することもできる。[0015] These resins are generally volatile solvents and / or
Alternatively, one or more polymerizable unsaturated group-containing compounds are added to the molecule, and a photopolymerization initiator, a polymerizable unsaturated resin other than the above-described polymerizable unsaturated resin, a saturated resin, and if necessary, fluidity control. A liquid photosensitive composition is obtained by mixing with additives such as an agent, an extender, a coloring pigment, and a dye. Furthermore, by neutralizing a part or all of the ionic groups in the photocurable resin with an acid or an alkali, the photosensitive composition of the present invention can be used in the form of an aqueous solution or an aqueous dispersion.
【0016】本発明における液状感光性組成物は、樹脂
成分として前記した重合性不飽和樹脂以外に、重合性不
飽和基含有化合物、例えばエチレン性不飽和基を含有し
たポリエステルアクリレ−ト、ポリウレタン樹脂、エポ
キシ樹脂、アクリル樹脂など;飽和樹脂、例えばポリエ
ステル樹脂、ポリウレタン樹脂、エポキシ樹脂、アクリ
ル樹脂など;オリゴマ−、例えばジエチレングリコ−ル
ジ(メタ)アクリレ−トなど;エチレン性不飽和化合
物、例えば(メタ)アクリル酸エステル類などを前記重
合性不飽和樹脂100重量部に対して100重量部以
下、好適には50重量部以下の範囲内で配合して塗膜性
能を適宜調節するようにすることも可能である。The liquid photosensitive composition according to the present invention comprises a polymerizable unsaturated group-containing compound, for example, a polyester acrylate containing an ethylenically unsaturated group, a polyurethane, in addition to the polymerizable unsaturated resin described above as a resin component. Resins, epoxy resins, acrylic resins, etc .; saturated resins, for example, polyester resins, polyurethane resins, epoxy resins, acrylic resins, etc .; oligomers, for example, diethylene glycol di (meth) acrylate; ethylenically unsaturated compounds, for example, (meth) ) Acrylic esters and the like may be blended in an amount of 100 parts by weight or less, preferably 50 parts by weight or less based on 100 parts by weight of the polymerizable unsaturated resin, so that the coating film performance may be appropriately adjusted. It is possible.
【0017】揮発性溶剤としては、疎水性溶剤、たとえ
ばトルエン、キシレン等の石油系溶剤;メチルエチルケ
トン、メチルイソブチルケトン等のケトン類;酢酸エチ
ル、酢酸ブチル等のエステル類;2−エチルヘキシルア
ルコ−ル等のアルコ−ル類;などを使用することができ
る。また、親水性溶剤、たとえばイソプロパノ−ル、n
−ブタノ−ル、t−ブタノ−ル、メトキシエタノ−ル、
エトキシエタノ−ル、ブトキシエタノ−ル、ジエチレン
グリコ−ル、メチルエ−テル、ジオキサン、テトラヒド
ロフランなどを使用することができる。溶剤の種類はこ
こに挙げた例に限定されるものではなく、樹脂添加剤等
を安定に溶解又は分散できるものである限り広い範囲か
ら選ぶことができる。Examples of the volatile solvent include hydrophobic solvents such as petroleum solvents such as toluene and xylene; ketones such as methyl ethyl ketone and methyl isobutyl ketone; esters such as ethyl acetate and butyl acetate; 2-ethylhexyl alcohol and the like. Alcohols; and the like. Also, a hydrophilic solvent such as isopropanol, n
-Butanol, t-butanol, methoxyethanol,
Ethoxyethanol, butoxyethanol, diethylene glycol, methyl ether, dioxane, tetrahydrofuran and the like can be used. The type of the solvent is not limited to the examples given here, and can be selected from a wide range as long as the resin additive or the like can be stably dissolved or dispersed.
【0018】後述する電着塗装用の水溶液又は水分散液
を製造する際には、通常、樹脂成分100重量部に対し
て親水性溶剤300重量部以下、疎水性溶剤200重量
部以下の範囲で使用することが好ましい。When an aqueous solution or aqueous dispersion for electrodeposition coating described below is produced, the amount of the hydrophilic solvent is usually 300 parts by weight or less and the hydrophobic solvent is 200 parts by weight or less based on 100 parts by weight of the resin component. It is preferred to use.
【0019】本発明において光重合開始剤は可視光硬化
を行なわせるために必須である。可視光重合開始剤単
独、可視光重合開始剤と増感剤との組合せ、またはラジ
カル発生剤と増感剤とを組合せた光重合開始剤等を使用
することができる。その具体例としては、チタノセン化
合物、チタノセン化合物とクマリン誘導体またはケトク
マリン誘導体との組合せ、有機過酸化物とクマリン誘導
体またはケトクマリン誘導体との組合せ、ビスイミダゾ
−ルとN−ビニルコハク酸イミダ及びチオ−ル化合物と
の組合せ、ジフエニルヨ−ドニウム塩とメロシアニン色
素またはチオキサンテン色素との組合せ、N−フエニル
グリシンとケトクマリン誘導体との組合せ、イミダゾ−
ル二量体とアクリジン色素またはアリ−ルケトン類との
組合せ、2,4,6−トリス(トリクロロメチル)−5−
トリアジン、3−フエニル−5−イソオキサゾロン、2
−メルカプトベンズイミダゾ−ルなどとメロシアニン色
素、芳香族ケトンとの組合せなどが挙げられる。In the present invention, a photopolymerization initiator is indispensable for performing visible light curing. A visible light polymerization initiator alone, a combination of a visible light polymerization initiator and a sensitizer, or a photo polymerization initiator obtained by combining a radical generator and a sensitizer can be used. Specific examples thereof include titanocene compounds, combinations of titanocene compounds with coumarin derivatives or ketocoumarin derivatives, combinations of organic peroxides with coumarin derivatives or ketocoumarin derivatives, bisimidazoles and imida N-vinylsuccinate and thiol compounds. A combination of a diphenyliodonium salt with a merocyanine dye or a thioxanthene dye, a combination of N-phenylglycine with a ketocoumarin derivative, imidazo-
Combination of dimer and acridine dye or aryl ketone, 2,4,6-tris (trichloromethyl) -5-
Triazine, 3-phenyl-5-isoxazolone, 2
-Combinations of mercaptobenzimidazole and the like with merocyanine dyes and aromatic ketones.
【0020】また、現像後の露光を紫外線で行なう場合
には、後露光硬化を効率よく行なわせるために、前記可
視光重合開始剤と共に、紫外線重合開始剤を併用するこ
とができる。その具体例としては、ベンゾイン、ベンゾ
インメチルエ−テル、ベンゾインエチルエ−テル、ベン
ジル、ジフエニルジスルフイド、テトラメチルチウラム
モノサルフアイド、ジアセチル、エオシン、チオニン、
ミヒラ−ケトン、アントラキノン、クロルアントラキノ
ン、メチルアントラキノン、α−ヒドロキシイソブチル
フエノン、p−イソプロピル−α−ヒドロキシイソブチ
ルフエノン、α,α′−ジクロル−4−フエノキシアセ
トフエノン、1−ヒドロキシ1−シクロヘキシルアセト
フエノン、2,2−ジメトキシ−2−フエニルアセトフ
エノン、メチルベンゾイルフオルメイト、2−メチル−
1−[4−(メチルチオ)フエニル]−2−モルフオリ
ノ−プロペン、チオキサントン、ベンゾフエノンなどが
挙げられる。When the exposure after development is carried out with ultraviolet rays, an ultraviolet polymerization initiator can be used together with the visible light polymerization initiator in order to carry out the post-exposure curing efficiently. Specific examples thereof include benzoin, benzoin methyl ether, benzoin ethyl ether, benzyl, diphenyl disulphide, tetramethylthiuram monosulfide, diacetyl, eosine, thionin,
Michler's ketone, anthraquinone, chloranthraquinone, methylanthraquinone, α-hydroxyisobutylphenone, p-isopropyl-α-hydroxyisobutylphenone, α, α'-dichloro-4-phenoxyacetophenone, 1-hydroxy1- Cyclohexylacetophenone, 2,2-dimethoxy-2-phenylacetophenone, methylbenzoylformate, 2-methyl-
1- [4- (methylthio) phenyl] -2-morpholino-propene, thioxanthone, benzophenone and the like.
【0021】上記の可視光重合開始剤、ラジカル発生
剤、増感剤及び紫外線重合開始剤の使用量は一般に樹脂
成分(固形分)100重量部に対しそれぞれ0.1〜1
0重量部の範囲が適している。また、本発明の感光性組
成物を後述する電着塗装法用の液状レジストとして用い
る場合には、水溶性の光重合開始剤を用いると、重合性
不飽和樹脂と均一に混合された状態で電着することが困
難になるので好ましくない。The above-mentioned visible light polymerization initiator, radical generator, sensitizer and ultraviolet polymerization initiator are generally used in an amount of 0.1 to 1 based on 100 parts by weight of the resin component (solid content).
A range of 0 parts by weight is suitable. Further, when the photosensitive composition of the present invention is used as a liquid resist for an electrodeposition coating method to be described later, when a water-soluble photopolymerization initiator is used, the mixture is uniformly mixed with the polymerizable unsaturated resin. It is not preferable because electrodeposition becomes difficult.
【0022】また、本発明の液状感光性組成物の流動性
調節等のために、マイカ、硫酸バリウム、炭酸カルシウ
ム、シリカ等の体質顔料を樹脂成分100重量部に対し
て200重量部以下で配合することができ、さらに、レ
ジスト膜の着色のために着色顔料、染料またはそのロイ
コ体等の着色剤を樹脂成分100重量部に対して30重
量部以下で使用することもできる。また、本発明の液状
感光性組成物の分散性調整のため、界面活性剤等を適宜
使用することもできる。In order to control the fluidity of the liquid photosensitive composition of the present invention, an extender such as mica, barium sulfate, calcium carbonate, silica, etc. is blended in an amount of 200 parts by weight or less based on 100 parts by weight of the resin component. Further, a coloring agent such as a coloring pigment, a dye or a leuco body thereof may be used in an amount of 30 parts by weight or less based on 100 parts by weight of the resin component for coloring the resist film. Further, for adjusting the dispersibility of the liquid photosensitive composition of the present invention, a surfactant or the like may be appropriately used.
【0023】感光性組成物の塗装方法には特に制限はな
く、従来用いられている方法、例えばスプレ−塗装、ロ
−ルコ−タ−塗装、ナイフコ−タ−塗装、デイツプ塗装
法、スクリ−ン印刷法等を用いることができ、又は水溶
液ないし水分散液状の感光性組成物の場合には電着塗装
法を適用することもできる。特に、電着塗装の場合に
は、被塗物の金属が析出した樹脂と界面でキレ−ト化
し、接着強度が高くなるため、板厚が100μm以上と
厚い金属板のエツチング打ち抜き加工用レジスト膜を形
成するのに特に適している。The method of coating the photosensitive composition is not particularly limited, and any of the conventionally used methods, such as spray coating, roll coater coating, knife coater coating, date coating, screen coating, etc. A printing method or the like can be used, or in the case of an aqueous solution or an aqueous dispersion liquid photosensitive composition, an electrodeposition coating method can be applied. Particularly, in the case of electrodeposition coating, since the metal of the object to be coated is chelated at the interface with the deposited resin and the adhesive strength is increased, the resist film for etching punching of a metal plate having a thickness as thick as 100 μm or more is used. Particularly suitable for forming
【0024】電着塗装用の感光性組成物において使用で
きるアニオン性基を含有する重合性不飽和樹脂として
は、カルボキシル基含量が0.35〜5.5モル/kg樹
脂、好ましくは0.7〜2.0モル/kg樹脂の範囲内に
あり、不飽和当量が150〜3000で且つ数平均分子
量が300以上、好ましくは1000〜30000の範
囲内にある水溶性ないし水分散性のカルボキシル基含有
重合性不飽和樹脂が好適である。その代表的なものとし
て、例えば下記のものを挙げることができるが、使用し
得る樹脂はこれらの例にのみ限定されるものではない。The polymerizable unsaturated resin containing an anionic group which can be used in the photosensitive composition for electrodeposition coating has a carboxyl group content of 0.35 to 5.5 mol / kg, preferably 0.7. Water-soluble or water-dispersible carboxyl group having an unsaturated equivalent of 150 to 3000 and a number average molecular weight of 300 or more, preferably 1,000 to 30,000. Polymerizable unsaturated resins are preferred. Typical examples thereof include the following, but usable resins are not limited only to these examples.
【0025】(i) 一分子中に重合性不飽和結合およ
び水酸基を有する化合物とジイソシアネ−ト系化合物と
の反応物を、骨格中に水酸基を有する高酸価アクリル樹
脂に付加させてなる重合性不飽和樹脂:一分子中に重合
性不飽和結合および水酸基を有する化合物としては、た
とえば2−ヒドロキシエチルアクリレ−ト、2−ヒドロ
キシエチルメタクリレ−ト、2−ヒドロキシプロピルア
クリレ−ト、N−メチロ−ルアクリルアミド、アリルア
ルコ−ル、メタアリルアルコ−ルなどが挙げられ、また
ジイソシアネ−ト系化合物としては、たとえばトリレン
ジイソシアネ−ト、キシリレンジイソシアネ−ト、ヘキ
サメチレンジイソシアネ−ト、リジンジイソシアネ−ト
などが挙げられる。(I) A polymerizable product obtained by adding a reaction product of a compound having a polymerizable unsaturated bond and a hydroxyl group in one molecule and a diisocyanate compound to a high acid value acrylic resin having a hydroxyl group in a skeleton. Unsaturated resin: Compounds having a polymerizable unsaturated bond and a hydroxyl group in one molecule include, for example, 2-hydroxyethyl acrylate, 2-hydroxyethyl methacrylate, 2-hydroxypropyl acrylate, N -Methylolacrylamide, allyl alcohol, methallyl alcohol and the like. Examples of diisocyanate compounds include tolylene diisocyanate, xylylene diisocyanate, and hexamethylene diisocyanate. And lysine diisocyanate.
【0026】一方、高酸価アクリル樹脂は、上記した一
分子中に重合性不飽和結合および水酸基を有する化合物
と、酸基含有不飽和単量体、例えばアクリル酸、メタク
リル酸などをアクリル樹脂製造時に共重合させることに
より得ることができる。On the other hand, a high acid value acrylic resin is obtained by preparing a compound having a polymerizable unsaturated bond and a hydroxyl group in one molecule and an acid group-containing unsaturated monomer such as acrylic acid and methacrylic acid in the acrylic resin. It can be obtained by sometimes copolymerizing.
【0027】一分子中に重合性不飽和結合および水酸基
を有する化合物とジイソシアネ−ト系化合物とのウレタ
ン化反応およびこれらの反応物と骨格中に水酸基を有す
る高酸価アクリル樹脂とのウレタン化付加反応は通常の
方法で行なうことができる。 (ii) エポキシ基を有するエポキシ樹脂と不飽和脂肪
酸とのエステル化物における脂肪酸鎖中の不飽和結合に
α,β−エチレン性不飽和二塩基酸またはその無水物を
付加させてなる重合性不飽和樹脂と一分子中に重合性不
飽和結合を1個以上有するエチレン性不飽和化合物との
混合物を主成分とする樹脂:不飽和脂肪酸としては、た
とえばオレイン酸、リノ−ル酸、リノレン酸、エレオス
テアリン酸、リカン酸、リシノ−ル酸、アラキドン酸な
どが挙げられ、また、アクリル酸及び/又はメタクリル
酸及び/又はクロトン酸等のカルボニル基と共役した不
飽和カルボン酸を併用してもよい。以下、これら両者を
総称して不飽和カルボン酸と呼ぶことがある。Urethane-forming reaction between a compound having a polymerizable unsaturated bond and a hydroxyl group in one molecule and a diisocyanate-based compound, and urethane-adding reaction between these reactants and a high acid value acrylic resin having a hydroxyl group in a skeleton The reaction can be performed by a usual method. (Ii) A polymerizable unsaturated compound obtained by adding an α, β-ethylenically unsaturated dibasic acid or its anhydride to an unsaturated bond in a fatty acid chain in an esterified product of an epoxy resin having an epoxy group and an unsaturated fatty acid. Resin whose main component is a mixture of a resin and an ethylenically unsaturated compound having at least one polymerizable unsaturated bond in one molecule: Examples of unsaturated fatty acids include oleic acid, linoleic acid, linolenic acid, Examples include rheostearic acid, ricanoic acid, ricinoleic acid, and arachidonic acid. An unsaturated carboxylic acid conjugated with a carbonyl group such as acrylic acid and / or methacrylic acid and / or crotonic acid may be used in combination. . Hereinafter, these may be collectively referred to as an unsaturated carboxylic acid.
【0028】α,β−エチレン性不飽和二塩基酸または
その無水物としては、たとえばマレイン酸、無水マレイ
ン酸、フマル酸、イタコン酸などを例示することができ
る。このビヒクル成分において、酸価はα,β−エチレ
ン性不飽和二塩基酸またはその無水物の付加量によつて
調整することができ、そして不飽和当量は不飽和カルボ
ンの種類とその使用量で調整することができる。Examples of the α, β-ethylenically unsaturated dibasic acid or its anhydride include maleic acid, maleic anhydride, fumaric acid, itaconic acid and the like. In this vehicle component, the acid value can be adjusted by the amount of the α, β-ethylenically unsaturated dibasic acid or anhydride added, and the unsaturated equivalent is determined by the type of unsaturated carboxylic acid and its amount used. Can be adjusted.
【0029】(iii) 不飽和脂肪酸変性高酸価アルキ
ド樹脂からなる重合性不飽和樹脂と一分子中に重合性不
飽和結合を1個以上有するエチレン性不飽和化合物との
混合物を主成分とする樹脂:上記の重合性不飽和樹脂
は、一分子中に2個のカルボキシル基を有する二塩基酸
と一分子中に3個以上のカルボキシル基を有する多塩基
酸との混合物と一分子中に2個以上の水酸基を有する多
価アルコ−ルとのエステル化物の骨格中に含まれる水酸
基に不飽和脂肪酸をエステル化反応させることにより得
られるものである。この場合、酸成分のモル数/アルコ
−ル成分のモル数の比は0.8〜1.0の範囲内にあるこ
とが好ましい。(Iii) A mixture mainly composed of a polymerizable unsaturated resin composed of an unsaturated fatty acid-modified high acid alkyd resin and an ethylenically unsaturated compound having at least one polymerizable unsaturated bond in one molecule. Resin: The polymerizable unsaturated resin is a mixture of a dibasic acid having two carboxyl groups in one molecule and a polybasic acid having three or more carboxyl groups in one molecule, and a mixture of two or more in one molecule. It is obtained by subjecting an unsaturated fatty acid to an esterification reaction with a hydroxyl group contained in the skeleton of an esterified product with a polyhydric alcohol having at least one hydroxyl group. In this case, the ratio of the number of moles of the acid component to the number of moles of the alcohol component is preferably in the range of 0.8 to 1.0.
【0030】この反応において酸価は多塩基酸の種類と
量とによつて調整し、不飽和当量は不飽和脂肪酸の付加
量によつて調整することができる。また、水酸基がカル
ボキシル基に対して過剰にある不飽和樹脂酸変性アルキ
ド樹脂に二塩基酸を半エステル化せしめて酸価を付与す
るようにしてもよい。この系において二塩基酸としては
無水フタル酸、イソフタル酸、テレフタル酸、テトラヒ
ドロ無水フタル酸、無水マレイン酸、フマル酸、コハク
酸、セバチン酸などが例示され、また、多塩基酸として
は、たとえばトリメリツト酸、ピロメリツト酸、無水ピ
ロメリツト酸などが挙げられ、多価アルコ−ルとして
は、たとえばエチレングリコ−ル、プロピレングリコ−
ル、ブチレングリコ−ル、ネオペンチルグリコ−ル、グ
リセリン、トリメチロ−ルエタン、トリメチロ−ルプロ
パン、ペンタエリトリツト、ソルビト−ル、ジグリセロ
−ルなどを用いることができる。また、不飽和脂肪酸と
しては前記(ii)の重合性不飽和樹脂においてエポキシ
樹脂を反応せしめる際に用いるものとして前述したと同
様の不飽和脂肪酸を用いることができる。In this reaction, the acid value can be adjusted by the type and amount of the polybasic acid, and the unsaturated equivalent can be adjusted by the amount of the unsaturated fatty acid added. Further, an unsaturated resin acid-modified alkyd resin having a hydroxyl group in excess of a carboxyl group may be half-esterified with a dibasic acid to give an acid value. In this system, examples of dibasic acids include phthalic anhydride, isophthalic acid, terephthalic acid, tetrahydrophthalic anhydride, maleic anhydride, fumaric acid, succinic acid, sebacic acid and the like, and examples of polybasic acids include trimellitate Acid, pyromellitic acid, pyromellitic anhydride and the like. Examples of the polyhydric alcohol include ethylene glycol and propylene glycol.
Butylene glycol, neopentyl glycol, glycerin, trimethylolethane, trimethylolpropane, pentaerythritol, sorbitol, diglycerol, and the like. As the unsaturated fatty acid, the same unsaturated fatty acid as described above as used when the epoxy resin is reacted with the polymerizable unsaturated resin (ii) can be used.
【0031】(iv) マレイン化油からなる重合性不飽
和樹脂と一分子中に重合性不飽和結合を1個以上有する
エチレン性不飽和化合物との混合物を主成分とする樹
脂:マレイン化油には、共役二重結合または非共役二重
結合を持つ油と無水マレイン酸との反応生成物が包含さ
れる。さらに、この反応生成物にスチレン、ビニルトル
エン、シクロペンタジエン、アクリル酸エステル、メタ
クリル酸エステルなどを付加すると、塗膜の硬化性をさ
らに向上させることができる。これらのマレイン化油に
おいて、酸価は無水マレイン酸の付加量によつて調整す
ることができ、また、不飽和当量は油に含まれる不飽和
結合によつて調整することができる。この場合、油とし
てはアマニ油、桐油、大豆油、ヒマシ油、ヤシ油、イワ
シ油、綿実油、麻実油などを例示することができる。(Iv) A resin mainly composed of a mixture of a polymerizable unsaturated resin comprising a maleated oil and an ethylenically unsaturated compound having at least one polymerizable unsaturated bond in one molecule: Include the reaction products of oils having conjugated or non-conjugated double bonds with maleic anhydride. Further, when styrene, vinyltoluene, cyclopentadiene, acrylic acid ester, methacrylic acid ester and the like are added to the reaction product, the curability of the coating film can be further improved. In these maleated oils, the acid value can be adjusted by the amount of maleic anhydride added, and the unsaturated equivalent can be adjusted by the unsaturated bonds contained in the oil. In this case, examples of the oil include linseed oil, tung oil, soybean oil, castor oil, coconut oil, sardine oil, cottonseed oil, hemp seed oil, and the like.
【0032】(v) 分子中に重合性不飽和結合および
グリシジル基を有する化合物を高酸価アクリル樹脂に付
加させてなる重合性不飽和樹脂、または、これらと一分
子中に重合性不飽和結合を1個以上有するエチレン性不
飽和化合物とを併用したものを主成分とする樹脂:この
重合性不飽和樹脂は、アクリル酸、メタクリル酸などと
他のモノマ−とを共重合させて得られる高酸価アクリル
樹脂に、グリシジルアクリレ−ト、グリシジルメタクリ
レ−トなどの一分子中に重合性不飽和結合およびグリシ
ジル基を有する化合物を付加させることにより製造する
ことができる。(V) A polymerizable unsaturated resin obtained by adding a compound having a polymerizable unsaturated bond and a glycidyl group in a molecule to a high acid value acrylic resin, or a polymerizable unsaturated bond and a polymerizable unsaturated bond in one molecule Resin based on a combination of an ethylenically unsaturated compound having at least one of the following: The polymerizable unsaturated resin is obtained by copolymerizing acrylic acid, methacrylic acid, or the like with another monomer. It can be produced by adding a compound having a polymerizable unsaturated bond and a glycidyl group in one molecule such as glycidyl acrylate and glycidyl methacrylate to an acid value acrylic resin.
【0033】(vi) 感光性基としてシンナモイル基を
含む光硬化性樹脂:本光硬化性樹脂は、例えば、ヒドロ
キシル基を含有する高酸価アクリル系樹脂と置換もしく
は未置換のケイ皮酸のハライドとを、塩基の存在下、例
えばピリジン溶媒中で反応せしめることにより製造する
ことができる。その際使用されるヒドロキシル基含有高
酸価アクリル系樹脂は、例えば、アクリル酸、メタクリ
ル酸などのα,β−エチレン性不飽和酸及びメタクリル
酸2−ヒドロキシエチル、アクリル酸2−ヒドロキシエ
チル、メタクリル酸ヒドロキシプロピルなどのエチレン
性不飽和酸のヒドロキシアルキルエステルを必須成分と
し、これらと不飽和単量体の少なくとも1種とを共重合
させることにより得ることができる。(Vi) Photocurable resin containing a cinnamoyl group as a photosensitive group: The photocurable resin is, for example, a high acid value acrylic resin containing a hydroxyl group and a substituted or unsubstituted halide of cinnamic acid. Is reacted in the presence of a base, for example, in a pyridine solvent. The hydroxyl group-containing high acid value acrylic resin used at that time is, for example, α, β-ethylenically unsaturated acid such as acrylic acid and methacrylic acid and 2-hydroxyethyl methacrylate, 2-hydroxyethyl acrylate, methacrylic acid. A hydroxyalkyl ester of an ethylenically unsaturated acid such as hydroxypropyl acid is used as an essential component, and can be obtained by copolymerizing these with at least one unsaturated monomer.
【0034】かかるヒドロキシル基含有高酸価アクリル
系樹脂の製造において、α,β−エチレン性不飽和酸
は、一般に得られる光硬化樹脂の酸価が20〜300、
好ましくは30〜100の範囲内になるような量で使用
することができ、また、エチレン性不飽和酸のヒドロキ
シアルキルエステルは、一般に該高酸価アクリル系樹脂
100重量部当り5〜97重量部、好ましくは20〜7
5重量部の範囲内となるような量で使用することができ
る。In the production of such a hydroxyl group-containing high acid value acrylic resin, the α, β-ethylenically unsaturated acid generally has a photocurable resin having an acid value of 20 to 300,
Preferably, it can be used in an amount such that it falls within the range of 30 to 100. The hydroxyalkyl ester of the ethylenically unsaturated acid is generally used in an amount of 5 to 97 parts by weight per 100 parts by weight of the high acid value acrylic resin. , Preferably 20-7
It can be used in an amount such that it is within the range of 5 parts by weight.
【0035】一方、置換もしくは未置換のケイ皮酸ハラ
イドは、一般に上記ヒドロキシル基含有高酸価アクリル
系樹脂100重量部当り6〜180重量部、好ましくは
30〜140重量部の範囲内になるような量で使用する
ことができる。On the other hand, the substituted or unsubstituted cinnamic halide is generally in the range of 6 to 180 parts by weight, preferably 30 to 140 parts by weight, per 100 parts by weight of the hydroxyl group-containing high acid value acrylic resin. Can be used in any amount.
【0036】使用しうる置換もしくは未置換のケイ皮酸
ハライドとしては、ベンゼン環上にニトロ基、低級アル
コキシ基等から選ばれる置換基を1〜3個有していても
よいケイ皮酸ハライドが包含され、より具体的には、ケ
イ皮酸クロライド、p−ニトロケイ皮酸クロライド、p
−メトキシケイ皮酸クロライド、p−エトキシケイ皮酸
クロライド等が挙げられる。Examples of the substituted or unsubstituted cinnamic halides which may be used include cinnamic halides which may have 1 to 3 substituents selected from a nitro group and a lower alkoxy group on the benzene ring. And more specifically cinnamic acid chloride, p-nitrocinnamic acid chloride, p
-Methoxycinnamic acid chloride, p-ethoxycinnamic acid chloride and the like.
【0037】これら置換もしくは未置換のケイ皮酸ハラ
イドと前述のヒドロキシル基含有アクリル系樹脂との反
応は、例えば、アクリル樹脂溶液100重量部にピリジ
ン20〜100mlに加えジメチルホルムアミド20〜
100mlに溶かしたケイ皮酸クロリド10℃以下で滴
下し、その後30〜70℃で3〜8時間撹拌することに
よつて得られる精製物は、反応溶液を大過剰(150〜
400ml)のメタノ−ルに注いでポリマ−を沈殿さ
せ、テトラヒドロフランと水の混合液で再沈し、更にテ
トラヒドロフランとメタノ−ルの混合液で再沈すること
によつて得ることができる。The reaction between these substituted or unsubstituted cinnamic acid halides and the above-mentioned hydroxyl group-containing acrylic resin is carried out, for example, by adding 20 to 100 ml of pyridine to 100 parts by weight of an acrylic resin solution and adding 20 to 100 ml of dimethylformamide.
The purified product obtained by dropping cinnamic acid chloride dissolved in 100 ml at a temperature of 10 ° C. or less and then stirring at 30 to 70 ° C. for 3 to 8 hours gives a large excess of the reaction solution (150 to 150 ° C.).
(400 ml) of methanol to precipitate the polymer, reprecipitate with a mixture of tetrahydrofuran and water, and reprecipitate with a mixture of tetrahydrofuran and methanol.
【0038】以上に述べた重合性不飽和樹脂において、
一般にカルボキシル基含量が0.35モル/kg樹脂よ
り低くなると水分散性が低下し、反対に酸価が5.5モ
ル/kg樹脂より高くなると電着塗装が困難となる傾向
がある。また、不飽和当量が150より少なくなると塗
膜形成能が低下し、反対に3000より多くなると硬化
性が低下する傾向がみられる。さらに、数平均分子量が
約300より小さくなると塗膜形成能が低下するのであ
まり好ましくない。In the polymerizable unsaturated resin described above,
In general, when the carboxyl group content is lower than 0.35 mol / kg resin, the water dispersibility decreases, and when the acid value is higher than 5.5 mol / kg resin, electrodeposition coating tends to be difficult. When the unsaturated equivalent is less than 150, the ability to form a coating film is reduced, and when it is more than 3000, the curability tends to be reduced. Further, when the number average molecular weight is less than about 300, the ability to form a coating film decreases, which is not preferred.
【0039】電着塗装用液状感光性組成物に使用できる
カチオン性基を含有する重合性不飽和樹脂としては、カ
チオン性基(例えば3級アミノ基又はオニウム塩基)の
含量が通常0.2〜5モル/kg樹脂、好ましくは0.3
〜2.0モル/kg樹脂の範囲内にあり、不飽和当量が
150〜30000で且つ数平均分子量が300以上、
好ましくは1000〜3000の範囲内にある水溶性な
いし水分散性の重合性不飽和樹脂が挙げられる。その代
表的なものとして例えば下記のものを挙げることができ
るが、使用し得る樹脂はこれらの例のみに限定されるも
のではない。As the polymerizable unsaturated resin containing a cationic group that can be used in the liquid photosensitive composition for electrodeposition coating, the content of a cationic group (for example, a tertiary amino group or an onium base) is usually 0.2 to 0.2. 5 mol / kg resin, preferably 0.3
~ 2.0 mol / kg resin, the unsaturated equivalent is 150 ~ 30000 and the number average molecular weight is 300 or more,
Preferably, a water-soluble or water-dispersible polymerizable unsaturated resin in the range of 1,000 to 3,000 is used. Typical examples thereof include the following, but usable resins are not limited to these examples.
【0040】(a) ヒドロキシル基及び3級アミノ基
を有するアクリル樹脂に、ヒドロキシル基含有重合性不
飽和化合物とジイソシアネ−ト化合物との反応物を付加
して得られる樹脂; (b) エポキシ樹脂を2級アミンと反応させた後、残
余のエポキシ基を重合性不飽和モノカルボン酸又はヒド
ロキシ基含有不飽和化合物と反応させて得られる3級ア
ミノ基含有樹脂; (c) グリシジル基含有不飽和化合物と3級アミノ基
含有不飽和化合物を、他の重合性不飽和モノマ−と共重
合して得られる樹脂に、重合性不飽和モノカルボン酸又
はヒドロキシル基含有重合性不飽和化合物を反応させて
得られる3級アミノ基含有樹脂; (d) エポキシ樹脂を重合性不飽和モノカルボン酸又
はヒドロキシル基含有不飽和化合物と反応させ、残余の
エポキシ基を3級アミノ化合物、チオエ−テル、ホスフ
イン等とカルボン酸の存在下でオニウム塩化して得られ
るオニウム塩基含有樹脂。 これらの樹脂は単独でまたは2種以上混合して使用する
ことができる。(A) a resin obtained by adding a reactant of a hydroxyl group-containing polymerizable unsaturated compound and a diisocyanate compound to an acrylic resin having a hydroxyl group and a tertiary amino group; (b) an epoxy resin A tertiary amino group-containing resin obtained by reacting the remaining epoxy group with a polymerizable unsaturated monocarboxylic acid or a hydroxy group-containing unsaturated compound after reacting with a secondary amine; (c) a glycidyl group-containing unsaturated compound And a resin obtained by copolymerizing a tertiary amino group-containing unsaturated compound with another polymerizable unsaturated monomer, and reacting with a polymerizable unsaturated monocarboxylic acid or a hydroxyl group-containing polymerizable unsaturated compound. (D) reacting an epoxy resin with a polymerizable unsaturated monocarboxylic acid or a hydroxyl group-containing unsaturated compound to obtain a residual epoxy resin; An onium base-containing resin obtained by onium salification of a tertiary amino group with a tertiary amino compound, thioether, phosphine or the like and a carboxylic acid. These resins can be used alone or in combination of two or more.
【0041】以上に述べた電着塗装可能なカチオン性又
はアニオン性を有する重合性不飽和樹脂の水分散化また
は水溶化は、該樹脂中にカルボキシル基等のアニオン性
基が導入されている場合には、アルカリ(中和剤)で中
和することによつて、またアミノ基等のカチオン性基が
導入されている場合には、酸(中和剤)で中和すること
によつて行われる。その際に使用されるアルカリ中和剤
としては、例えば、モノエタノ−ルアミン、ジエタノ−
ルアミン、トリエタノ−ルアミンなどのアルカノ−ルア
ミン類;トリエチルアミン、ジエチルアミン、モノエチ
ルアミン、ジイソプロピルアミン、トリメチルアミン、
ジイソブチルアミンなどのアルキルアミン類;ジメチル
アミノエタノ−ルなどのアルキルアルカノ−ルアミン
類;シクロヘキシルアミンなどの脂環族アミン類;カセ
イソ−ダ、カセイカリなどのアルカリ金属水酸化物;ア
ンモニアなどが挙げられる。また、酸中和剤としては、
例えば、ギ酸、酢酸、乳酸、酪酸等のモノカルボン酸が
挙げられる。これら中和剤は単独でまたは混合して使用
できる。中和剤の使用量は該樹脂中に含まれるイオン性
基1モル当り一般に0.2〜1.0当量、特に0.3〜0.
8当量の範囲内が好ましい。The cationically or anionic polymerizable unsaturated resin capable of being electrodeposited as described above is made water-soluble or water-soluble when an anionic group such as a carboxyl group is introduced into the resin. The reaction is carried out by neutralizing with an alkali (neutralizing agent) or, if a cationic group such as an amino group is introduced, with an acid (neutralizing agent). Will be Examples of the alkali neutralizing agent used at that time include monoethanolamine, diethanol-
Alkanolamines such as triamine, triethanolamine and the like; triethylamine, diethylamine, monoethylamine, diisopropylamine, trimethylamine,
Alkylamines such as diisobutylamine; alkylalkanolamines such as dimethylaminoethanol; alicyclic amines such as cyclohexylamine; alkali metal hydroxides such as caseiso-da and kaseikari; ammonia; Also, as an acid neutralizer,
For example, monocarboxylic acids such as formic acid, acetic acid, lactic acid, and butyric acid can be mentioned. These neutralizing agents can be used alone or in combination. The amount of the neutralizing agent to be used is generally 0.2 to 1.0 equivalent, preferably 0.3 to 0.3, per mole of the ionic group contained in the resin.
It is preferably within the range of 8 equivalents.
【0042】電着塗料用の感光性組成物の調製は、それ
自体既知の方法で行なうことができ、例えば、前記の中
和処理により水分散化ないし水溶化された樹脂、光重合
開始剤、必要に応じて溶剤及びその他の成分をよく混合
し、水を加えることにより行なうことができる。このよ
うにして調製される組成物は、使用時に通常の方法で水
で希釈し、例えばPHが4〜9の範囲内、浴濃度(固形
分濃度)3〜25重量%、好ましくは5〜15重量%の
範囲内の電着塗料(又は塗装浴)とすることができる。The preparation of the photosensitive composition for an electrodeposition coating composition can be carried out by a method known per se, for example, a resin which is water-dispersed or made water-soluble by the neutralization treatment, a photopolymerization initiator, If necessary, a solvent and other components can be mixed well and water can be added. The composition thus prepared is diluted with water in a usual manner at the time of use. For example, the pH is in the range of 4 to 9, the bath concentration (solids concentration) is 3 to 25% by weight, preferably 5 to 15%. It can be an electrodeposition paint (or coating bath) in the range of weight%.
【0043】かくして調製される感光性電着塗料は例え
ば次のようにして被塗物である導体表面に塗装すること
ができる。その際に使用しうる導体としては、例えば
銅、ニツケル、クロム、アルミニウム、鉄などの金属も
しくは合金の板、それらの金属もしくは合金をメツキし
た金属板、又はそれら金属もしくは合金の箔を貼布した
積層板、又はそれらに前記した金属又は合金をメツキし
た積層板等が挙げられる。The photosensitive electrodeposition paint thus prepared can be applied to the surface of a conductor to be coated, for example, as follows. As a conductor that can be used at that time, for example, a metal or alloy plate such as copper, nickel, chromium, aluminum, and iron, a metal plate coated with such a metal or alloy, or a foil of such a metal or alloy was applied Laminated plates, or laminated plates obtained by plating the above-mentioned metals or alloys on them are exemplified.
【0044】電着浴の温度は一般に15〜40℃、好適
には15〜30℃にすることができ、そしてPH及び浴
濃度は既述の範囲内に管理する。次いで、このように管
理された電着塗装浴に、塗装されるべき導体を、電着塗
料がアニオン型の場合は陽極とし、また、カチオン型の
場合には陰極として浸漬し、5〜400Vの直流電圧を
印加する。印加時間は30秒〜5分が適当であり、得ら
れる膜厚は、乾燥膜厚で一般に2〜30μm、好適には
5〜25μmである。電着塗装後、電着浴から被塗物を
引き上げ、水洗いした後、電着塗膜中に含まれる水分な
どを熱風等で乾燥、除去する。The temperature of the electrodeposition bath can generally be between 15 and 40 ° C., preferably between 15 and 30 ° C., and the pH and bath concentration are controlled within the stated ranges. Then, the conductor to be coated is immersed in the electrodeposition coating bath controlled as described above as an anode when the electrodeposition coating is an anion type and as a cathode when the electrodeposition coating is a cation type, and a voltage of 5 to 400 V is applied. Apply a DC voltage. The application time is suitably from 30 seconds to 5 minutes, and the obtained film thickness is generally from 2 to 30 μm, preferably from 5 to 25 μm in dry film thickness. After the electrodeposition coating, the object to be coated is pulled up from the electrodeposition bath, washed with water, and then the moisture and the like contained in the electrodeposition coating film are dried and removed with hot air or the like.
【0045】他の塗装方法の場合も好ましい膜厚範囲は
上記と同じである。各種の塗装法で得られたウエツト被
膜は熱風乾燥等で含まれる溶剤、水分等を除去する。乾
燥条件は一般的に120℃以下で1〜30分程度が好ま
しい。The preferred film thickness ranges for other coating methods are the same as described above. The wet film obtained by various coating methods removes the contained solvent, moisture and the like by hot air drying or the like. Generally, drying conditions are preferably 120 ° C. or lower and about 1 to 30 minutes.
【0046】塗布されたレジスト膜の大気中の酸素によ
る硬化阻害をさけるため、ポリビニルアルコ−ル、ポリ
塩化ビニリデン等の酸素遮断能力の高いポリマ−を主成
分とする溶液又は分散液を得られるレジスト膜上に1〜
5μm程度塗布することが好ましく、これによつてレジ
スト膜の表面硬化性を向上させることができる。In order to prevent curing of the applied resist film due to oxygen in the atmosphere, a resist or a solution containing a polymer having a high oxygen-blocking ability such as polyvinyl alcohol and polyvinylidene chloride as a main component can be obtained. 1 on the membrane
It is preferable to apply about 5 μm, whereby the surface curability of the resist film can be improved.
【0047】得られる可視光感光性レジスト膜は、画像
に応じて可視光レ−ザ−を用いて走査露光して選択的に
硬化させ、次いで非露光部膜を現像処理によつて除去す
ることにより画像を形成することができる。可視光レ−
ザ−光源としては、458nm、488nmまたは51
4.5nmに発振線をもつアルゴンレ−ザ−、442n
mに発振線をもつヘリウム−カドミウムレ−ザ−等を使
用することができる。現像処理は、アニオン性組成物の
場合には、例えば炭酸ソ−ダ、カセイソ−ダ、カセイカ
リ、アンモニア水などのアルカリ水溶液を用いて、また
カチオン性組成物の場合には、例えば酢酸、ギ酸、乳酸
等を用いて行なうことができる。The resulting visible light-sensitive resist film is selectively cured by scanning exposure using a visible light laser in accordance with an image, and then the unexposed portion film is removed by a developing process. Can form an image. Visible light ray
As the light source, 458 nm, 488 nm or 51
Argon laser with oscillation line at 4.5 nm, 442n
A helium-cadmium laser having an oscillation line at m can be used. In the case of an anionic composition, the developing treatment is performed using an aqueous alkali solution such as sodium carbonate, caseisoda, caustic potash, aqueous ammonia, and in the case of a cationic composition, for example, acetic acid, formic acid, It can be performed using lactic acid or the like.
【0048】前述した理由により可視光レ−ザ−による
露光量は一般に5mJ/cm2以下であることが好まし
いが、板厚の厚い金属板のエツチングによる打ち抜き加
工、画線巾150μm以下といつた高度に細密なパタ−
ンのエツチングを行なう場合、現像時のパタ−ンは良好
であつても、このような加工のためにはレジスト膜の架
橋度が十分でなく、非画像部の金属、例えば銅を塩化第
2鉄水溶液、塩化第2銅水溶液または塩化アンモニウム
とアンモニア水の混合液を用いて除去するエツチングに
耐えることが困難である。このため画像のシヤ−プさが
ない、銅厚が薄くなる、画像の一部または全部が欠損す
る等の不良を生ずる。For the reasons described above, the exposure amount by a visible light laser is generally preferably 5 mJ / cm 2 or less. However, the thickness of a thick metal plate was punched out by etching, and the image width was 150 μm or less. Highly detailed pattern
When etching is performed, the degree of cross-linking of the resist film is not sufficient for such processing even if the pattern at the time of development is good. It is difficult to withstand etching that is removed using an iron aqueous solution, a cupric chloride aqueous solution, or a mixed solution of ammonium chloride and ammonia water. As a result, defects such as no sharpness of the image, a reduction in the thickness of the copper, and a loss of part or all of the image occur.
【0049】本発明は、可視光レ−ザ−によるレジスト
画像を現像処理後にさらに可視光及び/又は紫外線で短
時間露光することにより上記の如き不良が生ずるのを未
然に阻止し、容易に、充分に架橋重合したエツチングレ
ジスト膜を得ることを可能にしたものである。本発明の
方法によつて形成されるレジスト膜は、塩化第2鉄水溶
液、塩化第2銅水溶液または塩化アンモニウムとアンモ
ニア水の混合液に侵されることなくエツチング後シヤ−
プな欠陥のない画像を得ることができるという驚くべき
効果をもたらす。The present invention prevents the above-mentioned defects from occurring by exposing the resist image by a visible light laser to a visible light and / or ultraviolet ray for a short time after the development processing, thereby easily preventing This makes it possible to obtain an etching resist film which has been sufficiently cross-linked and polymerized. The resist film formed by the method of the present invention is not affected by a ferric chloride aqueous solution, a cupric chloride aqueous solution or a mixed solution of ammonium chloride and ammonia water, and is subjected to a post-etching shear.
This has the surprising effect that an image without any defective elements can be obtained.
【0050】本発明による現像処理後の可視光及び/又
は紫外線露光は、通常250〜700nmの範囲内の波
長を有する光線が適している。これらの波長をもつ光を
含む光源としては、例えば超高圧、高圧、中圧、低圧の
各水銀灯、ケミカルランプ、カ−ボンア−ク灯、キセノ
ン灯、メタルハライド灯、蛍光灯、タングステン灯、レ
−ザ−光、太陽光などを使用することができる。これら
のうち、超高圧、水銀灯、高圧水銀灯、キセノン灯、メ
タルハライド灯が好ましい。上記の活性光線の照射は数
分以内、通常は1分以内で行なわれる。For the exposure to visible light and / or ultraviolet light after the development treatment according to the present invention, light having a wavelength in the range of usually 250 to 700 nm is suitable. Light sources containing light having these wavelengths include, for example, ultrahigh pressure, high pressure, medium pressure, and low pressure mercury lamps, chemical lamps, carbon arc lamps, xenon lamps, metal halide lamps, fluorescent lamps, tungsten lamps, laser lamps, and the like. Light, sunlight or the like can be used. Of these, an ultrahigh pressure, mercury lamp, high pressure mercury lamp, xenon lamp, and metal halide lamp are preferred. The above-mentioned irradiation with actinic rays is performed within several minutes, usually within one minute.
【0051】現像処理によつて露出した金属部分(非画
像部分)、例えば銅は、塩化第2鉄水溶液、塩化第2銅
水溶液または塩化アンモニウムとアンモニア水の混合液
を用いて通常のエツチング処理によつて除去することが
できる。しかる後、画像上のレジスト膜を、アニオン性
組成物の膜の場合には、カセイソ−ダ等の強アルカリに
よつて、またカチオン性組成物の膜の場合には、有機酸
もしくは無機酸の水溶液又は塩素化炭化水素等の有機溶
剤によつて溶解又は膨潤除去し、エツチング加工物や回
路パタ−ンを得ることができる。The metal portion (non-image portion) exposed by the developing process, for example, copper, is subjected to a normal etching process using an aqueous ferric chloride solution, an aqueous cupric chloride solution or a mixed solution of ammonium chloride and aqueous ammonia. Can be removed. Thereafter, the resist film on the image is formed with a strong alkali such as casei-oda in the case of a film of an anionic composition, or an organic acid or an inorganic acid in the case of a film of a cationic composition. By dissolving or swelling and removing with an organic solvent such as an aqueous solution or a chlorinated hydrocarbon, an etched product or a circuit pattern can be obtained.
【0052】[0052]
【効果】以上に述べた本発明の方法に従い、光硬化性組
成物を金属板上に塗装し、乾燥後、画像に応じて可視光
レ−ザ−を用いて露光して硬化させ、現像処理、乾燥
後、さらに短時間可視光及び/又は紫外線露光すること
により、充分硬化したエツチングレジスト膜の画像を形
成せしめることができる。本発明の方法により形成され
るレジスト膜は、板厚の厚い金属のエツチング加工に対
し、又は細密な回路パタ−ンをエツチング法で得る際に
優れたレジスト性を示し、線巾150μm以下といつた
微細な画像であつてもエツチング後、シヤ−プで欠陥の
ない画像が得られる。本発明の方法によれば、可視光光
源の容量を小さくすることができ、露光に要する時間を
大巾に短縮することができるため、生産性、経済性に優
れた可視光直接描画法による微細画像又は打抜きパタ−
ンを有する金属のエツチング加工物の製造方法を提供す
ることができる。According to the above-described method of the present invention, the photocurable composition is coated on a metal plate, dried, exposed and cured according to an image using a visible light laser, and developed. After drying, exposure to visible light and / or ultraviolet light for a short period of time can form an image of a sufficiently cured etching resist film. The resist film formed by the method of the present invention exhibits excellent resist properties when etching a thick metal plate or when obtaining a fine circuit pattern by the etching method. After etching, even a fine image can be obtained with a sharp and defect-free image. According to the method of the present invention, the capacity of the visible light source can be reduced, and the time required for exposure can be greatly reduced. Image or punch pattern
The present invention can provide a method for producing a metal-etched product having metal.
【0053】[0053]
【実施例】以下、実施例を掲げて本発明を更に具体的に
説明する。実施例中、特にことわらないかぎり「部」及
び「%」はすべて「重量部」及び「重量%」を示す。 製造例1 メチルメタクリレ−ト48部、n−ブチルアクリレ−ト
12部、アクリル酸40部およびアゾビスイソブチロニ
トリル3部からなる混合液を、窒素ガス雰囲気におい
て、110℃に保持したプロピレングリコ−ルモノメチ
ルエ−テル90部中に3時間を要して滴下した。滴下
後、1時間熟成させ、アゾビスジメチルバレロニトリル
1部及びプロピレングリコ−ルモノメチルエ−テル10
部からなる混合液を1時間要して滴下し、さらに5時間
熟成させて高酸価アクリル樹脂(酸価300)溶液を得
た。次に、この溶液にグリシジルメタクリレ−ト50、
ハイドロキノンモノメチルエ−テル0.08部及びテト
ラエチルアンモニウムブロマイド0.6部を加えて、空
気を吹き込みながら110℃で5時間反応させて重合性
不飽和樹脂(酸価72、不飽和当量約230、数平均分
子量15,000、Tg13℃)溶液を得た。EXAMPLES Hereinafter, the present invention will be described more specifically with reference to examples. In Examples, "parts" and "%" all indicate "parts by weight" and "% by weight" unless otherwise specified. Production Example 1 A mixture of 48 parts of methyl methacrylate, 12 parts of n-butyl acrylate, 40 parts of acrylic acid and 3 parts of azobisisobutyronitrile was kept in a nitrogen gas atmosphere at 110 ° C. in propylene glycol. The mixture was added dropwise to 90 parts of monomethyl ether in 3 hours. After dropping, the mixture was aged for 1 hour, and 1 part of azobisdimethylvaleronitrile and 10 parts of propylene glycol monomethyl ether 10
Was added dropwise over 1 hour and aged for 5 hours to obtain a high acid value acrylic resin (acid value 300) solution. Next, glycidyl methacrylate 50 was added to this solution.
Hydroquinone monomethyl ether (0.08 part) and tetraethylammonium bromide (0.6 part) were added and reacted at 110 ° C. for 5 hours while blowing air into the polymerizable unsaturated resin (acid value: 72, unsaturated equivalent: about 230, A solution having an average molecular weight of 15,000 and a Tg of 13 ° C.) was obtained.
【0054】この重合性不飽和樹脂をトリエチルアミン
で0.6当量中和した後、下記化学式1で示される可視
光重合開始剤(チタノセン化合物)5部、紫外線重合開
始剤のα−ヒドロキシイソブチルフエノン6部を添加し
た後、固形分含有率が10%になる様に水を加えて電着
塗装浴(PH7.0)を調製した。After neutralizing the polymerizable unsaturated resin with 0.6 equivalents of triethylamine, 5 parts of a visible light polymerization initiator (titanocene compound) represented by the following chemical formula 1 and α-hydroxyisobutylphenone as an ultraviolet polymerization initiator After adding 6 parts, water was added so that the solid content became 10% to prepare an electrodeposition coating bath (PH 7.0).
【0055】[0055]
【化1】 Embedded image
【0056】製造例2 メチルメタクリレ−ト43部、n−ブチルアクリレ−ト
22部、2−ヒドロキシエチルメタクリレ−ト20部、
アクリル酸15部およびアゾビスイソブチロニトリル2
部からなる混合系を、窒素ガス雰囲気下において、10
5℃に保持したジオキサン(親水性溶剤)100部中に
2時間を要して滴下し、さらに同温度で1時間熟成させ
て、高酸価アクリル樹脂(酸価113)溶液を得た。次
に、この溶液200部に2−ヒドロキシエチルメタクリ
レ−トとトリレンジイソシアネ−トとの等モル付加物を
40部、ハイドロキノンモノメチルエ−テル0.07部
加えて空気を吹き込みながら温度80℃において5時間
反応せしめて本発明に使用できる重合性不飽和樹脂(酸
価約80、不飽和当量約1,000、数平均分子量約2
0,000、Tg約12℃)の溶液を得た。Preparation Example 2 43 parts of methyl methacrylate, 22 parts of n-butyl acrylate, 20 parts of 2-hydroxyethyl methacrylate,
15 parts of acrylic acid and azobisisobutyronitrile 2
Part of the mixed system under nitrogen atmosphere.
It was dropped into 100 parts of dioxane (hydrophilic solvent) maintained at 5 ° C. over 2 hours, and aged at the same temperature for 1 hour to obtain a high acid value acrylic resin (acid value 113) solution. Next, 40 parts of an equimolar adduct of 2-hydroxyethyl methacrylate and tolylene diisocyanate and 0.07 part of hydroquinone monomethyl ether were added to 200 parts of the solution, and the mixture was heated to 80 ° C. while blowing air. The polymerizable unsaturated resin (acid value: about 80, unsaturated equivalent: about 1,000, number average molecular weight: about 2)
000, Tg of about 12 ° C.).
【0057】この重合性不飽和樹脂に、ラジカル発生剤
としての3,3′,4,4′−テトラ(tert−ブチルパ−
オキシカルボニル)ベンゾフエノン6部と下記化学式2
に示す光増感剤1部とを組合せた可視光重合開始剤及び
紫外線重合開始剤のベンジルジメチルケタ−ル3部を固
形分含有率が30重量%になるように酢酸エチルで希釈
して液状レジストを調製した。To this polymerizable unsaturated resin was added 3,3 ', 4,4'-tetra (tert-butyl perfluoro) as a radical generator.
6 parts of oxycarbonyl) benzophenone and the following chemical formula 2
3 parts of benzyl dimethyl ketal, a visible light polymerization initiator in combination with 1 part of the photosensitizer shown in the following , and ethyl acetate so that the solid content becomes 30% by weight. After dilution, a liquid resist was prepared.
【0058】[0058]
【化2】 Embedded image
【0059】製造例3 メチルメタクリレ−ト25部、n−ブチルアクリレ−ト
15部、アクリル酸15部、メタクリル酸2ヒドロキシ
エチル45部およびアゾビスイソブチロニトリル2部か
らなる混合液を、窒素ガス雰囲気下において80℃に保
持したDMF100部中に3時間を要して滴下した。滴
下後、1時間熟成させ、アゾビスジメチルバレロニトリ
ル1部およびDMF(ジメチルホルムアミド)5部から
なる混合液を1時間で滴下し、さらに5時間熟成させて
アクリル樹脂(酸価115)溶液を得た。Production Example 3 A mixture comprising 25 parts of methyl methacrylate, 15 parts of n-butyl acrylate, 15 parts of acrylic acid, 45 parts of 2-hydroxyethyl methacrylate and 2 parts of azobisisobutyronitrile was mixed with nitrogen. The mixture was dropped into 100 parts of DMF maintained at 80 ° C. in a gas atmosphere over 3 hours. After the dropwise addition, the mixture was aged for 1 hour, and a mixed solution composed of 1 part of azobisdimethylvaleronitrile and 5 parts of DMF (dimethylformamide) was added dropwise for 1 hour and further aged for 5 hours to obtain an acrylic resin (acid value 115) solution. Was.
【0060】この重合溶液200部にピリジン120部
を加えDMF150部に溶かしたケイ皮酸クロリド57
部を10℃以下で滴下しその後50℃で4時間撹拌し
た。反応溶液を500部のメタノ−ルに注ぎポリマ−を
沈澱させ、THF(テトラヒドロフラン)−水で再沈
し、更に、THF−メタノ−ルで更沈して精製し室温で
減圧乾燥させた。得られたシンナモイル基を感光基とす
る光硬化樹脂の酸価は81、Tg点51℃、数平均分子
量約20,000であつた。シンナモイル基の量は3.6
9モル/kgであつた。To 200 parts of this polymerization solution, 120 parts of pyridine was added and 150 parts of DMF was dissolved in cinnamic acid chloride 57.
The mixture was added dropwise at 10 ° C. or lower, and then stirred at 50 ° C. for 4 hours. The reaction solution was poured into 500 parts of methanol to precipitate a polymer, reprecipitated with THF (tetrahydrofuran) -water, further precipitated with THF-methanol, purified and dried at room temperature under reduced pressure. The resulting photocurable resin having a cinnamoyl group as a photosensitive group had an acid value of 81, a Tg point of 51 ° C., and a number average molecular weight of about 20,000. The amount of cinnamoyl groups is 3.6
It was 9 mol / kg.
【0061】本樹脂100部をプロピレングリコ−ルメ
チルエ−テル50部、n−ブタノ−ル50部の混合溶媒
に溶解したものを使用した。A solution prepared by dissolving 100 parts of the present resin in a mixed solvent of 50 parts of propylene glycol methyl ether and 50 parts of n-butanol was used.
【0062】この重合性不飽和樹脂に前記化学式1に示
す可視光重合開始剤(チタノセン化合物)を1部、下記
化学式3で示される光増感剤0.5部、紫外線重合開始
剤のベンジルメチルケタ−ルを3部添加して、メチルエ
チルケトンで固形分30%になるように希釈して液状レ
ジストを得た。To the polymerizable unsaturated resin, 1 part of a visible light polymerization initiator (titanocene compound) represented by the above chemical formula 1, 0.5 part of a photosensitizer represented by the following chemical formula 3, and benzyl methyl 3 parts of ketal was added and diluted with methyl ethyl ketone to a solid content of 30% to obtain a liquid resist.
【0063】[0063]
【化3】 Embedded image
【0064】製造例4 グリシジルメタクリレ−ト30部、スチレン5部、n−
ブチルメタクリレ−ト24部、メチルアクリレ−ト23
部、ジメチルアミノエチルメタクリレ−ト18部および
アゾビスイソバレロニトリル5部からなる混合液を窒素
ガス雰囲気下において80℃に保持したセロソルブ90
部中に3時間を要して滴下した。滴下後、1時間熟成さ
せ、アゾビスジメチルバレロニトリル1部とセロソルブ
10部からなる混合液を1時間要して滴下し、さらに5
時間熟成させてアクリル樹脂溶液を得た。次に、この溶
液にアクリル酸15部及びハイドロキノン0.13部を
加えて空気を吹き込みながら110℃で5時間反応させ
て光硬化性樹脂(アミノ基含有量約1.0モル/kg、
不飽和当量545、Tg20℃、数平均分子量約15,
000)溶液を得た。Production Example 4 30 parts of glycidyl methacrylate, 5 parts of styrene, n-
24 parts of butyl methacrylate, 23 parts of methyl acrylate
, A mixed solution consisting of 18 parts of dimethylaminoethyl methacrylate and 5 parts of azobisisovaleronitrile was maintained at 80 ° C. in a nitrogen gas atmosphere.
It took 3 hours to add the solution dropwise. After the dropwise addition, the mixture was aged for 1 hour, and a mixed solution composed of 1 part of azobisdimethylvaleronitrile and 10 parts of cellosolve was added dropwise over 1 hour, and further added for 5 hours.
After aging for a time, an acrylic resin solution was obtained. Next, 15 parts of acrylic acid and 0.13 parts of hydroquinone were added to this solution, and the mixture was reacted at 110 ° C. for 5 hours while blowing air into the photocurable resin (amino group content: about 1.0 mol / kg,
Unsaturated equivalent weight 545, Tg 20 ° C, number average molecular weight about 15,
000) A solution was obtained.
【0065】この重合性不飽和樹脂をギ酸で0.6当量
中和した後、前記化学式1で示される可視光重合開始剤
(チタノセン化合物)4部、紫外線重合開始剤としての
α−ヒドロキシイソブチルフエノン6部を添加した後、
固形分含有率が10%になるように水を加えて電着塗装
浴(PH6.5)を調製した。After neutralizing the polymerizable unsaturated resin with 0.6 equivalents of formic acid, 4 parts of a visible light polymerization initiator (titanocene compound) represented by the above formula 1 and α-hydroxyisobutyl phenyl as an ultraviolet polymerization initiator After adding 6 parts of non,
Water was added so that the solid content became 10% to prepare an electrodeposition coating bath (PH 6.5).
【0066】[0066]
【実施例1】製造例1の電着塗装浴を用いて銅厚75μ
mの銅張積層板を陽極とし、浴温25℃で銅張積層板に
対し60mA/dm2の直流電流を3分間通電して電着
塗装した。この時の最大電圧は100Vであつた。この
塗膜を水洗、風乾して20μm厚の平滑な感光膜を得
た。次に、ライン巾60μmの画像を描くようアルゴン
レ−ザ−を用いて3mJ/cm2の強度で走査露光をし
た後、1%の炭酸ソ−ダで現像、水洗、乾燥後、80w
/cmの高圧水銀灯(積層板とランプとの距離250m
m)で2秒露光した後、レジスト膜が現像により露出し
た部分の銅を、塩化第2鉄溶液でエツチング処理除去す
ることにより画像パタ−ンを得た。次いで、露光部の硬
化塗膜を3%カセイソ−ダ水溶液で50℃で剥離除去
後、画像パタ−ンの状態を調べた。剥離後のパタ−ンの
状態は、画像に欠損なく、銅箔の厚みは減少しなかつ
た。得られた画線の線巾の精度は規定の線巾(60μ
m)に対して±3%以内であつた。Example 1 Using the electrodeposition coating bath of Production Example 1 , copper thickness of 75 μm
The copper-clad laminate was used as an anode, and a DC current of 60 mA / dm 2 was applied to the copper-clad laminate at a bath temperature of 25 ° C. for 3 minutes to perform electrodeposition coating. The maximum voltage at this time was 100V. This coating film was washed with water and air-dried to obtain a smooth photosensitive film having a thickness of 20 μm. Next, scanning exposure was performed at an intensity of 3 mJ / cm 2 using an argon laser so as to draw an image having a line width of 60 μm, and then developed with 1% sodium carbonate, washed with water, dried, and dried at 80 watts.
/ Cm high pressure mercury lamp (distance between laminate and lamp 250m
After exposure for 2 seconds in step m), the copper in the exposed portion of the resist film by development was removed by etching treatment with a ferric chloride solution to obtain an image pattern. Next, the cured coating film on the exposed portion was peeled off and removed at 50 ° C. with a 3% aqueous solution of caseide soda, and the state of the image pattern was examined. The state of the pattern after peeling was such that there was no defect in the image and the thickness of the copper foil did not decrease. The accuracy of the line width of the obtained image is the specified line width (60 μm).
m) within ± 3%.
【0067】[0067]
【実施例2】製造例2の液状レジストを銅厚75μmの
銅張積層板に乾燥膜厚15μmになるようにバ−コ−タ
−で塗装し、80℃で10分間乾燥した後、ポリビニル
アルコ−ルの5%水溶液を乾燥膜厚2μmになる様にレ
ジスト膜上に塗布し、風乾した。次いで、ライン巾50
μmの画像を描くようにアルゴンイオンレ−ザ−を用い
1mJ/cm2の強度で走査露光した後、製造例1と同様
にして現像した。現像後の露光は、製造例1で用いた8
0w/cmの高圧水銀灯の代りに、1kwのキセノンラ
ンプ(積層板とランプとの距離250mm)を用いて1
0秒間行なつた。露光後、現像により露出した銅箔を塩
化第2銅溶液を用いてエツチング除去して画像パタ−ン
を得た。次いで、露光部の硬化塗膜を3%カセイソ−ダ
水溶液で50℃で剥離除去後、画像パタ−ンの状態を調
べた。剥離後のパタ−ンの状態は、画像に欠損なく、銅
箔の厚みは減少しなかつた。得られた画線の線巾の精度
は規定の線巾(50μm)に対して±3%以内であつ
た。EXAMPLE 2 The liquid resist of Production Example 2 was coated on a copper-clad laminate having a copper thickness of 75 μm with a bar coater so as to have a dry film thickness of 15 μm, dried at 80 ° C. for 10 minutes, and then dried with polyvinyl alcohol. A 5% aqueous solution of phenol was applied on the resist film to a dry film thickness of 2 μm and air-dried. Then, line width 50
After scanning and exposing with an intensity of 1 mJ / cm 2 using an argon ion laser so as to draw an image of μm, development was carried out in the same manner as in Production Example 1. Exposure after development was performed using 8
Instead of a 0 w / cm high pressure mercury lamp, a 1 kW xenon lamp (250 mm distance between the laminate and the lamp) was used.
Go for 0 seconds. After the exposure, the copper foil exposed by the development was etched and removed using a cupric chloride solution to obtain an image pattern. Next, the cured coating film on the exposed portion was peeled off and removed at 50 ° C. with a 3% aqueous solution of caseide soda, and the state of the image pattern was examined. The state of the pattern after peeling was such that there was no defect in the image and the thickness of the copper foil did not decrease. The accuracy of the line width of the obtained image was within ± 3% of the specified line width (50 μm).
【0068】[0068]
【実施例3】製造例3の液状レジストを用いて、現像後
の露光は80w/cmの高圧水銀灯の代りに、80w/
cmのメタルハライドランプ(積層板とランプとの距離
250mm)を用いて2秒間行なう以外は実施例2と同
様の方法で銅張積層板上に画像パタ−ンを得た。次い
で、露光部の硬化塗膜を3%カセイソ−ダ水溶液で50
℃で剥離除去後、画像パタ−ンの状態を調べた。剥離後
のパタ−ンの状態は画像に欠損なく、銅箔の厚みは減少
しなかつた。得られた画線の線巾の精度は規定の線巾
(50μm)に対して±3%以内であつた。Example 3 Using the liquid resist of Production Example 3, exposure after development was 80 w / cm instead of a 80 w / cm high pressure mercury lamp.
An image pattern was obtained on a copper-clad laminate in the same manner as in Example 2 except that a metal halide lamp (distance between the laminate and the lamp of 250 mm) was used for 2 seconds. Next, the cured coating film in the exposed area was washed with a 3% aqueous solution of caseidos for 50 hours.
After peeling and removal at ℃, the state of the image pattern was examined. The state of the pattern after peeling was not defective in the image, and the thickness of the copper foil did not decrease. The accuracy of the line width of the obtained image was within ± 3% of the specified line width (50 μm).
【0069】[0069]
【実施例4】製造例4の電着塗装浴を用いて、銅厚75
μmのプリント配線用銅張積層板(300×500×
1.6mm)を陰極とし、浴温25℃で銅張積層板に対
し50mA/dm2の直流電流を3分間通電し、電着塗
装した。この時の最大電圧は80Vであつた。この塗膜
を水洗、風乾して20μm厚の平滑な感光膜を得た。次
に、実施例2と同様にして感光膜上にポリビニルアルコ
−ル膜(2μm)を形成した後、ライン幅60μmの画
像を描くようアルゴンレ−ザ−を用いて2mJ/cm2
の強度で走査露光した後、1%の酢酸で現像、水洗、乾
燥した。現像後の露光は120w/cmの超高圧水銀灯
(積層板とランプ距離250mm)で3秒露光した後、
現像により露出した銅部分を、塩化アンモニウムとアン
モニア水の混合水溶液でエツチング処理を行なつた。次
いで、露光部の硬化塗膜を1%酢酸水溶液で、50℃で
剥離除去後、画像パタ−ンの状態を調べた。剥離後のパ
タ−ン状態は画線に欠損なく、銅箔の厚みは減少しなか
つた。得られた画線の線巾の精度は規定の線巾(60μ
m)に対して±3%以内であつた。Example 4 Using the electrodeposition coating bath of Production Example 4, a copper
μm copper-clad laminate for printed wiring (300 × 500 ×
(1.6 mm) as a cathode, a DC current of 50 mA / dm 2 was applied to the copper-clad laminate at a bath temperature of 25 ° C. for 3 minutes to perform electrodeposition coating. The maximum voltage at this time was 80V. This coating film was washed with water and air-dried to obtain a smooth photosensitive film having a thickness of 20 μm. Next, after forming a polyvinyl alcohol film (2 μm) on the photosensitive film in the same manner as in Example 2, 2 mJ / cm 2 using an argon laser so as to draw an image having a line width of 60 μm.
And then developed with 1% acetic acid, washed with water and dried. Exposure after development was performed for 3 seconds with a 120 w / cm ultra-high pressure mercury lamp (lamps and lamp distance 250 mm).
The copper portion exposed by the development was subjected to an etching treatment with a mixed aqueous solution of ammonium chloride and aqueous ammonia. Next, the cured coating film on the exposed portion was peeled off and removed with a 1% aqueous acetic acid solution at 50 ° C., and the state of the image pattern was examined. The pattern after peeling did not show any defects in the image, and the thickness of the copper foil did not decrease. The accuracy of the line width of the obtained image is the specified line width (60 μm).
m) within ± 3%.
【0070】比較例1 現像後の高圧水銀灯での露光をせずにエツチング処理す
る以外は実施例1と全く同様にして画像パタ−ンを得
た。エツチング処理、露光部の硬化塗膜剥離後のパタ−
ン状態は、画線に一部欠損を生じ、また、銅箔が薄くな
つた。得られた画線の線巾は規定の線巾(60μm)に
対して30%以上減少していた。Comparative Example 1 An image pattern was obtained in exactly the same manner as in Example 1 except that an etching treatment was performed without performing exposure with a high-pressure mercury lamp after development. Etching and patterning after peeling of the cured coating on the exposed area
In this state, the image was partially lost and the copper foil was thinned. The line width of the obtained image was reduced by 30% or more with respect to the specified line width (60 μm).
【0071】比較例2 現像後のキセノンランプでの露光をせずにエツチング処
理する以外は、実施例2と全く同様にして画像パタ−ン
を得た。エツチング処理、露光部の硬化塗膜剥離後のパ
タ−ン状態は、画線に一部欠損を生じ、また銅箔が薄く
なつた。得られた画線の線巾は規定の線巾(50μm)
に対して30%以上減少していた。Comparative Example 2 An image pattern was obtained in exactly the same manner as in Example 2 except that an etching treatment was performed without exposing with a xenon lamp after development. In the patterning state after the etching treatment and the peeling of the cured coating film in the exposed area, a part of the image was lost and the copper foil became thin. The line width of the obtained image is the specified line width (50 μm)
By more than 30%.
【0072】比較例3 現像後のメタルハライドランプでの露光をせずにエツチ
ング処理する以外は実施例3と全く同様にして画像パタ
−ンを得た。エツチング処理、露光部の硬化塗膜剥離後
のパタ−ン状態は、画線に一部欠損を生じ、また銅箔が
薄くなつた。得られた画線の線巾は規定の線巾(50μ
m)に対して30%以上減少していた。 比較例4 現像後の超高圧水銀灯での露光をせずにエツチング処理
する以外は実施例4と全く同様にして画像パタ−ンを得
た。エツチング処理、露光部の硬化塗膜剥離後のパタ−
ン状態は、画線に一部欠損を生じ、また銅箔が薄くなつ
た。得られた画線の線巾は規定の線巾(60μm)に対
して30%以上減少していた。Comparative Example 3 An image pattern was obtained in exactly the same manner as in Example 3 except that an etching treatment was performed without performing exposure with a metal halide lamp after development. In the patterning state after the etching treatment and the peeling of the cured coating film in the exposed area, a part of the image was lost and the copper foil became thin. The line width of the obtained image is the specified line width (50 μm).
m) was reduced by 30% or more. Comparative Example 4 An image pattern was obtained in exactly the same manner as in Example 4 except that an etching treatment was performed without performing exposure with an ultrahigh pressure mercury lamp after development. Etching and patterning after peeling of the cured coating on the exposed area
In this state, the image was partially missing and the copper foil was thinned. The line width of the obtained image was reduced by 30% or more with respect to the specified line width (60 μm).
【0073】比較例5 実施例1で、アルゴンレ−ザ−の走査速度を遅くして強
度15mJ/cm2で露光した。その後現像処理し、現
像後の高圧水銀灯での露光は行なわず、エツチング処理
した。露光部の硬化塗膜剥離後のパタ−ン状態は、画線
に欠損はなかつたが、得られた画線の線巾は規定の線巾
(60μm)にくらべて20%以上太くなり、一部にシ
ヨ−トが見られた。Comparative Example 5 In Example 1, exposure was performed at an intensity of 15 mJ / cm 2 at a reduced scanning speed of the argon laser. Thereafter, the film was subjected to a development process, and an etching process was performed without performing exposure with a high-pressure mercury lamp after the development. In the pattern state after the cured coating film was peeled off in the exposed area, the image was not defective, but the line width of the obtained image was 20% or more larger than the specified line width (60 μm). A shot was seen in the part.
【0074】実施例5 製造例1の電着塗装浴を用いて300μm厚の銅板を陽
極とし、浴温25℃で銅板に対し60mA/dm2の直
流電流を4分間通電し、電着塗装した。この時の最大電
圧は120Vであつた。この塗膜を水洗、風乾して20
μm厚の平滑な感光膜を得た。次いで、実施例2と同様
に感光膜上にポリビニルアルコ−ルの被膜を乾燥膜厚2
μmとなる様に形成した。次に、ライン巾60μmの画
線を描く様にアルゴンレ−ザ−を用いて表面及び裏面を
12mJ/cm2の強度で走査露光した後、1%の炭酸
ソ−ダ水溶液で現像して、水洗、乾燥した。次いで、表
面及び裏面を超高圧水銀灯で3秒間露光した。現像によ
り露出した銅を塩化第2銅を用いてエツチング処理除去
した後、3%カセイゾ−ダ水溶液を用いて50℃で硬化
膜を溶解除去した結果、良好な打ち抜きレリ−フ画像が
得られた。Example 5 A 300 μm thick copper plate was used as an anode using the electrodeposition coating bath of Production Example 1, and a DC current of 60 mA / dm 2 was applied to the copper plate at a bath temperature of 25 ° C. for 4 minutes to perform electrodeposition coating. . The maximum voltage at this time was 120V. This coating film is washed with water and air-dried for 20 minutes.
A smooth photosensitive film having a thickness of μm was obtained. Next, a polyvinyl alcohol film was formed on the photosensitive film in a dry film thickness of 2
It was formed to have a thickness of μm. Next, the front and back surfaces are scanned and exposed at an intensity of 12 mJ / cm 2 using an argon laser so as to draw an image having a line width of 60 μm, and then developed with a 1% aqueous sodium carbonate solution and washed with water. And dried. Next, the front and back surfaces were exposed for 3 seconds with an ultra-high pressure mercury lamp. After the copper exposed by the development was removed by etching using cupric chloride, the cured film was dissolved and removed at 50 ° C. using a 3% aqueous solution of sodium hydroxide. As a result, a good punch relief image was obtained. .
【0075】比較例6 実施例5で、現像処理後の表面及び裏面を超高圧水銀灯
で露出せずにエツチング処理したところ、エツチング中
にレジスト膜が膨潤したり、一部溶解したため、画像部
までエツチングされ、画像部の銅厚が薄くなつたり、一
部レリ−フ画像がこわれ、良好な打ち抜き画像を得るこ
とができなかつた。Comparative Example 6 In Example 5, when the front and back surfaces after the development processing were subjected to an etching treatment without being exposed by an ultra-high pressure mercury lamp, the resist film swelled or partially dissolved during the etching. Etching was performed, and the copper thickness of the image portion was reduced, and a part of the relief image was broken, so that a good punched image could not be obtained.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 瀬古 健治 神奈川県平塚市東八幡4丁目17番1号関 西ペイント株式会社内 (56)参考文献 特開 昭62−288826(JP,A) 特開 平1−279251(JP,A) 特開 昭62−69613(JP,A) 特開 平1−137634(JP,A) 特開 昭61−48922(JP,A) (58)調査した分野(Int.Cl.7,DB名) G03F 7/00 - 7/42 ──────────────────────────────────────────────────続 き Continuation of the front page (72) Inventor Kenji Seko 4-171-1, Higashi-Hachiman, Hiratsuka-shi, Kanagawa Paints Kansai Paint Co., Ltd. (56) References JP-A-62-288826 (JP, A) 1-279251 (JP, A) JP-A-62-69613 (JP, A) JP-A-1-137634 (JP, A) JP-A-61-48922 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) G03F 7/ 00-7/42
Claims (1)
る感光性基とイオン性基とを含有する光硬化性樹脂、可
視光重合開始剤及び紫外線重合開始剤を含有する液状感
光性組成物を塗装した塗装板を可視光レーザーにより露
光し、現像した後、さらに紫外線露光することを特徴と
するエツチングレジスト膜の形成方法。1. A liquid photosensitive composition containing a photocurable resin containing a photosensitive group and an ionic group which can be crosslinked or polymerized by irradiation with visible light, a visible light polymerization initiator and an ultraviolet polymerization initiator. A method for forming an etching resist film, comprising exposing the coated plate with a visible light laser, developing the coated plate, and further exposing the coated plate to ultraviolet light.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3037707A JP3030102B2 (en) | 1991-02-08 | 1991-02-08 | Coating method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3037707A JP3030102B2 (en) | 1991-02-08 | 1991-02-08 | Coating method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0534932A JPH0534932A (en) | 1993-02-12 |
| JP3030102B2 true JP3030102B2 (en) | 2000-04-10 |
Family
ID=12504999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3037707A Expired - Fee Related JP3030102B2 (en) | 1991-02-08 | 1991-02-08 | Coating method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3030102B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08157744A (en) * | 1994-12-12 | 1996-06-18 | Hitachi Chem Co Ltd | Photosensitive resin composition and photosensitive element produced therefrom |
| JP2001305750A (en) * | 2000-04-18 | 2001-11-02 | Toray Eng Co Ltd | Method for etching polytmide film |
| JP2019021794A (en) * | 2017-07-19 | 2019-02-07 | ウシオ電機株式会社 | Functional structure manufacturing method and photoresist processing apparatus |
| CN110355075B (en) * | 2018-03-26 | 2022-09-13 | 青岛海尔智慧厨房电器有限公司 | Super-amphiphobic impeller and preparation method and application thereof |
-
1991
- 1991-02-08 JP JP3037707A patent/JP3030102B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0534932A (en) | 1993-02-12 |
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