JP3045576B2 - Method of forming passive film on stainless steel and stainless steel - Google Patents
Method of forming passive film on stainless steel and stainless steelInfo
- Publication number
- JP3045576B2 JP3045576B2 JP3212592A JP21259291A JP3045576B2 JP 3045576 B2 JP3045576 B2 JP 3045576B2 JP 3212592 A JP3212592 A JP 3212592A JP 21259291 A JP21259291 A JP 21259291A JP 3045576 B2 JP3045576 B2 JP 3045576B2
- Authority
- JP
- Japan
- Prior art keywords
- stainless steel
- passivation film
- gas
- treatment
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/80—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D6/00—Heat treatment of ferrous alloys
- C21D6/002—Heat treatment of ferrous alloys containing Cr
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/02—Pretreatment of the material to be coated
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D1/00—General methods or devices for heat treatment, e.g. annealing, hardening, quenching or tempering
- C21D1/74—Methods of treatment in inert gas, controlled atmosphere, vacuum or pulverulent material
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Treatment Of Metals (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、ステンレス鋼の不動態
膜形成方法及びステンレス鋼に係わり、特に超高真空装
置、超高清浄装置及び超純水装置等に好適に適用される
得る酸化不動態ステンレス鋼の不動態膜形成方法及びス
テンレス鋼に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a passivation film of stainless steel and a stainless steel, and more particularly to an oxidation resistant film suitable for ultra-high vacuum equipment, ultra-high cleaning equipment, ultra-pure water equipment and the like. The present invention relates to a method for forming a passive film on a passive stainless steel and a stainless steel.
【0002】[0002]
【従来の技術】近年、超高真空を実現する技術あるいは
真空チャンバ内に所定のガスを小流量流し込み超高清浄
な減圧雰囲気をつくり出す技術が非常に重要となってき
ている。これらの技術は、材料特性の研究、各種薄膜の
形成、半導体デバイスの製造等に広く用いられており、
その結果益々高い真空度が実現されてきているが、さら
に、不純物の混入を極限まで減少させた減圧雰囲気を実
現することが非常に強く望まれている。2. Description of the Related Art In recent years, a technique for realizing an ultra-high vacuum or a technique for flowing a predetermined gas into a vacuum chamber at a small flow rate to create an ultra-high-purity reduced-pressure atmosphere has become very important. These technologies are widely used for researching material properties, forming various thin films, and manufacturing semiconductor devices.
As a result, higher and higher degrees of vacuum have been realized, but it is also very strongly desired to realize a reduced-pressure atmosphere in which contamination of impurities is reduced to the utmost.
【0003】例えば、半導体デバイスを例にとれば、L
SIの高集積化に伴い、単位素子の寸法は年々小さくな
っており、1μmからサブミクロン、さらに、0.5μ
m以下の寸法を持つ半導体デバイスの研究開発が実用化
に向けて盛んに行われている。For example, taking a semiconductor device as an example, L
With the increase in integration of SI, the size of unit elements has been decreasing year by year, from 1 μm to submicron, and further 0.5 μm.
Research and development of semiconductor devices having dimensions of less than m have been actively conducted for practical use.
【0004】このような半導体デバイスの製造では、薄
膜を形成する工程や、形成された薄膜を所定の回路パタ
ーンにエッチングする工程等がくり返し行われる。そし
てこれらプロセスは、超高真空状態、あるいは所定のガ
スを導入した減圧雰囲気で行われるのが普通である。こ
れらの工程に、もし不純物が混入すれば、例えば形成さ
れる薄膜の膜質が劣化したり、微細加工の精度が得られ
なくなるなどの問題を生じる。これが、半導体製造プロ
セスで、超高真空や超高清浄な減圧雰囲気が要求される
理由である。In the manufacture of such a semiconductor device, a step of forming a thin film, a step of etching the formed thin film into a predetermined circuit pattern, and the like are repeatedly performed. These processes are usually performed in an ultra-high vacuum state or a reduced-pressure atmosphere into which a predetermined gas is introduced. If impurities are mixed in these steps, problems such as deterioration of the film quality of the formed thin film and inability to obtain the precision of the fine processing are caused. This is the reason why an ultra-high vacuum or an ultra-high clean reduced-pressure atmosphere is required in the semiconductor manufacturing process.
【0005】超高真空や超高清浄な減圧雰囲気の実現を
これまで阻んでいた最大の原因の一つとして、チャンバ
やガス配管などに広く用いられているステンレス鋼の表
面から放出されるガスがあげられる。特に、真空あるい
は減圧雰囲気中において脱離してくるステンレス表面に
吸着した水分が最も大きな汚染源となっていた。[0005] One of the biggest factors that has so far prevented the realization of an ultra-high vacuum or ultra-high-purity decompressed atmosphere is the gas released from the surface of stainless steel widely used in chambers and gas piping. can give. In particular, the moisture adsorbed on the stainless steel surface desorbed in a vacuum or reduced-pressure atmosphere has been the largest contamination source.
【0006】図9は、従来装置におけるガス配管系およ
び反応チャンバを合わせたシステムのトータルリーク量
(配管系および反応チャンバ内表面からの放出ガス量と
外部リークとの和)とガスの汚染の関係を示したグラフ
である。図中の複数の線は、ガスの流量を様々な値に変
化させた場合について、雰囲気中の不純物濃度とシステ
ムのトータルリーク量の関係を示している。FIG. 9 shows the relationship between the total leak amount (the sum of the amount of gas released from the piping system and the inner surface of the reaction chamber and the external leak) of the system combining the gas piping system and the reaction chamber in the conventional apparatus and gas contamination. FIG. A plurality of lines in the figure show the relationship between the impurity concentration in the atmosphere and the total leak amount of the system when the gas flow rate is changed to various values.
【0007】半導体プロセスは、より精度の高いプロセ
スを実現するためガスの流量を益々少なくする傾向にあ
り、例えば10cc/minやそれ以下の流量を用いる
のが普通となっている。図から分かるように、10cc
/minの流量を用いた場合、現在広く用いられている
装置のように10-3〜10-6 Torr・l/sec程
度のシスタムトータルリークがあると、ガス中の不純物
濃度は10ppm〜1%になり、高清浄プロセスとは程
遠いものになってしまう。In a semiconductor process, a flow rate of a gas tends to be further reduced in order to realize a more accurate process. For example, a flow rate of 10 cc / min or less is generally used. As you can see from the figure, 10cc
In the case of using a flow rate of / min, if there is a total leakage of about 10 −3 to 10 −6 Torr · l / sec as in a device widely used at present, the impurity concentration in the gas is 10 ppm to 1 ppm. %, Which is far from a high clean process.
【0008】本発明者は超高清浄ガス供給システムを発
明し、システムの外部からのリーク量を現状の検出器の
検出限界の1×10-11 Torr・l/sec以下に抑
えこむことに成功している。しかし、システム内部から
のリーク、すなわち、前述のステンレス鋼の表面からガ
スが放出されるため、結果として減圧雰囲気の不純物濃
度を下げることができなかった。The inventor of the present invention invented an ultra-high-purity gas supply system, and succeeded in suppressing the amount of leakage from the outside of the system to 1 × 10 −11 Torr · l / sec or less, which is the current detection limit of the detector. doing. However, since the gas leaks from the inside of the system, that is, the gas is released from the surface of the stainless steel, the impurity concentration in the reduced-pressure atmosphere cannot be reduced as a result.
【0009】現在の超高真空技術における表面処理によ
り得られる表面放出ガス量の最小値は、ステンレス鋼の
場合、1×10-11 Torr・l/sec・cm2であ
る。ここで、チャンバの内部に露出している表面積を、
例えば1m2と最も小さく見積ったとしても、トータル
では1×10-7Torr・l/secのリーク量とな
り、ガス流量10cc/minの場合、不純物濃度1p
pm程度の純度のガスしか得られないことになる。ガス
流量をさらに小さくすると、さらに純度が落ちることは
言うまでもない。The minimum value of the surface emission gas amount obtained by the surface treatment in the current ultra-high vacuum technology is 1 × 10 −11 Torr · l / sec · cm 2 for stainless steel. Here, the surface area exposed inside the chamber is
For example, even if it is estimated to be as small as 1 m 2 , the total leak amount is 1 × 10 −7 Torr · l / sec, and when the gas flow rate is 10 cc / min, the impurity concentration is 1 p.
Only a gas having a purity of about pm can be obtained. If the gas flow rate is further reduced, it goes without saying that the purity is further reduced.
【0010】従って、チャンバ内表面からの脱ガス成分
を、システムの外部リーク量と同じ1×10-11Tor
r・l/secと同程度まで下げるには、ステンレス鋼
の表面からの脱ガスを1×10-15 Torr・l/se
c・cm2以下とする必要がある。そのために、ガス放
出量を少なくするステンレス鋼の表面の処理技術が強く
求められていた。Therefore, the degassing component from the inner surface of the chamber is reduced to 1 × 10 −11 Torr, which is the same as the external leakage amount of the system.
To reduce the pressure to about the same level as r · l / sec, degassing from the surface of stainless steel is performed at 1 × 10 −15 Torr · l / sec.
c · cm 2 or less. Therefore, there has been a strong demand for a technology for treating the surface of stainless steel that reduces the amount of outgassing.
【0011】また一方、半導体製造プロセスでは、比較
的安定な一般ガス(O2 ,N2 ,Ar,H2 ,He)か
ら反応性、腐食性および毒性の強い特殊ガスまで多種多
様なガスが使用される。特に、特殊ガスの中には、例え
ば塩化水素(HCl),塩素(Cl2),三塩化ホウ素
(BCl3),三フッ化ホウ素(BF3)等のように、雰
囲気中に水分が存在すると強い腐食性を示す塩酸やフッ
酸を生成するガスがある。通常これらのガスを扱う配管
やチャンバ材料には耐腐食性、高強度、2次加工性の容
易さ、溶接の容易さ、そして内表面の研磨処理の容易さ
からステンレス鋼が使用されることが多い。On the other hand, in the semiconductor manufacturing process, a wide variety of gases are used, from relatively stable general gases (O 2 , N 2 , Ar, H 2 , He) to highly reactive, corrosive and toxic special gases. Is done. In particular, if there is moisture in the atmosphere, such as hydrogen chloride (HCl), chlorine (Cl 2 ), boron trichloride (BCl 3 ), boron trifluoride (BF 3 ), etc. There are gases that produce hydrochloric acid and hydrofluoric acid, which are highly corrosive. Normally, stainless steel is used for piping and chamber materials that handle these gases because of its corrosion resistance, high strength, ease of secondary workability, ease of welding, and ease of polishing the inner surface. Many.
【0012】しかしながら、ステンレス鋼は、極微量水
分の超高純度雰囲気中では耐食性に優れているが、水分
の存在する塩素系またはフッ素系ガス雰囲気中では容易
に腐食されてしまう。このため、ステンレス鋼の表面研
磨後には耐腐食性処理が不可欠となる。[0012] However, stainless steel is excellent in corrosion resistance in an ultra-high purity atmosphere with a trace amount of water, but is easily corroded in a chlorine-based or fluorine-based gas atmosphere where water is present. For this reason, a corrosion resistance treatment is indispensable after polishing the surface of stainless steel.
【0013】処理方法としてはステンレス鋼に耐食性の
強い金属を被覆するNi−W−Pコーティング(クリー
ンエスコーティング法)または硝酸溶液中で金属表面に
薄い酸化物皮膜を作る等の不動態膜形成法があるが、こ
れらは湿式法であるために膜表面、膜中及び膜とステン
レスの界面に水分や処理溶液の残留分が多く存在し、超
高真空装置や超高清浄装置等に適用できるには至ってい
ない。As a processing method, a passive film forming method such as Ni-WP coating (clean S coating method) for coating stainless steel with a metal having high corrosion resistance or forming a thin oxide film on the metal surface in a nitric acid solution. However, since these are wet methods, a large amount of moisture and processing solution residues are present on the film surface, in the film, and at the interface between the film and stainless steel, making them applicable to ultra-high vacuum equipment and ultra-high cleaning equipment. Has not been reached.
【0014】そこで、ステンレス鋼を気相中で酸化し、
不動態膜形成する方法が提案されている。Therefore, stainless steel is oxidized in the gas phase,
A method for forming a passivation film has been proposed.
【0015】本発明者は、酸化不動態膜の脱ガス特性と
その形成条件の関係について研究を重ねた結果、不動態
膜形成時における酸化雰囲気中の水分が不動態膜の表面
状態及び脱ガス特性に大きく影響することが分かり、こ
れらに関し以下の知見を得た。As a result of repeated studies on the relationship between the degassing characteristics of the oxidized passivation film and the conditions for forming the same, the moisture in the oxidizing atmosphere during the formation of the passivated film caused the surface state of the passivated film and the degassing. It was found that the characteristics were greatly affected, and the following findings were obtained for these.
【0016】水分含有量が、例えば、100ppb程度
の高純度雰囲気中で形成した酸化不動態膜は、図1
(a)に示すように、湿式法で形成した不動態膜(図1
(b))に比べ、脱ガス特性は改善されたものの未だ十
分ではなく、超高真空あるいは超高清浄減圧装置用の材
料として用いることができるまでには至らなかった。An oxidation passivation film formed in a high-purity atmosphere having a water content of, for example, about 100 ppb is shown in FIG.
As shown in FIG. 1A, a passive film formed by a wet method (FIG. 1)
Although the degassing property was improved as compared with (b), it was still insufficient, and did not reach the point where it could be used as a material for an ultra-high vacuum or ultra-high clean pressure reducing device.
【0017】この不動態膜のXPS(X線光電子分光
法)で測定した深さ方向の各成分原子の濃度プロフィー
ルを図10に、膜表面の走査型電子顕微鏡写真を図11
に示す。図11の電子顕微鏡写真に見られるように、不
動態膜表面には多数のクラック、ピンホールが観察さ
れ、平滑で緻密な膜は得られていない。また、図10に
示すように、不動態膜の最表面には耐食性の高いクロム
酸化物は少なく、鉄酸化物を主成分とする層が形成され
ていることが分かった。FIG. 10 shows a concentration profile of each component atom in the depth direction of this passivation film measured by XPS (X-ray photoelectron spectroscopy), and FIG. 11 shows a scanning electron micrograph of the film surface.
Shown in As seen in the electron micrograph of FIG. 11, a number of cracks and pinholes were observed on the surface of the passive film, and a smooth and dense film was not obtained. In addition, as shown in FIG. 10, it was found that chromium oxide having high corrosion resistance was small on the outermost surface of the passivation film, and a layer mainly composed of iron oxide was formed.
【0018】以上述べたように、水分を含む酸化性雰囲
気で酸化不動態膜を形成すると、極微量な水分であって
も、雰囲気中の水分濃度に応じて得られる不動態膜の平
滑性・緻密性は影響を受け、不動態膜にクラックやピン
ホールが発生する。また、XPSによる解析から、この
クラック、ピンホール等は最表面の酸化鉄を多く含む層
に存在し、水分がこれらクラック、ピンホール等に吸
着、吸蔵されるため脱ガス特性が悪化することが分かっ
た。As described above, when an oxidation passivation film is formed in an oxidizing atmosphere containing moisture, even if the amount of moisture is very small, the passivation film obtained in accordance with the concentration of moisture in the atmosphere has a high smoothness. Density is affected, causing cracks and pinholes in the passive film. According to the analysis by XPS, the cracks and pinholes are present in the outermost layer containing a large amount of iron oxide, and moisture is adsorbed and occluded by the cracks and pinholes, so that the degassing property may be deteriorated. Do you get it.
【0019】一方、水分量10ppb以下の超高純度雰
囲気中でステンレス鋼表面に酸化不動態膜を形成する
と、図1(c)に示すように脱ガス特性に優れた不動態
膜が得られ、超高真空あるいは超高清浄減圧装置用の材
料として用いることが可能ではあるが、この不動態膜も
表面の凹凸を完全に無視できるまでには至っていない。On the other hand, when an oxidation passivation film is formed on the surface of stainless steel in an ultra-high purity atmosphere having a water content of 10 ppb or less, a passivation film having excellent degassing characteristics is obtained as shown in FIG. Although it can be used as a material for an ultra-high vacuum or ultra-high-purity decompression device, the passivation film has not yet reached a point where surface irregularities can be completely ignored.
【0020】すなわち、不動態膜の形成前に表面を平滑
化すべく電解研磨が行われるが、現在電解研磨により達
成できる表面粗度はRmax0.05〜0.1μmが限度
であり、通常は、0.5μmの表面粗度が用いられてい
る。しかるに、電解研磨後不動態膜の形成を行うと、電
解研磨時の表面粗度は維持されず、表面は荒れてしま
う。例えば、仮に、不動態膜形成前に母材(バルク部)
の表面をRmax0.05〜0.1μmに仕上げたとして
も不動態膜を形成すると不動態膜の表面粗度はRmax
0.1よりも粗くなってしまう。結局不動態膜が形成さ
れたステンレス鋼であって表面粗度がRmax0.1以下
のものは現在存在していない。そして、不動態膜の表面
粗度は脱ガス特性に大きく影響し、表面粗度が荒ければ
荒いほどガス放出量は多くなることを本発明者は解明し
ている。That is, electrolytic polishing is performed to smooth the surface before the formation of the passivation film. The surface roughness that can be achieved by the electrolytic polishing at present is limited to Rmax 0.05 to 0.1 μm. A surface roughness of 0.5 μm is used. However, when the passivation film is formed after the electrolytic polishing, the surface roughness during the electrolytic polishing is not maintained, and the surface becomes rough. For example, if the base material (bulk part) is
When the passivation film is formed even when the surface of Rmax is finished to Rmax 0.05 to 0.1 μm, the surface roughness of the passivation film becomes Rmax
It becomes coarser than 0.1. As a result, there is no stainless steel having a passivation film and a surface roughness of less than Rmax 0.1 at present. The present inventors have clarified that the surface roughness of the passivation film greatly affects the outgassing characteristics, and that the rougher the surface roughness, the greater the amount of gas release.
【0021】本発明は、酸化不動態膜について以上の問
題点の発見を基になされたものである。The present invention has been made based on the discovery of the above-mentioned problems with respect to the oxidation passivation film.
【0022】[0022]
【発明が解決しようとする課題】本発明は、不動態膜の
超平坦化並びに緻密化を達成し、脱ガス特性や耐食性に
優れた不動態膜を形成する方法及びステンレス鋼を提供
することを目的とする。SUMMARY OF THE INVENTION It is an object of the present invention to provide a method for forming a passivation film having excellent degassing characteristics and corrosion resistance by achieving ultra-flatness and densification of the passivation film, and a stainless steel. Aim.
【0023】[0023]
【課題を解決するための手段】本発明の第1の要旨は、
ステンレス鋼の表面を電解研磨処理した後、酸化性雰囲
気ガス中で酸化処理し、続いて水素ガスにより表面の鉄
酸化物を還元除去することを特徴とするステンレス鋼酸
化不動態膜形成方法に存在する。A first gist of the present invention is as follows.
Electrolytic polishing of the surface of stainless steel, oxidation in an oxidizing atmosphere gas, and then reduction of iron oxide on the surface with hydrogen gas. I do.
【0024】本発明の第2の要旨は、第1の要旨におい
て、前記電解研磨処理後、前記酸化膜形成の前に300
〜600℃の不活性ガス雰囲気中で熱処理することを特
徴とするステンレス鋼酸化不動態膜形成方法に存在す
る。また第3の要旨は、前記水素ガス処理後、不活性ガ
ス中でアニールすることを特徴とするステンレス鋼不動
態膜形成方法に存在する。According to a second aspect of the present invention, in the first aspect, after the electrolytic polishing treatment, before forming the oxide film, 300
A method for forming a stainless steel oxidation passivation film, characterized by performing a heat treatment in an inert gas atmosphere at a temperature of up to 600 ° C. A third aspect of the present invention resides in a method for forming a passivation film of stainless steel, wherein annealing is performed in an inert gas after the hydrogen gas treatment.
【0025】本発明の第3の要旨は、表面粗度がRmax
0.1μm以下である不動態膜を有することを特徴とす
るステンレス鋼に存在する。The third gist of the present invention is that the surface roughness is Rmax
Present in stainless steel characterized by having a passivation film of less than 0.1 μm.
【0026】[0026]
【作用及び実施態様例】以下に、本発明の作用を実施態
様例とともに説明する。Operation and Embodiments The operation of the present invention will be described below together with embodiments.
【0027】(電解研磨)本発明では、不動態膜形成前
に電解研磨を行う。電解研磨法としては、例えば、複合
電解研磨法を用いてもよい。複合電解研磨法とは、電解
により陽極性の被研磨金属を電解溶出させるとともに、
被研磨金属の表面に生成された不動態酸化膜を研磨砥粒
による擦過作用で鏡面に加工する方法である(例えば、
特公昭57−47759号公報)。(Electropolishing) In the present invention, electropolishing is performed before forming a passivation film. As the electrolytic polishing method, for example, a composite electrolytic polishing method may be used. With the composite electrolytic polishing method, the polished metal to be polished is electrolytically eluted by electrolysis,
This is a method of processing a passive oxide film generated on the surface of a metal to be polished into a mirror surface by rubbing action of abrasive grains (for example,
JP-B-57-47759).
【0028】ステンレス鋼を電解研磨することにより、
表面の加工変質層は除去される。また、表面粗度をR
max1μm以下とすることができる。電解研磨後の表面
粗度は、細かければ細かいほど好ましく、従って、0.
05〜0.1μmとすることが好ましい。By electropolishing stainless steel,
The affected layer on the surface is removed. Further, the surface roughness is R
max can be 1 μm or less. The surface roughness after the electropolishing is preferably as fine as possible.
It is preferable that the thickness be in the range of 0.5 to 0.1 μm.
【0029】図2に電解研磨による表面状態の変化を示
す。図2中、図2(a)は研磨後の表面状態を示し、図
2(b)は研磨前の表面状態を示す。図2から明らかな
ように、研磨前は、結晶粒の大きな凹凸があり、この状
態で酸化不動態膜を形成しても連続した膜は得られず、
耐食性に劣る膜となる。更に、結晶粒の間に水分等が吸
蔵、吸着されるため、脱ガス特性の良好な膜は得られな
い。電解研磨処理を施すことにより、表面の凹凸はなく
なり平滑な面となる、その結果表面積は減少し水分の吸
着及び吸蔵量は大きく減少する。FIG. 2 shows a change in the surface state due to electrolytic polishing. 2A shows the surface state after polishing, and FIG. 2B shows the surface state before polishing. As is clear from FIG. 2, before polishing, there are large irregularities of crystal grains, and even if an oxide passivation film is formed in this state, a continuous film cannot be obtained.
The resulting film has poor corrosion resistance. Further, since moisture and the like are absorbed and absorbed between crystal grains, a film having good degassing properties cannot be obtained. By performing the electropolishing treatment, the surface becomes uneven and the surface becomes smooth. As a result, the surface area is reduced and the amount of adsorbing and occluding water is greatly reduced.
【0030】なお、電解研磨後は、ウエハ洗浄と同様な
精密洗浄、乾燥を行うことが好ましい。After the electrolytic polishing, it is preferable to perform the same precision cleaning and drying as the wafer cleaning.
【0031】(高温ベーキング前処理)本発明では、電
解研磨後、直ちに不動態膜形成処理を行ってもよいが、
不動態膜形成処理前に高温ベーキングを行うことが好ま
しい。この高温ベーキング処理を不動態膜形成処理前に
行うと、ステンレス表面側のクロム濃度が増加し、緻密
で、耐腐食性に優れた不動態膜が形成される。(High Temperature Baking Pretreatment) In the present invention, a passivation film forming treatment may be performed immediately after electrolytic polishing.
It is preferable to perform high-temperature baking before the passivation film forming process. If this high-temperature baking treatment is performed before the passivation film formation treatment, the chromium concentration on the stainless steel surface side increases, and a dense, excellent corrosion-resistant passivation film is formed.
【0032】高温ベーキング前処理は、例えばAr,H
e,N2ガス等の不活性ガスを導入して行う。時間は1
〜10時間が好ましい。処理温度は300〜600℃が
好ましく(請求項2)、400〜520℃がより好まし
い。400〜520℃の温度範囲内で行うと表面荒れは
より抑制され、形成される酸化不動態膜は、他の温度範
囲で行う場合に比べより緻密な膜となり、脱ガス特性は
より向上する。The high-temperature baking pretreatment is performed, for example, by Ar, H
e, by introducing an inert gas such as N 2 gas. Time is 1
-10 hours are preferred. The processing temperature is preferably from 300 to 600 ° C (Claim 2), more preferably from 400 to 520 ° C. When performed in a temperature range of 400 to 520 ° C., the surface roughness is further suppressed, and the formed oxide passivation film becomes a denser film as compared with the case performed in another temperature range, and the degassing property is further improved.
【0033】なお、この高温ベーキングにおいても酸化
不動態膜が形成される。ベーキングを不活性ガス雰囲気
中で行うにもかかわらず表面に酸化不動態膜が形成され
る理由は必ずしも明確ではないが、母材中に不純物とし
て含有される酸素(数ppm以下)、あるいは不活性ガ
ス中に不純物として含有される酸素(数ppt)が酸素
の供給源になっているのではないかと考えられる。ま
た、高温ベーキングによって形成される不動態膜の表面
粗度は、電解研磨後の表面粗度が維持されている。この
不動態膜の厚さはベーキング温度・時間によっても変化
するが、例えば、500℃×10時間の場合約30Å厚
となるため、そのまま実用に供することもできる。Incidentally, an oxidation passivation film is also formed in this high-temperature baking. The reason why an oxidation passivation film is formed on the surface despite baking in an inert gas atmosphere is not always clear, but oxygen (several ppm or less) contained as an impurity in the base material or inert gas It is considered that oxygen (several ppt) contained as an impurity in the gas is a source of oxygen. Further, the surface roughness of the passivation film formed by the high-temperature baking is maintained at the surface roughness after the electrolytic polishing. The thickness of the passivation film varies depending on the baking temperature and time. For example, in the case of 500 ° C. × 10 hours, the thickness becomes about 30 °, so that it can be put to practical use as it is.
【0034】(酸化処理…不動態膜形成処理)高温ベー
キング処理後、酸化性ガス(例えばAr/O2=4/1
(モル比)の混合ガス)を導入し、例えば350〜45
0℃に加熱してステンレス表面に酸化不動態膜を形成す
る。この酸化処理により、ステンレス表面にクロム酸化
物を多く含む層、その上に鉄酸化を多く含む層が形成さ
れる。鉄酸化物の多く含む層は、先に述べたようにクラ
ック、ピンホールを有するポーラスな膜である。これら
クラックやピンホール等の程度は酸化性雰囲気の水分量
によって変わり、水分含有量は微量なほど好ましい。(Oxidation treatment: Passive film formation treatment) After the high-temperature baking treatment, an oxidizing gas (for example, Ar / O 2 = 4/1)
(Molar ratio) of mixed gas), for example, 350 to 45
Heat to 0 ° C. to form an oxidation passivation film on the stainless steel surface. By this oxidation treatment, a layer containing a large amount of chromium oxide is formed on the stainless steel surface, and a layer containing a large amount of iron oxide is formed thereon. The layer containing much iron oxide is a porous film having cracks and pinholes as described above. The degree of such cracks and pinholes varies depending on the amount of water in the oxidizing atmosphere, and the smaller the water content, the better.
【0035】(水素ガス処理)酸化性ガスを排気し、続
いて水素ガスを導入して不動態最表面の層を還元除去す
る。この水素処理により不動態膜最表面は清浄で平坦な
面となる。これは、ピンホールやクラックが存在する鉄
酸化物を多く含む層が水素により還元除去され、クロム
酸化物が多く含まれる緻密な層が現れた結果と考えられ
る。(Hydrogen gas treatment) The oxidizing gas is exhausted, and then the hydrogen gas is introduced to reduce and remove the passivation outermost layer. By this hydrogen treatment, the outermost surface of the passivation film becomes a clean and flat surface. This is considered to be a result of a layer containing a large amount of iron oxide containing pinholes and cracks being reduced and removed by hydrogen, and a dense layer containing a large amount of chromium oxide appeared.
【0036】一般に水素分子は700℃以上の温度でラ
ジカル化し、還元反応を起こすと云われており、300
℃程度の低温で還元反応が起こる理由はまだ確認されて
いないが、ステンレス中に含まれるNiが触媒として働
いているためと推測される。水素処理ガス中の水素濃度
は、0.1ppm〜10%が好ましく(請求項3)、
0.5〜100ppmがより好ましい。0.5〜100
ppmの範囲で、脱ガス特性のより優れた緻密な不動態
膜が形成される。また水素処理の温度は、200〜50
0℃が好ましく(請求項4)、300〜400℃がより
好ましい。この範囲でステンレスの水素脆性は抑えら
れ、脱ガス特性の良好な緻密なクロム酸化物を主成分と
する不動態膜が得られる。In general, it is said that hydrogen molecules are radicalized at a temperature of 700 ° C. or more and cause a reduction reaction.
The reason why the reduction reaction occurs at a low temperature of about ℃ has not been confirmed yet, but it is presumed that Ni contained in stainless steel works as a catalyst. The hydrogen concentration in the hydrogen treatment gas is preferably 0.1 ppm to 10% (claim 3),
0.5-100 ppm is more preferred. 0.5-100
In the ppm range, a dense passivation film having better degassing properties is formed. The temperature of the hydrogen treatment is 200 to 50.
0 ° C is preferable (claim 4), and 300 to 400 ° C is more preferable. Within this range, the hydrogen embrittlement of stainless steel is suppressed, and a passivation film containing chromium oxide as a main component and having good degassing properties can be obtained.
【0037】以上のようにして作製される不動態膜の表
面粗度は極めて平滑であり、例えば、電解研磨により
0.05〜0.1μmに仕上げた後上記工程により不動
態膜を形成した場合には、表面粗度が0.01μm以下
である不動態膜が得られる。The surface roughness of the passivation film produced as described above is extremely smooth. For example, when the passivation film is formed by the above process after finishing to 0.05 to 0.1 μm by electrolytic polishing. , A passive film having a surface roughness of 0.01 μm or less is obtained.
【0038】(アニール処理)水素処理後に、更に不活
性ガス中でアニールを行うことにより、熱酸化不動態膜
最表面のクロム酸化物濃度は一層増加し、耐食性により
優れた膜となる(請求項5)。アニールは200〜50
0℃で1〜10時間行うのが好ましく(請求項6)、こ
の範囲の条件でアニールを行うことで熱酸化不動態膜の
表面状態はより平滑となり、また最表面のクロム酸化物
濃度は一層増加し、耐食性はより一層向上する。本発明
では、不活性ガスとして、例えば,Ar,He、N2等
が用いられる。(Annealing Treatment) After the hydrogen treatment, annealing is further performed in an inert gas, whereby the chromium oxide concentration on the outermost surface of the thermally oxidized passive film is further increased, and a film having more excellent corrosion resistance is obtained. 5). Annealing is 200-50
It is preferable that the annealing is performed at 0 ° C. for 1 to 10 hours (Claim 6). By performing annealing under the conditions in this range, the surface state of the thermal oxidation passivation film becomes smoother, and the chromium oxide concentration on the outermost surface is further reduced. And the corrosion resistance is further improved. In the present invention, for example, Ar, He, N 2 or the like is used as the inert gas.
【0039】(ステンレス鋼)関連技術の項で述べたと
おり、従来は、表面粗度がRmax0.1μm以下である
不動態膜を有するステンレス鋼は存在しなかった。それ
は、従来の技術により不動態膜を形成すると表面が荒れ
てしまうことに起因している。(Stainless Steel) As described in the related art section, conventionally, no stainless steel having a passivation film having a surface roughness of R max of 0.1 μm or less did not exist. This is because the surface becomes rough when a passivation film is formed by the conventional technique.
【0040】しかるに、上記した本発明方法によれば、
表面粗度がRmax0.1μm以下である不動態膜を有す
るステンレス鋼(請求項8)を容易に作製することがで
きる。 ひとつは、電解研磨により表面粗度を0.05
〜0.1μmに仕上げておき、高温ベーキングを行う方
法である。高温ベーキングによっても不動態膜が形成さ
れることは前述した通りであり、また、高温ベーキング
によっても電解研磨時の表面粗度は維持されることも前
述した通りである。従って、電解研磨後高温ベーキング
を行えば、表面粗度が0.05〜0.1μmの不動態膜
が得られる。なお、この不動態膜は、表面が極めてクロ
ムに富み、Cr/Feが1以上であることはもちろん、
Cr/Feは7近くのものも達成されており(図5参
照)、極めて緻密な不動態膜である。However, according to the method of the present invention described above,
A stainless steel having a passive film having a surface roughness of Rmax 0.1 μm or less (claim 8) can be easily produced. One is that the surface roughness is 0.05 by electrolytic polishing.
This is a method of performing high-temperature baking after finishing to 0.1 μm. As described above, the passivation film is formed even by the high-temperature baking, and the surface roughness during the electrolytic polishing is also maintained by the high-temperature baking as described above. Therefore, if high-temperature baking is performed after electropolishing, a passive film having a surface roughness of 0.05 to 0.1 μm can be obtained. The passivation film is extremely rich in chromium and has a Cr / Fe ratio of 1 or more.
A Cr / Fe ratio of close to 7 has been achieved (see FIG. 5), and it is a very dense passive film.
【0041】結局、このステンレス鋼は、表面粗度がR
max0.1μm以下であり、かつ、緻密な不動態膜を有
しているため、極めて脱ガス性に優れている(請求項1
1)。 表面粗度がRmax0.1μm以下である不動態
膜を有するステンレス鋼を得る他の方法は、電解研磨に
より母材の表面を表面粗度Rmax0.05〜0.1μm
に仕上げ、前記した水素ガス処理(水素ガス処理前に高
温ベーキングを行ってもよい)を行う方法である。この
方法では、Rmax0.01以下の表面粗度を有する不動
態膜を有するステンレス鋼をも作製することができる。
なお、この水素ガス処理後における不動態の表面におけ
るCr/Feは母材におけるCr/Feより大となる
(図7参照、例えば、図7(a)ではCr/Feは0.
35)ため、脱ガス特性、耐腐食性にも優れたステンレ
ス鋼が得られる(請求項10)。After all, this stainless steel has a surface roughness of R
max 0.1 μm or less, and having a dense passivation film, it is extremely excellent in degassing properties.
1). Other methods of surface roughness to obtain a stainless steel having a passivation film is not more than R max 0.1 [mu] m, the surface of the surface roughness of the base material Rmax0.05~0.1μm by electropolishing
And performing the above-described hydrogen gas treatment (high-temperature baking may be performed before the hydrogen gas treatment). According to this method, a stainless steel having a passivation film having a surface roughness of Rmax 0.01 or less can be produced.
The Cr / Fe on the passivated surface after the hydrogen gas treatment is larger than the Cr / Fe on the base material (see FIG. 7, for example, in FIG.
35) Therefore, a stainless steel excellent in degassing properties and corrosion resistance can be obtained (claim 10).
【0042】(対象ステンレス鋼)また、本発明のステ
ンレス鋼とは、例えばFe−Cr系、Fe−Cr−Ni
系のものである。また、組織としても、フェライト系、
マルテンサイト系、オーステナイト系のいずれのステン
レス鋼であってもよい。(Target Stainless Steel) The stainless steel of the present invention is, for example, Fe-Cr-based, Fe-Cr-Ni
System. In addition, ferrite,
Any of martensitic and austenitic stainless steels may be used.
【0043】以上に述べた本発明の不動態膜形成方法に
より作製した不動態化ステンレス鋼は、極めて良好な脱
ガス特性及び耐腐食性を示し、超真空装置、超高清浄な
減圧装置等の構成材として用いることが可能となる。The passivated stainless steel produced by the above-described passivation film forming method of the present invention exhibits extremely good degassing properties and corrosion resistance, and is suitable for use in ultra-vacuum devices, ultra-high clean pressure reducing devices and the like. It can be used as a constituent material.
【0044】[0044]
【実施例】以下に本発明の実施例を説明する。Embodiments of the present invention will be described below.
【0045】(実施例1)長さ2m,3/8”径のSU
S316Lステンレス管を電解研磨し、表面を半径5μ
mの円周内で凹凸の差の最大値(Rmax)を0.05μ
mの鏡面とした。この表面状態は図3に示すように、結
晶粒界の見られる平滑な面である。次に、このステンレ
ス管をウエハの洗浄プロセスと同じ方法で、即ちアンモ
ニア過水(NH4OH:H2O2:H2O=1:4:20,
90℃)、湯洗(90℃)、超純水の順に洗浄し、イソ
プロピルアルコールで乾燥した。(Example 1) SU having a length of 2 m and a diameter of 3/8 "
S316L stainless steel tube is electropolished and the surface is radius 5μ.
maximum difference of the irregularities in the circumference of m and (R max) 0.05μ
m mirror surface. As shown in FIG. 3, this surface state is a smooth surface where crystal grain boundaries can be seen. Next, the stainless steel tube was subjected to the same method as the wafer cleaning process, that is, ammonia peroxide (NH 4 OH: H 2 O 2 : H 2 O = 1: 4: 20,
(90 ° C.), hot water (90 ° C.), ultrapure water, and dried with isopropyl alcohol.
【0046】このステンレス管を従来の酸化炉に設置
し、Arガスを1l/min流し、常温で1時間パージ
した後、温度を450〜550℃にあげ、10時間ベー
キング処理した。種々の温度で熱処理した後のステンレ
ス内表面の状態を図4に示す。図4から明らかなよう
に、高温で長時間の熱処理後も、ステンレス表面は電解
研磨後の鏡面が維持されていた。すなわち、Rmax0.
05が維持されていた。また、500℃でベーキングし
たステンレス管の内表面をXPSで測定した結果を図5
に示す。上記ベーキング処理により、表面側でクロム原
子が増加し、逆に鉄原子は減少し、クロム/鉄組成比は
バルク中と逆転した。The stainless steel tube was set in a conventional oxidation furnace, Ar gas was flowed at a rate of 1 l / min, and after purging at room temperature for 1 hour, the temperature was raised to 450 to 550 ° C. and baked for 10 hours. FIG. 4 shows the state of the stainless steel inner surface after heat treatment at various temperatures. As is apparent from FIG. 4, the mirror surface of the stainless steel surface after electrolytic polishing was maintained even after the heat treatment at a high temperature for a long time. That is, R max 0.
05 was maintained. FIG. 5 shows the result of XPS measurement of the inner surface of the stainless steel tube baked at 500 ° C.
Shown in By the baking treatment, chromium atoms increased on the surface side and iron atoms decreased, and the chromium / iron composition ratio was reversed from that in the bulk.
【0047】図5においてFeの線とOの線が交差する
ところがバルク(母材)と不動態膜との界面であり、図
5に示す不動態膜の膜厚は約30Åである。この不動態
膜においては表面(図5のグラフの左端)から約22Å
がクロム酸化物が鉄酸化物より多くなっている。In FIG. 5, the intersection of the line of Fe and the line of O is the interface between the bulk (base material) and the passivation film. The thickness of the passivation film shown in FIG. 5 is about 30 °. In this passivation film, about 22 ° from the surface (the left end of the graph in FIG. 5)
Has more chromium oxide than iron oxide.
【0048】続いて酸化炉内を400℃に下げた後,A
rガスを100ppbの水分を含むArとO2の混合ガ
ス(Ar/O2=4:1)で置換し、ステンレス管内表
面を酸化処理した。酸化後の表面状態は図10の電子顕
微鏡写真に示されるように、膜表面に多数のクラックや
ピンホールが観察された。Subsequently, the temperature in the oxidation furnace was lowered to 400 ° C.
The r gas was replaced with a mixed gas of Ar and O 2 containing 100 ppb of moisture (Ar / O 2 = 4: 1), and the inner surface of the stainless steel tube was oxidized. As shown in the electron micrograph of FIG. 10, a number of cracks and pinholes were observed on the surface of the film after the oxidation.
【0049】次に、酸化性ガスをArガスでパージした
後、1ppmのH2を含むArガスをステンレス管に導
入し、400℃で10分間あるいは30分間、酸化膜の
水素還元処理行った。処理後の表面状態を図6に、ま
た、酸化不動態膜中の成分元素の濃度プロフィールを図
7に示す。図6、図7(a)及び図7(b)は還元処理
時間がそれぞれ10分及び30分の場合の結果である。
図6が示すように、水素還元処理した不動態膜の表面に
は酸化処理後に存在したクラック、ピンホールが観測さ
れず、平坦な表面状態になった。一方、図7に示すよう
に不動態膜中には、高濃度のクロム酸化物が存在し、鉄
に対するクロム原子比は母材中に比べはるかに大きくな
った。なお、図7(a)、図7(b)に示す不動態膜の
厚さは、約60Åであった。Next, after purging the oxidizing gas with Ar gas, Ar gas containing 1 ppm of H 2 was introduced into the stainless steel tube, and the oxide film was subjected to hydrogen reduction treatment at 400 ° C. for 10 or 30 minutes. FIG. 6 shows the surface state after the treatment, and FIG. 7 shows the concentration profile of the component elements in the oxidation passivation film. FIGS. 6, 7A and 7B show the results when the reduction processing time is 10 minutes and 30 minutes, respectively.
As shown in FIG. 6, cracks and pinholes existing after the oxidation treatment were not observed on the surface of the passivation film subjected to the hydrogen reduction treatment, and the surface became flat. On the other hand, as shown in FIG. 7, a high concentration of chromium oxide was present in the passivation film, and the chromium atomic ratio to iron was much higher than in the base material. The thickness of the passivation film shown in FIGS. 7A and 7B was about 60 °.
【0050】この不動態膜の表面粗度を測定したところ
Rmax0.01μmであった。When the surface roughness of the passivation film was measured, it was R max 0.01 μm.
【0051】以上のことから、水素還元処理により、ピ
ンホールやクラックが多数存在する鉄酸化物の層が除去
され、クロム酸化物を多量に含む緻密な層が現れ、表面
が清浄、平坦になったものと考えられる。From the above, by the hydrogen reduction treatment, the iron oxide layer having many pinholes and cracks is removed, a dense layer containing a large amount of chromium oxide appears, and the surface becomes clean and flat. It is thought that it was.
【0052】また、水素還元処理時間は不動態膜の表面
状態及び深さ方向の濃度プロフィールに殆ど影響は及ぼ
さず、10分程度で還元反応が終了することが分かっ
た。Further, it was found that the hydrogen reduction treatment time hardly affected the surface state of the passivation film and the concentration profile in the depth direction, and the reduction reaction was completed in about 10 minutes.
【0053】次に、以上の不動態化処理を行ったステン
レス管について脱ガス特性の評価試験を行った。ステン
レス管を相対湿度50%、温度20℃のクリーンルーム
に1週間放置した後,Arガスを1.2l/minの流
量で流し、管出口でArガス中に含まれる水分量をAP
IMS(大気圧イオン化質量分析計)で測定した。結果
を図1(d)に示す。通ガス20分後、Arガス中の水
分量は10ppbに減少し、30分後にはバックグラウ
ンドレベルの3ppb以下になった。Next, an evaluation test of the degassing characteristics was performed on the stainless steel tube subjected to the above passivation treatment. After leaving the stainless steel tube in a clean room at a relative humidity of 50% and a temperature of 20 ° C. for one week, Ar gas was flowed at a flow rate of 1.2 l / min, and the amount of water contained in the Ar gas was measured at the outlet of the tube by AP.
It was measured by IMS (atmospheric pressure ionization mass spectrometer). The results are shown in FIG. 20 minutes after passing the gas, the water content in the Ar gas was reduced to 10 ppb, and after 30 minutes, it became 3 ppb or less of the background level.
【0054】図1(a)に示した従来法で作製した酸化
不動態膜に比べ、脱ガス特性は大きく改善され、本実施
例に従い作製される酸化不動態膜ステンレス鋼が超高真
空装置や超高清浄減圧装置に適用できることを示した。As compared with the oxidation passivation film produced by the conventional method shown in FIG. 1 (a), the degassing characteristics are greatly improved. It is shown that it can be applied to ultra-high clean pressure reduction equipment.
【0055】(実施例2)実施例1において,Ar雰囲
気でのベーキング処理を省略し、その他は実施例1と同
様にして酸化不動態ステンレス管を作製し、その脱ガス
特性を評価した。結果を図1(e)に示す。(Example 2) An oxidation passivated stainless steel tube was prepared in the same manner as in Example 1 except that the baking treatment in an Ar atmosphere was omitted, and the degassing characteristics were evaluated. The results are shown in FIG.
【0056】図1から明らかなように、通ガス後約40
分後に水分量は3ppbとなり、脱ガス特性は実施例1
の酸化不動態膜に比べると劣るものの、従来の酸化不動
態膜に対して大きく改善された。As is apparent from FIG.
After 3 minutes, the water content becomes 3 ppb, and the degassing property is
Although it is inferior to the oxidation passivation film of No. 1, it is greatly improved over the conventional oxidation passivation film.
【0057】(実施例3)水素還元処理の温度を600
℃とし、他の処理条件は実施例1と同じにしてステンレ
ス管内面に酸化不動態膜を形成し、同様な評価を行っ
た。Example 3 The temperature of the hydrogen reduction treatment was set to 600
° C, and the other treatment conditions were the same as in Example 1, an oxidation passivation film was formed on the inner surface of the stainless steel tube, and the same evaluation was performed.
【0058】結果を図1(f)に示す。ここで作製した
不動態膜の表面には、若干荒れがみられ、脱ガス特性も
実施例1及び2よりは劣るが、水分量は通ガス後約70
分で3ppbに減少し、従来例に比べて明らかに改善さ
れた。The results are shown in FIG. The surface of the passivation film produced here is slightly rough and the degassing properties are inferior to those of Examples 1 and 2, but the water content is about 70% after passing the gas.
Min to 3 ppb and clearly improved compared to the conventional example.
【0059】(実施例4)水素還元処理ガスを20%水
素含有Arガスとし、他の処理条件は実施例1と同じに
してステンレス管内面に酸化不動態膜を形成し、同様な
評価を行った。(Example 4) An oxidation passivation film was formed on the inner surface of a stainless steel tube under the same conditions as in Example 1 except that the hydrogen reduction treatment gas was Ar gas containing 20% hydrogen, and the same evaluation was performed. Was.
【0060】結果を図1(g)に示す。不動態膜の表面
には若干荒れがみられ、脱ガス特性も実施例1及び2よ
りは劣るが、水分量は通ガス後約70分で3ppbに減
少し、従来例に比べて明らかに改善された。The results are shown in FIG. Although the surface of the passivation film is slightly rough and the degassing properties are inferior to those of Examples 1 and 2, the water content is reduced to 3 ppb in about 70 minutes after passing the gas, which is clearly improved as compared with the conventional example. Was done.
【0061】(実施例5)酸化性雰囲気を水分濃度5p
pbの超高純度雰囲気とし、その他の処理条件は実施例
1と同様にして酸化不動態ステンレス管を作製し、その
脱ガス特性を評価した。結果は図1(h)の通りであ
る。通ガス10分後には、Arガス中の水分量はバック
グラウンドレベルの3ppb以下になり、現状の最高レ
ベルの膜であっても本実施例の処理により脱ガス特性が
改善されることが分かった。(Example 5) The oxidizing atmosphere was changed to a water concentration of 5 p.
An oxidation-passive stainless steel tube was prepared in the same manner as in Example 1 except that the atmosphere was set to an ultrapure atmosphere of pb, and the degassing characteristics were evaluated. The result is as shown in FIG. Ten minutes after passing the gas, the water content in the Ar gas became 3 ppb or less of the background level, and it was found that the degassing characteristics were improved by the treatment of this embodiment even with the current highest level film. .
【0062】(実施例6)実施例1と同様にして水素還
元処理した後、更に種々の温度で10時間、Arガス中
でアニール処理を行った。熱酸化不動態膜表面のXPS
による深さ方向濃度プロフィールを図8に示す。(Example 6) After hydrogen reduction treatment in the same manner as in Example 1, annealing treatment was further performed at various temperatures for 10 hours in Ar gas. XPS on thermal oxidation passivation film surface
FIG. 8 shows the concentration profile in the depth direction according to.
【0063】図8から明らかなように、Arアニールに
より最表面層では耐腐食性の高いクロムの濃度が増加し
た。しかも処理温度の上昇に伴いクロム濃度はますます
増加し、475℃以上でクロムと鉄の濃度は逆転するこ
とが分かった。なお、図8(a)〜図8(f)に示す不
動態膜の厚さは、約70Aであった。As is apparent from FIG. 8, the concentration of chromium having high corrosion resistance in the outermost surface layer was increased by Ar annealing. In addition, it was found that the chromium concentration further increased with an increase in the treatment temperature, and that the concentration of chromium and iron was reversed above 475 ° C. The thickness of the passivation film shown in FIGS. 8A to 8F was about 70A.
【0064】また、本実施例の酸化不動態膜は最表面の
クロム濃度の増加により耐腐食性は向上し、36%HC
lの強腐食性溶液に対しても極めて良好な耐腐食性を示
した。Further, the oxidation passivation film of this embodiment has improved corrosion resistance due to an increase in the chromium concentration on the outermost surface, and has a 36% HC content.
It showed very good corrosion resistance even to 1 strongly corrosive solution.
【0065】[0065]
【発明の効果】本発明により、脱ガス特性及び耐腐食性
に極めて優れた不動態膜を形成することが可能となり、
超高真空、超高清浄減圧装置等に適用可能な酸化不動態
ステンレス鋼を供給することが可能となる。According to the present invention, it is possible to form a passivation film having extremely excellent degassing characteristics and corrosion resistance.
It is possible to supply an oxidized passivated stainless steel applicable to an ultra-high vacuum, ultra-high clean pressure reducing device, and the like.
【図1】種々の方法で作製した酸化不動態ステンレス管
の脱ガス特性を示すグラフ。 (a)従来法により作製した熱酸化不動態膜。 (b)湿式法で作製した酸化不動態膜。 (c)水分含有量10ppb以下の超高純度酸化性雰囲
気中で作製した熱酸化不動態膜。 (d)実施例1の熱酸化不動態膜。 (e)実施例2の熱酸化不動態膜。 (f)実施例3の熱酸化不動態膜。 (g)実施例4の熱酸化不動態膜。 (h)実施例5の熱酸化不動態膜。FIG. 1 is a graph showing the degassing characteristics of an oxidized passive stainless tube manufactured by various methods. (A) A thermally oxidized passivation film produced by a conventional method. (B) An oxidation passivation film produced by a wet method. (C) A thermally oxidized passive film formed in an ultra-high purity oxidizing atmosphere having a water content of 10 ppb or less. (D) The thermal oxidation passivation film of Example 1. (E) The thermal oxidation passivation film of Example 2. (F) The thermal oxidation passivation film of Example 3. (G) The thermal oxidation passivation film of Example 4. (H) The thermal oxidation passivation film of Example 5.
【図2】電解研磨処理前後のステンレス管の内表面状態
を示す走査型電子顕微鏡写真。FIG. 2 is a scanning electron micrograph showing the inner surface state of a stainless steel tube before and after electrolytic polishing.
【図3】電解研磨後のステンレス管の内表面状態を示す
走査型電子顕微鏡写真。FIG. 3 is a scanning electron micrograph showing the inner surface state of a stainless steel tube after electrolytic polishing.
【図4】Arガス雰囲気でのベーキング後のステンレス
管の内表面状態を示す走査型電子顕微鏡写真。FIG. 4 is a scanning electron micrograph showing the inner surface state of a stainless steel tube after baking in an Ar gas atmosphere.
【図5】Arガス雰囲気でのベーキング後の電解研磨表
面のXPSによる深さ方向濃度プロフィールを示すグラ
フ。FIG. 5 is a graph showing a concentration profile in a depth direction by XPS of an electropolished surface after baking in an Ar gas atmosphere.
【図6a】10分間の水素還元処理後の熱酸化不動態膜
の表面状態を示す走査型電子顕微鏡写真。FIG. 6a is a scanning electron micrograph showing the surface state of a thermal oxidation passivation film after hydrogen reduction treatment for 10 minutes.
【図6b】30分間の水素還元処理後の熱酸化不動態膜
の表面状態を示す走査型電子顕微鏡写真。FIG. 6B is a scanning electron micrograph showing the surface state of the thermal oxidation passivation film after the hydrogen reduction treatment for 30 minutes.
【図7】水素還元処理後における熱酸化不動態膜表面の
XPSによる深さ方向濃度プロフィールを示すグラフ。 (a)処理時間10分 (b)処理時間30分FIG. 7 is a graph showing a concentration profile in the depth direction by XPS of the surface of a thermally oxidized passivation film after a hydrogen reduction treatment. (A) Processing time 10 minutes (b) Processing time 30 minutes
【図8】Arアニール処理後の熱酸化不動態膜表面のX
PSによる深さ方向濃度プロフィールを示すグラフ。 (a)アニール温度 375℃ (b)アニール温度 400℃ (c)アニール温度 425℃ (d)アニール温度 450℃ (e)アニール温度 475℃ (f)アニール温度 500℃FIG. 8 shows X on the surface of a thermally oxidized passivation film after Ar annealing.
7 is a graph showing a depth concentration profile by PS. (A) Annealing temperature 375 ° C (b) Annealing temperature 400 ° C (c) Annealing temperature 425 ° C (d) Annealing temperature 450 ° C (e) Annealing temperature 475 ° C (f) Annealing temperature 500 ° C
【図9】種々のガス流量における雰囲気ガス中の不純物
濃度とシステムリーク量の関係を示すグラフ。FIG. 9 is a graph showing a relationship between an impurity concentration in an atmospheric gas and a system leak amount at various gas flow rates.
【図10】従来法により作製した熱酸化不動態膜表面の
XPSによる深さ方向濃度プロフィールを示すグラフ。FIG. 10 is a graph showing a concentration profile in the depth direction by XPS of the surface of a thermally oxidized passivation film manufactured by a conventional method.
【図11】従来法により作製した熱酸化不動態膜の表面
状態を示す走査型電子顕微鏡写真。FIG. 11 is a scanning electron micrograph showing the surface state of a thermally oxidized passivation film manufactured by a conventional method.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI C23C 22/00 C23C 22/00 C25F 3/06 C25F 3/06 (56)参考文献 特開 昭57−149473(JP,A) 特開 昭63−278760(JP,A) 特開 昭63−169391(JP,A) 特開 昭64−31956(JP,A) 特開 平3−285049(JP,A) 特開 平5−33156(JP,A) 特開 平5−125518(JP,A) (58)調査した分野(Int.Cl.7,DB名) C21D 1/76 C23C 8/02 C23C 8/14 C23C 8/80 C23C 22/00 C25F 3/06 ────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 7 Identification symbol FI C23C 22/00 C23C 22/00 C25F 3/06 C25F 3/06 (56) References JP-A-57-149473 (JP, A) JP-A-63-278760 (JP, A) JP-A-63-169391 (JP, A) JP-A-64-31956 (JP, A) JP-A-3-285049 (JP, A) JP-A-5-33156 (JP, A) JP-A-5-125518 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) C21D 1/76 C23C 8/02 C23C 8/14 C23C 8/80 C23C 22 / 00 C25F 3/06
Claims (11)
後、酸化性雰囲気ガス中で酸化処理し、続いて水素ガス
により表面の鉄酸化物を還元除去することを特徴とする
ステンレス鋼不動態膜形成方法。1. A stainless steel passivation film characterized in that after a surface of stainless steel is electropolished, an oxidation treatment is carried out in an oxidizing atmosphere gas, and subsequently, iron oxide on the surface is reduced and removed by hydrogen gas. Forming method.
前に300〜600℃の不活性ガス雰囲気中で熱処理す
ることを特徴とする請求項1記載のステンレス鋼の酸化
不動態膜形成方法。2. The method according to claim 1, wherein the heat treatment is performed in an inert gas atmosphere at 300 to 600 ° C. after the electrolytic polishing and before the oxide film is formed. .
の水素濃度が0.1ppm〜10%であることを特徴と
する請求項1または2記載のステンレスの鋼酸化不動態
膜形成方法。3. The method for forming a stainless steel oxide passivation film according to claim 1, wherein in the hydrogen gas treatment, a hydrogen concentration in a gas atmosphere is 0.1 ppm to 10%.
200〜500℃であることを特徴とする請求項1乃至
3のいずれか1項記載のステンレス鋼の酸化不動態膜形
成方法。4. The method for forming an oxide passivation film on stainless steel according to claim 1, wherein the processing temperature in the hydrogen gas processing is 200 to 500 ° C.
ニール処理を行うことを特徴とする請求項1及至4のい
ずれか1項記載のステンレス鋼の酸化不動態膜形成方
法。5. The method for forming an oxidized passivation film of stainless steel according to claim 1, wherein annealing is performed in an inert gas after the hydrogen gas treatment.
00〜500℃で1〜10時間であることを特徴とする
請求項5記載のステンレス鋼の酸化不動態膜形成方法。6. The condition of the inert gas annealing treatment is 2
The method for forming an oxide passivation film on stainless steel according to claim 5, wherein the temperature is from 00 to 500C for 1 to 10 hours.
75℃以上であることを特徴とする請求項6記載のステ
ンレス鋼の酸化不動態膜形成法。7. The condition of the inert gas annealing treatment is 4
The method according to claim 6, wherein the temperature is 75 ° C or higher.
不動態膜を有することを特徴とするステンレス鋼。8. A stainless steel having a passivation film having a surface roughness of Rmax 0.1 μm or less.
る不動態膜を有することを特徴とする請求項8記載のス
テンレス鋼。9. The stainless steel according to claim 8, having a passivation film having a surface roughness of Rmax 0.01 μm or less.
(原子比、以下同じ)が、母材部におけるCr/Feよ
りも大であることを特徴とする請求項8または請求項9
記載のステンレス鋼。10. Cr / Fe on the surface of a passivation film
10. The atomic ratio (hereinafter, the same) is larger than Cr / Fe in the base material portion.
Stainless steel as described.
1以上であることを特徴とする請求項8記載のステンレ
ス鋼。11. The stainless steel according to claim 8, wherein Cr / Fe on the surface of the passivation film is 1 or more.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3212592A JP3045576B2 (en) | 1991-05-28 | 1991-07-30 | Method of forming passive film on stainless steel and stainless steel |
| JP51015992A JP3181053B2 (en) | 1991-05-28 | 1992-05-28 | Method for forming passive film on stainless steel, and stainless steel and fluid contact parts |
| EP19920917389 EP0596121A4 (en) | 1991-05-28 | 1992-05-28 | PROCESS FOR FORMING A PASSIVE FILM ON STAINLESS STEEL, AND ELEMENT COMING INTO CONTACT WITH GASES, LIQUIDS AND STAINLESS STEEL. |
| PCT/JP1992/000699 WO1992021786A1 (en) | 1991-05-28 | 1992-05-28 | Process for forming passive film on stainless steel, and stainless steel and gas- and liquid-contacting part |
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15246691 | 1991-05-28 | ||
| JP3-152466 | 1991-07-12 | ||
| JP19871891 | 1991-07-12 | ||
| JP3-198718 | 1991-07-12 | ||
| JP3212592A JP3045576B2 (en) | 1991-05-28 | 1991-07-30 | Method of forming passive film on stainless steel and stainless steel |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10204526A JPH10204526A (en) | 1998-08-04 |
| JP3045576B2 true JP3045576B2 (en) | 2000-05-29 |
Family
ID=27320281
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3212592A Expired - Lifetime JP3045576B2 (en) | 1991-05-28 | 1991-07-30 | Method of forming passive film on stainless steel and stainless steel |
| JP51015992A Expired - Lifetime JP3181053B2 (en) | 1991-05-28 | 1992-05-28 | Method for forming passive film on stainless steel, and stainless steel and fluid contact parts |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51015992A Expired - Lifetime JP3181053B2 (en) | 1991-05-28 | 1992-05-28 | Method for forming passive film on stainless steel, and stainless steel and fluid contact parts |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP0596121A4 (en) |
| JP (2) | JP3045576B2 (en) |
| WO (1) | WO1992021786A1 (en) |
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| JP3379070B2 (en) | 1992-10-05 | 2003-02-17 | 忠弘 大見 | Method of forming oxidation passivation film having chromium oxide layer on surface |
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| JPH07197206A (en) * | 1993-12-30 | 1995-08-01 | Tadahiro Omi | Stainless steel and piping system |
| JP2000208431A (en) * | 1999-01-13 | 2000-07-28 | Tadahiro Omi | Metal material having a chromium oxide passivation film formed thereon, method for producing the same, fluid contact part, and fluid supply / exhaust system |
| US6228445B1 (en) * | 1999-04-06 | 2001-05-08 | Crucible Materials Corp. | Austenitic stainless steel article having a passivated surface layer |
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| KR101686721B1 (en) * | 2012-03-08 | 2016-12-14 | 제이에프이 스틸 가부시키가이샤 | Seawater-resistant stainless clad steel |
| JP6502225B2 (en) * | 2015-09-30 | 2019-04-17 | 日本特殊陶業株式会社 | Ceramic heater and method of manufacturing the same |
| JPWO2017188209A1 (en) * | 2016-04-28 | 2019-02-14 | 富士フイルム株式会社 | Purification apparatus, purification method, manufacturing apparatus, chemical manufacturing method, container, and chemical container |
| CN112449658B (en) | 2018-07-06 | 2023-11-07 | 富士胶片株式会社 | Components, containers, chemical solution storage bodies, reaction tanks, distillation towers, filter units, storage tanks, pipelines, and methods for manufacturing chemical solutions |
| JP7492206B1 (en) | 2023-11-28 | 2024-05-29 | オロル株式会社 | Stainless steel components for semiconductor manufacturing equipment and their manufacturing method |
| JP7812167B2 (en) * | 2024-02-29 | 2026-02-09 | マルイ鍍金工業株式会社 | Surface treatment method for austenitic stainless steel |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3345218A (en) * | 1964-04-02 | 1967-10-03 | Owens Illinois Inc | Preoxidation of stainless steel for glass-to-metal sealing |
| US4078949A (en) * | 1976-09-02 | 1978-03-14 | United States Steel Corporation | Method for improving the surface quality of stainless steels and other chromium-bearing iron alloys |
| US4661171A (en) * | 1984-08-29 | 1987-04-28 | Shinko-Pfaudler Company, Ltd. | Method for treating the surface of stainless steel by high temperature oxidation |
| JP2517727B2 (en) * | 1987-07-25 | 1996-07-24 | 忠弘 大見 | Method for manufacturing stainless steel member for semiconductor manufacturing equipment |
| JPH0192389A (en) * | 1987-09-30 | 1989-04-11 | Aichi Steel Works Ltd | Method for preventing surface roughening of stainless steel wire rod during pickling |
| DE3804359C1 (en) * | 1988-02-12 | 1988-11-24 | Thyssen Edelstahlwerke Ag, 4000 Duesseldorf, De | |
| JP2768952B2 (en) * | 1988-08-04 | 1998-06-25 | 忠弘 大見 | Metal oxidation treatment apparatus and metal oxidation treatment method |
| JP2862546B2 (en) * | 1988-11-21 | 1999-03-03 | 神鋼パンテック株式会社 | Equipment piping materials for ultrapure water production and supply equipment |
| US5051140A (en) * | 1989-03-23 | 1991-09-24 | Mitsubishi Jidosha Kogyo Kabushiki Kaisha | Surface treatment method for titanium or titanium alloy |
-
1991
- 1991-07-30 JP JP3212592A patent/JP3045576B2/en not_active Expired - Lifetime
-
1992
- 1992-05-28 JP JP51015992A patent/JP3181053B2/en not_active Expired - Lifetime
- 1992-05-28 EP EP19920917389 patent/EP0596121A4/en not_active Withdrawn
- 1992-05-28 WO PCT/JP1992/000699 patent/WO1992021786A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP0596121A4 (en) | 1994-11-23 |
| JP3181053B2 (en) | 2001-07-03 |
| JPH10204526A (en) | 1998-08-04 |
| EP0596121A1 (en) | 1994-05-11 |
| WO1992021786A1 (en) | 1992-12-10 |
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