JP3082463B2 - Solid electrolytic capacitors - Google Patents
Solid electrolytic capacitorsInfo
- Publication number
- JP3082463B2 JP3082463B2 JP04255754A JP25575492A JP3082463B2 JP 3082463 B2 JP3082463 B2 JP 3082463B2 JP 04255754 A JP04255754 A JP 04255754A JP 25575492 A JP25575492 A JP 25575492A JP 3082463 B2 JP3082463 B2 JP 3082463B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- lead wire
- cathode
- sintered body
- solid electrolytic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は固体電解コンデンサに関
するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solid electrolytic capacitor.
【0002】[0002]
【従来の技術】タンタル等の固体電解コンデンサは、通
常、タンタル等の微粉末を、陽極用リード線を引き出し
た状態で円筒状や直方体状に加圧成形し、これを真空中
において高温度で焼結した焼結体を用いる。そして図2
に示す通り、この焼結体11に陽極酸化皮膜12、二酸
化マンガン層13、カーボン層14、銀層(又は銅層)
15を順次設け、陽極用リード線16には陽極端子5を
そして銀層15等には陰極端子17を接続してコンデン
サ素子を形成する。銀層15等を設けるには、カーボン
層14を設けた後の焼結体11を銀ペーストや銅ペース
ト中に浸漬し、ペーストを塗布して行う。この際、陰極
としての面積を広くするために、陽極用リード線16に
ペーストが接触しないようにして焼結体を長さ方向に8
0%以上ペースト中に浸漬し、銀層15等をその先端1
8が焼結体11の陽極用リード線16の引き出し面19
の位置にくるように形成している。陰極である銀層等の
面積を広くすることにより、tanδ やインピーダンス特
性を安定化できる。2. Description of the Related Art A tantalum or other solid electrolytic capacitor is usually formed by pressing a fine powder of tantalum or the like into a cylindrical shape or a rectangular parallelepiped shape with an anode lead wire drawn out, and then forming the material at high temperature in a vacuum. A sintered body is used. And FIG.
As shown in FIG. 2, anodized film 12, manganese dioxide layer 13, carbon layer 14, silver layer (or copper layer)
15 are sequentially provided, and the anode terminal 5 is connected to the anode lead wire 16 and the cathode terminal 17 is connected to the silver layer 15 and the like to form a capacitor element. In order to provide the silver layer 15 and the like, the sintered body 11 provided with the carbon layer 14 is immersed in a silver paste or a copper paste, and the paste is applied. At this time, in order to increase the area as the cathode, the sintered body is moved in the longitudinal direction by keeping the paste out of contact with the anode lead wire 16.
0% or more of the silver paste 15
8 is a drawing surface 19 of the anode lead wire 16 of the sintered body 11
It is formed so that it comes to the position of. By increasing the area of the silver layer or the like serving as a cathode, tan δ and impedance characteristics can be stabilized.
【0003】ところで、耐電圧試験やサージ耐圧試験を
行うと、コンデンサ素子には瞬間的に吸収電流が流れ
る。この吸収電流は抵抗のより低い部分を流れる。そし
て、従来のコンデンサ素子では、陽極用リード線から直
接銀層等を通り、陰極端子に抜ける経路抵抗が低いた
め、吸収電流はこの経路を流れる。When a withstand voltage test or a surge withstand voltage test is performed, an absorption current instantaneously flows through the capacitor element. This absorption current flows through the lower part of the resistance. In the conventional capacitor element, the path resistance from the anode lead directly through the silver layer or the like to the cathode terminal is low, so that the absorption current flows through this path.
【0004】[0004]
【発明が解決しようとする課題】しかし、吸収電流が流
れると、その経路で発熱する。そのため経路の近傍にあ
る二酸化マンガン層や陽極酸化皮膜が熱劣化する。これ
により、コンデンサは、漏れ電流が増加したり、短絡不
良を生じる欠点がある。However, when an absorption current flows, heat is generated in the path. Therefore, the manganese dioxide layer and the anodic oxide film near the route are thermally degraded. As a result, the capacitor has a drawback that the leakage current increases and short-circuit failure occurs.
【0005】本発明の目的は、以上の欠点を改良し、漏
れ電流を低下でき、短絡不良を防止できる固体電解コン
デンサを提供するものである。An object of the present invention is to provide a solid electrolytic capacitor which can improve the above drawbacks, reduce the leakage current, and prevent short circuit failure.
【0006】[0006]
【課題を解決するための手段】本発明は、上記の目的を
達成するために、陽極用リード線を引き出した、弁作用
を有する金属の焼結体に陽極酸化皮膜、半導体層並びに
カーボン層からなる内層及び銀又は銅を成分とする外層
からなる陰極層を設け、この陰極層の外層に陰極端子を
前記陽極用リード線と反対方向に引き出して接続した固
体電解コンデンサにおいて、陽極用リード線の引き出し
方向に向かって、焼結体の全長の1/4〜3/5の間に
先端を配置した陰極層の外層を設けることを特徴とする
固体電解コンデンサを提供するものである。SUMMARY OF THE INVENTION In order to achieve the above object, the present invention has a valve action in which an anode lead wire is drawn.
Anodized film, semiconductor layer and sintered metal
Inner layer consisting of carbon layer and outer layer containing silver or copper
And a cathode terminal on the outer layer of the cathode layer.
The solid lead pulled out and connected in the opposite direction to the anode lead wire
A solid electrolytic capacitor in which an outer layer of a cathode layer having a tip disposed between 1/4 and 3/5 of the entire length of a sintered body is provided in a body electrolytic capacitor in a drawing direction of a lead wire for an anode. Is provided.
【0007】[0007]
【作用】陰極層の外層を、その先端が陽極用リード線の
引き出し方向に向かって、焼結体の全長の1/4〜3/
5の間に位置するように、焼結体に形成する。そしてこ
の陰極層の外層に、陽極リード線と反対方向に引き出し
て陰極端子を接続する。そのために、陽極用リード線と
陰極端子との間の距離が長くなり、抵抗が従来よりも大
きくなる。従って、陽極用リード線から直接に陰極層の
外層を通って陰極端子に流れる電流を低下できる。According to the present invention, the outer layer of the cathode layer is formed such that its tip is directed toward the lead-out direction of the anode lead wire, and is 1/4 to 3/3 of the total length of the sintered body.
5 is formed on the sintered body. Then , pull out to the outer layer of this cathode layer in the direction opposite to the anode lead wire
Te to connect the cathode terminal. Therefore, the distance between the anode lead wire and the cathode terminal becomes longer, and the resistance becomes larger than before. Therefore, directly the cathode layer from the anode lead wire
The current flowing to the cathode terminal through the outer layer can be reduced.
【0008】[0008]
【実施例】以下、本発明を実施例に基づいて説明する。
図1において、1は、焼結体であり、タンタルの微粉末
を加圧成形し、真空中において高温度で焼結したもので
ある。2はこの焼結体1から引き出したタンタル製の陽
極用リード線である。3は焼結体1に設けた陽極酸化皮
膜である。4はこの陽極酸化皮膜3の全表面に設けた二
酸化マンガンからなる半導体層である。5は、カーボン
層であり、半導体層4の表面にその陽極用リード線2の
引き出し面6を除き積層したもので、陰極層の内層を形
成している。7は、銀や銅からなる陰極層の外層であ
り、焼結体1の全長Lの1/4〜3/5の間にその先端
8がくるようにカーボン層5の表面に積層している。9
はこの陰極層の外層7に接続した陰極端子であり、その
端10を外層7の先端8に合わせているがずらしてもよ
い。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below based on embodiments.
In FIG. 1, reference numeral 1 denotes a sintered body, which is obtained by pressing a fine powder of tantalum and sintering it at a high temperature in a vacuum. Reference numeral 2 denotes a tantalum anode lead wire drawn from the sintered body 1. Reference numeral 3 denotes an anodized film provided on the sintered body 1. Reference numeral 4 denotes a semiconductor layer made of manganese dioxide provided on the entire surface of the anodic oxide film 3. Reference numeral 5 denotes a carbon layer, which is laminated on the surface of the semiconductor layer 4 except for the lead-out surface 6 of the anode lead wire 2 and forms an inner layer of the cathode layer. Reference numeral 7 denotes an outer layer of a cathode layer made of silver or copper, which is laminated on the surface of the carbon layer 5 so that the tip 8 comes to 1 / to / of the total length L of the sintered body 1. . 9
Is a cathode terminal connected to the outer layer 7 of the cathode layer, the end 10 of which is aligned with the tip 8 of the outer layer 7, but may be shifted.
【0009】この実施例において、陽極酸化皮膜3は、
焼結体1を硝酸溶液やリン酸溶液等の化成液中に浸漬
し、電気化学的に化成処理して形成する。また、半導体
層4は、陽極酸化皮膜3を形成後の焼結体1を硝酸マン
ガン溶液中に浸漬してこの液を含浸し、焼成及び再化成
する工程を数回繰り返して所定の厚さに形成する。In this embodiment, the anodic oxide film 3
The sintered body 1 is immersed in a chemical conversion solution such as a nitric acid solution or a phosphoric acid solution, and is formed by electrochemical conversion treatment. Further, the semiconductor layer 4 is formed by immersing the sintered body 1 after the formation of the anodic oxide film 3 in a manganese nitrate solution, impregnating the solution, firing and re-chemically forming the semiconductor body 4 several times to a predetermined thickness. Form.
【0010】次に、上記実施例、従来例及び比較例につ
き、tanδ 及び破壊電圧値(以下BDVと略す)を測定
し、結果を表1に示した。なお、測定に用いた試料は、
定格35V10μFのタンタルチップ型固体電解コンデ
ンサであり、化成電圧140Vで化成処理したものであ
る。試料数は各々10ケとする。Next, tan δ and breakdown voltage (hereinafter abbreviated as BDV) were measured for the above Examples, Conventional Examples and Comparative Examples, and the results are shown in Table 1. The sample used for the measurement was
This is a tantalum chip type solid electrolytic capacitor rated at 35 V and 10 μF, which is subjected to a chemical conversion treatment at a chemical conversion voltage of 140 V. The number of samples is 10 each.
【0011】[0011]
【表1】 [Table 1]
【0012】表1から明らかな通り、実施例1及び実施
例2によればBDVが109〜111Vとなり、従来例
1に比較して約1.22〜1.25倍に上昇している。
また、実施例1及び実施例2は、比較例1及比較例2に
比べてもBDVが約1.08〜1.23倍上昇してお
り、特に比較例1に比べて tanδが約59〜62%減少
している。すなわち、陰極層の外層をその先端が焼結体
の全長Lの1/4〜3/5の位置にくるように設けるこ
とがBDVを上昇させるのに効果的であることがわか
る。As apparent from Table 1, according to the first and second embodiments, the BDV is 109-111 V, which is about 1.22-1.25 times higher than that of the conventional example 1.
Further, in Examples 1 and 2, the BDV is increased by about 1.08 to 1.23 times as compared with Comparative Examples 1 and 2, and particularly, tan δ is increased by about 59 to It has decreased by 62%. That is, it is found that providing the outer layer of the cathode layer such that the tip thereof is located at a position of 1/4 to 3/5 of the entire length L of the sintered body is effective for increasing the BDV.
【0013】また、実施例等につき、サージ電圧試験前
後の特性及び短絡不良率を測定し、表2にその結果を示
した。なお、実施例3は実施例1と、実施例4は実施例
2と、従来例2は従来例1と、比較例3は比較例1と、
比較例4は比較例2と各々同一の条件で製造したものと
する。これらの試料数は各々10ケとする。そしてサー
ジ電圧試験は、雰囲気の温度85℃、印加電圧45.5
Vで30秒間充電し、5分30秒間で放電するサイクル
を1000回繰り返して行う。Further, the characteristics and short-circuit failure rate before and after the surge voltage test were measured for Examples and the like, and Table 2 shows the results. Example 3 is Example 1, Example 4 is Example 2, Conventional Example 2 is Conventional Example 1, Comparative Example 3 is Comparative Example 1,
Comparative Example 4 is manufactured under the same conditions as Comparative Example 2. The number of these samples is 10 each. In the surge voltage test, the temperature of the atmosphere was 85 ° C., and the applied voltage was 45.5.
A cycle of charging with V for 30 seconds and discharging in 5 minutes and 30 seconds is repeated 1000 times.
【0014】[0014]
【表2】 [Table 2]
【0015】表2から明らかな通り、実施例3及び実施
例4によれば従来例2に比較して試験後の漏れ電流を約
29〜34%に減少でき、かつショート不良率を0%に
できる。また、実施例3及び実施例4は、比較例3及び
比較例4に比べても漏れ電流を約48〜60%に減少で
きる。As apparent from Table 2, according to Examples 3 and 4, the leakage current after the test can be reduced to about 29 to 34% and the short-circuit failure rate can be reduced to 0% as compared with Conventional Example 2. it can. In addition, the leakage current of Examples 3 and 4 can be reduced to about 48 to 60% as compared with Comparative Examples 3 and 4.
【0016】[0016]
【発明の効果】以上の通り、本発明によれば、陽極用リ
ード線を引き出した、弁作用を有する金属の焼結体に陽
極酸化皮膜、半導体層並びにカーボン層からなる内層及
び銀又は銅を成分とする外層からなる陰極層を設け、こ
の陰極層の外層に陰極端子を前記陽極用リード線と反対
方向に引き出して接続した固体電解コンデンサにおい
て、陰極層の外層をその先端が陽極用リード線の引き出
し方向に向かって、焼結体の全長の1/4〜3/5の間
に位置するようにして設けているため、tanδ が上昇す
るとなく、耐圧を向上でき、漏れ電流特性や短絡不良を
改善できる固体電解コンデンサが得られる。As described above, according to the present invention, the anode
Sintering of metal with valve action
Inner layer consisting of extreme oxide film, semiconductor layer and carbon layer
And a cathode layer consisting of an outer layer containing silver or copper as a component.
A cathode terminal on the outer layer of the cathode layer opposite to the anode lead wire
Of solid electrolytic capacitor
Since the outer layer of the cathode layer is provided so that its tip is located between 1 / to / of the entire length of the sintered body in the drawing direction of the anode lead wire, tan δ increases. Instead, it is possible to obtain a solid electrolytic capacitor capable of improving the breakdown voltage and improving the leakage current characteristics and short-circuit failure.
【図1】本発明の実施例の焼結体に陰極端子を接続した
状態の断面図を示す。FIG. 1 is a sectional view showing a state where a cathode terminal is connected to a sintered body according to an embodiment of the present invention.
【図2】従来例の焼結体に陰極端子を接続した状態の断
面図を示す。FIG. 2 is a sectional view showing a state in which a cathode terminal is connected to a conventional sintered body.
1…焼結体、 2…陽極用リード線、 3…陽極酸化皮
膜、 4…半導体層、5…カーボン層、 7…外層、
9…陰極端子。DESCRIPTION OF SYMBOLS 1 ... Sintered body, 2 ... Lead wire for anode, 3 ... Anodized film, 4 ... Semiconductor layer, 5 ... Carbon layer, 7 ... Outer layer,
9 ... Cathode terminal.
Claims (1)
有する金属の焼結体に陽極酸化皮膜、半導体層並びにカ
ーボン層からなる内層及び銀又は銅を成分とする外層か
らなる陰極層を設け、この陰極層の前記外層に陰極端子
を前記陽極用リード線と反対方向に引き出して接続した
固体電解コンデンサにおいて、陽極用リード線の引き出
し方向に向かって、焼結体の全長の1/4〜3/5の間
に先端を配置した陰極層の外層を設けることを特徴とす
る固体電解コンデンサ。An anodic oxide film, a semiconductor layer , and a metal are formed on a sintered body of a metal having a valve action from which an anode lead wire is drawn.
An inner layer consisting of a carbon layer and an outer layer containing silver or copper
And a cathode terminal on the outer layer of the cathode layer.
Was connected in the direction opposite to the lead wire for the anode in the solid electrolytic capacitor connected in a direction opposite to the lead wire for the anode. A solid electrolytic capacitor provided with an outer layer of a cathode layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04255754A JP3082463B2 (en) | 1992-08-31 | 1992-08-31 | Solid electrolytic capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04255754A JP3082463B2 (en) | 1992-08-31 | 1992-08-31 | Solid electrolytic capacitors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0684717A JPH0684717A (en) | 1994-03-25 |
| JP3082463B2 true JP3082463B2 (en) | 2000-08-28 |
Family
ID=17283168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP04255754A Expired - Lifetime JP3082463B2 (en) | 1992-08-31 | 1992-08-31 | Solid electrolytic capacitors |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3082463B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4900851B2 (en) * | 2009-05-15 | 2012-03-21 | 株式会社村田製作所 | Solid electrolytic capacitor element and solid electrolytic capacitor |
-
1992
- 1992-08-31 JP JP04255754A patent/JP3082463B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0684717A (en) | 1994-03-25 |
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