JP3087296B2 - Microwave semiconductor device - Google Patents
Microwave semiconductor deviceInfo
- Publication number
- JP3087296B2 JP3087296B2 JP02254442A JP25444290A JP3087296B2 JP 3087296 B2 JP3087296 B2 JP 3087296B2 JP 02254442 A JP02254442 A JP 02254442A JP 25444290 A JP25444290 A JP 25444290A JP 3087296 B2 JP3087296 B2 JP 3087296B2
- Authority
- JP
- Japan
- Prior art keywords
- package
- bias
- resistor circuit
- circuit board
- bias resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/753—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Microwave Amplifiers (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はマイクロ波帯集積回路に関し、とくに小型で
高周波特性のすぐれた半導体装置に関する。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microwave integrated circuit, and more particularly to a small semiconductor device having excellent high frequency characteristics.
従来、この種のマイクロ波集積回路は、多数のICチッ
プが縦続接続されて1個のパッケージ内に実装されて構
成されている。最良の高周波特性を得るために、半導体
素子へのバイアス電圧を最適に選ぶ手段としてパッケー
ジ外部の抵抗を調整する手法がとられている。Conventionally, this type of microwave integrated circuit is configured by cascade-connecting a large number of IC chips and mounting them in one package. In order to obtain the best high-frequency characteristics, a method of adjusting the resistance outside the package has been adopted as a means for optimally selecting a bias voltage to a semiconductor element.
半導体素子個々に外部の抵抗と接続するため、多段素
子の場合はパッケージにいくつもの接続リード端子を設
けなければならない。ICチップの形状はモノリシック化
等によって非常に小さくなってきているが、パッケージ
の形状が接続リード端子の数によって制限されるので装
置全体としての小型化はそれほど進展してないという欠
点がある。In order to connect each semiconductor element to an external resistor, in the case of a multi-stage element, a number of connection lead terminals must be provided in the package. Although the shape of an IC chip has become extremely small due to monolithicization, there is a drawback that the size of the entire device is not so advanced because the shape of the package is limited by the number of connection lead terminals.
従来のマイクロ波集積回路用半導体装置を第5図に示
す。2A〜2FがICチップで、素子としてFETの場合を用い
て説明する。パッケージ1には各チップからゲートバイ
アス印加のための接続リード端子5A〜5F及びドレインバ
イアス印加のための接続リード端子6A〜6Fが設けられて
いる。パッケージの形状はこれらのリード端子の物理的
間隔により制限を受けるため、いくつものリード端子を
必要とする構造では小型化には限度がある。FIG. 5 shows a conventional semiconductor device for a microwave integrated circuit. 2A to 2F are IC chips, and will be described using an FET as an element. The package 1 is provided with connection lead terminals 5A to 5F for applying a gate bias and connection lead terminals 6A to 6F for applying a drain bias from each chip. Since the shape of the package is limited by the physical spacing between these lead terminals, there is a limit to miniaturization in a structure that requires several lead terminals.
本発明の目的は、パッケージから外部電源への接続リ
ード端子の数を少くし、小型のマイクロ波集積回路用半
導体装置を提供することにある。An object of the present invention is to provide a small-sized semiconductor device for a microwave integrated circuit, in which the number of connection lead terminals from a package to an external power supply is reduced.
本発明のマイクロ波半導体装置は、複数個のICチップ
が1個のパッケージに実装されるマイクロ波半導体装置
において、前記パッケージ内に、同一基板上に一方の電
極が共通接続された複数個の薄膜抵抗とチップコンデン
サとを備えるバイアス抵抗回路基板を、少なくとも2つ
以上のICチップ当りに1つのバイアス抵抗回路基板が割
り当てられるようにマウントし、各々のICチップのバイ
アス電圧供給点ごとに、割り当てられたバイアス抵抗回
路基板上の複数個の薄膜抵抗からいずれか1つを選択
し、その選択した薄膜抵抗の他方の電極に接続すると共
に、前記バイアス抵抗回路基板上の複数個の薄膜抵抗の
一方の電極を共通接続した接続点を、前記パッケージの
側壁を貫通している1つのバイアスリード端子に電気的
に接続したことを特徴とする。A microwave semiconductor device according to the present invention is a microwave semiconductor device in which a plurality of IC chips are mounted in one package, wherein a plurality of thin films having one electrode commonly connected on the same substrate are provided in the package. A bias resistor circuit board including a resistor and a chip capacitor is mounted such that one bias resistor circuit board is assigned to at least two or more IC chips, and is assigned to each bias voltage supply point of each IC chip. One of the plurality of thin film resistors on the bias resistor circuit board, and connected to the other electrode of the selected thin film resistor, and one of the plurality of thin film resistors on the bias resistor circuit board. A connection point where the electrodes are commonly connected is electrically connected to one bias lead terminal penetrating the side wall of the package. That.
次に、本発明について図面を参照して説明する。 Next, the present invention will be described with reference to the drawings.
第1図は本発明の一実施例を示すパッケージ実装図で
ある。FIG. 1 is a package mounting diagram showing one embodiment of the present invention.
1はパッケージ、2A〜2FはICチップ、3A〜3Cはゲート
バイアス抵抗回路基板、5はゲートリード端子、6はド
レインリード端子である。各バイアス抵抗回路からの配
線が4本のリード端子に集まる構造としているためパッ
ケージの小型化が可能である。1 is a package, 2A to 2F are IC chips, 3A to 3C are gate bias resistance circuit boards, 5 is a gate lead terminal, and 6 is a drain lead terminal. Since the wiring from each bias resistance circuit is collected in four lead terminals, the package can be reduced in size.
2個のICチップとバイアス抵抗回路を拡大した図を第
2図に示す。太線は接地配線を示す。半導体素子のパラ
メータは製造上のばらつきがあり、最良の高周波特性を
得るためには個々のFETに印加されるバイアス電圧を最
適に調整する必要がある。FETバイアス回路例を第3図
に示す。RG1,RG2及びRD等を第2図のバイアス抵抗回路
基板内の4本の薄膜抵抗の中から選択し、ボンディング
により配線する。又バイアス抵抗回路基板にはバイアス
コンデンサ7,8(チップコンデンサ)等を設けることに
より異常発振防止に効果がある。FIG. 2 shows an enlarged view of the two IC chips and the bias resistor circuit. Thick lines indicate ground wiring. The parameters of the semiconductor element have manufacturing variations, and it is necessary to optimally adjust the bias voltage applied to each FET in order to obtain the best high-frequency characteristics. FIG. 3 shows an example of the FET bias circuit. R G1 , R G2, R D, etc. are selected from the four thin film resistors in the bias resistance circuit board shown in FIG. 2 and wired by bonding. Providing bias capacitors 7, 8 (chip capacitors) and the like on the bias resistor circuit board is effective in preventing abnormal oscillation.
このようにバイアス抵抗回路をICチップとは別の基板
に製作することによりバイアス抵抗の調整ができかつパ
ッケージの小型化も可能になる。By manufacturing the bias resistance circuit on a substrate different from the IC chip, the bias resistance can be adjusted and the size of the package can be reduced.
本発明のパッケージへの実装手順を簡単に説明する。
まず複数個の薄膜抵抗を形成したバイアス抵抗回路基板
にバイアスコンデンサ(チップコンデンサ)をマウント
し、この基板とICチップを同時にパッケージ内にマウン
トする。このあとバイアス抵抗回路基板相互の配線及び
ICチップとバイアス抵抗回路そしてバイアス抵抗回路と
リード端子とのボンディング配線工事を行う。尚バイア
ス抵抗の選択は、あらかじめ各ICチップ毎に高周波測定
用治具等を用いて高周波特性を評価し最適バイアス抵抗
うを決めておくことにする。抵抗値を任意に選択できる
ようにバイアス抵抗回路基板を数種類用意して自由に交
換するようにすればより自由度が増すことになる。A procedure for mounting the present invention on a package will be briefly described.
First, a bias capacitor (chip capacitor) is mounted on a bias resistor circuit board on which a plurality of thin film resistors are formed, and this board and an IC chip are simultaneously mounted in a package. After this, the wiring between the bias resistor circuit boards and
Perform bonding wiring work between IC chip and bias resistor circuit, and between bias resistor circuit and lead terminal. When selecting a bias resistor, the optimum bias resistor is determined in advance by evaluating the high-frequency characteristics of each IC chip using a high-frequency measurement jig or the like. If several types of bias resistance circuit boards are prepared and freely replaced so that the resistance value can be arbitrarily selected, the degree of freedom is further increased.
ICチップ数がさらに多い場合には、第4図に示すよう
に、ICチップ,バイアス抵抗回路基板及びリード端子か
らなるブロックを複数個設ければよいのである。When the number of IC chips is further increased, a plurality of blocks each composed of an IC chip, a bias resistor circuit board and lead terminals may be provided as shown in FIG.
このようにして、8段,10段という多段IC構造になっ
てもパッケージ側壁に必要なリード端子の数は4〜6個
程度であり小型パッケージという目的は充分に達成され
るものである。In this way, even in a multi-stage IC structure of eight or ten stages, the number of lead terminals required on the side wall of the package is about four to six, and the purpose of a small package is sufficiently achieved.
以上説明したように本発明は、複数個の抵抗及びバイ
パスコンデンサを含んだバイアス抵抗回路基板をパッケ
ージ内に収容することにより、パッケージを小型化でき
る効果がある。これによりこのパッケージを受信器,送
信器等に使用する場合外部にとりつけるバイアス抵抗が
不要になり、装置全体の小型化及び電気的調整の簡便化
が図れ、実用に供して非常に有益なものがある。As described above, the present invention has an effect that the package can be miniaturized by housing the bias resistance circuit board including the plurality of resistors and the bypass capacitors in the package. As a result, when this package is used for a receiver, a transmitter, or the like, an external bias resistor is not required, and the entire device can be reduced in size and electrical adjustment can be simplified. is there.
第1図は本発明の一実施例を示すパッケージ実装図、第
2図は第1図のバイアス抵抗回路部を拡大した実装図、
第3図はバイアス回路図、第4図は一実施例の変形を示
すパッケージ実装図、第5図は従来の半導体装置の構造
図を示す。 1……パッケージ、2A〜2J……ICチップ、3A〜3E……ゲ
ートバイアス抵抗回路、5,5A〜5F……ゲートリード端
子、6,6A〜6F……ドレインリード端子、7,8,9A〜9F,10A
〜10F……バイパスコンデンサ、RF IN……入力端子、R
F OUT……出力端子。FIG. 1 is a package mounting diagram showing an embodiment of the present invention, FIG. 2 is an enlarged mounting diagram of a bias resistor circuit portion of FIG. 1,
FIG. 3 is a bias circuit diagram, FIG. 4 is a package mounting diagram showing a modification of one embodiment, and FIG. 5 is a structural diagram of a conventional semiconductor device. 1. Package, 2A to 2J IC chip, 3A to 3E Gate bias resistor circuit, 5, 5A to 5F Gate lead terminal, 6, 6A to 6F Drain lead terminal, 7, 8, 9A ~ 9F, 10A
~ 10F: bypass capacitor, RF IN: input terminal, R
F OUT …… Output terminal.
フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H01L 23/12 301 H01L 25/00 Continuation of the front page (58) Field surveyed (Int. Cl. 7 , DB name) H01L 23/12 301 H01L 25/00
Claims (1)
装されるマイクロ波半導体装置において、 前記パッケージ内に、同一基板上に一方の電極が共通接
続された複数個の薄膜抵抗とチップコンデンサとを備え
るバイアス抵抗回路基板を、少なくとも2つ以上のICチ
ップ当りに1つのバイアス抵抗回路基板が割り当てられ
るようにマウントし、 各々のICチップのバイアス電圧供給点ごとに、割り当て
られたバイアス抵抗回路基板上の複数個の薄膜抵抗から
いずれか1つを選択し、その選択した薄膜抵抗の他方の
電極に接続すると共に、 前記バイアス抵抗回路基板上の複数個の薄膜抵抗の一方
の電極を共通接続した接続点を、前記パッケージの側壁
を貫通しているバイアスリード端子に電気的に接続した
ことを特徴とするマイクロ波半導体装置。1. A microwave semiconductor device in which a plurality of IC chips are mounted in one package, wherein a plurality of thin film resistors and a chip capacitor in which one electrode is commonly connected on the same substrate in the package. A bias resistor circuit board comprising: a bias resistor circuit board mounted such that one bias resistor circuit board is assigned to at least two or more IC chips; and a bias resistor circuit assigned to each bias voltage supply point of each IC chip. Any one of the plurality of thin film resistors on the substrate is selected and connected to the other electrode of the selected thin film resistor, and one electrode of the plurality of thin film resistors on the bias resistor circuit board is commonly connected. Wherein the connection point is electrically connected to a bias lead terminal penetrating the side wall of the package.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02254442A JP3087296B2 (en) | 1990-09-25 | 1990-09-25 | Microwave semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02254442A JP3087296B2 (en) | 1990-09-25 | 1990-09-25 | Microwave semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04132251A JPH04132251A (en) | 1992-05-06 |
| JP3087296B2 true JP3087296B2 (en) | 2000-09-11 |
Family
ID=17265064
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP02254442A Expired - Fee Related JP3087296B2 (en) | 1990-09-25 | 1990-09-25 | Microwave semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3087296B2 (en) |
-
1990
- 1990-09-25 JP JP02254442A patent/JP3087296B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04132251A (en) | 1992-05-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |