JP3100888B2 - Vacuum deposition equipment - Google Patents
Vacuum deposition equipmentInfo
- Publication number
- JP3100888B2 JP3100888B2 JP07279879A JP27987995A JP3100888B2 JP 3100888 B2 JP3100888 B2 JP 3100888B2 JP 07279879 A JP07279879 A JP 07279879A JP 27987995 A JP27987995 A JP 27987995A JP 3100888 B2 JP3100888 B2 JP 3100888B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- anode
- cathode
- vacuum chamber
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Physical Vapour Deposition (AREA)
Description
【0001】[0001]
【発明の技術分野】本発明は、真空蒸着装置の改良に関
する。TECHNICAL FIELD The present invention relates to an improvement in a vacuum evaporation apparatus.
【0002】[0002]
【従来の技術】この種の真空蒸着装置は、真空中で熱電
子により成膜原料ガスをイオン化し、イオン化蒸着物質
分子をマイナス電圧により基板の方向に加速し、基板に
保持されている被加工物に蒸着膜を形成する。2. Description of the Related Art A vacuum deposition apparatus of this type ionizes a film-forming raw material gas by thermal electrons in a vacuum, accelerates ionized vapor deposition material molecules in the direction of a substrate by a negative voltage, and processes the material to be processed held on the substrate. An evaporation film is formed on an object.
【0003】この蒸着過程で、蒸着物質が絶縁体のと
き、基板が蒸着膜によって被覆されるため、基板に次第
に電流が流れなくなり、成膜速度が遅くなってしまう。
測定の結果によると、直径250〔mm〕の基板におい
て、初期の電流値が4〔mA〕であっても、30分後の
電流値は2〔mA〕以下になり、ついにほとんど流れな
くなって膜の成長がほとんど止まってしまった。このた
め、次の加工に備えて、基板の表面から、蒸着膜の剥離
作業が不可欠となっている。[0003] In this vapor deposition process, when the vapor deposition material is an insulator, the substrate is covered with the vapor deposition film, so that current does not gradually flow through the substrate, and the film forming speed is reduced.
According to the measurement result, even if the initial current value was 4 mA on the substrate having a diameter of 250 mm, the current value after 30 minutes became 2 mA or less, and almost no current finally flowed. Has almost stopped growing. For this reason, in order to prepare for the next processing, the work of peeling the deposited film from the surface of the substrate is indispensable.
【0004】このような剥離作業のときに、真空槽の内
部に設けられている内カバー、カソード、およびアノー
ドを分解し、それらに付着している蒸着膜の除去作業も
行われている。この場合、蒸着膜が密着よく付いてい
て、なかなかとれないため、その除去(掃除)に4〜5
時間かかり、これが生産上大きなロスタイムとなってい
た。At the time of such a stripping operation, an inner cover, a cathode, and an anode provided inside the vacuum chamber are disassembled, and an operation of removing a deposited film adhered thereto is also performed. In this case, since the deposited film adheres well and cannot be easily removed, it is necessary to remove (clean) it by 4 to 5 times.
This was time consuming and this was a significant production time loss.
【0005】また、基板に直流のマイナス電圧がかけら
れているが、被加工物が絶縁体のとき、イオン化蒸着物
質分子の加速のコントロールが難しく、たて・よこ7
〔mm〕以上の面積についての均一の蒸着が困難であっ
た。直流電源の代わりに、高周波電源を用い、高周波電
圧を基板に印加すれば、絶縁膜の蒸着面積が直流のとき
よりも大きくなるが、高周波電源の価格が直流電源の3
倍程度と高くなるため、電源装置が高価なものとなって
いる。Although a DC negative voltage is applied to the substrate, when the workpiece is an insulator, it is difficult to control the acceleration of the ionized vapor deposition material molecules.
It was difficult to perform uniform deposition over an area of [mm] or more. If a high-frequency power supply is used instead of a DC power supply and a high-frequency voltage is applied to the substrate, the deposition area of the insulating film becomes larger than when the DC power supply is used.
The power supply device is expensive because it is about twice as high.
【0006】[0006]
【発明の目的】したがって、本発明の目的は、絶縁膜の
蒸着過程での基板の電流の減少を抑えること、基板に対
する直流電圧の印加状態で絶縁体試料の蒸着面積を大き
くすること、さらに真空槽の内部の内カバーやカソー
ド、アノードの掃除を容易に行えるようにすることであ
る。SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to suppress a decrease in the current of a substrate during the process of depositing an insulating film, to increase the deposition area of an insulator sample when a DC voltage is applied to the substrate, and to further reduce the vacuum. The purpose is to make it easy to clean the inner cover, cathode and anode inside the tank.
【0007】[0007]
【発明の解決手段】上記目的の下に、本発明は、真空槽
内のカソード、アノードに電圧を印加してカソードから
アノードに向けて熱電子を放出させ、この熱電子により
真空槽中の成膜原料ガスをイオン化し、イオン化蒸着物
質分子を基板にかけられたマイナス電圧により基板の方
向に加速することにより、基板に保持されている被加工
物に蒸着膜を形成する真空蒸着装置において、基板の面
積を被加工物の膜形成面の面積より大きくし、基板のカ
ソード・アノード対向面側にしゃへい板を設け、このし
ゃへい板に被加工物の膜形成面積に対応する大きさの開
口部を形成するとともに、しゃへい板のカソード・アノ
ード対向面側に基板に対して所定の間隔で導電性メッシ
ュ製の制御電極を配置し、この制御電極を基板と同じマ
イナス電位に設定し、さらに、真空槽の内部に内カバー
を真空槽、カソード・アノードのソケッと受けに対して
着脱自在に取り付け、カソード・アノードのホルダに対
してカソードおよびアノードを着脱自在に取り付けると
いう構成を採用している。According to the above object, the present invention applies a voltage to a cathode and an anode in a vacuum chamber to emit thermoelectrons from the cathode toward the anode. In a vacuum deposition apparatus that forms a deposition film on a workpiece held by a substrate by ionizing a film source gas and accelerating ionized deposition material molecules in the direction of the substrate by a negative voltage applied to the substrate, The area is larger than the area of the film forming surface of the workpiece, a shielding plate is provided on the cathode / anode facing side of the substrate, and an opening having a size corresponding to the film forming area of the workpiece is formed on this shielding plate. At the same time, a control electrode made of conductive mesh is placed at a predetermined distance from the substrate on the side of the shield plate facing the cathode and anode, and this control electrode is set to the same negative potential as the substrate Furthermore, the inner cover is detachably attached to the vacuum tank, the cathode / anode socket and the receiver inside the vacuum tank, and the cathode and the anode are detachably attached to the cathode / anode holder. ing.
【0008】蒸着時に、しゃへい板が基板のカソード・
アノード対向面側で、イオン化蒸着物質分子を遮断して
いるため、遮断された部分で基板にイオン化蒸着物質分
子が付着せず、これによって、基板電流が減少しなくな
る。また、しゃへい板のカソード・アノード対向面側に
制御電極があり、これがイオン化蒸着物質分子を均一に
拡散しているため、被加工物が絶縁体であっても、大き
な範囲で均一な電界が得られ、大きな面積で絶縁膜の蒸
着が行える。[0008] At the time of vapor deposition, the shielding plate is
Since the ionized vapor deposition material molecules are blocked on the side facing the anode, the ionized vapor deposition material molecules do not adhere to the substrate at the blocked portion, and thus the substrate current does not decrease. In addition, there is a control electrode on the side of the shield plate facing the cathode and anode, which uniformly diffuses ionized deposition material molecules, so that even if the workpiece is an insulator, a uniform electric field can be obtained over a large range. Thus, the insulating film can be deposited over a large area.
【0009】さらに、真空槽の内部から内カバーが容易
に取り出せ、またカソードおよびアノードもホルダに対
し簡単に着脱できるため、連続的な蒸着過程で、それら
を予備のものと取り替えることによって、蒸着作業がロ
ス時間のない状態で連続的に行える。Further, since the inner cover can be easily taken out from the inside of the vacuum chamber and the cathode and anode can be easily attached to and detached from the holder, they can be replaced by a spare one in a continuous vapor deposition process. Can be continuously performed without any loss time.
【0010】[0010]
【実施例】図1ないし図7は、本発明の真空蒸着装置1
の具体的な構成を示している。真空蒸着装置1は、真空
槽2の内部で、カソード3、アノード4、内カバー5、
基板6および制御電極7などを備えている。真空槽2
は、底板8、筒体9、蓋板10によって密閉できるよう
構成されている。なお、蓋板10は、開閉機構によっ
て、筒体9の上面に対して垂直に開閉できるようになっ
ている。1 to 7 show a vacuum deposition apparatus 1 according to the present invention.
Is shown. The vacuum evaporation apparatus 1 includes a cathode 3, an anode 4, an inner cover 5,
A substrate 6 and a control electrode 7 are provided. Vacuum chamber 2
Is configured so that it can be hermetically closed by the bottom plate 8, the cylindrical body 9, and the lid plate 10. The lid plate 10 can be opened and closed vertically with respect to the upper surface of the cylindrical body 9 by an opening and closing mechanism.
【0011】カソード3およびアノード4は、真空槽2
の内部のやや下方で、向き合っており、絶縁体のソケッ
ト11、12により絶縁体のソケット受け13の内部に
収められ、それぞれ端子14、15に対して電気的に接
続した状態で、ナット16によりソケット受け13に着
脱自在に取り付けられている。なお、ソケット受け13
および端子14、15は、2本のサポート17やパイプ
18などによって、底板8に取り付けられた端子板19
に固定されている。The cathode 3 and the anode 4 are connected to a vacuum chamber 2
Are slightly opposed to each other, are housed in an insulator socket receiver 13 by insulator sockets 11 and 12, and are electrically connected to terminals 14 and 15 by nuts 16. It is detachably attached to the socket receiver 13. The socket receiver 13
And terminals 14 and 15 are connected to a terminal plate 19 attached to the bottom plate 8 by two supports 17 and pipes 18.
It is fixed to.
【0012】また、内カバー5は、上面開口型であっ
て、真空槽2の内部に収められ、基板8の上の支え20
の上に乗り、ソケット受け13に対してソケット受け1
3とほぼ等しい孔の部分で上下の押えナット21によっ
てソケット受け13に対して着脱自在に取り付けられて
いる。なお、炭化水素ガスや、有機金属ガス(Moガ
ス)などの成膜原料ガス22は、導入バルブ23を経
て、内カバー5のほぼ中央のガス吐出口24から真空槽
2の内部に供給され、拡散板40により放射状に流入す
る。The inner cover 5 is of a top opening type, is housed in the vacuum chamber 2 and has a support 20 on the substrate 8.
On the socket receiver 13 and the socket receiver 1 against the socket receiver 13.
3 is detachably attached to the socket receiver 13 by upper and lower presser nuts 21 at a hole portion substantially equal to that of the socket receiver 3. Note that a film forming material gas 22 such as a hydrocarbon gas or an organic metal gas (Mo gas) is supplied to the inside of the vacuum chamber 2 from a gas discharge port 24 substantially at the center of the inner cover 5 via an introduction valve 23. Radiation flows in by the diffusion plate 40.
【0013】また、基板6は、真空槽2の内部で、回転
軸26の下端部分に取り付けられており、保持具27の
部分で例えば4つの被加工物28を下向きの状態で保持
している。回転軸26は、冷却水の循環路を兼用してお
り、蓋板10に取り付けられた軸受け29に対して回転
自在に取り付けられ、蒸着工程中に駆動モータ30、タ
イミングベルト・プーリ31によって所定の速度で回転
できるように取り付けられている。なお、フィルター付
の排気口25には、真空ポンプ32が取り付けられてい
る。The substrate 6 is attached to the lower end of the rotary shaft 26 inside the vacuum chamber 2 and holds, for example, four workpieces 28 in a downward direction at the holder 27. . The rotating shaft 26 also serves as a cooling water circulation path, is rotatably mounted on a bearing 29 mounted on the cover plate 10, and is driven by a drive motor 30 and a timing belt pulley 31 during a vapor deposition process. It is mounted so that it can rotate at speed. In addition, a vacuum pump 32 is attached to the exhaust port 25 with a filter.
【0014】基板6の面積は、4つの被加工物28の合
計膜形成面積より大きくなっておりカソード3・アノー
ド4に対する対向面側でしゃへい板33を有している。
このしゃへい板33は、基板6とほぼ同じ大きさで、基
板8に対し適当な間隔をおいて、平行な状態で取り付け
られており、4つの被加工物28の膜形成面積よりやや
大きな開口部34を有している。The area of the substrate 6 is larger than the total film forming area of the four workpieces 28 and has a shielding plate 33 on the side facing the cathode 3 and the anode 4.
The shielding plate 33 is substantially the same size as the substrate 6, is attached in parallel with the substrate 8 at an appropriate interval, and has an opening slightly larger than the film forming area of the four workpieces 28. 34.
【0015】また、制御電極7は、導電性メッシュによ
って製作されており、しゃへい板33に対してカソード
3・アノード4の対向面側にあって、基板6に対して所
定の間隔をおいて配置されている。このメッシュの大き
さは、直流電源による蒸着面積の最大値に対応させて、
たて・よこ7〔mm〕以下に設定する。なお、この制御
電極7にもカソード3・アノード4と対向する側に、必
要に応じて、開口部39を有するしゃへい板38が取り
付けられる。The control electrode 7 is made of a conductive mesh, is located on the side facing the cathode 3 and the anode 4 with respect to the shielding plate 33, and is arranged at a predetermined distance from the substrate 6. Have been. The size of this mesh corresponds to the maximum value of the deposition area by DC power supply,
Set it to 7 mm or less. In addition, a shielding plate 38 having an opening 39 is attached to the control electrode 7 on the side facing the cathode 3 and the anode 4 as necessary.
【0016】そして、前記カソード3は、交流電源35
に接続されており、またアノード4は、直流電源36の
プラス側に、また基板6および制御電極7は、共に共通
の直流電源37のマイナス側に接続されている。The cathode 3 is connected to an AC power supply 35.
The anode 4 is connected to the positive side of a DC power supply 36, and the substrate 6 and the control electrode 7 are both connected to the negative side of a common DC power supply 37.
【0017】蒸着時に、4つの被加工物28を保持具2
7により基板6に固定し、蓋板10を筒体9の上面にあ
てがった状態で、真空ポンプ32によって、真空槽2の
内部を適当な真空度の状態とする。この状態で、導入バ
ルブ23から例えばダイヤモンド状カーボン膜形成のた
めに、炭化水素(CH4 )系の成膜原料ガス22が真空
槽2の内部に供給される。カソード3およびアノード4
に電圧を印加すると、カソード3からアノード4に向け
て熱電子が放出される。この熱電子は、真空槽2の内部
の成膜原料ガス22をイオン化し、プラズマの状態とす
る。基板6および制御電極7は、マイナス電位によっ
て、イオン化蒸着物質分子(イオン化炭化水素分子)を
基板6の方向に加速し、被加工物28の表面にダイヤモ
ンド状カーボン膜の蒸着膜を形成する。At the time of vapor deposition, the four workpieces 28 are
With the cover 7 fixed to the substrate 6 with 7 and the cover plate 10 applied to the upper surface of the cylindrical body 9, the inside of the vacuum chamber 2 is brought into a state of an appropriate degree of vacuum by the vacuum pump 32. In this state, a hydrocarbon (CH 4 ) -based source gas 22 is supplied from the introduction valve 23 into the vacuum chamber 2 to form, for example, a diamond-like carbon film. Cathode 3 and anode 4
Is applied, a thermoelectron is emitted from the cathode 3 toward the anode 4. These thermoelectrons ionize the film forming raw material gas 22 inside the vacuum chamber 2 to be in a plasma state. The substrate 6 and the control electrode 7 accelerate the ionized deposition substance molecules (ionized hydrocarbon molecules) in the direction of the substrate 6 by the negative potential, and form a diamond-like carbon film on the surface of the workpiece 28.
【0018】この蒸着過程で、イオン化炭化水素分子
は、制御電極7によって、均一に拡散されるため、直流
電位の絶縁体の被加工物28に対し広い面積で衝突す
る。またイオン化炭化水素分子は、しゃへい板33の開
口部34を経て、ほとんど被加工物28の蒸着面に衝突
し、電極6の外周縁表面およびしゃへい板33の裏面に
回り込まない。この結果、基板6に対するイオン化炭化
水素分子の付着が少なくなり、これによる電流の減少が
未然に防止できる。同様に、制御電極7についてもしゃ
へい板38が存在するため、しゃへい板38の開口部3
9と対応する以外の部分での絶縁性の蒸着膜の形成が抑
えられる。したがって、長い時間にわたって成膜速度が
一定で安定な膜形成が可能となる。In this vapor deposition process, the ionized hydrocarbon molecules are uniformly diffused by the control electrode 7, and therefore collide with a large area against the workpiece 28, which is a DC potential insulator. In addition, the ionized hydrocarbon molecules almost collide with the vapor deposition surface of the workpiece 28 through the opening 34 of the shielding plate 33, and do not go around the outer peripheral surface of the electrode 6 and the back surface of the shielding plate 33. As a result, adhesion of the ionized hydrocarbon molecules to the substrate 6 is reduced, and a decrease in current due to this can be prevented. Similarly, since the control electrode 7 also has the shielding plate 38, the opening 3 of the shielding plate 38 is formed.
The formation of an insulating vapor-deposited film in portions other than those corresponding to No. 9 is suppressed. Therefore, a stable film can be formed at a constant film forming rate over a long time.
【0019】蒸着が完了した時点で、蓋板10を開放
し、基板6の保持具27から被加工物28が取り外され
る。この状態で、必要に応じ、カソード3、アノード4
および内カバー5の内部の清掃(蒸着膜の除去)が行わ
れる。この清掃時に、ナット16を緩めることによっ
て、カソード3およびアノード4がソケット受け13か
ら簡単に取り外せる。また、押えナット21を緩めるこ
とによって、内カバー5がソケット受け13から分離す
るため、真空槽2の内部から取り出して、清掃できる状
態となる。したがって、取り外し後の内カバー5、カソ
ード3およびアノード4の清掃中に、予備の内カバー
5、カソード3およびアノード4を装着すれば使用済の
内カバー5、カソード3、アノード4の清掃中に、予備
のものによって蒸着作業が継続できることになる。When the vapor deposition is completed, the cover plate 10 is opened, and the workpiece 28 is removed from the holder 27 of the substrate 6. In this state, if necessary, the cathode 3 and the anode 4
And the inside of the inner cover 5 is cleaned (removal of the deposited film). During this cleaning, the cathode 3 and the anode 4 can be easily removed from the socket receiver 13 by loosening the nut 16. Further, by loosening the presser nut 21, the inner cover 5 is separated from the socket receiver 13, so that the inner cover 5 can be taken out of the vacuum chamber 2 and cleaned. Therefore, if the spare inner cover 5, the cathode 3, and the anode 4 are attached during the cleaning of the inner cover 5, the cathode 3, and the anode 4 after the removal, the used inner cover 5, the cathode 3, and the anode 4 are cleaned during the cleaning. In addition, the preliminary operation allows the vapor deposition operation to be continued.
【0020】[0020]
【発明の効果】本発明では、つぎの特有の効果が得られ
る。蒸着時に、しゃへい板が基板のカソード・アノード
対向面側で、イオン化蒸着物質分子を遮断しているた
め、遮断された部分で基板にイオン化蒸着物質分子が付
着せず、これによって、電流が減少しなくなる。また、
しゃへい板のカソード・アノード対向面側に制御電極が
あり、これがイオン化蒸着物質分子を均一に拡散してい
るため、被加工物が絶縁体であっても、大きな範囲で均
一な電界が得られ、大きな面積で絶縁膜の蒸着が行え
る。さらに、真空槽の内部から内カバーが容易に取り出
せ、またカソードおよびアノードもホルダに対し簡単に
着脱できるため、連続的な蒸着過程で、それらを予備の
ものと取り替えることによって、蒸着作業がロス時間の
ない状態で連続的に行える。According to the present invention, the following specific effects can be obtained. During deposition, the shielding plate blocks the ionized vapor deposition material molecules on the cathode / anode facing side of the substrate, so that the ionized vapor deposition material molecules do not adhere to the substrate at the cut-off portion, thereby reducing the current. Disappears. Also,
There is a control electrode on the cathode / anode facing side of the shielding plate, which uniformly diffuses the ionized deposition material molecules, so that even if the workpiece is an insulator, a uniform electric field can be obtained over a large range. An insulating film can be deposited over a large area. Furthermore, since the inner cover can be easily removed from the inside of the vacuum chamber and the cathode and anode can be easily attached to and detached from the holder, replacing them with spare ones in the continuous evaporation process can reduce the evaporation time. It can be done continuously without any
【図1】真空蒸着装置の断面図である。FIG. 1 is a sectional view of a vacuum evaporation apparatus.
【図2】アノードおよびアノードの支持部分の正面図で
ある。FIG. 2 is a front view of an anode and a supporting portion of the anode.
【図3】カソードおよびアノードの支持部分の一部の断
面図である。FIG. 3 is a cross-sectional view of a part of a supporting portion of a cathode and an anode.
【図4】基板およびしゃへい板の平面図である。FIG. 4 is a plan view of a substrate and a shielding plate.
【図5】基板およびしゃへい板の断面図である。FIG. 5 is a sectional view of a substrate and a shielding plate.
【図6】制御電極およびしゃへい板の平面図である。FIG. 6 is a plan view of a control electrode and a shielding plate.
【図7】制御電極およびしゃへい板の断面図である。FIG. 7 is a sectional view of a control electrode and a shielding plate.
1 真空蒸着装置 21 押えナット 2 真空槽 22 成膜原料ガ
ス 3 カソード 23 導入バルブ 4 アノード 24 ガス吐出口 5 内カバー 25 フィルター
付の排気口 6 基板 26 回転軸 7 制御電極 27 保持具 8 底板 28 被加工物 9 筒体 29 軸受け 10 蓋板 30 駆動モー
タ 11 ソケット 31 タイミン
グベルト・プーリ 12 ソケット 32 真空ポン
プ 13 ソケット受け 33 しゃへい
板 14 端子 34 開口部 15 端子 35 交流電源 16 ナット 36 直流電源 17 サポート 37 直流電源 18 パイプ 38 しゃへい
板 19 端子板 39 開口部 20 支え 40 拡散板DESCRIPTION OF SYMBOLS 1 Vacuum vapor deposition apparatus 21 Holding nut 2 Vacuum tank 22 Film forming material gas 3 Cathode 23 Introducing valve 4 Anode 24 Gas discharge port 5 Inner cover 25 Filter outlet 6 Substrate 26 Rotating shaft 7 Control electrode 27 Holder 8 Bottom plate 28 Cover Workpiece 9 Cylindrical body 29 Bearing 10 Cover plate 30 Drive motor 11 Socket 31 Timing belt pulley 12 Socket 32 Vacuum pump 13 Socket receiver 33 Shielding plate 14 Terminal 34 Opening 15 Terminal 35 AC power supply 16 Nut 36 DC power supply 17 Support 37 DC Power supply 18 Pipe 38 Shielding plate 19 Terminal plate 39 Opening 20 Support 40 Diffusion plate
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) C23C 14/00 - 14/58 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) C23C 14/00-14/58
Claims (1)
印加して、カソードからアノードに向けて熱電子を放出
させ、この熱電子により真空槽中の成膜原料ガスをイオ
ン化し、イオン化蒸着物質分子を基板にかけられたマイ
ナス電圧により基板の方向に加速することにより、基板
に保持されている被加工物に蒸着膜を形成する真空蒸着
装置において、 基板の面積を被加工物の膜形成面の面積より大きくし、
基板のカソード・アノード対向面側にしゃへい板を設
け、このしゃへい板に被加工物の膜形成面積に対応する
大きさの開口部を形成するとともに、しゃへい板のカソ
ード・アノード対向面側に基板に対して所定の間隔で導
電性メッシュ製の制御電極を配置し、この制御電極を基
板と同じマイナス電位に設定し、さらに、真空槽の内部
に内カバーを真空槽、カソード・アノードのホルダに対
して着脱自在に取り付け、カソード・アノードのソケッ
ト受けに対してカソードおよびアノードを着脱自在に取
り付けてなることを特徴とする真空蒸着装置。1. A voltage is applied to a cathode and an anode in a vacuum chamber to emit thermoelectrons from the cathode to the anode, and the thermoelectrons ionize a film-forming material gas in the vacuum chamber to form an ionized vapor deposition material. In a vacuum deposition apparatus that forms a vapor deposition film on a workpiece held on a substrate by accelerating molecules in the direction of the substrate by a negative voltage applied to the substrate, the area of the substrate is reduced by the area of the film formation surface of the workpiece. Larger than the area,
A shield plate is provided on the cathode / anode facing side of the substrate, and an opening having a size corresponding to the film formation area of the workpiece is formed on the shielding plate. A control electrode made of a conductive mesh is arranged at a predetermined interval, the control electrode is set to the same negative potential as the substrate, and an inner cover is provided inside the vacuum chamber with respect to the vacuum chamber and the cathode / anode holder. And a cathode and an anode are detachably attached to a cathode / anode socket receiver.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP07279879A JP3100888B2 (en) | 1995-10-04 | 1995-10-04 | Vacuum deposition equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP07279879A JP3100888B2 (en) | 1995-10-04 | 1995-10-04 | Vacuum deposition equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09104971A JPH09104971A (en) | 1997-04-22 |
| JP3100888B2 true JP3100888B2 (en) | 2000-10-23 |
Family
ID=17617217
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP07279879A Expired - Fee Related JP3100888B2 (en) | 1995-10-04 | 1995-10-04 | Vacuum deposition equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3100888B2 (en) |
-
1995
- 1995-10-04 JP JP07279879A patent/JP3100888B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH09104971A (en) | 1997-04-22 |
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