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JP3131004B2 - Manufacturing method of laminated porcelain electronic components - Google Patents
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JP3131004B2 - Manufacturing method of laminated porcelain electronic components - Google Patents

Manufacturing method of laminated porcelain electronic components

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Publication number
JP3131004B2
JP3131004B2 JP04048740A JP4874092A JP3131004B2 JP 3131004 B2 JP3131004 B2 JP 3131004B2 JP 04048740 A JP04048740 A JP 04048740A JP 4874092 A JP4874092 A JP 4874092A JP 3131004 B2 JP3131004 B2 JP 3131004B2
Authority
JP
Japan
Prior art keywords
electronic component
temperature
palladium
manufacturing
laminated ceramic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP04048740A
Other languages
Japanese (ja)
Other versions
JPH05251264A (en
Inventor
高哉 石垣
正利 石川
弘次 田中
伸一 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
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Filing date
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Priority to JP04048740A priority Critical patent/JP3131004B2/en
Publication of JPH05251264A publication Critical patent/JPH05251264A/en
Application granted granted Critical
Publication of JP3131004B2 publication Critical patent/JP3131004B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、積層磁器コンデサ,積
層形アクチュエータ,積層形バリスタ等の積層磁器電子
部品の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a laminated ceramic electronic component such as a laminated ceramic capacitor, a laminated actuator, and a laminated varistor.

【0002】[0002]

【従来の技術】近年、内部電極に金属パラジウムを使用
した積層磁器電子部品が多数使われている。
2. Description of the Related Art In recent years, many laminated ceramic electronic components using metal palladium for internal electrodes have been used.

【0003】しかしながら、金属パラジウムは焼成工程
で酸化してその体積が膨脹するため、内部欠陥(デラミ
ネーション,クラック等)を招く原因となっている。
[0003] However, metallic palladium is oxidized in the firing step and its volume expands, which causes internal defects (delamination, cracks, etc.).

【0004】このため、内部電極の体積膨脹を緩和する
ことは、積層磁器電子部品の生産効率の向上を図る上で
極めて重要なことであり、従来より、金属パラジウムの
酸化による体積膨脹を緩和する方法として、以下の方法
が主に採られていた。
[0004] For this reason, it is extremely important to reduce the volume expansion of the internal electrodes in order to improve the production efficiency of the laminated ceramic electronic component. Conventionally, the volume expansion due to the oxidation of metallic palladium is alleviated. As a method, the following method was mainly adopted.

【0005】(1) 窒素雰囲気下で焼成を行い、パラジウ
ムの酸化を抑制する。
(1) Sintering is performed in a nitrogen atmosphere to suppress oxidation of palladium.

【0006】(2) 粒径の大きいパラジウム粉を使用し、
パラジウムの酸化速度を遅らせる。
(2) Using palladium powder having a large particle size,
Slows the rate of oxidation of palladium.

【0007】(3) 各種添加物によりパラジウムの酸化を
抑制したり、パラジウムの焼成を促進させ、体積膨脹を
緩和させる。
(3) Various additives suppress the oxidation of palladium, promote the firing of palladium, and reduce the volume expansion.

【0008】(4) 酸化と焼成が同時に進行するパラジウ
ム粉を使用し、体積膨脹を緩和させる。
(4) The volume expansion is reduced by using palladium powder in which oxidation and calcination proceed simultaneously.

【0009】(5) パラジウム電極ペーストを薄く印刷
し、パラジウムの酸化による体積膨脹の絶対量を減ら
す。
(5) The palladium electrode paste is printed thinly to reduce the absolute volume expansion due to the oxidation of palladium.

【0010】[0010]

【発明が解決しようとする課題】一方、積層磁器電子部
品においては、小型高容量化及び低コスト化の観点か
ら、磁器誘電体層の厚さ及び内部電極層の厚さを薄くす
るとともに、内部電極層の数を多くすることが試みられ
ている。
On the other hand, in the case of a laminated ceramic electronic component, the thickness of the ceramic dielectric layer and the thickness of the internal electrode layer are reduced from the viewpoint of miniaturization, high capacity, and cost reduction. Attempts have been made to increase the number of electrode layers.

【0011】例えば、積層磁器コンデンサの場合を例に
とると、容量を増大させるためには、電極層間の誘電体
層の厚みを薄くし、かつ、互いに対向する内部電極層の
数を多くすることが望ましい。
For example, taking the case of a laminated ceramic capacitor as an example, in order to increase the capacitance, it is necessary to reduce the thickness of the dielectric layer between the electrode layers and increase the number of internal electrode layers facing each other. Is desirable.

【0012】しかしながら、誘電体層の厚みが例えば1
0μm以下と薄く、内部電極層の数が例えば50層以上
と多い高容量の積層磁器電子部品の場合は、金属パラジ
ウムの酸化による体積膨脹を緩和する上述した従来の方
法では、内部欠陥(デラミネーション,クラック等)を
完全に防止することができず、次のような問題を生じて
いた。
However, if the thickness of the dielectric layer is, for example, 1
In the case of a high-capacity laminated porcelain electronic component having a thickness as small as 0 μm or less and having a large number of internal electrode layers, for example, as many as 50 or more, the above-described conventional method for alleviating volume expansion due to oxidation of metallic palladium does not provide internal defects (delamination). , Cracks, etc.) could not be completely prevented, causing the following problems.

【0013】(1) 窒素雰囲気下で焼成を行った場合は、
パラジウムの酸化は完全に抑制することができるが、パ
ラジウムが過焼結化し、電極ぎれが発生する。この結
果、静電容量が低下してしまう。
(1) When firing is performed in a nitrogen atmosphere,
Oxidation of palladium can be completely suppressed, but palladium is over-sintered, causing electrode breakage. As a result, the capacitance decreases.

【0014】(2) 粒径の大きいパラジウム粉を使用した
場合は、内部電極層の厚みを薄くすることができず、コ
スト高となってしまう。
(2) When palladium powder having a large particle size is used, the thickness of the internal electrode layer cannot be reduced, resulting in an increase in cost.

【0015】(3) 内部電極ペースト中に添加物を入れた
ものを使用した場合は、内部電極面の被覆率が低下し、
誘電体損失,等価直列抵抗等が悪化する。
(3) When an additive is added to the internal electrode paste, the coverage of the internal electrode surface decreases,
The dielectric loss, the equivalent series resistance, etc., deteriorate.

【0016】(4) 酸化と焼結が同時に進行するパラジウ
ム粉を使用した場合は、電極の数が50層を超えると、
内部欠陥が発生することがある。
(4) When using palladium powder in which oxidation and sintering proceed simultaneously, if the number of electrodes exceeds 50,
Internal defects may occur.

【0017】(5) パラジウム電極ペーストを薄く印刷し
た場合は、内部欠陥の発生は抑制されるが、電極厚みの
ばらつきにより電極がとぎれて静電容量が低下すること
もある。
(5) When the palladium electrode paste is printed thinly, the occurrence of internal defects is suppressed, but the electrodes may be cut off due to variations in the electrode thickness, and the capacitance may decrease.

【0018】そこで、本発明は、上記事情に鑑みてなさ
れたものであり、小型で高容量の積層磁器電子部品を効
率良く製造できる積層磁器電子部品の製造方法を提供す
ることを目的とする。
Accordingly, the present invention has been made in view of the above circumstances, and an object of the present invention is to provide a method for manufacturing a laminated ceramic electronic component capable of efficiently producing a small, high-capacity laminated ceramic electronic component.

【0019】[0019]

【課題を解決するための手段】上記目的を達成するため
に本発明は、磁器層間に金属パラジウムからなる内部電
極層を積層したものを、焼成する工程を有する積層磁器
電子部品の製造方法において、前記焼成する工程は、
温乃至400℃の昇温領域における昇温速度を300℃
/hとし、400乃至900℃の昇温領域における昇温
速度を600℃/h以上とし、900乃至1360℃の
昇温領域における昇温速度を300℃/hとしたことを
特徴とするものである。
In order to achieve the above object, the present invention provides a method for manufacturing a laminated porcelain electronic component comprising a step of firing an internal electrode layer made of metal palladium between porcelain layers. The firing step is performed in a chamber
The temperature rise rate in the temperature rise area from temperature to 400 ° C is 300 ° C.
/ H, the rate of temperature rise in the temperature rise region of 400 to 900 ° C. is 600 ° C./h or more ,
The heating rate in the heating area is 300 ° C./h .

【0020】[0020]

【作用】このように構成された積層磁器電子部品の製造
方法の作用を説明する。
The operation of the method for manufacturing a laminated ceramic electronic component having such a configuration will be described.

【0021】金属パラジウムは、その粒径にもよるが、
大気中で約400乃至800℃において酸化し、800
℃以上では還元して金属パラジウムに戻る。また、この
酸化速度は、金属パラジウムの状態により異なるが、い
ずれにしても時間と温度の関数で定まる。800℃以下
の温度領域において、温度が高い程、また、時間が長い
程、酸化反応は進み、それに比例した体積膨脹も起き
る。室温から一瞬にして800℃以上の温度領域まで昇
温することができれば、反応時間は0となり酸化反応は
起きない。すなわち、昇温速度が速くなる程、酸化反応
時間は短くなり、パラジウムの酸化量及び体積膨脹量も
少なくなる。この結果、内部欠陥が発生しにくい積層磁
器電子部品を得ることができる。しかし、このように一
瞬にして昇温することは不可能であるから、徐々に昇温
し、前記酸化反応が顕著な400乃至900℃の領域を
急速昇温し、900℃以上では再び徐々に昇温するとい
う構成を採用している。
Metal palladium depends on its particle size.
Oxidizes at about 400-800 ° C in air, 800
Above ℃, it returns to metallic palladium. The oxidation rate varies depending on the state of the metal palladium, but is determined by a function of time and temperature in any case. In a temperature range of 800 ° C. or less, the higher the temperature and the longer the time, the more the oxidation reaction proceeds, and a proportional volume expansion occurs. If the temperature can be raised instantaneously from room temperature to a temperature range of 800 ° C. or higher, the reaction time becomes 0 and no oxidation reaction occurs. That is, the higher the rate of temperature rise, the shorter the oxidation reaction time, and the smaller the amount of oxidation and volume expansion of palladium. As a result, it is possible to obtain a laminated ceramic electronic component in which internal defects hardly occur. But like this one
It is impossible to raise the temperature instantaneously, so the temperature gradually increases
And a region of 400 to 900 ° C. where the oxidation reaction is remarkable.
It is said that the temperature rises rapidly and then gradually rises above 900 ° C
Configuration is adopted.

【0022】[0022]

【実施例】以下、本発明の実施例を図面を参照して詳述
する。
Embodiments of the present invention will be described below in detail with reference to the drawings.

【0023】図1は本発明の製造方法により製造される
積層磁器電子部品の一部欠損のある斜視図である。
FIG. 1 is a perspective view of a laminated ceramic electronic component manufactured by the manufacturing method of the present invention, with a part missing.

【0024】この積層磁器電子部品1は、厚みの薄い例
えば10μmの磁器誘電体シートを積層してなる磁器誘
電体2と、この磁器誘電体2内に厚み方向に配設され、
金属パラジウム粉からなる複数(本例では100層)の
内部電極3と、一対の外部電極4,4とを具備してい
る。また、この積層磁器電子部品1は、全体として小型
な矩形状を有し、外部電極4が対向する方向をL、その
直角方向をW、内部電極3に対して垂直方向をTとする
と、全体の寸法を例えば、L=3.3mm,W=1.6
5mm,T=1.35mmとしている。
The laminated porcelain electronic component 1 is provided with a porcelain dielectric 2 formed by laminating a porcelain dielectric sheet having a small thickness of, for example, 10 μm, and is disposed in the porcelain dielectric 2 in a thickness direction.
A plurality of (in this example, 100 layers) internal electrodes 3 made of metal palladium powder and a pair of external electrodes 4 and 4 are provided. The laminated ceramic electronic component 1 has a small rectangular shape as a whole, and when the direction in which the external electrode 4 faces is L, the direction perpendicular to the direction is W, and the direction perpendicular to the internal electrode 3 is T, the overall Are, for example, L = 3.3 mm and W = 1.6.
5 mm and T = 1.35 mm.

【0025】次に、本発明の積層磁器電子部品の製造方
法を説明する。
Next, a method for manufacturing the laminated ceramic electronic component of the present invention will be described.

【0026】本製造方法は、磁器誘電体生シートを介し
て互いに対向するように金属パラジウム粉からなる電極
ペーストを厚み方向に積層した後、脱バインダを行い、
焼成工程を経て、一対の外部電極4,4を被着形成し、
図1に示す積層磁器電子部品1を得るものである。
In the present manufacturing method, an electrode paste made of metal palladium powder is laminated in a thickness direction so as to face each other via a raw ceramic dielectric sheet, and then a binder is removed.
Through a firing step, a pair of external electrodes 4 and 4 are formed by deposition,
This is to obtain the laminated ceramic electronic component 1 shown in FIG.

【0027】前記焼成工程は、室温乃至400℃の昇温
領域を300℃/hの遅い昇温速度とし、400乃至9
00℃の昇温領域を600℃/h以上の速い昇温速度と
し、900乃至1360℃の昇温領域を300℃/hの
遅い昇温速度とし、1360°Cまで昇温した後は、こ
の1360°Cで2時間保持し、1360℃乃至室温の
降温領域を300℃/hの遅い降温速度で行うものであ
る。
In the baking step, the temperature is raised from room temperature to 400 ° C. at a slow rate of 300 ° C./h.
After the temperature rising region of 00 ° C. was set to a high temperature rising speed of 600 ° C./h or more, and the temperature rising region of 900 to 1360 ° C. was set to a slow temperature rising speed of 300 ° C./h, the temperature was raised to 1360 ° C. The temperature is maintained at 1360 ° C. for 2 hours, and the temperature is reduced from 1360 ° C. to room temperature at a slow rate of 300 ° C./h.

【0028】このように構成された上記実施例の製造方
法の効果を表1及び図2,3を参照して説明する。
The effects of the manufacturing method of the above-described embodiment will be described with reference to Table 1 and FIGS.

【0029】表1は、400乃至900℃の昇温領域を
150℃/h,300℃/h,600℃/h,1200
℃/h,2400℃/hと変化させた場合の内部欠陥
(デラミネーション,クラック等)の発生率を示すもの
である。
Table 1 shows that the temperature rise range from 400 to 900 ° C. is 150 ° C./h, 300 ° C./h, 600 ° C./h, 1200
It shows the rate of occurrence of internal defects (delamination, cracks, etc.) when the temperature was changed to 2400 ° C / h and 2400 ° C / h.

【0030】[0030]

【表1】 [Table 1]

【0031】同表によれば、昇温速度が速くなる程、欠
陥発生率は小さくなり、600℃/h以上では発生率が
0となった。この結果、内部欠陥が発生しにくい積層磁
器電子部品1を得ることができる。
According to the table, the higher the rate of temperature rise, the smaller the defect occurrence rate, and the rate of occurrence was 0 at 600 ° C./h or more. As a result, it is possible to obtain the laminated ceramic electronic component 1 in which internal defects are less likely to occur.

【0032】このことは、図2及び図3に示す結果から
もいえる。
This can be said from the results shown in FIGS.

【0033】図2は、昇温速度を150℃/h,600
℃/h,2400℃/hと変化させた場合の昇温過程に
おける積層磁器電子部品の体積変化率(体積膨脹率)を
示すグラフである。同図によれば、400乃至900℃
の昇温領域では、昇温速度が速くなる程、積層磁器電子
部品の膨脹率が小さくなり、特に800℃付近では、そ
れが顕著に現れていることが判る。また、この800℃
付近での体積膨脹は、内部電極3に使用しているパラジ
ウムの酸化による膨脹が原因である。
FIG. 2 shows that the heating rate is 150 ° C./h, 600 ° C.
It is a graph which shows the volume change rate (volume expansion rate) of the laminated porcelain electronic component in the heating process when it changes into 2400 degreeC / h and 2400 degreeC / h. According to FIG.
It can be seen that in the temperature rise region, the higher the rate of temperature rise, the lower the expansion rate of the laminated ceramic electronic component, and particularly at around 800 ° C., it becomes remarkable. In addition, this 800
The volume expansion in the vicinity is caused by expansion of the palladium used for the internal electrode 3 due to oxidation.

【0034】また、図3は、昇温速度を150℃/h,
600℃/h,2400℃/hと変化させた場合の昇温
過程における内部電極3の重量変化率を示すグラフであ
る。同図によれば、400乃至900℃の昇温領域で
は、昇温速度が速くなる程金属パラジウムの酸化による
重量変化率は小さくなっていることが判る。なお、20
0乃至350℃の温度領域にて、急激に重量が減少して
いるが、これは内部電極3中の溶剤及び樹脂等の有機物
の分解または燃焼によるものである。また、600℃付
近からゆっくりと重量が増加しているのは、金属パラジ
ウムの酸化による重量増であり、800℃付近で急激に
減少しているのは、金属パラジウムの還元による重量減
である。
FIG. 3 shows that the heating rate was 150 ° C./h,
It is a graph which shows the weight change rate of the internal electrode 3 in the heating process at the time of changing at 600 degreeC / h and 2400 degreeC / h. According to the figure, in the temperature rise region of 400 to 900 ° C., the rate of weight change due to oxidation of metal palladium decreases as the temperature rise rate increases. In addition, 20
In the temperature range of 0 to 350 ° C., the weight rapidly decreases, but this is due to the decomposition or combustion of organic substances such as solvents and resins in the internal electrodes 3. The slow increase in weight around 600 ° C. is due to the weight increase due to the oxidation of metal palladium, and the rapid decrease near 800 ° C. is the weight decrease due to reduction of the metal palladium.

【0035】なお、本発明は上記実施例に限定されず、
その要旨を変更しない範囲内で種々に変形実施できる。
例えば、本発明は、磁器層が圧電性磁器からなる積層形
アクチュエータや磁器層がZnO系,SrTiO3 系の
積層形サーミスタ,バリスタにも同様に適用できる。
The present invention is not limited to the above embodiment,
Various modifications can be made without departing from the scope of the invention.
For example, the present invention can be similarly applied to a laminated actuator in which a porcelain layer is made of piezoelectric porcelain, or a laminated thermistor or varistor in which a porcelain layer is made of ZnO or SrTiO 3 .

【0036】[0036]

【発明の効果】以上詳述したように本発明によれば、焼
成工程で400乃至900℃の昇温領域における昇温速
度を600℃/h以上としているので、内部電極に使用
している金属パラジウムの酸化反応は抑制され、体積膨
脹は小さくなるため、内部欠陥が発生しにくくなる。こ
のため、低コストで電気的特性の劣化等を招くことな
く、磁器誘電体層の厚さを薄くして、内部電極層の数を
増加させた小型高容量の積層磁器電子部品を安定に生産
でき、また、昇温速度を速くすることで焼成時間は短縮
され、生産効率を上げることもできる。そして、上記4
00乃至900℃の範囲以外の前後の領域では通常の昇
温速度としているので焼成工程に無理が生じない。従っ
て、小型で高容量の積層磁器電子部品を効率良く製造で
きる積層磁器電子部品の製造方法を提供することができ
る。
As described in detail above, according to the present invention, since the heating rate in the heating range of 400 to 900 ° C. in the firing step is set to 600 ° C./h or more, the metal used for the internal electrode Since the oxidation reaction of palladium is suppressed and the volume expansion is reduced, internal defects are less likely to occur. For this reason, the thickness of the ceramic dielectric layer is reduced and the number of internal electrode layers is increased to produce a small and high-capacity laminated ceramic electronic component stably at low cost without deteriorating electrical characteristics. In addition, by increasing the heating rate, the firing time can be shortened, and the production efficiency can be increased. And above 4
In the region before and after the temperature range of 00 to 900 ° C, the normal rise
Since the heating rate is used, there is no difficulty in the firing step. Therefore, it is possible to provide a method of manufacturing a laminated ceramic electronic component capable of efficiently producing a small, high-capacity laminated ceramic electronic component.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の製造方法により製造される積層磁器電
子部品の一部欠損のある斜視図である。
FIG. 1 is a perspective view of a laminated ceramic electronic component manufactured by a manufacturing method of the present invention, with a part missing.

【図2】本発明に係る積層磁器電子部品の製造方法の効
果を示すための積層磁器電子部品の体積変化率を示すグ
ラフである。
FIG. 2 is a graph showing a volume change rate of the laminated ceramic electronic component to show the effect of the method for manufacturing the laminated ceramic electronic component according to the present invention.

【図3】本発明に係る積層磁器電子部品の製造方法の効
果を示すための内部電極の重量変化率を示すグラフであ
る。
FIG. 3 is a graph showing a weight change rate of an internal electrode to show the effect of the method for manufacturing a laminated ceramic electronic component according to the present invention.

【符号の説明】[Explanation of symbols]

1 積層磁器電子部品 2 磁器誘電体 3 内部電極 Reference Signs List 1 laminated porcelain electronic component 2 porcelain dielectric 3 internal electrode

───────────────────────────────────────────────────── フロントページの続き (72)発明者 佐々木 伸一 東京都中央区日本橋一丁目13番1号 テ ィーディーケイ株式会社内 (56)参考文献 特開 昭59−69909(JP,A) 特開 平3−142808(JP,A) 特開 平4−280613(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01G 4/00 - 4/40 H01G 13/00 - 13/06 ────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Shinichi Sasaki 1-1-13 Nihonbashi, Chuo-ku, Tokyo Inside TDK Corporation (56) References JP-A-59-69909 (JP, A) JP-A-3 -142808 (JP, A) JP-A-4-280613 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) H01G 4/00-4/40 H01G 13/00-13/06

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 磁器層間に金属パラジウムからなる内部
電極層を積層したものを、焼成する工程を有する積層磁
器電子部品の製造方法において、 前記焼成する工程は、室温乃至400℃の昇温領域にお
ける昇温速度を300℃/hとし、400乃至900℃
の昇温領域における昇温速度を600℃/h以上とし
900乃至1360℃の昇温領域における昇温速度を3
00℃/hとしたことを特徴とする積層磁器電子部品の
製造方法。
1. A method for manufacturing a laminated ceramic electronic component, comprising a step of firing an internal electrode layer made of metallic palladium between porcelain layers, wherein the firing step is performed in a temperature rising region from room temperature to 400 ° C. You
400-900 ° C at a heating rate of 300 ° C / h
The heating rate in the heating area of 600 ° C./h or more ,
The heating rate in the heating range of 900 to 1360 ° C is 3
A method for producing a laminated ceramic electronic component, wherein the temperature is set to 00 ° C./h .
JP04048740A 1992-03-05 1992-03-05 Manufacturing method of laminated porcelain electronic components Expired - Lifetime JP3131004B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04048740A JP3131004B2 (en) 1992-03-05 1992-03-05 Manufacturing method of laminated porcelain electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04048740A JP3131004B2 (en) 1992-03-05 1992-03-05 Manufacturing method of laminated porcelain electronic components

Publications (2)

Publication Number Publication Date
JPH05251264A JPH05251264A (en) 1993-09-28
JP3131004B2 true JP3131004B2 (en) 2001-01-31

Family

ID=12811688

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04048740A Expired - Lifetime JP3131004B2 (en) 1992-03-05 1992-03-05 Manufacturing method of laminated porcelain electronic components

Country Status (1)

Country Link
JP (1) JP3131004B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4041082B2 (en) * 2004-03-23 2008-01-30 Tdk株式会社 Varistor and varistor manufacturing method

Also Published As

Publication number Publication date
JPH05251264A (en) 1993-09-28

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