JP3144871B2 - Permeability measuring device - Google Patents
Permeability measuring deviceInfo
- Publication number
- JP3144871B2 JP3144871B2 JP03819892A JP3819892A JP3144871B2 JP 3144871 B2 JP3144871 B2 JP 3144871B2 JP 03819892 A JP03819892 A JP 03819892A JP 3819892 A JP3819892 A JP 3819892A JP 3144871 B2 JP3144871 B2 JP 3144871B2
- Authority
- JP
- Japan
- Prior art keywords
- coil
- magnetic field
- output voltage
- measurement
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000035699 permeability Effects 0.000 title claims description 52
- 238000005259 measurement Methods 0.000 claims description 57
- 238000001514 detection method Methods 0.000 claims description 23
- 239000000758 substrate Substances 0.000 claims description 9
- 239000000696 magnetic material Substances 0.000 claims description 5
- 238000003780 insertion Methods 0.000 claims description 4
- 230000037431 insertion Effects 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 3
- 238000005404 magnetometry Methods 0.000 claims 1
- 230000010355 oscillation Effects 0.000 description 28
- 238000000034 method Methods 0.000 description 6
- 238000005452 bending Methods 0.000 description 4
- 239000004020 conductor Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000002238 attenuated effect Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 229920000298 Cellophane Polymers 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Measuring Magnetic Variables (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は薄膜磁性材料の高周波に
おける実効透磁率およびその実数部と虚数部を可及的に
少ない誤差で求めることを可能とする透磁率測定装置に
関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for measuring the effective magnetic permeability of a thin-film magnetic material at high frequencies and its real and imaginary parts with as small an error as possible.
【0002】[0002]
【従来の技術】従来、磁性材料の透磁率測定方法とし
て、インダクタンス法、ヨーク法などが利用されてい
る。これらの方法ではコイルの分布容量に起因する自己
共振のために、高周波での測定は困難であった。これら
に代わる方法として差動コイルを用いた透磁率測定方法
が知られている。2. Description of the Related Art Conventionally, an inductance method, a yoke method, and the like have been used as a method for measuring the magnetic permeability of a magnetic material. In these methods, measurement at high frequency was difficult due to self-resonance caused by the distributed capacitance of the coil. As an alternative to these methods, a magnetic permeability measurement method using a differential coil is known.
【0003】差動コイルを用いた透磁率測定装置の検出
部の構造は、特開昭61−57871号公報に開示され
ている。すなわち、図6に示すように、この透磁率測定
装置は、断面が矩形状の磁界発生用コイル2に励磁用の
高周波電源4からの電圧を印加して交番磁界を発生さ
せ、磁界発生用コイル2によって発生させられた交番磁
界に対して面が直交するように、該磁界発生用コイル2
内に8字状に巻回する測定用差動コイル6および磁界検
出用コイル8を設け、測定用差動コイル6の一方のコイ
ル部中に透磁率測定試料(以下、単に試料とも記す)9
を挿入し、測定用差動コイル6の出力電圧EB と磁界検
出用コイル8の出力電圧EH との比、μ=(EB /
EH )・(SH /SB )から透磁率を測定する。ここ
で、SH は磁界検出用コイル8の実効面積、SB は試料
9の断面積である。[0003] The structure of a detection unit of a magnetic permeability measuring apparatus using a differential coil is disclosed in Japanese Patent Application Laid-Open No. 61-58771. That is, as shown in FIG. 6, this magnetic permeability measuring device generates an alternating magnetic field by applying a voltage from a high frequency power supply 4 for excitation to a magnetic field generating coil 2 having a rectangular cross section. 2 so that the plane is orthogonal to the alternating magnetic field generated by the magnetic field generating coil 2.
A measurement differential coil 6 and a magnetic field detection coil 8 wound in an eight-shape are provided in one of the coils, and a magnetic permeability measurement sample (hereinafter, simply referred to as a sample) 9 is provided in one coil portion of the measurement differential coil 6.
Insert the ratio between the output voltage E H of the output voltage E B and the magnetic field detecting coil 8 of the measuring differential coil 6, μ = (E B /
The magnetic permeability is measured from E H ) · (S H / S B ). Here, S H is the effective area of the magnetic field detection coil 8, the S B is the cross-sectional area of the sample 9.
【0004】前記の従来技術において、磁界発生用コイ
ル2内に配設される測定用差動コイル6および磁界用検
出コイル8は、例えば、透磁率の小さいガラス材料等で
形成された枠体に細い導線を巻回することにより得てい
る。In the above prior art, the measuring differential coil 6 and the magnetic field detecting coil 8 disposed in the magnetic field generating coil 2 are formed, for example, on a frame made of a glass material having a low magnetic permeability. It is obtained by winding a thin conductive wire.
【0005】[0005]
【発明が解決しようとする課題】然しながら、前記構成
では、寸法精度がさほどに向上することなく、従って、
製品としてばらつきが出て、正確な透磁率の測定が困難
である。However, in the above configuration, the dimensional accuracy is not significantly improved, and
Variations appear as products, and it is difficult to accurately measure magnetic permeability.
【0006】しかも、試料の挿入度合によって異なる透
磁率が測定されることになり、測定結果に信頼性が得ら
れない難点がある。In addition, different magnetic permeability is measured depending on the degree of insertion of the sample, and there is a problem that the reliability of the measurement result cannot be obtained.
【0007】本発明は前記の不都合を克服するためにな
されたものであって、簡単な構成で確実に、すなわち、
測定誤差が少なく且つ迅速に透磁率を測定することが可
能であり、しかも測定部の寸法精度に優れた透磁率測定
装置を提供することを目的とする。SUMMARY OF THE INVENTION The present invention has been made to overcome the above-mentioned disadvantages, and has a simple structure.
An object of the present invention is to provide a magnetic permeability measuring apparatus which can quickly measure a magnetic permeability with a small measurement error and which has excellent dimensional accuracy of a measuring section.
【0008】[0008]
【課題を解決するための手段】前記の目的を達成するた
めに、本発明は、ほぼ一様な交番磁界を発生する磁界発
生用コイルと、前記磁界発生用コイル中に配設された磁
界検出用コイル並びに測定用差動コイルとを備え測定用
差動コイルの出力電圧と磁界検出用コイルの出力電圧と
から透磁率を測定する透磁率測定装置において、前記磁
界検出用コイルと測定用差動コイルとは単一の基板上に
巻回形成されていることを特徴とする。SUMMARY OF THE INVENTION To achieve the above object, the present invention provides a magnetic field generating coil for generating a substantially uniform alternating magnetic field, and a magnetic field detecting coil disposed in the magnetic field generating coil. And a differential coil for measurement, wherein the magnetic permeability is measured from the output voltage of the differential coil for measurement and the output voltage of the magnetic field detection coil. The coil is characterized by being wound on a single substrate.
【0009】[0009]
【作用】基板上に形成された測定用差動コイルに対して
試料を接近させ、その出力電圧を得る。一方、前記測定
用差動コイルが空心状態の時の出力電圧を得て、両出力
電圧の差を求め、誤差によって前記測定用差動コイルの
出力電圧の値を補正して磁界検出用コイルの出力電圧と
の比から透磁率を測定する。この時、測定用差動コイル
と磁界検出用コイルとは基板上に設けられているため
に、寸法精度が向上し、正確且つ迅速に透磁率の測定が
達成される。The sample is brought close to the measuring differential coil formed on the substrate to obtain the output voltage. On the other hand, the output voltage when the measurement differential coil is in the air-core state is obtained, the difference between the two output voltages is obtained, the output voltage value of the measurement differential coil is corrected by an error, and the magnetic field detection coil The magnetic permeability is measured from the ratio to the output voltage. At this time, since the measurement differential coil and the magnetic field detection coil are provided on the substrate, the dimensional accuracy is improved, and the measurement of the magnetic permeability can be achieved accurately and quickly.
【0010】[0010]
【実施例】以下本発明を実施例により説明する。The present invention will be described below with reference to examples.
【0011】図1において、参照符号10は、本発明に
係る透磁率測定装置を示す。この透磁率測定装置10
は、基本的には、基台12と前記基台12にボルト14
によって固定される案内部材16と、前記案内部材16
が臨む磁気検出回路18とから基本的に構成されてい
る。In FIG. 1, reference numeral 10 denotes a magnetic permeability measuring device according to the present invention. This magnetic permeability measuring device 10
Basically, the base 12 and the bolts 14
A guide member 16 fixed by
And a magnetic detection circuit 18 facing the same.
【0012】案内部材16は、図1から容易に諒解され
る通り、その長手方向中央部に沿って蟻溝20が設けら
れており、前記蟻溝20には摺動部材22が摺動自在に
嵌合されている。摺動部材22の先端部は試料Wの固着
部位として利用する。この場合、摺動部材22を変位さ
せるために、把手24が設けられている。なお、参照符
号26は前記蟻溝20の一方の端部に設けられた摺動部
材22のそれ以上の変位を阻止するためのストッパを示
している。As can be easily understood from FIG. 1, the guide member 16 is provided with a dovetail groove 20 along the center in the longitudinal direction, and a slide member 22 is slidably provided in the dovetail groove 20. Mated. The tip of the sliding member 22 is used as a fixing portion of the sample W. In this case, a handle 24 is provided to displace the sliding member 22. Reference numeral 26 denotes a stopper for preventing further displacement of the slide member 22 provided at one end of the dovetail groove 20.
【0013】前記案内部材16は磁気検出回路18に臨
む。磁気検出回路18はCチャンネル上に折曲形成され
た励磁用コイル28と前記励磁用コイル28の、図にお
いて、垂直方向中央に配設されるプリント基板30と、
前記プリント基板30に設けられる8の字状コイル(後
述)の出力を外部へと取り出すためのターミナル部32
とから構成される。The guide member 16 faces a magnetic detection circuit 18. The magnetism detecting circuit 18 includes an exciting coil 28 bent on the C channel and a printed circuit board 30 disposed at the center of the exciting coil 28 in the vertical direction in the drawing.
A terminal portion 32 for taking out an output of a figure eight coil (described later) provided on the printed circuit board 30 to the outside.
It is composed of
【0014】励磁用コイル28とプリント基板30とは
固着されており、さらに前記プリント基板30に穿設さ
れた孔部にボルト34を挿通して前記案内部材16の螺
溝に螺合することにより磁気検出回路18と一体化され
ている。The exciting coil 28 and the printed circuit board 30 are fixed, and a bolt 34 is inserted through a hole formed in the printed circuit board 30 and screwed into a screw groove of the guide member 16. It is integrated with the magnetic detection circuit 18.
【0015】図3並びに図4に前記プリント基板30の
配線構造を示す。図3から容易に諒解される通り、プリ
ント基板30の一方の面には一本の導体42を実質的に
8字状に湾曲乃至屈曲形成して測定用差動コイル44が
形成され、また、図4に示すように、プリント基板30
の他方の面に導体46を湾曲乃至屈曲させて磁界検出用
コイル48として形成している。測定用差動コイル44
の出力側は図示しない導線を介して第1ターミナル50
に接続され、磁界検出用コイル48の出力側は、同様に
第2ターミナル52に接続されている。また、励磁用コ
イル28の出力側は第3ターミナル54に接続される。
なお、図中、参照符号56a、56bはスルーホールを
示し、また、参照符号57はプリント基板30に画成さ
れた矩形状の第1のスペースを示すとともに、さらに参
照符号58は前記第1スペース57の下方に画成された
試料挿入用の第2スペースを示す。FIGS. 3 and 4 show the wiring structure of the printed circuit board 30. FIG. As can be easily understood from FIG. 3, a measurement differential coil 44 is formed on one surface of the printed circuit board 30 by bending or bending a single conductor 42 substantially in a figure-eight shape. As shown in FIG.
A conductor 46 is formed as a magnetic field detection coil 48 by bending or bending the conductor 46 on the other surface of the magnetic field detecting coil 48. Measurement differential coil 44
Is connected to a first terminal 50 via a conductor (not shown).
, And the output side of the magnetic field detecting coil 48 is similarly connected to the second terminal 52. The output side of the exciting coil 28 is connected to the third terminal 54.
In the drawings, reference numerals 56a and 56b indicate through holes, reference numeral 57 indicates a first rectangular space defined on the printed circuit board 30, and reference numeral 58 indicates the first space. Shown below is a second space defined below 57 for sample insertion.
【0016】次に、前記のように構成される透磁率測定
装置10の回路構成について、図5以降を参照して説明
する。Next, a circuit configuration of the magnetic permeability measuring apparatus 10 configured as described above will be described with reference to FIG.
【0017】該透磁率測定装置10は磁界発生のための
高周波電源としての発振器60を備えて、発振器60か
らの発振出力はフィルタ・アッテネータ62に供給して
波形整形し、かつレベルを発振器60の発振周波数に比
例して減衰させ、高周波電力増幅器64に供給して電力
増幅し、該高周波電力増幅器64の出力電圧を励磁用コ
イル28に印加して、ほぼ均一な交番磁界を発生させ
る。The permeability measuring apparatus 10 includes an oscillator 60 as a high-frequency power source for generating a magnetic field. The oscillation output from the oscillator 60 is supplied to a filter attenuator 62 to shape the waveform, and the level of the oscillator 60 is adjusted. The power is attenuated in proportion to the oscillation frequency, supplied to the high-frequency power amplifier 64 to amplify the power, and the output voltage of the high-frequency power amplifier 64 is applied to the exciting coil 28 to generate a substantially uniform alternating magnetic field.
【0018】励磁用コイル28によって発生した交番磁
界と鎖交して発生した測定用差動コイル44の出力電圧
および磁界検出用コイル48の出力電圧は夫々第2ター
ミナル52、第1ターミナル50を介して2チャンネル
高周波増幅器66に供給され、それぞれ各別に増幅され
る。2チャンネル高周波増幅器66によって増幅された
測定用差動コイル44の出力電圧および磁界検出用コイ
ル48の出力電圧は2チャンネルミキサ68に供給され
て、発振器70からの発振周波数とそれぞれ各別に周波
数混合され中間周波信号に周波数変換される。The output voltage of the measuring differential coil 44 and the output voltage of the magnetic field detecting coil 48 generated by interlinking with the alternating magnetic field generated by the exciting coil 28 are passed through the second terminal 52 and the first terminal 50, respectively. And supplied to a two-channel high-frequency amplifier 66 to be separately amplified. The output voltage of the measurement differential coil 44 and the output voltage of the magnetic field detection coil 48 amplified by the two-channel high-frequency amplifier 66 are supplied to a two-channel mixer 68, and are respectively frequency-mixed with the oscillation frequency from the oscillator 70. The frequency is converted to an intermediate frequency signal.
【0019】中間周波信号に変換された測定用差動コイ
ル44の出力電圧および磁界検出用コイル48の出力電
圧は2チャンネル中間周波増幅器72に供給して、それ
ぞれ各別に中間周波数成分のみを選択増幅する。2チャ
ンネル中間周波増幅器72によって増幅された測定用差
動コイル44の出力電圧および磁界検出用コイル48の
出力電圧は2チャンネルA/D変換器およびメモリ74
に供給してデジタルデータに各別に変換し、発振器60
の発振周波数f1 で励磁されたときの振幅データとして
それぞれ2チャンネルA/D変換器およびメモリ74の
メモリに一旦格納する。The output voltage of the measuring differential coil 44 and the output voltage of the magnetic field detecting coil 48, which have been converted into the intermediate frequency signal, are supplied to a two-channel intermediate frequency amplifier 72 to selectively amplify only the intermediate frequency component. I do. The output voltage of the measuring differential coil 44 and the output voltage of the magnetic field detecting coil 48 amplified by the two-channel intermediate frequency amplifier 72 are output from the two-channel A / D converter and the memory 74.
, And convert the data into digital data separately.
Is temporarily stored in the two-channel A / D converter and the memory of the memory 74 as amplitude data when excited at the oscillation frequency f1 of the first and second channels, respectively.
【0020】2チャンネル中間周波増幅器72によって
増幅された測定用差動コイル44の出力電圧および磁界
検出用コイル48の出力電圧は位相検波器およびA/D
変換器76に供給し、2チャンネル中間周波増幅器72
で増幅された磁界検出用コイル48の出力位相を基準と
して2チャンネル中間周波増幅器72で増幅された測定
用差動コイル44の出力位相と2チャンネル中間周波増
幅器72で増幅された磁界検出用コイル48の出力位相
との位相差を位相検波して直流電圧として取り出し、デ
ジタルデータに変換して出力する。この場合、A/D変
換は低い周波数をサンプルパルスとして位相検波出力を
サンプリングし、デジタルデータに変換しているため、
位相検波器およびA/D変換器76は一時的なメモリと
しても作用している。The output voltage of the measuring differential coil 44 and the output voltage of the magnetic field detecting coil 48 amplified by the two-channel intermediate frequency amplifier 72 are output from a phase detector and an A / D converter.
And a two-channel intermediate frequency amplifier 72
The output phase of the measurement differential coil 44 amplified by the two-channel intermediate frequency amplifier 72 with reference to the output phase of the magnetic field detection coil 48 amplified by The phase difference from the output phase is detected, extracted as a DC voltage, converted into digital data, and output. In this case, in the A / D conversion, the phase detection output is sampled using a low frequency as a sample pulse and converted into digital data.
The phase detector and A / D converter 76 also functions as a temporary memory.
【0021】2チャンネルA/D変換器およびメモリ7
4に格納した測定用差動コイル44の出力電圧振幅デー
タおよび磁界検出用コイル48の出力電圧振幅データ、
位相検波器およびA/D変換器76で変換された位相差
データは、入/出力装置78を介してマイクロコンピュ
ータ80に供給して、マイクロコンピュータ80に読み
込む。Two-channel A / D converter and memory 7
4, the output voltage amplitude data of the measurement differential coil 44 and the output voltage amplitude data of the magnetic field detection coil 48,
The phase difference data converted by the phase detector and A / D converter 76 is supplied to the microcomputer 80 via the input / output device 78, and is read into the microcomputer 80.
【0022】マイクロコンピュータ80はプログラムを
格納したROM、作業領域を有するRAM等を含み、外
部メモリ82と接続されており、ROMに格納されたプ
ログラムおよび外部メモリ82と協働して、機能的に所
定期間毎に発振器60の発振周波数を、例えば、1MH
zずつ順次変化させる発振周波数制御手段80a、中間
周波数を、例えば、100kHzとしたとき、発振器6
0の発振周波数+100kHzの発振周波数に発振器7
0の発振周波数を制御する発振周波数制御手段80b、
発振器60の発振周波数に比例して入力レベルを減衰さ
せるフィルタ・アッテネータ62におけるアッテネータ
の減衰率制御手段80c、2チャンネルA/D変換器お
よびメモリ74のメモリに格納した測定用差動コイル4
4の出力電圧振幅データおよび磁界検出用コイル48の
出力電圧振幅データ、位相検波器およびA/D変換器7
6で変換された位相差データを読み込んで外部メモリ8
2に格納するメモリ制御手段80dを備えている。The microcomputer 80 includes a ROM storing a program, a RAM having a work area, and the like, and is connected to an external memory 82. The microcomputer 80 functions in cooperation with the program stored in the ROM and the external memory 82 to function. The oscillation frequency of the oscillator 60 is set to, for example, 1 MHz every predetermined period.
Oscillation frequency control means 80a that sequentially changes z at a time, for example, when the intermediate frequency is 100 kHz, the oscillator 6
Oscillation frequency of 0 + oscillation frequency of 100 kHz
An oscillation frequency control means 80b for controlling an oscillation frequency of 0;
Attenuator attenuation rate control means 80c in the filter attenuator 62 for attenuating the input level in proportion to the oscillation frequency of the oscillator 60, the two-channel A / D converter and the measuring differential coil 4 stored in the memory 74
4, the output voltage amplitude data of the magnetic field detecting coil 48, the phase detector and the A / D converter 7
6 reads the phase difference data converted in
2 is provided.
【0023】さらに、マイクロコンピュータ80は、機
能的に、外部メモリ82に格納された空心状態のときの
測定用差動コイル44の出力電圧振幅データ、試料Wを
挿入したときにおける測定用差動コイル44の出力電圧
振幅データ、空心状態のときの測定用差動コイル44の
出力電圧の位相差データ、および試料Wを挿入したとき
における測定用差動コイル44の出力電圧の位相差デー
タに基づいて、試料Wを挿入時の測定用差動コイル44
の出力電圧から空心状態のときの測定用差動コイル44
の出力電圧をベクトル減算して補正された測定用差動コ
イル44の出力電圧を得る補正演算手段80e、補正さ
れた測定用差動コイル44の出力電圧と磁界検出用コイ
ル48の出力電圧との比を演算して透磁率を演算する透
磁率演算手段80fを備えている。Further, the microcomputer 80 functionally stores the output voltage amplitude data of the measurement differential coil 44 in the air-core state stored in the external memory 82 and the measurement differential coil when the sample W is inserted. 44 based on the output voltage amplitude data, the phase difference data of the output voltage of the measurement differential coil 44 in the air-core state, and the phase difference data of the output voltage of the measurement differential coil 44 when the sample W is inserted. Differential coil 44 for inserting sample W
Measurement differential coil 44 in the air-core state from the output voltage of
A vector calculating means for obtaining a corrected output voltage of the differential coil for measurement 44 e by subtracting the output voltage of the differential differential coil 44 from the output voltage of the differential coil for measurement 44. A magnetic permeability calculating means 80f for calculating a ratio to calculate a magnetic permeability is provided.
【0024】さらに、マイクロコンピュータ80は、必
要に応じて演算した結果を出力するための出力手段とし
てのプリンタ・ディスプレイ装置84を制御して、透磁
率等を提示する表示制御手段80gも備えている。Further, the microcomputer 80 also has a display control means 80g for controlling the printer / display device 84 as an output means for outputting a result calculated as required, and presenting magnetic permeability and the like. .
【0025】本発明に係る透磁率測定装置10は基本的
に以上のように構成されるものであり、次にその作用並
びに効果について説明する。The magnetic permeability measuring apparatus 10 according to the present invention is basically configured as described above. Next, its operation and effects will be described.
【0026】先ず、摺動部材22の先端部に、図1に示
すように、薄板状の磁性体からなる試料Wを、例えば、
セロテープ等で貼着する。そして、把手24を介して摺
動部材22を蟻溝20に沿ってプリント基板30方向へ
と移動させ、前記摺動部材22の先端部のストッパ26
が当接すると、試料Wはその長手方向の中央部分がプリ
ント基板30の第2スペース58に進入した状態にな
る。ここで、透磁率の測定が開始される。First, as shown in FIG. 1, a sample W made of a thin plate-like magnetic material is placed on the tip of the sliding member 22 by, for example,
Adhere with cellophane tape. Then, the sliding member 22 is moved toward the printed circuit board 30 along the dovetail groove 20 via the handle 24, and the stopper 26 at the tip end of the sliding member 22 is moved.
When the sample W comes into contact, the sample W enters a state in which the central portion in the longitudinal direction has entered the second space 58 of the printed circuit board 30. Here, the measurement of the magnetic permeability is started.
【0027】先ず、発振器60の発振周波数は発振周波
数制御手段80aによって1〜100MHzまで1MH
zおきにその周波数が制御されるものとして説明する。
試料Wを挿入前に、空心状態で発振周波数制御手段80
aおよび80bの制御のもとに所定時間間隔毎に同期し
て発振器60の発振周波数は1MHz、2MHz、3M
Hz、…に、発振器70の発振周波数は1.1MHz、
2.1MHz、3.1MHz…に制御され、発振器60
の発振周波数の変更と同期して減衰率制御手段80cの
制御のもとにフィルタ・アッテネータ62の減衰率が周
波数の逆数に比例するよう制御される。First, the oscillation frequency of the oscillator 60 is 1 MHz from 1 to 100 MHz by the oscillation frequency control means 80a.
Description will be made on the assumption that the frequency is controlled every z.
Before inserting the sample W, the oscillation frequency control means
The oscillation frequency of the oscillator 60 is 1 MHz, 2 MHz, 3 MHz in synchronization with a predetermined time interval under the control of a and 80 b.
Hz, the oscillation frequency of the oscillator 70 is 1.1 MHz,
Are controlled at 2.1 MHz, 3.1 MHz,.
The attenuation rate of the filter attenuator 62 is controlled so as to be proportional to the reciprocal of the frequency under the control of the attenuation rate control means 80c in synchronization with the change of the oscillation frequency.
【0028】各コイルによって検出される電圧Vは磁界
の強さをH=A・exp jωt(Aは振幅定数、ωは発振
器60の発振出力の角周波数)とすると、V∝dH/d
t=jωHとなり、電圧Vは角周波数ωに比例する。し
たがって、各コイルの出力電圧レベルは角周波数に比例
して増大する。したがって、例えば、1MHzの場合に
比較して100MHzの場合は100倍の高電圧となる
ため、高周波電力増幅器64の利得を大きくとると、高
周波電力増幅器64が飽和してしまう。これを防止する
ため、減衰率を制御する。減衰率の制御に代わって高周
波電力増幅器64の利得を制御してもよい。If the voltage V detected by each coil is H = A 磁 界 exp jωt (A is an amplitude constant and ω is the angular frequency of the oscillation output of the oscillator 60), V∝dH / d
t = jωH, and the voltage V is proportional to the angular frequency ω. Therefore, the output voltage level of each coil increases in proportion to the angular frequency. Therefore, for example, the voltage at 100 MHz is 100 times higher than that at 1 MHz. Therefore, when the gain of the high-frequency power amplifier 64 is increased, the high-frequency power amplifier 64 is saturated. In order to prevent this, the attenuation rate is controlled. The gain of the high-frequency power amplifier 64 may be controlled instead of controlling the attenuation rate.
【0029】減衰された発振器60からの発振出力は高
周波電力増幅器64によって電力増幅され、励磁用コイ
ル28に印加されて、励磁用コイル28によって交番磁
界が発生させられる。測定用差動コイル44および磁界
検出用コイル48はこの交番磁界に鎖交し、測定用差動
コイル44および磁界検出用コイル48から電圧が発生
される。この両電圧は2チャンネル高周波増幅器66に
おいてそれぞれ増幅され、2チャンネルミキサ68にお
いて発振器70の発振周波信号と周波数混合されて、中
間周波信号に変換される。ここで、中間周波数は100
kHzである。The attenuated oscillation output from the oscillator 60 is power-amplified by the high-frequency power amplifier 64 and applied to the exciting coil 28, so that the exciting coil 28 generates an alternating magnetic field. The measurement differential coil 44 and the magnetic field detection coil 48 are linked to the alternating magnetic field, and a voltage is generated from the measurement differential coil 44 and the magnetic field detection coil 48. These two voltages are respectively amplified by a two-channel high-frequency amplifier 66, mixed in frequency with an oscillation frequency signal of an oscillator 70 by a two-channel mixer 68, and converted into an intermediate frequency signal. Here, the intermediate frequency is 100
kHz.
【0030】中間周波数に変換された両信号は2チャン
ネル中間周波増幅器72において100kHzの信号が
それぞれ選択増幅され、増幅された両中間周波信号は2
チャンネルA/D変換器およびメモリ74において各別
にデジタル化されて、両振幅データが2チャンネルA/
D変換器およびメモリ74のメモリに発振器60の発振
周波数に対応して一旦格納される。The 100 kHz signal is selectively amplified by the two-channel intermediate frequency amplifier 72 for the two signals converted to the intermediate frequency.
Both amplitude data are digitized separately in the channel A / D converter and the memory 74 so that the two-channel A / D
The data is temporarily stored in the memory of the D converter and the memory 74 corresponding to the oscillation frequency of the oscillator 60.
【0031】また、位相検波器およびA/D変換器76
において、磁界検出用コイル48の出力電圧の位相を基
準に測定用差動コイル44の出力電圧の位相と磁界検出
用コイル48の出力電圧の位相との位相差が位相検波さ
れて、デジタル化されて出力される。Further, a phase detector and an A / D converter 76
In the above, the phase difference between the phase of the output voltage of the measuring differential coil 44 and the phase of the output voltage of the magnetic field detecting coil 48 is detected based on the phase of the output voltage of the magnetic field detecting coil 48, and digitized. Output.
【0032】ここで、2チャンネル高周波増幅器66の
入力レベルは大きくとも1mVP-P以下であり、これを
2チャンネルA/D変換器およびメモリ74、位相検波
器およびA/D変換器76の入力端で1VP-P の振幅レ
ベルとするには、70〜80dBの電圧利得が必要であ
るが、1MHz〜100MHzの範囲で振幅特性、位相
特性が共に良好な状態で実現するような2チャンネル高
周波増幅器66は実現困難である。従って、本実施例に
おいては、2チャンネル高周波増幅器66の電圧利得を
約40dBとし、他の利得は2チャンネル中間周波増幅
器72において得ている。Here, the input level of the two-channel high-frequency amplifier 66 is at most 1 mV PP or less, which is supplied to the input terminals of the two-channel A / D converter and memory 74, the phase detector and the A / D converter 76. A voltage gain of 70 to 80 dB is required to achieve an amplitude level of 1 V PP , but a two-channel high-frequency amplifier 66 that realizes both an amplitude characteristic and a phase characteristic in a good state in a range of 1 MHz to 100 MHz is realized. Have difficulty. Therefore, in this embodiment, the voltage gain of the two-channel high-frequency amplifier 66 is set to about 40 dB, and the other gains are obtained in the two-channel intermediate frequency amplifier 72.
【0033】上記の作用が発振器60の発振周波数変更
毎に行われて、測定用差動コイル44の出力電圧の振幅
データおよび位相差データがメモリ制御手段80dの制
御のもとに外部メモリ82に発振器60の発振周波数に
対応して格納される。これが1MHz間隔で1MHz〜
100MHzにわたって行われることになる。したがっ
て、アナログ的にいえば、空心状態のときの測定用差動
コイル44の出力電圧EB2sin (ωt+θ2 )が発振器
60の発振周波数に対応して外部メモリ82に格納され
た状態となる。The above operation is performed every time the oscillation frequency of the oscillator 60 is changed. The amplitude data and the phase difference data of the output voltage of the measuring differential coil 44 are stored in the external memory 82 under the control of the memory control means 80d. It is stored corresponding to the oscillation frequency of the oscillator 60. This is 1MHz at 1MHz intervals
It will be performed over 100 MHz. Therefore, in analog terms, the output voltage E B2 sin (ωt + θ 2 ) of the measuring differential coil 44 in the air-core state is stored in the external memory 82 in accordance with the oscillation frequency of the oscillator 60.
【0034】次に、測定用差動コイル44の一方のコイ
ル部中に試料Wが挿入されて、試料Wが挿入された状態
において、上記と同様にして、測定用差動コイル44の
出力電圧の振幅データおよび位相差データと、磁界検出
用コイル48の出力電圧の振幅データとがメモリ制御手
段80dの制御のもとに外部メモリ82に発振器60の
発振周波数に対応して格納される。これが1MHz間隔
で1MHz〜100MHzにわたって行われることにな
る。この場合は、磁界検出用コイル48の出力電圧の振
幅データも格納されている。したがって、アナログ的に
いえば、試料Wが挿入された状態での測定用差動コイル
44の出力電圧EB1sin (ωt+θ1 )と、磁界検出用
コイル48の出力電圧EH sin ωtとが発振器60の発
振周波数に対応して外部メモリ82に格納された状態と
なる。Next, the sample W is inserted into one of the coil portions of the measurement differential coil 44, and in a state where the sample W is inserted, the output voltage of the measurement differential coil 44 is The amplitude data and the phase difference data, and the amplitude data of the output voltage of the magnetic field detecting coil 48 are stored in the external memory 82 under the control of the memory control means 80d in accordance with the oscillation frequency of the oscillator 60. This will be done at 1 MHz intervals from 1 MHz to 100 MHz. In this case, the amplitude data of the output voltage of the magnetic field detecting coil 48 is also stored. Therefore, in analog terms, the output voltage E B1 sin (ωt + θ 1 ) of the measurement differential coil 44 and the output voltage E H sin ωt of the magnetic field detection coil 48 with the sample W inserted are generated by the oscillator. The state is stored in the external memory 82 corresponding to the oscillation frequency of 60.
【0035】発振器60の発振周波数が100MHzに
達するまで実行されたときは、補正演算手段80eの制
御のもとに試料Wが挿入された状態での測定用差動コイ
ル44の出力電圧の振幅データおよび位相差データか
ら、空心状態での測定用差動コイル44の出力電圧の振
幅データおよび位相差データがベクトル減算されること
によって補正演算がなされる。このベクトル減算は周波
数毎に行われる。When the process is executed until the oscillation frequency of the oscillator 60 reaches 100 MHz, the amplitude data of the output voltage of the measuring differential coil 44 with the sample W inserted under the control of the correction calculating means 80e. The correction operation is performed by vector subtracting the amplitude data and the phase difference data of the output voltage of the measurement differential coil 44 in the air-core state from the phase difference data. This vector subtraction is performed for each frequency.
【0036】この補正演算をアナログ的に説明すれば、
次の如くである。If this correction operation is described in analog terms,
It is as follows.
【0037】試料Wが挿入された状態での測定用差動コ
イル44の出力電圧はEB1sin (ωt+θ1 )、空心状
態のときの測定用差動コイル44の出力電圧はEB2sin
(ωt+θ2 )、磁界検出用コイル48の出力電圧はE
H sin ωtであって、試料Wが挿入された状態での補正
された測定用差動コイル44の出力電圧をEB sin (ω
t+θ)とする。The output voltage of the measuring differential coil 44 with the sample W inserted is E B1 sin (ωt + θ 1 ), and the output voltage of the measuring differential coil 44 with the air core is E B2 sin
(Ωt + θ 2 ), the output voltage of the magnetic field detecting coil 48 is E
H sin ωt, and the corrected output voltage of the measurement differential coil 44 with the sample W inserted is expressed as E B sin (ω
t + θ).
【0038】ここで、θ1 、θ2 およびθは磁界検出用
コイル48の出力電圧EH sin ωtを基準としたときの
位相である。Here, θ 1 , θ 2, and θ are phases with reference to the output voltage E H sin ωt of the magnetic field detecting coil 48.
【0039】上記から、補正演算は EB sin (ωt+θ)=EB1sin (ωt+θ1 )−EB2sin (ωt+θ2 ) である。From the above, the correction operation is: E B sin (ωt + θ) = E B1 sin (ωt + θ 1 ) −E B2 sin (ωt + θ 2 ).
【0040】左辺EB sin (ωt+θ)はEB (cos θ
sinωt+sin θ cosωt)と書ける。The left side E B sin (ωt + θ) is equal to E B (cos θ
sinωt + sin θ cosωt).
【0041】一方、右辺は、 EB1sin (ωt+θ1 )−EB2sin (ωt+θ2 ) =(EB1cos θ1 −EB2cos θ2 )sin ωt +(EB1sin θ1 −EB2sin θ2 )cos ωt である。したがってEB は |EB |=√{EB1 2 +EB2 2 −2EB1EB2cos (θ1 −θ2 )} となり、位相角θは θ=tan -1{(EB1sin θ1 −EB2sin θ2 )/ (EB1cos θ1 −EB2cos θ2 )} となって、補正される。On the other hand, the right side is E B1 sin (ωt + θ 1 ) −E B2 sin (ωt + θ 2 ) = (E B1 cos θ 1 −EB 2 cos θ 2 ) sin ωt + (E B1 sin θ 1 −E B2 sin θ 2 ) cos ωt. Therefore E B is | E B | = √ {E B1 2 + E B2 2 -2E B1 E B2 cos (θ 1 -θ 2)} , and the phase angle θ θ = tan -1 {(E B1 sin θ 1 - E B2 sin θ 2 ) / (E B1 cos θ 1 −E B2 cos θ 2 )} and is corrected.
【0042】この補正に続いて透磁率演算手段80fの
制御のもとに、(EB /EH )の演算がなされて、透磁
率μが求まる。この演算は周波数毎に行われる。なお、
透磁率測定装置10が定まり、試料Wの断面積を常に一
定にしておけば(SH /SB)は一定であり、この演算
は省略してある。この透磁率演算の結果をプリンタ・デ
ィスプレイ装置84に提示することによって、測定透磁
率が周波数毎のテーブルとしても周波数に対するグラフ
としても提示できる。さらに、EB とEH との位相角δ
=θも演算されて、透磁率|μ|cos δから透磁率の実
数部が、|μ|sin δから透磁率の虚数部が演算され
る。さらに損失(tan δ)についても(sin δ/cos
δ)から演算される。これらの提示も勿論可能である。Following this correction, the calculation of (E B / E H ) is performed under the control of the magnetic permeability calculating means 80f, and the magnetic permeability μ is obtained. This calculation is performed for each frequency. In addition,
If the permeability measuring device 10 is determined and the cross-sectional area of the sample W is always kept constant, (S H / S B ) is constant, and this calculation is omitted. By presenting the result of the permeability calculation to the printer / display device 84, the measured permeability can be presented as a table for each frequency or as a graph for the frequency. Further, the phase angle δ between E B and E H
= Θ is also calculated, and the real part of the magnetic permeability is calculated from the magnetic permeability | μ | cos δ, and the imaginary part of the magnetic permeability is calculated from | μ | sin δ. Further, the loss (tan δ) is also calculated as (sin δ / cos
δ). These presentations are of course also possible.
【0043】なお、上記したように空心状態のときの測
定と試料Wを挿入状態での測定を1MHz毎に行うため
に、周波数によって測定用差動コイル44、磁界検出用
コイル48の浮遊容量および2チャンネル高周波増幅器
66の入力端の浮遊容量による影響を軽減させることが
できる。Since the measurement in the air-core state and the measurement in the state in which the sample W is inserted are performed every 1 MHz as described above, the stray capacitances of the measuring differential coil 44 and the magnetic field detecting coil 48 and the stray capacitance of the magnetic field detecting coil 48 depend on the frequency. The effect of stray capacitance at the input end of the two-channel high-frequency amplifier 66 can be reduced.
【0044】なお、上記した一実施例において、空心状
態のときに1MHz〜100MHzまでの測定を行い、
次いで試料Wを挿入した状態で1MHz〜100MHz
までの測定を行う場合を例示したが、同一周波数で空心
状態のときと試料Wを挿入した状態のときとを交互に測
定して、1MHz〜100MHzまでの測定を行っても
よい。In the above-described embodiment, the measurement is performed from 1 MHz to 100 MHz in the air-core state,
Next, with the sample W inserted, 1 MHz to 100 MHz
Although the case where the measurement up to the above is performed is illustrated, the measurement from 1 MHz to 100 MHz may be performed by alternately measuring the air-core state and the state where the sample W is inserted at the same frequency.
【0045】また、空心状態のときの測定を1MHz毎
に行う場合を例示したが、空心状態のときの測定を試料
Wが挿入された状態での測定の周波数間隔に対し、数倍
の周波数間隔で行っても、充分な場合もある。この場合
は、空心状態のときの測定用差動コイル44の出力電圧
の振幅データおよび位相差データとして次の周波数での
測定まではその直前の測定値で補間することになる。Also, the case where the measurement in the air-core state is performed every 1 MHz has been described as an example, but the measurement in the air-core state is several times the frequency interval of the measurement with the sample W inserted. In some cases, it may be sufficient. In this case, as the amplitude data and the phase difference data of the output voltage of the measurement differential coil 44 in the state of the air-core state, interpolation is performed with the measurement value immediately before the measurement at the next frequency.
【0046】[0046]
【発明の効果】以上のように、本発明によれば、摺動部
材を介してワークを透磁率測定用のコイル内に挿入する
ことができる。そして、この場合、透磁率測定用の基板
は測定用差動コイルと磁界検出用コイルとを備えた単一
の基板から構成されているために、寸法誤差等を生ずる
ことがない。従って、安定した透磁率の測定ができる。
しかも、摺動部材は案内部材に対してストッパを介して
位置決めされるために、常に測定位置が定まった状態に
ある。従って、多数の試料を測定する場合であっても、
安定した測定誤差のない結果が得られる。しかも、該摺
動部材に試料としての薄膜磁性材料を固定して孔部に挿
入可能な固着部位を設けているので、試料の位置決めが
容易である。As described above, according to the present invention, a work can be inserted into a coil for measuring magnetic permeability via a sliding member. In this case, since the substrate for magnetic permeability measurement is composed of a single substrate including the measurement differential coil and the magnetic field detection coil, no dimensional error or the like occurs. Therefore, stable measurement of magnetic permeability can be performed.
In addition, since the sliding member is positioned with respect to the guide member via the stopper, the measurement position is always in a fixed state. Therefore, even when measuring a large number of samples,
A stable measurement-free result is obtained. In addition, since the thin-film magnetic material as a sample is fixed to the sliding member and a fixing portion that can be inserted into the hole is provided, positioning of the sample is easy.
【0047】さらに、本発明によれば、透磁率測定試料
が挿入されていない空心状態のときの測定用差動コイル
の出力電圧を透磁率測定試料が挿入された状態のときに
おける測定用差動コイルの出力電圧からベクトル減算し
て補正し、補正後の測定用差動コイルの出力電圧と磁界
検出用コイルの出力電圧との比から透磁率を測定するよ
うにしたため、測定用差動コイルの製作上の制約等か
ら、測定用差動コイルを形成する2つのコイル部の有効
面積を等しく形成することができない場合においても、
これが補正されて実質的に測定用差動コイルを形成する
2つのコイル部の有効面積を等しく形成したのと等価と
なって、透磁率を正確に測定することができる効果があ
る。Further, according to the present invention, the output voltage of the measurement differential coil in the air-core state where the magnetic permeability measurement sample is not inserted is changed by the measurement differential coil in the state where the magnetic permeability measurement sample is inserted. The vector is subtracted from the output voltage of the coil and corrected, and the permeability is measured from the ratio of the output voltage of the corrected measurement differential coil and the output voltage of the magnetic field detection coil. Even in the case where the effective areas of the two coil portions forming the measurement differential coil cannot be made equal due to manufacturing restrictions and the like,
This is corrected to be substantially equivalent to the case where the effective areas of the two coil portions forming the measurement differential coil are substantially equalized, and there is an effect that the magnetic permeability can be accurately measured.
【図1】本発明の一実施例の装置の分解斜視図である。FIG. 1 is an exploded perspective view of an apparatus according to an embodiment of the present invention.
【図2】図1に示す装置の斜視図である。FIG. 2 is a perspective view of the device shown in FIG.
【図3】図1並びに図2の装置に組み込まれる基板の正
面図である。FIG. 3 is a front view of a substrate incorporated in the apparatus shown in FIGS. 1 and 2;
【図4】図3に示す基板の背面図である。FIG. 4 is a rear view of the substrate shown in FIG. 3;
【図5】本発明の一実施例の構成を示すブロック図であ
る。FIG. 5 is a block diagram showing a configuration of one embodiment of the present invention.
【図6】本発明が適用される透磁率測定装置の検出部の
構成を示す斜視図である。FIG. 6 is a perspective view showing a configuration of a detecting unit of the magnetic permeability measuring apparatus to which the present invention is applied.
10…透磁率測定装置 12…基台 16…案内部材 18…磁気検出回路 22…摺動部材 24…把手 28…励磁用コイル 44…測定用差動コイル 48…磁界検出用コイル 50、52、54…ターミナル 60…発振器 62…フィルタ・アッテネータ 64…高周波電力増幅器 66…2チャンネル高周波増幅器 68…2チャンネルミキサ 70…発振器 72…2チャンネル中間周波増幅器 74…2チャンネルA/D変換器およびメモリ 76…位相検波器およびA/D変換器 80…マイクロコンピュータ 80a、80b…発振周波数制御手段 80c…減衰率制御手段 80d…メモリ制御手段 80e…補正演算手段 80f…透磁率演算手段 80g…表示制御手段 82…外部メモリ 84…プリンタ・ディスプレイ装置 W…試料 DESCRIPTION OF SYMBOLS 10 ... Permeability measuring apparatus 12 ... Base 16 ... Guide member 18 ... Magnetic detection circuit 22 ... Sliding member 24 ... Handle 28 ... Excitation coil 44 ... Measurement differential coil 48 ... Magnetic field detection coil 50, 52, 54 ... Terminal 60 ... Oscillator 62 ... Filter Attenuator 64 ... High Frequency Power Amplifier 66 ... Two Channel High Frequency Amplifier 68 ... Two Channel Mixer 70 ... Oscillator 72 ... Two Channel Intermediate Frequency Amplifier 74 ... Two Channel A / D Converter and Memory 76 ... Phase Detector and A / D converter 80 Microcomputer 80a, 80b Oscillation frequency control means 80c ... Attenuation rate control means 80d ... Memory control means 80e ... Correction calculation means 80f ... Magnetic permeability calculation means 80g ... Display control means 82 ... External Memory 84: Printer / display device W: Sample
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平7−104044(JP,A) 特開 平5−264705(JP,A) 特開 平5−232203(JP,A) 特開 平4−19584(JP,A) 特開 昭61−57871(JP,A) (58)調査した分野(Int.Cl.7,DB名) G01R 33/00 - 33/18 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-7-104044 (JP, A) JP-A-5-264705 (JP, A) JP-A-5-232203 (JP, A) JP-A-4- 19584 (JP, A) JP-A-61-57871 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) G01R 33/00-33/18
Claims (5)
コイルと、前記磁界発生用コイル中に配設された磁界検
出用コイル並びに測定用差動コイルとを備え測定用差動
コイルの出力電圧と磁界検出用コイルの出力電圧とから
透磁率を測定する透磁率測定装置において、 前記磁界検出用コイルと測定用差動コイルとは単一の基
板上に巻回形成されていることを特徴とする透磁率測定
装置。1. A measuring differential coil comprising: a magnetic field generating coil for generating a substantially uniform alternating magnetic field; a magnetic field detecting coil and a measuring differential coil disposed in the magnetic field generating coil. In a magnetic permeability measuring device for measuring magnetic permeability from an output voltage and an output voltage of a magnetic field detection coil, the magnetic field detection coil and the measurement differential coil are wound around a single substrate. Characteristic permeability measuring device.
前記基板の測定用差動コイルの中心部位を貫通して試料
挿入用の孔部が画成されていることを特徴とする透磁率
測定装置。2. The magnetic permeability measuring apparatus according to claim 1, wherein
A magnetic permeability measuring device, wherein a hole for sample insertion is formed through a central portion of the measurement differential coil of the substrate.
試料挿入用の孔部に対して案内部材を近接配置し、前記
案内部材に摺動部材を係合させて該摺動部材に固定され
た試料を前記孔部に挿入することを特徴とする透磁率測
定装置。3. The magnetic permeability measuring apparatus according to claim 2, wherein
A guide member is disposed in close proximity to a sample insertion hole, a slide member is engaged with the guide member, and a sample fixed to the slide member is inserted into the hole. Magnetic susceptibility measurement device.
案内部材に前記摺動部材を所定位置で停止させるストッ
パを設けることを特徴とする透磁率測定装置。4. The magnetic permeability measuring apparatus according to claim 3, wherein
A magnetic permeability measuring device, wherein a guide member is provided with a stopper for stopping the sliding member at a predetermined position.
おいて、前記摺動部材に試料としての薄膜磁性材料の固
着部位を形成することを特徴とする透磁率測定装置。5. A magnetic permeability measuring apparatus according to claim 3, wherein a fixed portion of a thin film magnetic material as a sample is formed on said sliding member.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP03819892A JP3144871B2 (en) | 1992-02-25 | 1992-02-25 | Permeability measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP03819892A JP3144871B2 (en) | 1992-02-25 | 1992-02-25 | Permeability measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05264705A JPH05264705A (en) | 1993-10-12 |
| JP3144871B2 true JP3144871B2 (en) | 2001-03-12 |
Family
ID=12518657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP03819892A Expired - Fee Related JP3144871B2 (en) | 1992-02-25 | 1992-02-25 | Permeability measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3144871B2 (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4638713B2 (en) * | 2004-10-29 | 2011-02-23 | 一郎 笹田 | Coil for sensor and magnetic sensor using the same |
| JP2008039409A (en) * | 2006-08-01 | 2008-02-21 | Nec Tokin Corp | Buoyancy type magnetic azimuth detection element |
| JP6960655B2 (en) * | 2017-03-31 | 2021-11-05 | 国立大学法人 筑波大学 | Magnetic property measurement method for magnetic materials and magnetic property measurement device for magnetic materials |
| CN113296034B (en) * | 2021-05-27 | 2025-04-15 | 中国科学院高能物理研究所 | Coil fixture for measuring magnetic field of magnets |
| CN115767872B (en) * | 2022-10-31 | 2025-10-28 | 兰州泰基离子技术有限公司 | Shimming Method for Discreteness Measurement of Iron-Core Dominant Magnets |
-
1992
- 1992-02-25 JP JP03819892A patent/JP3144871B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH05264705A (en) | 1993-10-12 |
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