JP3157693B2 - Method for producing silica glass-based deposit - Google Patents
Method for producing silica glass-based depositInfo
- Publication number
- JP3157693B2 JP3157693B2 JP05739895A JP5739895A JP3157693B2 JP 3157693 B2 JP3157693 B2 JP 3157693B2 JP 05739895 A JP05739895 A JP 05739895A JP 5739895 A JP5739895 A JP 5739895A JP 3157693 B2 JP3157693 B2 JP 3157693B2
- Authority
- JP
- Japan
- Prior art keywords
- flow rate
- gas
- raw material
- carrier gas
- vapor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B37/00—Manufacture or treatment of flakes, fibres, or filaments from softened glass, minerals, or slags
- C03B37/01—Manufacture of glass fibres or filaments
- C03B37/012—Manufacture of preforms for drawing fibres or filaments
- C03B37/014—Manufacture of preforms for drawing fibres or filaments made entirely or partially by chemical means, e.g. vapour phase deposition of bulk porous glass either by outside vapour deposition [OVD], or by outside vapour phase oxidation [OVPO] or by vapour axial deposition [VAD]
- C03B37/01413—Reactant delivery systems
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2207/00—Glass deposition burners
- C03B2207/80—Feeding the burner or the burner-heated deposition site
- C03B2207/85—Feeding the burner or the burner-heated deposition site with vapour generated from liquid glass precursors, e.g. directly by heating the liquid
- C03B2207/86—Feeding the burner or the burner-heated deposition site with vapour generated from liquid glass precursors, e.g. directly by heating the liquid by bubbling a gas through the liquid
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2207/00—Glass deposition burners
- C03B2207/80—Feeding the burner or the burner-heated deposition site
- C03B2207/85—Feeding the burner or the burner-heated deposition site with vapour generated from liquid glass precursors, e.g. directly by heating the liquid
- C03B2207/88—Controlling the pressure
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Glass Melting And Manufacturing (AREA)
- Manufacture, Treatment Of Glass Fibers (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は光ファイバ用母材、ある
いはLSIフォトマスク基板用ガラスとして有用なシリ
カガラス系堆積体の製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing a silica glass-based deposit useful as a base material for an optical fiber or a glass for an LSI photomask substrate.
【0002】[0002]
【従来の技術】光ファイバー用母材となるシリカガラス
の製造設備では、水素、酸素等の気体原料の他に、SiO2
ガラスの原料となる SiCl4や、ガラスに屈折率分布を形
成する為のドープ用原料として GeCl4が液体原料として
製造に供される。気相軸付け(VAD)法では各々の液
体原料はともに気化されて酸水素火炎バーナーへ供給さ
れ、ガラス微粒子堆積体の形成に供される。従来、これ
らの方法においては SiCl4および GeCl4は各原料容器内
に充填し、流量制御されたキャリアーガスたとえばAr
ガスを各原料容器内のガラス原料中にバブリングするこ
とにより所望の各原料をキャリアーガス中に気相拡散さ
せ、各原料蒸気をキャリアーガスとの混合気体として発
生させてバーナーに供給していた。図2はこれを概念的
に示したものである。2. Description of the Related Art In a facility for producing silica glass as a base material for optical fibers, in addition to gaseous materials such as hydrogen and oxygen, SiO 2
SiCl 4 , which is a raw material for glass, and GeCl 4, which is a doping raw material for forming a refractive index distribution in glass, are provided as liquid raw materials for production. In the vapor phase axial (VAD) method, each liquid raw material is vaporized together and supplied to an oxyhydrogen flame burner to be used for forming a glass fine particle deposit. Conventionally, in these methods, SiCl 4 and GeCl 4 are filled in each raw material container, and a carrier gas having a controlled flow rate such as Ar gas is used.
The desired raw material is vapor-phase diffused in the carrier gas by bubbling the gas into the glass raw material in each raw material container, and each raw material vapor is generated as a mixed gas with the carrier gas and supplied to the burner. FIG. 2 conceptually illustrates this.
【0003】同図において1はキャリアーガス流量制御
器、2はガラス原料容器(以後容器という)、3はガラ
ス原料(以後原料という)であり、原料容器気相ではキ
ャリアーガスおよびキャリアーガス中に拡散した原料蒸
気の2成分系になっていることから、P を容器2内にお
ける気相全圧、φを飽和度、tを容器温度、p(t)を温度
tにおける原料の飽和蒸気圧とすると、原料蒸気の容器
2内における分圧はφp(t)であらわされる。またキャリ
アーガスの、容器2内における分圧はP-φp(t)であらわ
されることから、qをキャリアーガス流量、Qを同伴原
料蒸気流量とすると次式が成り立つ。 Q:q=原料蒸気分圧φp(t):キャリアーガス分圧P-φp(t)…(1) 即ち、同伴原料蒸気流量Qは次式により計算される。 Q=q×φp(t)/{P-φp(t)}…(2)In FIG. 1, reference numeral 1 denotes a carrier gas flow controller, reference numeral 2 denotes a glass raw material container (hereinafter referred to as a container), and reference numeral 3 denotes a glass raw material (hereinafter referred to as a raw material). Since P is the two-component system of the raw material vapor, P is the total gas phase pressure in the container 2, φ is the saturation degree, t is the container temperature, and p (t) is the saturated vapor pressure of the raw material at the temperature t. The partial pressure of the raw material vapor in the vessel 2 is represented by φp (t). Further, since the partial pressure of the carrier gas in the vessel 2 is represented by P-φp (t), the following equation holds when q is the carrier gas flow rate and Q is the accompanying raw material vapor flow rate. Q: q = raw material partial pressure φp (t): carrier gas partial pressure P−φp (t) (1) That is, the accompanying raw material vapor flow rate Q is calculated by the following equation. Q = q × φp (t) / {P-φp (t)} (2)
【0004】この原料蒸気流量Qを一定にするには、
(2)式中q、φ、p(t)およびPの各値を一定に保持す
ればよい。キャリアーガス流量qはマスフローコントロ
ーラーにより精度よく一定値に制御される。飽和度φを
全て一定にする技術としては、例えば特公昭 61-1378号
公報に開示されているが、この方法によると、同一液体
原料を充填した容器を前、後段に区分してバブリング用
キャリアーガス導管により直列に接続し、且つ前段にあ
る容器の温度により高温に維持することにより、飽和度
φを再現性よくほぼ 100%に保持することができる。In order to keep the raw material vapor flow rate Q constant,
(2) In the equation, the values of q, φ, p (t) and P may be kept constant. The carrier gas flow rate q is precisely controlled to a constant value by a mass flow controller. As a technique for keeping the degree of saturation φ constant, for example, it is disclosed in Japanese Patent Publication No. 61-1378, but according to this method, a container filled with the same liquid material is divided into a front and a rear stage, and a carrier for bubbling is divided. The saturation degree φ can be maintained at almost 100% with good reproducibility by connecting in series by a gas conduit and maintaining the temperature at a high temperature by the temperature of the vessel at the preceding stage.
【0005】[0005]
【発明が解決しようとする課題】(2)式において、キ
ャリアーガス流量qは、質量流量計(MFC)により制
御されるので、精度の高さに加えて応答性も速い。これ
に対し原料濃度φp(t)/(P-φp(t)) は複数の因子から決
定され、応答性は極めて遅いことから、キャリアーガス
方式にあっては、原料蒸気流量Qは、容器気相中の諸条
件の均一化と安定化により原料蒸気濃度を一定値に保持
し、キャリアーガス流量により制御されるのが理想的制
御方法と考えられる。In the equation (2), the flow rate q of the carrier gas is controlled by the mass flow meter (MFC), so that the responsiveness is high in addition to the high accuracy. On the other hand, the raw material concentration φp (t) / (P−φp (t)) is determined from a plurality of factors, and the response is extremely slow. Therefore, in the carrier gas method, the raw material vapor flow rate Q is It is considered that the ideal control method is to keep the raw material vapor concentration at a constant value by equalizing and stabilizing various conditions in the phase and to control the raw material vapor concentration by the carrier gas flow rate.
【0006】しかしながらVAD法では、容器〜火炎バ
ーナー内の原料蒸気流路の流動抵抗が小さく容器の気相
圧力は、すべて0.01kg/cm2以下であり、大気圧の変動が
そのまま気相圧力の変動となるので、従来の供給方法の
ように、キャリアーガス流量q、飽和度φ、及び容器の
温度tを一定に保持しても、容器内気相圧力P が大気圧
π→π±△πに変化すると容器内気相圧力P →P ±△π
に変化してしまい、同伴原料蒸気流量Qは(3)式によ
り表される△Qだけ変化してしまう。 △Q=q×φp(t)[1/{P ±△π−φp(t)} −1/{P-φp(t)} ]…(3)However, in the VAD method, the flow resistance of the raw material vapor flow path in the vessel to the flame burner is small, and the gas phase pressure in the vessel is all 0.01 kg / cm 2 or less. Even if the carrier gas flow rate q, the saturation degree φ, and the temperature t of the container are kept constant as in the conventional supply method, the gas pressure P in the container becomes atmospheric pressure π → π ± △ π. When it changes, the gas pressure in the vessel P → P ± △ π
, And the accompanying raw material vapor flow rate Q changes by ΔQ represented by the equation (3). ΔQ = q × φp (t) [1 / {P ± △ π-φp (t)} -1 / {P-φp (t)}… (3)
【0007】従来、このように大気圧πが変動した場合
にはこの変動による(2)式中の濃度項φp(t)/{P-φ
p(t)}の変動を打ち消すようにキャリアーガス流量項q
を変化させることにより対応する方法が、例えば特公平
4-33738号公報に開示されている。この方法は、図2に
おいて大気圧センサ5により検知された△πが補正演算
器6に伝達され、演算器6において原料濃度変動値φp
(t)[1/{P ±△π−φp(t)} −1/{P-φp(t)} ]が直
ちに計算され、これに応じて増減されたキャリアーガス
流量の新規設定値をキャリアーガス流量制御器1へ伝達
する。このように容器気相の原料濃度の上昇または低下
に合わせて、キャリアーガス流量qの設定値を低減、あ
るいは増加させることにより、同伴原料蒸気流量Qを一
定値になるように保持していた。しかしこの方法は、キ
ャリアーガス流量を変更することになり、その結果、バ
ーナーの酸水素火炎の温度変動による堆積母材表面の嵩
密度が変更前と後で異なり、これが透明ガラス化の際に
該当部位に微妙な屈折率の変異部位を作り出す結果とな
り、プリフォームの光学特性不良や、光学ガラスの脈理
の原因となるという問題があった。Conventionally, when the atmospheric pressure π fluctuates as described above, the concentration term φp (t) / {P-φ in the equation (2) due to this fluctuation.
Carrier gas flow term q so as to cancel the fluctuation of p (t)}
The method of responding by changing
It is disclosed in Japanese Patent Publication No. 4-33738. In this method, .DELTA..pi. Detected by the atmospheric pressure sensor 5 in FIG.
(t) [1 / {P ± △ π-φp (t)} -1 / {P-φp (t)}] is immediately calculated, and the new set value of the carrier gas flow rate which is increased or decreased accordingly is set to the carrier. The signal is transmitted to the gas flow controller 1. As described above, the set value of the carrier gas flow rate q is reduced or increased in accordance with the rise or fall of the raw material concentration in the container gas phase, thereby maintaining the accompanying raw material vapor flow rate Q at a constant value. However, in this method, the carrier gas flow rate is changed, and as a result, the bulk density of the surface of the deposited base material due to the temperature fluctuation of the oxyhydrogen flame of the burner is different from before and after the change, and this is the case during the transparent vitrification. As a result, a delicate refractive index variation site is created in the site, and there is a problem that the optical characteristics of the preform are poor and the optical glass is striae.
【0008】[0008]
【課題を解決するための手段】本発明は上記の問題を解
決したもので、液体シリコン化合物等の液体原料をそれ
ぞれ原料容器に充填し、これにキャリアガスをバブリン
グしてそれぞれを別個に気化しキャリアガスとの混合気
体を得、この混合気体をバーナーに供給し、同バーナー
において酸水素火炎中にて火炎加水分解することにより
それぞれの微粒子を発生させ、これら微粒子を回転する
種棒上に付着、堆積させることによるシリカガラス系堆
積体の製造方法において、検知された大気圧の変動値か
ら濃度変動を推定する演算手段および濃度変動推定値か
らキャリアーガス流量を補正する制御手段を備えること
により液体原料の蒸気供給流量を一定に制御する際、前
記混合気体がバーナーに供給される直前に、前記混合気
体に前記キャリアガスと同一成分のガスを大気圧の変動
に応じた流量を加えて混合気体中のキャリアガス成分の
流量を一定に保つとするシリカガラス系堆積体の製造方
法を要旨とするものである。SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and a liquid material such as a liquid silicon compound is filled in each material container, and a carrier gas is bubbled into each of the material containers to vaporize them separately. A mixed gas with a carrier gas is obtained, this mixed gas is supplied to a burner, and the burner performs flame hydrolysis in an oxyhydrogen flame to generate fine particles, and these fine particles adhere to a rotating seed rod. A method for manufacturing a silica glass-based deposit by depositing, comprising: a calculating means for estimating a concentration fluctuation from a detected fluctuation value of atmospheric pressure; and a control means for correcting a carrier gas flow rate from the concentration fluctuation estimated value. When controlling the steam supply flow rate of the raw material to be constant, the carrier gas is added to the gas mixture immediately before the gas mixture is supplied to the burner. The scan of the same component of the gas is intended to be subject matter of the method for producing a silica glass-based deposit to the addition of flow rate corresponding to changes in atmospheric pressure maintaining the flow rate of the carrier gas components in the mixed gas to be constant.
【0009】以下本発明を具体的に説明する。図1は本
発明の説明図で、図中1は第1キャリアーガス流量制御
器、2は液体原料容器(容器)、3は原料、5は大気圧
センサ、6は補正演算器、7は第2キャリアーガス流量
制御器よりなり第1、第2キャリアーガス流量制御器は
大気圧センサ5、及び補正演算器6に接続されている。
原料の SiCl4は容器2に原料補給管11により注入され、
第1キャリアーガスがキャリアーガス導入管8より供給
され原料蒸気とキャリアガスの混合気体が原料蒸気供給
管9よりバーナー(図示せず)に送られ、別途供給され
るO2 ガス(図示せず)とH2 ガス(図示せす)による
酸水素火炎により火炎加水分解され酸化物微粒子を生成
し、これを回転する種棒上(図示せず)に付着、堆積す
ることによりシリカガラス系堆積体を製造するが、この
工程において第2キャリアーガスとして第1キャリアー
ガスと同一成分のガスを、大気圧の変動に応じて変化し
た第1キャリアーガス流量を補うために、第2キャリア
ーガス流量制御器7よりバーナーの直前において、原料
ガスと第1キャリアーガスの混合ガスに混合されるもの
である。第1キャリアーガス流量制御器1、第2キャリ
アーガス流量制御器7にはそれぞれ大気圧センサ5に接
続した補正演算器6により、大気圧の変動に応じて第
1、第2キャリアーガスの流量q1、q2 をコントロール
して、供給原料蒸気量Q、及びキャリアーガス総流量q
=q1 +q2 を一定となるようにする。Hereinafter, the present invention will be described specifically. FIG. 1 is an explanatory view of the present invention, in which 1 is a first carrier gas flow controller, 2 is a liquid material container (container), 3 is a material, 5 is an atmospheric pressure sensor, 6 is a correction calculator, and 7 is a The first and second carrier gas flow controllers comprise two carrier gas flow controllers and are connected to an atmospheric pressure sensor 5 and a correction calculator 6.
The raw material SiCl 4 is injected into the container 2 by the raw material supply pipe 11,
The first carrier gas is supplied from a carrier gas introduction pipe 8, and a mixed gas of the raw material vapor and the carrier gas is sent from a raw material vapor supply pipe 9 to a burner (not shown), and an O 2 gas (not shown) separately supplied is provided. And H 2 gas (not shown), flame-hydrolyzed by an oxyhydrogen flame to produce oxide fine particles, which are deposited and deposited on a rotating seed rod (not shown) to form a silica glass-based deposit. In this process, a gas having the same composition as the first carrier gas is used as the second carrier gas in this step, in order to compensate for the first carrier gas flow rate changed according to the fluctuation of the atmospheric pressure, the second carrier gas flow controller 7 is used. Immediately before the burner, it is mixed with the mixed gas of the source gas and the first carrier gas. The first and second carrier gas flow controllers 1 and 2 each have a correction arithmetic unit 6 connected to an atmospheric pressure sensor 5 to control the flow rate q of the first and second carrier gases according to the fluctuation of the atmospheric pressure. 1, q 2 is controlled, and the feed material vapor amount Q and the carrier gas total flow amount q
= Q 1 + q 2 is made constant.
【0010】しかし、キャリアーガスが低下すると供給
する原料蒸気量Qが低下すると言う問題があるが、これ
に付いては、本発明者らは検討を重ねた結果、容器気相
の原料蒸気濃度を高く一定に設定することにより、第1
キャリアーガス流量q1 が従来の流量qより低めに設定
しても原料蒸気量Qを低下させることなく行うことがで
き、その差q2 (=q−q1 )の流量を第2キャリアー
ガスとして別ラインからマスフローコントローラにより
流量制御し、第1キャリアーガスとの混合気体がバーナ
ーに供給される直前部位に、導入して混合することとし
た。これは(2)式中の濃度項φp(t)/{P-φp(t)}の
変動を打ち消すように第1キャリアーガス流量項q1 を
変化させて原料蒸気流量Qを一定に保ち、同時に第2キ
ャリアーガス流量q2 を同量変化させ、キャリアーガス
総流量q1 +q2 (=q)が常に一定に保持されるよう
にしたものである。なお容器内気相の原料蒸気濃度を高
く設定する方法は、例えば容器の加熱温度を上げる等の
方法でおこなえばよい。この第1キャリアーガス流量q
1 の原料蒸気供給流量Qに対する比率(容量比、以下同
じ)は、0.25未満とすると50℃以上に原料容器の温度を
維持することが必要で容器気相飽和度の一定化が難し
い。また、第2キャリアーガス流量q2 の第1キャリア
ーガス流量q1 に対する比率は、0.20以上であることが
制御上好ましい。キャリアーガス総流量q1 +q2 (=
q)の原料蒸気供給流量Qに対する比率は0.30以上とす
ることが好ましいが、この比率は大きいほど原料容器内
温度は低値でよく原料蒸気流量制御上も高精度化しやす
いが、火炎温度を低下させるという問題があり、従って
0.30〜2とすることがよく、より好ましくは0.50〜1.5
である。なお、本発明のシリカガラス系堆積体として
は、光ファイバ用プリフォームのための多孔質ガラス母
材や、LSI用フォトマスク基板に用いられる光学用シ
リカガラス等が例示される。However, there is a problem that the amount of the raw material vapor Q to be supplied is reduced when the carrier gas is reduced. As a result, the present inventors have repeatedly studied and found that the concentration of the raw material vapor in the gas phase of the container is reduced. By setting high and constant, the first
Also carrier gas flow rate q 1 is set lower than the conventional flow rate q can be done without reducing the raw material steam amount Q, the flow rate of the difference q 2 (= q-q 1) as the second carrier gas The flow rate was controlled by a mass flow controller from another line, and the mixed gas with the first carrier gas was introduced and mixed at a position immediately before being supplied to the burner. This (2) the concentration term in formula φp (t) / {P- φp (t)} first by changing the carrier gas flow to claim q 1 so as to cancel the variation of keeping the raw material vapor flow rate Q constant, At the same time, the second carrier gas flow rate q 2 is changed by the same amount so that the total carrier gas flow rate q 1 + q 2 (= q) is always kept constant. The method of setting the raw material vapor concentration in the gas phase in the container high may be performed by, for example, increasing the heating temperature of the container. This first carrier gas flow rate q
If the ratio (volume ratio, hereinafter the same) of 1 to the raw material vapor supply flow rate Q is less than 0.25, it is necessary to maintain the temperature of the raw material container at 50 ° C. or more, and it is difficult to stabilize the gas phase saturation of the container. Further, the ratio of the first carrier gas flow rate q 1 of the second carrier gas flow rate q 2, it is controlled on preferably 0.20 or more. Carrier gas total flow q 1 + q 2 (=
The ratio of q) to the raw material vapor supply flow rate Q is preferably 0.30 or more. The larger the ratio, the lower the temperature in the raw material container and the higher the accuracy of the raw material vapor flow control, but the lower the flame temperature. The problem is that
It is preferably 0.30 to 2, more preferably 0.50 to 1.5
It is. Examples of the silica glass-based deposit of the present invention include a porous glass preform for an optical fiber preform and an optical silica glass used for a photomask substrate for LSI.
【0011】[0011]
【作用】本発明は液体シリコン化合物等の液体原料をそ
れぞれ原料容器に充填し、これにキャリアガスをバブリ
ングしてそれぞれを別個に気化しキャリアガスとの混合
気体を得、この混合気体をバーナーに供給し、同バーナ
ーにおいて酸水素火炎中にて火炎加水分解することによ
りそれぞれの微粒子を発生させ、これら微粒子を回転す
る種棒上に付着、堆積させることによりなるシリカガラ
ス系堆積体の製造方法において、検知された大気圧の変
動値から濃度変動を推定する演算手段および濃度変動推
定値からキャリアーガス流量を補正する制御手段を備え
ることにより液体原料の蒸気供給流量を一定に制御する
際、前記混合気体がバーナーに供給される直前に、前記
混合気体に前記キャリアガスと同一成分のガスを大気圧
の変動に応じた流量を加えて混合気体中のキャリアガス
成分のガス流量を一定に保つことよりなるシリカガラス
系堆積体の製造方法を要旨とするもので、本発明に依る
と大気圧の変動に対してもバーナーに供給される原料蒸
気流量およびキャリアーガス流量が常に一定に保持され
る結果、再現性よく軸方向に均質な光ファイバー母材
や、脈理のない光学的に透明で均一な合成石英ガラスを
得ることができる。According to the present invention, a liquid material such as a liquid silicon compound is charged into a material container, and a carrier gas is bubbled into the material containers to separately vaporize each of them to obtain a mixed gas with the carrier gas. Supply, and in the same burner, the respective particles are generated by flame hydrolysis in an oxyhydrogen flame, and the fine particles are adhered and deposited on a rotating seed rod. When controlling the vapor supply flow rate of the liquid raw material to be constant by providing arithmetic means for estimating the concentration fluctuation from the detected fluctuation value of the atmospheric pressure and control means for correcting the carrier gas flow rate from the concentration fluctuation estimation value, the mixing is performed. Immediately before the gas is supplied to the burner, a gas having the same composition as the carrier gas flows through the mixed gas in accordance with the fluctuation of the atmospheric pressure. To maintain the gas flow rate of the carrier gas component in the mixed gas at a constant level. As a result, the flow rate of the supplied raw material vapor and the flow rate of the carrier gas are always kept constant, so that an optical fiber preform that is homogeneous in the axial direction with good reproducibility and an optically transparent and uniform synthetic quartz glass without striae can be obtained. it can.
【0012】[0012]
【実施例】以下本発明の実施例、比較例について述べ
る。 実施例1 コア用原料 SiCl4は、図1の原料蒸気供給装置を用い、
液体 SiCl4容器内の温度40℃で SiCl4蒸気流量とArガ
ス総流量の体積比率は1.21に設定し、 SiCl4蒸気流量を
121SCCM (毎分標準体積流量(CC)、以下同じ)、Ar
ガス総流量を100SCCM 、第1キャリアーガスのArガス
流量q1 は68SCCM、第2キャリアーガスのArガス流量
q2 は32SCCMに設定された。この間、大気圧は気圧計で
1.033〜1.053kg/cm2の範囲で変動したが、原料容器内
に吹き込まれる第1キャリアーガスのArガスのマスフ
ローコントローラー流量の制御流量q1 は68〜70SCCMで
補正制御されるとともに、第2キャリアーガスのArガ
スのマスフローコントローラー流量の制御流量q2 は32
〜30SCCMで補正制御された。その結果コア用バーナーに
供給された SiCl4蒸気流量は121SCCM と、またキャリア
ーガスのArガスの総流量q1 +q2 は 100SCCMと常に
一定に保たれた。EXAMPLES Examples and comparative examples of the present invention will be described below. Example 1 Core material SiCl 4 was obtained by using a material vapor supply device shown in FIG.
At a temperature of 40 ° C in the liquid SiCl 4 container, the volume ratio between the SiCl 4 vapor flow rate and the Ar gas total flow rate was set to 1.21, and the SiCl 4 vapor flow rate was
121SCCM (Standard volume flow per minute (CC), the same applies hereinafter), Ar
Total gas flow rate 100SCCM, Ar gas flow rate q 1 of the first carrier gas 68SCCM, Ar gas flow rate q 2 of the second carrier gas was set to 32 sccm. During this time, the atmospheric pressure was measured with a barometer
Although it fluctuated in the range of 1.033 to 1.053 kg / cm 2 , the control flow rate q 1 of the mass flow controller flow rate of the Ar gas of the first carrier gas blown into the raw material container was corrected and controlled at 68 to 70 SCCM, and the second carrier was controlled. The control flow q 2 of the mass flow controller flow of Ar gas is 32
The correction was controlled at ~ 30 SCCM. As a result, the flow rate of SiCl 4 vapor supplied to the core burner was kept constant at 121 SCCM, and the total flow rate q 1 + q 2 of Ar gas as a carrier gas was kept constant at 100 SCCM.
【0013】一方、コア用ドウパントの液体原料の GeC
l4についてはキャリアーガスのArガスの流量も少ない
ことからその効果が小さいことより従来法の図2の原料
供給装置を用い、コア用バーナーに次の様に供給した。
温度30℃に保持された液体 GeCl4の原料容器内液中に上
記Arガス50SCCMをバブリングすることにより GeCl4蒸
気を同伴させてコア用バーナーに送気した。容器内の気
相圧力0.01KG(1.043kg/cm2 )において、容器内温度
30℃では気相内における GeCl4蒸気とArガスの体積比
率は0.18である。この間、大気圧センサと流量補正制御
器により、Arガスのマスフローコントローラー流量の
制御流量が50〜52SCCMの範囲で補正制御されたが、バー
ナーに供給された GeCl4蒸気は50SCCMと常に一定に保た
れた。On the other hand, GeC as a liquid raw material for the core dough punt
l 4 using the raw material supply apparatus of FIG. 2 of the prior art from this effect becomes small since the flow rate is small in the Ar gas of the carrier gas for, and fed to the core burner as follows.
The Ar gas of 50 SCCM was bubbled into the liquid in the raw material container of liquid GeCl 4 kept at a temperature of 30 ° C., and GeCl 4 vapor was entrained to send the gas to the core burner. When the gas phase pressure in the container is 0.01 KG (1.043 kg / cm 2 ), the temperature in the container
At 30 ° C., the volume ratio of GeCl 4 vapor to Ar gas in the gas phase is 0.18. During this time, the control flow rate of the Ar gas mass flow controller flow rate was controlled by the atmospheric pressure sensor and the flow rate correction controller in the range of 50 to 52 SCCM, but the GeCl 4 vapor supplied to the burner was constantly kept at 50 SCCM. Was.
【0014】クラッド用液体原料 SiCl4は、コア用原料
とは別の図1に示す原料蒸気供給装置を用い、液体 SiC
l4の原料容器内温度40℃でSiCl4 蒸気流量とArガス総
流量の体積比率は1.21と設定し、 SiCl4蒸気流量を605S
CCM 、Arガス総流量q1 +q2 を500 SCCM、第1キャ
リアーガスのArガス流量q1 を399SCCM 、第2キャリ
アーガスのArガス流量q2 を 161SCCMに設定した。反
応の間、大気圧は気圧計で 1.033〜1.053kg/cm2 の範囲
で変動したが、容器内に吹き込まれる第1キャリアーガ
スのArガスのマスフローコントローラーの制御流量q
1 は 340〜 350SCCMで補正制御されるとともに、第2キ
ャリアガスのArガスのマスフローコントローラー流量
の制御流量q2 は 160〜150SCCM で補正制御された。そ
の結果、クラッド用バーナーに供給された SiCl4蒸気流
量は605SCCM と、またキャリアーガスのAr総流量q1
+q2 は 500SCCMと常に一定に保たれた。The liquid raw material for cladding SiCl 4 is prepared by using a raw material vapor supply device shown in FIG.
l SiCl 4 vapor flow rate and the Ar gas total flow volume ratio in the raw material container temperature 40 ° C. for 4 is set to 1.21, 605S and SiCl 4 vapor flow
CCM, the total flow rate of Ar gas q 1 + q 2 was set at 500 SCCM, the Ar gas flow rate q 1 of the first carrier gas was set at 399 SCCM, and the Ar gas flow rate q 2 of the second carrier gas was set at 161 SCCM. During the reaction, the atmospheric pressure fluctuated in the range of 1.033 to 1.053 kg / cm 2 with a barometer, but the control flow rate q of the Ar gas of the first carrier gas blown into the container by the mass flow controller q
1 was controlled to be corrected at 340 to 350 SCCM, and the control flow q 2 of the mass flow controller flow rate of Ar gas as the second carrier gas was controlled to be corrected to 160 to 150 SCCM. As a result, the flow rate of the SiCl 4 vapor supplied to the clad burner was 605 SCCM, and the total Ar flow rate q 1 of the carrier gas was 1
+ Q 2 was always kept constant at 500 SCCM.
【0015】この様にしてコア用原料蒸気とクラッド用
原料蒸気をそれぞれコア用及びクラッド用バーナーに送
りVAD法により多孔質ガラス母材を作製し、これを
1,200℃で脱水し、 1,500℃で焼結して直径30mm長さ 50
0mmのシングルモード型プリフォーム(△n= 0.3%)
を5本製造し、その長手方向の屈折率変位について屈折
率分布アナライザーを用いて調べたところ表1に示す結
果を得た。In this way, the raw material vapor for the core and the raw material vapor for the clad are respectively sent to the core and clad burners to produce a porous glass base material by the VAD method.
Dehydrate at 1,200 ° C, sinter at 1,500 ° C, diameter 30mm, length 50
0mm single-mode preform (△ n = 0.3%)
Were produced and their refractive index displacement in the longitudinal direction was examined using a refractive index distribution analyzer. The results shown in Table 1 were obtained.
【0016】[0016]
【表1】 表1の結果より△nのロット内のバラツキは小さいこと
が分った。[Table 1] From the results in Table 1, it was found that the variation in the lot of Δn was small.
【0017】比較例1 コア用原料 SiCl4は図2の原料蒸気供給装置を用い、温
度35℃に保持された液体原料 SiCl4の容器内液中にキャ
リアーガスのArガス 100SCCMをバブリングすることに
より SiCl4蒸気を同伴させ、流量82SCCMに設定してコア
用バーナーに送気する。容器内の気相圧力0.01KG(1.
043kg/cm2 )において、容器内温度35℃では気相内にお
ける SiCl4蒸気流量とArガス流量の体積比率は0.82に
設定した。この間、大気圧センサと流量補正制御器によ
り、Arガスのマスフローコントローラー流量の制御流
量が 100〜103SCCM の範囲で変動したが、コア用バーナ
ーに供給された SiCl4蒸気流量は82SCCMと一定に保たれ
た。ドウパントの液体原料の GeCl4については実施例1
と同様に行ったが、この間Arガスのマスフローコント
ローラー流量の制御量は50〜52SCCMと変化し、コア用バ
ーナーに供給された GeCl4の蒸気流量は50SCCMと一定に
保たれた。Comparative Example 1 Core material SiCl 4 was prepared by bubbling 100 SCCM of Ar gas as a carrier gas into a liquid in a container of liquid material SiCl 4 maintained at a temperature of 35 ° C. using a material vapor supply apparatus shown in FIG. The gas is supplied to the core burner at a flow rate of 82 SCCM, accompanied by SiCl 4 vapor. Gas phase pressure of 0.01 KG (1.
At 043 kg / cm 2 ), the volume ratio of the flow rate of the SiCl 4 vapor to the flow rate of the Ar gas in the gas phase was set to 0.82 at a temperature of 35 ° C. in the container. During this time, the control flow rate of the Ar gas mass flow controller fluctuated in the range of 100 to 103 SCCM by the atmospheric pressure sensor and the flow rate correction controller, but the SiCl 4 vapor flow rate supplied to the core burner was kept constant at 82 SCCM. Was. Example 1 for GeCl 4 as a liquid material for dough punts
During this period, the control amount of the mass flow controller flow rate of Ar gas was changed to 50 to 52 SCCM, and the vapor flow rate of GeCl 4 supplied to the core burner was kept constant at 50 SCCM.
【0018】クラッド用原料 SiCl4は、コア用原料の場
合とは別の図2の原料蒸気供給装置を用い、温度35℃に
保持された液体原料 SiCl4の容器内液中にキャリアガス
のArガスの 500SCCMをバブリングすることにより SiC
l4蒸気を同伴させクラッド用バーナーに送気する。容器
内の気相圧力0.01KG(1.043kg/cm2 )において、容器
内温度35℃では気相内における SiCl4蒸気流量を410SCC
M 設定し、Arガス流量との体積比率は0.82に設定し
た。この間、大気圧センサと流量補正制御器により、キ
ャリアーガスのArガスのマスフローコントローラー流
量の制御流量が 500〜515SCCM の範囲で変化したが、ク
ラッド用バーナーへの供給 SiCl4ガス流量は410 SCCMと
常に一定に保たれた。The cladding raw material SiCl 4 was prepared by using a raw material vapor supply device shown in FIG. 2 different from the core raw material, and using carrier gas Ar in the liquid in the container of the liquid raw material SiCl 4 maintained at a temperature of 35 ° C. SiC by bubbling 500 SCCM of gas
l 4 Steam is supplied to the cladding burner. When the gas pressure in the vessel is 0.01 KG (1.043 kg / cm 2 ) and the temperature in the vessel is 35 ° C., the flow rate of SiCl 4 vapor in the gas phase is 410 SCC.
M was set, and the volume ratio to the Ar gas flow rate was set to 0.82. During this time, the control flow rate of the mass flow controller flow rate of the carrier gas Ar gas changed within the range of 500 to 515 SCCM by the atmospheric pressure sensor and the flow rate correction controller, but the SiCl 4 gas flow rate supplied to the cladding burner was always 410 SCCM. Kept constant.
【0019】この様にしてコア用原料蒸気とクラッド用
原料蒸気をそれぞれコア用及びクラッド用バーナーに送
りVAD法により多孔質ガラス母材を作製し、これを実
施例1と同様に 1,200℃で脱水し、 1,500℃で焼結して
直径30mm長さ 500mmのシングルモード型プリフォーム
(△n= 0.3%)を5本製造し、その長手方向の屈折率
変位について屈折率分布アナライザーを用いて調べたと
ころ表2に示す結果を得た。In this way, the raw material vapor for the core and the raw material vapor for the clad are respectively sent to the core and clad burners to produce a porous glass base material by the VAD method, which is dehydrated at 1,200 ° C. in the same manner as in Example 1. After sintering at 1,500 ° C., five single-mode preforms (Δn = 0.3%) having a diameter of 30 mm and a length of 500 mm were manufactured, and the refractive index displacement in the longitudinal direction was examined using a refractive index distribution analyzer. However, the results shown in Table 2 were obtained.
【0020】[0020]
【表2】 表2の結果より△nのバラツキは大きいことが分った。[Table 2] From the results in Table 2, it was found that the variation of Δn was large.
【0021】実施例2 図1に示す原料蒸気供給装置を用い、原料として液体原
料 SiCl4を用い、容器内の温度40℃での気相内における
SiCl4蒸気流量とキャリアーガスのO2 ガス総流量の体
積比率を1.0 に設定し、 SiCl4蒸気流量を20SLM (毎分
標準体積流量(L )、以下同じ)に、キャリアーガスの
O2 ガス総流量を20SLM に、第1キャリアーガスのO2
ガス流量q1 を14SLM 、第2キャリアガスのO2 ガス流
量q2 を6.0SLM に設定した。この間、大気圧は 1.033
〜 1.053kg/cm2の範囲で変動したが、容器内に吹き込ま
れる第1キャリアーガスのO2 ガスのマスフローコント
ローラー流量の制御流量q1 は14.0〜14.5SLM で補正制
御されるとともに、第2キャリアーガスのO2 ガスのマ
スフローコントローラー流量の制御流量q2 は 6.0〜
5.5SLM で補正制御された。その結果、バーナーに供給
された SiCl4蒸気流量は20SLM と、またキャリアーガス
のO2 ガスの総流量q1 +q2 は20SLM といずれも常に
一定に保たれた。Example 2 Using a raw material vapor supply apparatus shown in FIG. 1, a liquid raw material SiCl 4 was used as a raw material,
The volume ratio of the SiCl 4 vapor flow rate to the carrier gas O 2 gas total flow rate is set to 1.0, the SiCl 4 vapor flow rate is set to 20 SLM (standard volume flow rate per minute (L), the same applies hereinafter), and the carrier gas O 2 gas total The flow rate is 20 SLM and the first carrier gas O 2
The gas flow rate q 1 14SLM, was set O 2 gas flow rate q 2 of the second carrier gas to 6.0SLM. During this time, the atmospheric pressure was 1.033
The control flow rate q 1 of the mass flow controller flow rate of the O 2 gas of the first carrier gas blown into the container is corrected and controlled at 14.0 to 14.5 SLM, and the second carrier gas is varied in the range of 1.053 kg / cm 2. Control flow q 2 of mass flow controller flow of gas O 2 gas is 6.0 ~
Correction was controlled by 5.5SLM. As a result, the flow rate of the SiCl 4 vapor supplied to the burner was kept constant at 20 SLM, and the total flow rate q 1 + q 2 of the O 2 gas as the carrier gas was kept constant at 20 SLM.
【0022】この様にして SiCl4蒸気をバーナーに供給
し、火炎加水分解によりシリカガラス微粒子を生成さ
せ、これを耐熱性担体上に堆積すると同時に溶融し直径
100mm、長さ 1,000mmの透明ガラス体を5本製造した。
次いで同ガラス体の長手方向にわたり、偏光板と光源を
組み合せた歪み検査計SVP−10P[東芝(株)製]に
より脈理を調べたところ表3の結果を得た。In this manner, SiCl 4 vapor is supplied to the burner, and silica glass fine particles are generated by flame hydrolysis.
Five transparent glass bodies having a length of 100 mm and a length of 1,000 mm were produced.
Next, striae was examined along the longitudinal direction of the glass body with a strain tester SVP-10P [manufactured by Toshiba Corporation] in which a polarizing plate and a light source were combined, and the results shown in Table 3 were obtained.
【0023】[0023]
【表3】 表3の結果より、各ロットで強い脈理は認められず、弱
い脈理も少ないことが分った。[Table 3] From the results in Table 3, it was found that strong stria was not observed in each lot, and that there was little weak stria.
【0024】比較例2 温度35℃に保持された液体原料 SiCl4の容器内液中にキ
ャリアーガスのO2 ガス流量20SLM をバブリングするこ
とにより SiCl4蒸気流量14SLM を同伴させバーナーに送
気する。容器内の気相圧力0.10KG(1.133kg/cm2 )に
おいて、容器内温度35℃では気相内における SiCl4蒸気
流量とキャリアーガスのO2 ガス流量の体積比率は0.71
に設定した。この間大気センサと流量補正制御器によ
り、O2 ガスのマスフローコントローラー流量の制御流
量が20.0〜20.6SLM の範囲で変化したが、バーナーに供
給された SiCl4蒸気の流量は14SLM と一定に保たれた。COMPARATIVE EXAMPLE 2 A carrier gas O 2 gas flow rate of 20 SLM is bubbled into a liquid inside a container of liquid raw material SiCl 4 maintained at a temperature of 35 ° C., and a vapor flow rate of 14 SLM of SiCl 4 is entrained and sent to a burner. At a gas phase pressure of 0.10 KG (1.133 kg / cm 2 ) in the vessel, at a vessel temperature of 35 ° C., the volume ratio of the SiCl 4 vapor flow rate to the carrier gas O 2 gas flow rate in the gas phase is 0.71.
Set to. During this time, the control flow rate of the O 2 gas mass flow controller flow rate changed in the range of 20.0 to 20.6 SLM by the atmospheric sensor and the flow rate correction controller, but the flow rate of SiCl 4 vapor supplied to the burner was kept constant at 14 SLM. .
【0025】この様にして SiCl4蒸気を実施例2と同様
にバーナーに供給し、火炎加水分解によりシリカガラス
微粒子を生成させ、これを耐熱性担体上に堆積すると同
時に溶融し直径 100mm、長さ 1,000mmの透明ガラス体を
5本製造した。次いで同ガラス体の長手方向にわたり、
偏光板と光源を組み合せた歪み検査計SVP−10P[東
芝(株)製]により脈理を調べたところ表4の結果を得
た。In this manner, SiCl 4 vapor is supplied to the burner in the same manner as in Example 2, and silica glass fine particles are generated by flame hydrolysis. Five 1,000 mm transparent glass bodies were manufactured. Next, over the longitudinal direction of the glass body,
Striae was examined using a strain tester SVP-10P (manufactured by Toshiba Corporation) in which a polarizing plate and a light source were combined. The results shown in Table 4 were obtained.
【0026】[0026]
【表4】 表4の結果より各ロットに強い脈理が認められ、弱い脈
理も多く認められた。[Table 4] From the results in Table 4, strong stria was observed in each lot, and many weak stria were also observed.
【0027】[0027]
【発明の効果】本発明によれば、ガラス原料蒸気および
キャリアーガスが、大気圧の変動の影響を受けることな
く一定流量でバーナーに供給されるので、長手方向に均
質な光ファイバ母材や、脈理の無い光学特性の均質なシ
リカガラスとして有用なシリカガラス系堆積体を得るこ
とができる。According to the present invention, the glass raw material vapor and the carrier gas are supplied to the burner at a constant flow rate without being affected by the fluctuation of the atmospheric pressure. It is possible to obtain a silica glass-based deposit useful as a homogeneous silica glass having a stria-free optical property.
【図1】本発明における原料蒸気供給装置の縦断面図。FIG. 1 is a longitudinal sectional view of a raw material vapor supply device according to the present invention.
【図2】従来法における原料蒸気供給装置の縦断面図。FIG. 2 is a longitudinal sectional view of a raw material vapor supply device in a conventional method.
1…第1キャリアーガス流量制御器 2…液体原料容器(容器) 3…液体原料 5…大気圧センサ 6…補正演算器 7…第2キャリアーガス流量制御器 8…キャリアーガス吹込み管 9…原料蒸気送付管 11…液体原料液補給管 12…気泡 DESCRIPTION OF SYMBOLS 1 ... 1st carrier gas flow controller 2 ... Liquid raw material container (container) 3 ... Liquid raw material 5 ... Atmospheric pressure sensor 6 ... Correction arithmetic unit 7 ... 2nd carrier gas flow controller 8 ... Carrier gas injection pipe 9 ... Raw material Vapor sending pipe 11 ... Liquid raw material liquid supply pipe 12 ... Bubble
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭63−129033(JP,A) 特開 昭57−47738(JP,A) 特開 昭61−254242(JP,A) 特開 昭63−288922(JP,A) 実開 平1−170439(JP,U) (58)調査した分野(Int.Cl.7,DB名) C03B 8/04 C03B 37/018 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-63-129033 (JP, A) JP-A-57-47738 (JP, A) JP-A-61-254242 (JP, A) JP-A-63-164 288922 (JP, A) Hikaru 1-170439 (JP, U) (58) Fields studied (Int. Cl. 7 , DB name) C03B 8/04 C03B 37/018
Claims (3)
ぞれ原料容器に充填し、これにキャリアガスをバブリン
グしてそれぞれを別個に気化しキャリアガスとの混合気
体を得、この混合気体をバーナーに供給し、同バーナー
において酸水素火炎中にて火炎加水分解することにより
それぞれの微粒子を発生させ、これら微粒子を回転する
種棒上に付着、堆積させることによるシリカガラス系堆
積体の製造方法において、検知された大気圧の変動値か
ら濃度変動を推定する演算手段および濃度変動推定値か
らキャリアーガス流量を補正する制御手段を備えること
により液体原料の蒸気供給流量を一定に制御する際、前
記混合気体がバーナーに供給される直前に、前記混合気
体に前記キャリアガスと同一成分のガスを大気圧の変動
に応じた流量を加えて混合気体中のキャリアガス成分の
流量を一定に保つことを特徴とするシリカガラス系堆積
体の製造方法。1. A raw material container is filled with a liquid raw material such as a liquid silicon compound, and a carrier gas is bubbled into the raw material container to separately vaporize each of them, thereby obtaining a mixed gas with the carrier gas, and supplying the mixed gas to the burner. Then, in the same burner, each particle is generated by flame hydrolysis in an oxyhydrogen flame, and these particles are attached and deposited on a rotating seed rod. When controlling the vapor supply flow rate of the liquid raw material to be constant by providing arithmetic means for estimating the concentration fluctuation from the fluctuation value of the atmospheric pressure and control means for correcting the carrier gas flow rate from the concentration fluctuation estimation value, the mixed gas is Immediately before being supplied to the burner, a gas having the same composition as that of the carrier gas is added to the mixed gas at a flow rate corresponding to the change in atmospheric pressure. And maintaining the flow rate of the carrier gas component in the mixed gas at a constant level.
て堆積されたシリカガラス系堆積体である請求項1に記
載のシリカガラス系堆積体の製造方法。2. The method for producing a silica glass-based deposit according to claim 1, wherein the fine particles are a silica glass-based deposit deposited as a porous material on the seed rod.
時に、加熱ガラス化されたシリカガラス系堆積体である
請求項1に記載のシリカガラス系堆積体の製造方法。3. The method for producing a silica glass-based deposit according to claim 1, wherein the fine particles are a silica glass-based deposit which is heated and vitrified while being deposited on the seed rod.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP05739895A JP3157693B2 (en) | 1995-03-16 | 1995-03-16 | Method for producing silica glass-based deposit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP05739895A JP3157693B2 (en) | 1995-03-16 | 1995-03-16 | Method for producing silica glass-based deposit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08259239A JPH08259239A (en) | 1996-10-08 |
| JP3157693B2 true JP3157693B2 (en) | 2001-04-16 |
Family
ID=13054537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP05739895A Expired - Fee Related JP3157693B2 (en) | 1995-03-16 | 1995-03-16 | Method for producing silica glass-based deposit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3157693B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6161398A (en) * | 1998-04-09 | 2000-12-19 | Lucent Technologies, Inc. | Methods of and systems for vapor delivery control in optical preform manufacture |
| KR100632879B1 (en) * | 1999-06-03 | 2006-10-16 | 신에쓰 가가꾸 고교 가부시끼가이샤 | An apparatus for manufacturing glass base material and a method for manufacturing glass base material |
-
1995
- 1995-03-16 JP JP05739895A patent/JP3157693B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH08259239A (en) | 1996-10-08 |
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