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JP3173402B2 - Liquid phase growth equipment for semiconductor substrates - Google Patents
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JP3173402B2 - Liquid phase growth equipment for semiconductor substrates - Google Patents

Liquid phase growth equipment for semiconductor substrates

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Publication number
JP3173402B2
JP3173402B2 JP34722296A JP34722296A JP3173402B2 JP 3173402 B2 JP3173402 B2 JP 3173402B2 JP 34722296 A JP34722296 A JP 34722296A JP 34722296 A JP34722296 A JP 34722296A JP 3173402 B2 JP3173402 B2 JP 3173402B2
Authority
JP
Japan
Prior art keywords
semiconductor substrate
solvent
liquid phase
phase growth
solution pot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP34722296A
Other languages
Japanese (ja)
Other versions
JPH10189462A (en
Inventor
英行 渡辺
幸夫 白井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Stanley Electric Co Ltd
Original Assignee
Stanley Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stanley Electric Co Ltd filed Critical Stanley Electric Co Ltd
Priority to JP34722296A priority Critical patent/JP3173402B2/en
Publication of JPH10189462A publication Critical patent/JPH10189462A/en
Application granted granted Critical
Publication of JP3173402B2 publication Critical patent/JP3173402B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体の製造装置に
関するものであり、詳細には、例えば温度勾配法などを
用い液中にてエピタキシャル成長を行わせるときに用い
られる液相成長装置に係るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus, and more particularly, to a liquid phase growth apparatus used for performing epitaxial growth in a liquid using a temperature gradient method or the like. is there.

【0002】[0002]

【従来の技術】従来の液相成長装置90の構成の例を示
すものが図3であり、この液相成長装置90は基本的に
は、溶媒を収納する溶液つぼ部91aが設けられる本体
部91と、この本体部91の底面側に摺動可能に設けら
れ半導体基板を収納する収納凹部92aが設けられた底
部92と、本体部91の溶液つぼ部91aの上面を閉止
する蓋部93とから構成されている。
2. Description of the Related Art FIG. 3 shows an example of the structure of a conventional liquid phase growth apparatus 90. This liquid phase growth apparatus 90 basically has a main body provided with a solution pot 91a for accommodating a solvent. 91, a bottom portion 92 provided on the bottom surface side of the main body portion 91 slidably provided with a housing concave portion 92 a for housing the semiconductor substrate, and a lid portion 93 for closing the upper surface of the solution pot 91 a of the main body portion 91. It is composed of

【0003】前記液相成長装置90を用いて液相成長を
行うときの状態を示すものが図4であり、本体部91の
底面側は、収納凹部92aに半導体基板11を収納した
底部92で閉止しておき、前記本体部91の溶液つぼ部
91aには溶質材12aが飽和状態で溶解された溶媒1
2が注入され、蓋部93で施蓋されている。
FIG. 4 shows a state in which liquid phase growth is performed using the liquid phase growth apparatus 90. The bottom side of a main body 91 is a bottom portion 92 in which a semiconductor substrate 11 is stored in a storage recess 92a. The solvent 1 in which the solute material 12 a is dissolved in a saturated state is closed in the solution pot 91 a of the main body 91.
2 is injected and covered with a lid 93.

【0004】この状態で、前記底部92を冷却台94に
接触させ、更に蓋部93の上方からヒータ95で加熱を
行うと、前記溶液つぼ部91a内の溶媒12には上方が
高温となり下方が低温となる垂直方向への温度勾配を生
じるものとなり、下方においては溶質材12aが過飽和
の状態となる。この状態を所定時間保持すると、半導体
基板11上には所定の組成の結晶がエピタキシャル成長
するものとなる。
In this state, when the bottom portion 92 is brought into contact with the cooling table 94 and the heater 95 is further heated from above the lid portion 93, the temperature of the solvent 12 in the solution pot 91a becomes high and the bottom becomes high. This causes a temperature gradient in the vertical direction at a low temperature, and the solute material 12a is supersaturated below. When this state is maintained for a predetermined time, a crystal having a predetermined composition grows epitaxially on the semiconductor substrate 11.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、前記し
た従来の構成の液相成長装置90においては、ヒータ9
5からの加熱は、その殆どが溶液つぼ部91aの側壁9
1bを介して溶媒12に伝導されるものとなり、これに
より、前記半導体基板11の直上の位置の溶媒12の温
度分布を水平方向に測定すると、半導体基板11も周縁
部では液温が高く、中心に向かうに従って液温が低下す
る傾向を示すものとなる。
However, in the liquid phase growth apparatus 90 having the above-mentioned conventional configuration, the heater 9
5 from the side of the side wall 9 of the solution pot 91a.
When the temperature distribution of the solvent 12 immediately above the semiconductor substrate 11 is measured in the horizontal direction, the semiconductor substrate 11 also has a high liquid temperature at the peripheral portion, , The liquid temperature tends to decrease.

【0006】従って、液温が低い半導体基板11の中心
部では溶質材12aがより過飽和の状態となるので、結
晶成長が進み膜厚が厚くなり、周縁部では過飽和の状態
が少なく結晶成長が進まず膜厚が薄くなり、結果として
半導体基板11の全面における成長厚みが不均一となっ
て不良要因となり歩留まりが低下する問題点を生じ、こ
の点の解決が課題とされるものと成っている。
Accordingly, the solute material 12a becomes more supersaturated at the center of the semiconductor substrate 11 where the liquid temperature is low, so that the crystal growth proceeds and the film thickness becomes thicker, and the supersaturation is less at the periphery and the crystal growth proceeds. First, the film thickness is reduced, and as a result, the growth thickness over the entire surface of the semiconductor substrate 11 becomes nonuniform, which causes a problem of causing a defect and lowering the yield, and solving this point is an issue.

【0007】[0007]

【課題を解決するための手段】本発明は前記した従来の
課題を解決するための具体的な手段として、溶媒を収納
する溶液つぼ部が設けられる本体部と、該本体部の底面
側に摺動可能に設けられ半導体基板を収納する収納凹部
が設けられた底部と、前記本体部の溶液つぼ部の上面を
閉止する蓋部とから成る半導体基板の液相成長装置にお
いて、前記溶液つぼ部内には、前記溶媒の温度に耐え且
つ前記溶媒の熱伝導率より熱伝導率の大きい部材で形成
され、前記半導体基板の面積よりも大きな面積を有し、
略全面に複数の貫通孔がマトリクス状に形成された熱な
らし板が、前記溶液つぼ部の側壁とは5mm以上の間隙を
設け、前記溶媒の液面から5mm以上の深さとなり、且
つ、前記半導体基板からは3mm以上の間隔を設けて前記
半導体基板と平行となるように前記蓋部から懸架されて
いることを特徴とする半導体基板の液相成長装置を提供
することで課題を解決するものである。
According to the present invention, as a specific means for solving the above-mentioned conventional problems, there is provided a main body provided with a solution pot for accommodating a solvent, and a sliding member provided on the bottom side of the main body. In a liquid phase growth apparatus for a semiconductor substrate, comprising: a bottom portion movably provided with a storage concave portion for storing a semiconductor substrate; and a lid portion for closing an upper surface of the solution pot portion of the main body portion. Is formed of a member that withstands the temperature of the solvent and has a higher thermal conductivity than the thermal conductivity of the solvent, and has an area larger than the area of the semiconductor substrate;
A thermal equalizing plate in which a plurality of through-holes are formed in a matrix on substantially the entire surface is provided with a gap of 5 mm or more with the side wall of the solution pot, and has a depth of 5 mm or more from the liquid level of the solvent, and The problem is solved by providing a liquid phase growth apparatus for a semiconductor substrate, wherein the apparatus is suspended from the lid so as to be parallel to the semiconductor substrate at a distance of 3 mm or more from the semiconductor substrate. Things.

【0008】[0008]

【発明の実施の形態】つぎに、本発明を図に示す実施形
態に基づいて詳細に説明する。図1に符号1で示すもの
は本発明に係る半導体基板の液相成長装置であり、この
液相成長装置1は大別して、溶媒12を収納する溶液つ
ぼ部3が設けられる本体部2と、この本体部2の底面側
に摺動可能に設けられ半導体基板を収納する収納凹部4
aが設けられた底部4と、本体部2の溶液つぼ部3の上
面を閉止する蓋部5とから構成されるものである点は従
来例のものと同様である。
Next, the present invention will be described in detail based on an embodiment shown in the drawings. 1 is a liquid phase growth apparatus for a semiconductor substrate according to the present invention, and the liquid phase growth apparatus 1 is roughly divided into a main body 2 provided with a solution pot 3 for accommodating a solvent 12; A housing recess 4 slidably provided on the bottom side of the main body 2 for housing a semiconductor substrate.
This is similar to the conventional example in that it comprises a bottom part 4 provided with a and a lid part 5 for closing the upper surface of the solution pot part 3 of the main body part 2.

【0009】また、液相成長を行うときには、本体部2
の底面を収納凹部4aに半導体基板11を収納した底部
4で塞いでおき、本体部2の溶液つぼ部3に溶質材12
aが飽和状態で溶解された溶媒12が注入され、蓋部5
で施蓋した後に、底部4を冷却台(図示は省略する)に
接触させ、更に、蓋部5の上方からヒータ(図示は省略
する)で加熱を行うものであることも従来例のものと同
様である。
When performing liquid phase growth, the main body 2
Of the semiconductor substrate 11 is housed in the housing recess 4a, and the solute material 12 is placed in the solution pot 3 of the main body 2.
a is dissolved in a saturated state,
After that, the bottom 4 is brought into contact with a cooling stand (not shown), and heating is performed from above the lid 5 by a heater (not shown). The same is true.

【0010】ここで、本発明では前記溶媒12中に浸漬
される熱ならし板6を設けるものであり、この熱ならし
板6は前記溶媒12が加熱される温度、例えば800℃
に充分に耐える部材、例えばグラファイトカーボンなど
の板状部材を用いて形成されるものであり、このときに
熱ならし板6の熱伝導率は、溶媒12の熱伝導率よりも
大きいものが選択される。
Here, in the present invention, a thermal leveling plate 6 immersed in the solvent 12 is provided, and the thermal leveling plate 6 is heated to a temperature at which the solvent 12 is heated, for example, 800 ° C.
Is formed by using a plate-shaped member such as graphite carbon, which is sufficiently resistant to heat. At this time, the thermal conductivity of the thermal leveling plate 6 is selected to be higher than the thermal conductivity of the solvent 12. Is done.

【0011】図2は前記熱ならし板6の構成を示すもの
であり、若しも、結晶成長を行うべき半導体基板11が
円形であるならば、前記熱ならし板6も同様に円形と言
うように半導体基板11の平面形状に対応する形状とし
て形成され、その外径φ1は半導体基板11の外径φ2
よりも適宜に大きく形成されている。
FIG. 2 shows the structure of the thermal equalizing plate 6. If the semiconductor substrate 11 on which crystal growth is to be performed has a circular shape, the thermal equalizing plate 6 also has a circular shape. As described above, it is formed as a shape corresponding to the planar shape of the semiconductor substrate 11, and its outer diameter φ1 is equal to the outer diameter φ2 of the semiconductor substrate 11.
It is formed larger than appropriate.

【0012】また、前記熱ならし板6には、複数の貫通
孔6aが例えばマトリクス状としてほヾ全面に渡り穿設
され、溶媒12中における溶質材12aの拡散を妨げな
いものとされている。そして、この熱ならし板6は支柱
7により蓋部5に取付けられ、液相成長を行うときに蓋
部5で溶液つぼ部3に施蓋することで、溶媒12中の所
定位置に懸架されるものと成っている。
A plurality of through-holes 6a are formed in the thermal equalizing plate 6, for example, in a matrix form over almost the entire surface so as not to prevent the diffusion of the solute material 12a in the solvent 12. . The thermal leveling plate 6 is attached to the lid 5 by a support column 7 and is suspended at a predetermined position in the solvent 12 by covering the solution pot 3 with the lid 5 during liquid phase growth. It is made of things.

【0013】ここで、本発明を成すための発明者の実験
の結果に基づいて、前記熱ならし板6の溶媒12中にお
ける好ましい位置について説明を行えば、先ず、熱なら
し板6の外径は溶液つぼ部3の側壁3aから5mm以上の
間隙Aを設け、加えて、前記熱ならし板6は溶媒12中
に5mm以上の深さBに浸漬することが望ましい。
Here, based on the results of experiments conducted by the inventor for carrying out the present invention, a preferred position of the heat equalizing plate 6 in the solvent 12 will be described. It is desirable to provide a gap A having a diameter of 5 mm or more from the side wall 3a of the solution pot 3 and to immerse the heat equalizing plate 6 in the solvent 12 to a depth B of 5 mm or more.

【0014】ここで、側壁3aからの間隙Aと、溶媒1
2中に浸漬される深さBが上記の寸法よりも少ない場合
には、ヒータによる加熱で生じる溶媒12の対流が妨げ
られ、例えば側壁3aの近傍に溶質材12aが滞留し、
この部分、即ち、半導体基板11の周縁部分の結晶成長
がより厚くなり、面全体としての均一性が失われるもの
となる。
Here, the gap A from the side wall 3a and the solvent 1
If the depth B immersed in 2 is smaller than the above dimension, convection of the solvent 12 generated by heating by the heater is prevented, and the solute material 12a stays near the side wall 3a, for example.
This portion, that is, the crystal growth in the peripheral portion of the semiconductor substrate 11 becomes thicker, and the uniformity of the entire surface is lost.

【0015】更に、本発明においては、半導体基板11
と熱ならし板6との間の間隔Cも規定するものであり、
この間隔Cは3mm以上とすることが好ましい。これは、
上記した発明者による実験の結果によれば、半導体基板
11と熱ならし板6との間の間隔Cが、例えば2mmなど
あまりに近くにすぎると、結晶成長が行われた後の半導
体基板11の表面には貫通孔6aが形成するマトリクス
状のパターンを生じ、上記と同様に面全体としての均一
性が失われるからである。
Further, in the present invention, the semiconductor substrate 11
And the distance C between the heat equalizing plate 6 and
This interval C is preferably 3 mm or more. this is,
According to the results of the experiment by the inventor described above, if the distance C between the semiconductor substrate 11 and the thermal leveling plate 6 is too close, for example, 2 mm, the semiconductor substrate 11 after crystal growth is performed. This is because a matrix-like pattern formed by the through holes 6a is formed on the surface, and the uniformity of the entire surface is lost in the same manner as described above.

【0016】尚、上記の条件を満たした上で、半導体基
板11と熱ならし板6とは平行となるように取付けられ
る。また、前記液相成長装置1が、本体部2に複数の溶
液つぼ部3が設けられ、この本体部2或いは底部4の何
れか一方をスライドし、連続的に成長を行わせる構成の
ものであれば、前記熱ならし板6はそれぞれの溶液つぼ
部3毎に、上記した条件で設けられるものとされてい
る。
After satisfying the above conditions, the semiconductor substrate 11 and the heat equalizing plate 6 are mounted so as to be parallel to each other. Further, the liquid phase growth apparatus 1 has a structure in which a plurality of solution pots 3 are provided in a main body 2 and either one of the main body 2 or the bottom 4 is slid to continuously grow. If so, the heat equalizing plate 6 is provided for each solution pot 3 under the above-described conditions.

【0017】次いで、上記の構成とした本発明の液相成
長装置1の作用および効果について説明する。本発明に
より溶媒12中の所定位置に、前記溶媒12よりも熱伝
導率が高い熱ならし板6が半導体基板11が平行に浸漬
されていることで、例えば溶液つぼ部3の側壁3aから
の直接の加熱で溶媒12に水平方向の温度差を生じる状
態が生じても、その温度差は熱ならし板6の熱伝導率に
より均一化される。
Next, the operation and effects of the liquid phase growth apparatus 1 of the present invention having the above-described configuration will be described. According to the present invention, the thermal leveling plate 6 having a higher thermal conductivity than the solvent 12 is immersed in parallel with the semiconductor substrate 11 at a predetermined position in the solvent 12, so that, for example, Even if a state where a horizontal temperature difference occurs in the solvent 12 due to the direct heating occurs, the temperature difference is made uniform by the thermal conductivity of the thermal leveling plate 6.

【0018】従って、前記熱ならし板6と平行に設置さ
れている半導体基板11に接触している溶媒12は、こ
の半導体基板11の全面に渡り均一な温度となり、溶質
材12aに対する過飽和の状態が同一となるので、半導
体基板11の全面に渡り均一な厚さの結晶成長が行われ
るものとなる。
Accordingly, the temperature of the solvent 12 in contact with the semiconductor substrate 11 placed in parallel with the thermal leveling plate 6 becomes uniform over the entire surface of the semiconductor substrate 11, and the solvent 12 is supersaturated with respect to the solute material 12a. Are the same, so that crystal growth of a uniform thickness is performed over the entire surface of the semiconductor substrate 11.

【0019】以上の効果を具体的な数値として示せば、
結晶成長が均一に行われるものと成ったことで、半導体
基板11の歩留りは、従来が略80%未満であったもの
が、95%以上となり、生産性が略20%向上するもの
となった。更に加えて、結晶成長の厚みが均一化したこ
とで、波長特性も均一化し、例えばLEDなどを生産し
た場合、特性の揃ったものの生産が可能となり品質も向
上するものとなる。
If the above effects are shown as specific numerical values,
Since the crystal growth is performed uniformly, the yield of the semiconductor substrate 11 is reduced from approximately less than 80% in the past to 95% or more, and the productivity is improved by approximately 20%. . In addition, since the thickness of the crystal growth is made uniform, the wavelength characteristics are also made uniform. For example, when an LED or the like is produced, it is possible to produce a product having uniform characteristics and improve the quality.

【0020】[0020]

【発明の効果】以上に説明したように本発明により、溶
液つぼ部内には、前記溶媒の温度に耐え且つ前記溶媒の
熱伝導率より熱伝導率の大きい部材で形成され、前記半
導体基板の面積よりも大きな面積を有し、略全面に複数
の貫通孔がマトリクス状に形成された熱ならし板が、前
記溶液つぼ部の側壁とは5mm以上の間隙を設け、前記溶
媒の液面から5mm以上の深さとなり、且つ、前記半導体
基板からは3mm以上の間隔を設けて前記半導体基板と平
行となるように前記蓋部から懸架されている半導体基板
の液相成長装置としたことで、熱ならし板の高い熱伝導
率により半導体基板の表面近傍に存在する溶媒の温度を
均一化し、これにより、結晶成長の厚みを均一化して歩
留りを向上させ、更には特性の均一化も可能とし、生産
性の向上と品質の向上とに極めて優れた効果を奏するも
のである。
As described above, according to the present invention, the solution pot is formed of a member that withstands the temperature of the solvent and has a higher thermal conductivity than the thermal conductivity of the solvent. A heat equalizing plate having a larger area and a plurality of through-holes formed in a matrix on substantially the entire surface is provided with a gap of 5 mm or more with the side wall of the solution pot, and 5 mm from the liquid level of the solvent. A liquid phase growth apparatus for a semiconductor substrate suspended from the lid so as to have a depth of not less than 3 mm and to be parallel to the semiconductor substrate at an interval of 3 mm or more from the semiconductor substrate, Due to the high thermal conductivity of the leveling plate, the temperature of the solvent existing near the surface of the semiconductor substrate is made uniform, thereby making the thickness of the crystal growth uniform, improving the yield, and further enabling the uniformity of the characteristics. Improve productivity and improve quality In which it exhibits an extremely excellent effect and.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明に係る半導体基板の液相成長装置の実
施形態を示す断面図である。
FIG. 1 is a sectional view showing an embodiment of a semiconductor substrate liquid phase growth apparatus according to the present invention.

【図2】 同じ実施形態の要部を示す斜視図である。FIG. 2 is a perspective view showing a main part of the same embodiment.

【図3】 従来例を示す斜視図である。FIG. 3 is a perspective view showing a conventional example.

【図4】 図3のA―A線に沿う断面図である。FIG. 4 is a sectional view taken along the line AA in FIG. 3;

【符号の説明】[Explanation of symbols]

1……液相成長装置 2……本体部 3……溶液つぼ部 3a……側壁 4……底部 4a……基板収納凹部 5……蓋部 6……熱ならし板 6a……貫通孔 7……支柱 11……半導体基板 12……溶媒 12a……溶質材 A……熱ならし板と側壁との間隙 B……熱ならし板の溶媒中の深さ C……熱ならし板と半導体基板との間隔 DESCRIPTION OF SYMBOLS 1 ... Liquid phase growth apparatus 2 ... Body part 3 ... Solution pot 3a ... Side wall 4 ... Bottom part 4a ... Substrate storage recessed part 5 ... Cover part 6 ... Heat leveling plate 6a ... Through-hole 7 ... Supports 11... Semiconductor substrate 12... Solvents 12 a... Solute material A... Gap between heat equalizing plate and side wall B. Distance from semiconductor substrate

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平2−28920(JP,A) 特開 平7−215793(JP,A) 特開 平2−208284(JP,A) 特開 平2−212390(JP,A) 特開 昭58−172291(JP,A) 特開 昭50−84173(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/208,21/368 C30B 19/00 - 19/12 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-2-28920 (JP, A) JP-A-7-215793 (JP, A) JP-A-2-208284 (JP, A) JP-A-2- 212390 (JP, A) JP-A-58-172291 (JP, A) JP-A-50-84173 (JP, A) (58) Fields studied (Int. Cl. 7 , DB name) H01L 21 / 208,21 / 368 C30B 19/00-19/12

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 溶媒を収納する溶液つぼ部が設けられる
本体部と、該本体部の底面側に摺動可能に設けられ半導
体基板を収納する収納凹部が設けられた底部と、前記本
体部の溶液つぼ部の上面を閉止する蓋部とから成る半導
体基板の液相成長装置において、前記溶液つぼ部内に
は、前記溶媒の温度に耐え且つ前記溶媒の熱伝導率より
熱伝導率の大きい部材で形成され、前記半導体基板の面
積よりも大きな面積を有し、略全面に複数の貫通孔がマ
トリクス状に形成された熱ならし板が、前記溶液つぼ部
の側壁とは5mm以上の間隙を設け、前記溶媒の液面から
5mm以上の深さとなり、且つ、前記半導体基板からは3
mm以上の間隔を設けて前記半導体基板と平行となるよう
に前記蓋部から懸架されていることを特徴とする半導体
基板の液相成長装置。
1. A main body in which a solution pot for storing a solvent is provided, a bottom provided with a storage recess slidably provided on the bottom side of the main body for storing a semiconductor substrate, A liquid phase growth apparatus for a semiconductor substrate, comprising: a lid for closing the upper surface of the solution pot; and a member having a heat conductivity higher than that of the solvent and which withstands the temperature of the solvent in the solution pot. A heat equalizing plate having an area larger than the area of the semiconductor substrate and having a plurality of through-holes formed in a matrix on substantially the entire surface is provided with a gap of 5 mm or more from the side wall of the solution pot. And a depth of 5 mm or more from the liquid level of the solvent and 3 mm from the semiconductor substrate.
An apparatus for growing a liquid phase on a semiconductor substrate, wherein the apparatus is suspended from the lid so as to be parallel to the semiconductor substrate at an interval of at least mm.
JP34722296A 1996-12-26 1996-12-26 Liquid phase growth equipment for semiconductor substrates Expired - Fee Related JP3173402B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34722296A JP3173402B2 (en) 1996-12-26 1996-12-26 Liquid phase growth equipment for semiconductor substrates

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34722296A JP3173402B2 (en) 1996-12-26 1996-12-26 Liquid phase growth equipment for semiconductor substrates

Publications (2)

Publication Number Publication Date
JPH10189462A JPH10189462A (en) 1998-07-21
JP3173402B2 true JP3173402B2 (en) 2001-06-04

Family

ID=18388757

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34722296A Expired - Fee Related JP3173402B2 (en) 1996-12-26 1996-12-26 Liquid phase growth equipment for semiconductor substrates

Country Status (1)

Country Link
JP (1) JP3173402B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6260258B1 (en) 1996-06-03 2001-07-17 Matsushita Electric Industrial Co., Ltd. Method for manufacturing varistor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6260258B1 (en) 1996-06-03 2001-07-17 Matsushita Electric Industrial Co., Ltd. Method for manufacturing varistor

Also Published As

Publication number Publication date
JPH10189462A (en) 1998-07-21

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