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JP3196540B2 - Semiconductor device - Google Patents
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JP3196540B2 - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JP3196540B2
JP3196540B2 JP30577394A JP30577394A JP3196540B2 JP 3196540 B2 JP3196540 B2 JP 3196540B2 JP 30577394 A JP30577394 A JP 30577394A JP 30577394 A JP30577394 A JP 30577394A JP 3196540 B2 JP3196540 B2 JP 3196540B2
Authority
JP
Japan
Prior art keywords
base plate
case frame
adhesive
frame
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP30577394A
Other languages
Japanese (ja)
Other versions
JPH08162572A (en
Inventor
伸 征矢野
進 鳥羽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP30577394A priority Critical patent/JP3196540B2/en
Publication of JPH08162572A publication Critical patent/JPH08162572A/en
Application granted granted Critical
Publication of JP3196540B2 publication Critical patent/JP3196540B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/14Mounting supporting structure in casing or on frame or rack
    • H05K7/1417Mounting supporting structure in casing or on frame or rack having securing means for mounting boards, plates or wiring boards
    • H05K7/142Spacers not being card guides

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、半導体素子が実装され
た回路基板をケース枠内に収納したパワーモジュールと
称される半導体装置に関し、特に、ケース枠と放熱ベー
ス板との取付け構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device called a power module in which a circuit board on which a semiconductor element is mounted is housed in a case frame, and more particularly to a structure for mounting a case frame and a heat radiation base plate.

【0002】[0002]

【従来の技術】従来、パワーモジュール又はインテリジ
ェントパワーモジュールと称される半導体装置(半導体
モジュール)は、図2,図3に示す如く、リードフレー
ム付きの絶縁樹脂製ケース枠10と、このケース枠10
の額縁部12の一方面側の開口段差面14に接着剤を以
て固着して開口を閉蓋する放熱ベース板(金属板)20
と、この放熱ベース板20の内面に半田等で固着された
回路基板(セラミックス基板)30,31と、この回路
基板30上の厚膜配線にインナーリード先端Aが接続し
たリードフレーム40〜45と、ケース枠10の額縁部
12に取付け固定され、回路基板31上の厚膜配線にイ
ンナーリード先端Bが接続した多数のリードピンP1〜
P16を有するリードピンブロック70と、ケース枠1
0の内部空間に充填され、回路基板30,31,リード
フレーム40〜45のインナーリード及びリードピンP
1〜P16のインナーリードを浸漬するゲル状樹脂(シ
リコーン樹脂)封止材50と、ケース枠10の他面側の
開口段差面18に接着剤を以て固着して開口を閉蓋する
絶縁樹脂製の蓋板60とを有している。回路基板30,
31にはパワートランジスタ,IGBT(伝導度変調形
トランジスタ),ダイオード,サイリスタ等の半導体素
子(チップ)32,34が実装されている。リードフレ
ーム40〜45のインナーリード先端Aは回路基板30
の厚膜配線(ランド部)に半田等で固着されており、そ
の配線と対応の半導体素子32,34にボンディングワ
イア32a,34aで接続されている。リードフレーム
40〜45は額縁部12にインサート成形で埋め込まれ
ており、額縁部12の端子座板40a〜45aに外部接
続の端子ねじ(図示せず)が螺着するようになってい
る。
2. Description of the Related Art Conventionally, as shown in FIGS. 2 and 3, a semiconductor device (semiconductor module) called a power module or an intelligent power module includes a case frame 10 made of an insulating resin with a lead frame and a case frame 10 made of an insulating resin.
The heat radiation base plate (metal plate) 20 which is fixed to the opening step surface 14 on one side of the frame portion 12 with an adhesive to close the opening.
Circuit boards (ceramic substrates) 30 and 31 fixed to the inner surface of the heat dissipation base plate 20 by soldering or the like; and lead frames 40 to 45 in which the inner lead ends A are connected to thick film wiring on the circuit board 30. A large number of lead pins P1 to P1 are attached and fixed to the frame portion 12 of the case frame 10 and the inner lead ends B are connected to the thick film wiring on the circuit board 31.
Lead pin block 70 having P16 and case frame 1
0, and the inner leads and the lead pins P of the circuit boards 30, 31 and the lead frames 40 to 45 are filled.
A gel-like resin (silicone resin) sealing material 50 for immersing the inner leads 1 to P16 and an insulating resin made of an insulating resin for closing the opening by adhering to the opening step surface 18 on the other surface side of the case frame 10 with an adhesive. And a cover plate 60. Circuit board 30,
The semiconductor elements (chips) 32 and 34 such as power transistors, IGBTs (conductivity modulation type transistors), diodes, and thyristors are mounted on 31. The tips A of the inner leads of the lead frames 40 to 45 are
Is fixed to the thick film wiring (land portion) with solder or the like, and connected to the wiring and the corresponding semiconductor elements 32, 34 by bonding wires 32a, 34a. The lead frames 40 to 45 are embedded in the frame portion 12 by insert molding, and terminal screws (not shown) for external connection are screwed to the terminal seat plates 40 a to 45 a of the frame portion 12.

【0003】このような構造の半導体モジュールは絶縁
樹脂製のケース枠10の四隅の肉薄部である取付座部1
5に貫通した通し孔15aに通しボルト(図示せず)を
挿入して電子機器等に取付けるようになっている。その
通しボルトによる締め付けで通し孔15aの縁や取付座
部15にカケ,割れ等の損傷が生じないように、図4に
示す如く、通し孔15aは取付座部15に金属製の筒状
カラー15bを一体成形埋め込みで縁取られている。こ
のため、通しボルトの締め付け力によって通し孔15a
周辺の取付座部15を通しボルトのボルト頭とベース板
20で挟み付けても、金属製の筒状カラー15bが補強
しているので、取付座部15の割れ等が防止されてい
る。
A semiconductor module having such a structure has a mounting seat 1 which is a thin portion at four corners of a case frame 10 made of an insulating resin.
A bolt (not shown) is inserted into a through hole 15a penetrating through the hole 5 and attached to an electronic device or the like. As shown in FIG. 4, the mounting hole 15 is formed in a metal cylindrical collar so that the edge of the through hole 15a and the mounting seat 15 do not suffer damage such as chipping or cracking due to the fastening with the through bolt. 15b is bordered by integral molding and embedding. For this reason, the through hole 15a is formed by the tightening force of the through bolt.
Even when the peripheral mounting seat 15 is sandwiched between the bolt head of the through bolt and the base plate 20, the metal tubular collar 15b reinforces, so that the mounting seat 15 is prevented from cracking.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記の
半導体モジュールの絶縁樹脂製のケース枠10と放熱ベ
ース板20との取付け構造にあっては、次のような問題
点があった。
However, the above-described mounting structure of the case frame 10 made of insulating resin of the semiconductor module and the heat radiation base plate 20 has the following problems.

【0005】取付座部15の裏面も含めた絶縁樹脂製ケ
ース枠10の開口段差面14には接着剤15cを塗布し
て金属製のベース板20を貼り合わせて開口を閉塞する
ようにしているものの、自動塗布機で接着剤15cの分
量を最適化して塗布しても、ベース板20の貼り合わせ
力の如何によって接着剤層の層厚tにバラツキが生じ
る。貼り合わせ力が強すぎると、開口段差面14とベー
ス板20との間に挟まれている接着剤15cが過度には
み出すので、層厚tが薄くなり過ぎ、乾燥後に接着剤層
の剥離やゲル状樹脂封止材の漏れを起こすおそれがあ
る。貼り合わせ力が弱すぎると、膜中にボイド等が残留
したままであるため層厚tは厚いものの、半導体モジュ
ールの機器等への取付け時においては通しボルトの締め
付け力によって接着剤層が押し潰されて変形する。この
結果、ボルトの締め付け力が樹脂製の取付座部15の部
分に曲げモーメントとして作用し、取付座部15に割れ
等を生じさせることがあった。
An adhesive 15c is applied to the stepped surface 14 of the insulating resin case frame 10 including the back surface of the mounting seat 15, and a metal base plate 20 is attached to close the opening. However, even if the amount of the adhesive 15c is optimized and applied by an automatic application machine, the thickness t of the adhesive layer varies depending on the bonding force of the base plate 20. If the bonding force is too strong, the adhesive 15c sandwiched between the step surface 14 and the base plate 20 excessively protrudes, so that the layer thickness t becomes too thin, and the adhesive layer peels off or gels after drying. There is a possibility that the resin sealing material may leak. If the bonding force is too weak, the layer thickness t is large because voids and the like remain in the film, but the adhesive layer is crushed by the tightening force of the through bolt when the semiconductor module is mounted on equipment or the like. Be deformed. As a result, the fastening force of the bolt acts as a bending moment on the mounting seat 15 made of resin, and the mounting seat 15 may be cracked.

【0006】そこで上記問題点に鑑み、本発明の課題
は、半導体モジュールにおいてケース枠とベース板との
取付け構造を改善することにより、接着剤層の層厚のバ
ラツキを無くして最適化し、接着剤層の剥離,ゲル状樹
脂封止材の漏れや取付座部の割れ等を防止することにあ
る。
SUMMARY OF THE INVENTION In view of the above problems, an object of the present invention is to improve the mounting structure between a case frame and a base plate in a semiconductor module, thereby eliminating variations in the thickness of the adhesive layer and optimizing the adhesive. An object of the present invention is to prevent peeling of a layer, leakage of a gel resin sealing material, cracking of a mounting seat, and the like.

【0007】[0007]

【課題を解決するための手段】上記の課題を解決するた
めに、本発明の手段は、金属製の筒状カラー自体を接着
剤層の層厚を規定するスペーサとして利用するものであ
る。即ち、本発明は、額縁部からリードフレームが延出
する絶縁樹脂製のケース枠と、このケース枠の一方の開
口段差面に接着剤を以て固着して閉蓋する金属製の放熱
ベース板と、上記放熱ベース板の内面に固着され、上記
リードフレームのインナーリード先端に接続する半導体
素子が実装された回路基板と、上記ケース枠の内部空間
に充填され、上記回路基板及び上記インナーリードを浸
漬するゲル状樹脂封止材と、上記ケース枠の他方の開口
を閉蓋する絶縁樹脂製の蓋板と、上記ケース枠の四隅の
取付座部に一体成形で埋め込んだ通し孔用の金属製筒状
カラーとを有する半導体装置において、上記金属製筒状
カラーの端面が前記接着剤の塗布される前記開口段差面
のレベルから所定長さだけ突出し、該突出した金属製筒
状カラーの端面が上記放熱ベース板に当接することによ
って上記開口段差面と上記放熱ベース板との間に形成さ
れたギャップに上記接着剤が介在していることを特徴と
する。このギャップは0.1〜0.2mmであることが
望ましい。
In order to solve the above-mentioned problems, the means of the present invention is to use the metallic tubular collar itself as a spacer for defining the thickness of the adhesive layer. That is, the present invention provides a case frame made of an insulating resin in which a lead frame extends from a frame portion, a metal heat dissipation base plate fixedly closed with an adhesive on one of the step surfaces of the case frame with an adhesive, A circuit board fixed with an inner surface of the heat radiation base plate and mounted with a semiconductor element connected to a tip of an inner lead of the lead frame, and an inner space of the case frame is filled, and the circuit board and the inner lead are immersed therein. A gel-like resin sealing material, a cover plate made of an insulating resin for closing the other opening of the case frame, and a metal cylindrical shape for a through hole embedded in the mounting seat at the four corners of the case frame by integral molding. in a semiconductor device having a color, metallic cylinder end surface of the metallic, cylindrical collar has issued the projecting from the coated by the opening stepped surface level of the adhesive by a predetermined length, projecting
When the end face of the collar contacts the heat dissipation base plate,
Formed between the opening step surface and the heat dissipation base plate.
The adhesive is interposed in the formed gap . This gap is desirably 0.1 to 0.2 mm .

【0008】[0008]

【作用】本発明においても、ケース枠の開口段差面に接
着剤を塗布した後、金属製の放熱ベース板を貼り合わせ
てケース枠とベース板とを固着するが、金属製筒状カラ
ーが開口段差面のレベルから所定長さだけ突出し、この
突出した金属製筒状カラーの端面が放熱ベース板に当接
することによって開口段差面と放熱ベース板との間に形
成されたギャップに接着剤が介在しているているため、
このギャップに相当する層厚の接着剤層が確保されるこ
とになり、層厚が薄すぎたり厚すぎたりすることが無
く、接着剤層の剥離,ゲル状樹脂封止材の漏れや取付座
部の割れを防止できる。このような構造の半導体装置
も、絶縁樹脂製のケース枠の四隅の取付座部の金属製筒
状カラーに通しボルトを挿入して電子機器等に締め付け
固定するようになっているが、金属製のベース板がケー
ス枠の樹脂部分に直接当たらなくなるため、締め付け力
がケース枠の樹脂部に加わらず樹脂変形を防止でき、不
如意なケース枠の反りを無くすことができる。なお、
口段差面の周囲に接着剤の逃がし溜め溝が形成されてい
る場合には、貼り合わせ時にはみ出した余分な樹脂を逃
がし溜めすることができ、外観不良を無くすことができ
る。
According to the present invention, the adhesive is applied to the step surface of the opening of the case frame, and then the metal frame is bonded to the base plate by bonding a metal heat dissipation base plate. Protruding from the level of the step surface by a predetermined length , this
The end of the protruding metal cylindrical collar abuts the heat dissipation base plate
Between the step surface of the opening and the heat dissipation base plate.
Since the adhesive is interposed in the formed gap ,
An adhesive layer having a thickness corresponding to this gap is secured, and the thickness of the adhesive layer is not too thin or too thick. The crack of the part can be prevented. The semiconductor device having such a structure is also designed so that bolts are inserted through metal cylindrical collars at four corners of a mounting frame of an insulating resin case frame and tightened and fixed to an electronic device or the like. Since the base plate does not directly contact the resin portion of the case frame, the tightening force is not applied to the resin portion of the case frame, so that resin deformation can be prevented, and inadvertent warpage of the case frame can be eliminated. In the case where an escape reservoir groove for the adhesive is formed around the step surface of the opening, the excess resin that has protruded at the time of bonding can be escaped and accumulated, and appearance defects can be eliminated.

【0009】[0009]

【実施例】以下、図面に基づいて本発明の実施例を詳細
に説明する。
Embodiments of the present invention will be described below in detail with reference to the drawings.

【0010】図1(a)は本発明の実施例に係る半導体
装置におけるケース枠と放熱ベース板との取付け前の状
態を示す部分断面図、図1(b)は同半導体装置におけ
るケース枠と放熱ベース板との取付け後の状態を示す部
分断面図である。
FIG. 1A is a partial cross-sectional view showing a state before mounting a case frame and a heat radiation base plate in a semiconductor device according to an embodiment of the present invention, and FIG. FIG. 4 is a partial cross-sectional view showing a state after attachment to a heat dissipation base plate.

【0011】本例の半導体装置はパワーモジュール又は
インテリジェントパワーモジュールと称される半導体モ
ジュールで、図2に示す如くと同様の平面構造を有して
いる。そして従来例と同様に、本例の半導体モジュール
の断面構造も、図3と略同様に、リードフレーム付きの
絶縁樹脂製ケース枠10と、このケース枠10の額縁部
12の一方面側の開口段差面14に接着剤を以て固着し
て開口を閉蓋する放熱ベース板(金属板)20と、この
放熱ベース板20の内面に半田等で固着された回路基板
(セラミックス基板)30,31と、この回路基板30
上の厚膜配線にインナーリード先端Aが接続したリード
フレーム40〜45と、回路基板30,31,リードフ
レーム40〜45のインナーリードを浸漬するゲル状樹
脂(シリコーン樹脂)封止材50と、ケース枠10の他
面側の開口段差面18に接着剤を以て固着して開口を閉
蓋する絶縁樹脂製の蓋板60とを有している。
The semiconductor device of this embodiment is a semiconductor module called a power module or an intelligent power module, and has the same planar structure as shown in FIG. Similarly to the conventional example, the cross-sectional structure of the semiconductor module of this example is substantially the same as that of FIG. A radiating base plate (metal plate) 20 fixed to the step surface 14 with an adhesive to close the opening, and circuit boards (ceramic substrates) 30 and 31 fixed to the inner surface of the radiating base plate 20 with solder or the like. This circuit board 30
A lead frame 40 to 45 in which the inner lead tips A are connected to the upper thick film wiring, a gel-like resin (silicone resin) sealing material 50 for immersing the inner leads of the circuit boards 30, 31 and the lead frames 40 to 45; A cover plate 60 made of insulating resin is fixed to the stepped surface 18 on the other surface side of the case frame 10 with an adhesive to close the opening.

【0012】ケース枠10の四隅においては樹脂肉薄部
である取付座部15が形成されており、これには一体成
形(インサート成形)で通し孔15a用の金属製筒状カ
ラー80が埋め込まれている。この金属製筒状カラー8
0はその裏面側の端面が開口段差面14のレベルよりも
ギャップd(例えば0.1 〜0.2mm )だけ突出するように
埋め込まれている。そして、開口段差面14の周囲には
接着剤15cの逃がし溜め溝85が形成されている。
At four corners of the case frame 10, there are formed mounting seat portions 15 which are thin portions of resin, into which metal cylindrical collars 80 for the through holes 15a are embedded by integral molding (insert molding). I have. This metal cylindrical collar 8
0 is embedded so that the end face on the back surface side thereof protrudes beyond the level of the opening step surface 14 by a gap d (for example, 0.1 to 0.2 mm). A relief groove 85 for the adhesive 15c is formed around the step surface 14 of the opening.

【0013】ケース枠10の開口段差面14に接着剤1
5cを自動塗布機で所定量塗布した後、金属製の通し孔
20aを有する放熱ベース板20を貼り合わせてケース
枠10とベース板20とを固着する。この際、金属製筒
状カラー80の端面が開口段差面14のレベルからギャ
ップdだけ突出しているため、図1(b)に示す如く、
このギャップdに相当する層厚の接着剤層が確保される
ことになる。このため接着剤15cの層厚バラツキを無
くすことができる。接着剤層の剥離,ゲル状樹脂封止材
の漏れや取付座部の割れを防止できる。
The adhesive 1 is applied to the step surface 14 of the opening of the case frame 10.
After applying a predetermined amount of 5c with an automatic coating machine, a heat dissipation base plate 20 having a metal through-hole 20a is attached to fix the case frame 10 and the base plate 20 together. At this time, since the end surface of the metal cylindrical collar 80 protrudes from the level of the opening step surface 14 by the gap d, as shown in FIG.
An adhesive layer having a thickness corresponding to the gap d is secured. For this reason, the thickness variation of the adhesive 15c can be eliminated. It is possible to prevent peeling of the adhesive layer, leakage of the gel resin sealing material, and cracking of the mounting seat.

【0014】本例の半導体モジュールの機器取付けにお
いては、金属製筒状カラー80の通し孔15a及びベー
ス板20の通し孔20aに通しボルト(図示せず)を挿
入して締め付け固定するようになっているが、金属製筒
状カラー80の突出部分がベース板受け部としてのスト
ッパとなっているので、金属製のベース板20がケース
枠10の樹脂部分に直接当たらなくなるため、締め付け
力がケース枠10の樹脂部に加わらず樹脂変形を防止で
き、不如意なケース枠の反りを無くすことができる。
In mounting the semiconductor module of this embodiment, through-hole bolts (not shown) are inserted into the through-holes 15a of the metal cylindrical collar 80 and the through-holes 20a of the base plate 20, and tightened and fixed. However, since the protruding portion of the metal cylindrical collar 80 serves as a stopper as a base plate receiving portion, the metal base plate 20 does not directly contact the resin portion of the case frame 10, so that the tightening force is reduced. Resin deformation can be prevented irrespective of the resin portion of the frame 10, and unintentional warpage of the case frame can be eliminated.

【0015】更にまた、本例においては逃がし溜め溝8
5が巡らされているため、接着剤塗布の貼り合わせ時に
は、隙間からはみ出した余分な樹脂が逃がし溜め溝85
に溜まり、ベース板20の表面には露出しないので、外
観不良を無くすことができる。
Furthermore, in the present embodiment, the escape reservoir groove 8
5, the excess resin that has protruded from the gap is released when the adhesive is applied.
And is not exposed on the surface of the base plate 20, so that the appearance defect can be eliminated.

【0016】[0016]

【発明の効果】以上説明したように、本発明は、ケース
枠の四隅の取付座部における通し孔用の金属製筒状カラ
ーをその端面が接着剤の塗布される開口段差面のレベル
から所定長さだけ突出し、この突出した金属製筒状カラ
ーの端面が放熱ベース板に当接することによって開口段
差面と放熱ベース板との間に形成されたギャップに接着
剤が介在している点を特徴としている。従って次の効果
を奏する。
As described above, according to the present invention, the metal cylindrical collar for the through hole in the mounting seat at the four corners of the case frame is provided with a predetermined end face whose level is determined from the level of the stepped surface to which the adhesive is applied. Protrudes by the length of the metal cylinder
The end face of the
Adhesion to the gap formed between the difference surface and the heat dissipation base plate
It is characterized by the presence of an agent . Therefore, the following effects are obtained.

【0017】 このギャップに相当する層厚の接着剤
層が確保され、そのバラツキを無くすことができるの
で、接着剤層の剥離,ゲル状樹脂封止材の漏れや取付座
部の割れを防止できる。
Since the adhesive layer having a thickness corresponding to the gap is secured and its variation can be eliminated, peeling of the adhesive layer, leakage of the gel resin sealing material, and cracking of the mounting seat can be prevented. .

【0018】 金属製筒状カラーの突出部分がストッ
パとなり、金属製のベース板がケース枠の樹脂部分に直
接当たらなくなるため、締め付け力がケース枠の樹脂部
に加わらず樹脂変形を防止でき、不如意なケース枠の反
りを無くすことができる。
Since the protruding portion of the metal cylindrical collar serves as a stopper and the metal base plate does not directly contact the resin portion of the case frame, the tightening force is not applied to the resin portion of the case frame, thereby preventing the resin deformation and unexpectedly It is possible to eliminate the warp of the case frame.

【0019】[0019]

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)は本発明の実施例に係る半導体装置にお
けるケース枠と放熱ベース板との取付け前の状態を示す
部分断面図、(b)は同半導体装置におけるケース枠と
放熱ベース板との取付け後の状態を示す部分断面図であ
る。
FIG. 1A is a partial cross-sectional view showing a state before attachment of a case frame and a heat radiation base plate in a semiconductor device according to an embodiment of the present invention, and FIG. 1B is a case frame and heat radiation base plate in the semiconductor device. It is a fragmentary sectional view showing the state after attachment.

【図2】パワーモジュールと称される半導体装置の構造
を示す平面図である。
FIG. 2 is a plan view illustrating a structure of a semiconductor device called a power module.

【図3】図2のQ−Q′線に沿って切断した状態を示す
断面図である。
FIG. 3 is a cross-sectional view showing a state cut along a line QQ ′ in FIG. 2;

【図4】従来のパワーモジュールと称される半導体装置
におけるケース枠と放熱ベース板との取付け構造を示す
部分断面図である。
FIG. 4 is a partial cross-sectional view showing a mounting structure of a case frame and a heat radiation base plate in a conventional semiconductor device called a power module.

【符号の説明】[Explanation of symbols]

10…絶縁樹脂製ケース枠 12…額縁部 14,18…開口段差面 15…取付座部 15a,20a…通し孔 15c…接着剤 20…金属製放熱ベース板 30,31…回路基板 32,34…半導体素子(チップ) 32a,34a…ボンディングワイア 40〜45…リードフレーム 40a〜40a…端子座板 50…ゲル状樹脂封止材(シリコーン樹脂) 60…絶縁性蓋板 A,B…インナーリード先端 P1〜P16…リードピン 70…リードピンブロック 80…金属製筒状カラー 85…逃がし溜め溝。 DESCRIPTION OF SYMBOLS 10 ... Insulating resin case frame 12 ... Frame part 14, 18 ... Opening step surface 15 ... Mounting seat part 15a, 20a ... Through hole 15c ... Adhesive 20 ... Metal heat dissipation base plate 30, 31 ... Circuit boards 32, 34 ... Semiconductor elements (chips) 32a, 34a Bonding wires 40 to 45 Lead frames 40a to 40a Terminal seat plates 50 Gel-like resin sealing material (silicone resin) 60 Insulating lid plates A, B ... Inner lead tips P1 P16: Lead pin 70: Lead pin block 80: Metallic tubular collar 85: Relief storage groove

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平2−81461(JP,A) 特開 昭59−86249(JP,A) 特開 昭60−88446(JP,A) 特開 平6−177295(JP,A) 実開 平2−108377(JP,U) 実開 昭56−81546(JP,U) (58)調査した分野(Int.Cl.7,DB名) H01L 23/28 - 23/31 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-2-81461 (JP, A) JP-A-59-86249 (JP, A) JP-A-60-88446 (JP, A) 177295 (JP, A) JP-A 2-108377 (JP, U) JP-A 56-81546 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) H01L 23/28-23 / 31

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 額縁部からリードフレームが延出する絶
縁樹脂製のケース枠と、このケース枠の一方の開口段差
面に接着剤を以て固着して閉蓋する金属製の放熱ベース
板と、前記放熱ベース板の内面に固着され、前記リード
フレームのインナーリード先端に接続する半導体素子が
実装された回路基板と、前記ケース枠の内部空間に充填
され、前記回路基板及び前記インナーリードを浸漬する
ゲル状樹脂封止材と、前記ケース枠の他方の開口を閉蓋
する絶縁樹脂製の蓋板と、前記ケース枠の四隅の取付座
部に一体成形で埋め込んだ通し孔用の金属製筒状カラー
とを有する半導体装置において、前記金属製筒状カラー
の端面が前記接着剤の塗布される前記開口段差面のレベ
ルから所定長さだけ突出し、該突出した金属製筒状カラ
ーの端面が前記放熱ベース板に当接することによって前
記開口段差面と前記放熱ベース板との間に形成されたギ
ャップに前記接着剤が介在していることを特徴とする半
導体装置。
1. A case frame made of an insulating resin having a lead frame extending from a frame portion, a metal heat dissipation base plate fixed to one of the step surfaces of the case frame with an adhesive and closed. A circuit board on which a semiconductor element mounted on the inner surface of the heat radiation base plate and connected to the tip of the inner lead of the lead frame is mounted; and a gel filling the inner space of the case frame and immersing the circuit board and the inner lead. Resin sealing material, a cover plate made of an insulating resin for closing the other opening of the case frame, and a metal cylindrical collar for a through hole embedded in the mounting seats at the four corners of the case frame by integral molding. Wherein the end face of the metal cylindrical collar projects from the level of the stepped surface to which the adhesive is applied by a predetermined length, and the protruding metal cylindrical collar
The end face of the
A groove formed between the opening step surface and the heat dissipation base plate.
A semiconductor device , wherein the adhesive is interposed in a gap .
【請求項2】 請求項1に記載の半導体装置において、
前記ギャップが0.1〜0.2mmであることを特徴と
する半導体装置。
2. The semiconductor device according to claim 1, wherein
The semiconductor device , wherein the gap is 0.1 to 0.2 mm .
JP30577394A 1994-12-09 1994-12-09 Semiconductor device Expired - Lifetime JP3196540B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30577394A JP3196540B2 (en) 1994-12-09 1994-12-09 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30577394A JP3196540B2 (en) 1994-12-09 1994-12-09 Semiconductor device

Publications (2)

Publication Number Publication Date
JPH08162572A JPH08162572A (en) 1996-06-21
JP3196540B2 true JP3196540B2 (en) 2001-08-06

Family

ID=17949178

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30577394A Expired - Lifetime JP3196540B2 (en) 1994-12-09 1994-12-09 Semiconductor device

Country Status (1)

Country Link
JP (1) JP3196540B2 (en)

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