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JP3214069B2 - Liquid phase epitaxial growth equipment - Google Patents
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JP3214069B2 - Liquid phase epitaxial growth equipment - Google Patents

Liquid phase epitaxial growth equipment

Info

Publication number
JP3214069B2
JP3214069B2 JP17007692A JP17007692A JP3214069B2 JP 3214069 B2 JP3214069 B2 JP 3214069B2 JP 17007692 A JP17007692 A JP 17007692A JP 17007692 A JP17007692 A JP 17007692A JP 3214069 B2 JP3214069 B2 JP 3214069B2
Authority
JP
Japan
Prior art keywords
base substrate
substrate
outer peripheral
spacer
holding frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP17007692A
Other languages
Japanese (ja)
Other versions
JPH05330984A (en
Inventor
充弘 青田
優 藤野
嗣伸 水埜
誠人 熊取谷
雄徳 関島
洋 鷹木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP17007692A priority Critical patent/JP3214069B2/en
Publication of JPH05330984A publication Critical patent/JPH05330984A/en
Application granted granted Critical
Publication of JP3214069B2 publication Critical patent/JP3214069B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は下地基板の表面に単結晶
膜を育成する液相エピタキシャル成長装置に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid phase epitaxial growth apparatus for growing a single crystal film on the surface of a base substrate.

【0002】[0002]

【従来の技術】従来、遅延線フィルター,発振器,非線
形デバイスなどの静磁波(MSW)デバイス、およびフ
ァラデー回転効果を利用した光アイソレータ,サーキュ
レータまたはスイッチなどの磁気光学素子等に磁性ガー
ネット単結晶が広く用いられている。この磁性ガーネッ
ト単結晶の主な製造方法として、液相エピタキシャル成
長法(LPE法)が知られている。
2. Description of the Related Art Conventionally, magnetic garnet single crystals have been widely used in magnetostatic wave (MSW) devices such as delay line filters, oscillators, and nonlinear devices, and in magneto-optical devices such as optical isolators, circulators, and switches utilizing the Faraday rotation effect. Used. As a main production method of the magnetic garnet single crystal, a liquid phase epitaxial growth method (LPE method) is known.

【0003】この液相エピタキシャル成長法は、縦型加
熱炉内に所定条件に保持された白金製坩堝に、ガーネッ
トを構成する元素の酸化物および溶剤としてPbOとB
2 3 とを充填し、約1200℃で均質化を行い溶液化
する。この溶液を液相線(Liquidus) と固相線 (Solidu
s)の間の温度、即ち約900℃前後の一定温度に保持し
てガーネットを過飽和状態にした後、この溶液中に下地
基板であるGd3 Ga5 12(GGG)基板を浸漬し、
一定位置で回転させながら所定時間成長を行うことによ
り、下地基板の表面に磁性ガーネット単結晶膜を育成す
る。磁性ガーネット単結晶膜の育成が終了した後、下地
基板を溶液から高速度で回転して引き上げ、単結晶膜上
の付着溶液を遠心力により振り切ることにより、育成を
終了する。上記下地基板は、支持棒の下端部に取り付け
られた貴金属製の基板保持具によって水平状態に保持さ
れている。基板保持具に設けられた数本の脚部は内外方
向の弾性を有しており、この脚部の弾性によって下地基
板の外周部を挟み込んで保持している。
[0003] In this liquid phase epitaxial growth method, PbO and B as an oxide and a solvent of elements constituting garnet are put in a platinum crucible kept in a vertical heating furnace under predetermined conditions.
It is charged with 2 O 3 and homogenized at about 1200 ° C. to form a solution. This solution is combined with liquidus (Liquidus) and solidus (Solidus).
After maintaining the temperature during s), that is, a constant temperature of about 900 ° C. to supersaturate the garnet, a Gd 3 Ga 5 O 12 (GGG) substrate as a base substrate is immersed in this solution,
The magnetic garnet single crystal film is grown on the surface of the base substrate by performing growth for a predetermined time while rotating at a fixed position. After the growth of the magnetic garnet single crystal film is completed, the growth is completed by rotating the base substrate out of the solution at a high speed and pulling the solution off the single crystal film by centrifugal force. The base substrate is held horizontally by a noble metal substrate holder attached to the lower end of the support rod. Several legs provided on the substrate holder have inward and outward elasticity, and the elasticity of the legs sandwiches and holds the outer peripheral portion of the base substrate.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記の
方法では1回の育成で1枚の単結晶板しか製造できず、
生産性が悪いという欠点がある。そこで、基板保持具の
脚部を下方へ長く延ばし、これら脚部の間に下地基板を
複数枚平行に保持するようにして、量産性を高めた液相
エピタキシャル成長装置もある。
However, according to the above method, only one single crystal plate can be manufactured by one growth.
There is a disadvantage that productivity is poor. Therefore, there is a liquid phase epitaxial growth apparatus in which the legs of the substrate holder are extended long downward and a plurality of base substrates are held in parallel between the legs to improve mass productivity.

【0005】ところが、この方法の場合、脚部の内側へ
の付勢力が脚部の自由端部(下端部)と基部(上端部)
とで異なり、下地基板の外周部に加わる脚部の応力も下
地基板によって異なるという問題がある。例えば、脚部
の基部付近に保持された下地基板への応力は大きく、そ
のため下地基板に割れや欠けが発生しやすい反面、脚部
の自由端付近に保持された下地基板の応力は小さく、溶
液振り切りのために高速回転させた時、下地基板が基板
保持具から脱落してしまい、育成基板の回収率が低下す
るという欠点がある。そこで、本発明の目的は、下地基
板に無理な応力を与えずに、高い回収率で良質の単結晶
膜を量産できる液相エピタキシャル成長装置を提供する
ことにある。
However, in the case of this method, the biasing force inward of the leg is applied to the free end (lower end) and the base (upper end) of the leg.
However, there is a problem that the stress of the leg applied to the outer peripheral portion of the base substrate also differs depending on the base substrate. For example, the stress on the base substrate held near the base of the leg is large, and therefore the base substrate is liable to crack or chip, but the stress on the base substrate held near the free end of the leg is small, and the solution When the substrate is rotated at a high speed for shaking off, there is a disadvantage that the underlying substrate falls off from the substrate holder and the recovery rate of the grown substrate is reduced. Accordingly, an object of the present invention is to provide a liquid phase epitaxial growth apparatus capable of mass-producing a high-quality single crystal film at a high recovery rate without giving an unreasonable stress to an underlying substrate.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するた
め、本発明の基板保持具は、支持棒の下端部に固定され
た取付枠と、取付枠に対して着脱可能に取り付けられ、
底板部とこの底板部から上方へ延び下地基板の外周面を
位置規制し、回転時のずれを防止する側脚部とを有する
保持枠と、保持枠の内部に上記側脚部によって外周部が
支持された状態で収容され、各下地基板の間に配置され
るスペーサとを備え、複数枚の下地基板を上記スペーサ
によって上下方向に距離を保ちながら水平に保持可能と
したものである。
In order to achieve the above object, a substrate holder of the present invention is provided with a mounting frame fixed to a lower end of a support rod, and is detachably mounted on the mounting frame.
The bottom plate and the outer peripheral surface of the underlying substrate extending upward from the bottom plate
A holding frame having a side leg that regulates the position and prevents displacement during rotation. An outer peripheral portion is formed inside the holding frame by the side leg.
It housed in the support state, and a spacer disposed between each base substrate, in which a plurality of underlying substrates were possible horizontally held while keeping a distance in the vertical direction by the spacer.

【0007】複数の下地基板を溶液中に浸漬して単結晶
膜を育成する際、各下地基板はスペーサによって上下に
間隔をあけて水平に保持されているので、単結晶の成分
が下地基板全体に行き渡り、エピタキシャル成長が促進
される。単結晶膜の育成が終了した後、下地基板を溶液
から高速度で回転して引き上げると、下地基板には遠心
力による外方への力が作用するが、下地基板の外周面は
保持枠の側脚部によって位置規制されているので、下地
基板がずれたり脱落することがない。基板保持具から下
地基板を取り出す際、保持枠を取付枠から取り外し、保
持枠内に収容されているスペーサを取り出せば、下地基
板も簡単に取り出すことができる。このように、下地基
板に無理な応力を掛けずに簡単に取り外すことができ
る。
When growing a single crystal film by immersing a plurality of base substrates in a solution, since each base substrate is horizontally held at intervals vertically by spacers, the components of the single crystal are formed. Spread all over the underlying substrate, and epitaxial growth is promoted. After the growth of the single crystal film is completed, when the underlying substrate is rotated from the solution at a high speed and pulled up, an outward force due to centrifugal force acts on the underlying substrate , but the outer peripheral surface of the underlying substrate is <br / > Since the position is regulated by the side legs of the holding frame, the base substrate does not shift or fall off. When removing the base substrate from the substrate holder, the base frame can be easily removed by removing the holding frame from the mounting frame and removing the spacer housed in the holding frame. In this manner, the base substrate can be easily removed without applying excessive stress.

【0008】[0008]

【実施例】図1は本発明の一例である磁性ガーネット膜
の育成装置を示す。アルミナ製の縦型円筒形炉心管1の
内側には、支持台2によって底面が支持された白金製坩
堝3が配置され、この坩堝3内には磁性ガーネット膜の
原料と溶剤とが充填されている。炉心管1の外側には
上,中,下の3段のヒータ4,5,6が設けられてお
り、坩堝3は中ヒータ5の内側に配置されている。炉心
管1内の坩堝3は上記ヒータ4〜6の輻射熱により加熱
され、ガーネット原料および溶剤が溶解されて溶液7化
されるとともに、炉心管1内の雰囲気が所定温度に保持
されている。
FIG. 1 shows an apparatus for growing a magnetic garnet film according to an embodiment of the present invention. A platinum crucible 3 having a bottom surface supported by a support 2 is disposed inside a vertical cylindrical core tube 1 made of alumina. The crucible 3 is filled with a raw material of a magnetic garnet film and a solvent. I have. Outside the furnace tube 1, upper, middle and lower three-stage heaters 4, 5 and 6 are provided, and the crucible 3 is arranged inside the middle heater 5. The crucible 3 in the furnace tube 1 is heated by the radiant heat of the heaters 4 to 6, the garnet raw material and the solvent are dissolved to form a solution 7, and the atmosphere in the furnace tube 1 is maintained at a predetermined temperature.

【0009】GGG基板よりなる円板状の下地基板8
は、図2,図3に示す白金製または白金合金製の基板保
持具9によって水平に保持されている。基板保持具9
は、取付枠10と、保持枠15と、スペーサ18とで構
成されている。取付枠10は、アルミナ製支持棒20の
下端部に固定されたボス部10aと、ボス部10aと放
射状の連結部11を介して連結された環状の支持部12
と、支持部12の下面に円環板状の押え板13とを備え
ている。上記支持部12の外径は下地基板8の外径とほ
ぼ等しく、その外周部には3箇所に白金製または白金合
金製のネジ14が螺合するねじ穴12aが形成されてい
る。
Disc-shaped base substrate 8 made of a GGG substrate
Is horizontally held by a substrate holder 9 made of platinum or a platinum alloy shown in FIGS. Substrate holder 9
Comprises a mounting frame 10, a holding frame 15, and a spacer 18. The mounting frame 10 includes a boss 10 a fixed to the lower end of the alumina support rod 20 and an annular support 12 connected to the boss 10 a via a radial connection 11.
And an annular plate-shaped holding plate 13 on the lower surface of the support portion 12. The outer diameter of the support portion 12 is substantially equal to the outer diameter of the base substrate 8, and screw holes 12 a into which screws 14 made of platinum or a platinum alloy are screwed are formed at three places on the outer peripheral portion.

【0010】保持枠15は、上記支持部12の外周面に
接する3本の側脚部16と、側脚部16の最下端に連結
された円環板状の底板17とからなり、側脚部16には
一定間隔おきに複数の長孔16aが形成されている。側
脚部16の内接円の直径は、下地基板8の直径にほぼ等
しい。スペーサ18は白金または白金合金製のワイヤで
略3角形状に形成されており、各頂点には、上下方向に
延びる足18aと、放射方向に延びる係合ピン18bと
が設けられている。係合ピン18bを保持枠15の長孔
16aに係合させると、スペーサ18は保持枠15に水
平に取り付けられる。そして、各スペーサ18の間に下
地基板8を配置すれば、複数の下地基板8を距離を保っ
て保持できる。なお、下地基板8の厚みにより上方のス
ペーサ18の高さが変わるので、この変化を長孔16a
によって吸収している。なお、上端の長孔16aはネジ
14を挿通するための挿通穴である。
The holding frame 15 is composed of three side legs 16 in contact with the outer peripheral surface of the support portion 12 and an annular bottom plate 17 connected to the lowermost end of the side legs 16. The portion 16 has a plurality of long holes 16a formed at regular intervals. The diameter of the inscribed circle of the side leg 16 is substantially equal to the diameter of the base substrate 8. The spacer 18 is formed in a substantially triangular shape with a wire made of platinum or a platinum alloy, and each apex is provided with a foot 18a extending vertically and an engaging pin 18b extending radially. When the engaging pin 18b is engaged with the elongated hole 16a of the holding frame 15, the spacer 18 is horizontally attached to the holding frame 15. By disposing the base substrate 8 between the spacers 18, the plurality of base substrates 8 can be held at a distance. Since the height of the upper spacer 18 changes depending on the thickness of the base substrate 8, this change is taken
Is absorbed by. The slot 16a at the upper end is an insertion hole through which the screw 14 is inserted.

【0011】上記基板保持具9に下地基板8を保持する
には、次のように行う。即ち、まず保持枠15に対して
下地基板8を上方から収納すると、下地基板8は外周面
が側脚部16でガイドされ、底板17上に外周部下面が
載置される。次に、スペーサ18を撓めながら保持枠1
5内に収納し、係合ピン18bを最下部の長穴16aに
係合させ、底板17上に載置された下地基板8の外周部
上面の3箇所を足18aで押える。続いて、スペーサ1
8の上に次の下地基板8を載置し、その下地基板8の上
に次のスペーサ18を載せ、スペーサ18の係合ピン1
8bを下から2番目の長孔16aに係合させる。以下、
同様にして下地基板8とスペーサ18を順に保持枠15
へ収容する。そして、最上部のスペーサ18の上に下地
基板8を載置した後、保持枠15の側脚部16を取付枠
10の支持部12へ外嵌し、外側からネジ14で側脚部
16と支持部12とを連結することにより、組付を終了
する。このようにして、下地基板8はその外周面が保持
枠15の側脚部16の内面で位置規制され、外周部上下
面が保持枠15の底板17とスペーサ18の足18aと
の間、または上下のスペーサ18の足18aの間で挟持
され、安定に保持される。そのため、基板保持具9を1
00rpmで30秒おきに正逆に回転させても、下地基
板8の回転方向のずれが起こらなかった。
In order to hold the base substrate 8 on the substrate holder 9, the following is performed. That is, when the base substrate 8 is first stored in the holding frame 15 from above, the outer peripheral surface of the base substrate 8 is guided by the side leg portions 16, and the lower surface of the outer peripheral portion is placed on the bottom plate 17. Next, the holding frame 1 is bent while the spacer 18 is being bent.
5, the engaging pin 18b is engaged with the lowermost slot 16a, and three positions on the upper surface of the outer peripheral portion of the base substrate 8 placed on the bottom plate 17 are pressed by the feet 18a. Then, spacer 1
Next, the next base substrate 8 is placed on the base substrate 8, the next spacer 18 is placed on the base substrate 8,
8b is engaged with the second long hole 16a from the bottom. Less than,
Similarly, the base substrate 8 and the spacer 18 are sequentially placed on the holding frame 15.
To house. Then, after placing the base substrate 8 on the uppermost spacer 18, the side legs 16 of the holding frame 15 are fitted onto the support portions 12 of the mounting frame 10, and the side legs 16 are screwed from outside with the screws 14. The assembly is completed by connecting the support portion 12. Thus, the position of the outer peripheral surface of the base substrate 8 is regulated by the inner surface of the side leg 16 of the holding frame 15, and the upper and lower outer peripheral surfaces are between the bottom plate 17 of the holding frame 15 and the feet 18 a of the spacer 18, or It is sandwiched between the legs 18a of the upper and lower spacers 18 and is stably held. Therefore, the substrate holder 9 is
Even when the substrate 8 was rotated in the normal or reverse direction at 30 minutes at 00 rpm, no deviation in the rotation direction of the base substrate 8 occurred.

【0012】上記支持棒20の上端部は駆動手段(図示
せず)に着脱可能に取り付けられており、回転方向およ
び上下方向に駆動される。なお、支持棒20と駆動手段
との連結部は、支持棒20の偏心を調整可能となってい
る。炉心管1の上端には、炉内への冷気の侵入を抑制す
る石英ガラス製のシャッタ21が載置されており、この
シャッタ21の中心部に上記支持棒20が挿通されてい
る。
The upper end of the support rod 20 is detachably attached to a driving means (not shown), and is driven in a rotating direction and a vertical direction. The connection between the support bar 20 and the driving means can adjust the eccentricity of the support bar 20. At the upper end of the furnace tube 1, a quartz glass shutter 21 for suppressing intrusion of cool air into the furnace is mounted, and the support bar 20 is inserted through the center of the shutter 21.

【0013】次に、上記構成の液相エピタキシャル成長
装置の動作の一例を説明する。まず、坩堝3の中でガー
ネット原料と溶剤とを混合し、1200℃で加熱溶解し
て2時間保持した後、890℃に降温して過冷却状態と
する。次に、保持枠15に複数の下地基板8をスペーサ
18によって距離を保ちながら水平に保持し、この保持
枠15の上端部をネジ14で取付枠10に固定する。こ
のようにして下端部に下地基板8を保持した支持棒20
を降下させ、下地基板8を溶液7中に浸漬する。そし
て、支持棒20を一方向あるいは正逆に回転させて磁性
ガーネット単結晶膜を育成する。単結晶膜の育成が終了
した後、下地基板8を溶液7から高速度で回転させなが
ら引き上げ、単結晶膜上の付着溶液を遠心力により振り
切る。その際、基板保持具9には高速回転により回転方
向の力が作用するが、下地基板8はその外周部が保持枠
15の側脚部16によって位置規制されているので、下
地基板8が基板保持具9からずれたり、脱落することが
ない。付着溶液の振り切りを終了した後、支持棒20を
さらに引き上げ、所定位置で保持枠15を取付枠10か
ら分離し、これを別の場所へ運び、ここで保持枠15か
ら下地基板8を取り出す。この時も、下地基板8には無
理な力が全く掛からないので、割れや欠けが発生しな
い。
Next, an example of the operation of the liquid phase epitaxial growth apparatus having the above configuration will be described. First, the garnet raw material and the solvent are mixed in the crucible 3, heated and melted at 1200 ° C., kept for 2 hours, and then cooled to 890 ° C. to be in a supercooled state. Next, the plurality of base substrates 8 are horizontally held on the holding frame 15 while keeping the distance by the spacers 18, and the upper end of the holding frame 15 is fixed to the mounting frame 10 with screws 14. The support rod 20 holding the base substrate 8 at the lower end in this manner
Is lowered, and the base substrate 8 is immersed in the solution 7. Then, the support bar 20 is rotated in one direction or forward and reverse to grow a magnetic garnet single crystal film. After the growth of the single crystal film is completed, the base substrate 8 is pulled up from the solution 7 while rotating at a high speed, and the attached solution on the single crystal film is shaken off by centrifugal force. At this time, a rotational force is applied to the substrate holder 9 by high-speed rotation. However, the position of the base substrate 8 is regulated by the side legs 16 of the holding frame 15 so that the base substrate 8 There is no displacement or dropping out of the holder 9. After the shaking off of the adhesion solution is completed, the support bar 20 is further pulled up, the holding frame 15 is separated from the mounting frame 10 at a predetermined position, and is transported to another place, where the base substrate 8 is taken out from the holding frame 15. Also at this time, since no excessive force is applied to the base substrate 8, no cracking or chipping occurs.

【0014】図4,図5は本発明にかかる基板保持具3
0の他の実施例を示す。この実施例の基板保持具30
も、アルミナ製支持棒31に固定された取付枠32と、
保持枠40と、スペーサ50とで構成されている。取付
枠32は、ボス部33と、ボス部33と放射状の連結部
34を介して連結された環状の支持部35とを備えてい
る。上記支持部35の外径は下地基板8の外径とほぼ等
しく、その外周部には3箇所に白金製または白金合金製
のネジ37が螺合するネジ穴36が形成されている。
FIGS. 4 and 5 show a substrate holder 3 according to the present invention.
0 shows another embodiment. Substrate holder 30 of this embodiment
A mounting frame 32 fixed to an alumina support rod 31;
It is composed of a holding frame 40 and a spacer 50. The mounting frame 32 includes a boss 33 and an annular support 35 connected to the boss 33 via a radial connection 34. The outer diameter of the support portion 35 is substantially equal to the outer diameter of the base substrate 8, and screw holes 36 into which screws 37 made of platinum or a platinum alloy are screwed are formed in three places on the outer peripheral portion.

【0015】保持枠40は、上記支持部35の外周面に
ほぼ接する環状の口縁部41と、口縁部41から下方へ
垂設された3本の側脚部42と、側脚部42の最下端に
連結された円環板の底脚部43とからなる。口縁部41
の内径および側脚部42の内接円の直径は下地基板8の
直径とほぼ等しく、底脚部43の内径は下地基板8の外
径よりやや小さい。なお、口縁部41には上記ネジ37
の挿通用長孔44が形成されている。スペーサ50は白
金または白金合金製のワイヤで形成されており、上下の
リング部51と、これらリング部51を連結する縦方向
の連結部52とで構成されている。リング部51の外径
は下地基板8の外径とほぼ等しい。
The holding frame 40 has an annular rim 41 almost in contact with the outer peripheral surface of the support portion 35, three side legs 42 extending downward from the rim 41, and a side leg 42. And a bottom leg 43 of an annular plate connected to the lowermost end of the ring. Lip 41
And the diameter of the inscribed circle of the side leg 42 is substantially equal to the diameter of the underlying substrate 8, and the inner diameter of the bottom leg 43 is slightly smaller than the outer diameter of the underlying substrate 8. In addition, the above-mentioned screw 37 is
Are formed. The spacer 50 is formed of platinum or a platinum alloy wire, and includes upper and lower ring portions 51 and a vertical connecting portion 52 connecting the ring portions 51. The outer diameter of the ring portion 51 is substantially equal to the outer diameter of the base substrate 8.

【0016】上記基板保持具30に下地基板8を保持す
るには、まず下地基板8を保持枠40の口縁部41から
収納する。下地基板8の外周面は側脚部42でガイドさ
れ、底脚部43上に外周部下面が載置される。次に、ス
ペーサ50を保持枠40内に収納し、続いてスペーサ5
0の上に次の下地基板8を載置し、その下地基板8の上
に次のスペーサ50を載せる。以下、同様にして下地基
板8とスペーサ50を順に保持枠40へ収容する。そし
て、最上部のスペーサ50の上に下地基板8を載置した
後、保持枠40の口縁部41を取付枠32の支持部35
へ外嵌し、外側からネジ37で口縁部41と支持部35
とを連結する。この時、最上部の下地基板8はスペーサ
50と支持部35とで挟持されることになる。このよう
にして組み立てられた基板保持具30において、下地基
板8はその外周面が保持枠40の側脚部42の内面で位
置規制され、外周部上下面が上下のスペーサ50のリン
グ部51によって挟持されるため、安定に保持される。
In order to hold the base substrate 8 on the substrate holder 30, the base substrate 8 is first stored from the edge 41 of the holding frame 40. The outer peripheral surface of the base substrate 8 is guided by the side legs 42, and the lower surface of the outer peripheral portion is placed on the bottom leg 43. Next, the spacer 50 is housed in the holding frame 40,
Next, the next base substrate 8 is placed on the base substrate 8, and the next spacer 50 is placed on the base substrate 8. Hereinafter, similarly, the base substrate 8 and the spacer 50 are sequentially housed in the holding frame 40. After the base substrate 8 is placed on the uppermost spacer 50, the edge 41 of the holding frame 40 is connected to the support 35 of the mounting frame 32.
And the lip portion 41 and the support portion 35 are screwed from outside.
And concatenate. At this time, the uppermost base substrate 8 is sandwiched between the spacer 50 and the support portion 35. In the substrate holder 30 assembled in this manner, the position of the outer peripheral surface of the base substrate 8 is regulated by the inner surface of the side leg portion 42 of the holding frame 40, and the outer peripheral upper and lower surfaces are formed by the ring portions 51 of the upper and lower spacers 50. Because it is sandwiched, it is stably held.

【0017】この実施例では、スペーサ50を保持枠4
0の中に単に挿入すればよいだけであるので、保持枠4
0への下地基板8およびスペーサ50の収納・取出は容
易であるという特徴がある。
In this embodiment, the spacer 50 is attached to the holding frame 4.
0, it is only necessary to insert it in the holding frame 4
There is a feature that the base substrate 8 and the spacer 50 can be easily stored and removed to zero.

【0018】なお、上記説明では磁性ガーネット単結晶
について説明したが、本発明はこれのみに限定されるも
のではなく、例えば光学デバイス用単結晶であるニオブ
酸リチウムの液相エピタキシャル成長にも本発明を適用
することができる。
In the above description, a magnetic garnet single crystal has been described. However, the present invention is not limited to this. For example, the present invention is also applied to liquid phase epitaxial growth of lithium niobate which is a single crystal for an optical device. Can be applied.

【0019】[0019]

【発明の効果】以上の説明で明らかなように、本発明に
よれば、基板保持方法を従来のような外周方向からの挟
み込み方式から、保持枠およびスペーサを用いた上下収
構造に変更したので、複数の下地基板を無理な応力を
与えずに確実に保持できる。特に、保持枠には底板部と
この底板部から上方へ延び下地基板の外周面を位置規制
し、回転時のずれを防止する側脚部とが設けられている
ので、育成後の高速回転による下地基板の外れ、下地基
板の外周部の欠けや割れといった不具合を解消できる。
また、下地基板はスペーサによって上下方向に距離をお
いて配置されるので、各下地基板の隙間には溶液が容易
に入り込み、単結晶の育成を助ける。そのため、良質の
単結晶を効率良く量産できる。
As is apparent from the above description, according to the present invention, the substrate holding method can be changed from the conventional sandwiching method from the outer peripheral direction to the vertical holding method using the holding frame and the spacer.
Since the housing structure has been changed, a plurality of base substrates can be reliably held without applying excessive stress. In particular, the holding frame has a bottom plate
Extends upward from this bottom plate and regulates the outer peripheral surface of the underlying substrate
And side legs for preventing displacement during rotation are provided.
Therefore, problems such as detachment of the base substrate due to high-speed rotation after growth and chipping or cracking of the outer peripheral portion of the base substrate can be solved.
In addition, since the base substrates are arranged at a distance in the vertical direction by the spacers, the solution easily enters the gaps between the base substrates and helps the growth of the single crystal. Therefore, high-quality single crystals can be efficiently mass-produced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明にかかる液相エピタキシャル成長装置の
浸漬前の縦断面図である。
FIG. 1 is a longitudinal sectional view of a liquid phase epitaxial growth apparatus according to the present invention before immersion.

【図2】基板保持具の第1実施例の斜視図である。FIG. 2 is a perspective view of a first embodiment of the substrate holder.

【図3】図2に示した基板保持具の分解斜視図である。FIG. 3 is an exploded perspective view of the substrate holder shown in FIG.

【図4】基板保持具の第2実施例の斜視図である。FIG. 4 is a perspective view of a second embodiment of the substrate holder.

【図5】図4に示した基板保持具の分解斜視図である。FIG. 5 is an exploded perspective view of the substrate holder shown in FIG.

【符号の説明】[Explanation of symbols]

1 炉心管 3 坩堝 7 溶液 8 下地基板 9 基板保持具 10 取付枠 15 保持枠 18 スペーサ 20 支持棒 DESCRIPTION OF SYMBOLS 1 Furnace tube 3 Crucible 7 Solution 8 Base substrate 9 Substrate holder 10 Mounting frame 15 Holding frame 18 Spacer 20 Support rod

───────────────────────────────────────────────────── フロントページの続き (72)発明者 熊取谷 誠人 京都府長岡京市天神2丁目26番10号 株 式会社村田製作所内 (72)発明者 関島 雄徳 京都府長岡京市天神2丁目26番10号 株 式会社村田製作所内 (72)発明者 鷹木 洋 京都府長岡京市天神2丁目26番10号 株 式会社村田製作所内 (56)参考文献 特開 昭63−122110(JP,A) 実開 昭49−18464(JP,U) (58)調査した分野(Int.Cl.7,DB名) C30B 1/00 - 35/00 ──────────────────────────────────────────────────続 き Continuing from the front page (72) Inventor Masato Kumagaya 2-26-10 Tenjin, Nagaokakyo-shi, Kyoto Inside Murata Manufacturing Co., Ltd. No. 2 Murata Manufacturing Co., Ltd. (72) Inventor Hiroshi Takagi 2-26-10 Tenjin, Nagaokakyo-shi, Kyoto Murata Manufacturing Co., Ltd. (56) References JP-A-63-122110 (JP, A) Akira Mikai 49-18464 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) C30B 1/00-35/00

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】支持棒の下端部に基板保持具を取り付け、
この基板保持具に水平に保持された下地基板を単結晶原
料が溶解されている坩堝内に浸漬し、一定位置で回転さ
せながら所定時間成長を行うことにより、下地基板の表
面に単結晶膜を育成する液相エピタキシャル成長装置に
おいて、 上記基板保持具は、支持棒の下端部に固定された取付枠
と、取付枠に対して着脱可能に取り付けられ、底板部と
この底板部から上方へ延び下地基板の外周面を位置規制
し、回転時のずれを防止する側脚部とを有する保持枠
と、保持枠の内部に上記側脚部によって外周部が支持さ
れた状態で収容され、各下地基板の間に配置されるスペ
ーサとを備え、複数枚の下地基板を上記スペーサによっ
上下方向に距離を保ちながら水平に保持可能としたこ
とを特徴とする液相エピタキシャル成長装置。
1. A substrate holder is attached to a lower end of a support rod,
The base substrate held horizontally by the substrate holder is immersed in a crucible in which the single crystal raw material is dissolved, and grown for a predetermined time while rotating at a predetermined position, thereby forming a single crystal film on the surface of the base substrate. in the liquid phase epitaxial growth apparatus for growing, the substrate holder comprises a mounting frame fixed to the lower end of the support rod detachably attached to the attachment frame, a bottom plate
Extends upward from this bottom plate and regulates the outer peripheral surface of the underlying substrate
A supporting frame having side legs for preventing displacement during rotation, and an outer peripheral portion supported by the side legs inside the holding frame.
It is housed in a state, and a spacer disposed between each base substrate, the liquid phase epitaxial growth, characterized in that a plurality of underlying substrates were possible horizontally held while keeping a distance in the vertical direction by the spacer apparatus.
JP17007692A 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment Expired - Fee Related JP3214069B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17007692A JP3214069B2 (en) 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17007692A JP3214069B2 (en) 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment

Publications (2)

Publication Number Publication Date
JPH05330984A JPH05330984A (en) 1993-12-14
JP3214069B2 true JP3214069B2 (en) 2001-10-02

Family

ID=15898200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17007692A Expired - Fee Related JP3214069B2 (en) 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment

Country Status (1)

Country Link
JP (1) JP3214069B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551908B2 (en) 2000-10-02 2003-04-22 Canon Kabushiki Kaisha Method for producing semiconductor thin films on moving substrates
JP4647525B2 (en) * 2006-03-20 2011-03-09 日本碍子株式会社 Method for producing group III nitride crystal

Also Published As

Publication number Publication date
JPH05330984A (en) 1993-12-14

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