JP3215798B2 - Method for growing II-VI compound semiconductor crystal - Google Patents
Method for growing II-VI compound semiconductor crystalInfo
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- JP3215798B2 JP3215798B2 JP16585296A JP16585296A JP3215798B2 JP 3215798 B2 JP3215798 B2 JP 3215798B2 JP 16585296 A JP16585296 A JP 16585296A JP 16585296 A JP16585296 A JP 16585296A JP 3215798 B2 JP3215798 B2 JP 3215798B2
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- Prior art keywords
- crystal
- reservoir
- growth
- growing
- compound semiconductor
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- 239000013078 crystal Substances 0.000 title claims description 60
- 238000000034 method Methods 0.000 title claims description 29
- 150000001875 compounds Chemical class 0.000 title claims description 15
- 239000004065 semiconductor Substances 0.000 title claims description 13
- 239000002994 raw material Substances 0.000 claims description 7
- 150000004820 halides Chemical class 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 6
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 24
- 239000003708 ampul Substances 0.000 description 17
- 239000000843 powder Substances 0.000 description 4
- 229910052736 halogen Inorganic materials 0.000 description 3
- 150000002367 halogens Chemical class 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000000859 sublimation Methods 0.000 description 2
- 230000008022 sublimation Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 238000001947 vapour-phase growth Methods 0.000 description 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- -1 CdT. e Inorganic materials 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 230000015271 coagulation Effects 0.000 description 1
- 238000005345 coagulation Methods 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005424 photoluminescence Methods 0.000 description 1
- 238000000103 photoluminescence spectrum Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000005092 sublimation method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 239000006163 transport media Substances 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
Landscapes
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、ZnSe、Zn
S、CdTe、CdS等のII−VI族化合物半導体結晶を
成長する方法に関する。The present invention relates to ZnSe, Zn
The present invention relates to a method for growing a II-VI compound semiconductor crystal such as S, CdTe, and CdS.
【0002】[0002]
【従来の技術】II−VI族化合物半導体結晶の成長方法
は、融液成長法、固相成長法、溶液成長法、気相成長法
の4種の方法に大きく分類される。その中で気相成長法
には、原料の昇華及び凝結を利用して結晶成長を行う昇
華法(PVT法:Physical VapourTransport 法)、及
び、ハロゲンと原料を反応させてハロゲン化物を生成
し、そのハロゲン化物をを輸送した後、分解して結晶成
長を行う化学輸送法(CVT法:Chemical Vapour Trans
port法)がある。2. Description of the Related Art II-VI compound semiconductor crystal growth methods are broadly classified into four types: melt growth method, solid phase growth method, solution growth method, and vapor phase growth method. Among them, the vapor phase growth method includes a sublimation method (PVT method: Physical VapourTransport method) in which crystal growth is performed by utilizing the sublimation and coagulation of the raw material, and a method in which a halogen is generated by reacting a halogen with a raw material. Chemical transport method (CVT: Chemical Vapor Trans
port method).
【0003】PVT法によるZnSe結晶成長として
は、J. Crystal Growth 94 (1989) p.1 〜5 に、石英管
に5gのZnSe粉末と、種結晶としてZnSe単結晶
とをアンプルに封入し、このアンプルを加熱してZnS
e粉末側の温度を約1080℃に、種結晶側の温度を約
1070℃に保持することにより、種結晶上にZnSe
結晶を成長させた。その後、成長ZnSe結晶をZn融
液中で熱処理することにより、比抵抗を0.2Ωcm程
度まで下げることができたと報告されている。As for the growth of ZnSe crystal by the PVT method, 5 g of ZnSe powder and a ZnSe single crystal as a seed crystal are sealed in an ampoule as described in J. Crystal Growth 94 (1989) pp. 1-5. Heat the ampoule to ZnS
e By maintaining the temperature on the powder side at about 1080 ° C. and the temperature on the seed crystal side at about 1070 ° C., ZnSe is deposited on the seed crystal.
A crystal was grown. Thereafter, it is reported that the specific resistance could be reduced to about 0.2 Ωcm by subjecting the grown ZnSe crystal to heat treatment in a Zn melt.
【0004】また、CVT法によるZnSe結晶成長と
しては、J. Crystal Growth 91 (1988) p.639 〜646
に、石英管にZnSe粉末と、種結晶としてZnSe単
結晶に加え、アンプル内容積1cm3 当たり5.4mg
のヨウ素をアンプルに封入し、このアンプルを加熱して
ZnSe粉末側の温度を850℃に、種結晶側の温度を
840℃に保持することにより、種結晶上にZnSe結
晶を成長させた。この結晶には100〜200ppm程
度のヨウ素が含まれているので、この結晶を1070℃
のZn融液中で130時間熱処理することにより、比抵
抗を0.03Ωcm下げることができたと報告されてい
る。As for ZnSe crystal growth by the CVT method, J. Crystal Growth 91 (1988) pp. 639-646.
In a ZnSe powder in a quartz tube, in addition to the ZnSe single crystal as a seed crystal, ampoule volume 1 cm 3 per 5.4mg
Was sealed in an ampoule, and the ampoule was heated to maintain the temperature on the ZnSe powder side at 850 ° C. and the temperature on the seed crystal side at 840 ° C., thereby growing a ZnSe crystal on the seed crystal. Since this crystal contains about 100 to 200 ppm of iodine,
It has been reported that by performing heat treatment in a Zn melt for 130 hours, the specific resistance could be reduced by 0.03 Ωcm.
【0005】[0005]
【発明が解決しようとする課題】上記のように、比抵抗
が0.03Ωcm程度のZnSe結晶をCVT法で成長
できるが、大きな結晶を成長するためには大きなアンプ
ルを使用する必要があるが、この方法はアンプル中にガ
ス対流が発生しやすく、大きなアンプルを使用すると、
その傾向は一層増加するので、安定な状態で結晶成長を
行うことができず、単結晶の育成は不可能であった。As described above, a ZnSe crystal having a specific resistance of about 0.03 Ωcm can be grown by the CVT method. However, in order to grow a large crystal, it is necessary to use a large ampoule. This method tends to generate gas convection in the ampoule, and if you use a large ampoule,
Since the tendency further increases, crystal growth could not be performed in a stable state, and single crystal could not be grown.
【0006】一方、アンプル中の対流を抑制するため
に、アンプル中の原料充填領域と結晶成長領域の中間領
域に、気体の対流の発生を抑制するための格子板や細管
の束を配置することが提案されたが(特開平5−489
4号公報参照)、この方法においても大きな結晶を成長
するためには、上記の対流抑制手段が存在しない結晶成
長領域を大きくする必要があるため、結果的には、この
大きな結晶成長領域でガス対流が発生して単結晶の成長
を困難にしていた。On the other hand, in order to suppress convection in the ampoule, a lattice plate or a bundle of thin tubes for suppressing generation of convection of gas is arranged in an intermediate region between the raw material filling region and the crystal growth region in the ampoule. (Japanese Patent Laid-Open No. 5-489)
In order to grow a large crystal in this method as well, it is necessary to enlarge the crystal growth region where the above-mentioned convection suppressing means does not exist. Convection occurred, making it difficult to grow single crystals.
【0007】このガス対流は、アンプル中の温度差によ
って誘起される自然対流であるが、一般に自然対流の強
さの強弱は、以下のグラスホッフ数(Gr)によって規
定される。アンプルが大きくなると、式中のRが大きく
なり、グラスホッフ数が大きくなるので、ガス対流が強
くなる。 Gr=gβT R3 ΔTρ2 /μ2 ここで g:重力 βT :体膨張係数 R :アンプル直径 ΔT:アンプル内温度差 ρ :ガスの密度 μ :粘性係数[0007] The gas convection is natural convection induced by a temperature difference in the ampoule. Generally, the strength of the natural convection is defined by the following Grashof number (Gr). When the ampoule increases, R in the equation increases and the Grashof number increases, so that the gas convection increases. Gr = gβ T R 3 ΔT ρ 2 / μ 2 where g: gravity β T : body expansion coefficient R: ampule diameter ΔT: temperature difference in the ampoule ρ: gas density μ: viscosity coefficient
【0008】ここで、アンプルの内圧を下げてガス密度
を下げることができればグラスホッフ数を小さくするこ
とができるので、大型結晶を成長させるために、アンプ
ル内径を大きくしてもグラスホッフ数はあまり大きくな
らず、自然対流が無い状態で結晶成長が可能となる。し
かし、一般に、ヨウ素を輸送媒体として用いるCVT法
でのZnSe結晶成長では内圧が数気圧と高く、自然対
流が発生しやすい状態になっているため、アンプル内径
を2cm程度にしてもガスの自然対流が問題となる。Here, if the gas density can be reduced by lowering the internal pressure of the ampoule, the number of Grashof can be reduced. Therefore, in order to grow a large crystal, even if the inner diameter of the ampoule is increased, the number of Grashof is too large. Therefore, crystal growth is possible without natural convection. However, in general, in the case of ZnSe crystal growth by the CVT method using iodine as a transport medium, the internal pressure is as high as several atmospheres, and natural convection is easily generated. Is a problem.
【0009】そこで、本発明は、気相法でII−VI族化合
物半導体の結晶成長を行うときの、上記の欠点を解消
し、ハロゲンドープ可能な低圧成長方法を提供しようと
するものである。SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to solve the above-mentioned drawbacks when growing a crystal of a II-VI compound semiconductor by a vapor phase method, and to provide a halogen-doped low-pressure growth method.
【0010】[0010]
【課題を解決するための手段】本発明は、気相法でII−
VI族化合物半導体結晶を成長する方法において、結晶成
長を行う成長室と、成長結晶を構成するII族元素のハロ
ゲン化物を収容するリザーバとを細管で連結し、成長室
にII−VI族化合物原料多結晶を配置し、リザーバの加熱
温度を制御しながら、結晶成長を行うことを特徴とする
II−VI族化合物半導体結晶の成長方法である。SUMMARY OF THE INVENTION The present invention relates to a method for preparing II-
In the method of growing a group VI compound semiconductor crystal, a growth chamber for growing a crystal and a reservoir containing a halide of a group II element constituting the grown crystal are connected by a thin tube, and a II-VI compound raw material is connected to the growth chamber. It is characterized in that polycrystals are arranged and crystal growth is performed while controlling the heating temperature of the reservoir
This is a method for growing a II-VI compound semiconductor crystal.
【0011】本発明は、前記II族元素のハロゲン化物を
リザーバの最低温度部に配置し、該最低温度部を均熱帯
に設けたことを特徴とする上記のII−VI族化合物半導体
結晶の成長方法である。According to the present invention, there is provided the above-mentioned II-VI compound semiconductor crystal, wherein the halide of the group II element is disposed at a lowest temperature portion of the reservoir, and the lowest temperature portion is provided in a uniform temperature zone. Is the way.
【0012】[0012]
【発明の実施の形態】本発明で成長するII−VI族化合物
半導体結晶は、ZnSe、ZnS、ZnTe、CdT
e、CdS、CdSe等を挙げることができ、前記のII
族元素のハロゲン化物としては、ZnCl2 、Zn
I2 、CdCl2 、CdI2 などを挙げることができ
る。また、本発明は、ZnSSeのような3元系II−VI
族化合物半導体結晶の成長にもの有効に適用することが
てきる。BEST MODE FOR CARRYING OUT THE INVENTION Group II-VI compound semiconductor crystals grown in the present invention are ZnSe, ZnS, ZnTe, CdT.
e, CdS, CdSe, and the like.
As halides of group elements, ZnCl 2 , Zn
I 2 , CdCl 2 , CdI 2 and the like can be mentioned. The present invention also relates to a ternary system II-VI such as ZnSSe.
It can be effectively applied to the growth of group III compound semiconductor crystals.
【0013】本発明において、リザーバ中に配置するII
族元素のハロゲン化物は、リザーバ中の最低温度部に配
置し、この最低温度部には均熱帯を設けることにより、
結晶成長の再現性をより向上させることができるように
なった。なお、ZnSe結晶成長の場合、結晶成長部の
温度は、950〜1150℃程度が好ましい。[0013] In the present invention, II placed in the reservoir
By placing the halide of the group element at the lowest temperature part in the reservoir and providing a sootherotropic zone at this lowest temperature part,
The reproducibility of crystal growth can be further improved. In the case of ZnSe crystal growth, the temperature of the crystal growth part is preferably about 950 to 1150 ° C.
【0014】また、本発明においては、成長室とリザー
バとの接合部は、内径が成長室及びリザーバの内径より
も細管にすることが望ましい。細管の内径は、成長室の
内径の10%程度が好ましく、断面積は成長室の1%程
度が好ましい。一般に、リザーバの加熱温度は、成長室
より低く設定されるので、原料多結晶がリザーバ内に漏
出して析出する恐れがあるが、上記細管を採用すること
により、成長室内の原料多結晶蒸気がリザーバ側に多量
に漏出することが防止され、リザーバ内部に原料多結晶
が凝結することが防止される。In the present invention, it is desirable that the junction between the growth chamber and the reservoir has a smaller inner diameter than the inner diameters of the growth chamber and the reservoir. The inner diameter of the thin tube is preferably about 10% of the inner diameter of the growth chamber, and the cross-sectional area is preferably about 1% of the growth chamber. Generally, since the heating temperature of the reservoir is set lower than that of the growth chamber, there is a possibility that the source polycrystal leaks into the reservoir and precipitates. A large amount of leakage to the reservoir side is prevented, and the polycrystalline raw material is prevented from condensing inside the reservoir.
【0015】図1は、本発明を実施するための成長装置
の1例を示した概念図であり、ZnSe単結晶を成長す
る場合を示したものである。成長室とリザーバは細管で
接続されており、成長室のリザーバ側にはZnSe多結
晶が配置されており、円錐形の先端が結晶成長部とな
る。また、リザーバの後端部にはZnCl2 が配置され
ている。この後端部は、リザーバの最低温度部で均熱帯
にすることが望ましい。FIG. 1 is a conceptual diagram showing an example of a growth apparatus for carrying out the present invention, and shows a case where a ZnSe single crystal is grown. The growth chamber and the reservoir are connected by a thin tube, and a ZnSe polycrystal is disposed on the reservoir side of the growth chamber, and the conical tip becomes a crystal growth part. ZnCl 2 is disposed at the rear end of the reservoir. This rear end is desirably level tropical at the lowest temperature of the reservoir.
【0016】[0016]
〔実施例1〕図1の装置を用い、成長室は内径12m
m、長さ20cmの石英管を用い、先端を尖らせて結晶
成長部とした。リザーバは内径12mm、長さ20cm
の石英管を用い、長さ10cm、内径2mmの細管を用
いて成長室とリザーバとを接続した。そして、成長室の
リザーバ側にはZnSe多結晶原料を10gを配置し、
リザーバの後端にはZnCl2 を約0.1g配置した。[Embodiment 1] Using the apparatus shown in FIG.
A quartz tube having a length of 20 cm and a length of 20 cm was used, and the tip was sharpened to form a crystal growth portion. The reservoir has an inner diameter of 12 mm and a length of 20 cm
The growth chamber and the reservoir were connected to each other using a small tube having a length of 10 cm and an inner diameter of 2 mm. Then, 10 g of a ZnSe polycrystalline material is placed on the reservoir side of the growth chamber,
About 0.1 g of ZnCl 2 was placed at the rear end of the reservoir.
【0017】このアンプルを2ゾーンの横型管状炉に投
入し、結晶成長部の温度を1000℃、ZnSe多結晶
原料の温度を1020℃とし、かつ、リザーバのZnC
l2の加熱温度を表1に示す4種類の温度に調節し、Z
nCl2 を配置した周辺10cmをリザーバ温度±1℃
の均熱帯としてZnSe単結晶の成長を行った。なお、
それぞれの温度におけるリザーバ内部のZnCl2 蒸気
圧及び成長速度を表1に記載した。結晶成長の期間は1
0日間とした。The ampoule is placed in a two-zone horizontal tubular furnace, the temperature of the crystal growth section is set to 1000 ° C., the temperature of the ZnSe polycrystalline raw material is set to 1020 ° C., and the ZnC
The heating temperature of the l 2 was adjusted to four different temperatures shown in Table 1, Z
Reservoir temperature ± 1 ° C. around 10 cm around nCl 2
, And a ZnSe single crystal was grown. In addition,
Table 1 shows the ZnCl 2 vapor pressure inside the reservoir and the growth rate at each temperature. The period of crystal growth is 1
0 days.
【0018】[0018]
【表1】 [Table 1]
【0019】得られたZnSe結晶を77Kという低温
に保持し、波長325nmのHe−Cdレーザ光を当て
て励起させ、下方遷移時に放出される光のPL(フォト
ルミネッセンス)スペクトルで測定した結果を図2に示
した。図2の(b)はZnCl2 蒸気圧を0.1Tor
r、(c)は10Torr、(d)は100Torrに
調整して成長させたもので、いずれの結晶も2.0eV
付近に発光が観察された。なお、同図(a)は蒸気圧を
加えなかったものである。この発光は一般的にSA(セ
ルフアクティブ)発光といわれ、不純物がドーピングさ
れたときに現れるものである。したがって、リザーバに
配置したZnCl2 よりCVT法と比べて低圧でClの
ドーピングに成功したことが分かる。The obtained ZnSe crystal is kept at a low temperature of 77 K, excited by irradiating He-Cd laser light having a wavelength of 325 nm, and measured by PL (photoluminescence) spectrum of light emitted at the time of downward transition. 2 is shown. FIG. 2B shows the case where the vapor pressure of ZnCl 2 is 0.1 Torr.
r and (c) were grown at 10 Torr and (d) were grown at 100 Torr.
Light emission was observed in the vicinity. FIG. 3A shows a case where no vapor pressure is applied. This light emission is generally called SA (self-active) light emission and appears when impurities are doped. Accordingly, it can be seen that Cl doping was succeeded at a lower pressure than that of the CVT method using ZnCl 2 disposed in the reservoir.
【0020】〔実施例2〕実施例1において、ZnCl
2 の代わりにZnI2 を使用し、リザーバの後端の温度
及びリザーバ内のZnI2 蒸気圧及び成長速度を表2に
示すように調節した以外は、実施例1と同様にしてZn
Se単結晶を成長させた。得られたZnSe結晶の2K
でのPLスペクトルを測定した結果を図3に示した。図
3の(b)はZnI2 蒸気圧を0.1Torr、(c)
は1Torrに調整して成長させたもので、いずれの結
晶も2.0eV付近にSA発光が観察され、CVT法と
比べて低圧でIのドーピングに成功したことが分かる。
なお、同図(a)は蒸気圧を加えなかったものである。[Embodiment 2] In the embodiment 1, the ZnCl
2 was replaced with ZnI 2 , and the temperature at the rear end of the reservoir, the ZnI 2 vapor pressure in the reservoir, and the growth rate were adjusted as shown in Table 2, except that ZnI 2 was used.
A Se single crystal was grown. 2K of the obtained ZnSe crystal
FIG. 3 shows the result of the measurement of the PL spectrum at the time. FIG. 3B shows the case where the ZnI 2 vapor pressure is 0.1 Torr and FIG.
Is grown at 1 Torr, and SA emission is observed at around 2.0 eV in any of the crystals, indicating that the doping of I was successful at a lower pressure than in the CVT method.
FIG. 3A shows a case where no vapor pressure is applied.
【0021】[0021]
【表2】 [Table 2]
【0022】[0022]
【発明の効果】本発明は、上記の構成を採用することに
より、昇華法によりII−VI族化合物半導体結晶を成長す
るときに、ハロゲンのドーピングに成功した。According to the present invention, by employing the above structure, halogen is successfully doped when a II-VI compound semiconductor crystal is grown by sublimation.
【図1】本発明で使用した結晶成長装置の1例の概念図
である。FIG. 1 is a conceptual diagram of one example of a crystal growth apparatus used in the present invention.
【図2】実施例1でZnCl2 蒸気圧を変化させて成長
させたZnSe結晶の光子エネルギーの強度を示したグ
ラフである。FIG. 2 is a graph showing the intensity of photon energy of a ZnSe crystal grown in Example 1 while changing the vapor pressure of ZnCl 2 .
【図3】実施例2でZnI2 蒸気圧を変化させて成長さ
せたZnSe結晶の光子エネルギーの強度を示したグラ
フである。FIG. 3 is a graph showing the intensity of photon energy of a ZnSe crystal grown in Example 2 while changing the ZnI 2 vapor pressure.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 望月 勝美 宮城県仙台市太白区八木山弥生町22−12 (56)参考文献 特開 平2−239179(JP,A) 特開 昭60−255693(JP,A) (58)調査した分野(Int.Cl.7,DB名) C30B 1/00 - 35/00 CA(STN) JICSTファイル(JOIS)──────────────────────────────────────────────────続 き Continued on the front page (72) Katsumi Mochizuki 22-12 Yayoi-machi, Yagiyama, Taishiro-ku, Sendai City, Miyagi Prefecture (56) References JP-A-2-239179 (JP, A) JP-A-60-255693 ( JP, A) (58) Field surveyed (Int. Cl. 7 , DB name) C30B 1/00-35/00 CA (STN) JICST file (JOIS)
Claims (2)
長する方法において、結晶成長を行う成長室と、成長結
晶を構成するII族元素のハロゲン化物を収容するリザー
バとを細管で連結し、成長室にII−VI族化合物原料多結
晶を配置し、リザーバの加熱温度を制御しながら、結晶
成長を行うことを特徴とするII−VI族化合物半導体結晶
の成長方法。1. A method for growing a group II-VI compound semiconductor crystal by a gas phase method, wherein a growth chamber for growing a crystal and a reservoir containing a halide of a group II element constituting the grown crystal are connected by a thin tube. A method for growing a group II-VI compound semiconductor crystal, comprising: placing a group II-VI compound raw material polycrystal in a growth chamber; and growing the crystal while controlling the heating temperature of the reservoir.
の最低温度部に配置し、該最低温度部を均熱帯に設けた
ことを特徴とする請求項1記載のII−VI族化合物半導体
結晶の成長方法。2. The group II-VI compound semiconductor crystal according to claim 1, wherein the halide of the group II element is arranged at a lowest temperature part of the reservoir, and the lowest temperature part is provided in a uniform tropical zone. Growth method.
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|---|---|---|---|
| JP16585296A JP3215798B2 (en) | 1996-06-26 | 1996-06-26 | Method for growing II-VI compound semiconductor crystal |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16585296A JP3215798B2 (en) | 1996-06-26 | 1996-06-26 | Method for growing II-VI compound semiconductor crystal |
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|---|---|
| JPH107497A JPH107497A (en) | 1998-01-13 |
| JP3215798B2 true JP3215798B2 (en) | 2001-10-09 |
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ID=15820227
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| US7608524B2 (en) | 2005-04-19 | 2009-10-27 | Ii-Vi Incorporated | Method of and system for forming SiC crystals having spatially uniform doping impurities |
| JP5419116B2 (en) * | 2006-06-02 | 2014-02-19 | 独立行政法人産業技術総合研究所 | Bulk crystal growth method |
| JP5052174B2 (en) * | 2007-03-26 | 2012-10-17 | 国立大学法人東京農工大学 | Zinc oxide based semiconductor manufacturing method and zinc oxide based semiconductor manufacturing apparatus |
| CN110093667A (en) * | 2019-05-21 | 2019-08-06 | 浙江森尼克半导体有限公司 | A kind of device and method of vapor phase growth ZnTe monocrystal |
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Also Published As
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| JPH107497A (en) | 1998-01-13 |
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