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JP3227846B2 - Foreign matter detection method in molten polyethylene - Google Patents
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JP3227846B2 - Foreign matter detection method in molten polyethylene - Google Patents

Foreign matter detection method in molten polyethylene

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Publication number
JP3227846B2
JP3227846B2 JP33977692A JP33977692A JP3227846B2 JP 3227846 B2 JP3227846 B2 JP 3227846B2 JP 33977692 A JP33977692 A JP 33977692A JP 33977692 A JP33977692 A JP 33977692A JP 3227846 B2 JP3227846 B2 JP 3227846B2
Authority
JP
Japan
Prior art keywords
foreign matter
molten polyethylene
shadow
light
line sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP33977692A
Other languages
Japanese (ja)
Other versions
JPH06160026A (en
Inventor
浩行 安尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP33977692A priority Critical patent/JP3227846B2/en
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to NO19934260A priority patent/NO310257B1/en
Priority to CA002109884A priority patent/CA2109884C/en
Priority to DK93118934T priority patent/DK0599297T3/en
Priority to DE69318677T priority patent/DE69318677T2/en
Priority to CN93121406A priority patent/CN1078351C/en
Priority to FI935222A priority patent/FI935222A7/en
Priority to EP93118934A priority patent/EP0599297B1/en
Priority to KR1019930025274A priority patent/KR0167363B1/en
Priority to TW082110043A priority patent/TW229266B/zh
Publication of JPH06160026A publication Critical patent/JPH06160026A/en
Priority to US08/471,443 priority patent/US5570181A/en
Application granted granted Critical
Publication of JP3227846B2 publication Critical patent/JP3227846B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は高温溶融状態で流れるポ
リエチレン中の異物を検出する方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for detecting foreign matter in polyethylene flowing in a molten state at a high temperature.

【0002】[0002]

【従来の技術及び発明が解決しようとする課題】架橋ポ
リエチレン絶縁電力ケーブル(CVケーブル)の絶縁体
の押出被覆やCVケーブル接続部の押出モールドジョイ
ント等において、ポリエチレン中に異物が存在すると絶
縁破壊等の電気的障害の要因となる。このため、溶融ポ
リエチレンの全量にわたって、異物の個数とその大きさ
を検出する必要がある。又上記溶融ポリエチレンには架
橋剤が混合されているため、溶融ポリエチレンの温度が
均一でないと、架橋反応が異常に進むいわゆるヤケ現象
が生じる。このため、異物の検出は、溶融ポリエチレン
の温度や流速等を変化させない状態で測定できることが
条件となる。
2. Description of the Related Art In the case of extrusion coating of an insulator of a crosslinked polyethylene insulated power cable (CV cable) or extrusion molding joint of a CV cable connection portion, if foreign matter is present in polyethylene, insulation breakdown or the like will occur. Cause electrical failure. Therefore, it is necessary to detect the number and size of foreign matter over the entire amount of the molten polyethylene. Further, since a crosslinking agent is mixed in the molten polyethylene, if the temperature of the molten polyethylene is not uniform, a so-called burn phenomenon in which the crosslinking reaction proceeds abnormally occurs. For this reason, the detection of foreign matter is a condition that the measurement can be performed without changing the temperature, flow rate, and the like of the molten polyethylene.

【0003】図6は従来の溶融ポリエチレン中の異物検
出方法の一例の説明図である。図面に示すように、溶融
ポリエチレン32のパイプの一部をガラスパイプ31で構成
し、光源33よりレーザ光を発射し、レーザ光が溶融ポリ
エチレン32中に存在する異物によって散乱される散乱光
をとらえることで異物の存在とその大きさを検出する方
法である。図面において、34は反射鏡、35はレンズ、36
は光ディテクタ、37はオシログラフである。
FIG. 6 is an explanatory diagram of an example of a conventional method for detecting foreign matter in molten polyethylene. As shown in the drawing, a part of the pipe of the molten polyethylene 32 is constituted by a glass pipe 31, a laser light is emitted from a light source 33, and the laser light captures scattered light scattered by a foreign substance present in the molten polyethylene 32. This is a method for detecting the presence of foreign matter and its size. In the drawing, 34 is a reflecting mirror, 35 is a lens, 36
Is an optical detector, and 37 is an oscillograph.

【0004】このような異物の検出方法は、異物によっ
て散乱されるレーザ光をとらえるため、数μm以下の微
小な異物を高感度に検出できるが、異物の径がレーザ光
の波長よりかなり大きくなると(〜数10μm)、異物の
形や表面状態によって散乱光の強度や方向が変化するた
め、異物外径の測定誤差が大きくなり、あるいは測定で
きないという問題点がある。
[0004] Such a method for detecting foreign matter detects laser light scattered by the foreign matter, and thus can detect minute foreign matter of several μm or less with high sensitivity. However, when the diameter of the foreign matter becomes considerably larger than the wavelength of the laser light. (Up to several tens of μm), the intensity and direction of the scattered light vary depending on the shape and surface state of the foreign matter, so that there is a problem that the measurement error of the outer diameter of the foreign matter increases or the measurement cannot be performed.

【0005】図7は従来の溶融ポリエチレン中の異物検
出方法の他の例の説明図である。図面に示すように、ガ
ラスパイプの形状をシート状ガラスパイプ41とし、CC
Dカメラ43の焦点深度内でその中を通過する溶融ポリエ
チレン42の異物像をカメラ像としてとらえて形状を検出
する方法である。
FIG. 7 is an explanatory view of another example of a conventional method for detecting foreign matter in molten polyethylene. As shown in the drawing, the shape of the glass pipe is a sheet-like glass pipe 41, and CC
This is a method of detecting the shape by capturing a foreign object image of the molten polyethylene 42 passing through the D camera 43 within the depth of focus as a camera image.

【0006】このような検出方法は、微小な異物を検出
するためには、レンズの焦点距離が長くなり、倍率が大
きいと焦点深度が浅く(短く)なる。そのため、溶融ポ
リエチレンの流れる通路を広く、かつ薄くする必要があ
り、架橋反応が進むヤケの現象が生じる可能性が高くな
る。又溶融ポリエチレンの流速が速くなるため、全量検
査を行うためには極めて高速な画像処理が必要とされ
る。さらにカメラ視野の大きさのパイプが必要となるこ
とで、溶融ポリエチレンの温度を一定に保つためガラス
部を保温する必要がある。
In such a detection method, the focal length of the lens becomes long in order to detect a minute foreign substance, and the focal depth becomes shallow (short) when the magnification is large. Therefore, it is necessary to make the passage through which the molten polyethylene flows wide and thin, and there is a high possibility that the phenomenon of scorching in which the crosslinking reaction proceeds will occur. In addition, since the flow rate of the molten polyethylene is increased, an extremely high-speed image processing is required to perform the entire inspection. Further, since a pipe having a size corresponding to the field of view of the camera is required, it is necessary to keep the temperature of the glass part constant in order to keep the temperature of the molten polyethylene constant.

【0007】[0007]

【課題を解決するための手段】本発明は上述の問題点を
解消し、広い視野をもち、高い空間分解能と大きな被写
体深度をもつ溶融ポリエチレン中の異物検出方法を提供
するもので、その特徴は、溶融ポリエチレンが流れるパ
イプに光が透過する窓を設け、その窓から、光源からの
光を溶融ポリエチレンに透過させて、溶融ポリエチレン
中に含まれる異物によって光源の光が遮ぎられて生じる
影をラインセンサで検出し、影の幅と影の強度との積
ら異物の大きさを測定することにある。
SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems and provides a method for detecting foreign matter in molten polyethylene having a wide field of view, a high spatial resolution and a large depth of field. The pipe through which the molten polyethylene flows is provided with a window through which the light is transmitted, and from that window, the light from the light source is transmitted through the molten polyethylene, and a shadow generated when the light from the light source is blocked by foreign substances contained in the molten polyethylene. An object of the present invention is to detect the size of a foreign object by detecting a line sensor and calculating the product of the shadow width and the shadow intensity .

【0008】[0008]

【作用】約 120℃に加熱し、溶融状態になったポリエチ
レンの流路中にガラスパイプを設置する。このガラスパ
イプを挾んで光源とラインセンサを対向させて配置し、
ラインセンサの各画素の光源強度をモニターする。溶融
ポリエチレン中に異物が存在すると、光源の光が異物に
よって遮ぎられ、その遮ぎられた光の量は異物の大きさ
と相関がある。さらに、異物の影は、異物とセンサの距
離が離れると光の干渉によってボケてくる(影の強度が
弱くなる)が、その分影の幅が広がり、影の強度と影の
幅の積は異物とセンサの距離に依存しなくなる。又ライ
ンセンサの影の生じている画素から異物の位置を知るこ
とができる。この位置精度と影の幅の測定精度はライン
センサの画素数と画素の大きさで決まり、ラインセンサ
は10μmの画素が5000ヶならんだものが容易に入手でき
る。
[Function] A glass pipe is installed in the flow path of polyethylene which is heated to about 120 ° C. and is in a molten state. The light source and the line sensor are placed facing each other across this glass pipe,
The light source intensity of each pixel of the line sensor is monitored. If foreign matter is present in the molten polyethylene, light from the light source is blocked by the foreign matter, and the amount of the blocked light has a correlation with the size of the foreign matter. Furthermore, the shadow of a foreign object becomes blurred (the intensity of the shadow becomes weaker) due to the interference of light when the distance between the foreign object and the sensor increases, but the width of the separation increases, and the product of the intensity of the shadow and the width of the shadow becomes It does not depend on the distance between the foreign object and the sensor. Further, the position of the foreign matter can be known from the pixel of the line sensor where the shadow occurs. The position accuracy and the shadow width measurement accuracy are determined by the number of pixels and the pixel size of the line sensor, and a line sensor having 5,000 pixels of 10 μm can be easily obtained.

【0009】本発明の検出方法によって、どの程度の分
解能と視野及び焦点深度をもっているかを図3(イ)に
示す方法で調べた。図において21は波長 850μmのLE
D光源、22はコア径 250μmのPCF光ファイバ、23は
セルフォックレンズ、24は図3(ロ)に示すような4
種、即ち 130μm25a 、70μm25b 、20μm25c 、 455
μm25d の金属ワイヤを配設した試料、26はラインセン
サ、27はCCD駆動回路、28はコンピュータ、29はプリ
ンタで、図3(イ)のように、上記4種の金属ワイヤ
(25a, 25b, 25c, 25d)をもった試料25を光路中に置
き、図のAあるいはBに位置せしめることで焦点深度の
深さによって異物径の検出精度がどの程度に変化するか
を調べた。CCDの信号出力は図4(2048画素、視野約
28.6mm、CCDラインセンサと試料の間隔約10mm)のよ
うに、金属ワイヤを張った位置に対応する画素に影とし
てとらえられる。結果を図5に示す。
The resolution, field of view, and depth of focus of the detection method according to the present invention were examined by the method shown in FIG. In the figure, reference numeral 21 denotes an LE having a wavelength of 850 μm.
D light source, 22 is a PCF optical fiber having a core diameter of 250 μm, 23 is a selfoc lens, and 24 is a 4F as shown in FIG.
Species: 130 μm 25a, 70 μm 25b, 20 μm 25c, 455
A sample having a metal wire of 25 μm 25d, 26 is a line sensor, 27 is a CCD drive circuit, 28 is a computer, 29 is a printer, and as shown in FIG. 3A, the above-mentioned four types of metal wires (25a, 25b, By placing the sample 25 having 25c, 25d) in the optical path and positioning it at A or B in the figure, it was examined how much the detection accuracy of the foreign particle diameter changes depending on the depth of focus. The signal output of the CCD is shown in Fig. 4 (2048 pixels, approx.
(28.6 mm, the distance between the CCD line sensor and the sample is about 10 mm), the pixel corresponding to the position where the metal wire is stretched is captured as a shadow. The results are shown in FIG.

【0010】図5より、影の幅と深さ(光強度)は、光
の回折のために 150μm以下ぐらいから金属ワイヤ幅と
の関係に直線性がみられなくなるが、幅と深さの積は 4
55μmの金属ワイヤ影に対して良好な直線であらわされ
る関係をもっていることがわかる。さらに、ラインセン
サ26と試料25の間隔を変化させたA10mm,B40mmの位置
でもこの関係が保たれることがわかった。
According to FIG. 5, the width and depth (light intensity) of the shadow are about 150 μm or less due to light diffraction, so that the relationship between the width and the depth of the metal wire is not linear. Is 4
It can be seen that there is a good straight line relationship for the metal wire shadow of 55 μm. Further, it was found that this relationship was maintained at the positions of A10 mm and B40 mm where the distance between the line sensor 26 and the sample 25 was changed.

【0011】[0011]

【実施例】図1は本発明の異物検出方法の具体例の回路
構成図、図2は図1の各部位の動作説明図である。光源
1によって、溶融ポリエチレンが流れるフローガラスセ
ル2にLED光が一様に照射される。ラインセンサ駆動
回路3によってCCDラインセンサ4より一画素づつ出
力される信号を、アンプ5によりコンパレータ6で判定
できるレベルに増幅し、あらかじめ設定しておいたレベ
ルとコンパレータ6で比較する。コンパレータ6は異物
の信号があるとハイレベルとなり、このハイレベルの期
間をカウンタ7で数えることで異物の影の幅を知ること
ができる。
FIG. 1 is a circuit diagram of a specific example of a foreign matter detection method according to the present invention, and FIG. 2 is an explanatory diagram of the operation of each part in FIG. The light source 1 uniformly irradiates the flow glass cell 2 through which the molten polyethylene flows with the LED light. The signal output from the CCD line sensor 4 one pixel at a time by the line sensor drive circuit 3 is amplified by the amplifier 5 to a level that can be determined by the comparator 6, and compared with a preset level by the comparator 6. The comparator 6 goes to a high level when there is a foreign substance signal, and the width of the foreign substance shadow can be known by counting the period of this high level with the counter 7.

【0012】一方、CCDラインセンサ4の信号は、ピ
ークホールド回路9で、1フレーム(CCDの0画素目
から2048画素まで出力する時間)中にあらわれる最大の
信号をホールドし、影の深さCが保持される。カウンタ
7で数えた異物の影の幅をD/Aコンバータ8でアナロ
グ値bし、影の深さレベルCと乗算器10で乗算すること
で異物影の面積に比例した信号レベルが出力dとして得
られる。
On the other hand, the signal of the CCD line sensor 4 holds the maximum signal appearing in one frame (time for outputting from the 0th pixel to the 2048th pixel of the CCD) by the peak hold circuit 9 and the shadow depth C Is held. The width of the foreign matter shadow counted by the counter 7 is converted into an analog value b by the D / A converter 8 and multiplied by the multiplier 10 with the shadow depth level C to obtain a signal level proportional to the foreign matter shadow area as an output d. can get.

【0013】[0013]

【発明の効果】以上説明したように、本発明の溶融ポリ
エチレン中の異物検出方法によれば、次の効果を有す
る。 (1)溶融ポリエチレン中の異物の影をとらえることで
測定可能であり、レンズの焦点深度にかかわることなく
異物検出ができる。 (2)異物によってできる影をラインセンサで検出する
ため、窓ガラスが短くてすみ、ガラス部を設けたことに
よる溶融ポリエチレンの保温の必要がなくなる。 (3)影は、光源の光を照射する方向の異物の最大径に
対応するため、異物の表面状態や形状の影響が少なく、
信号の処理も少なくてすみ、溶融ポリエチレン全量のチ
ェックが容易となる。 (4)影の幅と光強度の積から異物外径を求めるため、
光の干渉による異物影のボケ具合による誤差が小さく、
径の小さい異物の検出も可能となる。従って、本発明の
方法はCVケーブルの押出被覆工程やCVケーブル接続
部の押出モールドジョイント等に利用するとき、極めて
効果的である。
As described above, the method for detecting foreign matter in molten polyethylene according to the present invention has the following effects. (1) The measurement can be performed by capturing the shadow of the foreign matter in the molten polyethylene, and the foreign matter can be detected regardless of the depth of focus of the lens. (2) Since the shadow produced by the foreign matter is detected by the line sensor, the window glass can be short, and the necessity for keeping the temperature of the molten polyethylene due to the provision of the glass portion is eliminated. (3) Since the shadow corresponds to the maximum diameter of the foreign matter in the direction of irradiating the light of the light source, the influence of the surface condition and shape of the foreign matter is small,
The signal processing is small, and it is easy to check the total amount of the molten polyethylene. (4) In order to determine the outer diameter of the foreign substance from the product of the shadow width and the light intensity,
Small errors due to blurring of foreign matter shadows due to light interference,
It is also possible to detect a foreign substance having a small diameter. Therefore, the method of the present invention is extremely effective when used in an extrusion coating step of a CV cable or an extrusion mold joint of a CV cable connection part.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の溶融ポリエチレン中の異物検出方法の
具体例の回路構成図である。
FIG. 1 is a circuit configuration diagram of a specific example of a method for detecting foreign matter in molten polyethylene according to the present invention.

【図2】図1の各部位の動作説明図である。FIG. 2 is an operation explanatory view of each part in FIG. 1;

【図3】図3(イ)は本発明の異物検出方法の分解能、
視野及び焦点深度調査のための実験方法の説明図であ
り、図3(ロ)はそれに用いた試料の説明図である。
FIG. 3A shows the resolution of the foreign matter detection method of the present invention;
FIG. 3 is an explanatory view of an experimental method for investigating a visual field and a depth of focus, and FIG. 3B is an explanatory view of a sample used in the experiment.

【図4】図4(イ)は図3の実験によるCCDラインセ
ンサの信号出力の画像、図4(ロ)及び(ハ)はそれぞ
れ 25c,25d の拡大図である。
4A is an image of a signal output of the CCD line sensor in the experiment of FIG. 3, and FIGS. 4B and 4C are enlarged views of 25c and 25d, respectively.

【図5】図3の実験による異物径と異物影の関係図であ
る。
FIG. 5 is a diagram showing a relationship between a foreign particle diameter and a foreign material shadow in the experiment of FIG. 3;

【図6】従来の溶融ポリエチレン中の異物検出方法の一
例の説明図である。
FIG. 6 is an explanatory diagram of an example of a conventional method for detecting foreign matter in molten polyethylene.

【図7】従来の溶融ポリエチレン中の異物検出方法の他
の例の説明図である。
FIG. 7 is an explanatory diagram of another example of a conventional method for detecting foreign matter in molten polyethylene.

【符号の説明】[Explanation of symbols]

1 光源 2 溶融ポリエチレンフローガラスセル 3 CCDラインセンサ駆動回路 4 CCDラインセンサ 5 アンプ 6 コンパレータ 7 カウンタ 8 D/Aコンバータ 9 ピークホールド回路 10 乗算器 Reference Signs List 1 light source 2 molten polyethylene flow glass cell 3 CCD line sensor drive circuit 4 CCD line sensor 5 amplifier 6 comparator 7 counter 8 D / A converter 9 peak hold circuit 10 multiplier

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 溶融ポリエチレンが流れるパイプに光が
透過する窓を設け、その窓から光源からの光を溶融ポリ
エチレンに透過させて溶融ポリエチレン中に含まれる異
物によって光源の光が遮ぎられて生じる影をラインセン
サで検出し、影の幅と影の強度との積から異物の大きさ
を測定することを特徴とする溶融ポリエチレン中の異物
検出方法。
1. A window through which light is transmitted is provided in a pipe through which molten polyethylene flows, and light from the light source is transmitted through the window to the molten polyethylene, and the light from the light source is blocked by foreign substances contained in the molten polyethylene. A method for detecting foreign matter in molten polyethylene, comprising detecting a shadow with a line sensor and measuring the size of the foreign matter from the product of the width of the shadow and the intensity of the shadow .
JP33977692A 1992-11-25 1992-11-25 Foreign matter detection method in molten polyethylene Expired - Fee Related JP3227846B2 (en)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP33977692A JP3227846B2 (en) 1992-11-25 1992-11-25 Foreign matter detection method in molten polyethylene
EP93118934A EP0599297B1 (en) 1992-11-25 1993-11-24 Method of detecting impurities in molten resin
DK93118934T DK0599297T3 (en) 1992-11-25 1993-11-24 Process for detecting impurities in molten resin
DE69318677T DE69318677T2 (en) 1992-11-25 1993-11-24 Method of detecting contaminants in molten plastic
CN93121406A CN1078351C (en) 1992-11-25 1993-11-24 Method of detecting impurities in molten resin
FI935222A FI935222A7 (en) 1992-11-25 1993-11-24 Foerfarande Foer detektering av foeroreningar i smaelt resin
NO19934260A NO310257B1 (en) 1992-11-25 1993-11-24 Method for detecting contaminants in molten resin
CA002109884A CA2109884C (en) 1992-11-25 1993-11-24 Method of detecting impurities in molten resin
KR1019930025274A KR0167363B1 (en) 1992-11-25 1993-11-25 Impurity detection method in molten resin
TW082110043A TW229266B (en) 1992-11-25 1993-11-29
US08/471,443 US5570181A (en) 1992-11-25 1995-06-06 Method of detecting impurities in molten resin utilizing scattering light and the shadows of the impurities

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33977692A JP3227846B2 (en) 1992-11-25 1992-11-25 Foreign matter detection method in molten polyethylene

Publications (2)

Publication Number Publication Date
JPH06160026A JPH06160026A (en) 1994-06-07
JP3227846B2 true JP3227846B2 (en) 2001-11-12

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JP33977692A Expired - Fee Related JP3227846B2 (en) 1992-11-25 1992-11-25 Foreign matter detection method in molten polyethylene

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