JP3258349B2 - Epi-illumination fluorescence microscope - Google Patents
Epi-illumination fluorescence microscopeInfo
- Publication number
- JP3258349B2 JP3258349B2 JP22906291A JP22906291A JP3258349B2 JP 3258349 B2 JP3258349 B2 JP 3258349B2 JP 22906291 A JP22906291 A JP 22906291A JP 22906291 A JP22906291 A JP 22906291A JP 3258349 B2 JP3258349 B2 JP 3258349B2
- Authority
- JP
- Japan
- Prior art keywords
- optical
- optical substrate
- fluorescence
- epi
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/50—Fuel cells
Landscapes
- Optical Elements Other Than Lenses (AREA)
- Microscoopes, Condenser (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
Description
【0001】[0001]
【産業上の利用分野】この発明は、励起波長の切り換え
を行う際に用いられる光学素子を備えた落射型蛍光顕微
鏡に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an epi-illumination type fluorescence microscope having an optical element used for switching an excitation wavelength.
【0002】[0002]
【従来の技術】例えば落射型蛍光顕微鏡における励起波
長の切り換えを行う装置は、図3に示すように複数のフ
ィルタユニット(図面では2つ)を備えている。これら
各フィルタユニットは、観察光路への移動を果たす移動
機構を備えた支持部材、この支持部材に取付けられた光
学基板、この光学基板に形成され、蛍光を励起させるの
に必要な波長のみを抽出する励起フィルタによって構成
されている。そして、標本を照射する励起波長の切り換
えは、矢印で示すように、フィルタユニットを観察光路
内へスライドさせることによって行われている。2. Description of the Related Art For example, an apparatus for switching an excitation wavelength in an epi-illumination type fluorescence microscope is provided with a plurality of filter units (two in the drawing) as shown in FIG. Each of these filter units includes a support member having a moving mechanism for moving to the observation optical path, an optical substrate attached to the support member, and only a wavelength necessary for exciting fluorescence formed on the optical substrate. And an excitation filter. The switching of the excitation wavelength for irradiating the sample is performed by sliding the filter unit into the observation optical path as shown by the arrow.
【0003】[0003]
【発明が解決しようとする課題】前述したように、各フ
ィルタユニットは、各々単独で独立した光学基板や、こ
れを支持する支持部材等によって構成されている。この
ため、各光学基板間で厚み誤差、平行度のばらつきが発
生してしまう。この厚み誤差、平行度のばらつきによ
り、標本観察時に励起波長の切り換え操作を行うと、フ
ィルタでの屈折状態が異なってしまい、観察系に向かう
光路が、切り換え操作の前後において正確に一致しなく
なってしまう。As described above, each filter unit is constituted by an independent optical substrate and a supporting member for supporting the optical substrate. For this reason, thickness errors and variations in parallelism occur between the optical substrates. Due to the thickness error and the variation of the parallelism, if the operation of switching the excitation wavelength is performed at the time of sample observation, the refraction state at the filter will be different, and the optical path toward the observation system will not exactly match before and after the switching operation. I will.
【0004】また、各フィルタユニットにおける基板支
持部材や移動機構等に加工誤差があると、フィルタユニ
ットの切り換え操作の前後においてフィルタユニットが
同一の位置に再現されなくなってしまい、標本を照射す
る照明系からの光がぶれてしまう。Further, if there is a processing error in the substrate support member, the moving mechanism, or the like in each filter unit, the filter unit will not be reproduced at the same position before and after the switching operation of the filter unit, and the illumination system for irradiating the sample will be described. The light from is blurred.
【0005】この様に、光学基板の厚み誤差、平行度の
ばらつき、基板支持部材の加工誤差等により光学的芯ず
れが発生し、標本観察時に励起波長の切り換え操作を行
うと注目していた視野がずれてしまう。これは、多重励
起、多重露光等の蛍光写真の撮影時を始めとして、様々
な用途に支障をきたしてしまう。As described above, optical misalignment occurs due to errors in the thickness of the optical substrate, variations in parallelism, processing errors in the substrate support member, and the like. Is shifted. This hinders various uses, such as when taking a fluorescence photograph such as multiple excitation and multiple exposure.
【0006】この発明は上記問題点に鑑みて成されたも
のであり、光学素子において波長等の切り換え操作を行
う際、切り換え操作の前後において光学的芯ずれが発生
しない落射型蛍光顕微鏡を提供することを目的とする。SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and provides an epi-illumination type fluorescence microscope which does not cause optical misalignment before and after the switching operation of a wavelength or the like in an optical element. The purpose is to.
【0007】[0007]
【課題を解決するための手段、作用】前記課題を解決す
るために、本発明の落射型蛍光顕微鏡は、蛍光を励起さ
せるのに必要な複数種類の波長の光を射出する照明系
と、この照明系から射出された複数種類の波長から夫々
特定の蛍光を励起させるのに必要な波長の光のみを抽出
する光学的機能膜を同一面上に複数種類設けた単一の光
学基板と、この光学基板を同一面で保持すると共に、観
察光路内に配置された前記光学基板の光学的機能膜を切
り換えるための可動部材と、顕微鏡本体に形成され、前
記可動部材を案内して前記光学基板の光学的機能膜を光
路内に切り換える案内機構と、前記光学基板の光学的機
能膜により抽出された光により励起された標本からの蛍
光に基づいて標本を観察する観察系と、を有することを
特徴とする。In order to solve the above-mentioned problems, an epi-illumination type fluorescence microscope according to the present invention comprises: an illumination system for emitting light of a plurality of wavelengths necessary for exciting fluorescence; A single optical substrate provided with a plurality of types of optical functional films on the same surface for extracting only light having a wavelength necessary to excite a specific fluorescent light from a plurality of types of wavelengths emitted from the illumination system, respectively. While holding the optical substrate on the same surface, a movable member for switching an optical functional film of the optical substrate disposed in the observation optical path, and a movable member formed on the microscope main body, guiding the movable member, and A guide mechanism for switching the optical function film into the optical path, and an observation system for observing the sample based on fluorescence from the sample excited by light extracted by the optical function film of the optical substrate, And
【0008】[0008]
【実施例】以下、本発明の実施例に係わる落射型蛍光顕
微鏡を添付図面に沿って具体的に説明する。図1は、落
射型蛍光顕微鏡における光路の概略を示した図である。
この図において、四角で囲まれた部分1に光学素子10
が配置されている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An epi-illumination type fluorescence microscope according to an embodiment of the present invention will be specifically described below with reference to the accompanying drawings. FIG. 1 is a diagram schematically showing an optical path in an epi-illumination fluorescence microscope.
In this figure, an optical element 10 is placed in a portion 1 surrounded by a square.
Is arranged.
【0009】照明系5から射出された光は、光学素子1
0によって反射されると共に蛍光を励起させるのに必要
な波長のみが抽出され、対物レンズ7を介して標本9を
照射する。標本9からの反射光、蛍光等は再び対物レン
ズ7を通って光学素子10を通過し、観察系へと導かれ
る。The light emitted from the illumination system 5 is
Only the wavelengths that are reflected by 0 and necessary to excite the fluorescence are extracted and illuminate the specimen 9 via the objective lens 7. The reflected light, fluorescence, and the like from the specimen 9 pass through the optical element 10 again through the objective lens 7 and are guided to the observation system.
【0010】この光学素子10の構成を図2を参照して
具体的に説明する。図2(A)および(B)は、光学的
機能膜13(この実施例では、分光特性が異なるダイク
ロイックフイルタ13a,13b)を被着した光学基板
11の平面図および側面図をそれぞれ示している。この
光学基板11上に光学的機能膜13を形成するのは、通
常の薄膜形成技術、例えば真空蒸着、スパッタリング等
によって行われる。この光学的機能膜13が形成された
光学基板11は、以下に述べる可動機構部材20に保持
される。The structure of the optical element 10 will be specifically described with reference to FIG. FIGS. 2A and 2B are a plan view and a side view, respectively, of the optical substrate 11 on which the optical functional film 13 (in this embodiment, dichroic filters 13a and 13b having different spectral characteristics) is applied. . The formation of the optical functional film 13 on the optical substrate 11 is performed by a normal thin film forming technique, for example, vacuum evaporation, sputtering, or the like. The optical substrate 11 on which the optical function film 13 is formed is held by a movable mechanism member 20 described below.
【0011】図2(C)は可動機構部材20の構成を示
す平面図であり、図2(D)は図(C)におけるD−D
線に沿った断面図である。可動機構部材20には、光軸
に対して45°傾斜した支持面21が形成されており、
この支持面21に前記光学的機能膜13が形成された光
学基板11が保持されるようになっている。支持面21
には、前記分光特性が異なるダイクロイックフイルタ1
3a,13bに対応する位置に穴23a,23bがそれ
ぞれ形成されており、標本からの反射光を観察光学系へ
と導く。また、この可動機構部材20には、照明系から
の光をダイクロイックフイルタへ導く穴27、およびダ
イクロイックフイルタでの反射光を標本へ導く穴29が
形成されている。もちろんこれらの穴27,29は、穴
23aにも対応して形成されている。FIG. 2C is a plan view showing the structure of the movable mechanism member 20, and FIG.
It is sectional drawing along the line. The movable mechanism member 20 has a support surface 21 inclined at 45 ° with respect to the optical axis.
The optical substrate 11 on which the optical function film 13 is formed is held on the support surface 21. Support surface 21
The dichroic filters 1 having different spectral characteristics.
Holes 23a and 23b are formed at positions corresponding to 3a and 13b, respectively, and guide the reflected light from the sample to the observation optical system. The movable mechanism member 20 has a hole 27 for guiding light from the illumination system to the dichroic filter, and a hole 29 for guiding light reflected by the dichroic filter to the sample. Of course, these holes 27 and 29 are formed corresponding to the hole 23a.
【0012】さらに可動機構部材20には、切り換え摺
動部25が形成されており、この摺動部25が顕微鏡本
体に設けられた案内機構(図示せず)に係合し、可動機
構部材20をスライドさせるようになっている。この結
果、可動機構部材20をスライドさせることにより、励
起波長を切り換えることが可能になっている。Further, the movable mechanism member 20 is formed with a switching sliding portion 25, which engages with a guide mechanism (not shown) provided on the microscope main body, and To slide. As a result, it is possible to switch the excitation wavelength by sliding the movable mechanism member 20.
【0013】この様に、同一の光学基板11上に特性が
異なるダイクロイックフイルタ13a,13bをそれぞ
れ形成したために、光学基板の厚み誤差、平行度のばら
つきに基づく光学的芯ずれが発生することはない。この
場合、光学的機能膜の厚み誤差に基づく影響が考えられ
るが、この膜厚は非常に薄いものであるために、実際上
は無視できる。さらに、単一の可動部材20をスライド
させるように構成しているので、加工誤差に基づく光学
的芯ずれが発生することはない。As described above, since the dichroic filters 13a and 13b having different characteristics are formed on the same optical substrate 11, no optical misalignment occurs due to the thickness error of the optical substrate and the variation of the parallelism. . In this case, an influence based on a thickness error of the optically functional film can be considered, but since this film thickness is extremely thin, it can be ignored in practice. Further, since the single movable member 20 is configured to slide, no optical misalignment due to a processing error occurs.
【0014】本実施例では、光学的機能膜の数を2つと
したが、蛍光を励起させるのに必要な波長に応じてその
数を増やすことができる。また、可動機構部材20をス
ライドさせる機構については図示されたものに限られ
ず、例えばローラを用いたり、ラック・ピニオンによっ
て構成することもできる。さらに、本実施例では、蛍光
観察のために光学的機能膜として分光特性の異なるダイ
クロイックフイルタを用いているが、本発明の光学素子
としては、光学装置に応じて偏光ビームスプリッタ、ハ
ーフミラー等の特性を持ったものの組み合わせであって
も良い。In this embodiment, the number of optically functional films is two, but the number can be increased according to the wavelength required to excite fluorescence. Further, the mechanism for sliding the movable mechanism member 20 is not limited to the illustrated one, and may be configured by using, for example, a roller or a rack and pinion. Furthermore, in the present embodiment, a dichroic filter having different spectral characteristics is used as an optical functional film for fluorescence observation, but as an optical element of the present invention, a polarizing beam splitter, a half mirror, or the like is used depending on the optical device. A combination of those having characteristics may be used.
【0015】[0015]
【発明の効果】以上説明したように、本発明の落射型蛍
光顕微鏡によれば、光学素子により波長、光路等の切り
換え操作を行う際、切り換え操作の前後において光学的
芯ずれが発生することはない。As described above, according to the epi-illumination type fluorescence microscope of the present invention, when the switching operation of the wavelength and the optical path is performed by the optical element, the optical misalignment does not occur before and after the switching operation. Absent.
【図1】落射型蛍光顕微鏡における光路の概略を示した
図である。FIG. 1 is a diagram schematically showing an optical path in an epi-illumination type fluorescence microscope.
【図2】(A)および(B)は、分光特性が異なるダイ
クロイックフイルタを被着した光学基板を示す平面図お
よび側面図であり、(C)は可動機構部材の構成を示す
平面図、(D)は図(C)におけるD−D線に沿った断
面図である。FIGS. 2A and 2B are a plan view and a side view showing an optical substrate on which dichroic filters having different spectral characteristics are adhered; FIG. 2C is a plan view showing a configuration of a movable mechanism member; D) is a cross-sectional view along the line DD in FIG.
【図3】従来の落射型蛍光顕微鏡における励起波長の切
り換えを行う装置の概略を示す図である。FIG. 3 is a view schematically showing an apparatus for switching an excitation wavelength in a conventional epifluorescence microscope.
10…光学素子、11…光学基板、13a,13b…ダ
イクロイックフイルタ(光学的機能膜)、20…可動機
構部材。10 optical element, 11 optical substrate, 13a, 13b dichroic filter (optically functional film), 20 movable member.
フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G02B 21/00 G02B 5/00 G02B 26/00 Continuation of the front page (58) Field surveyed (Int.Cl. 7 , DB name) G02B 21/00 G02B 5/00 G02B 26/00
Claims (1)
波長の光を射出する照明系と、 この照明系から射出された複数種類の波長から夫々特定
の蛍光を励起させるのに必要な波長の光のみを抽出する
光学的機能膜を同一面上に複数種類設けた単一の光学基
板と、 この光学基板を同一面で保持すると共に、観察光路内に
配置された前記光学基板の光学的機能膜を切り換えるた
めの可動部材と、 顕微鏡本体に形成され、前記可動部材を案内して前記光
学基板の光学的機能膜を光路内に切り換える案内機構
と、 前記光学基板の光学的機能膜により抽出された光により
励起された標本からの蛍光に基づいて標本を観察する観
察系と、 を有することを特徴とする落射型蛍光顕微鏡。An illumination system that emits light of a plurality of wavelengths required to excite fluorescence, and a wavelength required to excite a specific fluorescence from the plurality of wavelengths emitted from the illumination system, respectively. A single optical substrate provided with a plurality of types of optically functional films on the same surface for extracting only light of the same type; holding the optical substrate on the same surface; A movable member for switching the functional film; a guide mechanism formed on the microscope main body for guiding the movable member to switch the optical functional film of the optical substrate into an optical path; and extracting by the optical functional film of the optical substrate. And an observation system for observing the sample based on fluorescence from the sample excited by the emitted light.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22906291A JP3258349B2 (en) | 1991-09-09 | 1991-09-09 | Epi-illumination fluorescence microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22906291A JP3258349B2 (en) | 1991-09-09 | 1991-09-09 | Epi-illumination fluorescence microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0566351A JPH0566351A (en) | 1993-03-19 |
| JP3258349B2 true JP3258349B2 (en) | 2002-02-18 |
Family
ID=16886144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22906291A Expired - Fee Related JP3258349B2 (en) | 1991-09-09 | 1991-09-09 | Epi-illumination fluorescence microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3258349B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10101711A1 (en) * | 2000-01-26 | 2001-08-02 | Leica Microsystems | Device for positioning an optical component in an optical path |
-
1991
- 1991-09-09 JP JP22906291A patent/JP3258349B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0566351A (en) | 1993-03-19 |
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